PD-91490C IRFP3710 HEXFET® Power MOSFET l l l l l Advanced Process Technology Dynamic dv/dt Rating 175°C Operating Temperature Fast Switching Fully Avalanche Rated D VDSS = 100V RDS(on) = 0.025W G Description ID = 57A S Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-247 package is preferred for commercialindustrial applications where higher power levels preclude the use of TO-220 devices. The TO-247 is similar but superior to the earlier TO-218 package because of its isolated mounting hole. TO-247AC Absolute Maximum Ratings ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Parameter Max. Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 srew 57 40 180 200 1.3 ± 20 530 28 20 5.0 -55 to + 175 Units A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RqJC RqCS RqJA www.irf.com Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient Typ. Max. Units ––– 0.24 ––– 0.75 ––– 40 °C/W 1 IRFP3710 Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. 100 ––– ––– 2.0 20 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– 0.12 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 14 59 58 48 IDSS Drain-to-Source Leakage Current LD Internal Drain Inductance ––– 5.0 LS Internal Source Inductance ––– 13 Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance ––– ––– ––– 3000 640 330 V(BR)DSS DV(BR)DSS/DTJ IGSS Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 0.025 W VGS = 10V, ID = 28A 4.0 V VDS = VGS, ID = 250µA ––– S VDS = 25V, ID = 28A 25 VDS = 100V, VGS = 0V µA 250 VDS = 80V, VGS = 0V, TJ = 150°C 100 VGS = 20V nA -100 VGS = -20V 190 ID = 28A 26 nC VDS = 80V 82 VGS = 1.7V, See Fig. 6 and 13 ––– VDD = 50V ––– ID = 28A ns ––– RG = 2.5W ––– RD = 1.7W, See Fig. 10 D Between lead, ––– 6mm (0.25in.) nH G from package ––– and center of die contact S ––– VGS = 0V ––– pF VDS = 25V ––– ƒ = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol ––– ––– 57 showing the A G integral reverse ––– ––– 180 S p-n junction diode. ––– ––– 1.3 V TJ = 25°C, IS = 28A, VGS = 0V ––– 210 320 ns TJ = 25°C, IF = 28A ––– 1.7 2.6 µC di/dt = 100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) Starting TJ = 25°C, L = 1.4mH Pulse width £ 300µs; duty cycle £ 2%. Uses IRF3710 data and test conditions RG = 25W , IAS = 28A. (See Figure 12) ISD £ 28A, di/dt £ 460A/µs, VDD £ V(BR)DSS, TJ £ 175°C 2 www.irf.com IRFP3710 1000 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V 100 100 10 4.5V 20µ s P U LS E W ID TH TC = 25°C 1 0.1 1 10 A 4.5V 10 100 3.0 R D S (on) , D rain-to-S ource O n R esistance (N orm alized) T J = 2 5 °C 100 T J = 1 7 5 °C 10 VDS = 50V 2 0 µ s P U L S E W ID T H 5 6 7 8 9 V G S , G a te -to -S o u rce V o lta g e (V ) Fig 3. Typical Transfer Characteristics www.irf.com 10 A 100 Fig 2. Typical Output Characteristics 1000 4 1 V D S , D rain-to-S ource V oltage (V ) Fig 1. Typical Output Characteristics 1 20µ s P U LS E W ID TH T C = 175°C 1 0.1 V D S , D rain-to-S ource V oltage (V ) I D , D ra in -to-S o urc e C urren t (A ) VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP I , D rain-to-S ource C urrent (A ) D I , D rain-to-S ource C urrent (A ) D TOP 10 A I D = 46A 2.5 2.0 1.5 1.0 0.5 V G S = 10V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 180 T J , Junction T em perature (°C ) Fig 4. Normalized On-Resistance Vs. Temperature 3 IRFP3710 V GS C iss C rss C oss 5000 = = = = 20 0V , f = 1M H z C gs + C gd , C ds S H O R TE D C gd C ds + C gd V G S , G ate-to-S ource V oltage (V ) 6000 C , C apacitanc e (pF ) C is s 4000 3000 C os s 2000 C rs s 1000 0 10 V D S = 80V V D S = 50V V D S = 20V 16 12 8 4 FO R TE S T C IR C U IT S E E FIG U R E 13 0 A 1 I D = 28 A 100 0 V D S , D rain-to-S ource V oltage (V ) 120 160 A 200 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 1000 O P E R A TIO N IN TH IS A R E A LIM ITE D B Y R D S (on) I D , D rain C urrent (A ) I S D , R everse D rain C urrent (A ) 80 Q G , Total G ate C harge (nC ) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 100 T J = 17 5°C T J = 25°C 10 10µ s 100 100µ s 1m s 10 10m s V G S = 0V 1 0.4 0.8 1.2 1.6 V S D , S ource-to-D rain V oltage (V ) Fig 7. Typical Source-Drain Diode Forward Voltage 4 40 A 2.0 T C = 25°C T J = 175°C S ingle P ulse 1 1 A 10 100 1000 V D S , D rain-to-S ource V oltage (V ) Fig 8. Maximum Safe Operating Area www.irf.com IRFP3710 60 RD VDS I D , Drain Current (A) 50 VGS D.U.T. RG + -VDD 40 10V 30 Pulse Width £1 µs Duty Factor £ 0.1 % 20 Fig 10a. Switching Time Test Circuit 10 VDS 90% 0 25 50 75 100 125 150 175 TC , Case Temperature ( ° C) 10% VGS Fig 9. Maximum Drain Current Vs. Case Temperature td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 1 D = 0.50 0.20 0.1 0.10 P DM 0.05 t1 0.02 0.01 t2 SINGLE PULSE (THERMAL RESPONSE) Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.01 0.00001 0.0001 0.001 0.01 0.1 1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFP3710 15V L VDS D R IVE R D .U .T RG + V - DD IA S 20V 0 .01 Ω tp Fig 12a. Unclamped Inductive Test Circuit A E A S , S ingle P ulse A valanc he E nergy (m J) 1200 TO P 1000 B O TTO M ID 11A 20A 28 A 800 600 400 200 0 V D D = 25V 25 50 V (B R )D S S A 75 100 125 150 175 S tarting T J , Junction T em perature (°C ) tp Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .2µF .3µF + V - DS 10 V QGS D.U.T. QGD VGS VG 3mA Charge Fig 13a. Basic Gate Charge Waveform 6 IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit www.irf.com IRFP3710 Peak Diode Recovery dv/dt Test Circuit + D.U.T Circuit Layout Considerations · Low Stray Inductance · Ground Plane · Low Leakage Inductance Current Transformer + - - + RG · · · · Driver Gate Drive P.W. + dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test D= Period - VDD P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS www.irf.com 7 IRFP3710 Package Outline TO-247AC Outline Dimensions are shown in millimeters (inches) -D - 3.65 (.143) 3.55 (.140) 15.90 (.626) 15.30 (.602) -B- 0.25 (.010) M D B M -A5.50 (.217) 20.30 (.800) 19.70 (.775) 2X 1 2 NOTES: 5.50 (.217) 4.50 (.177) 1 D IM E N S IO N IN G & TO LE R A N C IN G P E R A N S I Y 14.5M , 1982. 2 C O N TR O LLIN G D IM E N S IO N : IN C H . 3 C O N F O R M S TO JE D E C O U TLIN E T O -247-A C . 3 -C - 14.80 (.583) 14.20 (.559) 2.40 (.094) 2.00 (.079) 2X 5.45 (.215) 2X 5.30 (.209) 4.70 (.185) 2.50 (.089) 1.50 (.059) 4 4.30 (.170) 3.70 (.145) 0.80 (.031) 3X 0.40 (.016) 1.40 (.056) 3X 1.00 (.039) 0.25 (.010) M 2.60 (.102) 2.20 (.087) C A S 3.40 (.133) 3.00 (.118) LE A D A S S IG N M E N TS 1 2 3 4 - G A TE D R A IN SOURCE D R A IN Part Marking Information TO-247AC E X A M P L E : TH IS IS A N IR F P E 3 0 W ITH A S S E M B L Y LOT CODE 3A1Q A IN TE R N A TIO N A L R E C T IF IE R LOGO PART NUMBER IR F P E 3 0 3A 1 Q 9 3 0 2 ASSEMBLY LOT CODE D A TE C O D E (Y YW W ) YY = YEAR W W W EEK WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 IR GREAT BRITAIN: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 838 4630 IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673, Taiwan Tel: 886-2-2377-9936 http://www.irf.com/ Data and specifications subject to change without notice. 10/98 8 www.irf.com