NEC NP55N04SUG

DATA SHEET
MOS FIELD EFFECT TRANSISTOR
NP55N04SUG
SWITCHING
N-CHANNEL POWER MOSFET
ORDERING INFORMATION
DESCRIPTION
The NP55N04SUG is N-channel MOS Field Effect Transistor
designed for high current switching applications.
PART NUMBER
PACKAGE
NP55N04SUG
TO-252 (MP-3ZK)
FEATURES
(TO-252)
• Channel temperature 175 degree rating
• Super low on-state resistance
RDS(on) = 6.5 mΩ MAX. (VGS = 10 V, ID = 28 A)
• Low input capacitance
Ciss = 3400 pF TYP. (VDS = 25 V)
ABSOLUTE MAXIMUM RATINGS (TA = 25°C)
Drain to Source Voltage (VGS = 0 V)
VDSS
40
V
Gate to Source Voltage (VDS = 0 V)
VGSS
±20
V
Drain Current (DC) (TC = 25°C)
ID(DC)
±55
A
ID(pulse)
±220
A
Drain Current (pulse)
<R>
Note1
Total Power Dissipation (TC = 25°C)
PT1
77
W
Total Power Dissipation (TA = 25°C)
PT2
1.2
W
Channel Temperature
Tch
175
°C
Tstg
−55 to +175
°C
Repetitive Avalanche Current
Note2
IAR
30
A
Repetitive Avalanche Energy
Note2
EAR
90
mJ
Storage Temperature
Notes 1. PW ≤ 10 μs, Duty Cycle ≤ 1%
2. Tch ≤ 150°C, VDD = 20 V, RG = 25 Ω, VGS = 20 → 0 V
THERMAL RESISTANCE
<R>
Channel to Case Thermal Resistance
Rth(ch-C)
1.95
°C/W
Channel to Ambient Thermal Resistance
Rth(ch-A)
125
°C/W
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all products and/or types are available in every country. Please check with an NEC Electronics
sales representative for availability and additional information.
Document No. D17401EJ2V0DS00 (2nd edition)
Date Published May 2007 NS CP(K)
Printed in Japan
The mark <R> shows major revised points.
The revised points can be easily searched by copying an "<R>" in the PDF file and specifying it in the "Find what:" field.
2004
NP55N04SUG
ELECTRICAL CHARACTERISTICS (TA = 25°C)
CHARACTERISTICS
SYMBOL
TEST CONDITIONS
MIN.
TYP.
MAX.
UNIT
Zero Gate Voltage Drain Current
IDSS
VDS = 40 V, VGS = 0 V
1
μA
Gate Leakage Current
IGSS
VGS = ±20 V, VDS = 0 V
±100
nA
VGS(th)
VDS = VGS, ID = 250 μA
2.0
3.0
4.0
V
| yfs |
VDS = 10 V, ID = 28 A
12
23
RDS(on)
VGS = 10 V, ID = 28 A
Input Capacitance
Ciss
Output Capacitance
Gate to Source Threshold Voltage
Forward Transfer Admittance
Note
Drain to Source On-state Resistance
Note
S
5.0
6.5
mΩ
VDS = 25 V,
3400
5100
pF
Coss
VGS = 0 V,
320
480
pF
Reverse Transfer Capacitance
Crss
f = 1 MHz
210
380
pF
Turn-on Delay Time
td(on)
VDD = 20 V, ID = 28 A,
30
66
ns
Rise Time
tr
VGS = 10 V,
52
130
ns
Turn-off Delay Time
td(off)
RG = 0 Ω
78
156
ns
Fall Time
tf
12
30
ns
Total Gate Charge
QG
VDD = 32 V,
63
95
nC
Gate to Source Charge
QGS
VGS = 10 V,
12
nC
QGD
ID = 55 A
20
nC
VF(S-D)
IF = 55 A, VGS = 0 V
0.94
Reverse Recovery Time
trr
IF = 55 A, VGS = 0 V,
37
ns
Reverse Recovery Charge
Qrr
di/dt = 100 A/μs
40
nC
Gate to Drain Charge
Body Diode Forward Voltage
Note
1.5
V
Note Pulsed
TEST CIRCUIT 1 AVALANCHE CAPABILITY
D.U.T.
RG = 25 Ω
D.U.T.
L
50 Ω
PG.
VGS = 20 → 0 V
TEST CIRCUIT 2 SWITCHING TIME
RL
RG
PG.
VDD
VGS
VGS
Wave Form
0
VGS
10%
90%
VDD
VDS
90%
IAS
VDS
ID
VDS
τ
τ = 1 μs
Duty Cycle ≤ 1%
TEST CIRCUIT 3 GATE CHARGE
D.U.T.
IG = 2 mA
PG.
2
50 Ω
0
10%
10%
tr
td(off)
Wave Form
VDD
Starting Tch
90%
VDS
VGS
0
BVDSS
RL
VDD
Data Sheet D17401EJ2V0DS
td(on)
ton
tf
toff
NP55N04SUG
TYPICAL CHARACTERISTICS (TA = 25°C)
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
100
90
PT - Total Power Dissipation - W
dT - Percentage of Rated Power - %
120
100
80
60
40
20
80
70
60
50
40
30
20
10
0
0
0
25
50
75
100
125
150
0
175
25
TC - Case Temperature - °C
<R>
50
75
100
125
150
175
TC - Case Temperature - °C
FORWARD BIAS SAFE OPERATING AREA
o
S(
100
n)
RD S
G
(V
ID(pulse)
d
it e
Li m V )
0
i
=1
PW
=1
i
ID(DC)
00
μs
1i
DC
i
m
m
i
s
B
n
w
n
d
it e
m
Li
d
it e
m
Li
do
ke
ra
t io
pa
y
ar
nd
si
is
1
TC = 25°C
Single Pulse
0.1
1
10
100
VDS - Drain to Source Voltage - V
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
<R>
rth(t) - Transient Thermal Resistance - °C/W
0.1
1i 0
s
D
er
10
co
Se
w
Po
ID - Drain Current - A
1000
1000
Rth(ch-A) = 125°C/W
100
10
Rth(ch-C) = 1.95°C/W
1
0.1
Single Pulse
0.01
100 μ
1m
10 m
100 m
1
10
100
1000
PW - Pulse Width - s
Data Sheet D17401EJ2V0DS
3
NP55N04SUG
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
FORWARD TRANSFER CHARACTERISTICS
1000
250
ID - Drain Current - A
200
ID - Drain Current - A
VDS = 10 V
Pulsed
100
V GS = 10 V
150
100
50
10
TA = −55°C
25°C
125°C
175°C
1
0.1
0.01
Pulsed
0
0.001
0
0.4
0.8
1.2
1.6
2
0
1
VDS - Drain to Source Voltage - V
| yfs | - Forward Transfer Admittance - S
3.5
3
2.5
2
1.5
1
VDS = VGS
ID = 250 μA
0
-100
-50
0
50
100
150
4
5
6
100
VDS = 10 V
Pulsed
TA = −55°C
25°C
125°C
175°C
10
1
200
0.1
1
10
100
1000
Tch - Channel Temperature - °C
ID - Drain Current - A
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
DRAIN CURRENT
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
10
8
6
VGS = 10 V
4
2
Pulsed
0
1
10
100
1000
10
ID - Drain Current - A
4
3
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
RDS(on) - Drain to Source On-state Resistance - mΩ
RDS(on) - Drain to Source On-state Resistance - mΩ
VGS(th) - Gate to Source Threshold Voltage - V
GATE TO SOURCE THRESHOLD VOLTAGE vs.
CHANNEL TEMPERATURE
0.5
2
VGS - Gate to Source Voltage - V
8
28 A
ID = 55 A
6
4
2
Pulsed
0
0
4
8
12
16
VGS - Gate to Source Voltage - V
Data Sheet D17401EJ2V0DS
20
NP55N04SUG
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
10
10000
Ciss, Coss, Crss - Capacitance - pF
8
6
4
VGS = 10 V
ID = 28 A
Pulsed
2
0
-100
Ciss
1000
0
50
100
150
200
0.1
1
10
100
VDS - Drain to Source Voltage - V
SWITCHING CHARACTERISTICS
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
50
1000
VDD = 20 V
VGS = 10 V
RG = 0 Ω
100
td(off)
tr
td(on)
tf
10
10
45
VDS - Drain to Source Voltage - V
td(on), tr, td(off), tf - Switching Time - ns
Crss
100
-50
Tch - Channel Temperature - °C
VDD = 32 V
20 V
8V
40
35
8
30
6
VGS
25
20
4
15
10
ID = 55 A
Pulsed
VDS
5
1
2
0
0.1
1
10
100
0
0
ID - Drain Current - A
10
20
30
40
50
60
70
QG - Gate Charge - nC
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
REVERSE RECOVERY TIME vs.
DIODE FORWARD CURRENT
100
1000
VGS = 10 V
100
10
trr - Reverse Recovery Time - ns
IF - Diode Forward Current - A
Coss
VGS = 0 V
f = 1 MHz
0V
1
0.1
Pulsed
0.01
di/dt = 100 A/μs
VGS = 0 V
10
0
0.5
1
1.5
VF(S-D) - Source to Drain Voltage - V
0.1
1
10
100
IF - Diode Forward Current - A
Data Sheet D17401EJ2V0DS
5
VGS - Gate to Source Voltage - V
RDS(on) - Drain to Source On-state Resistance - mΩ
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
NP55N04SUG
PACKAGE DRAWING (Unit: mm)
TO-252 (MP-3ZK)
2.3±0.1
1.0 TYP.
6.5±0.2
5.1 TYP.
4.3 MIN.
0.5±0.1
No Plating
1.14 MAX.
3
0.51 MIN.
2
0.8
1
6.1±0.2
10.4 MAX. (9.8 TYP.)
4.0 MIN.
4
No Plating
0 to 0.25
0.5±0.1
0.76±0.12
2.3
2.3
1. Gate
2. Drain
3. Source
4. Fin (Drain)
1.0
EQUIVALENT CIRCUIT
Drain
Body
Diode
Gate
Source
Remark Strong electric field, when exposed to this device, can cause destruction of the gate oxide and ultimately
degrade the device operation. Steps must be taken to stop generation of static electricity as much as
possible, and quickly dissipate it once, when it has occurred.
6
Data Sheet D17401EJ2V0DS
NP55N04SUG
• The information in this document is current as of May, 2007. The information is subject to change
without notice. For actual design-in, refer to the latest publications of NEC Electronics data sheets or
data books, etc., for the most up-to-date specifications of NEC Electronics products. Not all
products and/or types are available in every country. Please check with an NEC Electronics sales
representative for availability and additional information.
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M8E 02. 11-1