DECEMBER 30, 2002

MAY 4, 2007
TEST REPORT #207131
CLP/FTSH SERIES CONNECTOR TESTING
PART NUMBER
CLP-125-02-L-D-A
FTSH-125-02-L-D
SAMTEC, INC.
APPROVED BY: THOMAS PEEL
PRESIDENT AND
DIRECTOR OF TEST PROGRAM DEVELOPMENT
CONTECH RESEARCH, INC.
Test Laboratory
Contech Research
An Independent Test and Research Laboratory
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
5/4/07
1.0
Initial Issue
TP
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CERTIFICATION
This is to certify that the evaluation described herein was
designed and executed by personnel of Contech Research, Inc.
It was performed with the concurrence of Samtec, Inc. of New
Albany, IN who was the test sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1,
ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
Thomas Peel
President and
Director of Test Program Development
Contech Research, Inc.
TP:cm
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SCOPE
To perform qualification testing on the CLP/FTSH series
connector as manufactured and submitted by the test sponsor
Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Samtec Specifications:
3.
Standards: EIA Publication 364
TC0625-1073
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
Description
Part Number
a) Receptacle Connector
b) Plug Connector
2.
CLP-125-02-L-D-A
FTSH-125-02-L-D
Test samples were supplied assembled and terminated to test
boards by the test sponsor. Specific test boards were
designed for the following tests:
- IR/DWV
- LLCR
- Nanosecond Event Detection
3.
The test samples for vibration and shock were prepared by
terminating all positions in series for monitoring contact
events during vibration and/or shock.
4.
The samples were fitted with spacers to maintain stability
throughout testing.
5.
Unless otherwise specified in the test procedures used, no
further preparation was used.
Test Laboratory
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TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #1, for test sequences
used.
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner
which remained legible for the test duration.
2.
The test samples were coded in the following manner:
Seq A: Group
Group
Group
Group
Seq B: Group
A
B1
B2
B3
A1
Seq C: Group A
Seq D: Group A
–
-
A-A-1, A-A-2
A-B1-1, A-B1-2
A-B2-1, A-B2-2
A-B3-1, A-B3-2
B-A-1, B-A-2, B-A-3, B-A-4, B-A-5, B-A-6,
B-A-7, B-A-8
- C-A-1, C-A-2, C-A-3, C-A-4, C-A-5, C-A-6,
C-A-7, C-A-8
- D-A-1, D-A-2, D-A-3
Sample ID Key
Board number
Group
Seq
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FIGURE #1
TEST PLAN FLOW DIAGRAM
SAMPLE PREPARATION
Seq. A
IR
DWV
Thermal Humidity
Shock
Seq. B
Seq. C
LLCR
LLCR
Mech.
Shock
50 Nanosecond
Monitoring
Durab.
Thermal
Shock
DWV
IR
DWV
LLCR
|
Thermal
Shock
Seq. D
Mech.
Shock
Random
Vibration
50 Nanosecond
Monitoring
LLCR
Humidity
LLCR
Random
Vibration
IR
Cyclic
Humidity
LLCR
LLCR
Group
B1
Group
B2
Group
B3
Group
A
Group
A
Group
A
Group
A
IR
: Insulation Resistance
DWV : Dielectric Withstanding Voltage
LLCR : Low Level Circuit Resistance
Test Laboratory
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DATA SUMMARY
TEST
REQUIREMENT
RESULTS
1000 Megohms Min.
No Damage
1000 Megohms Min.
No Damage
1000 Megohms Min.
>50000 Megohms
Passed
>50000 Megohms
Passed
>10000 Megohms
900 VAC
Passed
No Damage
900 VAC
Passed
Passed
No Damage
900 VAC
Passed
Passed
Record
No Damage
+10.0 mΩ Max.Chg.
No Damage
+10.0 mΩ Max.Chg.
No Damage
+10.0 mΩ Max.Chg.
10.4 mΩ
Passed
+1.8 mΩ
Passed
+2.1 mΩ
Passed
+3.0 mΩ
Record
No Damage
+10.0 mΩ Max.Chg.
No Damage
+10.0 mΩ Max.Chg.
9.1 mΩ Max.
Passed
4.8 mΩ Max.Chg.
Passed
+1.8 mΩ Max.Chg.
SEQUENCE A
GROUP A
Insulation Resistance
Thermal Shock
Insulation Resistance
Humidity
Insulation Resistance
GROUP B1
DWV
GROUP B2
Thermal Shock
DWV
GROUP B3
Humidity
DWV
SEQUENCE B
LLCR
Durability
LLCR
Thermal Shock
LLCR
Cyclic Humidity
LLCR
Max.
Max.Chg.
Max.Chg.
Max.Chg.
SEQUENCE C
GROUP A
LLCR
Mechanical Shock
LLCR
Random Vibration
LLCR
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DATA SUMMARY - Continued
TEST
REQUIREMENT
RESULTS
No
50
No
50
Passed
Passed
Passed
Passed
SEQUENCE D
Mechanical Shock
Random Vibration
Damage
Nanosecond
Damage
Nanosecond
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EQUIPMENT LIST
ID#
27
192
207
244
280
321
400
466
553
558
614
684
1028
1032
1121
1166
1167
1168
1169
1271
1272
1314
1315
1317
1324
1345
1361
1366
1369
1457
Next Cal
Last Cal
3/6/2008
12/1/2007
9/21/2007
2/7/2008
3/7/2008
3/6/2007
12/1/2006
9/21/2006
2/7/2007
3/7/2007
7/20/2007
1/8/2008
7/20/2006
1/8/2007
7/10/2007
1/10/2008
7/10/2006
1/10/2007
5/5/2007
8/10/2007
5/5/2006
8/10/2006
1/24/2008
1/24/2008
1/24/2007
1/24/2007
1/24/2008
1/24/2007
12/14/2007
12/14/2006
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Cal
Temp. Humid. Chamber
Vertical Thermal Shock
Micro-Ohm Meter
Micro-Ohm Meter
Micro-Ohm Meter
AC-DC Hipot/Megometer
Computer
Precision Resistor
12 channel Power Unit
Computer
Oven
Accelerometer
Event Detector
Computer
Accelerometer
Sine/Rndm Vib Control
Digitizer
Interface
Mainframe
Computer
Amplifier
Shaker Table
Multiplexer card
Data Aquisition Multimeter
X-Y Table
X-Y Table
Drill Press Stand
Multiplexer Card
Main Frame
Force Gage Stand
Precision Resistor
Blue M Co.
Cincinnati Sub-Zero
Keithley Co.
Keithley Instr.
Keithley Instr.
Hipotronics Co.
ARC CO
Victoreen Co.
PCB Co.
ARC Elect.
Tenney Co.
PCB. Co.
Analysis Tech
Magitronic
PCB
Hewlett Packard
FR-256PC-1
VTS-1-5-3
580
580-1
580
H300B
333MHZ
50,000 mego
483A
P111-450
TH Jr.
353B04
32 EHD
486DX4
353B04
E1432A
F2-249
88-11094
438208
467496
477845
DS16-201
051104
N/A
1303
274B031586
9712-510
47648
981019
100VL
57715
US39342279
See Cal Cert
See Cal Cert
See Cal Cert
See Cal Cert
See Cal Cert
See Cal Cert
N/A
±1%
See Cal Cert
N/A
See Manual
See Cal Cert.
See Cal.Cert.
N/A
See Cal. Cert.
See Cal Cert
Ea Test
12mon
12mon
12mon
12mon
12 mon.
N/A
12 mon.
12mon
N/A
Ea Test
12mon
12mon
N/A
12mon
12mon
Hewlett Packard
Hewlett Packard
ARC
Unholtz Dickie
Unholtz Dickie
Keithley Co.
Keithley Co.
Contech Research
Contech Research
Milescraft
Keithley
Aiglent H.P.
Chatillon
Victorine
E8491B
E8408A
PC133
SA15
S202PB
7708
2700
CR-XY
CR-XY
5000
7708
8408A
BRO
5KMOHM
US390100753
US39000357
none
3483
263
0862544
0862680
01
03
N/A
1067661
N/A
N/A
N/A
See Manual
N/A
See CERT
See CERT
N/A
N/A
N/A
See Cal Cert
N/A
N/A
See Cal Cert
N/A
N/A
N/A
N/A
N/A
12mon
12mon
N/A
N/A
N/A
12mon
N/A
N/A
12mon
Contech Research
Test Laboratory
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465
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TEST RESULTS
SEQUENCE A
Group A
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PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN:
RJC
-----------------------------------------------------------START DATE: 4/3/07
COMPLETE DATE: 4/3/07
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY:
32%
-----------------------------------------------------------EQUIPMENT ID#: 321, 466, 1457
-----------------------------------------------------------INSULATION RESISTANCE(IR)
PURPOSE:
To determine the resistance of insulation materials to leakage
of current through or on the surface of these materials when a
DC potential is applied.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 21.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
3.
Between Adjacent Contacts
Between Rows
Mated Condition
Mounting Condition
Electrification Time
Test Voltage
:
:
:
:
:
:
Yes
Yes
Mated
Mounted
2.0 Minutes
500 VDC
The test voltage was applied to designated test points
on the board.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, the insulation
resistance shall not be less than 1,000 megohms.
-----------------------------------------------------------RESULTS:
The insulation resistance exceeded 50,000 megohms.
Test Laboratory
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PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: GL/RJC
-----------------------------------------------------------START DATE: 4/12/07
COMPLETE DATE: 4/18/07
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY:
31%
-----------------------------------------------------------EQUIPMENT ID#: 192, 321, 466, 1457
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles was performed continuously.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
5.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See next page.
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REQUIREMENTS:
1.
There shall be no evidence of physical damage or
deterioration of the test samples so exposed.
2.
The insulation resistance shall exceed 1,000 megohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of visual or physical damage to the
test samples as tested.
2.
The insulation resistance was in excess of 50,000 megohms.
Test Laboratory
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Contech Research
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PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: RJC
-----------------------------------------------------------START DATE: 4/20/07
COMPLETE DATE: 5/1/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY: 38%
-----------------------------------------------------------EQUIPMENT ID#: 27, 321, 466, 614, 1314, 1315, 1361, 1457
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
1.
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity
and heat conditions. Measurements made under
high humidity conditions may reflect the peculiar
conditions under which the readings were made, and should
be compared only to initial readings when careful analysis
indicates that such a comparison is valid and applicable.
2.
This test obtains added effectiveness in employment of
temperature cycling that provides a breathing action,
inducing corrosion processes, and the introduction of
moisture into partially sealed test samples. This
condition imposes a vapor pressure on the samples which
constitutes the major force behind the moisture migration
and penetration.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, Method III (omit Step 7a, 7b)
with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
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:
:
:
:
:
:
:
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
3.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of
the test samples as tested.
2.
The final insulation resistance shall not be less than
1,000 megohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The final insulation resistance exceeded 10,000 megohms.
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TEST RESULTS
SEQUENCE A
Group B1
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PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: GL
-----------------------------------------------------------START DATE: 4/18/07
COMPLETE DATE: 4/18/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY:
31%
-----------------------------------------------------------EQUIPMENT ID#: 321, 466, 1457
-----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL)
PURPOSE:
To determine if the connectors can operate at its rated voltage
and withstand momentary overpotentials due to switching, surges
and other similar phenomenon.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 20.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
3.
Between Adjacent Contacts
Between Rows
Mated Condition
Mounting Condition
Hold Time
Rate of Application
Test Voltage
:
:
:
:
:
:
:
Yes
Yes
Mated
Mounted
60 Seconds
500 volts/sec.
900 VAC
The voltage was applied to specific test points on the
board.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, there shall be no
evidence of breakdown, arcing, etc.
-----------------------------------------------------------RESULTS:
All test samples as tested met the requirements as
specified.
Test Laboratory
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TEST RESULTS
SEQUENCE A
Group B2
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PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: GL
-----------------------------------------------------------START DATE: 4/12/07
COMPLETE DATE: 4/18/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY:
31%
-----------------------------------------------------------EQUIPMENT ID#: 192, 321, 466, 1314, 1315, 1366, 1457
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles was performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See next page.
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
When a 900 VAC test voltage is applied, there shall be no
evidence of arcing, breakdown, etc.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no evidence of arcing, breakdown, etc., when a
900 Vac voltage was applied.
Test Laboratory
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TEST RESULTS
SEQUENCE A
Group B3
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PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: SR/GL/RJC
-----------------------------------------------------------START DATE: 4/20/07
COMPLETE DATE: 5/1/07
-----------------------------------------------------------ROOM AMBIENT:
22°C
RELATIVE HUMIDITY: 38%
-----------------------------------------------------------EQUIPMENT ID#: 27, 321, 466, 614, 1314, 1315, 1361, 1457
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
1.
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity
and heat conditions. Measurements made under
high humidity conditions may reflect the peculiar
conditions under which the readings were made, and should
be compared only to initial readings when careful analysis
indicates that such a comparison is valid and applicable.
2.
This test obtains added effectiveness in employment of
temperature cycling that provides a breathing action,
inducing corrosion processes, and the introduction of
moisture into partially sealed test samples. This
condition imposes a vapor pressure on the samples which
constitutes the major force behind the moisture migration
and penetration.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31 Method III (omit Step 7a,7b),
with the following conditions:
Test Laboratory
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Contech Research
An Independent Test and Research Laboratory
PROCEDURE:
2.
-continued
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
3.
The final dielectric withstanding voltage test was
performed in accordance with EIA 364, Test Procedure 20
and the procedures as previously indicated.
4.
The voltage was applied to specific test points on the
board.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of
the test samples as tested.
2.
There shall be no evidence of arcing or breakdown when
a 900 VAC test voltage is applied.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
There was no evidence of breakdown, arcing, etc., when a
900 VAC test voltage was applied.
Test Laboratory
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TEST RESULTS
SEQUENCE B
Group A
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PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: RJC
-----------------------------------------------------------START DATE: 4/5/07
COMPLETE DATE:
4/5/07
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#: 280, 558
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23, with the following conditions:
2.
Test Conditions:
a) Test Current
b) Open Circuit Voltage
3.
: 10 milliamps
: 20 millivolts
The points of application are shown in Figure #2.
Test Laboratory
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REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
2.
Avg.
7.0
6.1
6.4
6.9
7.3
7.2
7.1
5.3
Max.
7.4
6.9
7.9
8.1
10.4
9.7
7.9
5.7
Min.
6.7
5.3
5.5
5.8
5.8
6.0
6.2
5.0
See data files 20713101 through 20713108 for individual
data points.
Test Laboratory
TR#207131, REV.1.0
26 of 67
Contech Research
An Independent Test and Research Laboratory
FIGURE #2
Typical LLCR test set up
-I
-V
Probing the 50
position
monitoring
header.
+V
+
Probing
the PTH’s
off the
common
buss
Test Laboratory
TR#207131, REV.1.0
27 of 67
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: RJC
-----------------------------------------------------------START DATE: 4/9/07
COMPLETE DATE: 4/10/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY:
25%
-----------------------------------------------------------EQUIPMENT ID#: 280, 558, 1317, 1324, 1345, 1369
-----------------------------------------------------------DURABILITY
PURPOSE:
1.
This is a preconditioning sequence which is used to induce
the type of wear on the contacting surfaces which may occur
under normal service conditions. The connectors are mated
and unmated a predetermined number of cycles. Upon
completion, the units being evaluated are exposed to the
environments as specified to assess any impact on
electrical stability resulting from wear or other wear
dependent phenomenon.
2.
This type or preconditioning sequence is also used to
mechanically stress the connector system as would normally
occur in actual service. This sequence in conjunction with
other tests is used to determine if a significant loss of
contact pressure occurs from said stresses which in turn,
may result in an unstable electrical condition to exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 09.
2.
Test Conditions:
a) No. of Cycles : 100
b) Rate
: 500 Cycles per hour
3.
The test samples were assembled to special holding devices
and attached to the manual cycling equipment utilizing
constant speed control and counter systems.
Test Laboratory
TR#207131, REV.1.0
28 of 67
Contech Research
An Independent Test and Research Laboratory
PROCEDURE:
-continued
4.
The test samples were axially aligned to accomplish the
mating and unmating function allowing for self-centering
movement.
5.
Care was taken to prevent the mating faces of the test
samples from contacting each other.
6.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples so tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
3.
Avg.
Change
Max.
Change
-0.3
+0.4
-0.4
+0.2
-0.5
-0.4
-0.2
+0.4
+0.1
+1.8
+1.0
+1.7
+0.2
+1.0
+0.3
+1.2
See data files 20713101 through 20713108 for individual
data points.
Test Laboratory
TR#207131, REV.1.0
29 of 67
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN:
GL
-----------------------------------------------------------START DATE: 4/12/07
COMPLETE DATE: 4/17/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY:
32%
-----------------------------------------------------------EQUIPMENT ID#: 192, 207, 400, 1314, 1315, 1361
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles were performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See next page.
Test Laboratory
TR#207131, REV.1.0
30 of 67
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
3.
Sample ID#
Avg.
Change
Max.
Change
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
-0.2
+0.7
+0.0
+0.0
-0.5
-0.5
-0.2
+0.8
+0.3
+2.1
+1.5
+1.2
+1.0
+0.6
+0.3
+1.4
See data files 20713101 through 20713108 for individual
data points.
Test Laboratory
TR#207131, REV.1.0
31 of 67
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: RJC
-----------------------------------------------------------START DATE: 4/20/07
COMPLETE DATE: 5/1/07
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 38%
-----------------------------------------------------------EQUIPMENT ID#: 27, 280, 558, 614, 1314, 1315, 1361
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
To evaluate the impact on electrical stability of the contact
system when exposed to any environment which may generate
thermal/moisture type failure mechanisms such as:
a)
Fretting corrosion due to wear resulting from
micromotion, induced by thermal cycling. Humidity
accelerates the oxidation process.
b)
Oxidation of wear debris or from particulates from the
surrounding atmosphere which may have become entrapped
between the contacting surfaces.
c)
Failure mechanisms resulting from a wet oxidation
process.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with EIA
364, Test Procedure 31, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
Test Laboratory
TR#207131, REV.1.0
32 of 67
:
:
:
:
:
:
:
:
50°C ± 5°C
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
Contech Research
An Independent Test and Research Laboratory
PROCEDURE:
-continued
3.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of the
test samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
3.
Sample ID#
Avg.
Change
Max.
Change
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
-0.3
+0.7
-0.1
+0.0
-0.4
-0.4
-0.1
+1.1
-0.1
+1.8
+1.5
+1.3
+1.1
+0.7
+0.2
+3.0
See data files 20713101 through 20713108 for individual
data points.
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
DATA FILE NUMBERS
20713101
20713102
20713103
2073104
20713105
20713106
20713107
20713108
Test Laboratory
TR#207131, REV.1.0
34 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# B-A-1
Open circuit voltage:
20mv
Spec:
Subgroup:
File #:
EIA 364, TP 23
Seq B
20713101
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.8
6.8
7.1
7.1
6.8
7.2
6.9
7.1
7.0
7.3
7.1
6.7
6.7
6.8
6.7
6.7
6.7
7.3
7.4
7.3
7.3
7.0
23
25
10Apr07
After 100X
Durability
-0.1
-0.4
-0.5
-0.3
-0.3
-0.3
-0.3
-0.5
-0.3
-0.4
-0.2
-0.1
-0.2
-0.3
-0.1
0.0
0.1
-0.2
-0.2
-0.4
-0.1
-0.6
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
0.0
-0.2
-0.3
-0.2
0.1
-0.2
-0.2
-0.5
0.3
-0.1
-0.1
0.0
-0.2
-0.3
-0.1
-0.1
-0.1
-0.2
-0.2
-0.4
-0.1
-0.4
-0.2
-0.3
-0.4
-0.6
-0.1
-0.3
-0.5
-0.7
-0.2
-0.3
-0.1
-0.3
-0.4
-0.3
-0.1
-0.2
-0.2
-0.2
-0.2
-0.3
-0.1
-0.5
MAX
MIN
AVG
STD
Open
Tech
7.4
6.7
7.0
0.2
0
RJC
0.1
-0.6
-0.3
0.2
0
RJC
0.3
-0.5
-0.2
0.2
0
GL
-0.1
-0.7
-0.3
0.2
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
35 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# B-A-2
Open circuit voltage:
20mv
Spec:
Subgroup:
File #:
EIA 364, TP 23
Seq B
20713102
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.3
5.7
5.9
6.1
5.8
5.4
6.5
6.1
6.1
6.0
5.4
6.5
6.5
6.7
6.2
6.2
6.9
5.3
5.5
5.7
6.3
6.6
23
25
10Apr07
After 100X
Durability
0.6
0.9
0.5
0.8
0.5
1.8
-0.2
-0.3
-0.1
-0.1
1.0
0.2
-0.1
-0.1
0.2
0.6
0.3
0.6
0.4
0.6
0.3
-0.1
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
0.4
0.9
0.5
0.6
0.6
1.2
0.1
0.6
0.6
0.6
2.1
0.5
0.0
0.0
1.3
0.8
-0.1
1.2
1.2
0.8
0.4
0.1
0.3
1.0
0.6
0.7
0.7
1.3
0.2
0.6
0.7
0.6
1.8
0.6
0.1
0.2
1.5
1.0
0.0
1.4
1.3
0.8
0.5
0.1
MAX
MIN
AVG
STD
Open
Tech
6.9
5.3
6.1
0.4
0
RJC
1.8
-0.3
0.4
0.5
0
RJC
2.1
-0.1
0.7
0.5
0
GL
1.8
0.0
0.7
0.5
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
36 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# B-A-3
Open circuit voltage:
20mv
Spec:
Subgroup:
File #:
EIA 364, TP 23
Seq B
20713103
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.9
7.9
7.1
7.1
5.5
5.8
6.1
6.3
6.3
5.5
6.6
7.2
6.3
6.4
7.8
6.8
6.4
5.6
5.9
5.5
5.6
6.3
23
25
10Apr07
After 100X
Durability
-0.1
-1.3
-0.5
-0.7
0.3
0.7
-0.2
-0.4
-0.5
0.4
-1.5
-2.2
-0.7
-1.3
-2.4
-1.1
-0.5
0.1
0.8
0.8
1.0
0.2
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
-0.3
-1.2
-0.5
-0.5
0.9
0.5
0.2
-0.1
0.0
0.9
-0.4
-1.6
0.1
-0.2
-1.5
-0.6
-0.1
0.4
0.8
1.1
1.5
0.1
-0.3
-1.1
-0.6
-0.6
1.0
0.5
0.2
-0.2
0.0
1.0
-1.5
-1.3
0.2
-0.3
-1.5
-0.5
-0.2
0.2
0.9
1.0
1.5
0.1
MAX
MIN
AVG
STD
Open
Tech
7.9
5.5
6.4
0.7
0
RJC
1.0
-2.4
-0.4
0.9
0
RJC
1.5
-1.6
0.0
0.8
0
GL
1.5
-1.5
-0.1
0.8
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
37 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# B-A-4
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq B
File #:
20713104
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.9
7.0
6.8
7.2
6.9
5.8
7.0
7.2
6.6
8.1
7.9
6.8
6.9
7.0
6.8
7.0
6.6
6.2
6.9
6.9
6.9
6.9
23
25
10Apr07
After 100X
Durability
0.0
-0.1
0.1
0.7
-0.1
0.3
0.7
0.5
0.1
-0.8
-0.5
0.0
0.1
0.0
0.1
0.1
0.0
0.8
1.7
0.1
0.1
0.3
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
-0.1
-0.2
-0.1
-0.4
-0.1
1.2
0.0
0.1
0.1
-1.2
-0.6
0.1
0.1
0.0
0.0
0.0
0.1
0.6
0.3
-0.1
-0.1
-0.2
-0.1
-0.2
-0.3
-0.2
0.0
1.3
0.0
0.1
0.1
-1.1
-0.6
0.2
0.1
0.1
0.0
0.1
0.2
-0.2
0.1
0.0
-0.1
-0.1
MAX
MIN
AVG
STD
Open
Tech
8.1
5.8
6.9
0.5
0
RJC
1.7
-0.8
0.2
0.5
0
RJC
1.2
-1.2
0.0
0.4
0
GL
1.3
-1.1
0.0
0.4
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
38 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# B-A-5
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq B
File #:
20713105
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.9
10.4
7.1
6.8
7.0
5.9
5.8
7.0
7.0
6.9
7.2
7.0
7.5
7.2
7.1
7.5
7.1
8.9
7.2
8.3
6.8
7.1
23
25
10Apr07
After 100X
Durability
-0.3
-3.4
-0.3
-0.1
-0.2
-0.4
0.2
-0.2
0.0
-0.9
-0.3
-0.3
-0.5
0.1
-0.2
-0.4
-0.1
-1.6
-0.4
-1.0
-0.1
-0.3
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
-0.3
-3.7
-0.4
-0.2
-0.3
0.7
1.0
-0.2
-0.1
-0.4
-0.3
-0.4
-0.4
0.0
-0.2
-0.6
-0.3
-2.0
-0.4
-1.5
-0.2
-0.3
-0.3
-3.8
-0.4
-0.1
-0.3
0.7
1.1
-0.1
0.0
-0.3
-0.2
-0.4
-0.4
0.0
-0.1
-0.6
-0.2
-2.0
-0.4
-1.4
-0.1
-0.3
MAX
MIN
AVG
STD
Open
Tech
10.4
5.8
7.3
0.9
0
RJC
0.2
-3.4
-0.5
0.8
0
RJC
1.0
-3.7
-0.5
0.9
0
GL
1.1
-3.8
-0.4
0.9
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
39 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID#B-A-6
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq B
File #:
20713106
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.8
6.5
7.7
6.5
6.1
7.2
7.9
7.1
7.9
7.1
9.7
7.0
7.3
7.0
7.5
8.2
7.0
6.0
7.2
7.0
7.3
7.2
23
25
10Apr07
After 100X
Durability
0.0
0.0
-1.2
-0.6
0.1
-0.1
-0.9
0.0
-1.2
-0.2
-2.8
-0.3
-0.4
-0.2
-0.8
-1.3
-0.2
0.7
-0.5
0.0
-0.3
1.0
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
-0.2
0.1
-1.3
0.2
0.5
-0.2
-0.8
-0.1
-1.3
-0.3
-2.8
-0.3
-0.4
-0.3
-0.8
-1.3
-0.4
0.6
-0.5
-0.2
-0.4
0.0
-0.2
0.1
-1.2
0.3
0.1
-0.2
-0.9
-0.1
-1.3
0.5
-2.7
-0.3
-0.4
-0.3
-0.8
-1.4
-0.3
0.7
-0.5
-0.2
-0.4
-0.1
MAX
MIN
AVG
STD
Open
Tech
9.7
6.0
7.2
0.8
0
RJC
1.0
-2.8
-0.4
0.8
0
RJC
0.6
-2.8
-0.5
0.7
0
GL
0.7
-2.7
-0.4
0.7
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# B-A-7
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq B
File #:
20713107
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.5
6.8
7.2
6.5
6.6
7.4
7.5
7.2
7.2
7.2
7.2
7.3
7.7
7.1
7.3
7.9
7.4
6.2
6.9
6.5
6.7
7.5
23
25
10Apr07
After 100X
Durability
-0.1
0.3
-0.4
0.0
-0.1
0.3
0.1
-0.2
-0.1
-0.2
-0.4
-0.4
-0.6
-0.1
-0.2
-0.8
-0.3
0.2
-0.6
-0.7
-0.7
-0.4
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
-0.1
0.0
-0.5
0.0
-0.2
-0.3
-0.1
-0.2
-0.1
-0.1
-0.4
-0.4
-0.6
-0.2
-0.1
-0.8
-0.3
0.3
-0.3
-0.1
-0.1
-0.4
0.2
0.1
-0.4
0.2
-0.1
-0.1
0.2
-0.1
0.1
0.1
-0.4
-0.3
-0.5
-0.2
-0.2
-0.8
-0.3
0.1
-0.3
0.1
-0.2
-0.4
MAX
MIN
AVG
STD
Open
Tech
7.9
6.2
7.1
0.4
0
RJC
0.3
-0.8
-0.2
0.3
0
RJC
0.3
-0.8
-0.2
0.2
0
GL
0.2
-0.8
-0.1
0.3
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
41 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# B-A-8
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq B
File #:
20713108
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
30
05Apr07
Initial
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
5.6
5.4
5.5
5.4
5.2
5.3
5.6
5.5
5.4
5.2
5.4
5.4
5.7
5.4
5.3
5.4
5.6
5.0
5.1
5.2
5.2
5.2
23
25
10Apr07
After 100X
Durability
1.1
0.8
0.9
1.1
1.2
0.3
-0.2
0.2
0.1
0.1
0.2
-0.1
0.7
0.1
0.1
0.3
0.3
0.1
0.1
0.0
0.1
0.4
23
32
17Apr07
T-Shock
22
38
01May07
Cy Humid
0.9
0.9
1.1
1.4
1.3
1.3
1.0
1.2
0.8
0.4
0.4
0.3
0.6
0.4
0.6
0.7
0.8
1.0
0.5
0.3
0.8
0.8
0.9
1.4
1.0
1.4
1.2
1.3
1.1
1.2
1.2
0.7
0.9
0.7
0.7
0.7
0.8
3.0
0.8
1.2
0.9
0.6
0.8
1.1
MAX
MIN
AVG
STD
Open
Tech
5.7
5.0
5.3
0.2
0
RJC
1.2
-0.2
0.4
0.4
0
RJC
1.4
0.3
0.8
0.3
0
GL
3.0
0.6
1.1
0.5
0
RJC
Equip ID
280
558
280
558
400
207
280
558
Test Laboratory
TR#207131, REV.1.0
42 of 67
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE C
Group A
Test Laboratory
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Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: GL
-----------------------------------------------------------START DATE: 4/12/07
COMPLETE DATE: 4/12/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY:
26%
-----------------------------------------------------------EQUIPMENT ID#: 207, 400
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23, with the following conditions:
2.
Test Conditions:
a) Test Current
: 10 milliamps
b) Open Circuit Voltage : 20 millivolts
Test Laboratory
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Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued:
3.
The points of application are shown in Figure #2.
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
2.
Avg.
Max.
Min.
7.3
6.2
5.4
6.9
6.5
7.5
6.5
6.4
8.9
7.7
6.6
8.6
7.6
9.1
7.2
6.9
6.0
5.3
4.9
5.8
5.4
6.5
5.5
5.2
See data files 20713101 through 20713108 for individual
data points.
Test Laboratory
TR#207131, REV.1.0
45 of 67
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: RT/SR
-----------------------------------------------------------START DATE: 4/25/07
COMPLETE DATE: 4/25/07
-----------------------------------------------------------ROOM AMBIENT:
22°C
RELATIVE HUMIDITY:
34%
-----------------------------------------------------------EQUIPMENT ID#: 244, 553, 1032, 1121, 1166, 1167, 1168, 1169,
1271, 1272
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity of
connectors for use with electronic equipment subjected to shocks
such as those expected from handling, transportation, etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 27.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Half-Sine
11.3 feet per second
3 Shocks/Direction, 3 Axis (18 Total)
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
2.
-continued
The change in low level circuit resistance shall not
exceed +10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
Avg.
Change
Max.
Change
-0.1
+0.3
+0.2
+0.4
+0.1
-0.2
+0.2
+0.2
+1.1
+1.0
+0.5
+1.8
+0.9
+0.1
+0.9
+0.8
3.
See data files 20713109 through 20713116 for individual
data points.
4.
The Mechanical Shock characteristics are shown in Figures
#3 (Calibration Pulse) and #4 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
FIGURE #3
Channel 1
Classical Shock
[g]
UPPER LIMIT------
150
Project 207131
Samtec
Cal Wave 1
100G’s 6ms
Halfsine
04-25-07
Tech:RT
ACCELERATION (g)
100
ACTUAL PULSE----50
0
-50
-100
0.46
LOWER LIMIT-----
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
[s]
DURATION (Seconds)
Test Laboratory
TR#207131, REV.1.0
Contech Research
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An Independent Test and Research Laboratory
FIGURE #4
Channel 1
Classical Shock
[g]
UPPER LIMIT------
150
Project 207131
Samtec
Actual Wave 1
100G’s 6ms
Halfsine
04-25-07
Tech:RT
ACCELERATION (g)
100
ACTUAL PULSE----50
0
-50
-100
0.46
LOWER LIMIT-----
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
[s]
DURATION (Seconds)
Test Laboratory
TR#207131, REV.1.0
Contech Research
49 of 67
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: RJC
-----------------------------------------------------------START DATE: 4/26/07
COMPLETE DATE: 4/30/07
-----------------------------------------------------------ROOM AMBIENT:
20°C
RELATIVE HUMIDITY: 40%
-----------------------------------------------------------EQUIPMENT ID#: 280, 553, 558, 1121, 1166, 1167, 1168, 1169,
1271, 1272,
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if the electrical stability of the system has
degraded when exposed to a vibratory environment.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a) G ’RMS’
b) Frequency
c) Duration
:
:
:
7.56
50 to 2000 Hz
2.0 hours per axis, 3 axis total
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
All subsequent variable testing was performed in accordance
with procedures previously indicated.
----------------------------------------------------------REQUIREMENTS: See next page.
Test Laboratory
TR#207131, REV.1.0
50 of 67
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the observed data:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
3.
Avg.
Change
Max.
Change
-0.3
+0.2
+0.4
-0.2
-0.1
-0.5
+0.0
+0.1
+0.6
+0.9
+1.4
+1.8
+1.3
+0.0
+0.7
+1.0
See data files 20713109 through 20713116 for individual
data points.
Test Laboratory
TR#207131, REV.1.0
51 of 67
Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
DATA FILE NUMBERS
20713109
20713110
20713111
20713112
20713113
20703114
20703115
20703116
Test Laboratory
TR#207131, REV.1.0
52 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-1
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713109
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.0
6.0
6.3
7.0
6.4
7.6
7.7
7.8
7.3
8.2
8.0
8.9
8.6
6.8
8.3
6.8
7.2
7.2
7.1
7.0
6.7
7.8
0.7
0.5
0.4
1.1
-0.4
-0.2
-0.3
0.2
0.0
0.1
-0.6
-0.7
-0.4
-0.9
-0.4
-0.1
0.0
-0.1
0.0
-0.1
-0.1
-0.7
0.4
0.6
0.4
-0.1
-0.1
-0.1
-0.4
-0.2
0.0
-0.3
-1.2
-1.6
-1.7
-0.3
-1.2
-0.1
-0.1
-0.2
-0.2
-0.2
0.1
-0.6
MAX
MIN
AVG
STD
Open
Tech
8.9
6.0
7.3
0.8
0
GL
1.1
-0.9
-0.1
0.5
0
S.Rath
0.6
-1.7
-0.3
0.6
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
53 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-2
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713110
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R.Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.6
6.8
5.8
5.7
5.9
5.8
6.0
6.8
6.7
6.2
5.3
7.7
5.5
5.8
6.4
6.7
6.7
5.7
5.7
5.7
6.0
7.0
-0.2
-0.2
-0.2
-0.2
0.1
1.0
0.7
0.2
0.1
0.0
0.2
0.3
0.6
1.0
0.4
0.3
0.2
0.0
0.1
0.2
0.8
0.7
-0.3
-0.3
0.4
0.5
0.4
0.7
0.5
0.0
-0.2
0.1
0.6
-0.8
0.9
0.5
-0.3
-0.3
-0.3
0.2
0.6
0.4
0.6
-0.3
MAX
MIN
AVG
STD
Open
Tech
7.7
5.3
6.2
0.6
0
GL
1.0
-0.2
0.3
0.4
0
S.Rath
0.9
-0.8
0.2
0.4
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
54 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-3
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713101
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R.Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
5.1
5.9
6.3
5.5
5.3
6.6
5.5
5.4
5.0
5.1
4.9
5.0
5.0
5.2
5.2
5.1
5.4
5.4
5.7
5.4
5.5
6.5
0.0
-0.3
-0.3
-0.1
-0.1
0.5
0.4
0.5
0.5
0.1
0.0
0.4
0.3
0.4
0.4
0.5
0.1
0.1
-0.1
-0.1
0.0
0.4
0.9
0.2
0.1
0.7
0.8
-0.9
0.7
1.4
1.0
0.8
0.2
0.6
0.3
0.6
0.4
0.5
0.1
0.0
-0.3
0.1
0.1
-0.1
MAX
MIN
AVG
STD
Open
Tech
6.6
4.9
5.4
0.5
0
GL
0.5
-0.3
0.2
0.3
0
S.Rath
1.4
-0.9
0.4
0.5
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
55 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-4
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713112
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R.Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
5.8
6.0
6.4
6.3
6.1
6.1
6.6
6.5
5.9
7.2
7.3
6.9
7.0
6.8
7.0
8.2
8.6
7.7
7.1
8.0
7.4
5.9
1.4
1.1
1.8
1.0
0.5
0.8
0.4
0.4
0.8
0.7
-0.1
0.1
0.2
-0.2
0.0
0.0
-0.4
-0.2
0.2
-0.5
0.0
1.3
1.8
0.5
0.3
0.1
-0.2
0.6
-0.5
0.1
0.3
-0.5
-0.6
-0.2
-0.9
-0.3
-0.1
-1.6
-1.7
-0.6
-0.5
-0.9
-0.2
0.9
MAX
MIN
AVG
STD
Open
Tech
8.6
5.8
6.9
0.8
0
GL
1.8
-0.5
0.4
0.6
0
S.Rath
1.8
-1.7
-0.2
0.8
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-5
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713113
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R.Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
5.6
5.5
5.8
5.4
6.5
7.6
7.1
7.2
6.1
7.3
7.1
5.6
7.2
7.3
6.6
6.8
6.9
5.8
5.7
6.6
6.7
6.4
0.7
0.1
0.7
0.3
0.0
-0.6
-0.2
-0.2
0.3
-0.4
-0.2
0.2
-0.1
-0.2
0.5
0.3
0.0
0.0
0.9
0.5
0.1
0.2
0.4
0.1
1.3
0.4
0.2
-0.8
-0.3
-0.3
0.3
-0.5
-0.7
0.1
-0.3
-0.1
0.0
-0.7
-0.8
-0.3
0.2
0.1
0.0
-0.1
MAX
MIN
AVG
STD
Open
Tech
7.6
5.4
6.5
0.7
0
GL
0.9
-0.6
0.1
0.4
0
S.Rath
1.3
-0.8
-0.1
0.5
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
57 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-6
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713114
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R.Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
7.2
7.3
7.2
7.1
9.1
7.4
7.5
7.7
7.6
8.0
8.2
7.3
7.5
7.6
8.5
8.5
7.5
6.5
6.7
6.6
6.5
7.3
-0.1
0.0
-0.2
-0.1
-1.1
0.1
0.0
-0.1
-0.1
-0.6
0.1
-0.1
-0.6
-0.2
-1.1
-0.3
0.0
0.0
0.0
-0.4
-0.1
0.1
-0.2
-0.2
-0.3
-0.3
-2.1
0.0
-0.1
-0.2
-0.3
-0.8
-0.9
-0.3
-0.9
-0.3
-1.3
-1.2
-0.1
-0.5
-0.4
-0.7
-0.3
0.0
MAX
MIN
AVG
STD
Open
Tech
9.1
6.5
7.5
0.7
0
GL
0.1
-1.1
-0.2
0.3
0
S.Rath
0.0
-2.1
-0.5
0.5
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
58 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-7
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713115
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R.Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.7
6.7
6.6
6.5
5.6
7.2
6.8
6.8
6.9
6.6
5.5
7.0
6.7
6.3
6.4
7.0
6.1
5.8
5.5
5.6
7.0
6.7
0.1
0.0
0.2
-0.1
0.4
0.2
0.1
0.1
0.0
0.0
0.2
0.1
-0.4
0.5
0.1
-0.3
0.9
0.7
0.7
0.3
0.0
-0.1
0.6
0.3
0.0
0.0
0.2
-0.2
-0.2
0.0
-0.2
-0.6
0.0
-0.1
-0.4
0.4
-0.3
-0.5
0.3
0.5
0.7
0.1
-0.1
-0.2
MAX
MIN
AVG
STD
Open
Tech
7.2
5.5
6.5
0.5
0
GL
0.9
-0.4
0.2
0.3
0
S.Rath
0.7
-0.6
0.0
0.3
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
59 of 67
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207131
Customer:
Samtec (1070)
Product:
Series CLP/FTSH connector
Description: ID# C-A-8
Open circuit voltage:
20mv
Spec:
EIA 364, TP 23
Subgroup: Seq C
File #:
20713116
Current:
10 ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
26
12Apr07
Initial
22
34
25Apr07
M.Shock
20
40
30Apr07
R.Vibra
1
2
3
4
5
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.5
6.9
6.8
6.5
6.9
5.6
6.5
6.2
5.2
5.3
6.4
5.6
6.9
6.8
6.7
6.8
6.7
6.0
6.7
6.5
6.7
6.7
0.1
0.1
0.2
0.0
0.1
0.1
0.1
0.0
0.1
0.5
0.0
0.0
0.2
0.1
0.2
0.0
0.1
0.8
0.2
0.2
0.3
0.0
-0.1
0.1
0.1
0.0
-0.1
0.5
0.0
0.0
0.5
1.0
-0.4
0.2
0.1
0.1
0.1
0.0
0.1
0.8
-0.1
0.0
0.2
-0.2
MAX
MIN
AVG
STD
Open
Tech
6.9
5.2
6.4
0.5
0
GL
0.8
0.0
0.2
0.2
0
S.Rath
1.0
-0.4
0.1
0.3
0
RJC
Equip ID
400
207
244
1032
280
558
Test Laboratory
TR#207131, REV.1.0
60 of 67
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE D
Group A
Test Laboratory
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Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 3 Samples
TECHNICIAN:
RT
-----------------------------------------------------------START DATE: 4/25/07
COMPLETE DATE: 4/25/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY: 34%
-----------------------------------------------------------EQUIPMENT ID#: 553, 684, 1028, 1121, 1166, 1168, 1169, 1271,
1272
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity of
connectors for use with electronic equipment subjected to
shocks such as those expected from handling, transportation,
etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 27.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Half-Sine
12.3 feet Per Second
3 Shocks/Direction, 3 Axis (18 Total)
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
The samples were characterized to determine nanosecond
event requirement. Following characterization the
requirement level was established at 50 nanoseconds.
5.
The low nanosecond monitoring was performed in accordance
with EIA 364, Test Procedure 87.
-----------------------------------------------------------REQUIREMENTS: See next page.
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the
samples as tested.
2.
There shall be no low nanosecond event detected greater
than 50 nanoseconds.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no low nanosecond event detected greater than 50
nanoseconds.
3.
The Mechanical Shock characteristics are shown in Figures
#5 (Calibration Pulse) and #6 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
FIGURE #5
Channel 1
Classical Shock
[g]
UPPER LIMIT------
150
Project 207131
Samtec
Cal Wave 1
100G’s 6ms
Halfsine
04-25-07
Tech:RT
ACCELERATION (g)
100
ACTUAL PULSE----50
0
-50
-100
0.46
LOWER LIMIT-----
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
[s]
DURATION (Seconds)
Test Laboratory
TR#207131, REV.1.0
Contech Research
64 of 67
An Independent Test and Research Laboratory
FIGURE #6
Channel 1
Classical Shock
[g]
UPPER LIMIT------
150
Project 207131
Samtec
Actual Wave 1
100G’s 6ms
Halfsine
04-25-07
Tech:RT
ACCELERATION (g)
100
ACTUAL PULSE----50
0
-50
-100
0.46
LOWER LIMIT-----
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
[s]
DURATION (Seconds)
Test Laboratory
TR#207131, REV.1.0
Contech Research
65 of 67
An Independent Test and Research Laboratory
PROJECT NO.: 207131
SPECIFICATION: TC0626-1070
-----------------------------------------------------------PART NO.: CLP-125-02-L-D-A
PART DESCRIPTION: CLP/FTSH
FTSH-125-02-L-D
Connectors
-----------------------------------------------------------SAMPLE SIZE: 3 Samples
TECHNICIAN: RT
-----------------------------------------------------------START DATE: 4/26/07
COMPLETE DATE: 4/27/07
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY:
33%
-----------------------------------------------------------EQUIPMENT ID#: 553, 684, 1166, 1167, 1168, 1169, 1271, 1272
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if electrical discontinuities at the level
specified exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with Specification
EIA 364, Test Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a)
b)
c)
d)
G ’RMS’
Frequency
Duration
Test Current
:
:
:
:
7.56
50 to 2000 Hz
2.0 Hours per Axis, 3 Axis Total
100 mA
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
The samples were characterized prior to test to determine
nanosecond event requirement. Following characterization
the requirement level was established at 50 nanoseconds.
Test Laboratory
TR#207131, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
PROCEDURE:
5.
-continued
The low nanosecond monitoring was performed in accordance
with EIA 364, Test Procedure 87.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no low nanosecond event detected greater
than 50 nanoseconds.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no low nanosecond event detected greater than
50 nanoseconds.
Test Laboratory
TR#207131, REV.1.0
67 of 67
Contech Research
An Independent Test and Research Laboratory