MAY 4, 2007 TEST REPORT #207131 CLP/FTSH SERIES CONNECTOR TESTING PART NUMBER CLP-125-02-L-D-A FTSH-125-02-L-D SAMTEC, INC. APPROVED BY: THOMAS PEEL PRESIDENT AND DIRECTOR OF TEST PROGRAM DEVELOPMENT CONTECH RESEARCH, INC. Test Laboratory Contech Research An Independent Test and Research Laboratory REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 5/4/07 1.0 Initial Issue TP Test Laboratory TR#207131, REV.1.0 2 of 67 Contech Research An Independent Test and Research Laboratory CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed with the concurrence of Samtec, Inc. of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1, ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and Contech Research. Thomas Peel President and Director of Test Program Development Contech Research, Inc. TP:cm Test Laboratory TR#207131, REV.1.0 3 of 67 Contech Research An Independent Test and Research Laboratory SCOPE To perform qualification testing on the CLP/FTSH series connector as manufactured and submitted by the test sponsor Samtec, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Samtec Specifications: 3. Standards: EIA Publication 364 TC0625-1073 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Samtec, Inc., for the evaluation to be performed by Contech Research, Inc. Description Part Number a) Receptacle Connector b) Plug Connector 2. CLP-125-02-L-D-A FTSH-125-02-L-D Test samples were supplied assembled and terminated to test boards by the test sponsor. Specific test boards were designed for the following tests: - IR/DWV - LLCR - Nanosecond Event Detection 3. The test samples for vibration and shock were prepared by terminating all positions in series for monitoring contact events during vibration and/or shock. 4. The samples were fitted with spacers to maintain stability throughout testing. 5. Unless otherwise specified in the test procedures used, no further preparation was used. Test Laboratory TR#207131, REV.1.0 4 of 67 Contech Research An Independent Test and Research Laboratory TEST SELECTION 1. See Test Plan Flow Diagram, Figure #1, for test sequences used. 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification. SAMPLE CODING 1. All samples were coded. Mated test samples remained with each other throughout the test group/sequences for which they were designated. Coding was performed in a manner which remained legible for the test duration. 2. The test samples were coded in the following manner: Seq A: Group Group Group Group Seq B: Group A B1 B2 B3 A1 Seq C: Group A Seq D: Group A – - A-A-1, A-A-2 A-B1-1, A-B1-2 A-B2-1, A-B2-2 A-B3-1, A-B3-2 B-A-1, B-A-2, B-A-3, B-A-4, B-A-5, B-A-6, B-A-7, B-A-8 - C-A-1, C-A-2, C-A-3, C-A-4, C-A-5, C-A-6, C-A-7, C-A-8 - D-A-1, D-A-2, D-A-3 Sample ID Key Board number Group Seq Test Laboratory TR#207131, REV.1.0 5 of 67 Contech Research An Independent Test and Research Laboratory FIGURE #1 TEST PLAN FLOW DIAGRAM SAMPLE PREPARATION Seq. A IR DWV Thermal Humidity Shock Seq. B Seq. C LLCR LLCR Mech. Shock 50 Nanosecond Monitoring Durab. Thermal Shock DWV IR DWV LLCR | Thermal Shock Seq. D Mech. Shock Random Vibration 50 Nanosecond Monitoring LLCR Humidity LLCR Random Vibration IR Cyclic Humidity LLCR LLCR Group B1 Group B2 Group B3 Group A Group A Group A Group A IR : Insulation Resistance DWV : Dielectric Withstanding Voltage LLCR : Low Level Circuit Resistance Test Laboratory TR#207131, REV.1.0 6 of 67 Contech Research An Independent Test and Research Laboratory DATA SUMMARY TEST REQUIREMENT RESULTS 1000 Megohms Min. No Damage 1000 Megohms Min. No Damage 1000 Megohms Min. >50000 Megohms Passed >50000 Megohms Passed >10000 Megohms 900 VAC Passed No Damage 900 VAC Passed Passed No Damage 900 VAC Passed Passed Record No Damage +10.0 mΩ Max.Chg. No Damage +10.0 mΩ Max.Chg. No Damage +10.0 mΩ Max.Chg. 10.4 mΩ Passed +1.8 mΩ Passed +2.1 mΩ Passed +3.0 mΩ Record No Damage +10.0 mΩ Max.Chg. No Damage +10.0 mΩ Max.Chg. 9.1 mΩ Max. Passed 4.8 mΩ Max.Chg. Passed +1.8 mΩ Max.Chg. SEQUENCE A GROUP A Insulation Resistance Thermal Shock Insulation Resistance Humidity Insulation Resistance GROUP B1 DWV GROUP B2 Thermal Shock DWV GROUP B3 Humidity DWV SEQUENCE B LLCR Durability LLCR Thermal Shock LLCR Cyclic Humidity LLCR Max. Max.Chg. Max.Chg. Max.Chg. SEQUENCE C GROUP A LLCR Mechanical Shock LLCR Random Vibration LLCR Test Laboratory TR#207131, REV.1.0 7 of 67 Contech Research An Independent Test and Research Laboratory DATA SUMMARY - Continued TEST REQUIREMENT RESULTS No 50 No 50 Passed Passed Passed Passed SEQUENCE D Mechanical Shock Random Vibration Damage Nanosecond Damage Nanosecond Test Laboratory TR#207131, REV.1.0 8 of 67 Contech Research An Independent Test and Research Laboratory EQUIPMENT LIST ID# 27 192 207 244 280 321 400 466 553 558 614 684 1028 1032 1121 1166 1167 1168 1169 1271 1272 1314 1315 1317 1324 1345 1361 1366 1369 1457 Next Cal Last Cal 3/6/2008 12/1/2007 9/21/2007 2/7/2008 3/7/2008 3/6/2007 12/1/2006 9/21/2006 2/7/2007 3/7/2007 7/20/2007 1/8/2008 7/20/2006 1/8/2007 7/10/2007 1/10/2008 7/10/2006 1/10/2007 5/5/2007 8/10/2007 5/5/2006 8/10/2006 1/24/2008 1/24/2008 1/24/2007 1/24/2007 1/24/2008 1/24/2007 12/14/2007 12/14/2006 Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal Temp. Humid. Chamber Vertical Thermal Shock Micro-Ohm Meter Micro-Ohm Meter Micro-Ohm Meter AC-DC Hipot/Megometer Computer Precision Resistor 12 channel Power Unit Computer Oven Accelerometer Event Detector Computer Accelerometer Sine/Rndm Vib Control Digitizer Interface Mainframe Computer Amplifier Shaker Table Multiplexer card Data Aquisition Multimeter X-Y Table X-Y Table Drill Press Stand Multiplexer Card Main Frame Force Gage Stand Precision Resistor Blue M Co. Cincinnati Sub-Zero Keithley Co. Keithley Instr. Keithley Instr. Hipotronics Co. ARC CO Victoreen Co. PCB Co. ARC Elect. Tenney Co. PCB. Co. Analysis Tech Magitronic PCB Hewlett Packard FR-256PC-1 VTS-1-5-3 580 580-1 580 H300B 333MHZ 50,000 mego 483A P111-450 TH Jr. 353B04 32 EHD 486DX4 353B04 E1432A F2-249 88-11094 438208 467496 477845 DS16-201 051104 N/A 1303 274B031586 9712-510 47648 981019 100VL 57715 US39342279 See Cal Cert See Cal Cert See Cal Cert See Cal Cert See Cal Cert See Cal Cert N/A ±1% See Cal Cert N/A See Manual See Cal Cert. See Cal.Cert. N/A See Cal. Cert. See Cal Cert Ea Test 12mon 12mon 12mon 12mon 12 mon. N/A 12 mon. 12mon N/A Ea Test 12mon 12mon N/A 12mon 12mon Hewlett Packard Hewlett Packard ARC Unholtz Dickie Unholtz Dickie Keithley Co. Keithley Co. Contech Research Contech Research Milescraft Keithley Aiglent H.P. Chatillon Victorine E8491B E8408A PC133 SA15 S202PB 7708 2700 CR-XY CR-XY 5000 7708 8408A BRO 5KMOHM US390100753 US39000357 none 3483 263 0862544 0862680 01 03 N/A 1067661 N/A N/A N/A See Manual N/A See CERT See CERT N/A N/A N/A See Cal Cert N/A N/A See Cal Cert N/A N/A N/A N/A N/A 12mon 12mon N/A N/A N/A 12mon N/A N/A 12mon Contech Research Test Laboratory TR#207131, REV.1.0 N/A 465 9 of 67 An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A Group A Test Laboratory TR#207131, REV.1.0 10 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: RJC -----------------------------------------------------------START DATE: 4/3/07 COMPLETE DATE: 4/3/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 32% -----------------------------------------------------------EQUIPMENT ID#: 321, 466, 1457 -----------------------------------------------------------INSULATION RESISTANCE(IR) PURPOSE: To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 21. 2. Test Conditions: a) b) c) d) e) f) 3. Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Electrification Time Test Voltage : : : : : : Yes Yes Mated Mounted 2.0 Minutes 500 VDC The test voltage was applied to designated test points on the board. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, the insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: The insulation resistance exceeded 50,000 megohms. Test Laboratory TR#207131, REV.1.0 11 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: GL/RJC -----------------------------------------------------------START DATE: 4/12/07 COMPLETE DATE: 4/18/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 31% -----------------------------------------------------------EQUIPMENT ID#: 192, 321, 466, 1457 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles was performed continuously. 4. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 5. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See next page. Test Laboratory TR#207131, REV.1.0 12 of 67 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage or deterioration of the test samples so exposed. 2. The insulation resistance shall exceed 1,000 megohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of visual or physical damage to the test samples as tested. 2. The insulation resistance was in excess of 50,000 megohms. Test Laboratory TR#207131, REV.1.0 13 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: RJC -----------------------------------------------------------START DATE: 4/20/07 COMPLETE DATE: 5/1/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 38% -----------------------------------------------------------EQUIPMENT ID#: 27, 321, 466, 614, 1314, 1315, 1361, 1457 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: 1. The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. Measurements made under high humidity conditions may reflect the peculiar conditions under which the readings were made, and should be compared only to initial readings when careful analysis indicates that such a comparison is valid and applicable. 2. This test obtains added effectiveness in employment of temperature cycling that provides a breathing action, inducing corrosion processes, and the introduction of moisture into partially sealed test samples. This condition imposes a vapor pressure on the samples which constitutes the major force behind the moisture migration and penetration. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, Method III (omit Step 7a, 7b) with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration Test Laboratory TR#207131, REV.1.0 14 of 67 : : : : : : : 90% to 95% 25°C to 65°C No No Mated Mounted 240 hours Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 3. All subsequent variable testing was performed in accordance with the procedures previously indicated. 4. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The final insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The final insulation resistance exceeded 10,000 megohms. Test Laboratory TR#207131, REV.1.0 15 of 67 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A Group B1 Test Laboratory TR#207131, REV.1.0 16 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: GL -----------------------------------------------------------START DATE: 4/18/07 COMPLETE DATE: 4/18/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 31% -----------------------------------------------------------EQUIPMENT ID#: 321, 466, 1457 -----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL) PURPOSE: To determine if the connectors can operate at its rated voltage and withstand momentary overpotentials due to switching, surges and other similar phenomenon. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 20. 2. Test Conditions: a) b) c) d) e) f) g) 3. Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Hold Time Rate of Application Test Voltage : : : : : : : Yes Yes Mated Mounted 60 Seconds 500 volts/sec. 900 VAC The voltage was applied to specific test points on the board. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, there shall be no evidence of breakdown, arcing, etc. -----------------------------------------------------------RESULTS: All test samples as tested met the requirements as specified. Test Laboratory TR#207131, REV.1.0 17 of 67 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A Group B2 Test Laboratory TR#207131, REV.1.0 18 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: GL -----------------------------------------------------------START DATE: 4/12/07 COMPLETE DATE: 4/18/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 31% -----------------------------------------------------------EQUIPMENT ID#: 192, 321, 466, 1314, 1315, 1366, 1457 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles was performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See next page. Test Laboratory TR#207131, REV.1.0 19 of 67 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. When a 900 VAC test voltage is applied, there shall be no evidence of arcing, breakdown, etc. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no evidence of arcing, breakdown, etc., when a 900 Vac voltage was applied. Test Laboratory TR#207131, REV.1.0 20 of 67 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A Group B3 Test Laboratory TR#207131, REV.1.0 21 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: SR/GL/RJC -----------------------------------------------------------START DATE: 4/20/07 COMPLETE DATE: 5/1/07 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 38% -----------------------------------------------------------EQUIPMENT ID#: 27, 321, 466, 614, 1314, 1315, 1361, 1457 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: 1. The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. Measurements made under high humidity conditions may reflect the peculiar conditions under which the readings were made, and should be compared only to initial readings when careful analysis indicates that such a comparison is valid and applicable. 2. This test obtains added effectiveness in employment of temperature cycling that provides a breathing action, inducing corrosion processes, and the introduction of moisture into partially sealed test samples. This condition imposes a vapor pressure on the samples which constitutes the major force behind the moisture migration and penetration. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31 Method III (omit Step 7a,7b), with the following conditions: Test Laboratory TR#207131, REV.1.0 22 of 67 Contech Research An Independent Test and Research Laboratory PROCEDURE: 2. -continued Test Conditions: a) b) c) d) e) f) g) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : 90% to 95% 25°C to 65°C No No Mated Mounted 240 hours 3. The final dielectric withstanding voltage test was performed in accordance with EIA 364, Test Procedure 20 and the procedures as previously indicated. 4. The voltage was applied to specific test points on the board. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. There shall be no evidence of arcing or breakdown when a 900 VAC test voltage is applied. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. There was no evidence of breakdown, arcing, etc., when a 900 VAC test voltage was applied. Test Laboratory TR#207131, REV.1.0 23 of 67 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE B Group A Test Laboratory TR#207131, REV.1.0 24 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: RJC -----------------------------------------------------------START DATE: 4/5/07 COMPLETE DATE: 4/5/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 30% -----------------------------------------------------------EQUIPMENT ID#: 280, 558 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23, with the following conditions: 2. Test Conditions: a) Test Current b) Open Circuit Voltage 3. : 10 milliamps : 20 millivolts The points of application are shown in Figure #2. Test Laboratory TR#207131, REV.1.0 25 of 67 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 2. Avg. 7.0 6.1 6.4 6.9 7.3 7.2 7.1 5.3 Max. 7.4 6.9 7.9 8.1 10.4 9.7 7.9 5.7 Min. 6.7 5.3 5.5 5.8 5.8 6.0 6.2 5.0 See data files 20713101 through 20713108 for individual data points. Test Laboratory TR#207131, REV.1.0 26 of 67 Contech Research An Independent Test and Research Laboratory FIGURE #2 Typical LLCR test set up -I -V Probing the 50 position monitoring header. +V + Probing the PTH’s off the common buss Test Laboratory TR#207131, REV.1.0 27 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: RJC -----------------------------------------------------------START DATE: 4/9/07 COMPLETE DATE: 4/10/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 25% -----------------------------------------------------------EQUIPMENT ID#: 280, 558, 1317, 1324, 1345, 1369 -----------------------------------------------------------DURABILITY PURPOSE: 1. This is a preconditioning sequence which is used to induce the type of wear on the contacting surfaces which may occur under normal service conditions. The connectors are mated and unmated a predetermined number of cycles. Upon completion, the units being evaluated are exposed to the environments as specified to assess any impact on electrical stability resulting from wear or other wear dependent phenomenon. 2. This type or preconditioning sequence is also used to mechanically stress the connector system as would normally occur in actual service. This sequence in conjunction with other tests is used to determine if a significant loss of contact pressure occurs from said stresses which in turn, may result in an unstable electrical condition to exist. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 09. 2. Test Conditions: a) No. of Cycles : 100 b) Rate : 500 Cycles per hour 3. The test samples were assembled to special holding devices and attached to the manual cycling equipment utilizing constant speed control and counter systems. Test Laboratory TR#207131, REV.1.0 28 of 67 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 4. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement. 5. Care was taken to prevent the mating faces of the test samples from contacting each other. 6. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples so tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 3. Avg. Change Max. Change -0.3 +0.4 -0.4 +0.2 -0.5 -0.4 -0.2 +0.4 +0.1 +1.8 +1.0 +1.7 +0.2 +1.0 +0.3 +1.2 See data files 20713101 through 20713108 for individual data points. Test Laboratory TR#207131, REV.1.0 29 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: GL -----------------------------------------------------------START DATE: 4/12/07 COMPLETE DATE: 4/17/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 32% -----------------------------------------------------------EQUIPMENT ID#: 192, 207, 400, 1314, 1315, 1361 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles were performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See next page. Test Laboratory TR#207131, REV.1.0 30 of 67 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) 3. Sample ID# Avg. Change Max. Change B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 -0.2 +0.7 +0.0 +0.0 -0.5 -0.5 -0.2 +0.8 +0.3 +2.1 +1.5 +1.2 +1.0 +0.6 +0.3 +1.4 See data files 20713101 through 20713108 for individual data points. Test Laboratory TR#207131, REV.1.0 31 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: RJC -----------------------------------------------------------START DATE: 4/20/07 COMPLETE DATE: 5/1/07 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 38% -----------------------------------------------------------EQUIPMENT ID#: 27, 280, 558, 614, 1314, 1315, 1361 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as: a) Fretting corrosion due to wear resulting from micromotion, induced by thermal cycling. Humidity accelerates the oxidation process. b) Oxidation of wear debris or from particulates from the surrounding atmosphere which may have become entrapped between the contacting surfaces. c) Failure mechanisms resulting from a wet oxidation process. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) h) Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration Test Laboratory TR#207131, REV.1.0 32 of 67 : : : : : : : : 50°C ± 5°C 90% to 95% 25°C to 65°C No No Mated Mounted 240 hours Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 3. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) 3. Sample ID# Avg. Change Max. Change B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 -0.3 +0.7 -0.1 +0.0 -0.4 -0.4 -0.1 +1.1 -0.1 +1.8 +1.5 +1.3 +1.1 +0.7 +0.2 +3.0 See data files 20713101 through 20713108 for individual data points. Test Laboratory TR#207131, REV.1.0 33 of 67 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES DATA FILE NUMBERS 20713101 20713102 20713103 2073104 20713105 20713106 20713107 20713108 Test Laboratory TR#207131, REV.1.0 34 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# B-A-1 Open circuit voltage: 20mv Spec: Subgroup: File #: EIA 364, TP 23 Seq B 20713101 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.8 6.8 7.1 7.1 6.8 7.2 6.9 7.1 7.0 7.3 7.1 6.7 6.7 6.8 6.7 6.7 6.7 7.3 7.4 7.3 7.3 7.0 23 25 10Apr07 After 100X Durability -0.1 -0.4 -0.5 -0.3 -0.3 -0.3 -0.3 -0.5 -0.3 -0.4 -0.2 -0.1 -0.2 -0.3 -0.1 0.0 0.1 -0.2 -0.2 -0.4 -0.1 -0.6 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid 0.0 -0.2 -0.3 -0.2 0.1 -0.2 -0.2 -0.5 0.3 -0.1 -0.1 0.0 -0.2 -0.3 -0.1 -0.1 -0.1 -0.2 -0.2 -0.4 -0.1 -0.4 -0.2 -0.3 -0.4 -0.6 -0.1 -0.3 -0.5 -0.7 -0.2 -0.3 -0.1 -0.3 -0.4 -0.3 -0.1 -0.2 -0.2 -0.2 -0.2 -0.3 -0.1 -0.5 MAX MIN AVG STD Open Tech 7.4 6.7 7.0 0.2 0 RJC 0.1 -0.6 -0.3 0.2 0 RJC 0.3 -0.5 -0.2 0.2 0 GL -0.1 -0.7 -0.3 0.2 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 35 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# B-A-2 Open circuit voltage: 20mv Spec: Subgroup: File #: EIA 364, TP 23 Seq B 20713102 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.3 5.7 5.9 6.1 5.8 5.4 6.5 6.1 6.1 6.0 5.4 6.5 6.5 6.7 6.2 6.2 6.9 5.3 5.5 5.7 6.3 6.6 23 25 10Apr07 After 100X Durability 0.6 0.9 0.5 0.8 0.5 1.8 -0.2 -0.3 -0.1 -0.1 1.0 0.2 -0.1 -0.1 0.2 0.6 0.3 0.6 0.4 0.6 0.3 -0.1 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid 0.4 0.9 0.5 0.6 0.6 1.2 0.1 0.6 0.6 0.6 2.1 0.5 0.0 0.0 1.3 0.8 -0.1 1.2 1.2 0.8 0.4 0.1 0.3 1.0 0.6 0.7 0.7 1.3 0.2 0.6 0.7 0.6 1.8 0.6 0.1 0.2 1.5 1.0 0.0 1.4 1.3 0.8 0.5 0.1 MAX MIN AVG STD Open Tech 6.9 5.3 6.1 0.4 0 RJC 1.8 -0.3 0.4 0.5 0 RJC 2.1 -0.1 0.7 0.5 0 GL 1.8 0.0 0.7 0.5 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 36 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# B-A-3 Open circuit voltage: 20mv Spec: Subgroup: File #: EIA 364, TP 23 Seq B 20713103 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.9 7.9 7.1 7.1 5.5 5.8 6.1 6.3 6.3 5.5 6.6 7.2 6.3 6.4 7.8 6.8 6.4 5.6 5.9 5.5 5.6 6.3 23 25 10Apr07 After 100X Durability -0.1 -1.3 -0.5 -0.7 0.3 0.7 -0.2 -0.4 -0.5 0.4 -1.5 -2.2 -0.7 -1.3 -2.4 -1.1 -0.5 0.1 0.8 0.8 1.0 0.2 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid -0.3 -1.2 -0.5 -0.5 0.9 0.5 0.2 -0.1 0.0 0.9 -0.4 -1.6 0.1 -0.2 -1.5 -0.6 -0.1 0.4 0.8 1.1 1.5 0.1 -0.3 -1.1 -0.6 -0.6 1.0 0.5 0.2 -0.2 0.0 1.0 -1.5 -1.3 0.2 -0.3 -1.5 -0.5 -0.2 0.2 0.9 1.0 1.5 0.1 MAX MIN AVG STD Open Tech 7.9 5.5 6.4 0.7 0 RJC 1.0 -2.4 -0.4 0.9 0 RJC 1.5 -1.6 0.0 0.8 0 GL 1.5 -1.5 -0.1 0.8 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 37 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# B-A-4 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq B File #: 20713104 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.9 7.0 6.8 7.2 6.9 5.8 7.0 7.2 6.6 8.1 7.9 6.8 6.9 7.0 6.8 7.0 6.6 6.2 6.9 6.9 6.9 6.9 23 25 10Apr07 After 100X Durability 0.0 -0.1 0.1 0.7 -0.1 0.3 0.7 0.5 0.1 -0.8 -0.5 0.0 0.1 0.0 0.1 0.1 0.0 0.8 1.7 0.1 0.1 0.3 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid -0.1 -0.2 -0.1 -0.4 -0.1 1.2 0.0 0.1 0.1 -1.2 -0.6 0.1 0.1 0.0 0.0 0.0 0.1 0.6 0.3 -0.1 -0.1 -0.2 -0.1 -0.2 -0.3 -0.2 0.0 1.3 0.0 0.1 0.1 -1.1 -0.6 0.2 0.1 0.1 0.0 0.1 0.2 -0.2 0.1 0.0 -0.1 -0.1 MAX MIN AVG STD Open Tech 8.1 5.8 6.9 0.5 0 RJC 1.7 -0.8 0.2 0.5 0 RJC 1.2 -1.2 0.0 0.4 0 GL 1.3 -1.1 0.0 0.4 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 38 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# B-A-5 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq B File #: 20713105 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.9 10.4 7.1 6.8 7.0 5.9 5.8 7.0 7.0 6.9 7.2 7.0 7.5 7.2 7.1 7.5 7.1 8.9 7.2 8.3 6.8 7.1 23 25 10Apr07 After 100X Durability -0.3 -3.4 -0.3 -0.1 -0.2 -0.4 0.2 -0.2 0.0 -0.9 -0.3 -0.3 -0.5 0.1 -0.2 -0.4 -0.1 -1.6 -0.4 -1.0 -0.1 -0.3 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid -0.3 -3.7 -0.4 -0.2 -0.3 0.7 1.0 -0.2 -0.1 -0.4 -0.3 -0.4 -0.4 0.0 -0.2 -0.6 -0.3 -2.0 -0.4 -1.5 -0.2 -0.3 -0.3 -3.8 -0.4 -0.1 -0.3 0.7 1.1 -0.1 0.0 -0.3 -0.2 -0.4 -0.4 0.0 -0.1 -0.6 -0.2 -2.0 -0.4 -1.4 -0.1 -0.3 MAX MIN AVG STD Open Tech 10.4 5.8 7.3 0.9 0 RJC 0.2 -3.4 -0.5 0.8 0 RJC 1.0 -3.7 -0.5 0.9 0 GL 1.1 -3.8 -0.4 0.9 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 39 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID#B-A-6 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq B File #: 20713106 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.8 6.5 7.7 6.5 6.1 7.2 7.9 7.1 7.9 7.1 9.7 7.0 7.3 7.0 7.5 8.2 7.0 6.0 7.2 7.0 7.3 7.2 23 25 10Apr07 After 100X Durability 0.0 0.0 -1.2 -0.6 0.1 -0.1 -0.9 0.0 -1.2 -0.2 -2.8 -0.3 -0.4 -0.2 -0.8 -1.3 -0.2 0.7 -0.5 0.0 -0.3 1.0 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid -0.2 0.1 -1.3 0.2 0.5 -0.2 -0.8 -0.1 -1.3 -0.3 -2.8 -0.3 -0.4 -0.3 -0.8 -1.3 -0.4 0.6 -0.5 -0.2 -0.4 0.0 -0.2 0.1 -1.2 0.3 0.1 -0.2 -0.9 -0.1 -1.3 0.5 -2.7 -0.3 -0.4 -0.3 -0.8 -1.4 -0.3 0.7 -0.5 -0.2 -0.4 -0.1 MAX MIN AVG STD Open Tech 9.7 6.0 7.2 0.8 0 RJC 1.0 -2.8 -0.4 0.8 0 RJC 0.6 -2.8 -0.5 0.7 0 GL 0.7 -2.7 -0.4 0.7 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 40 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# B-A-7 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq B File #: 20713107 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.5 6.8 7.2 6.5 6.6 7.4 7.5 7.2 7.2 7.2 7.2 7.3 7.7 7.1 7.3 7.9 7.4 6.2 6.9 6.5 6.7 7.5 23 25 10Apr07 After 100X Durability -0.1 0.3 -0.4 0.0 -0.1 0.3 0.1 -0.2 -0.1 -0.2 -0.4 -0.4 -0.6 -0.1 -0.2 -0.8 -0.3 0.2 -0.6 -0.7 -0.7 -0.4 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid -0.1 0.0 -0.5 0.0 -0.2 -0.3 -0.1 -0.2 -0.1 -0.1 -0.4 -0.4 -0.6 -0.2 -0.1 -0.8 -0.3 0.3 -0.3 -0.1 -0.1 -0.4 0.2 0.1 -0.4 0.2 -0.1 -0.1 0.2 -0.1 0.1 0.1 -0.4 -0.3 -0.5 -0.2 -0.2 -0.8 -0.3 0.1 -0.3 0.1 -0.2 -0.4 MAX MIN AVG STD Open Tech 7.9 6.2 7.1 0.4 0 RJC 0.3 -0.8 -0.2 0.3 0 RJC 0.3 -0.8 -0.2 0.2 0 GL 0.2 -0.8 -0.1 0.3 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 41 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# B-A-8 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq B File #: 20713108 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 30 05Apr07 Initial 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.6 5.4 5.5 5.4 5.2 5.3 5.6 5.5 5.4 5.2 5.4 5.4 5.7 5.4 5.3 5.4 5.6 5.0 5.1 5.2 5.2 5.2 23 25 10Apr07 After 100X Durability 1.1 0.8 0.9 1.1 1.2 0.3 -0.2 0.2 0.1 0.1 0.2 -0.1 0.7 0.1 0.1 0.3 0.3 0.1 0.1 0.0 0.1 0.4 23 32 17Apr07 T-Shock 22 38 01May07 Cy Humid 0.9 0.9 1.1 1.4 1.3 1.3 1.0 1.2 0.8 0.4 0.4 0.3 0.6 0.4 0.6 0.7 0.8 1.0 0.5 0.3 0.8 0.8 0.9 1.4 1.0 1.4 1.2 1.3 1.1 1.2 1.2 0.7 0.9 0.7 0.7 0.7 0.8 3.0 0.8 1.2 0.9 0.6 0.8 1.1 MAX MIN AVG STD Open Tech 5.7 5.0 5.3 0.2 0 RJC 1.2 -0.2 0.4 0.4 0 RJC 1.4 0.3 0.8 0.3 0 GL 3.0 0.6 1.1 0.5 0 RJC Equip ID 280 558 280 558 400 207 280 558 Test Laboratory TR#207131, REV.1.0 42 of 67 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE C Group A Test Laboratory TR#207131, REV.1.0 43 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: GL -----------------------------------------------------------START DATE: 4/12/07 COMPLETE DATE: 4/12/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 26% -----------------------------------------------------------EQUIPMENT ID#: 207, 400 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23, with the following conditions: 2. Test Conditions: a) Test Current : 10 milliamps b) Open Circuit Voltage : 20 millivolts Test Laboratory TR#207131, REV.1.0 44 of 67 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued: 3. The points of application are shown in Figure #2. -----------------------------------------------------------REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 2. Avg. Max. Min. 7.3 6.2 5.4 6.9 6.5 7.5 6.5 6.4 8.9 7.7 6.6 8.6 7.6 9.1 7.2 6.9 6.0 5.3 4.9 5.8 5.4 6.5 5.5 5.2 See data files 20713101 through 20713108 for individual data points. Test Laboratory TR#207131, REV.1.0 45 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: RT/SR -----------------------------------------------------------START DATE: 4/25/07 COMPLETE DATE: 4/25/07 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 34% -----------------------------------------------------------EQUIPMENT ID#: 244, 553, 1032, 1121, 1166, 1167, 1168, 1169, 1271, 1272 -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27. 2. Test Conditions: a) b) c) d) e) Peak Value Duration Wave Form Velocity No. of Shocks : : : : : 100 G 6 Milliseconds Half-Sine 11.3 feet per second 3 Shocks/Direction, 3 Axis (18 Total) 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. Test Laboratory TR#207131, REV.1.0 46 of 67 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 2. -continued The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 Avg. Change Max. Change -0.1 +0.3 +0.2 +0.4 +0.1 -0.2 +0.2 +0.2 +1.1 +1.0 +0.5 +1.8 +0.9 +0.1 +0.9 +0.8 3. See data files 20713109 through 20713116 for individual data points. 4. The Mechanical Shock characteristics are shown in Figures #3 (Calibration Pulse) and #4 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification. Test Laboratory TR#207131, REV.1.0 47 of 67 Contech Research An Independent Test and Research Laboratory FIGURE #3 Channel 1 Classical Shock [g] UPPER LIMIT------ 150 Project 207131 Samtec Cal Wave 1 100G’s 6ms Halfsine 04-25-07 Tech:RT ACCELERATION (g) 100 ACTUAL PULSE----50 0 -50 -100 0.46 LOWER LIMIT----- 0.47 0.48 0.49 0.50 0.51 0.52 0.53 0.54 [s] DURATION (Seconds) Test Laboratory TR#207131, REV.1.0 Contech Research 48 of 67 An Independent Test and Research Laboratory FIGURE #4 Channel 1 Classical Shock [g] UPPER LIMIT------ 150 Project 207131 Samtec Actual Wave 1 100G’s 6ms Halfsine 04-25-07 Tech:RT ACCELERATION (g) 100 ACTUAL PULSE----50 0 -50 -100 0.46 LOWER LIMIT----- 0.47 0.48 0.49 0.50 0.51 0.52 0.53 0.54 [s] DURATION (Seconds) Test Laboratory TR#207131, REV.1.0 Contech Research 49 of 67 An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: RJC -----------------------------------------------------------START DATE: 4/26/07 COMPLETE DATE: 4/30/07 -----------------------------------------------------------ROOM AMBIENT: 20°C RELATIVE HUMIDITY: 40% -----------------------------------------------------------EQUIPMENT ID#: 280, 553, 558, 1121, 1166, 1167, 1168, 1169, 1271, 1272, -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To establish the mechanical integrity of the test samples exposed to external mechanical stresses. 2. To determine if the contact system is susceptible to fretting corrosion. 3. To determine if the electrical stability of the system has degraded when exposed to a vibratory environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 28, Test Condition V, Letter B. 2. Test Conditions: a) G ’RMS’ b) Frequency c) Duration : : : 7.56 50 to 2000 Hz 2.0 hours per axis, 3 axis total 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. All subsequent variable testing was performed in accordance with procedures previously indicated. ----------------------------------------------------------REQUIREMENTS: See next page. Test Laboratory TR#207131, REV.1.0 50 of 67 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 3. Avg. Change Max. Change -0.3 +0.2 +0.4 -0.2 -0.1 -0.5 +0.0 +0.1 +0.6 +0.9 +1.4 +1.8 +1.3 +0.0 +0.7 +1.0 See data files 20713109 through 20713116 for individual data points. Test Laboratory TR#207131, REV.1.0 51 of 67 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES DATA FILE NUMBERS 20713109 20713110 20713111 20713112 20713113 20703114 20703115 20703116 Test Laboratory TR#207131, REV.1.0 52 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-1 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713109 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.0 6.0 6.3 7.0 6.4 7.6 7.7 7.8 7.3 8.2 8.0 8.9 8.6 6.8 8.3 6.8 7.2 7.2 7.1 7.0 6.7 7.8 0.7 0.5 0.4 1.1 -0.4 -0.2 -0.3 0.2 0.0 0.1 -0.6 -0.7 -0.4 -0.9 -0.4 -0.1 0.0 -0.1 0.0 -0.1 -0.1 -0.7 0.4 0.6 0.4 -0.1 -0.1 -0.1 -0.4 -0.2 0.0 -0.3 -1.2 -1.6 -1.7 -0.3 -1.2 -0.1 -0.1 -0.2 -0.2 -0.2 0.1 -0.6 MAX MIN AVG STD Open Tech 8.9 6.0 7.3 0.8 0 GL 1.1 -0.9 -0.1 0.5 0 S.Rath 0.6 -1.7 -0.3 0.6 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 53 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-2 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713110 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R.Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.6 6.8 5.8 5.7 5.9 5.8 6.0 6.8 6.7 6.2 5.3 7.7 5.5 5.8 6.4 6.7 6.7 5.7 5.7 5.7 6.0 7.0 -0.2 -0.2 -0.2 -0.2 0.1 1.0 0.7 0.2 0.1 0.0 0.2 0.3 0.6 1.0 0.4 0.3 0.2 0.0 0.1 0.2 0.8 0.7 -0.3 -0.3 0.4 0.5 0.4 0.7 0.5 0.0 -0.2 0.1 0.6 -0.8 0.9 0.5 -0.3 -0.3 -0.3 0.2 0.6 0.4 0.6 -0.3 MAX MIN AVG STD Open Tech 7.7 5.3 6.2 0.6 0 GL 1.0 -0.2 0.3 0.4 0 S.Rath 0.9 -0.8 0.2 0.4 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 54 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-3 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713101 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R.Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.1 5.9 6.3 5.5 5.3 6.6 5.5 5.4 5.0 5.1 4.9 5.0 5.0 5.2 5.2 5.1 5.4 5.4 5.7 5.4 5.5 6.5 0.0 -0.3 -0.3 -0.1 -0.1 0.5 0.4 0.5 0.5 0.1 0.0 0.4 0.3 0.4 0.4 0.5 0.1 0.1 -0.1 -0.1 0.0 0.4 0.9 0.2 0.1 0.7 0.8 -0.9 0.7 1.4 1.0 0.8 0.2 0.6 0.3 0.6 0.4 0.5 0.1 0.0 -0.3 0.1 0.1 -0.1 MAX MIN AVG STD Open Tech 6.6 4.9 5.4 0.5 0 GL 0.5 -0.3 0.2 0.3 0 S.Rath 1.4 -0.9 0.4 0.5 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 55 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-4 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713112 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R.Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.8 6.0 6.4 6.3 6.1 6.1 6.6 6.5 5.9 7.2 7.3 6.9 7.0 6.8 7.0 8.2 8.6 7.7 7.1 8.0 7.4 5.9 1.4 1.1 1.8 1.0 0.5 0.8 0.4 0.4 0.8 0.7 -0.1 0.1 0.2 -0.2 0.0 0.0 -0.4 -0.2 0.2 -0.5 0.0 1.3 1.8 0.5 0.3 0.1 -0.2 0.6 -0.5 0.1 0.3 -0.5 -0.6 -0.2 -0.9 -0.3 -0.1 -1.6 -1.7 -0.6 -0.5 -0.9 -0.2 0.9 MAX MIN AVG STD Open Tech 8.6 5.8 6.9 0.8 0 GL 1.8 -0.5 0.4 0.6 0 S.Rath 1.8 -1.7 -0.2 0.8 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 56 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-5 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713113 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R.Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 5.6 5.5 5.8 5.4 6.5 7.6 7.1 7.2 6.1 7.3 7.1 5.6 7.2 7.3 6.6 6.8 6.9 5.8 5.7 6.6 6.7 6.4 0.7 0.1 0.7 0.3 0.0 -0.6 -0.2 -0.2 0.3 -0.4 -0.2 0.2 -0.1 -0.2 0.5 0.3 0.0 0.0 0.9 0.5 0.1 0.2 0.4 0.1 1.3 0.4 0.2 -0.8 -0.3 -0.3 0.3 -0.5 -0.7 0.1 -0.3 -0.1 0.0 -0.7 -0.8 -0.3 0.2 0.1 0.0 -0.1 MAX MIN AVG STD Open Tech 7.6 5.4 6.5 0.7 0 GL 0.9 -0.6 0.1 0.4 0 S.Rath 1.3 -0.8 -0.1 0.5 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 57 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-6 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713114 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R.Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 7.2 7.3 7.2 7.1 9.1 7.4 7.5 7.7 7.6 8.0 8.2 7.3 7.5 7.6 8.5 8.5 7.5 6.5 6.7 6.6 6.5 7.3 -0.1 0.0 -0.2 -0.1 -1.1 0.1 0.0 -0.1 -0.1 -0.6 0.1 -0.1 -0.6 -0.2 -1.1 -0.3 0.0 0.0 0.0 -0.4 -0.1 0.1 -0.2 -0.2 -0.3 -0.3 -2.1 0.0 -0.1 -0.2 -0.3 -0.8 -0.9 -0.3 -0.9 -0.3 -1.3 -1.2 -0.1 -0.5 -0.4 -0.7 -0.3 0.0 MAX MIN AVG STD Open Tech 9.1 6.5 7.5 0.7 0 GL 0.1 -1.1 -0.2 0.3 0 S.Rath 0.0 -2.1 -0.5 0.5 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 58 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-7 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713115 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R.Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.7 6.7 6.6 6.5 5.6 7.2 6.8 6.8 6.9 6.6 5.5 7.0 6.7 6.3 6.4 7.0 6.1 5.8 5.5 5.6 7.0 6.7 0.1 0.0 0.2 -0.1 0.4 0.2 0.1 0.1 0.0 0.0 0.2 0.1 -0.4 0.5 0.1 -0.3 0.9 0.7 0.7 0.3 0.0 -0.1 0.6 0.3 0.0 0.0 0.2 -0.2 -0.2 0.0 -0.2 -0.6 0.0 -0.1 -0.4 0.4 -0.3 -0.5 0.3 0.5 0.7 0.1 -0.1 -0.2 MAX MIN AVG STD Open Tech 7.2 5.5 6.5 0.5 0 GL 0.9 -0.4 0.2 0.3 0 S.Rath 0.7 -0.6 0.0 0.3 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 59 of 67 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 207131 Customer: Samtec (1070) Product: Series CLP/FTSH connector Description: ID# C-A-8 Open circuit voltage: 20mv Spec: EIA 364, TP 23 Subgroup: Seq C File #: 20713116 Current: 10 ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 26 12Apr07 Initial 22 34 25Apr07 M.Shock 20 40 30Apr07 R.Vibra 1 2 3 4 5 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 6.5 6.9 6.8 6.5 6.9 5.6 6.5 6.2 5.2 5.3 6.4 5.6 6.9 6.8 6.7 6.8 6.7 6.0 6.7 6.5 6.7 6.7 0.1 0.1 0.2 0.0 0.1 0.1 0.1 0.0 0.1 0.5 0.0 0.0 0.2 0.1 0.2 0.0 0.1 0.8 0.2 0.2 0.3 0.0 -0.1 0.1 0.1 0.0 -0.1 0.5 0.0 0.0 0.5 1.0 -0.4 0.2 0.1 0.1 0.1 0.0 0.1 0.8 -0.1 0.0 0.2 -0.2 MAX MIN AVG STD Open Tech 6.9 5.2 6.4 0.5 0 GL 0.8 0.0 0.2 0.2 0 S.Rath 1.0 -0.4 0.1 0.3 0 RJC Equip ID 400 207 244 1032 280 558 Test Laboratory TR#207131, REV.1.0 60 of 67 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE D Group A Test Laboratory TR#207131, REV.1.0 61 of 67 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: RT -----------------------------------------------------------START DATE: 4/25/07 COMPLETE DATE: 4/25/07 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 34% -----------------------------------------------------------EQUIPMENT ID#: 553, 684, 1028, 1121, 1166, 1168, 1169, 1271, 1272 -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27. 2. Test Conditions: a) b) c) d) e) Peak Value Duration Wave Form Velocity No. of Shocks : : : : : 100 G 6 Milliseconds Half-Sine 12.3 feet Per Second 3 Shocks/Direction, 3 Axis (18 Total) 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. The samples were characterized to determine nanosecond event requirement. Following characterization the requirement level was established at 50 nanoseconds. 5. The low nanosecond monitoring was performed in accordance with EIA 364, Test Procedure 87. -----------------------------------------------------------REQUIREMENTS: See next page. Test Laboratory TR#207131, REV.1.0 62 of 67 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the samples as tested. 2. There shall be no low nanosecond event detected greater than 50 nanoseconds. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no low nanosecond event detected greater than 50 nanoseconds. 3. The Mechanical Shock characteristics are shown in Figures #5 (Calibration Pulse) and #6 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification. Test Laboratory TR#207131, REV.1.0 63 of 67 Contech Research An Independent Test and Research Laboratory FIGURE #5 Channel 1 Classical Shock [g] UPPER LIMIT------ 150 Project 207131 Samtec Cal Wave 1 100G’s 6ms Halfsine 04-25-07 Tech:RT ACCELERATION (g) 100 ACTUAL PULSE----50 0 -50 -100 0.46 LOWER LIMIT----- 0.47 0.48 0.49 0.50 0.51 0.52 0.53 0.54 [s] DURATION (Seconds) Test Laboratory TR#207131, REV.1.0 Contech Research 64 of 67 An Independent Test and Research Laboratory FIGURE #6 Channel 1 Classical Shock [g] UPPER LIMIT------ 150 Project 207131 Samtec Actual Wave 1 100G’s 6ms Halfsine 04-25-07 Tech:RT ACCELERATION (g) 100 ACTUAL PULSE----50 0 -50 -100 0.46 LOWER LIMIT----- 0.47 0.48 0.49 0.50 0.51 0.52 0.53 0.54 [s] DURATION (Seconds) Test Laboratory TR#207131, REV.1.0 Contech Research 65 of 67 An Independent Test and Research Laboratory PROJECT NO.: 207131 SPECIFICATION: TC0626-1070 -----------------------------------------------------------PART NO.: CLP-125-02-L-D-A PART DESCRIPTION: CLP/FTSH FTSH-125-02-L-D Connectors -----------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: RT -----------------------------------------------------------START DATE: 4/26/07 COMPLETE DATE: 4/27/07 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 33% -----------------------------------------------------------EQUIPMENT ID#: 553, 684, 1166, 1167, 1168, 1169, 1271, 1272 -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To establish the mechanical integrity of the test samples exposed to external mechanical stresses. 2. To determine if the contact system is susceptible to fretting corrosion. 3. To determine if electrical discontinuities at the level specified exist. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Specification EIA 364, Test Procedure 28, Test Condition V, Letter B. 2. Test Conditions: a) b) c) d) G ’RMS’ Frequency Duration Test Current : : : : 7.56 50 to 2000 Hz 2.0 Hours per Axis, 3 Axis Total 100 mA 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. The samples were characterized prior to test to determine nanosecond event requirement. Following characterization the requirement level was established at 50 nanoseconds. Test Laboratory TR#207131, REV.1.0 66 of 67 Contech Research An Independent Test and Research Laboratory PROCEDURE: 5. -continued The low nanosecond monitoring was performed in accordance with EIA 364, Test Procedure 87. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no low nanosecond event detected greater than 50 nanoseconds. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no low nanosecond event detected greater than 50 nanoseconds. Test Laboratory TR#207131, REV.1.0 67 of 67 Contech Research An Independent Test and Research Laboratory