STMICROELECTRONICS STGP10NB60SDFP

STGP10NB60SDFP
N-CHANNEL 10A - 600V - TO-220FP
PowerMesh™ IGBT
TYPE
VCES
VCE(sat)
IC
STGP10NB60SDFP
600
< 1.8 V
10 A
■
■
■
■
HIGHT INPUT IMPEDANCE (VOLTAGE
DRIVEN)
LOW ON-VOLTAGE DROP
HIGH CURRENT CAPABILITY
OFF LOSSES INCLUDE TAIL CURRENT
3
1
2
TO-220FP
DESCRIPTION
Using the latest high voltage technology based on a
patented strip layout, STMicroelectronics has
designed an advanced family of IGBTs, the
PowerMESH™ IGBTs, with outstanding
performances. The suffix “S” identifies a family
optimized achieve minimum on-voltage drop for low
frequency applications (<1kHz).
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ LIGHT DIMMER
■ STATIC RELAYS
■ MOTOR CONTROL
ABSOLUTE MAXIMUM RATINGS
Symbol
Value
Unit
VCES
Collector-Emitter Voltage (VGS = 0)
Parameter
600
V
VECR
Reverse Battery Protection
20
V
VGE
Gate-Emitter Voltage
± 20
V
IC
Collector Current (continuous) at TC = 25°C
20
A
IC
Collector Current (continuous) at TC = 100°C
10
A
Collector Current (pulsed)
80
A
PTOT
Total Dissipation at TC = 25°C
30
W
VISO
Insulation Withstand Voltage A.C.(t = 1 sec; Tc = 25°C)
Tstg
Storage Temperature
ICM ()
Derating Factor
Tj
Max. Operating Junction Temperature
0.2
W/°C
2500
V
–65 to 150
°C
175
°C
(● ) Pulse width limited by safe operating area
November 2002
1/8
STGP10NB60SDFP
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
5
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Rthc-sink
Thermal Resistance Case-sink Typ
0.5
°C/W
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
VBR(CES)
Collector-Emitter Break-down
Voltage
IC = 250 µA, VGE = 0,
600
V
VBR(CES)
Emitter Collector Break-down
Voltage
IC = 1 mA, VGE = 0,
20
V
ICES
Collector cut-off Current
(VGE = 0)
VCE = Max Rating ,Tj =25 °C
VCE = Max Rating ,Tj =125 °C
IGES
Gate-Emitter Leakage
Current (VCE = 0)
VGE = ± 20V , VCE = 0
10
100
µA
µA
± 100
nA
Max.
Unit
5
V
1.15
1.35
1.25
1.8
V
V
V
Typ.
Max.
Unit
ON (1)
Symbol
VGE(th)
VCE(SAT)
Parameter
Test Conditions
Gate Threshold Voltage
VCE = VGE, IC = 250µA
Collector-Emitter Saturation
Voltage
VGE =15V,
VGE =15V,
VGE =15V,
Min.
Typ.
2.5
IC = 5 A, Tj= 25°C
IC = 10 A, Tj= 25°C
IC = 10 A, Tj= 125°C
DYNAMIC
Symbol
gfs
Cies
Coes
Cres
2/8
Parameter
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
Test Conditions
VCE = 25 V , IC =10 A
Min.
5
VCE = 25V, f = 1 MHz, VGE = 0
Qg
Gate Charge
VCE = 400V, IC = 10 A,
VGE = 15V
ICL
Latching Current
Vclamp= 480V, RG= 1kΩ,
Tj= 125°C
20
S
610
65
12
pF
pF
pF
33
nC
A
STGP10NB60SDFP
SWITCHING ON
Symbol
td(on)
tr
(di/dt)on
Eon
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Rise Time
VCC = 480 V, IC = 10 A
RG = 1KΩ , VGE = 15 V
0.46
µs
Turn-on Current Slope
Turn-on Switching Losses
VCC= 480 V, IC = 10 A
RG=1KΩ, VGE = 15 V
8
0.6
A/µs
mJ
Turn-on Delay Time
0.7
µs
SWITCHING OFF
Symbol
tc
tr(Voff)
tf
Eoff(**)
tc
tr(Voff)
tf
Eoff(**)
Parameter
Cross-over Time
Off Voltage Rise Time
Test Conditions
Min.
Vclamp = 480 V, IC = 10 A,
RGE = 1K Ω , VGE = 15 V
Fall Time
Turn-off Switching Loss
Typ.
Max.
Unit
2.2
µs
1.2
µs
1.2
µs
5.0
mJ
3.8
µs
1.2
µs
Fall Time
1.9
µs
Turn-off Switching Loss
8.0
mJ
Cross-over Time
Off Voltage Rise Time
Vclamp = 480 V, IC = 10 A,
RGE = 1KΩ , VGE = 15 V
Tj = 125 °C
COLLECTOR-EMITTER DIODE
Symbol
Parameter
Test Conditions
Min.
Typ.
If
Ifm
Forward Current
Forward Current pulsed
Vf
Forward On-Voltage
If = 3.5 A
If = 3.5 A, Tj = 125 °C
1.4
1.15
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
If = 7 A ,VR = 35 V,
Tj =125°C, di/dt = 100A/µs
50
70
2.7
trr
Qrr
Irrm
Max.
Unit
7
56
A
A
1.9
V
V
ns
nC
A
(●)Pulsed: Pulse duration = 300 µ s, duty cycle 1.5 %.
(1)Pulse width limited by max. junction temperature.
(**)Losses Include Also the Tail
Switching Off Safe Operating Area
Thermal Impedance
3/8
STGP10NB60SDFP
Output Characteristics
Transfer Characteristics
Transconductance
Collector-Emitter On Voltage vs Temperature
Collector-Emitter On Voltage vs Collector Current
Gate Threshold Voltage vs Temperature
4/8
STGP10NB60SDFP
Capacitance Variations
Gate Charge vs Gate-Emitter Voltage
Off Losses vs Gate Resistance
Off Losses vs Collector Current
Normalized Break-down Voltage vs Temp.
Off Losses vs Temperature
5/8
STGP10NB60SDFP
Emitter-Collector Diode Characteristics
Fig. 1: Gate Charge test Circuit
6/8
Fig. 2: Test Circuit For Inductive Load Switching
STGP10NB60SDFP
TO-220FP MECHANICAL DATA
mm.
DIM.
MIN.
A
4.4
inch
TYP
MAX.
MIN.
TYP.
MAX.
4.6
0.173
0.181
B
2.5
2.7
0.098
0.106
D
2.5
2.75
0.098
0.108
E
0.45
0.7
0.017
0.027
F
0.75
1
0.030
0.039
F1
1.15
1.5
0.045
0.067
F2
1.15
1.5
0.045
0.067
G
4.95
5.2
0.195
0.204
G1
2.4
2.7
0.094
0.106
H
10
10.4
0.393
0.409
L2
16
0.630
28.6
30.6
1.126
1.204
L4
9.8
10.6
.0385
0.417
L5
2.9
3.6
0.114
0.141
L6
15.9
16.4
0.626
0.645
L7
9
9.3
0.354
0.366
Ø
3
3.2
0.118
0.126
B
D
A
E
L3
L3
L6
F2
H
G
G1
¯
F
F1
L7
L2
L5
1 2 3
L4
7/8
STGP10NB60SDFP
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from
its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications
mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information
previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or
systems without express written approval of STMicroelectronics.
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© 2002 STMicroelectronics - Printed in Italy - All Rights Reserved
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