SEPTEMBER 24, 2001 TEST REPORT #201175A, REVISION 1.2 QUALIFICATION TESTING PART NUMBERS YFT-20-05-E-08-SB YFS-20-03-E-08-SB YFT-20-05-H-08-SB YFS-20-03-H-08-SB SAMTEC SAM ARRAY NUMBER: 0110-0349 APPROVED BY: LUANNE WITT PROGRAM MANAGER CONTECH RESEARCH, INC. Contech Research REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 9/24/2001 1.0 Initial Issue LEW 10/25/2001 1.1 Editorial changes per customers request. MP 8/14/2007 1.2 Revised Current Derating curves. TP TR#201175A, REV.1.2 2 of 117 Contech Research CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec, of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NCSL Z540-1, as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and Contech Research. Luanne Witt Program Manager Contech Research, Inc. LW:js/cm TR#201175A, REV.1.2 3 of 117 Contech Research SCOPE To perform qualification testing on mated connectors as manufactured and submitted by the test sponsor Samtec. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing form a part of this report to the extent as specified herein. 2. Product Specifications: Nortel Networks, NPS Detail Specification NPS25298-2 3. Standards: EIA Publication 364 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Samtec, for the evaluation to be performed by Contech Research, Inc. Part Number YFT-20-05-E-08-SB YFS-20-03-E-08-SB YFT-20-05-H-08-SB YFS-20-03-H-08-SB Description 50µin 50µin 30µin 30µin Au Au Au Au Header Socket Header Socket Condition Mounted Mounted Mounted Mounted 2. Unless otherwise indicated, all materials were certified by the manufacturer to be in accordance with the applicable product specification. 3. The test samples as submitted were certified by the manufacturer as being fabricated and assembled utilizing normal production techniques common for this type of product and inspected in accordance with the quality criteria as established for the product involved. 4. Where applicable, test samples were supplied assembled and terminated to test boards by the test sponsor. TR#201175A, REV.1.2 4 of 117 Contech Research TEST SAMPLES AND PREPARATION - Continued 5. All test samples were coded and identified by Contech Research to maintain continuity throughout the test sequences. Upon initiating testing, mated test samples remained with each other throughout the test sequences for which they were designated. 6. The test samples were ultrasonically cleaned using the following process: A) Test samples were immersed into the Branson 8210 cleaner which contained Kyzen Ionex FCR cleaning solution with the following conditions: a) b) c) B) Test samples were slowly removed and placed into the Branson 5210 cleaner which contained DI water with the following conditions: a) b) c) 7. Temperature : 55° ± 4°C Frequency : 43 KHz Immersion Time : 3 to 5 Minutes Temperature : 55° ± 4°C Frequency : 47 KHz Immersion Time : 1 to 2 Minutes C) Test samples were removed and placed in a Fisher Thermix agitator containing DI water warmed to 55° ± 5°C for 1 to 2 minutes. D) Upon removal, the test samples were rinsed for 1 to 2 minutes in free flowing DI water at 55° ± 5°C. E) After final rinse, test samples were dried in an air circulating oven for 2 to 3 minutes minimum at 50° ± 2°C. F) Test samples were allowed to recover to room ambient conditions prior to testing. Unless otherwise specified in the test procedures used, no further preparation was used. TEST SELECTION See Test Plan Flow Diagram, Figure #1, for test sequences used. TR#201175A, REV.1.2 5 of 117 Contech Research DATA SUMMARY TEST REQUIREMENT RESULTS RECORD RECORD RECORD NO DAMAGE RECORD RECORD RECORD <50% CORROSION FIGURE #2 36.5lbs MAX. 16.8lbs MIN. PASSED 29.3lbs MAX. 15.1lbs MIN. FIGURES #3-5 FIGURES #6-12 20 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. 9.7mΩ MAX. GROUP 1 (50µin Au) NORMAL FORCE MATING FORCE UNMATING FORCE DURABILITY MATING FORCE UNMATING FORCE NORMAL FORCE WEAR TRACK GROUP 2 (50µin Au) LLCR DURABILITY LLCR PASSED +0.9mΩ MAX. GROUP 3 (50µin Au) CURRENT RATING (32 Pos.) PLOT CURRENT RATING (160 Pos.) PLOT FIG. #13 FIG. #14 GROUP 4 (50µin Au) 20 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. 10.1mΩ MAX. BREAKDOWN VOLTAGE IR RECORD >5000 MEGOHMS 1600 VAC DWV THERMAL SHOCK DWV NO ARCING OR BREAKDOWN NO DAMAGE >5000 MEGOHMS NO ARCING OR BREAKDOWN NO DAMAGE >5000 MEGOHMS NO ARCING OR BREAKDOWN PASSED PASSED PASSED PASSED PASSED PASSED PASSED PASSED BREAKDOWN VOLTAGE RECORD 1100 VAC LLCR VIBRATION LLCR MECHANICAL SHOCK LLCR PASSED +1.3mΩ MAX. PASSED +1.4mΩ MAX. GROUP 5 (50µin Au) IR DWV MOISTURE RESISTANCE IR TR#201175A, REV.1.2 6 of 117 Contech Research DATA SUMMARY – Continued TEST REQUIREMENT RESULTS GROUP 6 (50µin Au) 20 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. 9.2mΩ MAX. PASSED +0.9mΩ MAX. PASSED +0.9mΩ MAX. 20 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. ∆10 mΩ MAX. ∆10 mΩ MAX. ∆10 mΩ MAX. ∆10 mΩ MAX. 9.0mΩ MAX. PASSED +0.9mΩ MAX. +0.9mΩ MAX. +1.4mΩ MAX. +1.4mΩ MAX. +1.5mΩ MAX. RECORD NO DAMAGE RECORD RECORD RECORD RECORD RECORD FIGURE PASSED FIGURE FIGURE FIGURE FIGURE FIGURE LLCR, MATED THERMAL AGING LLCR, UNMATED DURABILITY LLCR MFG (5 DAYS) LLCR MFG (10 DAYS) LLCR MFG (15 DAYS) 20 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE 10.4mΩ PASSED +3.6mΩ PASSED +9.4mΩ PASSED +7.7mΩ PASSED +4.2mΩ PASSED TR#201175A, REV.1.2 7 of 117 LLCR THERMAL SHOCK LLCR MOISTURE RESISTANCE LLCR GROUP 7 (50µin Au) LLCR THERMAL AGING LLCR, 100 HRS. 200 HRS. 300 HRS. 400 HRS. 500 HRS. GROUP 8 (50µin Au) NORMAL FORCE THERMAL AGING NORMAL FORCE, 100 200 300 400 500 HRS. HRS. HRS. HRS. HRS. #20 #21 #22 #23 #24 #25 GROUP 9 (30µin Au) MAX. MAX. MAX MAX. MAX. Contech Research DATA SUMMARY – Continued TEST REQUIREMENT RESULTS GROUP 9 (50µin Au)- Continued LLCR 1 CYCLE LLCR MFG (20 DAYS) LLCR DISTURBANCE LLCR 1 CYCLE LLCR DURABILITY LLCR MFG (30 DAYS) LLCR MFG (40 DAYS) LLCR TR#201175A, REV.1.2 ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. NO DAMAGE ∆10 mΩ MAX. 8 of 117 +7.5mΩ MAX. PASSED +13.7mΩ MAX. PASSED +7.4mΩ MAX. PASSED +5.0mΩ MAX. PASSED +6.6mΩ MAX. PASSED +6.3mΩ MAX. PASSED +6.0mΩ MAX. PASSED +7.6mΩ MAX. Contech Research FIGURE #1 VISUAL SAMPLE PREPARATION NORMAL FORCE LLCR LLCR BREAKDOWN LLCR LLCR NORMAL LLCR VOLTAGE FORCE VIBRATION IR THERMAL THERMAL MATING/ SHOCK THERMAL AGING UNMATING LLCR AGING FORCE DWV THERMAL LLCR DURAMECHANICAL LLCR AGING BILITY(50X) SHOCK DURABILITY DURATHERMAL LLCR BILITY(50X) LLCR SHOCK (100,200, LLCR 300,400, MATING/ LLCR IR 500 HRS) NORMAL MFG UNMATING CURRENT FORCE FORCE RATING DWV (100,200, LLCR (16 CONTACTS) MOISTURE 300,400, RESISTANCE 500 HRS) MFG NORMAL FORCE CURRENT MOISTURE LLCR RATING RESISTANCE (160 CONTACTS) LLCR MFG WEAR TRACK IR LLCR 1 CYCLE DWV LLCR BREAKDOWN VOLTAGE MFG LLCR DISTURBANCE LLCR 1 CYCLE LLCR DURABILITY LLCR MFG LLCR MFG LLCR Gp 1 Gp 2 Gp 3 TR#201175A, REV.1.2 Gp 4 Gp 5 9 of 117 Gp 6 Gp 7 Gp8 Gp 9 Contech Research EQUIPMENT LIST ID# 19 20 27 34 52 53 54 92 113 117 192 203 213 257 315 321 400 410 455 465 466 478 487 521 529 543 544 Next Cal Last Cal 6/29/02 6/29/01 5/9/02 5/9/01 12/29/01 6/29/01 6/12/02 6/22/02 6/12/01 6/22/01 11/1/01 5/1/01 1/23/02 1/23/01 6/20/02 8/30/02 6/21/02 6/21/02 6/20/01 8/30/01 6/21/01 6/21/01 12/11/01 2/24/02 12/11/00 8/24/01 TR#201175A, REV.1.2 Equipment Name Bench Oven Bench Oven Temp. Humid. Chamber Shock Machine Drill Press Stand Load Cell 10 Pound Air Fume Hood NF Fixture Large Oven Digitizing Scope Vertical Thermal Shock Stereo Scope Temp/Humidity Gage Scanner Main Frame X-Y Table AC-DC Hipot/Megometer Computer Current Shunt Digital Multi Meter Unit Precision Resistor Precision Resistor Computer Computer Sulfur Dioxide Analyzer Computer Analytical Balance Temp-Humid-Trans Manufacturer Model # Serial # Accuracy Freq.Cal Blue M Co. Hot Pack Blue M Co. Avco Craftsman Daytronic Labconco BK Tool & MFG Blue M Co. Hewlett Packard Cincinnati Sub-Zero Bausch & Lomb Cole Parmer Co. Keithley Instr. NE Affiliated Tech. Hipotronics Co. Kandu Co. Empro Co. Keithley Co. Victoreen Co. Victoreen Co. Twilight Co. Twilight Co. Polaroid C.S.I. Co. ARC Elect. Ohaus Co. General Eastern POM7-256C 1303 FR-256PC-1 SM110-3 25921 152A-10 47701 N/A POM-166E 54200 VTS-1-5-3 N/A 3310-40 706 XY-6060 H300B 286-12 200A-50 199 5000 Megohm 50,000 mego P111-450 386-40 SA285E 486-40 AP250D 850-232 P38-1453 30364 F2-249 1047 4001-2 182 39286 N/A P6-2724 2445A 00127 88-11094 N/A 1 472351 N/A DS16-201 41353 05 392203 N/A N/A N/A N/A FE001 N/A MO9198 00984 N/A See Cal Cert See ID# 14 & 117 N/A See Cal Cert N/A ±.0005" N/A See Cal Cert See Cal Cert N/A ±1% See Manual N/A See Cal Cert N/A ±1% See Cal Cert ±1% ±1% N/A N/A See Spec N/A ± .4mg ± 2%RH 12 mon. Each Test 12 mon. Each Test N/A 6 mon. N/A N/A Each Test 12mon. 12 mon. N/A 6 mon. Each Test N/A 12 mon. N/A 12mon 1/00 12 mon. 12 mon. N/A N/A Each Test N/A 12 mon. 6mon 10 of 117 Contech Research EQUIPMENT LIST cont. ID# Next Cal Last Cal 628 631 650 683 684 8/28/02 12/29/01 8/8/02 8/28/01 6/29/01 8/8/01 6/11/02 6/11/01 691 10/3/01 4/3/01 2/27/02 8/8/02 10/24/01 11/9/01 2/27/01 8/8/01 4/24/01 5/9/01 8/28/02 1/25/02 5/30/02 11/15/01 8/28/01 7/25/01 5/30/01 11/15/00 12/7/01 6/7/01 7/3/02 7/3/01 699 1012 1041 1047 1115 1116 1118 1130 1136 1139 1168 1169 1175 1238 1272 1278 1279 1297 1298 TR#201175A, REV.1.2 Equipment Name Manufacturer Digital Thermometer LVDT Condt.Amp. Digital Multimeter Plotter Accelerometer Omega Eng. Daytronics Corp. Hewlett Packard Hewlett Packard PCB. Co. Microohm Meter Keithley Co. Oxident Monitor DC Power Supply 30 Amps Force Gage Microohm Meter Digital Multimeter Computer Torque Wrench Lbf-in Accelerometer Signal Condt. Micrometer Barrel Mainframe Computer Discontinuity Monitor Bench Oven Shaker Table Microohm mtr Computer MFG Control Panel MFG Chamber Mast Co. Hewlett Packard Chatillon Keithley Radio Shack ARC. Co. Amp/Macom PCB Co. PCB Mitutuyo Hewlett Packard ARC Metronics Blue M. Unholtz Dickie Keithley ARC Co. Contech Research Contech Research 11 of 117 Model # Serial # Accuracy Freq.Cal DP 116 3230 34401A 7470A 353B04 6210125 S04888 US36032126 2308A85161 47648 ±1.1DegC See Cal Cert See Cal Cert N/A See Cal Cert. 12mon 6 mon. 12 mon. N/A 12mon 580 0686748 See Cal Cert 6 mon. 1724 6033A DFIS-50 580 Auto Range P111-450 9911 353B04 480EO9 152-391 E8408A PC133 DM3000-10 ESP400C-5X S202PB 580 Pent-450 N/A 64 Cu Ft 12732 2642A-02383 B34054 0705731 22-186A N/A See Cal.Cert. ± .15% See Cal Cert See Cal. Cert. N/A See Cal. Cert See Cal. Cert. See Cal. Cert. ±.0001in N/A N/A See Cal Cert See Manual N/A See Manual N/A C1686A N/A Each Test 12 mon. 12 mon. 6 mon. 6 mon. N/A 2098-0275-54 58130 23397 01 US39000357 none 6-2K-1 ESP-1394 263 0803947 030175 N/A N/A 6 mon. 12mon 12 mon. N/A N/A 6mon N/A 12 mon. N/A N/A N/A Contech Research TEST RESULTS GROUP 1 TR#201175A, REV.1.2 12 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 5 Pairs TECHNICIAN: SR -----------------------------------------------------------START DATE: 9/13/01 COMPLETE DATE: 9/13/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 45% -----------------------------------------------------------EQUIPMENT ID#: 53, 92, 455, 487, 631, 683, 1139 -----------------------------------------------------------NORMAL FORCE PURPOSE: To determine the magnitude of normal force generated at any given deflection level within the normal operating levels of the contact system. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 04. 2. Applicable portions of the plastic housing were removed to expose the contacts to be tested. 3. One tine of the contact was removed to expose the opposing tine to be tested. 4. The prepared sample was placed in a special holding fixture on a X-Y moveable table. 5. The sample was positioned in such a manner so as to allow a special probe attached to a force transducer to deflect the contact element to a given distance as specified. 6. The probe/force traducer is interconnected with a linear transducer, amplifier, data acquisition/computer system and plotter. 7. As the contact element is deflected to the level desired, the normal force characteristic is plotted directly and simultaneously. TR#201175A, REV.1.2 13 of 117 Contech Research PROCEDURE: Continued 8. The test was performed with the contact in its plastic housing. 9. The exposed contact was deflected 0.005”. -----------------------------------------------------------REQUIREMENTS: The force/deflection characteristic shall be plotted. -----------------------------------------------------------RESULTS: 1. The force/deflection characteristic is shown in Figure #2. 2. The normal force characteristic for 5 contacts are shown on the same plot. 3. The spring rate of the contact system tested was 16 grams/0.001" deflection. TR#201175A, REV.1.2 14 of 117 Contech Research FIGURE #2 TR#201175A, REV.1.2 15 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 3 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/12/01 COMPLETE DATE: 7/12/01 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 50% -----------------------------------------------------------EQUIPMENT ID#: 315, 1041 -----------------------------------------------------------MATING AND UNMATING FORCE PURPOSE: To determine the mechanical forces required to completely mate and unmate the connector pairs. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 13. 2. The test samples were fixtured to the base plate of the test stand and applicable force gauge. 3. The fixturing was accomplished to assure axial alignment and allowed self centering movement to exist. 4. Care was taken to assure that the mating faces did not contact each other to assure proper forces were measured. 5. The test rate was 1 inch per minute maximum. -----------------------------------------------------------REQUIREMENTS: The force required to mate and unmate shall be measured and recorded. -----------------------------------------------------------RESULTS: See next page. TR#201175A, REV.1.2 16 of 117 Contech Research RESULTS: The following is a summary of the observed data: Sample ID# 2 3 4 TR#201175A, REV.1.2 MATING FORCE (Pounds) 36.5 29.6 32.5 17 of 117 UNMATING FORCE (Pounds) 18.3 18.5 16.8 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 3 Pairs TECHNICIAN: SR -----------------------------------------------------------START DATE: 9/14/01 COMPLETE DATE: 9/14/01 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 50% -----------------------------------------------------------EQUIPMENT ID#: 315, 1041 -----------------------------------------------------------DURABILITY PURPOSE: To determine the effects of subjecting connector pairs to a predetermined number of mating and unmating cycles simulating the expected mechanical life of the connector. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 09. 2. Test Conditions: a) No. of Cycles : 50 b) Rate : 1 inch per minute max 3. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See next page. TR#201175A, REV.1.2 18 of 117 Contech Research REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples. 2. The force required to mate and unmate the connector pairs shall be measured and recorded. 3. The normal force shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples. 2. The following is a summary of the data observed: Sample ID# aG2-2 aG2-3 aG2-4 3. MATING FORCE (Pounds) 29.3 20.5 25.7 UNMATING FORCE (Pounds) 16.8 15.1 15.7 Figures #3 thru 5 illustrate the normal force characteristics of the samples. TR#201175A, REV.1.2 19 of 117 Contech Research FIGURE #3 TR#201175A, REV.1.2 20 of 117 Contech Research FIGURE #4 TR#201175A, REV.1.2 21 of 117 Contech Research FIGURE #5 TR#201175A, REV.1.2 22 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 15 Contacts TECHNICIAN: GP -----------------------------------------------------------START DATE: 9/18/01 COMPLETE DATE: 9/18/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 40% -----------------------------------------------------------EQUIPMENT ID#: 20, 54, 203, 213, 628 -----------------------------------------------------------WEAR TRACK PURPOSE: To determine if 50 cycles of durability has worn through the plating. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 60. 2. Test Conditions: a) b) c) d) e) f) g) Acid Vapor Quantity of Acid Exposure Time Dry Time Dry Temperature Sample Mated : : : : : : : Nitric Acid 100 ml 60 Minutes 15 minutes 125°C Socket & Header No 3. The contacts were carefully removed from the housing and “opened” to expose the contact tines. 4. The exposed contact tines and header pins were examined under 10x magnification. -----------------------------------------------------------REQUIREMENTS: All contact tines shall have less than 50 percent coverage of corrosion product in the wear track. TR#201175A, REV.1.2 23 of 117 Contech Research RESULTS: 1. Approximately 40% of the contact tines have corrosion product in the wear track. 2. See Figures #6-12 for typical contacts. TR#201175A, REV.1.2 24 of 117 Contech Research FIGURE #6 Typical Measurement Zone TR#201175A, REV.1.2 25 of 117 Contech Research FIGURE #7 Typical Measurement Zone TR#201175A, REV.1.2 26 of 117 Contech Research FIGURE #8 Typical Measurement Zone TR#201175A, REV.1.2 27 of 117 Contech Research FIGURE #9 Typical Measurement Zone TR#201175A, REV.1.2 28 of 117 Contech Research FIGURE #10 Typical Measurement Zone TR#201175A, REV.1.2 29 of 117 Contech Research FIGURE #11 Typical Measurement Zone TR#201175A, REV.1.2 30 of 117 Contech Research FIGURE #12 Typical Measurement Zone TR#201175A, REV.1.2 31 of 117 Contech Research TEST RESULTS GROUP 2 TR#201175A, REV.1.2 32 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 6/28/01 COMPLETE DATE: 7/02/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54% -----------------------------------------------------------EQUIPMENT ID#: 400, 1047 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 23. 2. Test Conditions: a) Test Current : 10 ma max. b) Open Circuit Voltage : 20 mv c) No. of Positions Tested : 25 per test sample -----------------------------------------------------------REQUIREMENTS: The low level circuit resistance as measured shall not exceed 20 milliohms. -----------------------------------------------------------RESULTS: See next page. TR#201175A, REV.1.2 33 of 117 Contech Research RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# 1-4, 6-9 2. Avg. Max. Min. 7.8 9.7 2.4 See data file 201175B01 for individual data points. TR#201175A, REV.1.2 34 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 6/28/01 COMPLETE DATE: 6/28/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54% -----------------------------------------------------------EQUIPMENT ID#: Manual, 400, 1047 -----------------------------------------------------------DURABILITY PURPOSE: To determine the effects of subjecting connector pairs to a predetermined number of mating and unmating cycles simulating the expected mechanical life of the connector. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 09. 2. Test Conditions: a) No. of Cycles b) Rate : : 50 1 inch per minute 2. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement. 3. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples. 2. The change in low level circuit resistance shall not exceed +10 milliohms. TR#201175A, REV.1.2 35 of 117 Contech Research RESULTS: 1. There was no evidence of physical damage to the test samples. 2. The following is a summary of the observed data: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) 3. Sample ID# Avg. Change Max. Change 1-4, 6-9 -0.1 +0.9 See data file 201175B01 for individual data points. TR#201175A, REV.1.2 36 of 117 Contech Research Low Level Contact Resistance Project: 201175A Customer: Samtec Product: YFS/YFT 50µ inch Au Description: # 1, # 2, # 3, # 4, # 6, # 7, # 8, # 9 Open circuit voltage: 20mv Spec: NPS 25298-2 Subgroup: 2 File #: 201175B01 Tech: G.P. Current: 10ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 23 46 02Jul01 Dur. 50x 7.4 7.0 7.4 8.6 8.6 8.7 8.7 8.4 8.7 8.8 8.8 8.7 7.2 8.8 8.6 8.7 8.6 8.4 8.4 8.6 8.6 8.7 8.6 4.0 4.2 7.3 7.3 7.4 8.5 8.5 8.5 8.8 8.2 8.5 0.0 0.1 -0.1 -0.2 -0.2 -0.2 -0.1 0.0 0.0 -0.1 -0.1 0.0 0.1 -0.2 0.0 0.0 0.0 0.2 0.0 -0.1 -0.1 -0.1 -0.1 0.1 0.1 0.0 -0.4 -0.2 -0.3 -0.2 -0.3 -0.3 -0.1 -0.2 1-H1 1-G9 1-F6 1-E4 1-D2 1-C4 1-B6 1-A1 1-A3 1-A5 1-C7 1-D9 1-H11 1-C13 1-B15 1-A16 1-A18 1-A20 1-B19 1-C17 1-D19 1-E17 1-F15 1-G18 1-H20 2-H1 2-G9 2-F6 2-E4 2-D2 2-C4 2-B6 2-A1 2-A3 TR#201175A, REV.1.2 37 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 23 46 02Jul01 Dur. 50x 8.4 8.6 8.2 8.1 8.6 8.3 8.5 8.3 8.5 8.4 8.4 8.6 9.7 8.6 7.3 7.8 7.7 8.8 7.4 8.5 8.5 8.5 8.6 8.5 8.7 8.5 8.8 8.7 8.5 8.5 8.9 8.7 8.4 4.2 8.5 8.6 8.6 8.6 7.7 8.6 8.0 6.7 6.4 6.3 7.6 -0.2 -0.2 -0.1 0.0 -0.2 -0.1 0.0 0.0 -0.1 -0.1 -0.1 -0.1 -1.3 -1.1 -0.2 0.1 0.1 -0.2 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 0.0 -0.1 0.0 0.3 0.0 -0.3 0.0 0.0 0.0 0.0 -0.1 0.0 0.0 0.1 -0.1 0.9 0.1 -0.2 -0.1 -0.2 2-A5 2-C7 2-D9 2-H11 2-C13 2-B15 2-A16 2-A18 2-A20 2-B19 2-C17 2-D19 2-E17 2-F15 2-G18 2-H20 3-H1 3-G9 3-F6 3-E4 3-D2 3-C4 3-B6 3-A1 3-A3 3-A5 3-C7 3-D9 3-H11 3-C13 3-B15 3-A16 3-A18 3-A20 3-B19 3-C17 3-D19 3-E17 3-F15 3-G18 3-H20 4-H1 4-G9 4-F6 4-E4 TR#201175A, REV.1.2 38 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 23 46 02Jul01 Dur. 50x 7.0 7.6 7.6 3.8 2.4 7.8 7.6 6.9 6.5 7.6 7.6 6.9 7.6 7.3 7.5 7.4 7.4 7.2 6.2 7.1 6.8 7.8 8.4 7.2 7.3 8.5 8.5 8.4 8.3 8.6 8.5 8.5 8.3 8.3 7.4 8.4 8.5 8.5 8.4 8.4 8.3 8.5 8.5 7.5 8.7 0.2 -0.2 -0.2 -0.1 0.0 -0.1 0.0 0.2 0.2 -0.1 0.1 -0.3 -0.1 0.0 0.0 0.0 -0.7 -0.7 -0.1 -0.6 0.2 -0.1 -0.4 -0.3 -0.3 -0.2 -0.1 -0.1 -0.2 -0.1 -0.1 -0.2 -0.8 -0.4 0.1 -0.2 -0.1 -0.1 -0.2 -0.1 -0.6 -0.1 -0.2 -0.2 -0.1 4-D2 4-C4 4-B6 4-A1 4-A3 4-A5 4-C7 4-D9 4-H11 4-C13 4-B15 4-A16 4-A18 4-A20 4-B19 4-C17 4-D19 4-E17 4-F15 4-G18 4-H20 6-H1 6-G9 6-F6 6-E4 6-D2 6-C4 6-B6 6-A1 6-A3 6-A5 6-C7 6-D9 6-H11 6-C13 6-B15 6-A16 6-A18 6-A20 6-B19 6-C17 6-D19 6-E17 6-F15 6-G18 TR#201175A, REV.1.2 39 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 23 46 02Jul01 Dur. 50x 7.9 7.2 6.9 8.5 8.4 8.5 8.6 8.5 4.1 8.5 8.5 8.6 8.4 7.3 8.9 8.3 8.4 8.4 8.2 8.3 2.8 8.5 8.4 7.2 7.1 7.4 7.8 8.5 7.2 7.6 8.9 8.6 8.9 8.5 8.7 8.7 8.7 8.4 9.1 8.6 8.6 8.7 4.5 8.4 8.5 0.0 0.1 -0.1 -0.4 -0.1 -0.2 -0.1 -0.2 0.0 -0.3 -0.2 -0.2 -0.2 -0.1 -0.5 -0.1 -0.2 -0.1 -0.1 -0.2 0.0 -0.1 -0.9 -0.2 -0.1 0.1 0.0 -0.2 -0.2 0.9 -0.3 -0.3 -0.2 -0.2 -0.1 -0.2 -0.3 -0.1 -0.2 -1.1 0.0 -0.1 -0.2 0.0 -0.2 6-H20 7-H1 7-G9 7-F6 7-E4 7-D2 7-C4 7-B6 7-A1 7-A3 7-A5 7-C7 7-D9 7-H11 7-C13 7-B15 7-A16 7-A18 7-A20 7-B19 7-C17 7-D19 7-E17 7-F15 7-G18 7-H20 8-H1 8-G9 8-F6 8-E4 8-D2 8-C4 8-B6 8-A1 8-A3 8-A5 8-C7 8-D9 8-H11 8-C13 8-B15 8-A16 8-A18 8-A20 8-B19 TR#201175A, REV.1.2 40 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 23 46 02Jul01 Dur. 50x 8-C17 8-D19 8-E17 8-F15 8-G18 8-H20 9-H1 9-G9 9-F6 9-E4 9-D2 9-C4 9-B6 9-A1 9-A3 9-A5 9-C7 9-D9 9-H11 9-C13 9-B15 9-A16 9-A18 9-A20 9-B19 9-C17 9-D19 9-E17 9-F15 9-G18 9-H20 8.6 8.6 8.7 7.5 8.7 7.7 6.6 6.3 6.1 6.4 7.5 7.7 7.9 7.2 7.7 7.7 7.8 7.6 7.5 7.6 7.6 7.7 7.7 7.6 2.4 2.4 7.5 7.4 6.1 6.1 6.7 -0.2 -0.1 -0.1 0.3 -0.2 -0.1 -0.1 -0.1 0.1 0.0 -0.1 -0.2 -0.2 -0.1 -0.2 -0.2 -0.2 -0.2 -1.0 -0.5 -0.1 -0.1 -0.1 -0.1 0.0 0.0 -0.1 0.0 0.0 -0.1 0.0 MAX MIN AVG STD Open 9.7 2.4 7.8 1.2 0 0.9 -1.3 -0.1 0.2 0 Tech Equip ID G.P. G.P. 400,1047 400,1047 TR#201175A, REV.1.2 41 of 117 Contech Research TEST RESULTS GROUP 3 TR#201175A, REV.1.2 42 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 2 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 8/03/01 COMPLETE DATE: 8/10/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 58% -----------------------------------------------------------EQUIPMENT ID#: 257, 410, 650, 1012, 1279 -----------------------------------------------------------CURRENT CARRYING CAPACITY, STEPPED TECHNIQUE PURPOSE: To establish the current carrying capacity of the test sample under evaluation. This is achieved by determining the temperature rise resulting at the contact interface at specified current levels. The temperature rise at a given current level plus the ambient operating temperature should not exceed the temperature rating of the test sample. Thus, the current rating of the system decreases as the operating ambient increases. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 70. 2. The test samples were prepared to accept thermocouples at the appropriate locations. 3. An additional thermocouple was placed 2″ outside of the test samples adjacent to the locations to be monitored. This is accomplished to evaluate the impact of ambient conditions. 4. Kapton tape was used to cover the holes in the housing required to insert the thermocouples. 5. The thermocouples were attached to a data acquisition/ scanner system. TR#201175A, REV.1.2 43 of 117 Contech Research PROCEDURE: Continued 6. The test specimen was placed in a chamber or room which prevents air currents and the like from influencing the observations. 7. Test Conditions: a) Current Levels b) No. of Contacts in Series c) Derating Curve : 0.5A, 0.75A, 1.0A, 1.25A : 32 Pos. and 160 Pos. : Yes 8. The current level indicated was applied until temperature stabilization was reached. 9. Temperature stabilization is defined as no change in T-Rise greater than ± 1°C over a 15 minute interval. 10. Two types of circuits were tested: and 160 positions in series. 32 positions in series 11. Only positions on the outside rows of the connector could be tested. -----------------------------------------------------------REQUIREMENTS: The temperature rise shall be measured and recorded and a current derating curve established. -----------------------------------------------------------RESULTS: Figures #13 and 14 are the current derating curve for connectors evaluated with maximum operating temperature of 125° C. The derated curve is 20% from the base curve. TR#201175A, REV.1.2 44 of 117 Contech Research FIGURE #13 TR#201175A, REV.1.2 45 of 117 Contech Research FIGURE #14 TR#201175A, REV.1.2 46 of 117 Contech Research TEST RESULTS GROUP 4 TR#201175A, REV.1.2 47 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 6/28/01 COMPLETE DATE: 7/26/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54% -----------------------------------------------------------EQUIPMENT ID#: 400, 1047 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 23. 2. Test Conditions: a) Test Current : 10 ma max. b) Open Circuit Voltage : 20 mv c) No. of Positions Tested : 25 per test sample -----------------------------------------------------------REQUIREMENTS: The low level circuit resistance as measured shall not exceed 20 milliohms. -----------------------------------------------------------RESULTS: See next page. TR#201175A, REV.1.2 48 of 117 Contech Research RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# 1-4, 6-9 2. Avg. 8.0 Max. 10.1 Min. 6.4 See data file 201175B02 for individual data points. TR#201175A, REV.1.2 49 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 10 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/19/01 COMPLETE DATE: 7/19/01 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 54% -----------------------------------------------------------EQUIPMENT ID#: 684, 1168, 1169, 1175, 1272 -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To evaluate the test samples to determine if fretting corrosion occurs due to mechanical motion. To evaluate the integrity of the test samples relative to a severe mechanical environment. 2. To determine if electrical discontinuities at the level specified exist. 3. To determine if the electrical stability of the system has degraded when exposed to a vibratory environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 28, Test Condition V, Letter B. 2. Test Conditions: a) b) c) d) Power Spectral Density G ’RMS’ Frequency Duration : : : : 0.04g2/Hz 7.56 gs 50-2000Hz 2 hrs/axis, 3 axis 3. The low nanosecond event detection was performed in accordance with EIA 364, Test Procedure 87. 4. Two connector pairs were monitored for 1µsec. discontinuity. TR#201175A, REV.1.2 50 of 117 Contech Research PROCEDURE: 5. Continued All subsequent variable testing was performed in accordance with procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples. 2. There shall be no contact interruption greater than 1.0 microsecond. 3. The change in low level circuit resistance shall not exceed +10 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples. 2. There was no interruption greater than 1 microsecond. 3. The following is a summary of the observed data: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# Avg. Change Max. Change 1-4, 6-9 0.0 +1.3 4. See data file 201175B02 for individual data points. 5. Figures #15 thru 17 illustrate typical vibration plots. TR#201175A, REV.1.2 51 of 117 Contech Research FIGURE #15 TR#201175A, REV.1.2 52 of 117 Contech Research FIGURE #16 TR#201175A, REV.1.2 53 of 117 Contech Research FIGURE #17 TR#201175A, REV.1.2 54 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 10 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/23/01 COMPLETE DATE: 7/23/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 53% -----------------------------------------------------------EQUIPMENT ID#: 34, 117, 478, 1130, 1136, 1175 -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 27, Test Condition C. 2. Test Conditions: a) b) c) d) Peak Value Duration Wave Form No. of Shocks : : : : 100 G 6 Milliseconds Half-sine 3 Shocks/Direction, 3 Axis (18 Total) 3. The low nanosecond monitoring was performed in accordance with EIA 364, Test Procedure 87. 4. Two connector pairs were monitored for 1µsec discontinuity. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples. 2. There shall be no contact interruption greater than 1.0 microsecond. TR#201175A, REV.1.2 55 of 117 Contech Research REQUIREMENTS: 3. Continued The change in low level circuit resistance shall not exceed +10 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples. 2. There was no contact interruption greater than 1.0 microsecond. 3. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# Avg. Change Max. Change 1-4, 6-9 0.0 +1.4 4. See data file 201175B02 for individual data points. 5. Figures #18 and 19 illustrate typical vibration plots. TR#201175A, REV.1.2 56 of 117 Contech Research FIGURE #18 TR#201175A, REV.1.2 57 of 117 Contech Research FIGURE #19 TR#201175A, REV.1.2 58 of 117 Contech Research Low Level Contact Resistance Project: 201175A Customer: Samtec Product: YFS/YFT 50µ inch Au Description: # 1, # 2, # 3, # 4, # 6, # 7, # 8, # 9 Open circuit voltage: 20mv Spec: Subgroup: File #: Tech. Current: NPS 25298-2 Gp. 4 201175B02 G.P. 10ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 1-H1 1-G9 1-F6 1-E4 1-D2 1-C4 1-B6 1-A1 1-A3 1-A5 1-C7 1-D9 1-H11 1-C13 1-B15 1-A16 1-A18 1-A20 1-B19 1-C17 1-D19 1-E17 1-F15 1-G18 1-H20 2-H1 2-G9 2-F6 2-E4 2-D2 2-C4 2-B6 2-A1 2-A3 TR#201175A, REV.1.2 7.5 7.8 7.8 8.7 8.5 8.9 8.9 8.2 8.7 8.7 8.8 8.5 9.0 8.7 8.5 8.7 8.7 8.7 8.8 8.8 8.7 8.3 7.8 7.6 7.8 7.6 7.9 7.4 8.8 8.9 8.8 8.7 8.5 8.6 23 23 50 60 7/20/01 7/26/01 Vibration M. Shock 0.0 0.1 -0.3 0.0 0.0 -0.2 -0.2 -0.1 0.0 -0.1 0.0 0.0 0.0 -0.1 0.0 -0.1 -0.2 -0.1 -0.1 0.0 0.1 0.5 0.1 0.0 0.1 0.0 0.9 0.2 -0.1 -0.2 -0.1 -0.1 -0.2 -0.2 0.0 -0.3 -0.7 -0.3 -0.1 -0.3 -0.2 -0.1 -0.1 -0.1 -0.1 -0.1 0.1 -0.1 -0.1 -0.1 -0.2 -0.2 -0.1 -0.1 -0.1 -0.2 -0.2 0.0 0.2 0.5 0.8 0.0 -0.1 -0.1 -0.1 -0.2 -0.1 -0.1 59 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 2-A5 2-C7 2-D9 2-H11 2-C13 2-B15 2-A16 2-A18 2-A20 2-B19 2-C17 2-D19 2-E17 2-F15 2-G18 2-H20 3-H1 3-G9 3-F6 3-E4 3-D2 3-C4 3-B6 3-A1 3-A3 3-A5 3-C7 3-D9 3-H11 3-C13 3-B15 3-A16 3-A18 3-A20 3-B19 3-C17 3-D19 3-E17 3-F15 3-G18 3-H20 4-H1 4-G9 4-F6 4-E4 TR#201175A, REV.1.2 8.9 8.9 8.8 8.0 8.9 8.9 8.7 8.6 8.6 8.8 8.7 8.7 7.7 7.2 8.0 8.1 6.8 6.4 6.6 7.0 8.0 8.0 7.9 7.4 7.9 7.8 7.8 7.4 6.4 7.5 7.9 7.9 7.7 7.6 7.7 7.5 7.8 6.8 6.4 6.5 7.1 6.9 6.6 6.7 7.2 23 23 50 60 7/20/01 7/26/01 Vibration M. Shock -0.2 -0.1 0.0 1.3 -0.1 -0.1 0.0 0.1 0.0 -0.1 0.0 0.0 1.0 0.5 0.9 0.9 0.2 0.0 0.0 0.2 -0.1 0.1 0.0 0.3 0.5 0.0 0.0 0.2 0.1 0.0 -0.2 -0.3 -0.1 -0.7 -0.1 0.1 0.0 0.2 0.0 -0.1 -0.2 -0.1 -0.2 -0.2 0.2 -0.1 -0.2 -0.1 1.2 -0.1 -0.2 0.0 0.0 -0.1 -0.2 -0.1 -0.1 1.0 0.0 0.8 1.4 0.2 -0.1 -0.1 0.0 0.1 0.0 -0.1 0.0 0.1 -0.1 0.0 0.0 0.4 0.1 0.2 0.1 0.1 0.0 -0.1 0.7 0.1 0.1 -0.1 0.1 0.4 -0.1 -0.2 -0.4 -0.1 60 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 4-D2 4-C4 4-B6 4-A1 4-A3 4-A5 4-C7 4-D9 4-H11 4-C13 4-B15 4-A16 4-A18 4-A20 4-B19 4-C17 4-D19 4-E17 4-F15 4-G18 4-H20 5-H1 5-G9 5-F6 5-E4 5-D2 5-C4 5-B6 5-A1 5-A3 5-A5 5-C7 5-D9 5-H11 5-C13 5-B15 5-A16 5-A18 5-A20 5-B19 5-C17 5-D19 5-E17 5-F15 5-G18 TR#201175A, REV.1.2 7.6 7.5 8.3 7.3 7.6 7.8 7.8 7.3 6.5 6.9 7.9 7.6 7.5 7.3 7.6 7.9 7.6 7.5 7.6 6.6 6.7 7.6 7.1 7.2 8.7 8.6 8.5 8.7 8.3 8.6 8.7 8.7 8.7 8.4 8.8 7.9 8.8 8.5 8.4 8.6 8.6 8.5 8.6 7.3 7.4 23 23 50 60 7/20/01 7/26/01 Vibration M. Shock 0.1 0.0 -0.6 0.2 0.1 0.3 -0.2 0.2 -0.1 0.5 -0.3 0.0 -0.1 0.0 -0.1 -0.2 -0.1 -0.3 -1.1 -0.2 -0.2 0.0 0.0 0.0 -0.1 0.0 -0.1 -0.2 -0.1 -0.1 0.0 -0.1 -0.3 0.3 -0.2 -0.1 -0.2 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 0.0 -0.2 0.0 0.0 -0.5 -0.1 0.0 0.1 -0.2 -0.4 0.1 0.0 -0.3 0.1 0.1 0.0 -0.1 -0.1 0.0 0.2 -0.8 -0.1 0.1 0.0 0.0 0.0 -0.1 -0.1 0.0 -0.1 -0.1 -0.1 0.0 -0.1 -0.3 0.3 -0.2 0.0 -0.1 0.0 -0.1 -0.1 -0.1 -0.1 -0.1 0.3 -0.1 61 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 5-H20 6-H1 6-G9 6-F6 6-E4 6-D2 6-C4 6-B6 6-A1 6-A3 6-A5 6-C7 6-D9 6-H11 6-C13 6-B15 6-A16 6-A18 6-A20 6-B19 6-C17 6-D19 6-E17 6-F15 6-G18 6-H20 7-H1 7-G9 7-F6 7-E4 7-D2 7-C4 7-B6 7-A1 7-A3 7-A5 7-C7 7-D9 7-H11 7-C13 7-B15 7-A16 7-A18 7-A20 7-B19 23 54 28Jun01 Initial 8.0 7.6 7.2 7.3 8.1 8.8 8.7 8.7 8.3 8.6 8.7 8.6 8.1 8.0 8.5 8.5 8.7 8.4 8.3 8.4 8.5 8.7 7.9 7.2 7.1 7.5 7.5 7.2 7.9 8.8 8.7 8.8 10.1 8.4 8.9 8.7 9.1 8.6 7.6 8.7 8.9 8.8 8.4 8.5 8.7 TR#201175A, REV.1.2 23 23 50 60 7/20/01 7/26/01 Vibration M. Shock 0.0 0.0 0.0 0.2 0.1 0.1 -0.1 -0.1 0.0 0.0 0.0 0.1 0.1 -0.1 0.0 0.0 -0.1 0.0 0.0 0.0 0.0 0.0 0.0 -0.1 0.0 0.0 0.0 -0.1 -0.4 0.1 0.0 0.0 -1.0 0.1 0.1 0.0 -0.2 0.1 0.0 0.0 0.0 0.0 0.1 0.0 0.0 0.8 -0.1 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.0 0.1 0.0 0.1 0.1 0.2 0.0 -0.1 0.0 0.1 0.0 0.1 0.1 0.1 0.1 0.4 0.1 -0.1 0.2 0.1 0.0 -0.5 0.0 0.1 -0.1 0.0 0.1 0.7 0.2 0.0 0.0 0.1 0.1 0.2 62 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 54 28Jun01 Initial 23 23 50 60 7/20/01 7/26/01 Vibration M. Shock 7-C17 7-D19 7-E17 7-F15 7-G18 7-H20 8-H1 8-G9 8-F6 8-E4 8-D2 8-C4 8-B6 8-A1 8-A3 8-A5 8-C7 8-D9 8-H11 8-C13 8-B15 8-A16 8-A18 8-A20 8-B19 8-C17 8-D19 8-E17 8-F15 8-G18 8-H20 8.9 8.8 8.6 8.7 7.8 8.0 6.9 6.5 6.7 7.3 7.7 7.7 8.1 7.5 7.8 8.0 7.9 7.7 6.7 7.7 7.7 7.8 7.6 7.5 7.6 7.7 7.6 6.4 6.4 6.4 6.9 -0.1 -0.1 0.1 -0.2 -0.2 0.2 -0.2 0.0 -0.2 -0.8 -0.3 -0.1 -0.1 -0.2 -0.1 -0.1 -0.1 -0.1 0.1 0.0 -0.2 -0.2 -0.1 -0.1 -0.1 -0.2 0.0 0.3 -0.1 0.0 0.0 0.1 0.0 0.1 0.4 -0.2 0.4 -0.1 0.1 -0.1 -0.5 0.0 0.1 0.1 -0.1 0.0 -0.1 0.0 -0.4 0.1 -0.1 0.0 -0.1 0.0 -0.1 -0.1 -0.1 0.0 -0.1 -0.1 0.0 -0.1 MAX MIN AVG STD Open 10.1 6.4 8.0 0.7 0 1.3 -1.1 0.0 0.3 0 1.4 -0.8 0.0 0.3 0 Tech. Equip. G.P. G.P. G.P. 400,1047 400,1047 400,1047 TR#201175A, REV.1.2 63 of 117 Contech Research TEST RESULTS GROUP 5 TR#201175A, REV.1.2 64 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 2 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/10/01 COMPLETE DATE: 7/20/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 50% -----------------------------------------------------------EQUIPMENT ID#: 321, 465, 466 -----------------------------------------------------------BREAKDOWN VOLTAGE PURPOSE: To determine the voltage required to cause arcing or breakdown within the connector. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 20. 2. The test voltage was applied between adjacent electrically isolated circuit paths. 3. The voltage was increased slowly until failure occurred. 4. The test samples were mated. -----------------------------------------------------------REQUIREMENTS: The breakdown voltage shall be recorded. -----------------------------------------------------------RESULTS: See next page. TR#201175A, REV.1.2 65 of 117 Contech Research RESULTS: The following is a summary of the observed: BREAKDOWN VOLTAGE (VAC) Sample ID# 6 & 7 Avg. Max. Min. 1900 2000 1600 Maximum DWV Maximum Working Voltage TR#201175A, REV.1.2 1200 VAC 400 VAC 66 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 7 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/02/01 COMPLETE DATE: 7/20/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 46% -----------------------------------------------------------EQUIPMENT ID#: 321, 465, 466 -----------------------------------------------------------INSULATION RESISTANCE(IR) PURPOSE: To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 21. 2. Test Conditions: a) b) c) d) e) f) Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Electrification Time Test Voltage : : : : : : Yes Yes Mated Mounted 2 Minutes 500 VDC -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, the insulation resistance shall not be less than 5000 megohms. -----------------------------------------------------------RESULTS: The connectors as tested met the requirements as specified. TR#201175A, REV.1.2 67 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 5 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/02/01 COMPLETE DATE: 7/20/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 46% -----------------------------------------------------------EQUIPMENT ID#: 321, 465, 466 -----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL) PURPOSE: To determine if the connector can operate at its rated voltage and withstand momentary overpotentials due to switching, surges and other similar phenomenon. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 20. 2. Test Conditions: a) b) e) f) i) k) 3. Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Hold Time Test Voltage : : : : : : Yes Yes Mated Mounted 2 Minutes 1000 VAC The test voltage was applied between adjacent electrically isolated circuit paths. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, there shall be no evidence of breakdown, arcing, etc. -----------------------------------------------------------RESULTS: All test samples as tested met the requirements as specified. TR#201175A, REV.1.2 68 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 5 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/2/01 COMPLETE DATE: 7/6/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 52% -----------------------------------------------------------EQUIPMENT ID#: 192 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 32. 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles were performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See next page. TR#201175A, REV.1.2 69 of 117 Contech Research REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples. 2. The insulation resistance shall not be less than 5000 megohms. 3. When a 1000 VAC test voltage is applied, there shall be no evidence of arcing, breakdown, etc. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples. 2. The insulation resistance exceeded 5000 megohms. 3. There was no evidence of arcing, breakdown, etc., when 1000 VAC voltage was applied. TR#201175A, REV.1.2 70 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 7 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/10/01 COMPLETE DATE: 7/20/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 50% -----------------------------------------------------------EQUIPMENT ID#: 27 -----------------------------------------------------------MOISTURE RESISTANCE (HUMIDITY) PURPOSE: The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 31, Procedure III. 2. Test Conditions: a) b) c) d) e) f) g) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : 90% to 95% 25°C to 65°C No No Mated Mounted 240 hours 3. Dielectric withstanding voltage and insulation resistance measurements were performed between 2 and 4 hours after removal from the chamber. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See next page. TR#201175A, REV.1.2 71 of 117 Contech Research REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples. 2. The final insulation resistance shall not be less than 5000 megohms. 3. There shall be no evidence of arcing or breakdown when 1000 VAC test voltage is applied. 4. The breakdown voltage shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The final insulation resistance exceeded 5000 megohms after air dry of 2-4 hours. 3. There was no evidence of breakdown, arcing, etc., when a 1000 VAC test voltage was applied. 4. The following is a summary of the data observed: BREAKDOWN VOLTAGE (VAC) Sample ID# 6 & 7 Avg. Max. Min. 1400 1700 1100 Maximum DWV Maximum Working Voltage TR#201175A, REV.1.2 825 VAC 350 VAC 72 of 117 Contech Research TEST RESULTS GROUP 6 TR#201175A, REV.1.2 73 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/20/01 COMPLETE DATE: 7/20/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 46% -----------------------------------------------------------EQUIPMENT ID#: 400, 1047 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 23. 2. Test Conditions: a) Test Current : 10 ma max. b) Open Circuit Voltage : 20 mv c) No. of Positions Tested : 25 per test sample -----------------------------------------------------------REQUIREMENTS: The low level circuit resistance as measured shall not exceed 20 milliohms. -----------------------------------------------------------RESULTS: See next page. TR#201175A, REV.1.2 74 of 117 Contech Research RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# 1-5, 7-9 2. Avg. Max. Min. 7.4 9.2 3.4 See data file 201175B03 for individual data points. TR#201175A, REV.1.2 75 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/02/01 COMPLETE DATE: 7/06/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 52% -----------------------------------------------------------EQUIPMENT ID#: 192 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 32. 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles were performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. TR#201175A, REV.1.2 76 of 117 Contech Research REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples. 2. The change in low level circuit resistance shall not exceed +10 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples. 2. The following is a summary of the observed data: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# 1-5, 7-9 3. Avg. Change -0.2 Max. Change +0.9 See data file 201175B03 for individual data points. TR#201175A, REV.1.2 77 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/10/01 COMPLETE DATE: 7/20/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 50% -----------------------------------------------------------EQUIPMENT ID#: 27 -----------------------------------------------------------MOISTURE RESISTANCE (HUMIDITY) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as: a) Fretting corrosion due to wear resulting from micromotion, induced by thermal cycling. Humidity accelerates the oxidation process. b) Oxidation of wear debris or from particulates from the surrounding atmosphere which may have become entrapped between the contacting surfaces. c) Failure mechanisms resulting from a wet oxidation process. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 31, Procedure II. 2. Test Conditions: a) b) c) d) e) f) Relative Humidity Temperature Conditions Cold Cycle Mating Conditions Mounting Conditions Duration TR#201175A, REV.1.2 : : : : : : 90% to 95% 25°C to 65°C No Mated Mounted 240 hours 78 of 117 Contech Research PROCEDURE: Continued 3. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples. 2. The change in low level circuit resistance shall not exceed +10 milliohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The following is a summary of the observed data: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# 1-5, 7-9 3. Avg. Change -0.2 Max. Change +0.9 See data file 201175B03 for individual data points. TR#201175A, REV.1.2 79 of 117 Contech Research Low Level Contact Resistance Project: 201175A Customer: Samtec Product: YFS/YFT 50µ inch Au Description: # 1, # 2, # 3, # 4, # 5, # 7, # 8, #9 Open circuit voltage: 20mv Spec: Subgroup: File #: Tech. Current: NPS 25298-2 6 201175B03 G.P. 10ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 46 02Jul01 Initial 23 55 10Jul01 T-Shock 23 50 20Jul01 Humidity 6.8 6.8 6.3 6.8 7.5 7.5 7.8 7.5 7.6 7.8 7.8 7.1 6.9 7.6 6.9 7.9 7.0 7.5 7.1 7.6 7.7 6.7 6.3 6.6 6.8 7.0 6.9 6.4 7.3 7.5 7.7 7.7 7.3 7.6 -0.2 -0.5 -0.2 -0.5 -0.9 0.0 -0.2 -0.2 -0.2 -0.8 -0.2 -0.2 -0.3 -0.2 -0.2 -0.6 -0.7 -0.3 -0.5 -0.1 -1.3 -0.5 -0.3 -0.3 -0.1 -0.3 -0.6 -0.3 -0.8 -0.6 -0.2 -0.2 -0.1 -0.2 -0.1 -0.5 -0.2 -0.4 -0.2 -0.1 -0.4 -0.2 -0.4 -1.1 -0.3 -0.4 -0.1 -0.2 -0.4 -0.7 -0.7 -0.3 -0.4 -0.2 -0.2 -0.3 -0.2 -0.3 0.1 -0.3 -0.6 -0.3 -1.0 -0.8 -0.2 -0.5 -0.2 -0.3 1-H1 1-G9 1-F6 1-E4 1-D2 1-C4 1-B6 1-A1 1-A3 1-A5 1-C7 1-D9 1-H11 1-C13 1-B15 1-A16 1-A18 1-A20 1-B19 1-C17 1-D19 1-E17 1-F15 1-G18 1-H20 2-H1 2-G9 2-F6 2-E4 2-D2 2-C4 2-B6 2-A1 2-A3 TR#201175A, REV.1.2 80 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 46 02Jul01 Initial 23 55 10Jul01 T-Shock 23 50 20Jul01 Humidity 7.6 7.5 6.6 6.8 7.5 7.6 7.7 7.5 7.4 7.4 7.7 7.0 6.7 6.2 6.7 7.0 7.7 7.1 7.7 8.4 8.7 8.6 8.5 8.4 8.6 8.7 8.4 7.8 7.6 8.4 8.4 8.6 8.4 8.3 8.5 8.5 8.5 8.5 7.2 7.5 7.6 7.3 7.5 7.5 8.9 -0.1 -0.1 -0.3 -0.1 -0.2 -0.8 -0.7 -0.2 -0.1 -0.1 -0.2 -0.8 -0.6 -0.1 -0.3 0.1 -0.1 -0.2 -0.1 -0.6 -0.2 -0.2 -0.2 -0.2 -0.3 -0.2 -0.2 -0.5 0.5 -0.2 -0.3 -0.1 -0.2 -0.2 -0.2 -0.2 -0.5 -0.4 -0.2 0.3 0.7 0.2 -0.2 -0.5 -0.3 -1.1 -0.1 -0.1 0.1 -0.2 -1.1 -0.8 -0.2 -0.2 -0.2 -0.2 -0.9 -0.6 -0.2 -0.4 -0.1 -0.1 -0.2 -0.4 -0.2 -0.4 -0.2 -0.3 -0.3 -0.3 -0.3 -0.2 -0.6 0.2 -0.2 -0.3 -0.2 -0.2 -0.2 -0.2 -0.2 -1.0 -0.5 -0.2 0.4 0.9 0.1 -0.3 -0.6 -0.4 2-A5 2-C7 2-D9 2-H11 2-C13 2-B15 2-A16 2-A18 2-A20 2-B19 2-C17 2-D19 2-E17 2-F15 2-G18 2-H20 3-H1 3-G9 3-F6 3-E4 3-D2 3-C4 3-B6 3-A1 3-A3 3-A5 3-C7 3-D9 3-H11 3-C13 3-B15 3-A16 3-A18 3-A20 3-B19 3-C17 3-D19 3-E17 3-F15 3-G18 3-H20 4-H1 4-G9 4-F6 4-E4 TR#201175A, REV.1.2 81 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 46 02Jul01 Initial 23 55 10Jul01 T-Shock 23 50 20Jul01 Humidity 9.0 9.0 9.0 8.7 9.0 8.8 8.9 8.9 8.4 9.2 8.8 9.0 4.5 4.2 4.3 8.8 8.8 8.8 7.0 8.9 8.1 7.5 7.5 7.1 8.8 8.6 9.0 8.8 8.5 8.7 8.8 8.7 8.6 7.8 8.7 8.8 8.9 8.8 8.7 8.4 8.5 8.7 8.6 7.8 7.5 -0.4 -0.3 -0.4 -0.2 -0.3 -0.3 -0.3 -0.2 -0.1 -0.5 -0.3 -0.3 -0.1 -0.1 -0.1 -0.2 -0.2 -0.3 -0.1 -0.2 0.2 0.0 0.8 0.5 0.1 0.0 -0.1 -0.1 0.1 0.1 0.1 -0.1 0.0 0.9 -0.1 -0.2 0.0 0.1 0.1 0.1 -0.1 0.0 -0.8 0.1 0.8 -0.6 -0.4 -0.5 -0.3 -0.5 -0.4 -0.4 -0.2 0.3 -0.5 -0.3 -0.5 -0.2 -0.2 -0.2 -0.2 -0.3 -0.3 -0.1 -1.1 -0.1 0.3 0.8 0.2 -0.2 -0.3 -0.3 -0.3 -0.2 -0.2 -0.3 -0.3 -0.1 0.3 -0.2 -0.4 -0.3 -0.1 -0.1 0.0 -0.1 -0.2 -1.1 -0.2 0.3 4-D2 4-C4 4-B6 4-A1 4-A3 4-A5 4-C7 4-D9 4-H11 4-C13 4-B15 4-A16 4-A18 4-A20 4-B19 4-C17 4-D19 4-E17 4-F15 4-G18 4-H20 5-H1 5-G9 5-F6 5-E4 5-D2 5-C4 5-B6 5-A1 5-A3 5-A5 5-C7 5-D9 5-H11 5-C13 5-B15 5-A16 5-A18 5-A20 5-B19 5-C17 5-D19 5-E17 5-F15 5-G18 TR#201175A, REV.1.2 82 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 46 02Jul01 Initial 23 55 10Jul01 T-Shock 23 50 20Jul01 Humidity 4.3 7.5 6.9 7.0 8.3 8.3 8.3 8.4 8.2 8.5 8.5 8.4 8.2 7.4 8.3 8.2 8.5 8.4 4.2 4.4 8.3 8.3 7.3 7.0 7.3 7.8 6.9 6.8 6.3 7.6 7.5 7.7 7.8 7.7 7.7 7.7 7.7 6.8 7.2 6.8 7.3 7.5 6.6 7.3 7.5 0.0 0.1 0.0 0.0 -0.1 -0.1 -0.1 -0.2 -0.1 -0.2 -0.2 -0.2 -0.1 0.1 -0.1 -0.1 -0.2 -0.1 0.0 0.0 0.0 0.0 0.2 0.2 0.2 0.1 -0.2 -0.6 -0.2 -1.2 -1.1 -0.3 -0.4 -0.2 -0.2 -0.3 -0.3 -0.4 -0.1 -0.4 -0.6 -0.2 0.7 -0.1 -0.1 0.0 -0.1 -0.1 -0.1 -0.1 -0.2 -0.1 -0.1 -0.2 -0.2 -0.2 -0.1 -0.5 0.6 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 -0.1 -0.2 -0.2 -0.2 -0.3 0.0 0.0 0.0 0.0 -0.1 -0.1 0.0 0.0 0.0 0.0 0.0 -0.1 0.0 0.3 0.0 -0.1 -0.3 -1.0 -0.8 -0.1 5-H20 7-H1 7-G9 7-F6 7-E4 7-D2 7-C4 7-B6 7-A1 7-A3 7-A5 7-C7 7-D9 7-H11 7-C13 7-B15 7-A16 7-A18 7-A20 7-B19 7-C17 7-D19 7-E17 7-F15 7-G18 7-H20 8-H1 8-G9 8-F6 8-E4 8-D2 8-C4 8-B6 8-A1 8-A3 8-A5 8-C7 8-D9 8-H11 8-C13 8-B15 8-A16 8-A18 8-A20 8-B19 TR#201175A, REV.1.2 83 of 117 Contech Research Temp ºC R.H. % Date: Pos. ID 23 46 02Jul01 Initial 23 55 10Jul01 T-Shock 23 50 20Jul01 Humidity 8-C17 8-D19 8-E17 8-F15 8-G18 8-H20 9-H1 9-G9 9-F6 9-E4 9-D2 9-C4 9-B6 9-A1 9-A3 9-A5 9-C7 9-D9 9-H11 9-C13 9-B15 9-A16 9-A18 9-A20 9-B19 9-C17 9-D19 9-E17 9-F15 9-G18 9-H20 6.7 7.1 6.5 6.3 6.3 7.1 6.8 6.3 6.1 6.8 7.8 7.7 7.9 7.5 7.6 7.7 7.5 3.7 6.3 3.5 3.9 7.8 3.9 3.7 3.8 3.6 7.7 3.8 6.1 3.4 3.8 -0.3 0.1 -0.4 -0.3 -0.2 -0.2 -0.2 -0.2 -0.2 -0.6 -1.5 -0.6 -0.5 -0.3 -0.3 -0.3 -0.5 -0.4 -0.2 -0.3 -0.2 -0.3 -0.2 -0.1 -0.1 -0.1 -1.4 -0.5 -0.2 -0.1 -0.1 -0.1 -0.5 -0.1 -0.1 0.0 0.0 -0.1 0.0 -0.1 0.0 0.2 0.0 0.0 -0.1 -0.6 0.0 0.0 0.0 0.0 -0.1 -0.2 -0.4 -0.3 -0.1 -0.3 -0.2 0.1 -0.1 0.1 0.0 0.0 MAX MIN AVG STD Open 9.2 3.4 7.4 1.3 0 0.9 -1.5 -0.2 0.3 0 0.9 -1.1 -0.2 0.3 0 Tech: Equip ID G.P. G.P. G.P. 400,1047 400,1047 400,1048 TR#201175A, REV.1.2 84 of 117 Contech Research TEST RESULTS GROUP 7 TR#201175A, REV.1.2 85 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 6/29/01 COMPLETE DATE: 8/07/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54% -----------------------------------------------------------EQUIPMENT ID#: 400, 1047 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 23. 2. Test Conditions: a) Test Current : 10 ma max. b) Open Circuit Voltage : 20 mv c) No. of Positions Tested : 25 per test sample -----------------------------------------------------------REQUIREMENTS: The low level circuit resistance as measured shall not exceed 20 milliohms. -----------------------------------------------------------RESULTS: See next page. TR#201175A, REV.1.2 86 of 117 Contech Research RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# 2-4, 6-10 2. Avg. Max. Min. 8.1 9.0 4.3 See data file 201175B04 for individual data points. TR#201175A, REV.1.2 87 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/16/01 COMPLETE DATE: 8/07/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 61% -----------------------------------------------------------EQUIPMENT ID#: 1238 -----------------------------------------------------------THERMAL AGING PURPOSE: 1. To evaluate the impact on electrical stability of the contact system when exposed to a thermal environment. Said environment may generate temperature dependent failure mechanisms such as: a) Dry oxidation of base metals and/or underplates which have reached the contacting surfaces by impurity, diffusion or pore corrosion. b) Reduced normal (contact) force due to stress relaxation as a result of a thermal environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 17. 2. Test Condition: a) b) c) d) 3. Temperature Duration Mated Condition Mounting Condition : : : : 105°C 500 hours Mated Mounted At each designated measurement period, the test samples were removed from the chamber and allowed to cool to room ambient. TR#201175A, REV.1.2 88 of 117 Contech Research PROCEDURE: Continued 4. Upon completion of the measurements, the test samples were placed back into the test chamber. 5. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage or deterioration of the test samples. 2. The change in low level circuit resistance shall not exceed +10 milliohms. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Exposure Time(Hrs) 100 200 300 400 500 Avg. Change Max. Change 0.0 0.0 +0.1 +0.1 +0.2 +0.9 +0.9 +1.4 +1.4 +1.5 2. There was no evidence of physical damage or deterioration of the test samples. 3. See data file 201175B04 for individual data points. TR#201175A, REV.1.2 89 of 117 Contech Research Low Level Contact Resistance Project: 201175A Customer: Samtec Product: YFS/YFT 50µ inch Au Description: # 2, # 3, # 4, # 6, # 7, # 8, # 9, # 10 Open circuit voltage: 20mv Spec: Subgroup: File #: Tech. Current: NPS 25298-2 7 201175B04 G.P. 10ma Delta values units: milliohms Temp ºC R.H. % Date: Pos. ID 23 48 29Jun01 Initial 2-H1 2-G9 2-F6 2-E4 2-D2 2-C4 2-B6 2-A1 2-A3 2-A5 2-C7 2-D9 2-H11 2-C13 2-B15 2-A16 2-A18 2-A20 2-B19 2-C17 2-D19 2-E17 2-F15 2-G18 2-H20 3-H1 3-G9 3-F6 3-E4 3-D2 3-C4 3-B6 3-A1 3-A3 TR#201175A, REV.1.2 7.5 7.3 7.0 8.6 8.7 8.6 8.8 8.4 8.7 8.6 8.6 8.5 7.2 8.8 8.5 8.6 8.5 8.4 8.4 8.5 8.5 8.2 7.2 7.9 7.5 7.5 8.2 8.6 8.6 8.8 8.6 8.8 8.4 8.7 23 50 7/20/01 T-Aging 100 hrs. 0.1 -0.1 -0.1 -0.1 -0.1 -0.1 -0.2 -0.1 -0.2 0.0 -0.1 -0.1 0.0 -0.2 -0.1 0.0 -0.1 -0.1 0.0 -0.1 0.0 0.3 -0.2 -0.1 0.1 0.0 0.0 0.1 -0.1 0.0 -0.1 -0.1 -0.1 -0.1 23 51 7/24/01 T-Aging 200 hrs. 0.0 0.3 -0.2 -0.1 -0.1 -0.1 -0.2 -0.2 -0.2 -0.1 -0.1 -0.1 0.3 -0.3 -0.1 0.0 -0.1 -0.2 -0.1 -0.2 -0.1 0.2 -0.2 0.7 0.0 0.0 0.1 0.1 -0.1 0.0 -0.1 -0.1 -0.1 -0.2 90 of 117 22 60 7/30/01 T-Aging 300 hrs. 0.2 1.0 -0.2 -0.1 0.0 -0.1 -0.1 0.0 0.0 0.1 -0.1 -0.6 1.3 -0.2 -0.1 0.0 -0.1 -0.1 -0.1 -0.2 0.0 0.3 -0.1 0.7 0.2 0.1 0.3 0.4 0.1 0.5 0.3 0.3 0.2 0.3 23 50 8/3/01 T-Aging 400 hrs. 0.3 1.3 -0.1 -0.1 0.0 -0.1 0.0 0.0 -0.1 0.1 -0.1 -0.5 1.4 -0.2 0.0 0.1 0.0 -0.1 0.0 -0.1 0.0 0.2 -0.1 0.5 0.2 0.0 0.4 0.3 0.1 0.5 0.4 0.3 0.1 0.4 23 61 8/7/01 T-Aging 500 hrs. 0.3 1.3 -0.1 -0.1 0.0 -0.1 -0.1 -0.1 -0.1 0.0 -0.1 -0.7 1.4 -0.2 -0.1 0.1 -0.1 -0.2 -0.1 -0.1 0.0 0.2 0.1 0.8 0.3 0.0 0.4 1.0 0.2 0.5 0.3 0.7 0.0 0.5 Contech Research Temp ºC R.H. % Date: Pos. ID 23 48 29Jun01 Initial 3-A5 3-C7 3-D9 3-H11 3-C13 3-B15 3-A16 3-A18 3-A20 3-B19 3-C17 3-D19 3-E17 3-F15 3-G18 3-H20 4-H1 4-G9 4-F6 4-E4 4-D2 4-C4 4-B6 4-A1 4-A3 4-A5 4-C7 4-D9 4-H11 4-C13 4-B15 4-A16 4-A18 4-A20 4-B19 4-C17 4-D19 4-E17 4-F15 4-G18 4-H20 6-H1 6-G9 6-F6 6-E4 TR#201175A, REV.1.2 8.6 8.6 8.4 8.7 8.6 8.7 8.7 8.6 8.6 8.5 8.6 8.7 8.7 8.1 8.7 7.3 7.7 8.0 7.3 8.3 8.4 8.6 8.6 8.3 8.6 8.7 8.8 8.4 7.3 8.8 8.3 8.4 8.4 8.3 8.2 8.4 8.4 8.4 7.6 7.3 7.5 7.6 7.1 7.2 8.6 23 50 7/20/01 T-Aging 100 hrs. 0.1 -0.1 -0.1 0.0 -0.1 -0.1 0.0 0.0 -0.1 0.0 -0.1 0.0 -0.1 -0.1 -0.5 -0.1 0.2 0.0 0.0 0.0 0.0 -0.1 -0.1 0.0 -0.1 -0.1 -0.2 -0.1 0.1 -0.1 0.0 0.1 0.0 0.0 0.0 0.0 0.0 -0.1 0.1 0.2 0.0 0.1 0.3 0.0 0.0 23 51 7/24/01 T-Aging 200 hrs. 0.1 -0.1 -0.1 0.0 -0.1 -0.1 -0.1 -0.1 -0.2 0.0 -0.1 0.0 -0.1 0.3 -0.4 0.0 0.1 0.1 0.1 0.1 0.2 0.2 0.2 0.1 0.2 0.4 0.1 0.0 0.6 0.2 0.1 0.1 0.0 -0.1 0.0 0.0 0.0 -0.1 0.3 0.5 0.0 0.1 0.4 0.0 0.0 91 of 117 22 60 7/30/01 T-Aging 300 hrs. 0.6 0.0 0.0 0.0 0.1 0.4 0.4 0.1 -0.1 0.1 0.1 0.0 -0.1 0.2 -0.2 0.1 0.0 0.2 0.2 0.1 0.1 0.1 0.2 0.0 0.2 0.4 0.2 0.0 0.6 0.3 0.1 0.2 0.1 -0.1 0.0 0.0 0.0 -0.1 0.3 1.1 0.0 0.2 1.1 0.0 0.0 23 50 8/3/01 T-Aging 400 hrs. 0.3 0.1 0.1 0.1 0.1 0.8 0.1 0.0 -0.1 0.1 0.0 0.1 -0.1 0.1 -0.2 0.3 0.2 0.6 0.2 0.1 0.1 0.0 0.0 -0.1 -0.1 0.0 0.3 0.1 1.0 0.7 0.2 0.1 0.0 -0.1 0.0 0.1 0.1 0.0 0.5 1.3 0.1 0.3 0.9 0.0 0.0 23 61 8/7/01 T-Aging 500 hrs. 0.7 0.2 0.1 0.0 0.3 0.9 0.3 0.1 -0.1 0.1 0.1 0.0 -0.1 0.1 -0.4 0.2 0.1 0.6 0.3 0.2 0.1 0.4 0.5 0.3 0.7 0.8 0.7 0.2 1.0 0.9 0.2 0.2 0.2 0.0 0.1 0.1 0.1 0.0 0.5 1.2 0.1 0.2 1.2 0.2 0.0 Contech Research Temp ºC R.H. % Date: Pos. ID 23 48 29Jun01 Initial 6-D2 6-C4 6-B6 6-A1 6-A3 6-A5 6-C7 6-D9 6-H11 6-C13 6-B15 6-A16 6-A18 6-A20 6-B19 6-C17 6-D19 6-E17 6-F15 6-G18 6-H20 7-H1 7-G9 7-F6 7-E4 7-D2 7-C4 7-B6 7-A1 7-A3 7-A5 7-C7 7-D9 7-H11 7-C13 7-B15 7-A16 7-A18 7-A20 7-B19 7-C17 7-D19 7-E17 7-F15 7-G18 TR#201175A, REV.1.2 8.4 8.6 8.9 8.4 8.6 8.7 8.6 8.5 7.9 4.3 8.7 8.7 8.6 8.5 8.5 8.5 8.5 8.4 7.4 7.3 7.6 7.7 7.2 7.1 8.5 8.7 8.6 8.7 8.3 8.5 8.6 8.5 8.4 7.6 8.6 8.6 8.6 8.6 8.6 8.5 8.5 8.5 8.5 7.6 7.2 23 50 7/20/01 T-Aging 100 hrs. 0.0 -0.1 -0.1 -0.1 0.1 0.0 0.0 -0.1 0.9 0.0 0.0 0.0 -0.1 0.0 -0.1 -0.1 0.0 0.0 0.0 0.1 0.2 0.1 -0.1 -0.3 -0.1 -0.1 -0.1 -0.2 -0.1 -0.1 0.0 -0.1 -0.2 0.2 -0.2 -0.1 0.1 -0.2 -0.3 -0.2 -0.1 -0.1 -0.1 0.2 -0.1 23 51 7/24/01 T-Aging 200 hrs. 0.1 0.0 -0.1 -0.1 0.1 0.1 -0.1 -0.1 0.9 0.0 0.0 0.0 -0.1 0.0 -0.1 -0.1 0.0 0.0 0.0 0.2 0.3 0.2 -0.1 -0.3 -0.2 -0.1 -0.2 -0.1 -0.1 -0.1 0.1 -0.1 -0.2 0.2 -0.2 0.0 0.1 -0.1 -0.3 -0.2 -0.1 -0.1 -0.2 0.3 -0.1 92 of 117 22 60 7/30/01 T-Aging 300 hrs. 0.0 0.0 -0.1 0.0 0.1 0.2 0.0 -0.1 0.7 0.0 0.1 0.0 -0.1 -0.1 -0.1 -0.1 0.1 0.1 0.1 0.5 0.1 0.3 1.4 0.0 -0.1 0.0 -0.1 -0.1 0.1 0.0 0.0 -0.1 -0.2 1.2 -0.2 -0.1 0.2 -0.2 -0.2 -0.2 -0.1 -0.1 -0.4 0.3 0.1 23 50 8/3/01 T-Aging 400 hrs. 0.1 -0.1 -0.1 -0.2 0.0 0.1 0.0 0.0 0.8 0.0 0.0 0.0 -0.1 -0.1 -0.1 -0.1 0.1 0.0 0.1 0.3 0.3 0.0 1.4 -0.1 -0.1 0.0 -0.2 -0.2 0.0 -0.1 0.0 -0.1 -0.2 1.4 -0.1 -0.1 0.0 -0.2 -0.3 -0.2 -0.1 0.0 0.0 1.0 0.1 23 61 8/7/01 T-Aging 500 hrs. 0.1 0.1 0.3 0.0 0.5 0.6 0.2 0.0 0.7 0.1 0.4 0.3 0.1 0.0 0.0 0.1 0.1 0.0 0.1 0.4 0.7 0.1 0.8 -0.1 -0.1 -0.1 -0.2 -0.1 -0.1 -0.1 0.0 -0.1 -0.1 1.2 -0.1 0.0 0.2 -0.1 -0.2 -0.1 0.0 0.0 0.0 0.7 0.1 Contech Research Temp ºC R.H. % Date: Pos. ID 23 48 29Jun01 Initial 7-H20 8-H1 8-G9 8-F6 8-E4 8-D2 8-C4 8-B6 8-A1 8-A3 8-A5 8-C7 8-D9 8-H11 8-C13 8-B15 8-A16 8-A18 8-A20 8-B19 8-C17 8-D19 8-E17 8-F15 8-G18 8-H20 9-H1 9-G9 9-F6 9-E4 9-D2 9-C4 9-B6 9-A1 9-A3 9-A5 9-C7 9-D9 9-H11 9-C13 9-B15 9-A16 9-A18 9-A20 9-B19 TR#201175A, REV.1.2 7.3 6.8 6.5 6.2 6.7 7.6 7.7 7.7 7.5 7.7 7.8 7.5 6.6 6.4 7.6 7.7 7.7 7.6 7.4 7.6 7.5 7.6 7.6 6.2 6.4 6.7 7.3 7.4 7.2 8.7 8.6 8.7 8.6 8.6 8.7 8.5 8.6 8.5 7.5 8.5 8.6 8.9 8.7 8.5 8.6 23 50 7/20/01 T-Aging 100 hrs. -0.1 -0.1 -0.2 -0.1 0.7 0.0 -0.2 -0.1 -0.1 -0.1 -0.1 0.0 -0.2 -0.1 -0.1 -0.6 -0.6 -0.4 -0.2 -0.1 -0.1 -0.1 -0.1 0.0 -0.1 -0.1 0.0 0.4 0.1 0.0 0.0 -0.1 0.1 -0.1 0.0 0.2 -0.1 -0.2 0.3 -0.1 0.0 -0.1 -0.1 -0.1 -0.1 23 51 7/24/01 T-Aging 200 hrs. 0.0 -0.1 0.0 -0.1 0.8 0.0 0.2 0.0 0.1 0.0 0.0 0.1 -0.1 0.2 -0.3 0.0 -0.1 -0.1 -0.1 -0.1 -0.1 0.0 0.1 0.2 0.0 0.0 0.0 0.7 0.0 -0.1 0.0 -0.1 0.0 -0.2 -0.1 0.1 -0.1 -0.2 0.6 -0.1 -0.1 -0.1 -0.1 -0.2 -0.1 93 of 117 22 60 7/30/01 T-Aging 300 hrs. 0.4 -0.1 0.0 -0.1 0.8 0.0 0.1 0.0 -0.1 0.0 0.0 0.1 -0.1 0.1 -0.4 -0.2 -0.3 -0.7 -0.2 -0.1 -0.1 0.0 0.1 0.2 0.0 0.0 0.2 1.0 0.1 0.0 0.1 0.2 -0.2 0.3 0.3 0.5 0.2 0.1 0.7 0.2 0.4 0.6 0.2 0.0 0.2 23 50 8/3/01 T-Aging 400 hrs. 0.0 -0.1 0.1 -0.1 0.7 0.0 0.4 0.2 0.0 0.0 0.1 0.4 0.1 0.0 -0.4 -0.2 0.1 0.0 -0.1 0.0 0.1 0.1 0.1 0.2 0.0 0.0 0.0 0.7 0.2 0.1 0.1 0.3 0.4 0.1 0.2 0.3 0.4 0.1 0.6 0.2 0.2 0.6 0.1 0.0 0.0 23 61 8/7/01 T-Aging 500 hrs. 0.2 -0.1 0.1 -0.1 0.8 0.0 0.3 0.1 -0.1 0.0 0.0 0.3 0.0 0.2 -0.5 -0.2 -0.8 -0.1 -0.1 0.0 0.0 0.1 0.1 0.3 0.1 0.1 0.3 1.3 0.6 0.2 0.4 0.4 0.4 0.9 0.3 0.5 0.6 0.2 0.8 0.2 0.3 0.3 0.2 0.1 0.1 Contech Research Temp ºC R.H. % Date: Pos. ID 9-C17 9-D19 9-E17 9-F15 9-G18 9-H20 10-H1 10-G9 10-F6 10-E4 10-D2 10-C4 10-B6 10-A1 10-A3 10-A5 10-C7 10-D9 10-H11 10-C13 10-B15 10-A16 10-A18 10-A20 10-B19 10-C17 10-D19 10-E17 10-F15 10-G18 10-H20 8.4 8.6 8.7 8.0 7.3 7.6 7.7 7.3 7.5 8.7 8.6 8.7 8.5 8.3 8.7 8.8 8.6 8.3 7.9 8.8 8.6 8.7 4.5 8.5 8.6 8.6 8.8 9.0 8.5 7.6 7.8 23 50 7/20/01 T-Aging 100 hrs. -0.1 0.0 0.0 0.0 0.2 0.1 0.4 0.1 0.2 -0.1 0.0 -0.1 0.0 0.0 -0.1 0.0 0.0 0.0 0.0 0.0 0.0 0.2 0.0 -0.1 -0.1 -0.1 -0.1 -0.2 -0.1 0.3 0.1 MAX MIN AVG STD Open 9.0 4.3 8.1 0.7 0 0.9 -0.6 0.0 0.2 0 Tech: Equip ID 23 48 29Jun01 Initial 23 51 7/24/01 T-Aging 200 hrs. -0.1 0.0 -0.1 0.3 0.1 0.0 0.4 0.8 0.3 -0.1 0.0 -0.1 0.0 0.1 -0.1 0.0 0.0 -0.1 0.8 0.0 0.1 0.2 0.0 -0.1 -0.1 -0.1 -0.1 -0.2 -0.1 0.4 0.5 22 60 7/30/01 T-Aging 300 hrs. 0.3 0.0 0.0 0.2 0.5 0.2 0.2 0.7 0.3 0.0 0.0 0.0 -0.1 0.0 -0.1 -0.1 0.0 -0.1 0.4 -0.1 0.0 0.1 0.0 -0.1 0.0 0.1 0.0 -0.6 -0.1 0.2 0.8 23 50 8/3/01 T-Aging 400 hrs. 0.1 0.0 0.0 0.0 0.3 0.2 0.3 0.9 0.3 0.0 0.2 0.2 0.3 0.1 0.1 0.2 0.3 -0.1 0.6 0.1 0.2 0.3 0.1 -0.1 0.1 0.0 0.0 -0.1 -0.1 0.3 1.1 23 61 8/7/01 T-Aging 500 hrs. 0.2 0.1 0.0 0.1 0.8 0.6 0.6 1.3 0.5 0.0 0.2 0.2 0.2 0.2 0.1 0.1 0.2 0.1 1.2 0.0 0.0 0.2 0.0 -0.1 0.0 0.0 0.0 0.0 0.1 0.8 1.5 0.9 -0.4 0.0 0.2 0 1.4 -0.7 0.1 0.3 0 1.4 -0.5 0.1 0.3 0 1.5 -0.8 0.2 0.4 0 G.P. G.P. G.P. G.P. G.P. G.P. 400,1047 400,1047 400,1047 400,1047 400,1047 400,1047 TR#201175A, REV.1.2 94 of 117 Contech Research TEST RESULTS GROUP 8 TR#201175A, REV.1.2 95 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors YFS-20-03-E-08-SB -----------------------------------------------------------SAMPLE SIZE: 6 Pairs TECHNICIAN: GP -----------------------------------------------------------START DATE: 7/16/01 COMPLETE DATE: 8/07/01 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 61% -----------------------------------------------------------EQUIPMENT ID#: 1238 -----------------------------------------------------------THERMAL AGING PURPOSE: To evaluate the impact on the stability of the contact system when exposed to a thermal environment. Said environment may generate temperature dependent failure mechanisms such as: a) Reduced normal (contact) force due to stress relaxation as a result of a thermal environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Nortel Networks, NPS Detail Specification, NPS25298-2 and EIA-364, Test Procedure 17. 2. Test Condition: a) b) c) d) Temperature : Duration : Mated Condition : Mounting Condition : 105°C ± 500°C 500 hours Mated Mounted 3. At each designated measurement period, the test samples were removed from the chamber and allowed to cool to room ambient after 100 hours of exposure. 4. Upon completion of the measurements, the test samples were placed back into the test chamber. 5. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See next page. TR#201175A, REV.1.2 96 of 117 Contech Research REQUIREMENTS: 1. There shall be no evidence of physical damage or deterioration of the test samples so exposed. 2. The normal force shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. There was no evidence of visual or physical damage to the test samples. 2. Figures #20 thru 25 illustrate the normal force characteristics at each 100 hour interval. 3. No significant loss of normal force is evident. TR#201175A, REV.1.2 97 of 117 Contech Research FIGURE #20 TR#201175A, REV.1.2 98 of 117 Contech Research FIGURE #21 TR#201175A, REV.1.2 99 of 117 Contech Research FIGURE #22 TR#201175A, REV.1.2 100 of 117 Contech Research FIGURE #23 TR#201175A, REV.1.2 101 of 117 Contech Research FIGURE #24 TR#201175A, REV.1.2 102 of 117 Contech Research FIGURE #25 TR#201175A, REV.1.2 103 of 117 Contech Research TEST RESULTS SEQUENCE 9 TR#201175A, REV.1.2 104 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors YFS-20-03-H-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: AC/AB -----------------------------------------------------------START DATE: 5/22/01 COMPLETE DATE: 8/10/01 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 40% -----------------------------------------------------------EQUIPMENT ID#: 529, 691, 1116, 1278 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23. 2. Test Conditions: a) Test Current b) Open Circuit Voltage c) No. of Pos. Tested : 10 ma maximum : 20 mV : 200 total -----------------------------------------------------------REQUIREMENTS: See next page. TR#201175A, REV.1.2 105 of 117 Contech Research REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Avg. 8.3 2. Max. 10.4 Min. 4.2 See data file 201175A01 for individual data points. TR#201175A, REV.1.2 106 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors YFS-20-03-H-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: AC/AB -----------------------------------------------------------START DATE: 5/25/01 COMPLETE DATE: 6/06/01 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 44% -----------------------------------------------------------EQUIPMENT ID#: 19 -----------------------------------------------------------THERMAL AGE PURPOSE: 1. To evaluate the impact on electrical stability of the contact system when exposed to a thermal environment. Said environment may generate temperature dependent failure mechanisms such as: a) Dry oxidation of base metals and/or underplates which have reached the contacting surfaces by impurity, diffusion or pore corrosion. -----------------------------------------------------------PROCEDURE: 1. The test samples were placed in the test chamber after it had reached equilibrium at the specified temperature level. The test exposure was performed in accordance with EIA 364, Test Procedure 17. 2. Test Condition: a) b) c) d) Temperature : Duration : Mated Condition : Mounting Condition : 105°C ± 3°C 300 hours Mated Mounted 3. After recovery to room ambient conditions, the applicable variables were measured and recorded. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. TR#201175A, REV.1.2 107 of 117 Contech Research REQUIREMENTS: 1. There shall be no evidence of physical damage or deterioration of the test samples so exposed. 2. The change in low level circuit resistance shall not exceed 10 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of visual or physical damage to the test samples. 2. The following is a summary of the data observed: LOW LEVEL CIRCUIT/CONTACT RESISTANCE (Milliohms) 3. Avg. Change Max. Change No. of Opens +0.1 +3.6 0 See data file 201175A01 for individual data points. TR#201175A, REV.1.2 108 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors YFS-20-03-H-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: AC/AB -----------------------------------------------------------START DATE: 6/7/01 COMPLETE DATE: 6/7/01 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 45% -----------------------------------------------------------EQUIPMENT ID#: 52, 113, 691, 1116 -----------------------------------------------------------DURABILITY PURPOSE: This is a preconditioning sequence which is used to induce the type of wear on the contacting surfaces which may occur under normal service conditions. The connectors are mated and unmated a predetermined number of cycles. Upon completion, the units being evaluated are exposed to the environments as specified to assess any impact on electrical stability resulting from wear or other wear dependent phenomenon. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 09 and Paragraph 5.2.5 of GR-1217-CORE. 2. Test Conditions: a) No. of Cycles b) Rate : : 23 1 inch/min, max. 3. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See next page. TR#201175A, REV.1.2 109 of 117 Contech Research REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples. 2. The change in low level circuit resistance shall not exceed +10 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples. 2. The following is a summary of the data observed: LOW LEVEL CIRCUIT/CONTACT RESISTANCE (Milliohms) 3. Avg. Change Max. Change No. of Opens +0.7 +9.4 0 See data file 201175A01 for individual data points. TR#201175A, REV.1.2 110 of 117 Contech Research PROJECT NO.: 201175A SPECIFICATION: NPS25298-2 -----------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors YFS-20-03-H-08-SB -----------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: BC/AC/AB -----------------------------------------------------------START DATE: 6/16/01 COMPLETE DATE: 8/10/01 -----------------------------------------------------------ROOM AMBIENT: 21°C RELATIVE HUMIDITY: 40% -----------------------------------------------------------EQUIPMENT ID#: 521, 529, 543, 544, 691, 699, 1115, 1116, 1278, 1297, 1298 -----------------------------------------------------------MIXED FLOWING GAS PURPOSE: To determine the impact on electrical stability of contact interfaces when the test samples are exposed to a mixed flowing gas environment. Said environment is based on field data simulating typical, severe, non-benign environments. Said exposure is indicative of expected behavior in the field. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 65. 2. Environmental Conditions: a) b) c) d) e) f) g) h) i) Temperature : Relative Humidity : C12 : NO2 : : H2S : SO2 Exposure Time : Mounting Conditions : Mating Conditions : 30°C ± 1°C 70% ± 2% 10 ± 3 ppb 200 ± 50 ppb 10 ± 5 ppb 200 ± 20 ppb 40 days Mounted Mated 3. The test chamber was allowed to stabilize at the specified conditions indicated. 4. After stabilization, the test samples and control coupons were placed in the chamber such that they were no closer than 2.0" from each other and/or the chamber walls. TR#201175A, REV.1.2 111 of 117 Contech Research PROCEDURE: Continued 5. The test samples were handled in a manner so as not to disturb the contact interface. 6. After placement of the test samples in the chamber, it was allowed to re-stabilize and adjusted as required to maintain the specified concentrations and conditions. 7. The test chamber was monitored periodically during the exposure period to assure the environmental conditions as specified were maintained. 8. The samples were removed from the chamber periodically to perform low level circuit resistance, durability and disturbance. 9. Disturbance is defined as a small motion such that the contact surfaces move 0.004 to 0.015 inch respect to one another. 10. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 11. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of damage or corrosion to the test samples as exposed which will cause mechanical or electrical malfunction of the said samples. 2. The change in low level circuit resistance shall not exceed +10 milliohms. -----------------------------------------------------------RESULTS: See next page. TR#201175A, REV.1.2 112 of 117 Contech Research RESULTS: 1. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) After After After After After After After After After After 5th Day 10th Day 15th Day 1 Mating Cycle 20th Day Disturbance 1 Mating Cycle Durability 30th Day 40th Day Avg. Max. +0.6 +0.4 +0.6 +1.4 +0.5 +0.4 +0.6 +0.4 +0.4 +0.4 +7.7 +4.2 +7.5 +13.7 +7.4 +5.0 +6.6 +6.3 +6.0 +7.6 2. See data file 201175A01 for individual data points. 3. Five copper coupons were placed in the chamber. Upon removal said coupons were evaluated via weight gain technique with the following results: WEIGHT GAIN µgm/cm2/Day) Coupon No. Day 5 Day 10 Day 15 Day 20 Day 30 Day 40 13+ 12+ 12 14 15 14+ 15 13 13+ 14 14+ 13 13+ 15 15+ 12+ 14+ 13 15 14 12+ 13+ 13 14 12 14 14+ 15 13+ 14 1 2 3 4 5 Requirement: 12 - 16 4. There was no evidence of damage or corrosion to the test samples that would cause mechanical or electrical malfunction of the samples. 5. The test sponsor was notified relative to the observed measurements. Upon instructions from the test sponsor, the test sequence was continued. TR#201175A, REV.1.2 113 of 117 Contech Research Low Level Contact Resistance Project : 201175A Customer : Samtec Product : YFS/YFT series Description: Mated (ID # G1-1 thru G1-8) Open circuit voltage : 20mv Spec: NPS 25298-2 Subgroup: Group 9 30 µin Au File #: 201175A01 Current : 10ma Delta values units : milliohms Temp ºC R.H. % Date : Pos. ID 1-1 1-2 1-3 1-4 1-5 1-6 1-7 1-8 1-9 1-10 1-11 1-12 1-13 1-14 1-15 1-16 1-17 1-18 1-19 1-20 1-21 1-22 1-23 1-24 1-25 2-1 2-2 2-3 2-4 2-5 2-6 2-7 2-8 2-9 2-10 2-11 2-12 2-13 2-14 2-15 2-16 2-17 2-18 2-19 2-20 2-21 22 40 22 46 22 44 24 57 21 51 22 54 22 54 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X 8.3 8.9 8.3 8.8 8.7 9.0 9.3 9.6 9.0 9.1 9.3 8.4 8.2 8.4 8.1 8.4 8.5 8.7 8.6 8.6 8.8 8.6 8.1 7.6 9.8 7.2 7.4 7.8 8.3 7.9 8.6 8.4 7.2 8.5 8.5 8.4 7.8 7.3 8.1 7.9 8.0 7.6 8.0 8.1 8.0 8.2 0.3 0.0 0.1 -0.1 -0.1 -0.1 -0.2 -0.9 -0.2 0.1 -0.4 -0.1 1.0 -0.1 0.1 0.0 -0.2 -0.1 -0.1 -0.1 0.0 0.0 0.4 -0.1 -0.1 1.3 2.2 1.2 0.2 0.1 0.1 0.2 1.5 0.2 0.3 0.4 0.6 0.5 0.8 0.5 0.6 0.3 0.3 0.1 0.6 0.1 -0.4 0.8 0.4 0.7 0.6 0.8 0.5 -0.6 0.3 1.3 0.8 0.8 2.3 0.7 0.6 0.4 -0.1 0.1 0.3 1.0 0.2 1.0 0.9 0.4 -0.1 1.4 5.6 2.9 1.1 0.2 0.1 0.3 1.2 0.3 0.3 2.5 1.8 0.6 1.5 0.7 1.1 0.3 0.4 0.2 0.8 0.3 TR#201175A, REV.1.2 -0.5 0.3 1.1 0.8 0.3 0.2 0.3 0.5 1.3 0.4 0.4 1.0 0.6 1.3 2.8 1.5 0.1 0.0 0.9 4.0 0.1 1.7 1.4 1.8 0.0 -0.2 1.7 0.5 0.2 0.1 0.0 0.1 -0.6 0.0 0.0 1.5 0.2 0.5 0.0 0.2 0.3 0.1 0.1 0.2 0.1 0.3 -0.3 0.6 0.0 0.7 0.4 0.2 0.1 -0.9 0.2 0.4 0.0 0.9 1.9 1.0 1.6 1.2 -0.2 -0.3 0.4 3.5 0.0 1.4 1.6 1.6 -0.2 -0.1 2.2 1.5 0.7 0.3 -0.2 0.1 0.9 -0.3 0.2 2.1 0.9 -0.1 0.5 0.7 0.7 -0.2 0.1 0.1 0.6 0.6 -0.3 1.5 1.0 0.4 0.0 0.2 0.3 -0.1 0.4 0.4 0.0 0.8 4.6 0.5 0.8 0.5 0.0 -0.4 0.4 0.6 0.5 1.6 2.7 1.6 -0.5 1.4 4.3 1.6 0.7 0.3 -0.1 0.0 0.8 -0.2 0.2 2.0 0.6 1.1 0.4 0.7 1.0 0.2 0.0 0.2 0.4 0.5 -0.3 1.2 2.6 1.5 0.5 0.1 0.0 -0.4 1.6 1.2 0.1 1.4 1.9 2.3 2.7 0.9 -0.3 -0.2 0.8 4.9 0.2 4.0 4.3 2.0 -0.1 0.0 3.0 4.1 0.8 0.6 0.0 0.1 1.1 -0.1 0.1 2.7 3.3 0.4 2.5 2.3 3.5 0.6 0.3 0.3 0.7 0.7 114 of 117 23 48 23 50 23 50 22 52 16Jul01 17Jul01 18Jul01 19Jul01 MFG20d DISTURB Cyclic1X Dura 2 -0.2 0.5 -0.1 0.5 0.2 0.1 0.0 -0.6 1.2 1.2 -0.5 1.0 2.3 0.6 0.7 0.4 -0.3 -0.1 0.1 0.6 0.0 0.7 1.1 1.6 -0.1 1.2 2.4 1.7 0.2 0.2 -0.2 0.2 0.5 0.0 0.1 1.9 0.4 0.2 0.0 0.4 1.0 0.2 0.1 0.1 0.1 0.1 1.1 0.1 0.6 0.2 0.4 0.2 0.0 -0.2 0.5 0.6 0.0 1.5 1.2 0.5 0.5 0.1 -0.1 -0.2 0.0 0.4 0.2 0.4 0.9 1.5 0.1 1.4 2.2 1.5 0.0 0.3 0.1 0.1 0.8 0.4 0.0 1.9 0.2 0.4 0.1 0.4 0.7 0.8 0.2 0.2 0.3 0.3 -0.2 0.5 1.4 0.7 0.2 0.0 -0.1 -0.5 0.6 0.2 0.0 1.0 1.7 0.7 1.6 0.6 -0.3 -0.1 0.4 2.0 0.1 1.7 2.5 1.7 -0.2 0.8 2.1 2.9 0.3 0.3 0.0 0.1 0.5 0.0 0.1 2.5 1.3 0.5 2.0 1.2 1.2 0.4 0.4 0.3 0.6 0.4 0.3 0.7 0.9 0.4 0.3 0.3 0.2 -0.8 0.2 0.7 0.2 0.9 3.4 0.8 1.0 0.5 -0.3 0.0 0.5 2.5 0.4 1.0 1.7 2.1 -0.2 0.3 2.2 0.6 0.1 0.0 -0.8 -0.3 0.5 -0.1 0.0 1.9 0.3 0.1 0.1 -0.3 0.9 0.2 0.1 0.1 0.0 0.1 22 60 23 68 30Jul01 10Aug01 MFG30d MFG40d 1.0 0.5 -0.1 0.3 0.3 0.4 0.4 -0.5 0.2 0.7 0.1 0.8 2.5 0.8 0.9 0.7 -0.2 -0.1 0.5 2.5 0.3 0.9 1.3 1.9 -0.1 1.2 1.6 1.1 0.1 0.0 -0.1 0.0 0.5 0.0 0.1 2.1 0.3 0.1 0.5 0.5 1.1 0.3 0.2 0.0 0.3 0.1 0.1 0.6 0.2 0.2 0.3 0.0 -0.2 -0.7 -0.1 0.8 -0.1 0.9 2.5 1.6 2.2 0.3 -0.1 -0.2 0.4 2.0 0.3 2.0 2.8 2.1 -0.3 1.3 1.8 1.0 -1.0 -0.1 -0.1 -0.1 0.4 -0.1 0.0 2.1 0.4 0.4 0.6 0.4 0.9 0.3 0.2 0.0 0.1 0.2 Contech Research Temp ºC R.H. % Date : Pos. ID 2-22 2-23 2-24 2-25 3-1 3-2 3-3 3-4 3-5 3-6 3-7 3-8 3-9 3-10 3-11 3-12 3-13 3-14 3-15 3-16 3-17 3-18 3-19 3-20 3-21 3-22 3-23 3-24 3-25 4-1 4-2 4-3 4-4 4-5 4-6 4-7 4-8 4-9 4-10 4-11 4-12 4-13 4-14 4-15 4-16 4-17 4-18 4-19 4-20 4-21 4-22 4-23 4-24 4-25 5-1 5-2 5-3 22 40 22 46 22 44 24 57 21 51 22 54 22 54 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X 8.1 4.6 4.9 8.6 6.6 8.4 8.4 8.9 8.6 9.0 9.1 8.3 8.7 8.7 9.2 8.6 8.8 8.6 8.8 8.5 8.7 8.6 8.7 8.8 8.9 8.6 8.3 7.9 9.0 7.4 7.6 8.3 8.3 8.7 8.4 9.1 10.4 10.2 9.8 8.8 8.6 7.3 8.2 8.1 10.4 8.3 7.8 8.3 9.1 8.3 8.8 8.5 7.1 9.1 7.5 7.7 7.9 0.2 2.5 2.0 0.7 2.1 0.2 0.0 -0.1 0.2 0.0 -0.3 -0.3 0.1 0.0 -0.2 -0.1 0.7 0.0 0.0 0.0 -0.3 0.0 -0.1 0.0 0.1 0.1 -0.2 0.9 0.3 0.2 0.7 0.0 -0.1 -0.4 -0.1 -0.3 -1.8 -1.1 -1.0 -0.2 -0.3 1.2 -0.2 -0.2 -1.5 -0.4 0.1 0.0 -0.5 0.1 -0.2 -0.5 0.5 0.0 0.3 0.5 0.0 0.5 3.8 2.5 0.3 2.6 -0.6 0.8 0.4 0.2 0.1 0.1 0.0 0.1 1.0 0.5 2.5 0.4 1.1 0.6 0.3 -0.3 0.2 0.3 0.8 0.5 0.5 0.0 1.1 0.4 0.2 1.1 1.0 0.9 -0.5 0.1 0.1 -2.1 -1.4 -0.6 0.9 1.0 0.5 0.6 0.7 -2.4 -0.3 1.4 0.0 0.2 0.3 8.7 0.8 -0.1 0.1 0.1 3.3 1.1 TR#201175A, REV.1.2 0.5 5.9 1.0 -0.4 -0.2 -0.8 0.7 0.6 0.3 0.6 0.9 0.2 0.8 1.4 1.6 4.2 -1.0 3.9 1.9 0.9 -0.5 0.1 0.4 2.2 1.1 0.5 0.0 0.0 -0.5 0.1 -0.3 0.2 0.8 -0.2 0.2 -0.3 -0.3 -0.3 0.1 0.9 1.1 -0.4 0.9 0.9 -1.0 0.0 0.3 0.0 0.5 0.1 7.6 1.8 -0.6 0.0 0.0 1.8 0.3 0.5 3.3 2.7 0.8 1.8 -0.2 1.4 -0.2 -0.3 -0.2 -0.2 -0.4 -0.2 1.2 0.6 2.8 0.0 2.0 0.2 -0.2 -0.8 -0.3 -0.2 0.1 0.2 0.6 0.2 0.8 0.1 0.3 0.5 0.0 0.9 -0.6 0.0 1.1 -1.9 -1.3 -0.3 1.1 0.9 0.8 0.1 0.1 -2.4 0.0 0.6 0.2 -0.4 0.2 4.0 1.0 0.1 -0.1 -0.2 0.5 -0.4 0.6 3.7 3.8 0.8 2.3 0.0 1.2 0.4 0.1 -0.2 -0.1 0.3 -0.3 1.4 0.6 2.5 2.3 1.7 1.2 -0.2 -0.5 -0.3 0.1 0.1 0.2 0.4 0.3 0.6 -0.2 0.7 0.4 -0.1 1.4 -0.4 0.6 -0.4 -2.0 -1.2 -0.8 0.7 1.1 1.0 0.8 0.4 -2.3 -0.4 0.2 -0.1 0.2 0.5 7.5 3.8 0.7 0.1 0.3 0.8 -0.6 0.9 7.6 2.9 0.8 2.3 1.3 2.6 1.7 0.3 0.2 0.1 -0.3 -0.3 1.3 1.2 12.8 0.3 4.9 1.9 0.3 -1.2 0.3 0.1 1.6 0.7 1.1 0.7 1.1 0.1 0.1 1.9 1.5 2.1 -0.3 0.3 1.2 -1.7 -1.6 -0.6 3.4 3.3 0.8 3.2 1.9 -2.0 0.1 0.9 0.3 3.0 0.7 11.9 3.6 0.7 0.4 0.2 3.2 1.3 115 of 117 23 48 23 50 23 50 22 52 16Jul01 17Jul01 18Jul01 19Jul01 MFG20d DISTURB Cyclic1X Dura 2 0.2 4.4 2.7 0.1 2.1 -0.9 0.4 -0.1 0.2 0.0 -0.2 -0.2 0.0 1.3 0.0 3.9 -0.1 0.4 0.0 -0.2 -0.6 -0.2 0.0 -0.1 0.2 0.4 -0.3 0.9 -0.4 0.4 -0.3 -0.6 0.7 -0.3 0.0 0.1 -2.5 -1.4 -0.8 1.4 1.0 0.6 0.1 0.1 -2.5 -0.5 0.4 -0.4 -0.6 -0.1 1.7 -0.3 -0.1 -0.1 0.4 0.9 -0.7 0.5 5.0 3.0 0.8 2.4 -0.9 0.4 0.1 0.2 0.0 -0.3 -0.2 0.5 1.1 0.5 1.2 0.6 1.1 0.3 -0.2 -0.5 -0.3 -0.2 0.1 0.2 0.7 -0.6 0.9 0.3 1.0 -0.1 0.2 0.0 -0.9 0.1 -0.5 -2.7 -1.5 -0.8 1.3 1.0 0.7 0.1 -0.2 -2.5 -0.6 0.3 0.1 -0.1 0.5 4.6 0.2 0.7 0.4 2.4 1.2 -0.5 0.4 6.6 3.0 0.8 2.1 -0.7 1.1 0.3 0.1 -0.1 -0.2 -0.4 -0.1 1.2 0.3 3.9 -0.6 0.9 0.6 -0.2 -0.8 -0.1 -0.1 0.2 0.5 0.7 0.0 0.8 0.3 0.4 1.3 0.4 1.1 -0.6 0.1 -0.2 -2.1 -1.6 -1.1 1.4 2.3 0.8 0.7 0.2 -2.6 -0.3 0.8 -0.1 0.4 0.7 6.6 3.7 0.5 0.0 1.6 1.5 -0.3 0.2 5.0 3.5 0.7 1.7 -1.2 0.2 0.2 -0.2 -0.1 -0.4 -0.5 -0.2 0.9 -0.2 0.4 -0.9 0.2 0.0 -0.3 -1.2 -0.2 -0.2 -0.2 -0.1 0.3 -0.8 0.8 0.3 0.6 0.5 -0.4 0.9 -0.7 0.1 0.2 -1.6 -1.5 -1.5 0.4 1.9 1.5 1.1 0.3 -2.5 0.1 0.4 0.0 0.6 0.4 5.0 1.1 0.3 0.0 0.3 1.9 -0.3 22 60 23 68 30Jul01 10Aug01 MFG30d MFG40d 0.2 4.6 3.9 0.4 2.1 -1.1 0.2 0.0 0.2 0.0 -0.1 -0.4 -0.1 1.4 0.1 0.5 -0.4 0.2 0.0 -0.2 -0.7 -0.1 -0.1 -0.1 0.1 0.3 -0.6 0.9 0.1 1.5 0.6 -0.5 0.7 -0.5 0.1 0.1 -2.2 -1.5 -0.9 1.3 0.6 1.5 -0.2 0.0 -2.7 -0.2 0.8 0.0 -0.6 0.6 2.7 0.2 0.6 0.0 1.2 1.8 -0.7 0.2 3.9 3.8 0.7 2.0 -0.5 0.3 0.0 0.0 -0.1 -0.3 0.1 -0.1 1.3 -0.1 0.3 0.6 0.1 -0.1 -0.3 -1.3 0.4 -0.1 -0.2 0.0 0.3 0.4 0.9 -0.3 0.4 0.7 -0.2 0.6 -0.6 -0.1 -0.2 -2.3 -1.7 -1.1 0.3 0.6 1.5 0.4 0.2 -2.7 -0.3 0.2 -0.1 -0.2 0.4 2.6 -0.1 0.4 0.1 0.5 1.6 -0.8 Contech Research Temp ºC R.H. % Date : Pos. ID 5-4 5-5 5-6 5-7 5-8 5-9 5-10 5-11 5-12 5-13 5-14 5-15 5-16 5-17 5-18 5-19 5-20 5-21 5-22 5-23 5-24 5-25 6-1 6-2 6-3 6-4 6-5 6-6 6-7 6-8 6-9 6-10 6-11 6-12 6-13 6-14 6-15 6-16 6-17 6-18 6-19 6-20 6-21 6-22 6-23 6-24 6-25 7-1 7-2 7-3 7-4 7-5 7-6 7-7 7-8 7-9 7-10 22 40 22 46 22 44 24 57 21 51 22 54 22 54 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X 8.5 8.6 8.8 8.4 8.4 8.7 8.7 8.6 8.3 7.2 8.3 8.1 8.5 8.5 8.8 8.4 8.6 8.6 8.5 7.9 8.3 8.5 8.6 7.5 7.2 8.6 8.4 8.8 9.0 8.7 8.7 8.9 8.9 5.2 7.6 8.1 8.2 8.4 4.3 8.9 8.3 8.6 8.7 9.4 8.0 8.3 9.2 9.2 8.6 8.3 8.6 8.6 9.0 8.8 8.9 8.7 8.9 0.0 0.0 0.0 0.0 0.1 -0.2 0.0 0.0 -0.1 0.4 0.1 0.1 -0.1 -0.1 0.0 0.0 -0.2 0.0 -0.1 0.2 0.0 -0.2 -0.5 0.8 0.5 -0.1 0.0 0.1 -0.2 0.0 0.1 0.4 0.0 1.1 0.8 -0.1 0.0 0.1 0.1 -0.2 0.1 0.0 0.1 -0.1 0.3 0.3 0.0 -0.8 0.0 0.1 0.1 0.2 0.0 0.1 0.0 0.0 0.1 0.5 0.2 0.2 1.3 0.1 0.0 0.5 0.3 0.6 0.4 0.5 0.8 0.2 0.3 0.2 0.3 0.6 0.4 2.6 1.5 1.4 0.8 -0.6 0.5 0.5 0.4 0.3 0.5 0.4 0.2 0.4 0.2 0.3 3.2 1.2 0.5 0.6 0.2 0.3 -0.4 0.3 0.3 0.1 -0.1 0.8 -0.5 0.1 -0.5 0.1 1.8 0.7 0.5 0.4 1.3 -0.1 0.4 0.1 TR#201175A, REV.1.2 0.4 0.2 0.3 1.5 -0.1 0.2 0.4 0.4 0.6 0.1 0.4 0.5 0.1 0.3 0.1 0.2 0.7 0.2 2.3 1.2 1.2 0.4 0.0 -0.7 0.2 0.4 0.3 1.2 0.9 0.1 0.7 -0.2 1.1 2.1 -0.3 1.0 1.0 0.8 0.2 0.0 0.4 0.9 0.1 0.3 0.5 -0.6 0.2 0.5 -0.2 2.4 0.5 0.1 0.3 1.3 -0.2 0.2 0.0 0.2 0.1 -0.1 0.9 -0.2 -0.4 0.1 0.1 0.5 0.4 0.3 0.6 -0.5 0.1 0.0 0.3 0.0 0.2 1.7 1.2 0.5 0.7 -0.5 0.1 0.8 -0.3 0.3 0.6 0.2 0.0 0.1 -0.4 0.1 3.6 1.1 0.6 0.3 0.1 0.0 -0.2 0.3 0.4 0.3 0.1 0.7 -0.1 0.2 -0.4 -0.4 0.1 0.4 0.9 0.4 1.0 -0.6 0.2 0.1 0.7 0.1 0.4 0.7 -0.1 -0.2 0.1 0.1 0.6 0.3 0.4 0.5 0.0 0.1 -0.1 0.0 0.0 0.2 1.3 1.2 0.5 -0.2 -0.6 0.7 0.9 0.2 0.3 1.0 0.0 0.0 0.1 -0.1 0.2 3.2 0.8 0.3 0.5 0.3 0.4 0.1 0.4 0.5 0.3 0.2 1.1 -0.1 0.2 0.5 -0.1 1.8 0.4 0.5 1.0 1.5 -0.3 0.8 0.0 1.1 0.5 0.6 2.5 -0.1 -0.2 0.2 0.7 1.5 0.9 1.5 0.8 0.1 0.2 0.0 0.2 0.6 0.4 3.9 3.0 5.4 0.8 -0.5 2.3 2.4 1.7 0.6 0.5 0.3 0.2 0.0 -0.1 1.1 2.6 1.1 0.9 1.3 0.4 0.5 0.0 0.4 3.1 0.5 5.2 1.8 -0.1 0.2 -0.4 0.8 7.2 1.2 0.8 0.6 1.8 -0.1 0.2 0.0 116 of 117 23 48 23 50 23 50 22 52 16Jul01 17Jul01 18Jul01 19Jul01 MFG20d DISTURB Cyclic1X Dura 2 0.5 0.4 0.0 1.0 -0.2 -0.2 -0.1 -0.1 0.3 0.7 0.4 0.4 -0.2 -0.2 0.0 0.0 0.1 0.1 1.6 0.7 1.5 -0.1 -0.5 0.3 0.4 0.4 0.5 0.5 -0.1 -0.2 -0.1 -0.4 0.1 2.5 0.0 0.6 0.2 -0.1 -0.2 -0.4 0.3 0.8 0.0 0.5 0.6 -0.7 0.1 0.4 -0.3 2.8 0.8 0.6 0.2 0.5 -0.2 0.2 0.1 0.3 0.2 0.1 0.7 -0.8 -0.3 -0.1 0.1 0.4 0.8 0.7 0.5 -0.2 -0.1 0.1 0.3 0.1 0.3 1.7 0.5 1.8 0.1 -0.4 -0.1 1.4 0.1 0.6 0.8 0.3 -0.2 0.1 -0.3 0.3 3.4 0.1 0.5 0.7 0.7 0.2 -0.6 0.3 0.1 0.0 -0.2 0.1 -0.6 0.2 0.2 -0.6 -0.1 -0.1 0.2 0.7 0.3 0.1 0.6 0.7 0.4 0.1 0.0 1.4 -0.1 -0.2 0.0 0.1 0.5 0.3 0.5 0.5 -0.1 -0.1 0.2 0.0 0.3 0.3 5.4 2.0 3.4 0.8 -0.6 0.9 1.1 1.0 0.2 0.1 0.3 -0.2 0.0 -0.2 0.1 2.8 0.6 0.7 0.3 0.0 0.2 -0.5 0.2 0.9 0.1 0.8 0.4 -0.6 0.1 0.2 -0.8 0.5 0.3 0.3 0.1 0.6 -0.3 0.2 0.1 0.2 -0.3 0.1 1.2 -0.1 -0.2 0.0 0.2 0.1 0.2 0.2 -0.3 -0.2 0.0 0.1 -0.1 0.1 0.1 3.3 0.8 2.1 0.7 -0.6 -0.3 0.7 0.1 0.1 0.1 0.0 -0.2 0.0 -0.2 -0.3 2.1 0.1 0.3 0.3 -0.1 0.1 -0.5 0.2 0.8 0.0 -0.4 0.1 -0.7 0.1 0.3 -1.0 1.0 0.3 0.2 0.2 0.5 -0.3 0.1 0.0 22 60 23 68 30Jul01 10Aug01 MFG30d MFG40d 0.2 0.1 0.1 1.1 -0.2 -0.1 0.0 0.3 0.2 0.4 0.3 0.1 -0.2 0.0 0.0 -0.1 0.0 0.0 2.4 0.7 1.3 0.7 -0.6 -0.1 0.7 0.2 -0.1 0.0 0.1 -0.3 0.0 -0.2 -0.1 1.4 0.4 0.2 0.4 0.0 0.1 -0.3 0.3 0.5 0.0 -0.5 0.6 -0.7 0.2 0.3 -1.0 0.3 0.3 0.4 0.3 0.5 -0.3 0.2 0.1 0.2 0.1 0.1 0.6 -0.1 -0.2 -0.1 0.2 0.1 0.4 0.3 0.1 -0.2 -0.1 0.2 0.1 0.0 0.2 2.0 0.6 1.2 0.7 -0.2 -0.4 0.3 0.1 -0.1 0.1 -0.1 -0.2 0.0 0.0 0.0 2.8 0.4 0.4 0.5 0.1 0.3 -0.6 0.3 0.4 0.1 -0.5 0.6 0.1 0.1 0.3 -0.4 0.8 0.2 0.2 0.1 0.4 -0.1 0.0 0.0 Contech Research Temp ºC R.H. % Date : Pos. ID 22 40 22 46 22 44 24 57 21 51 22 54 22 54 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X 23 48 23 50 23 50 22 52 16Jul01 17Jul01 18Jul01 19Jul01 MFG20d DISTURB Cyclic1X Dura 2 22 60 23 68 30Jul01 10Aug01 MFG30d MFG40d 7-11 7-12 7-13 7-14 7-15 7-16 7-17 7-18 7-19 7-20 7-21 7-22 7-23 7-24 7-25 8-1 8-2 8-3 8-4 8-5 8-6 8-7 8-8 8-9 8-10 8-11 8-12 8-13 8-14 8-15 8-16 8-17 8-18 8-19 8-20 8-21 8-22 8-23 8-24 8-25 8.8 8.5 8.0 8.6 8.8 8.8 8.4 8.4 8.5 8.6 8.7 8.3 8.5 8.1 9.1 7.1 9.1 4.9 8.3 8.3 8.4 8.7 9.5 9.9 9.1 8.7 4.2 6.8 8.3 7.9 5.5 8.1 8.2 8.4 8.5 8.5 9.0 6.1 5.0 7.8 0.3 -0.1 0.6 0.0 0.2 0.1 0.1 0.0 0.0 0.0 0.0 0.1 -0.1 0.1 0.3 -0.1 -0.1 1.0 0.1 0.2 -0.1 0.0 -0.6 -0.7 0.0 -0.1 0.6 0.8 0.0 0.4 3.6 0.0 0.0 0.0 -0.1 0.1 0.0 0.8 1.8 0.1 0.7 3.4 0.4 1.7 1.0 0.3 0.8 1.1 0.3 1.0 0.7 2.0 1.0 0.9 0.6 0.5 -0.3 3.3 1.9 1.3 -2.1 0.7 -0.3 0.4 0.3 1.0 1.1 0.8 1.0 0.6 0.6 0.2 0.2 0.5 2.2 1.0 9.4 3.3 2.3 0.5 0.5 3.3 -1.7 1.8 0.8 0.2 0.8 1.6 0.3 0.7 0.2 1.3 1.1 0.0 -0.4 0.1 -0.8 4.4 1.7 0.6 -2.0 1.2 0.0 0.8 0.5 2.0 1.8 -0.1 2.0 0.7 -3.2 0.4 0.2 0.5 2.1 0.6 7.7 1.4 1.2 0.0 0.1 3.1 0.2 1.1 0.7 0.1 0.6 1.4 -0.1 0.8 0.5 1.4 0.4 0.8 0.6 0.0 -1.6 4.2 0.7 0.4 -2.3 0.0 -1.2 -0.6 -0.5 0.1 3.3 0.7 0.2 0.0 0.9 -0.3 -0.2 0.0 0.1 0.4 3.3 2.3 2.8 0.6 0.8 1.5 0.7 0.3 0.8 0.4 0.8 2.0 0.3 0.6 0.6 0.8 0.4 0.7 0.0 0.3 -1.8 3.4 1.2 0.7 -1.7 0.4 -1.0 -0.2 0.3 0.5 2.7 1.1 0.5 0.5 2.6 -0.1 -0.1 -0.1 0.5 0.2 2.5 2.8 2.2 0.4 1.8 13.7 0.9 3.7 1.3 0.4 1.0 2.7 0.5 2.3 0.8 3.7 2.1 0.7 0.5 0.5 -0.6 3.9 3.2 0.3 -0.4 -0.4 -0.8 -1.0 -0.3 0.6 1.1 0.7 1.0 -0.2 1.9 -0.3 -0.1 0.1 1.3 1.0 5.6 3.5 2.7 1.0 0.4 4.0 0.4 1.5 0.9 0.0 0.6 1.1 0.3 1.4 1.1 3.2 0.9 0.1 0.6 0.2 -0.9 7.4 2.8 1.2 -1.2 0.0 -1.1 -0.5 -0.1 0.5 2.1 0.5 0.6 0.1 1.4 -0.3 -0.1 0.3 1.3 0.8 7.3 4.2 3.4 0.4 1.0 1.9 1.0 1.2 0.8 0.2 0.5 1.5 0.6 0.5 0.5 0.9 0.7 1.0 0.4 0.0 -1.8 3.4 0.2 0.2 -1.6 -0.1 -1.1 -1.8 -0.3 0.3 4.7 2.6 0.3 0.2 2.5 -0.3 -0.2 0.0 -0.2 0.2 -0.1 1.1 2.4 0.6 0.3 4.2 0.3 1.3 1.3 0.0 1.0 -0.7 0.2 0.2 0.2 0.7 0.8 0.5 0.4 0.2 -1.5 6.0 1.5 0.4 -0.6 -0.1 -1.1 1.7 -0.4 0.2 3.8 0.3 0.4 0.1 2.0 -0.3 -0.1 0.1 0.6 0.5 3.6 2.0 3.3 0.4 0.3 1.0 0.3 0.6 0.6 0.1 0.5 0.8 -0.1 0.6 0.3 0.8 0.3 0.6 0.3 0.4 -1.1 6.3 1.5 0.1 -1.0 0.0 -1.1 0.1 -0.4 0.2 4.1 0.3 0.9 0.2 2.1 0.0 0.0 0.5 1.7 1.0 3.6 2.6 3.1 1.4 0.1 1.0 0.2 0.8 0.6 0.2 1.0 1.5 0.1 0.3 0.3 0.7 -0.2 1.0 0.4 0.9 -0.6 6.0 1.3 0.3 -1.4 0.4 -1.2 0.4 -0.4 0.5 3.0 0.5 0.6 0.4 2.0 0.3 0.1 0.5 2.2 0.9 4.9 3.5 2.3 1.7 0.2 0.7 1.1 0.5 0.3 0.0 0.8 1.5 -0.1 0.4 0.1 0.6 0.0 0.7 0.3 0.9 -0.1 7.6 0.7 0.2 -1.6 -0.2 -1.2 0.1 -0.6 0.7 3.2 0.4 0.9 0.2 2.0 -0.1 -0.1 0.2 0.4 0.7 4.0 3.6 2.8 1.8 MAX MIN AVG STD Open 10.4 4.2 8.3 0.9 0 3.6 -1.8 0.1 0.6 0 9.4 -2.4 0.7 1.3 0 7.7 -3.2 0.6 1.2 0 4.2 -2.4 0.4 1.0 0 7.5 -2.3 0.6 1.1 0 13.7 -2.0 1.4 2.1 0 7.4 -2.5 0.5 1.2 0 5.0 -2.7 0.4 1.0 0 6.6 -2.6 0.6 1.3 0 6.3 -2.5 0.4 1.1 0 6.0 -2.7 0.4 1.0 0 7.6 -2.7 0.4 1.1 0 Tech A.C. 691 1116 A.C. 692 1117 A.C. 693 1118 G.P. 400 1047 AC 691 1116 AC 691 1116 AC 691 1116 AC 691 1116 AB 691 1116 AC 691 1116 AB 529 1278 AC 691 1116 AC 691 1116 Equip ID TR#201175A, REV.1.2 117 of 117 Contech Research