PD - 91479B IRF6215 HEXFET® Power MOSFET Advanced Process Technology Dynamic dv/dt Rating l 175°C Operating Temperature l Fast Switching l P-Channel l Fully Avalanche Rated Description l D l VDSS = -150V RDS(on) = 0.29Ω G ID = -13A S Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-220 package is universally preferred for all commercial-industrial applications at power dissipation levels to approximately 50 watts. The low thermal resistance and low package cost of the TO-220 contribute to its wide acceptance throughout the industry. TO-220AB Absolute Maximum Ratings ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Parameter Max. Continuous Drain Current, VGS @ -10V Continuous Drain Current, VGS @ -10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 screw -13 -9.0 -44 110 0.71 ± 20 310 -6.6 11 -5.0 -55 to + 175 Units A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RθJC RθCS RθJA Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient Typ. Max. Units ––– 0.50 ––– 1.4 ––– 62 °C/W 5/13/98 IRF6215 Electrical Characteristics @ TJ = 25°C (unless otherwise specified) ∆V(BR)DSS/∆TJ Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient RDS(on) Static Drain-to-Source On-Resistance VGS(th) gfs Gate Threshold Voltage Forward Transconductance IDSS Drain-to-Source Leakage Current V(BR)DSS Min. -150 ––– ––– ––– -2.0 3.6 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time LD Internal Drain Inductance ––– LS Internal Source Inductance ––– Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance ––– ––– ––– IGSS Typ. ––– -0.20 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 14 36 53 37 Max. Units Conditions ––– V VGS = 0V, ID = 250µA ––– V/°C Reference to 25°C, ID = 1mA 0.29 VGS = -10V, ID = -6.6A , TJ = 25°C Ω 0.58 VGS = -10V, ID = -6.6A , TJ = 150°C -4.0 V VDS = VGS, ID = -250µA ––– S VDS = -50V, ID = -6.6A -25 VDS = -150V, VGS = 0V µA -250 VDS = -120V, VGS = 0V, TJ = 150°C 100 VGS = 20V nA -100 VGS = -20V 66 ID = -6.6A 8.1 nC VDS = -120V 35 VGS = -10V, See Fig. 6 and 13 ––– VDD = -75V ––– ID = -6.6A ns ––– RG = 6.8Ω ––– RD = 12Ω, See Fig. 10 D Between lead, 4.5 ––– 6mm (0.25in.) nH G from package 7.5 ––– and center of die contact S 860 ––– VGS = 0V 220 ––– pF VDS = -25V 130 ––– ƒ = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS ISM VSD trr Q rr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol ––– ––– -13 showing the A G integral reverse ––– ––– -44 p-n junction diode. S ––– ––– -1.6 V TJ = 25°C, IS = -6.6A, VGS = 0V ––– 160 240 ns TJ = 25°C, IF = -6.6A ––– 1.2 1.7 µC di/dt = -100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) Starting TJ = 25°C, L = 14mH RG = 25Ω, IAS = -6.6A. (See Figure 12) ISD ≤ -6.6A, di/dt ≤ -620A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Pulse width ≤ 300µs; duty cycle ≤ 2%. IRF6215 100 100 VGS - 15V - 10V - 8.0V - 7.0V - 6.0V - 5.5V - 5.0V BOTTOM - 4.5V VGS - 15V - 10V - 8.0V - 7.0V - 6.0V - 5.5V - 5.0V BOTTOM - 4.5V TOP -ID , D rain-to-S ource C urrent (A ) -ID , D rain-to-S ource C urrent (A ) TOP 10 20 µ s P U L S E W ID TH TJc = 25 °C A -4 .5 V 1 1 10 10 -4 .5V 2 0µ s P U LS E W ID T H TJ C = 1 75 °C 1 100 1 10 -VD S , D rain-to-S ource V oltage (V ) -VD S , D rain-to-S ource V oltage (V ) Fig 1. Typical Output Characteristics, Fig 2. Typical Output Characteristics, 2.5 R D S (on) , Drain-to-S ource O n Resistance (N orm alized) -I D , D rain-to-S ource C urrent (A) 100 TJ = 2 5 °C T J = 1 7 5 °C 10 V D S = -5 0 V 2 0 µ s P U L S E W ID T H 1 4 5 6 7 8 9 -VG S , G a te -to -S o u rc e V o lta g e (V ) Fig 3. Typical Transfer Characteristics A 100 10 A I D = -11 A 2.0 1.5 1.0 0.5 VG S = -1 0V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 180 T J , Junction T em perature (°C ) Fig 4. Normalized On-Resistance Vs. Temperature IRF6215 V GS C is s C rs s C o ss C , Capacitance (pF) 1600 = = = = 20 0V , f = 1M H z C g s + C g d , Cd s S H O R T E D C gd C d s + C gd -V G S , G ate-to-S ource V oltage (V ) 2000 C iss 1200 C oss 800 C rss 400 0 10 16 12 8 4 FO R TE S T CIR C U IT S E E FIG U R E 1 3 100 0 -VD S , D rain-to-S ourc e V oltage (V ) 20 40 60 A 80 Q G , Total G ate C harge (nC ) Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage 100 100 O P E R A TIO N IN TH IS A R E A L IM ITE D B Y R D S (o n) 10µ s -I D , D rain C urrent (A) -I S D , Reverse D rain Current (A ) V D S = -12 0V V D S = -75 V V D S = -30 V 0 A 1 I D = -6 .6 A TJ = 17 5 °C 10 T J = 25 °C 1 100µ s 10 1m s V G S = 0V 0.1 0.2 0.6 1.0 1.4 -VS D , S ourc e-to-D rain V oltage (V ) Fig 7. Typical Source-Drain Diode Forward Voltage A 1.8 T C = 25 °C T J = 17 5°C S ing le P u lse 1 1 10m s 10 100 -VD S , D rain-to-S ourc e V oltage (V ) Fig 8. Maximum Safe Operating Area A 1000 IRF6215 15 RD VDS VGS 12 D.U.T. -I D , Drain Current (A) RG + VDD 9 -10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 6 Fig 10a. Switching Time Test Circuit 3 td(on) tr t d(off) tf VGS 10% 0 25 50 75 100 125 150 175 TC , Case Temperature ( ° C) Fig 9. Maximum Drain Current Vs. Case Temperature 90% VDS Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 1 D = 0.50 0.20 0.10 0.1 0.01 0.00001 PDM 0.05 0.02 0.01 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 1 IRF6215 D .U .T RG A IA S -2 0 V tp VD D D R IV E R 0 .0 1Ω 15V Fig 12a. Unclamped Inductive Test Circuit IAS E A S , S ingle Pulse Avalanc he E nergy (m J) 800 L VDS TOP B O T TO M ID -2 .7A -4 .7A -6.6 A 600 400 200 0 A 25 50 75 100 125 150 S tarting T J , J unc tion T em perature (°C ) Fig 12c. Maximum Avalanche Energy Vs. Drain Current tp V (BR)DSS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .2µF .3µF -10V QGS QGD D.U.T. +VDS VGS VG -3mA Charge Fig 13a. Basic Gate Charge Waveform IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit 175 IRF6215 Peak Diode Recovery dv/dt Test Circuit + D.U.T* Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • dv/dt controlled by RG • ISD controlled by Duty Factor "D" • D.U.T. - Device Under Test RG VGS * + - VDD Reverse Polarity of D.U.T for P-Channel Driver Gate Drive P.W. D= Period P.W. Period [VGS=10V ] *** D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode [VDD] Forward Drop Inductor Curent Ripple ≤ 5% *** VGS = 5.0V for Logic Level and 3V Drive Devices Fig 14. For P-Channel HEXFETS [ ISD ] IRF6215 Package Outline TO-220AB Outline Dimensions are shown in millimeters (inches) 2.87 (.11 3) 2.62 (.10 3) 10 .54 (.4 15) 10 .29 (.4 05) 3 .7 8 (.149 ) 3 .5 4 (.139 ) -A - -B 4.69 ( .18 5 ) 4.20 ( .16 5 ) 1 .32 (.05 2) 1 .22 (.04 8) 6.47 (.25 5) 6.10 (.24 0) 4 1 5.24 (.60 0) 1 4.84 (.58 4) 1.15 (.04 5) M IN 1 2 1 4.09 (.55 5) 1 3.47 (.53 0) 4.06 (.16 0) 3.55 (.14 0) 3X 3X L E A D A S S IG NM E NT S 1 - GATE 2 - D R A IN 3 - S O U RC E 4 - D R A IN 3 1 .4 0 (.0 55 ) 1 .1 5 (.0 45 ) 0.93 (.03 7) 0.69 (.02 7) 0 .3 6 (.01 4) 3X M B A M 2.54 (.10 0) 0.55 (.02 2) 0.46 (.01 8) 2 .92 (.11 5) 2 .64 (.10 4) 2X N O TE S : 1 D IM E N S IO N IN G & TO L E R A N C ING P E R A N S I Y 1 4.5M , 1 9 82. 2 C O N TR O L LIN G D IM E N S IO N : IN C H 3 O U T LIN E C O N F O R M S TO JE D E C O U T LIN E TO -2 20 A B . 4 H E A TS IN K & LE A D M E A S U R E M E N T S D O N O T IN C LU DE B U R R S . Part Marking Information TO-220AB : IS TH IS A ISN AIR N F1 IR0F1 E X AEMXPA LMEP :L ETH 1 00 1 0 W ITWH ITAHS SAESMS BE LMYB L Y C EO D9EB 19MB 1 M L O TL OCTO D A INRTE N A TIO IN TE N ARTIO N A LN A L E C IE TIFR IE R R E CRTIF IR F IR 10F110 0 10 L O GL O G O 9 2 4962 4 6 9B 9B1 M 1 M A S SAESMS BE LMYB L Y C EO D E L O TL O TC O D A NB U EMRB E R P A RPTA RNTU M D A TE C EO D E D A TE COD (Y Y(Y W YWW) W ) Y Y Y=Y Y=E AYRE A R W WW W = W= EW E KE E K WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 5/98