IRF530 - New Jersey Semiconductor

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TELEPHONE: (973) 376-2922
(212)227-6005
FAX: (973) 376-8960
20 STERN AVE.
SPRINGFIELD, NEW JERSEY 07081
U.S.A.
IRF530
IRF531
IRF532
IRF533
N-C HAIMNEL ENHANCE VIENT-MODE SILICON GATE
TWOS POWER FIEL D EFFECT TRANSISTOR
The se TMOS Power FETs ar e designed for low voltage, high
speed power switching applical ions such as switching regulators,
conve rters, solenoid and relay drivers,
• Silk on Gate for Fast Switch! ng Speeds
• Rugged — SOA is Power Dis sipation Limited
• Source-to-Drain Diode Chara cterized for Use With Inductive
Loa ds
Part Number
IRF530
Vrjs
100V
'DSIon )
0.18 f
IRF531
IRF532
60V
100 V
0.18 n
0,25 fl
14 A
IRF533
60 V
0.25 fl
12 A
LD
14 A
12 A
S
TMOS
B
L
I i
MAXIMUM RATINGS
rfl
IRF
Ruing
Drain-Source Voltage
Drain-Gate Voltage
(HGS = 1.0 M(l)
Gate-Source Voltage
Continuous Drain Current TC = 25°C
Continuous Drain Current TC = 100'C
Drain Current — Pulsed
Total Power
Dissipation @ TC - 25'C
Derate above 25'C
Operating and Storage
Temperature Range
THERMAL CHARACTERISTICS
Thermal Resistance
Junction to Case
Junction to Ambient
Maximum Lead Temp, for Soldering
Purposes, 1/8* from case for 5 seconds
Symbol
530
531
532
633
Unit
VDSS
10°
6°
10°
60
Vdc
VDGR
100
eo
100
eo
vdc
f— /— F
^^ TT—r
tr^» t
^_J
»r
•-
±20
L-M
14
14
12
12
Adc
ID
9.0
9.0
8.0
8.0
Adc
IDM
56
56
48
48
PD
Tj.Tstg
*— R
— J
-
-.
n
SHUi.
75
0.6
W/°C
-55 to 160
'C
•c/w
1-67
TL
300
mi.GAH
IBM
tniM[
iOUM
Adc
Watts
R«JC
R0JA
S
Q—
vdc
ID
|(—
K
.,
VQS
~5D SS.T
^—
—-H<
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SM the MTM12N10 Designer's Data Sheet for a complete set of design curves for this product.
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TO-220AB
NJ Semi-Conductors reserves the right to change test conditions, parameter limits and package dimensions \vithout
notice. Information furnished by NJ Semi-Conductors is believed to be both accurate and reliable at the time of going
to press. However, NJ Semi-Conductors assumes no responsibility for any errors or omissions discovered in its use.
NJ Semi-Conductors encourages customers to verify that datasheets are current before placing orders.
Quality Semi-Conductors
ELECTRICAL CHARACTERISTICS (Tc - 25"C unless otherwise noted)
Symbol
Characteristic
|
Mln |
Typ
Unit
Off CHARACTERISTICS
Drain-Source Breakdown Voltage
(VGS = o, ID = 260 ^A)
IRFBSO.BSZ
VIBRJDSS
-
-
-
-
0.26
1.0
IGSSF
—
—
100
nAdc
'GSSR
—
—
-100
nAdc
VQS(th)
2.0
—
4.0
Vdc
14
12
-
-
-
-
0.18
0.25
9FS
4.0
—
—
mhos
PF
IRF531.533
Zero Gate Voltage Drain Current
<VGs = 0 V, VDS = Rated VDSs)
(VQS = o v. VDS = O.B Ra'«d VDSS.
Vdo
100
60
IDSS
TC - wci
Forward Gate-Body Leakage Current
(VQS - 20 v, VDS - <M
Reverse Gate-Body Leakage Current
(vGs = -2ov, VDS •= 01
mAdc
ON CHARACTERISTICS1
Gate Threshold Voltage
(vDs = VGS. ID - 250
^A)
On-State Drain Current
(VDS - 26 v, VQS - 1° v)
iRFeso.Bsi
1RF532.533
Static Drain-Source On-Resistance
(VGS = 1° V. 'D = 8.0 A)
Adc
'Dion)
Ohm
rOS(on)
IRF530,531
IRF 532,633
Forward Trensconductance
(VDS - 15 v, ID = 8.0 A)
DYNAMIC CHARACTERISTICS
Input Capacitance
Output Capacitance
(VDS = 25 v, VGS - o, f = 1.0 MHZ)
Reverse Transfer Capacitance
Ciss
—
—
800
GOSS
—
—
500
Crss
-
—
160
>d(on)
—
—
30
»r
—
—
76
'd(off)
—
—
40
'f
-
-
45
SWITCHING CHARACTERISTICS' |Tj = 100°C)
Turn-On Delay Time
VDD - 36 v, ID = e.o A
Z0 = 15 n
Rise Time
Turn-Off Delay Time
Fall Time
ns
SOURCE DRAIN DIODE CHARACTERISTICS'
Characteristic
Symbol
Typ
Unit
VSD
2.3
Vdc
Forward On-Voltage
Forward Turn-On Time
(Is = Rated ID, VQS = 0)
Limited by stray
Inductance
ton
Reverse Recovery Time
trr
360
ns
Unit
INTERNAL PACKAGE INDUCTANCE (TO-220)
Symbol
Internal Drain Inductance
(Measured from the contact screw on tab to center of die)
(Measured from the drain lead 0.25* from package to center of die)
Ld
Internal Source Inductance
(Measured from the source lead 0.25" from package to source bond pad.)
LS
Mln
Typ
Max
-
3.6
4.5
-
—
7.6
—
nH
•Pults Test: Pulse Width a 300 ia, Duty Cycle s 2.0 %.
FIGURE 1 — SWITCHING TEST CIRCUIT
VDD
FIGURE 2 — SWITCHING WAVEFORMS