ONSEMI NSS30100LT1G

NSS30100LT1G
30 V, 2 A, Low VCE(sat)
PNP Transistor
ON Semiconductor’s e2 PowerEdge family of low VCE(sat)
transistors are miniature surface mount devices featuring ultra low
saturation voltage (VCE(sat)) and high current gain capability. These
are designed for use in low voltage, high speed switching applications
where affordable efficient energy control is important.
Typical application are DC−DC converters and power management
in portable and battery powered products such as cellular and cordless
phones, PDAs, computers, printers, digital cameras and MP3 players.
Other applications are low voltage motor controls in mass storage
products such as disc drives and tape drives. In the automotive
industry they can be used in air bag deployment and in the instrument
cluster. The high current gain allows e2PowerEdge devices to be
driven directly from PMU’s control outputs, and the Linear Gain
(Beta) makes them ideal components in analog amplifiers.
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30 VOLTS
2.0 AMPS
PNP LOW VCE(sat) TRANSISTOR
EQUIVALENT RDS(on) 200 mW
COLLECTOR
3
• This is a Pb−Free Device
1
BASE
MAXIMUM RATINGS (TA = 25°C)
Rating
Symbol
Max
Unit
Collector-Emitter Voltage
VCEO
−30
Vdc
Collector-Base Voltage
VCBO
−50
Vdc
Emitter-Base Voltage
VEBO
−5.0
Vdc
IC
−1.0
A
ICM
−2.0
A
Collector Current − Continuous
Collector Current − Peak
2
EMITTER
3
1
THERMAL CHARACTERISTICS
2
Characteristic
SOT−23 (TO−236)
CASE 318
STYLE 6
Symbol
Max
Unit
PD (Note 1)
310
mW
2.5
mW/°C
RθJA (Note 1)
403
°C/W
PD (Note 2)
710
mW
3
5.7
mW/°C
VS4
RθJA (Note 2)
176
°C/W
Total Device Dissipation
(Single Pulse < 10 sec.)
PDsingle
(Note 3)
575
mW
Junction and Storage
Temperature Range
TJ, Tstg
−55 to
+150
°C
Total Device Dissipation
TA = 25°C
Derate above 25°C
Thermal Resistance,
Junction to Ambient
Total Device Dissipation
TA = 25°C
Derate above 25°C
Thermal Resistance,
Junction to Ambient
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. FR−4 @ Minimum Pad.
2. FR−4 @ 1.0 X 1.0 inch Pad.
3. Refer to Figure 8.
© Semiconductor Components Industries, LLC, 2005
June, 2005 − Rev. 0
1
DEVICE MARKING
2
1
VS4 = Specific Device Code
ORDERING INFORMATION
Device
Package
Shipping†
NSS30100LT1G
SOT−23
(Pb−Free)
3000/Tape & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specification
Brochure, BRD8011/D.
Publication Order Number:
NSS30100L/D
NSS30100LT1G
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Max
−30
−
−50
−
−5.0
−
−
−0.1
−
−0.1
−
−0.1
100
100
80
40
−
300
−
−
−
−
−
−0.25
−0.30
−0.65
−
−1.2
−
−1.1
100
−
−
15
Unit
OFF CHARACTERISTICS
Collector −Emitter Breakdown Voltage
(IC = −10 mAdc, IB = 0)
V(BR)CEO
Collector −Base Breakdown Voltage
(IC = −0.1 mAdc, IE = 0)
V(BR)CBO
Emitter −Base Breakdown Voltage
(IE = −0.1 mAdc, IC = 0)
V(BR)EBO
Collector Cutoff Current
(VCB = −30 Vdc, IE = 0)
ICBO
Collector−Emitter Cutoff Current
(VCES = −30 Vdc)
ICES
Emitter Cutoff Current
(VEB = −4.0 Vdc)
IEBO
Vdc
Vdc
Vdc
mAdc
mAdc
mAdc
ON CHARACTERISTICS
hFE
DC Current Gain (Note 4) (Figure 1)
(IC = −1.0 mA, VCE = −2.0 V)
(IC = −500 mA, VCE = −2.0 V)
(IC = −1.0 A, VCE = −2.0 V)
(IC = 2.0 A, VCE = −2.0 V)
Collector −Emitter Saturation Voltage (Note 4) (Figure 3)
(IC = −0.5 A, IB = −0.05 A)
(IC = −1.0 A, IB = 0.1 A)
(IC = −2.0 A, IB = −0.2 A)
VCE(sat)
Base −Emitter Saturation Voltage (Note 4) (Figure 2)
(IC = −1.0 A, IB = −0.1 A)
VBE(sat)
Base −Emitter Turn−on Voltage (Note 4)
(IC = −1.0 A, VCE = −2.0 V)
VBE(on)
Cutoff Frequency
(IC = −100 mA, VCE = −5.0 V, f = 100 MHz)
V
V
V
fT
Output Capacitance (f = 1.0 MHz)
Cobo
4. Pulsed Condition: Pulse Width = 300 msec, Duty Cycle ≤ 2%.
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2
MHz
pF
NSS30100LT1G
200
230
210
170
150
100
25°C
130
110
50
90
−55°C
70
0
0.01
0.001
0.1
1.0
50
10
Figure 2. DC Current Gain versus
Collector Current
1.0
VBE(sat) , BASE EMITTER SATURATION
VOLTAGE (VOLTS)
V, VOLTAGE (VOLTS)
1000
Figure 1. DC Current Gain versus
Collector Current
VBE(sat)
0.8
0.7
VBE(on)
0.6
0.5
0.4
0.3
0.2
0.1
VCE(sat)
1.0
100
10
1000
IC/IB = 100
0.7
0.65
0.6
0.55
0.5
VCE(sat) , COLLECTOR EMITTER SATURATION
VOLTAGE (VOLTS)
0.4
100 mA
50 mA
0.1
0.8
0.75
0.001
0.01
0.1
1.0
10
Figure 4. Base Emitter Saturation Voltage
versus Collector Current
1000 mA
0.01
IC/IB = 10
Figure 3. “On” Voltages
0.6
10 mA
0.9
0.85
IC, COLLECTOR CURRENT (AMPS)
0.8
0.2
0.95
IC, COLLECTOR CURRENT (mA)
1.0
0
100
IC, COLLECTOR CURRENT (mA)
0.9
0
10
1.0
IC, COLLECTOR CURRENT (AMPS)
1.0
VCE , COLLECTOR−EMITTER VOLTAGE (VOLTS)
VCE = −1.0 V
125°C
190
150
h FE , DC CURRENT GAIN
h FE , DC CURRENT GAIN
VCE = −2.0 V
1.0
10
100
1000
1.8
1.6
IC/IB = 100
1.4
1.2
1.0
0.8
0.6
IC/IB = 10
0.4
0.2
0
0.001
0.01
0.1
1.0
IB, BASE CURRENT (mA)
IC, COLLECTOR CURRENT (AMPS)
Figure 5. Collector Emitter Saturation Voltage
versus Collector Current
Figure 6. Collector Emitter Saturation Voltage
versus Collector Current
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3
10
NSS30100LT1G
IC , COLLECTOR CURRENT (AMPS)
10
SINGLE PULSE TEST AT Tamb = 25°C
1s
1.0
10 ms
100 ms
1 ms
100 ms
2s
0.1
0.01
0.1
1.0
10
VCE, COLLECTOR EMITTER VOLTAGE (VOLTS)
100
Figure 7. Safe Operating Area
0.5
0.2
0.1
1.0E+00
0.05
0.02
Rthja , (t)
1.0E−01
D = 0.01
1.0E−02
r(t)
1.0E−03
1E−05
0.0001
0.001
0.01
0.1
t, TIME (sec)
1.0
Figure 8. Normalized Thermal Response
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4
10
100
1000
NSS30100LT1G
PACKAGE DIMENSIONS
SOT−23 (TO−236)
CASE 318−08
ISSUE AH
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD
FINISH THICKNESS. MINIMUM LEAD THICKNESS
IS THE MINIMUM THICKNESS OF BASE
MATERIAL.
4. 318−03 AND −07 OBSOLETE, NEW STANDARD
318−08.
A
L
3
1
V
B S
2
DIM
A
B
C
D
G
H
J
K
L
S
V
G
C
D
H
J
K
INCHES
MIN
MAX
0.1102 0.1197
0.0472 0.0551
0.0350 0.0440
0.0150 0.0200
0.0701 0.0807
0.0005 0.0040
0.0034 0.0070
0.0140 0.0285
0.0350 0.0401
0.0830 0.1039
0.0177 0.0236
STYLE 6:
PIN 1. BASE
2. EMITTER
3. COLLECTOR
SOLDERING FOOTPRINT*
0.95
0.037
0.95
0.037
2.0
0.079
0.9
0.035
0.8
0.031
SCALE 10:1
mm Ǔ
ǒinches
*For additional information on our Pb−Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
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5
MILLIMETERS
MIN
MAX
2.80
3.04
1.20
1.40
0.89
1.11
0.37
0.50
1.78
2.04
0.013
0.100
0.085
0.177
0.35
0.69
0.89
1.02
2.10
2.64
0.45
0.60
NSS30100LT1G
ON Semiconductor and
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should
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6
For additional information, please contact your
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NSS30100L/D