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DECEMBER 19, 2007
TEST REPORT #207757B REV. 1.1
MIXED FLOWING GAS
TESTING
CONNECTOR SERIES
SMM/TMM
SAMTEC, INC.
APPROVED BY: DOMINIC ARPINO
PROGRAM MANAGER
CONTECH RESEARCH, INC.
Test Laboratory
Contech Research
An Independent Test and Research Laboratory
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
12/19/2007
1.0
Initial Issue
DA
12/20/2007
1.1
Editorial Changes on page 4 and 5
DA
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CERTIFICATION
This is to certify that the evaluation described herein was
designed and executed by personnel of Contech Research, Inc.
It was performed with the concurrence of Samtec, Inc., of New
Albany, IN who was the test sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1
and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
Dominic Arpino
Program Manager
Contech Research, Inc.
DA:cf
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SCOPE
To perform Mixed Flowing Gas testing on various connector
platings as manufactured and submitted by the test sponsor
Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Standards: EIA Publication 364
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
TABLE 1
Plating Thickness
(Microinches)
Connector Series
a) SMM-130-02-X-D-01
b) SMM-130-02-X-D-01
c) SMM-130-02-X-D-01
Nickel
Noble
Layer
Pd.
Top
Layer
150 min
150 min
150 min
40 min
40 min
Au Flash
Au Flash
Au(10)
Au(30)
Au(30)
150 min
150 min
150 min
40 min
40 min
Au Flash
Au Flash
Au(10)
Au(30)
Au(30)
Header Series
a) TMM-130-01-X-D-SM-A
b) TMM-130-01-X-D-SM-A
c) TMM-130-01-X-D-SM-A
2.
Test samples were supplied assembled and terminated to test
boards by the test sponsor.
3.
Test boards for mounting test samples were supplied by the
test sponsor.
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4.
The test samples were tested in their ‘as received’
condition.
TEST SAMPLES AND PREPARATION continue:
5.
Spacers were assembled to each test sample to maintain
stability between the mated pair.
6.
Unless otherwise specified in the test procedures used, no
further preparation was used.
TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #1, for test sequences
used.
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner
which remained legible for the test duration.
2.
The test samples were coded in the following manner:
CRI
Gp #
PLT
Thick
Socket
Contact
Header
Contact
mates to
ID#’s
108
Au(10) SMM-130-02-X-D-01-01
TMM-130-01-X-D-SM-A
1-1 to 1-8
109
Au(30) SMM-130-02-X-D-01-01
TMM-130-01-X-D-SM-A
2-9 to 2-16
110
Au(30) SMM-130-02-X-D-01-01
TMM-130-01-X-D-SM-A
3-17 to 3-24
3.
See page 4 Table 1 for the different plating.
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FIGURE #1
TEST PLAN FLOW DIAGRAM
SAMPLE PREPARATION
LLCR
DURABILITY
AS SPECIFIED
LLCR
MFG
EXPOSURE
DURATION
7 DAYS
UNMATED
LLCR
1 CYCLE
MATE/UNMATE
LLCR
MFG
EXPOSURE
DURATION
7 DAYS
MATED
LLCR
1 CYCLE
MATE/UNMATE
LLCR
Group A
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DATA SUMMARY
TEST
REQUIREMENT
RESULT
GR 108 –Au (10)
GR 109 –Au (30)
GR 110 –Au (30)
RECORD
RECORD
RECORD
8.8 mΩ MAX.
10.4 mΩ MAX.
9.9 mΩ MAX.
DURABILITY
GR 108 –Au (10)
GR 109 –Au (30)
GR 110 –Au (30)
NO DAMAGE
NO DAMAGE
NO DAMAGE
PASSED
PASSED
PASSED
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+2.8 mΩ MAX.CHG.
+2.4 mΩ MAX.CHG.
+2.1 mΩ MAX.CHG.
GROUP A
LLCR
LLCR
GR 108 –Au (30)
GR 109 –Au (30)
GR 110 –Au (30)
MFG –UNMATED
GR 108 –Au (10) @ 7 DAYS NO DAMAGE
GR 109 –Au (30) @ 7 DAYS NO DAMAGE
GR 110 –Au (30) @ 7 DAYS NO DAMAGE
CORROSION
CORROSION
CORROSION
LLCR
GR 108 –Au (10) @ 7 DAYS +10.0 mΩ MAX.CHG.
GR 109 –Au (30) @ 7 DAYS +10.0 mΩ MAX.CHG.
GR 110 –Au (30) @ 7 DAYS +10.0 mΩ MAX.CHG.
+3.1 mΩ MAX.CHG.
+1.9 mΩ MAX.CHG.
+2.2 mΩ MAX.CHG.
1 CYCLE
GR 108 –Au (10)
GR 109 –Au (30)
GR 110 –Au (30)
NO DAMAGE
NO DAMAGE
NO DAMAGE
PASSED
PASSED
PASSED
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DATA SUMMARY –continued
LLCR
GR 108 –Au (10)
GR 109 –Au (30)
GR 110 –Au (30)
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+3.2 mΩ MAX.CHG.
+2.1 mΩ MAX.CHG.
+2.2 mΩ MAX.CHG.
MFG – MATED
GR 108 –Au (10) @14 DAYS NO DAMAGE
GR 109 –Au (30) @14 DAYS NO DAMAGE
GR 110 –Au (30) @14 DAYS NO DAMAGE
PASSED
PASSED
PASSED
LLCR
GR 108 –Au (10) @14 DAYS +10.0 mΩ MAX.CHG.
GR 109 –Au (30) @14 DAYS +10.0 mΩ MAX.CHG.
GR 110 –Au (30) @14 DAYS +10.0 mΩ MAX.CHG.
+3.5 mΩ MAX.CHG.
+2.3 mΩ MAX.CHG.
+2.5 mΩ MAX.CHG.
1 CYCLE
GR 1 –Au (10)
GR 2 –Au (30)
GR 3 –Au (30)
NO DAMAGE
NO DAMAGE
NO DAMAGE
PASSED
PASSED
PASSED
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+10.0 mΩ MAX.CHG.
+8.4 mΩ MAX.CHG.
+8.7 mΩ MAX.CHG.
+6.3 mΩ MAX.CHG.
LLCR
GR 1 –Au (30)
GR 2 –Au (30)
GR 3 –Au (30)
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EQUIPMENT LIST
ID#
Next Cal
Last Cal
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Cal
102
208
280
299
436
443
525
526
529
543
563
582
1027
1105
1323
1370
1540
1/4/2008
1/4/2007
2/7/2008
2/7/2007
1/11/2008
2/8/2007
7/30/2008
7/30/2007
Data Acquisition Unit
Analyzer
Micro-Ohm Meter
Oxidant Monitor
Gas Regulator
Gas Regulator Valve
Gas Regulator
Gas Regulator
Computer
Analytical Balance
MFG Control Pan
Temp-Humid-Trans
Computer
Elect.Liquid Level Control
Air Dryer
Press Stand
MFG Chamber
Hewlett Packard
Columbia Scientific
Keithley Instr.
Mast Co.
Liquid Carboinc Co.
Liquid Carbonic Co.
Superior Co.
Matheson Co.
ARC Elect.
Ohaus Co.
Contech Research
General Eastern
ARC Co.
Cole Parmer
Balston
T.I.
Contech Research
3421A
SA285E
580
1724
702-S-3
DRK-2-48
5113A
3813-330
486-40
AP250D
N/A
850-232
Pent.133
7187
75-20
DT500
5 CU. FT
2338A02027
JC006
477845
14281
392838
40197
350218
R93172
N/A
MO9198
N/A
00445
026871
15239
7520-1076
27
N/A
±. 5 %Of Indicated
See Manual
See Cal Cert
See Manual
N/A
See Manual
See Owners Manual
See Owners Manual
N/A
± .4mg
N/A
± 2%RH
N/A
N/A
N/A
N/A
N/A
12mon
N/A
12mon
N/A
N/A
N/A
N/A
N/A
N/A
12mon
Ea Test
6mon
N/A
N/A
N/A
N/A
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TEST RESULTS
GROUP A
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PROJECT NO.: 207757B
SPECIFICATION: EIA
-----------------------------------------------------------PART NO.: See page 5
PART DESCRIPTION: Gold Plated Conn.
-----------------------------------------------------------SAMPLE SIZE: 24 connectors
TECHNICIAN:
MHB
-----------------------------------------------------------START DATE: 11/13/07
COMPLETE DATE: 12/6/07
-----------------------------------------------------------ROOM AMBIENT:
23°C
RELATIVE HUMIDITY: 45%
-----------------------------------------------------------EQUIPMENT ID#: 280, 529
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23 with the following conditions:
2.
Test Conditions:
a) Test Current
: 100 milliamps maximum
b) Open Circuit Voltage
: 20 millivolts
c) No. of Positions Tested : 25 per test sample
3.
The points of application are shown in Figure #2.
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REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
Avg.
Max.
Min.
6.5
6.8
7.7
6.6
7.1
7.5
7.1
7.9
8.2
8.3
8.6
8.4
8.5
8.7
8.8
8.6
4.6
4.9
5.9
4.5
5.3
5.4
5.0
6.7
9.0
8.4
8.4
8.8
7.2
8.0
8.1
8.6
10.4
9.9
10.4
9.7
8.5
8.9
8.9
9.9
6.9
6.9
5.7
7.0
5.3
6.3
6.0
5.4
8.0
8.2
8.5
8.5
8.1
8.1
8.2
8.1
8.7
8.9
9.7
9.9
8.8
8.7
8.9
8.9
6.7
6.5
6.9
6.7
6.1
6.7
6.2
6.1
GP #108 Au(10)
1-1
1-2
1-3
1-4
1-5
1-6
1-7
1-8
GP #109 Au(30)
2-9
2-10
2-11
2-12
2-13
2-14
2-15
2-16
GP #110 Au(30)
3-17
3-18
3-19
3-20
3-21
3-22
3-23
3-24
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RESULTS: -continued
2.
See the following data files for individual data points.
Connector Variation
File Numbers
Group 108 –Au (30)
Group 109 –Au (30)
Group 110 –Au (30)
20775701 through 20775708
20775709 through 20775716
20775717 through 20775724
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FIGURE #2
TYPICAL LLCR SET UP
+V
+I
Connector pair
-V
-I
Buss wires are soldered to the 2 PTH’s
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PROJECT NO.: 207757B
SPECIFICATION: EIA-364
-----------------------------------------------------------PART NO.: See page 5
PART DESCRIPTION: Gold Plated Conn.
-----------------------------------------------------------SAMPLE SIZE: 24 connectors TECHNICIAN:
MHB
-----------------------------------------------------------START DATE: 11/16/07
COMPLETE DATE: 11/19/07
-----------------------------------------------------------ROOM AMBIENT: 25°C
RELATIVE HUMIDITY:
45%
-----------------------------------------------------------EQUIPMENT ID#: 1323, 1370
-----------------------------------------------------------DURABILITY
PURPOSE:
1.
This is a preconditioning sequence which is used to induce
the type of wear on the contacting surfaces which may occur
under normal service conditions. The connectors are mated
and unmated a predetermined number of cycles. Upon
completion, the units being evaluated are exposed to the
environments as specified to assess any impact on
electrical stability resulting from wear or other wear
dependent phenomenon.
2.
This type or preconditioning sequence is also used to
mechanically stress the connector system as would normally
occur in actual service. This sequence in conjunction with
other tests is used to determine if a significant loss of
contact pressure occurs from said stresses which in turn,
may result in an unstable electrical condition to exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 09.
2.
Test Conditions:
a) No. of Cycles
b) Rate
: 25X
: 1.0 inch per minute
3.
The samples were cycled using an X Y Table and a drill
press stand.
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
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REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples so tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
Sample ID#
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Avg.
Max.
Change
Change
GP #108 Au(10)
1-1
1-2
1-3
1-4
1-5
1-6
1-7
1-8
+0.7
+0.6
-0.4
+0.4
+0.7
+0.4
-0.2
-0.4
+2.1
+2.6
+1.3
+2.2
+2.3
+1.2
+2.8
+1.4
-0.1
-1.0
-1.2
-0.7
-0.4
-0.3
-0.4
-1.2
+0.4
+0.5
+2.4
+0.0
+0.0
+0.8
+1.3
+0.4
GP #109 Au(30)
2-9
2-10
2-11
2-12
2-13
2-14
2-15
2-16
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RESULTS: -continued
Sample ID#
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Avg.
Max.
Change
Change
GP #110 Au(30)
3-17
3-18
3-19
3-20
3-21
3-22
3-23
3-24
2.
-0.1
-0.3
-0.7
-0.4
-0.1
-0.2
+0.0
-0.2
+1.0
+0.9
+0.4
+0.2
+1.1
+0.9
+1.1
+2.1
See the following data files for individual data points.
Connector Series
File Numbers
Group 108 –Au (10)
Group 109 –Au (30)
Group 110 –Au (30)
20775701 through 20775708
20775709 through 20775716
20775717 through 20775724
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PROJECT NO.: 207757B
SPECIFICATION: EIA-364-65
-----------------------------------------------------------PART NO.: See page 5
PART DESCRIPTION: Gold Plated Conn.
-----------------------------------------------------------SAMPLE SIZE: 72 connectors TECHNICIAN:
MHB
-----------------------------------------------------------START DATE: 11/20/07
COMPLETE DATE: 12/5/07
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 46%
-----------------------------------------------------------EQUIPMENT ID#: 102, 208, 299, 436, 443, 525, 526, 543, 563,
582, 1027, 1105, 1323, 1540
-----------------------------------------------------------MIXED FLOWING GAS
PURPOSE:
1.
To determine the impact on electrical stability of contact
interfaces when the test samples are exposed to a mixed
flowing gas environment. Said environment is based on
field data simulating typical, severe, non-benign
environments. Said exposure is indicative of expected
behavior in the field.
2.
Mixed flowing gas tests (MFG) are environmental test
procedures whose primary purpose is to evaluate product
performance under simulated storage or operating (field)
conditions. For parts involving plated contact surfaces,
such tests are also used to measure the effect of plating
degradation (due to the environment) on the electrical and
durability properties of a contact or connector system.
The specific test conditions are usually chosen so as to
simulate, in the test laboratory, the effects of certain
representative field environments or environmental severity
levels on standard metallic surfaces.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with EIA
364, Test Procedure 65 with the following conditions.
-continued on next page
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PROCEDURE:
2.
-continued
Environmental Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Temperature
Relative Humidity
C12
NO2
H2S
SO2
Exposure Time
Mating Conditions
:
:
:
:
:
:
:
:
:
30°C ± 1°C
70% ± 2%
10 ± 3 ppb
200 ± 50 ppb
10 ± 5 ppb
100 ± 20 ppb
14 days
First 7 days - unmated
Second 7 days -mated
3.
The test chamber was allowed to stabilize at the specified
conditions indicated.
4.
After stabilization, the test samples and control coupons
were placed in the chamber such that they were no closer
than 2.0" from each other and/or the chamber walls.
5.
The test samples were handled in a manner so as not to
disturb the contact interface.
6.
After placement of the test samples in the chamber, it was
allowed to re-stabilize and adjusted as required to
maintain the specified concentrations and conditions.
7.
The test chamber was monitored periodically during the
exposure period to assure the environmental conditions as
specified were maintained.
8.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of damage or corrosion to the
test samples as exposed which will cause mechanical or
electrical malfunction of the said samples.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
Some Evidence of corrosion was observed on GP 108 and GP
109 and GP 110. See figure #’s 3, 4 and 5.
-continued on next page.
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RESULTS:
2.
-continued
The following is a summary of the data observed following
the 7 days unmated portion of the exposure:
MAXIMUM CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
GP #108 Au(10)
Avg.
Chg.
Max.
Chg.
Avg.
Chg.
@ 7 Days
1-1
1-2
1-3
1-4
1-5
1-6
1-7
1-8
+0.9
+1.0
+0.2
+0.6
+0.8
-0.1
+0.9
+0.0
Max.
Chg.
1 Cycle
+2.6
+3.1
+1.7
+2.0
+2.7
+1.6
+2.8
+1.5
+0.1
+0.9
-0.1
+0.0
+0.6
-0.2
+0.8
+0.0
+1.9
+2.4
+1.5
+1.6
+2.4
+1.2
+3.2
+1.5
GP #109 Au(30)
@ 7 Days
2-9
2-10
2-11
2-12
2-13
2-14
2-15
2-16
-1.1
-0.7
-1.1
+0.4
+0.1
-0.3
-0.2
-1.0
1 Cycle
+1.9
+1.2
+0.7
-1.6
+1.5
+1.1
+1.6
+0.4
-1.4
-0.7
-1.1
-0.8
+0.3
-0.3
+0.0
-0.9
+2.1
+1.7
+0.7
+0.0
+1.7
+1.2
+1.7
+0.3
GP #110 Au(10)
@ 7 Days
3-17
3-18
3-19
3-20
3-21
3-22
3-23
3-24
+0.4
-0.1
-0.2
+0.0
+0.1
+0.2
+0.7
+0.2
1 Cycle
+1.6
+0.7
+1.0
+1.1
+1.2
+1.3
-0.7
+2.2
+0.1
+0.0
-0.5
+0.0
+0.0
+0.0
+0.1
+0.1
+1.1
+1.0
+0.9
+1.6
+1.2
+1.4
+1.2
+2.2
-continued on next page.
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RESULTS: -continued
3. The following is a summary of the data observed following
the 7 additional days mated portion of the exposure.
MAXIMUM CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
Avg.
Chg.
Max.
Chg.
Avg.
Chg.
Max.
Chg.
GP #108 Au(10)
@ 14 Days
1-1
1-2
1-3
1-4
1-5
1-6
1-7
1-8
+0.8
+1.1
+0.2
+0.9
+0.9
+0.1
+1.3
+0.3
1 Cycle
+3.1
+2.7
+2.2
+3.0
+3.4
+2.1
+3.5
+1.6
+0.7
+1.4
+0.5
+1.0
+0.9
+0.5
+1.3
+0.5
+2.8
+4.6
+2.1
+3.3
+2.4
+2.2
+3.0
+1.9
GP #109 Au(30)
@ 14Days
2-9
2-10
2-11
2-12
2-13
2-14
2-15
2-16
-0.8
-0.5
-0.8
-0.7
+0.5
-0.2
+0.0
-0.7
1 Cycle
+0.6
+1.5
+2.1
+0.8
+2.2
+1.2
+1.6
+2.3
-0.7
-0.6
-1.1
-0.6
+0.2
-0.3
+0.2
-1.0
+0.7
+1.9
+2.1
+1.0
+1.9
+1.6
+1.8
+0.8
GP #110 Au(30)
@ 14 Days
3-17
3-18
3-19
3-20
3-21
3-22
3-23
3-24
+0.2
+0.0
-0.5
+0.0
+0.3
+0.0
+0.1
+0.1
Test Laboratory
TR#20757B, REV.1.1
21 of 74
1 Cycle
+1.5
+0.9
+0.8
+1.5
+1.9
+1.2
+1.2
+2.5
+0.9
+0.3
+0.2
+0.4
+0.4
+0.3
+0.4
+0.2
+2.5
+2.1
+1.8
+3.2
+1.9
+3.8
+1.6
+2.4
Contech Research
An Independent Test and Research Laboratory
RESULTS: -continued
4.
See the following data files for individual data points.
Connector Series
File Numbers
Group 108 –Au (10)
Group 109 –Au (30)
Group 110 –Au (30)
5.
20775701 through 20775708
20775709 through 20775716
20775717 through 20775724
Five copper coupons were placed in the chamber. Upon
removal said coupons were evaluated via weight gain
technique with the following results:
WEIGHT GAIN (µgm/cm2/Day)
Coupon No.
Unmated
1
2
3
4
5
13
14
14
15
13+
Requirement:
12 to 16 µgm/cm2/Day
Test Laboratory
TR#20757B, REV.1.1
22 of 74
Mated
12+
14
13
13+
13
Contech Research
An Independent Test and Research Laboratory
FIGURE #3
Test Laboratory
TR#20757B, REV.1.1
23 of 74
Contech Research
An Independent Test and Research Laboratory
FIGURE #4
Test Laboratory
TR#20757B, REV.1.1
24 of 74
Contech Research
An Independent Test and Research Laboratory
FIGURE #5
Test Laboratory
TR#20757B, REV.1.1
25 of 74
Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
FILE NUMBERS
Group 108
Group 109
Group 110
20775701
20775702
20775703
20775704
20775705
20775706
20775707
20775708
20775709
20775710
20775711
20775712
20775713
20775714
20775715
20775716
20775717
20775718
20775719
20775720
20775721
20775722
20775723
20775724
Test Laboratory
TR#20757B, REV.1.1
26 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 10
Open circuit voltage:
20mv
Spec: EIA 364, TP23
Subgroup: CRI 108 ID# 1-1
File #:
20775701
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
8.1
6.6
6.8
7.5
8.1
8.2
8.0
8.0
6.6
6.6
5.5
4.8
5.9
6.0
6.6
5.9
5.6
8.0
8.0
6.2
5.3
5.0
5.4
4.9
4.6
0.1
0.3
0.5
-0.9
-0.1
0.0
0.1
-0.2
1.2
1.1
2.1
1.8
1.0
0.6
1.0
1.2
1.6
-0.2
-0.2
-0.3
1.6
1.8
1.7
0.4
1.1
24
40
27Nov07
MFG-7day
Unmated
0.1
0.5
0.6
0.6
-0.1
0.0
0.0
0.1
0.8
1.2
2.2
2.4
1.4
-0.7
1.2
0.4
0.9
-0.2
0.3
1.2
2.5
2.4
1.7
1.6
2.6
Test Laboratory
TR#20757B, REV.1.1
27 of 74
24
40
27Nov07
1X
-0.1
1.3
1.0
0.8
-0.2
0.0
-0.2
0.2
0.5
-0.1
-0.1
-0.1
-0.4
-1.2
-0.3
-0.3
-0.6
-0.6
0.0
-1.5
1.3
1.0
0.6
1.9
-0.3
23
20
05Dec07
MFG7Days
Mated
-0.1
-0.1
0.3
0.4
-0.3
0.0
-0.1
-0.2
0.7
0.7
1.6
0.3
0.6
0.1
1.1
0.0
1.1
-0.2
0.0
0.7
3.1
2.7
2.4
2.8
1.3
23
20
06Dec07
1X
0.0
2.0
1.2
0.7
-0.1
0.1
0.0
1.6
-0.5
-0.6
0.1
-0.2
-0.3
0.3
0.6
-0.6
0.5
-0.7
0.7
2.4
2.8
2.3
1.4
2.2
0.8
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775701
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG-7day
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG7Days
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.2
4.6
6.5
1.2
0
MOB
2.1
-0.9
0.7
0.8
0
JG
2.6
-0.7
0.9
0.9
0
S.Rath
1.9
-1.5
0.1
0.8
0
S.Rath
3.1
-0.3
0.8
1.0
0
MHB
2.8
-0.7
0.7
1.0
0
MHB
Equip ID
1125
1219
1512
295
244
1032
244
1032
529
280
529
280
Test Laboratory
TR#20757B, REV.1.1
28 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au(10)
Open circuit voltage:
20mv
Spec: EIA 364, TP23
Subgroup:
CRI ID# 1-2
File #:
20775702
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
6.7
8.3
7.3
5.6
8.3
6.1
5.1
6.3
7.6
6.5
5.4
5.2
4.9
6.6
7.2
6.0
6.7
6.9
6.4
7.5
6.0
8.1
8.1
8.2
8.3
1.0
0.7
0.9
1.9
-0.2
-0.1
2.6
1.4
0.1
1.3
2.0
2.0
1.7
0.7
-0.2
1.7
-0.2
-0.3
-0.5
-0.8
0.2
-0.9
-0.2
-0.2
-0.3
24
40
27Nov07
MFG-7day
Unmated
1.5
-0.2
1.2
2.9
-0.6
1.6
3.1
1.8
0.4
1.0
1.8
2.6
1.9
0.7
0.4
1.8
1.3
0.7
1.3
-1.2
2.1
-1.0
-0.2
0.5
-0.8
Test Laboratory
TR#20757B, REV.1.1
29 of 74
24
40
27Nov07
1X
0.8
0.8
0.6
2.0
0.0
0.2
1.9
1.0
0.3
1.2
2.4
1.5
1.5
0.8
0.5
1.4
1.9
0.8
1.5
-0.1
1.6
-0.1
0.5
0.1
-0.1
23
20
05Dec07
MFG 7d
Mated
0.7
0.8
1.1
2.5
-0.2
0.3
2.7
1.6
0.4
1.3
2.7
2.4
2.5
0.9
0.7
1.6
1.1
0.8
0.9
-0.2
1.9
0.3
0.5
0.0
0.1
23
20
06Dec07
1X
1.2
1.3
4.6
2.8
0.0
0.2
2.1
1.8
1.0
2.1
3.4
2.1
2.3
1.4
0.6
0.9
1.4
0.8
1.4
0.1
2.0
0.2
1.6
0.0
-0.1
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775702
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG-7day
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.3
4.9
6.8
1.1
0
MOB
2.6
-0.9
0.6
1.0
0
JG
3.1
-1.2
1.0
1.2
0
S.Rath
2.4
-0.1
0.9
0.8
0
S.Rath
2.7
-0.2
1.1
0.9
0
JG
4.6
-0.1
1.4
1.2
0
MHB
Equip ID
1125
1219
1512
295
244
1032
244
1032
295
1512
529
280
Test Laboratory
TR#20757B, REV.1.1
30 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au (10)
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
108 CRI ID# 1-3
File #:
20775703
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
8.6
6.7
8.3
7.4
5.9
8.6
8.5
8.3
8.2
8.3
8.3
8.3
8.3
8.3
8.3
7.3
8.2
8.3
7.5
6.4
7.9
7.2
7.2
7.2
6.3
-0.4
1.3
-0.4
0.4
-0.3
-0.4
-0.3
-0.1
-0.3
-0.3
-1.4
-1.5
-1.4
-1.7
-0.2
-0.7
-0.2
-0.2
0.2
1.3
0.2
-1.1
-1.4
-1.5
-0.1
24
40
27Nov07
MFG-7day
Unmated
-0.3
1.5
0.3
1.2
0.3
-0.1
1.0
-0.3
0.0
-0.2
-0.5
-0.8
-0.4
-1.2
0.0
-0.2
-0.1
-0.3
1.4
1.7
1.1
0.1
1.5
0.3
0.3
Test Laboratory
TR#20757B, REV.1.1
31 of 74
24
40
27Nov07
1X
-0.3
1.5
0.0
0.8
0.6
-0.2
0.5
-0.2
-0.2
-0.4
-1.5
-1.1
-0.9
-1.4
0.0
-0.3
-0.3
-0.5
0.3
0.9
0.7
-0.8
0.5
0.4
0.3
23
20
05Dec07
MFG 7d
Mated
-0.3
1.4
-0.3
-0.3
1.9
-0.1
0.2
-0.4
-0.3
-0.2
-0.1
-0.2
-0.2
-0.2
-0.1
-0.9
-0.2
-0.3
1.1
2.2
0.5
1.0
1.1
1.0
0.0
23
20
06Dec07
1X
-0.3
1.5
0.1
1.0
0.9
0.2
1.6
0.1
-0.2
0.2
0.6
-0.2
-0.1
0.3
0.3
0.3
-0.1
-0.2
0.9
2.1
0.7
1.3
0.3
0.5
0.0
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775703
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG-7day
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.6
5.9
7.7
0.8
0
MOB
1.3
-1.7
-0.4
0.8
0
JG
1.7
-1.2
0.2
0.8
0
S.Rath
1.5
-1.5
-0.1
0.7
0
S.Rath
2.2
-0.9
0.2
0.8
0
JG
2.1
-0.3
0.5
0.6
0
MHB
Equip ID
1125
1219
1512
295
244
1032
244
1032
295
1512
529
280
Test Laboratory
TR#20757B, REV.1.1
32 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 10
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
108 CRI ID# 1-4
File #:
20775704
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
4.9
8.2
8.0
7.9
8.0
5.3
6.1
5.5
6.5
6.9
4.5
4.9
4.9
4.8
4.9
7.0
8.0
4.5
6.9
8.4
7.9
7.9
7.9
8.1
8.0
0.5
-0.2
-0.2
-0.6
-0.2
0.4
-0.1
0.9
0.3
0.2
2.1
1.7
1.4
1.9
2.2
-0.3
-0.2
0.3
0.1
-0.3
-0.2
-0.2
-0.2
-0.1
-0.1
24
40
27Nov07
MFG-7dy
Unmated
2.0
-0.2
-0.1
0.1
-0.1
1.1
0.1
2.0
0.7
0.3
1.5
2.0
0.8
1.0
1.5
0.7
0.0
1.2
0.7
-0.2
-0.2
-0.2
-0.2
-0.2
0.1
Test Laboratory
TR#20757B, REV.1.1
33 of 74
24
40
27Nov07
1X
0.2
-0.2
-0.2
-0.9
-0.2
-0.9
1.6
0.0
-1.5
-1.8
0.4
0.0
-0.2
0.1
0.8
0.7
-0.2
1.2
0.9
-0.3
0.1
-0.2
0.3
-0.3
-0.1
23
20
05Dec07
MFG 7d
Mated
2.0
-0.4
-0.4
-0.4
-0.3
0.7
-0.2
2.0
1.2
0.8
3.0
2.5
2.6
3.0
2.5
0.7
-0.3
2.6
1.0
-0.2
0.0
0.1
0.4
-0.3
-0.1
23
20
06Dec07
1X
0.7
-0.1
-0.1
0.6
0.9
0.6
0.0
1.9
2.5
1.6
2.7
2.3
2.7
2.1
2.0
0.8
-0.2
3.3
1.0
-0.1
0.4
0.5
0.0
-0.3
-0.1
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775704
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG-7dy
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.4
4.5
6.6
1.4
0
MOB
2.2
-0.6
0.4
0.8
0
JG
2.0
-0.2
0.6
0.8
0
S.Rath
1.6
-1.8
0.0
0.8
0
S.Rath
3.0
-0.4
0.9
1.2
0
JG
3.3
-0.3
1.0
1.1
0
MHB
Equip ID
1125
1219
1512
295
244
1032
244
1032
295
1512
529
280
Test Laboratory
TR#20757B, REV.1.1
34 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au (10)
Open circuit voltage:
20mv
Spec: EIA 364, TP23
Subgroup: 108 CRI ID# 1-5
File #:
20775705
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
5.3
8.4
8.3
5.6
5.6
8.5
6.7
6.9
6.9
7.5
7.5
7.9
8.2
8.1
7.9
7.5
8.3
7.1
7.1
6.2
5.8
5.4
7.4
6.9
5.3
1.8
-0.1
-0.1
1.5
1.7
0.0
0.6
0.3
1.0
0.6
0.6
0.1
-0.2
-0.2
0.1
1.0
-0.2
0.9
1.1
-0.1
0.6
1.4
0.8
0.9
2.3
24
40
27Nov07
MFG-7dy
Unmated
1.9
0.7
-0.2
0.5
0.9
-0.2
1.2
1.1
1.1
0.6
0.6
0.4
0.7
0.1
0.1
1.1
0.0
1.0
1.2
0.0
1.2
1.8
0.8
1.0
2.7
Test Laboratory
TR#20757B, REV.1.1
35 of 74
24
40
27Nov07
1X
-0.2
0.1
0.1
1.2
0.7
-2.3
0.6
0.6
1.0
0.5
0.6
0.2
-0.1
-0.3
0.0
1.4
0.0
0.9
1.1
-0.1
0.5
2.1
1.5
1.5
2.4
23
20
05Dec07
MFG 7d
Mated
2.1
0.1
0.2
2.3
2.1
-0.5
0.2
-0.1
1.0
0.5
0.7
0.1
-0.2
-0.3
0.0
1.4
-0.1
0.9
1.2
-0.1
2.5
2.6
1.5
2.2
3.4
23
20
06Dec07
1X
1.0
0.9
0.3
1.9
2.0
-0.9
0.6
0.4
1.3
0.4
0.8
0.4
0.1
-0.2
0.0
2.4
0.1
0.9
1.1
-0.1
1.5
2.4
2.1
1.2
2.3
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775705
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG-7dy
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.5
5.3
7.1
1.1
0
MOB
2.3
-0.2
0.7
0.7
0
JG
2.7
-0.2
0.8
0.7
0
S.Rath
2.4
-2.3
0.6
0.9
0
S.Rath
3.4
-0.5
0.9
1.1
0
JG
2.4
-0.9
0.9
0.9
0
MHB
Equip ID
1125
1219
1512
295
244
1032
244
1032
295
1512
529
280
Test Laboratory
TR#20757B, REV.1.1
36 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au (10)
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
108 CRI ID# 1-6
File #:
20775706
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
6.2
7.0
7.1
5.4
6.8
6.3
8.5
8.4
8.2
8.3
6.9
8.2
8.3
7.4
8.2
8.3
8.5
8.5
8.6
8.7
7.3
6.7
6.8
7.3
6.7
-0.2
-0.1
0.2
0.7
-0.8
-0.3
-0.2
-0.3
-0.3
-0.2
-0.3
-1.5
-1.5
-1.2
-1.4
-1.8
-1.1
-0.4
-0.4
-0.3
0.7
1.2
-0.1
-1.0
0.3
24
40
27Nov07
MFG-7day
Unmated
1.6
0.6
-0.6
0.8
-0.8
-0.1
0.9
0.3
0.0
0.4
-0.5
-1.0
-1.6
-0.8
-0.8
-1.5
-1.4
-0.4
-0.3
0.7
0.9
0.9
0.2
-0.1
0.7
Test Laboratory
TR#20757B, REV.1.1
37 of 74
24
40
27Nov07
1X
0.7
0.3
-0.4
-0.2
-1.1
-0.3
-0.4
-0.2
-0.8
-0.3
-0.6
-1.1
-1.7
-1.1
-0.1
-1.1
-0.2
-0.4
-0.1
0.1
1.1
1.2
0.4
-0.1
0.9
23
20
05Dec07
MFG 7d
Mated
0.6
0.1
0.9
2.1
0.8
-0.3
-0.1
0.0
0.1
-0.2
-0.4
-0.1
-1.3
-0.7
0.4
-0.3
-0.1
-0.2
0.1
0.4
1.1
0.0
0.0
-0.1
0.0
23
20
06Dec07
1X
0.7
-0.4
0.9
2.2
0.3
-0.2
0.4
0.2
1.2
0.9
-0.2
0.5
-0.3
-0.7
0.4
0.1
-0.1
0.1
-0.1
0.3
1.1
1.9
1.5
0.4
0.4
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775706
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG-7day
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.7
5.4
7.5
0.9
0
MOB
1.2
-1.8
-0.4
0.7
0
JG
1.6
-1.6
-0.1
0.9
0
S.Rath
1.2
-1.7
-0.2
0.7
0
S.Rath
2.1
-1.3
0.1
0.6
0
JG
2.2
-0.7
0.5
0.7
0
MHB
Equip ID
1125
1219
1512
295
244
1032
244
1032
295
1512
529
280
Test Laboratory
TR#20757B, REV.1.1
38 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au(10)
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
108 CRI ID# 1-7
File #:
20775707
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
7.5
6.9
6.0
5.6
5.0
5.9
7.2
6.2
6.0
5.4
5.6
5.9
5.8
8.8
8.7
8.7
8.6
8.7
8.3
6.3
7.9
8.0
8.2
8.4
7.1
0.8
0.3
1.2
0.3
0.7
0.7
-0.5
0.6
1.1
0.8
0.1
0.5
0.8
-0.4
-0.2
-0.3
-0.6
-0.2
-1.3
2.8
-2.1
0.2
-1.3
-1.5
2.0
24
40
27Nov07
MFG-7 days
Unmated
1.5
1.8
2.5
2.5
1.7
2.8
1.3
2.1
2.4
2.8
2.7
2.4
2.3
-0.5
-0.4
-0.3
-0.2
-1.0
-0.8
2.3
-0.5
-1.4
0.0
-3.0
-0.2
Test Laboratory
TR#20757B, REV.1.1
39 of 74
24
40
27Nov07
1X
2.0
0.6
2.6
1.7
1.5
2.4
-0.1
0.5
0.8
0.9
0.2
0.3
1.1
-0.4
-0.4
0.0
0.0
-0.1
-0.7
3.2
0.0
0.6
0.0
0.1
2.0
23
20
05Dec07
MFG 7d
Mated
1.3
2.0
2.6
2.2
3.5
2.6
0.0
2.1
1.9
2.0
1.9
1.6
1.7
-0.4
-0.1
0.1
0.3
0.4
0.4
3.0
0.5
0.6
1.1
0.2
2.1
23
20
06Dec07
1X
1.2
2.6
2.6
1.4
2.0
2.6
0.3
0.7
2.3
2.0
1.8
1.6
2.0
-0.4
-0.1
0.0
1.4
0.6
-0.1
3.0
-1.0
0.8
1.5
1.1
1.6
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775707
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG-7 days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.8
5.0
7.1
1.3
0
MOB
2.8
-2.1
0.2
1.1
0
JG
2.8
-3.0
0.9
1.6
0
JG
3.2
-0.7
0.8
1.0
0
JG
3.5
-0.4
1.3
1.1
0
JG
3.0
-1.0
1.3
1.1
0
MHB
Equip ID
1125
1219
1512
295
1512
295
1512
295
1512
295
529
280
Test Laboratory
TR#20757B, REV.1.1
40 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au(10)
Open circuit voltage:
20mv
Spec: EIA 364, TP23
Subgroup: 108 CRI ID# 1-8
File #:
20775708
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
8.6
8.4
7.0
8.1
7.2
8.4
8.1
8.1
7.2
8.0
8.2
8.2
8.1
8.2
8.3
8.3
8.3
7.4
7.2
6.7
8.3
7.2
7.2
7.8
8.4
0.0
-1.1
0.7
-1.3
-1.4
-0.1
-1.7
-0.6
-0.6
-0.3
-0.2
-2.3
-0.9
-0.3
-0.3
-0.3
-0.4
-1.3
-0.8
1.4
-0.3
0.8
0.7
0.0
-0.4
24
24
40
40
27Nov07
27Nov07
MFG
1X
7 days unmated
1.0
0.5
0.1
0.2
1.5
0.9
-1.2
1.3
-0.2
1.3
-0.2
-0.2
0.0
-0.6
-0.2
-0.2
-0.7
-0.6
0.3
-0.2
-0.2
0.1
-0.1
-1.2
0.1
0.1
-0.3
-0.1
-0.3
-1.2
-1.5
-1.6
-1.1
-0.8
-1.0
-1.1
0.9
0.1
1.0
1.5
-0.2
0.0
1.1
1.1
1.1
1.0
-0.2
0.3
0.1
-0.2
Test Laboratory
TR#20757B, REV.1.1
41 of 74
23
20
05Dec07
MFG 7d
Mated
0.3
0.4
1.3
0.4
0.8
0.1
0.1
-0.2
0.9
-0.2
0.1
-0.1
0.1
-0.3
-0.3
-0.3
-0.3
0.1
0.7
1.6
-0.2
1.0
1.2
0.3
0.0
23
20
06Dec07
1X
0.9
0.7
1.7
1.9
0.9
0.2
0.5
-0.2
-0.2
-0.2
1.0
0.0
0.4
-0.2
-0.3
-0.3
-0.3
0.5
0.8
1.6
0.0
1.5
1.6
0.3
0.2
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
24
40
40
27Nov07
27Nov07
MFG
1X
7 days unmated
MAX
MIN
AVG
STD
Open
Tech
8.6
6.7
7.9
0.6
0
MOB
1.4
-2.3
-0.4
0.8
0
JG
1.5
-1.5
0.0
0.8
0
JG
Equip ID
1125
1219
1512
295
1512
295
Test Laboratory
TR#20757B, REV.1.1
42 of 74
20775708
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
1.5
-1.6
0.0
0.8
0
JG
1.6
-0.3
0.3
0.6
0
JG
1.9
-0.3
0.5
0.7
0
MHB
1512
295
1512
295
529
280
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 109 ID# 2-9
File #:
20775709
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
8.8
9.0
9.0
9.4
9.3
8.9
8.8
8.7
9.2
9.4
9.0
9.2
9.9
9.3
9.0
9.0
10.0
9.2
9.3
9.2
10.4
7.7
8.6
8.8
6.9
-0.1
-0.3
-0.6
-1.7
-3.0
-0.5
-0.3
-0.3
-1.3
-1.0
-1.0
-1.1
-1.8
-1.0
-0.4
-0.7
-1.5
-1.2
-2.0
-0.4
-2.2
-0.7
-0.4
-2.3
0.4
24
40
27Nov07
MFG 7-days
Unmated
-0.3
-0.6
-1.3
-2.2
-1.4
-0.4
-1.3
-1.8
-2.4
-2.8
-2.9
-2.6
-2.6
-0.5
-0.5
-0.4
-2.3
-0.8
-1.3
0.0
-2.6
0.6
0.1
-0.6
1.9
Test Laboratory
TR#20757B, REV.1.1
43 of 74
24
40
27Nov07
1X
0.2
-1.6
-1.7
-1.7
-2.0
-0.5
-2.7
-2.1
-3.2
-3.8
-3.7
-3.0
-3.4
-0.9
-0.6
-0.4
-2.5
-0.7
-1.7
0.0
-2.4
0.8
0.0
-0.5
2.1
23
20
05Dec07
MFG 7d
Mated
0.0
-0.4
-0.7
-1.1
-1.2
-0.3
-0.4
-0.3
-1.1
-1.0
-0.9
-1.0
-1.8
-1.1
-0.6
-0.7
-1.5
-0.8
-2.2
-0.5
-1.2
0.6
-0.3
-0.8
-0.1
23
20
06Dec07
1X
0.1
-0.3
-0.7
-1.0
-1.9
0.7
-0.7
0.6
-0.9
-1.0
-0.9
-0.9
-1.8
-1.1
-0.7
-0.7
-1.2
-0.9
-1.9
-0.6
-0.9
0.5
-0.4
-1.6
0.0
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775709
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7-days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
10.4
6.9
9.0
0.7
0
MOB
0.4
-3.0
-1.0
0.8
0
JG
1.9
-2.9
-1.1
1.2
0
JG
2.1
-3.8
-1.4
1.5
0
JG
0.6
-2.2
-0.8
0.6
0
JG
0.7
-1.9
-0.7
0.7
0
JG
Equip ID
1125
1219
1512
295
1512
295
1512
295
1512
295
1512
295
Test Laboratory
TR#20757B, REV.1.1
44 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Spec: EIA 364, TP23
Subgroup: CRI 109 ID# 2-10
File #:
20775710
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
7.1
7.8
7.5
8.0
8.1
8.7
8.5
8.8
9.3
8.4
9.3
9.1
8.9
8.5
8.9
9.9
9.2
9.5
9.6
8.9
7.6
7.9
7.0
7.3
6.9
-0.2
-1.1
-0.4
0.5
0.3
-0.4
-0.5
-0.6
-1.1
-0.5
-1.2
-0.8
-0.5
-1.8
-1.7
-2.1
-1.1
-1.6
-0.5
-0.3
-2.7
-2.8
-1.4
-1.3
-0.5
24
40
27Nov07
MFG 7-days
Unmated
0.7
-1.0
-0.9
0.3
0.1
-0.1
-0.2
-0.4
-0.7
-1.3
-1.7
-1.9
-2.3
-2.8
-1.6
-1.8
-1.1
-1.2
-1.1
0.3
0.5
-0.6
1.0
0.3
1.2
Test Laboratory
TR#20757B, REV.1.1
45 of 74
24
40
27Nov07
1X
0.8
-0.9
-1.0
0.1
0.0
-0.1
-0.3
-1.7
-1.0
-0.9
-1.8
-1.5
-2.6
-2.4
-1.5
-2.6
-1.0
-1.1
-0.6
-1.7
-0.7
0.2
0.9
1.2
1.7
23
20
05Dec07
MFG 7d
Mated
0.9
-1.0
-1.1
0.2
0.1
-0.2
-0.2
-0.5
-1.0
-2.0
-2.1
-0.9
-2.2
-1.6
-1.4
-1.3
-1.0
-1.1
-1.0
0.2
0.5
0.1
1.1
1.0
1.5
23
20
06Dec07
1X
0.8
-0.7
-0.7
0.2
0.0
-0.2
0.2
-0.4
-0.7
-0.5
-2.4
-2.4
-2.4
-2.0
-1.6
-2.0
-0.9
-1.3
-1.1
0.9
-0.7
-1.6
1.1
1.2
1.9
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775710
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7-days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
9.9
6.9
8.4
0.9
0
MOB
0.5
-2.8
-1.0
0.8
0.0
JG
1.2
-2.8
-0.7
1.0
0
JG
1.7
-2.6
-0.7
1.1
0
JG
1.5
-2.2
-0.5
1.0
0
JG
1.9
-2.4
-0.6
1.2
0
JG
Equip ID
1125
1219
1512.0
295.0
1512
295
1512
295
1512
295
1512
295
Test Laboratory
TR#20757B, REV.1.1
46 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 109 ID# 2-11
File #:
20775711
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
7.7
6.7
7.0
10.4
5.9
8.7
9.5
9.4
10.3
10.1
8.6
8.8
7.8
8.7
8.1
8.4
8.2
9.3
9.1
9.2
10.1
8.5
8.4
5.7
6.3
-1.4
-1.3
-0.5
-3.1
0.4
-0.3
-0.9
-1.2
-2.1
-2.5
-2.2
-2.6
-1.3
-2.0
0.3
-1.7
-1.4
-1.2
-0.8
-0.7
-2.8
-2.1
-0.6
2.4
0.0
24
40
27Nov07
MFG 7d
Unmated
-1.8
-1.5
-0.7
-2.4
0.7
-0.3
-1.0
-1.1
-2.5
-2.0
-2.1
-2.0
0.2
-2.2
0.3
0.1
-1.4
-0.8
-0.9
-0.8
-2.4
-2.8
-1.0
0.4
0.6
Test Laboratory
TR#20757B, REV.1.1
47 of 74
24
40
27Nov07
1X
-2.0
-1.8
-0.7
-3.7
0.3
-0.4
-0.9
-1.2
-2.2
-2.1
-2.2
-2.0
0.2
-2.1
0.3
-0.2
-0.2
-0.7
-0.9
-0.8
-3.0
-2.3
-0.5
0.6
0.7
23
20
05Dec07
MFG 7d
Mated
-2.2
0.9
-0.8
-2.3
2.1
-0.4
-0.9
-1.1
-2.2
-2.6
-1.7
-2.3
0.2
-1.9
0.4
-0.2
-0.5
-0.9
-0.6
-0.6
-2.1
-1.2
-1.2
1.4
0.4
23
20
06Dec07
1X
-0.7
-0.8
-0.8
-3.7
1.8
0.2
-1.0
-1.0
-2.1
-1.9
-2.3
-2.4
-0.4
-2.2
0.3
-1.6
-1.1
-1.1
-0.9
-0.9
-2.6
-2.3
-2.9
0.2
2.1
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775711
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7d
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
10.4
5.7
8.4
1.3
0
MOB
2.4
-3.1
-1.2
1.2
0
JG
0.7
-2.8
-1.1
1.1
0
JG
0.7
-3.7
-1.1
1.2
0
JG
2.1
-2.6
-0.8
1.2
0
JG
2.1
-3.7
-1.1
1.4
0
JG
Equip ID
1125
1219
1512
295
1512
295
1512
295
1512
295
1512
295
Test Laboratory
TR#20757B, REV.1.1
48 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 106 ID# 2-12
File #:
20775712
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
9.0
8.6
9.2
9.2
9.7
8.4
8.4
8.3
9.3
9.7
9.0
8.9
7.5
8.7
8.8
8.5
8.6
8.9
8.6
7.0
9.0
9.4
9.6
9.0
7.7
-0.5
-0.3
-1.3
-0.9
-1.4
-0.1
0.0
-0.4
-1.0
-1.4
-0.9
-0.8
-0.2
-0.7
-0.8
-0.4
-0.6
-0.6
-0.4
-0.4
-0.6
-1.0
-1.1
-0.5
-0.5
24
40
27Nov07
MFG 7-days
Unmated
-0.5
-0.2
-1.5
-0.9
-1.5
-0.6
-0.8
-0.5
-1.0
-1.4
-0.9
-0.7
-1.6
-0.7
-1.0
-0.5
-0.3
-0.5
-0.3
0.0
-0.4
-0.9
-1.1
-0.5
0.0
Test Laboratory
TR#20757B, REV.1.1
49 of 74
24
40
27Nov07
1X
-0.6
-0.2
-0.9
-0.9
-1.6
-0.6
0.0
-0.3
-1.1
-1.5
-0.9
-0.9
-1.1
-1.9
-0.7
-0.4
-0.6
-0.6
-0.4
-0.3
-0.7
-0.9
-1.2
-0.6
-0.8
23
20
05Dec07
MFG 7-days
Mated
-0.6
-0.3
-0.9
-0.9
-1.6
0.1
-0.1
0.1
-1.0
-1.5
-1.7
-0.9
-1.2
-2.0
-0.9
-0.5
-1.3
-0.7
-0.4
0.6
-0.6
-0.7
-1.1
-0.6
0.8
23
20
05Dec07
1X
-0.4
-0.2
-0.9
-0.8
-1.6
0.2
0.0
0.2
-1.0
-1.4
-0.8
-0.9
-1.4
-0.7
-1.5
-0.5
-0.7
-0.7
-0.9
0.0
-0.6
-0.7
-1.1
-0.6
1.0
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775712
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7-days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7-days
Mated
23
20
05Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
9.7
7.0
8.8
0.6
0
MOB
0.0
-1.4
-0.7
0.4
0
JG
-1.6
-0.7
0.4
0.0
0
JG
0.0
-1.9
-0.8
0.4
0
JG
0.8
-2.0
-0.7
0.7
0
GL
1.0
-1.6
-0.6
0.6
0
JG
Equip ID
1125
1219
1512
295
1512
295
1512
295
1276
207
1512
295
Test Laboratory
TR#20757B, REV.1.1
50 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 109 ID# 2-13
File #:
20775713
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
8.1
7.3
6.8
7.9
8.1
6.4
6.8
8.5
8.2
7.0
7.3
7.0
7.1
7.3
7.3
7.2
7.0
6.8
7.0
7.1
5.5
5.3
6.3
8.1
8.2
-0.6
-0.1
0.0
-1.1
-0.1
-0.1
-0.1
-0.2
-0.1
-0.3
-0.4
-0.3
-0.6
-0.5
-0.5
-0.5
-0.4
-0.4
-0.4
-0.1
-0.3
-0.2
-1.4
-0.8
-0.2
24
40
27Nov07
MFG 7d
Unmated
-0.6
-0.2
0.0
0.0
-0.2
0.0
1.5
-0.3
-0.1
0.2
-0.1
-0.2
0.0
0.6
0.6
0.0
0.7
0.9
-0.1
1.3
-0.5
-0.2
0.1
-0.2
-0.2
Test Laboratory
TR#20757B, REV.1.1
51 of 74
24
40
27Nov07
1X
0.2
0.2
1.5
1.0
-0.2
-0.1
1.3
0.5
-0.1
-2.5
-0.5
-1.0
-0.1
-0.2
0.3
1.4
0.2
0.9
-0.1
1.3
0.8
1.7
1.4
-0.2
-0.2
23
20
05Dec07
MFG 7d
Mated
-0.3
-0.3
-0.2
-0.2
-0.3
-0.1
1.3
-0.4
-0.2
0.5
0.3
0.9
0.9
0.7
0.7
0.0
0.9
1.1
0.0
1.3
2.2
2.0
1.2
-0.2
-0.1
23
20
06Dec07
1X
-0.6
-0.2
0.0
0.1
-0.1
-0.1
0.2
-0.2
-0.1
-0.2
-0.6
0.5
0.9
-0.4
-0.2
-0.3
0.3
0.7
-0.1
0.8
1.8
1.9
0.8
0.0
-0.2
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775713
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7d
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.5
5.3
7.2
0.8
0
MOB
0.0
-1.4
-0.4
0.3
0
JG
1.5
-0.6
0.1
0.5
0
JG
1.7
-2.5
0.3
0.9
0
MHB
2.2
-0.4
0.5
0.8
0
JG
1.9
-0.6
0.2
0.7
0
JG
Equip ID
1125
1219
1512
295
1512
295
529
1047
295
1512
295
1512
Test Laboratory
TR#20757B, REV.1.1
52 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 109 ID# 2-14
File #:
20775714
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
6.3
7.2
7.3
8.4
7.6
6.4
8.5
8.6
8.1
8.5
8.0
7.5
7.9
8.4
8.8
8.9
8.5
7.4
8.9
8.7
8.5
6.7
7.6
7.6
8.6
-0.3
0.1
-0.6
-0.1
0.8
-0.2
-0.2
-0.2
-0.6
-0.3
-0.8
-0.6
-1.2
-0.3
-2.0
-0.5
-0.3
-0.6
-1.5
-0.3
-0.2
0.7
0.6
0.7
-0.3
24
40
27Nov07
MFG 7-Days
Unmated
0.7
1.1
-0.5
-0.1
0.8
0.2
0.0
-0.1
-1.1
0.0
-0.9
-0.9
-1.2
-0.2
-2.2
-0.7
-0.3
-0.7
-2.1
-0.2
0.0
0.8
0.7
0.8
-0.4
Test Laboratory
TR#20757B, REV.1.1
53 of 74
24
40
27Nov07
1X
0.7
1.2
-0.4
-0.1
0.8
0.1
0.0
-0.1
0.5
0.4
-0.9
-0.9
-1.3
-0.2
-2.2
-0.6
-0.5
-0.7
-1.6
-0.1
-0.3
-0.6
0.7
0.9
-2.0
23
20
05Dec07
MFG 7-Days
Mated
0.0
1.2
-0.1
-0.1
0.7
0.0
0.6
-0.2
-0.9
-0.2
-1.1
-0.7
-1.3
-0.3
-2.1
-0.7
0.0
-0.4
-0.1
-0.1
-0.1
-0.3
0.7
0.8
-0.3
23
20
05Dec07
1X
1.3
1.1
-0.5
-0.1
0.7
0.2
0.2
-0.2
-0.9
-0.2
-2.9
-0.9
-1.3
-1.9
-2.2
-0.7
0.0
-0.7
-1.8
-0.1
0.1
0.3
1.6
0.8
-0.3
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775714
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7-Days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7-Days
Mated
23
20
05Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.9
6.3
8.0
0.8
0
MOB
0.8
-2.0
-0.3
0.6
0
JG
1.1
-2.2
-0.3
0.8
0
JG
1.2
-2.2
-0.3
0.9
0
JG
1.2
-2.1
-0.2
0.7
0
GL
1.6
-2.9
-0.3
1.1
0
JG
Equip ID
1125
1219
1512
295
1512
295
1512
295
1276
207
1512
295
Test Laboratory
TR#20757B, REV.1.1
54 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 109 ID# 2-15
File #:
20775715
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
8.4
8.5
6.9
6.6
7.3
7.5
8.8
6.0
8.6
8.7
8.8
8.7
8.9
8.7
8.9
8.8
8.8
7.9
7.6
6.8
8.4
8.6
8.6
8.3
6.6
-0.1
-0.3
1.3
-0.6
-0.8
0.7
-0.4
-1.0
0.1
-0.1
-0.2
-0.3
-0.4
-0.2
-0.3
-1.3
-1.2
-0.8
-0.9
-0.3
-0.2
-0.7
-0.4
-0.9
-1.0
24
40
27Nov07
MFG 7d
Unmated
-0.2
-0.2
1.6
-0.6
-0.3
0.0
-0.3
-0.6
-0.2
0.1
-0.3
-0.3
-0.4
-0.2
-0.3
-0.5
-0.3
-0.3
-0.6
-0.2
0.1
-0.3
-0.3
0.0
0.1
Test Laboratory
TR#20757B, REV.1.1
55 of 74
24
40
27Nov07
1X
-0.3
-0.3
1.4
0.9
0.6
0.9
-0.3
-0.6
-0.2
-0.1
-0.3
-0.4
-0.4
0.0
-0.4
-0.5
-0.3
-0.7
-0.6
-0.1
-0.2
-0.4
-0.4
0.0
1.7
23
20
05Dec07
MFG 7d
Mated
-0.3
-0.3
1.3
1.4
0.7
0.8
-0.4
-0.2
-0.2
-0.2
-0.4
-0.4
-0.4
-0.1
-0.4
-0.3
-0.3
-0.7
-0.4
-0.1
-0.1
-0.3
-0.4
0.0
1.6
23
20
06Dec07
1X
-0.2
-0.3
1.7
-0.5
-0.9
1.0
1.0
-0.7
0.0
0.0
-0.1
0.6
0.6
0.3
0.1
-0.2
-0.4
0.5
0.5
1.8
-1.7
0.2
-0.4
-0.1
1.6
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775715
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7d
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.9
6.0
8.1
0.9
0
MOB
1.3
-1.3
-0.4
0.6
0
JG
1.6
-0.6
-0.2
0.4
0
JG
1.7
-0.7
0.0
0.6
0
MHB
1.6
-0.7
0.0
0.6
0
JG
1.8
-1.7
0.2
0.8
0
JG
Equip ID
1125
1219
1512
295
295
1512
529
1047
1512
295
1512
295
Test Laboratory
TR#20757B, REV.1.1
56 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 109 ID# 2-16
File #:
20775716
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25X
7.6
8.7
9.9
5.4
9.0
6.8
9.1
9.1
9.0
9.2
9.8
9.1
9.7
8.9
9.2
8.4
8.6
9.6
7.3
7.9
8.8
8.5
8.7
8.5
8.6
0.4
-1.9
-3.3
-0.2
-1.0
-0.6
-1.9
-2.5
-2.5
-2.3
-1.7
-0.9
-1.4
-0.6
-0.9
-0.7
-1.3
-3.1
0.1
-1.8
-0.6
-0.6
-0.6
-0.4
-0.3
24
40
27Nov07
MFG 7 days
Unmated
0.4
-0.9
-2.5
0.0
-1.3
-0.4
-2.0
-3.0
-2.6
-2.5
-1.3
-0.9
-1.6
-0.3
-0.6
-0.1
-1.4
-2.6
0.2
-0.4
-0.6
-0.4
-0.7
-0.4
-0.3
Test Laboratory
TR#20757B, REV.1.1
57 of 74
24
40
27Nov07
1X
-0.8
-0.5
-1.8
0.2
-1.0
-0.5
-0.9
-1.8
-0.9
-1.2
-1.6
-1.0
-2.1
-0.5
-1.0
-0.2
-1.7
-2.9
0.3
-0.6
-0.7
-0.6
-0.6
-0.3
-0.3
23
20
05Dec07
MFG 7d
Mated
0.4
-0.6
-2.0
2.3
-1.2
-0.5
-0.9
-1.0
-0.9
-1.2
-1.7
-1.1
-1.7
-0.7
-0.9
-0.2
-0.4
-2.3
-0.6
-0.5
-1.0
-0.5
-0.7
-0.3
-0.3
23
20
06Dec07
1X
0.4
-0.4
-1.7
0.8
-1.1
-0.4
-2.3
-2.7
-2.7
-2.3
-0.7
-1.0
-1.6
0.5
-1.0
-0.2
-1.1
-3.0
-0.5
-0.5
-1.3
-0.5
-0.7
-0.3
-0.3
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775716
25
42
15Nov07
Initial
24
37
16Nov07
25X
24
40
27Nov07
MFG 7 days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
9.9
5.4
8.6
1.0
0
MOB
0.4
-3.3
-1.2
1.0
0
JG
0.4
-3.0
-1.0
1.0
0
JG
0.3
-2.9
-0.9
0.7
0
JG
2.3
-2.3
-0.7
0.9
0
JG
0.8
-3.0
-1.0
1.0
0
JG
Equip ID
1125
1219
1512
295
295
1512
295
1512
1512
295
1512
295
Test Laboratory
TR#20757B, REV.1.1
58 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 110 ID# 3-17
File #:
20775717
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
8.4
8.4
8.4
8.4
7.9
6.7
6.8
7.3
8.2
8.4
8.3
8.2
8.2
8.3
7.3
8.3
8.2
8.2
8.2
6.9
7.1
8.3
8.4
8.7
8.5
-0.2
-0.1
-0.1
-0.3
-1.4
-0.4
-0.4
0.5
-0.1
-0.2
-0.2
-0.2
-0.2
0.1
0.6
-0.1
0.1
0.0
0.1
0.0
1.0
-0.1
-0.2
-0.1
0.0
24
40
27Nov07
MFG 7-Days
Unmated
0.5
0.4
0.6
0.0
0.3
1.0
1.6
1.2
-0.1
-0.2
-0.2
0.2
0.0
-0.1
0.8
0.1
0.0
0.0
0.0
1.4
1.1
0.2
-0.2
0.3
0.0
Test Laboratory
TR#20757B, REV.1.1
59 of 74
24
40
27Nov07
1X
0.4
0.3
0.0
-0.2
0.3
-0.1
-0.1
1.0
-0.2
-0.2
-0.2
-0.1
-0.2
-0.1
0.4
0.0
0.0
0.0
0.1
0.4
1.1
0.5
-0.1
0.3
0.0
23
20
05Dec07
MFG 7d
Mated
0.3
-0.2
-0.1
-0.2
0.5
0.3
1.0
1.1
-0.1
-0.1
-0.2
-0.2
-0.2
-0.1
0.8
0.0
0.0
0.0
0.0
1.5
1.2
0.4
-0.1
0.1
0.2
23
20
06Dec07
1X
0.6
0.6
0.6
0.2
1.8
1.2
2.4
2.5
1.4
0.6
0.2
0.2
0.3
0.0
-0.1
0.4
0.5
0.2
1.0
1.6
1.9
2.2
0.5
0.3
0.3
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775717
25
42
15Nov07
Initial
24
37
16Nov07
25 X
24
40
27Nov07
MFG 7-Days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.7
6.7
8.0
0.6
0
MHB
1.0
-1.4
-0.1
0.4
0
MHB
1.6
-0.2
0.4
0.5
0.0
JG
1.1
-0.2
0.1
0.4
0
JG
1.5
-0.2
0.2
0.5
0
JG
2.5
-0.1
0.9
0.8
0
JG
Equip ID
529
1047
529
1047
295.0
1512.0
1512
295
1512
295
1512
295
Test Laboratory
TR#20757B, REV.1.1
60 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 110 ID# 3-18
File #:
20775718
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
6.6
7.3
8.4
8.6
8.5
6.5
8.4
8.4
8.4
8.4
8.4
8.8
8.4
7.8
8.2
8.5
8.5
8.5
8.9
8.5
8.2
8.2
8.4
7.0
8.3
-0.7
-0.7
-0.4
-0.4
-0.4
0.1
-0.2
-0.1
-0.2
-0.2
0.2
-1.4
-0.2
-0.1
-0.1
-0.2
-0.2
-0.2
-0.6
-0.1
-0.4
-0.2
-0.3
0.9
-0.3
24
40
27Nov07
MFG 7d
Unmated
0.1
0.3
0.2
-0.1
-0.3
0.4
0.1
-0.1
-0.2
0.3
0.2
-0.5
-0.2
-0.8
0.1
-0.2
-0.3
-0.3
-0.6
0.1
-0.2
-0.1
-0.2
0.7
-0.2
Test Laboratory
TR#20757B, REV.1.1
61 of 74
24
40
27Nov07
1X
-0.3
0.2
-0.1
-0.4
-0.1
0.6
0.0
-0.1
0.0
1.0
0.3
-0.6
-0.1
0.3
0.0
-0.1
-0.1
-0.1
-0.5
0.0
-0.2
-0.2
-0.2
0.9
-0.2
23
20
05Dec07
MFG 7d
Mated
0.2
0.8
-0.1
-0.2
-0.1
0.3
0.1
-0.1
0.0
0.7
0.2
-0.6
-0.1
-0.1
-0.1
-0.2
-0.2
-0.3
-0.6
0.2
-0.3
-0.1
-1.3
0.9
-0.2
23
20
06Dec07
1X
1.3
2.1
0.5
1.0
0.3
0.9
0.5
0.0
0.5
0.0
0.4
-0.4
0.0
0.5
0.0
-0.1
0.0
0.1
-0.6
0.8
-0.4
-0.8
-0.1
1.2
0.5
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775718
25
42
15Nov07
Initial
24
37
16Nov07
25 X
24
40
27Nov07
MFG 7d
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.9
6.5
8.2
0.6
0
MHB
0.9
-1.4
-0.3
0.4
0
MHB
0.7
-0.8
-0.1
0.3
0
JG
1.0
-0.6
0.0
0.4
0
JG
0.9
-1.3
0.0
0.5
0
JG
2.1
-0.8
0.3
0.6
0
JG
Equip ID
529
1047
529
1047
295
1512
295
1512
295
1512
295
1512
Test Laboratory
TR#20757B, REV.1.1
62 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 110 ID# 3-19
File #:
20775719
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
8.7
8.5
9.7
9.7
9.5
9.5
9.1
9.1
9.3
9.7
8.3
8.3
8.3
7.5
7.7
7.3
7.5
8.8
8.4
8.0
8.4
8.6
8.1
7.9
6.9
-1.8
-1.0
-1.1
-1.1
-0.9
-0.9
-0.3
-0.6
-0.6
-1.0
-1.2
-1.3
-1.1
-1.0
-1.2
-0.8
-0.1
-0.5
-0.1
0.4
-0.1
-0.4
0.2
-0.6
-0.6
24
40
27Nov07
MFG 7-Days
Unmated
-0.2
-1.2
-1.2
-0.8
-0.7
-2.3
-0.2
0.4
-0.2
-0.1
-0.7
-0.3
0.7
0.7
-0.4
-0.1
1.0
-0.4
0.1
1.0
0.3
0.0
0.3
0.2
-0.2
Test Laboratory
TR#20757B, REV.1.1
63 of 74
24
40
27Nov07
1X
-0.3
-0.6
-1.2
-1.0
-0.8
-0.8
-0.3
-0.4
-0.6
-1.6
-0.9
-1.0
0.0
0.1
-0.9
-0.7
0.9
-0.5
0.3
0.9
0.0
-0.2
-2.1
-0.2
-0.2
23
20
05Dec07
MFG 7d
Mated
-0.3
0.1
-1.1
-1.1
-1.0
-0.8
-0.3
-0.4
-0.8
-0.9
-0.7
-1.2
-0.1
-0.2
-1.2
-0.7
0.8
-0.5
0.1
0.7
-0.1
-0.4
0.1
-1.1
-0.5
23
20
06Dec07
1X
0.4
0.0
0.8
-0.8
-0.7
-0.2
-0.4
0.0
0.3
0.3
-0.6
-0.5
0.6
0.3
-0.1
-0.6
1.6
-0.5
1.0
1.8
-0.1
0.3
0.3
-0.8
1.7
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775719
25
42
15Nov07
Initial
24
37
16Nov07
25 X
24
40
27Nov07
MFG 7-Days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
9.7
6.9
8.5
0.8
0
MHB
0.4
-1.8
-0.7
0.5
0
MHB
1.0
-2.3
-0.2
0.7
0
JG
0.9
-2.1
-0.5
0.7
0
JG
0.8
-1.2
-0.5
0.6
0
JG
1.8
-0.8
0.2
0.8
0
JG
Equip ID
529
1047
529
1047
295
1512
295
1512
295
1512
295
1512
Test Laboratory
TR#20757B, REV.1.1
64 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 110 ID# 3-20
File #:
20775720
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
8.4
6.7
8.2
8.5
8.3
7.2
7.3
8.6
8.7
8.8
9.0
8.7
8.6
8.7
8.6
8.7
8.5
8.6
7.2
9.0
8.7
8.7
8.8
9.9
9.2
-0.1
0.1
-0.2
-0.4
-0.2
0.2
-0.6
-0.6
-0.4
-0.5
-0.7
-0.4
-0.4
-0.5
-0.3
-0.3
-0.1
-0.2
-0.5
-0.3
-0.2
-0.3
-0.3
-1.3
-0.7
24
40
27Nov07
MFG 7d
Unmated
1.0
0.7
0.7
-0.1
0.1
0.6
1.1
-0.7
-0.3
-0.2
-0.4
-0.3
-0.1
-0.2
0.3
0.0
0.0
0.3
0.6
-0.3
0.4
0.0
-0.3
-1.3
-0.6
Test Laboratory
TR#20757B, REV.1.1
65 of 74
24
40
27Nov07
1X
0.6
1.6
0.7
-0.3
-0.5
1.0
0.7
1.0
-0.3
-0.1
-0.5
-0.3
-0.3
-0.3
0.5
-0.1
0.0
0.0
-0.1
-0.1
0.1
-0.2
-0.4
-2.3
-0.6
23
20
05Dec07
MFG 7d
Mated
0.5
1.5
0.1
-0.3
-0.1
0.5
0.5
0.1
-0.5
-0.4
-0.5
-0.4
-0.3
-0.4
0.1
0.0
0.2
0.0
0.1
-0.2
0.4
0.1
-0.1
-0.5
-0.4
23
20
06Dec07
1X
1.5
3.2
0.2
0.0
0.4
1.0
1.5
0.7
-0.2
0.3
-0.2
-0.1
-0.2
0.1
2.3
0.4
0.5
-0.1
-0.3
0.2
0.7
0.0
0.0
-0.7
-0.3
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775720
25
42
15Nov07
Initial
24
37
16Nov07
25 X
24
40
27Nov07
MFG 7d
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
9.9
6.7
8.5
0.7
0
MHB
0.2
-1.3
-0.4
0.3
0
MHB
1.1
-1.3
0.0
0.6
0
JG
1.6
-2.3
0.0
0.7
0
JG
1.5
-0.5
0.0
0.5
0
JG
3.2
-0.7
0.4
0.9
0
JG
Equip ID
529
1047
529
1047
295
1512
295
1512
295
1512
1512
295
Test Laboratory
TR#20757B, REV.1.1
66 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 110 ID# 3-21
File #:
20775721
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
8.1
7.0
7.4
6.1
8.3
8.7
8.5
8.4
8.7
8.5
8.4
8.5
8.1
7.7
7.6
8.2
8.4
8.3
7.1
8.8
8.2
8.6
7.7
7.8
8.7
-0.3
-0.3
0.8
1.1
-0.2
-0.4
-0.2
-0.2
-0.4
-0.4
-0.2
-0.3
-0.6
-0.7
-0.2
0.0
-0.2
-0.1
1.1
-0.4
-0.1
-0.4
0.5
0.4
-0.4
24
40
27Nov07
MFG 7 days
unmated
-1.6
0.3
0.9
-0.4
0.0
0.3
0.0
0.2
0.2
-0.1
-0.1
0.6
-0.7
0.6
-0.3
0.6
0.7
0.1
1.2
-0.4
-0.1
-0.2
0.5
0.3
-0.6
Test Laboratory
TR#20757B, REV.1.1
67 of 74
24
40
27Nov07
1X
-0.9
-0.2
0.5
-0.5
-0.2
-0.1
0.2
-0.1
0.1
-0.3
0.3
-0.3
-0.4
0.7
0.5
0.1
0.2
0.2
1.2
-0.3
-0.1
-0.1
0.4
0.4
-0.5
23
20
05Dec07
MFG 7 days
Mated
0.1
0.5
0.8
1.3
0.0
0.0
-0.1
-0.1
-0.5
-0.4
-0.1
-0.4
0.1
0.5
0.9
0.5
1.5
0.9
1.9
-0.3
0.4
0.7
0.7
-0.3
0.0
23
20
05Dec07
1X
-1.7
0.0
0.7
0.8
-0.2
0.8
0.1
0.6
0.2
-0.2
0.2
0.3
-0.4
1.4
0.8
1.2
0.7
1.9
1.8
0.4
-0.4
-1.3
1.4
0.8
0.1
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775721
25
42
15Nov07
Initial
24
37
16Nov07
25 X
24
40
27Nov07
MFG 7 days
unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7 days
Mated
23
20
05Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.8
6.1
8.1
0.7
0
MHB
1.1
-0.7
-0.1
0.5
0
MHB
1.2
-1.6
0.1
0.6
0
JG
1.2
-0.9
0.0
0.5
0
MHB
1.9
-0.5
0.3
0.6
0
GL
1.9
-1.7
0.4
0.9
0
JG
Equip ID
529
1047
529
1047
295
1512
529
1047
1276
207
1512
295
Test Laboratory
TR#20757B, REV.1.1
68 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 110 ID# 3-22
File #:
20775722
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
8.4
8.2
8.2
8.3
8.1
7.7
7.8
7.6
7.3
8.3
8.2
8.3
8.3
8.7
8.4
8.2
8.3
7.7
6.7
8.6
8.0
8.1
8.2
8.2
8.2
-2.3
-0.1
-0.2
-0.2
0.0
-1.5
0.3
0.3
0.9
-0.2
-0.1
-0.2
-0.2
-0.5
-0.1
-0.1
-0.1
0.4
-0.4
-0.5
-0.1
-0.1
-0.1
-0.2
-0.2
24
40
27Nov07
MFG 7-Days
Unmated
-2.1
-0.8
0.1
0.1
0.2
-1.6
0.7
1.2
1.1
0.1
0.3
0.5
0.4
-0.1
0.1
1.0
-0.1
0.5
1.3
-0.3
0.3
0.1
0.6
0.3
0.0
Test Laboratory
TR#20757B, REV.1.1
69 of 74
24
40
27Nov07
1X
-2.4
0.1
0.1
-0.1
0.1
-1.9
-1.0
-0.4
1.0
-0.3
0.0
0.5
0.0
-0.6
-0.2
0.5
1.4
0.4
1.0
-0.4
0.2
0.2
0.4
0.1
0.2
23
20
05Dec07
MFG 7d
Mated
-2.1
0.1
0.0
-0.2
0.2
-1.6
-0.1
0.8
-0.2
-0.2
-0.1
-0.1
-0.1
-0.5
0.5
0.1
-0.1
0.0
1.2
0.5
0.3
0.2
0.3
0.1
0.8
23
20
06Dec07
1X
-2.3
-1.4
-0.1
0.1
0.1
-1.4
0.4
1.7
3.8
0.3
1.0
1.1
0.1
-0.4
0.4
1.5
0.2
1.1
1.1
0.4
0.2
0.1
0.3
0.1
0.0
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775722
25
42
15Nov07
Initial
24
37
16Nov07
25 X
24
40
27Nov07
MFG 7-Days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.7
6.7
8.1
0.4
0
MHB
0.9
-2.3
-0.2
0.6
0
MHB
1.3
-2.1
0.2
0.8
0
JG
1.4
-2.4
0.0
0.8
0
JG
1.2
-2.1
0.0
0.7
0.0
JG
3.8
-2.3
0.3
1.1
0.0
JG
Equip ID
529
1047
529
1047
295
1512
295
1512
295
1512
295
1512
Test Laboratory
TR#20757B, REV.1.1
70 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Subgroup:
Spec: EIA 364, TP23
CRI 110 ID# 3-23
File #:
20775723
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
8.9
8.7
8.7
8.6
7.7
8.6
8.6
8.6
8.5
8.7
8.5
8.3
8.2
7.5
7.0
8.5
8.8
8.5
7.7
6.7
8.5
8.6
8.6
7.2
6.2
-0.4
-0.3
-0.3
-0.2
-0.1
-0.2
-0.2
-0.2
-0.2
-0.4
-0.3
0.0
0.1
0.7
-0.3
-0.3
-0.4
-0.2
0.6
1.0
-0.2
-0.2
-0.2
1.1
-0.2
24
40
27Nov07
MFG 7-Days
Unmated
0.0
0.2
-0.6
-0.2
0.7
-0.1
0.0
-0.1
-0.1
-0.4
0.1
0.1
0.4
1.3
1.5
-0.1
-0.3
-0.1
1.0
1.9
0.4
0.0
-0.2
1.0
2.1
Test Laboratory
TR#20757B, REV.1.1
71 of 74
24
40
27Nov07
1X
-0.1
0.0
0.0
-0.3
0.2
0.0
0.0
-0.1
-0.1
-0.4
-0.1
0.0
0.2
0.8
0.1
-0.1
-0.3
0.0
1.1
0.7
-0.2
-0.4
-0.2
1.2
0.5
23
20
05Dec07
MFG 7d
Mated
-0.4
-0.2
-0.3
-0.6
0.2
0.0
0.3
-0.1
-0.1
-0.4
-0.2
0.1
0.4
1.0
-0.1
-0.1
-0.4
-0.1
0.9
1.1
0.0
-0.1
-0.2
1.2
0.3
23
20
06Dec07
1X
0.4
1.1
0.3
0.8
1.6
0.7
0.8
0.0
0.3
-0.2
0.6
-1.2
0.1
0.8
-0.2
0.1
-0.2
0.4
1.0
1.4
0.0
0.0
0.3
1.6
0.3
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
25
42
15Nov07
Initial
24
37
16Nov07
25 X
MAX
MIN
AVG
STD
Open
Tech
8.9
6.2
8.2
0.7
0
MHB
Equip ID
529
1047
24
40
27Nov07
1X
23
20
05Dec07
MFG 7d
Mated
23
20
06Dec07
1X
1.1
-0.4
0.0
0.4
0
MHB
24
40
27Nov07
MFG 7-Days
Unmated
2.1
-0.6
0.4
0.7
0
0
JG
1.2
-0.4
0.1
0.4
0.0
JG
1.2
-0.6
0.1
0.5
0
JG
1.6
-1.2
0.4
0.6
0
JG
529
1047
295
1512
295.0
1512.0
295
1512
295
1512
Test Laboratory
TR#20757B, REV.1.1
20775723
72 of 74
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:
207757
Customer:
Samtec
Product:
SMM/TMM Connector
Description: Plt Thick
Au 30
Open circuit voltage:
20mv
Spec: EIA 364, TP23
Subgroup: CRI 110 ID# 3-24
File #:
20775724
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
25
42
15Nov07
Initial
24
37
16Nov07
25 X
8.9
8.7
8.7
8.6
7.9
8.6
8.6
8.6
8.5
8.6
8.4
7.9
8.0
7.4
6.9
7.5
8.7
8.5
7.4
6.7
8.4
8.5
8.5
7.3
6.1
-0.4
-0.3
-0.1
-0.3
0.4
-2.5
-2.2
-0.4
-0.5
-0.5
-0.3
0.2
0.1
0.7
1.3
0.7
-1.3
-1.0
-0.8
0.1
-0.2
-0.3
-0.1
1.1
2.1
24
40
27Nov07
MFG 7-Days
Unmated
-0.2
0.2
0.1
-0.3
0.3
-0.7
-0.3
-0.3
-0.2
-0.1
0.0
0.3
0.3
1.0
1.7
0.8
-1.5
-0.9
-0.1
1.3
0.1
-0.1
0.0
1.3
2.2
Test Laboratory
TR#20757B, REV.1.1
73 of 74
24
40
27Nov07
1X
-0.3
-0.3
0.0
-0.9
0.3
-1.7
-1.5
-0.3
-0.4
-0.2
-0.3
0.3
0.4
0.8
1.5
0.8
-0.8
-0.8
0.8
2.0
0.1
-0.2
-0.2
1.0
2.2
23
20
05Dec07
MFG 7-Days
Mated
-0.3
-0.4
0.0
-0.3
0.2
-1.6
-1.6
-0.4
-0.4
-0.4
-0.3
0.4
0.5
0.8
1.5
0.8
-1.2
-0.7
0.2
1.9
0.0
0.0
-0.1
1.2
2.5
23
20
05Dec07
1X
1.0
-0.3
0.7
0.2
0.3
-1.2
-2.1
-1.4
-0.4
-0.2
-0.2
0.3
0.5
1.1
1.3
0.8
-0.8
0.3
0.2
1.9
-0.5
-0.1
-0.1
0.1
2.4
Contech Research
An Independent Test and Research Laboratory
File #:
Temp ºC
R.H. %
Date:
Pos. ID
20775724
25
42
15Nov07
Initial
24
37
16Nov07
25 X
24
40
27Nov07
MFG 7-Days
Unmated
24
40
27Nov07
1X
23
20
05Dec07
MFG 7-Days
Mated
23
20
05Dec07
1X
MAX
MIN
AVG
STD
Open
Tech
8.9
6.1
8.1
0.7
0
MHB
2.1
-2.5
-0.2
1.0
0
MHB
2.2
-1.5
0.2
0.8
0
JG
2.2
-1.7
0.1
1.0
0
JG
2.5
-1.6
0.1
1.0
0
GL
2.4
-2.1
0.2
1.0
0
JG
Equip ID
529
1047
529
1047
295
1512
1512
295
1276
207
1512
295
Test Laboratory
TR#20757B, REV.1.1
74 of 74
Contech Research
An Independent Test and Research Laboratory