FAIRCHILD FDB2614

FDB2614
tm
200V N-Channel PowerTrench MOSFET
General Description
Description
This N-Channel MOSFET is produced using Fairchild Semiconductor’s advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet
maintain superior switching performance.
•
•
•
•
•
62A, 200V, RDS(on) = 22.9mΩ @VGS = 10 V
Fast switching speed
Low gate charge
High performance trench technology for extremely low RDS(on)
High power and current handling capability
Application
• PDP application
D
D
G
G
S
S
Absolute Maximum Ratings
Symbol
Parameter
Ratings
Unit
200
V
± 30
V
62
39.3
A
A
(Note 1)
see Figure 9
A
Single Pulsed Avalanche Energy
(Note 2)
145
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
PD
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
TL
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
VDS
Drain-Source Voltage
VGS
Gate-Source Voltage
ID
Drain Current
- Continuous (TC = 25°C)
- Continuous (TC = 100°C)
IDM
Drain Current
- Pulsed
EAS
4.5
V/ns
260
2.1
W
W/°C
-55 to +150
°C
300
°C
(TC = 25°C)
- Derate above 25°C
*Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol
Parameter
Min.
Max.
Unit
0.48
°C/W
RθJC
Thermal Resistance, Junction-to-Case
--
RθJA*
Thermal Resistance, Junction-to-Ambient*
--
40
°C/W
RθJA
Thermal Resistance, Junction-to-Ambient
--
62.5
°C/W
*When mounted on the minimum pad size recommended (PCB Mount)
©2006 Fairchild Semiconductor Corporation
FDB2614 Rev. A
1
www.fairchildsemi.com
FDB2614 200V N-Channel PowerTrench MOSFET
November 2006
Device Marking
Device
FDB2614
Reel Size
Tape Width
Quantity
330mm
24mm
800
2
FDB2614
Electrical Characteristics
Symbol
Package
D -PAK
TC = 25°C unless otherwise noted
Parameter
Conditions
Min
Typ
Max Units
Off Characteristics
BVDSS
Drain-Source Breakdown Voltage
VGS = 0V, ID = 250µA, TJ = 25°C
200
--
--
V
∆BVDSS
/ ∆TJ
Breakdown Voltage Temperature
Coefficient
ID = 250µA, Referenced to 25°C
--
0.2
--
V/°C
IDSS
Zero Gate Voltage Drain Current
VDS = 200V, VGS = 0V
VDS = 200V, VGS = 0V, TJ = 125°C
---
---
1
500
µA
µA
IGSSF
Gate-Body Leakage Current, Forward
VGS = 30V, VDS = 0V
--
--
100
nA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = -30V, VDS = 0V
--
--
-100
nA
3.0
4.0
5.0
V
--
22.9
27
mΩ
--
72
--
S
--
5435
7230
pF
--
505
675
pF
--
110
165
pF
--
77
165
ns
--
284
560
ns
--
103
220
ns
--
162
335
ns
--
76
99
nC
--
35
--
nC
--
18
--
nC
On Characteristics
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
RDS(on)
Static Drain-Source On-Resistance
VGS = 10V, ID = 31A
gFS
Forward Transconductance
VDS = 10V, ID = 31A
(Note 4)
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
VDS = 25V, VGS = 0V
f = 1.0MHz
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
Qg
Total Gate Charge
Qgs
Gate-Source Charge
Qgd
Gate-Drain Charge
VDD = 100V, ID = 62A
VGS = 10V, RGEN = 25Ω
(Note 4, 5)
VDS = 100V, ID = 62A
VGS = 10V
(Note 4, 5)
Drain-Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
62
A
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
186
A
VSD
Drain-Source Diode Forward Voltage
VGS = 0V, IS = 62A
--
--
1.2
V
trr
Reverse Recovery Time
145
--
ns
Reverse Recovery Charge
VGS = 0V, IS = 62A
dIF/dt =100A/µs
--
Qrr
--
0.81
--
µC
(Note 4)
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 1mH, IAS = 17A, VDD = 50V, RG = 25Ω, Starting TJ = 25°C
3. ISD ≤ 62A, di/dt ≤ 100A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5. Essentially Independent of Operating Temperature Typical Characteristics
FDB2614 Rev. A
2
www.fairchildsemi.com
FDB2614 200V N-Channel PowerTrench MOSFET
Package Marking and Ordering Information
Figure 2. Transfer Characteristics
1000
V GS
Top :
15.0 V
10.0 V
8.0 V
7.0 V
6.5 V
6.0 V
Bottom : 5.5 V
100
ID,Drain Current[A]
ID,Drain Current[A]
500
10
* Notes :
1. V DS = 10V
2. 250 µ s Pulse Test
100
o
150 C
10
o
-55 C
* Notes :
1. 250µ s Pulse Test
o
25 C
o
1
0.1
2. T C = 25 C
1
V DS,Drain-Source Voltage[V]
1
10
Figure 3. On-Resistance Variation vs. Drain
Current and Gate Voltage
0.06
IDR, Reverse Drain Current [A]
RDS(ON) [Ω],
Drain-Source On-Resistance
0.05
VGS = 10V
0.03
VGS = 20V
0.02
* Notes :
1. VGS = 0V
2. ID = 250µ A
100
o
10
1
0.2
200
VGS, Gate-Source Voltage [V]
Capacitances [pF]
C oss
FDB2614 Rev. A
* Note:
1. VGS = 0V
2. f = 1MHz
1
10
V DS, Drain-Source Voltage [V]
1.0
1.2
V DS = 40V
6000
0
0.1
0.8
10
C iss
C rss
0.6
Figure 6. Gate Charge Characteristics
C iss = C gs + C gd ( C ds = shorted )
C oss = C ds + C gd
C rss = C gd
3000
0.4
V SD , Source-Drain voltage [V]
Figure 5. Capacitance Characteristics
9000
o
T A = 150 C
T A = 25 C
0.015
50
100
150
ID, Drain Current [A]
8
1000
o
0
4
6
V GS ,Gate-Source Voltage[V]
Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature
* Note : T J = 25 C
0.04
2
3
V DS = 160V
6
4
2
0
30
V DS = 100V
8
* Note : ID = 62A
0
20
40
60
80
Q g , Total Gate Charge [nC]
100
www.fairchildsemi.com
FDB2614 200V N-Channel PowerTrench MOSFET
Figure 1. On-Region Characteristics
Figure 8. On-Resistance Variation vs. Temperature
3.0
rDS(on), [Normalized]
1.1
1.0
0.9
0.8
-100
* Notes :
1. VGS = 0V
2. ID = 250 µ A
-50
0
50
100
o
T J, Junction Temperature [ C]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.2
2.5
2.0
1.5
1.0
0.0
-100
150
Figure 9. Maximum Safe Operating Area
* Notes :
1. VGS = 10V
2. ID = 31A
0.5
-50
0
50
100
150
o
TJ, Junction Temperature [ C ]
200
Figure 10. Maximum Drain Current vs. CaseTemperature
1000
100
60
100 µs
ID, Drain Current [A]
ID, Drain Current [A]
70
1ms
10
10 ms
Operation in This Area
is Limited by R DS(on)
1
DC
* Notes :
40
30
20
o
0.1
1. TC = 25 C
10
o
0.01
50
2. TJ = 150 C
3. Single Pulse
1
10
100
VDS, Drain-Source Voltage [V]
0
25
400
50
75
100
125
o
T C , Case Temperature [ C ]
150
Figure 11. Transient Thermal Response Curve
Thermal Response [ZθJC]
10
0
0.5
10
-1
0.2
PDM
0.1
t1
0.05
10
-2
0.02
0.01
t2
* Notes :
o
1. Zθ JC(t) = 0.48 C/W Max.
2. Duty Factor, D=t1/t2
3. TJM - TC = PDM * Zθ JC(t)
Single pulse
10
-3
10
-5
10
-4
-3
10
10
-2
-1
10
0
10
10
1
Rectangular Pulse Duration [sec]
FDB2614 Rev. A
4
www.fairchildsemi.com
FDB2614 200V N-Channel PowerTrench MOSFET
Figure 7. Breakdown Voltage Variation vs.
Temperature
FDB2614 200V N-Channel PowerTrench MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDB2614 Rev. A
5
www.fairchildsemi.com
FDB2614 200V N-Channel PowerTrench MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FDB2614 Rev. A
6
www.fairchildsemi.com
FDB2614 200V N-Channel PowerTrench MOSFET
www.fairchildsemi.com
7
FDB2614 Rev. A
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be
an exhaustive list of all such trademarks.
OCX™
SILENT SWITCHER®
UniFET™
FACT Quiet Series™
ACEx™
OCXPro™
UltraFET®
GlobalOptoisolator™
ActiveArray™
SMART START™
OPTOLOGIC®
GTO™
Bottomless™
SPM™
VCX™
HiSeC™
Build it Now™
Stealth™
Wire™
OPTOPLANAR™
I2C™
CoolFET™
SuperFET™
PACMAN™
CROSSVOLT™
SuperSOT™-3
POP™
i-Lo™
DOME™
SuperSOT™-6
Power820417™
ImpliedDisconnect™
EcoSPARK™
SuperSOT™-8
PowerEdge™
IntelliMAX™
E2CMOS™
SyncFET™
PowerSaver™
ISOPLANAR™
TCM™
PowerTrench®
LittleFET™
EnSigna™
TinyBoost™
MICROCOUPLER™
FACT™
QFET®
TinyBuck™
MicroFET™
FAST®
QS™
TinyPWM™
MicroPak™
QT Optoelectronics™
FASTr™
TinyPower™
MICROWIRE™
Quiet Series™
FPS™
TinyLogic®
MSX™
RapidConfigure™
FRFET™
MSXPro™
RapidConnect™
TINYOPTO™
µSerDes™
Across the board. Around the world.™
TruTranslation™
ScalarPump™
The Power Franchise®
UHC™
Programmable Active Droop™
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO
IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF
ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF
OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE
WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT
THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems which,
(a) are intended for surgical implant into the body, or (b) support
or sustain life, or (c) whose failure to perform when properly used
in accordance with instructions for use provided in the labeling,
can be reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life support device
or system whose failure to perform can be reasonably expected to
cause the failure of the life support device or system, or to affect
its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I20
8
FDB2614 Rev. A
www.fairchildsemi.com
FDB2614 200V N-Channel PowerTrench MOSFET
TRADEMARKS