DECEMBER 30, 2002

MAY 15, 2008
TEST REPORT #208131 REVISION. 1.1
QUALIFICATION TESTING
MTCA–085-02-S-DV
CONNECTOR SERIES
MTCA
SAMTEC, INC.
APPROVED BY: DOMINIC ARPINO
PROGRAM MANAGER
CONTECH RESEARCH, INC.
Test Laboratory
Contech Research
An Independent Test and Research Laboratory
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
5/15/2008
1.0
Initial Issue
DA
8/18/2008
1.1
-Editorial Changes.
-Replaced Sequence B data with
retest data.
DA/
TP
Test Laboratory
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CERTIFICATION
This is to certify that the MPTC connector series evaluation
described herein was designed and executed by personnel of
Contech Research, Inc. It was performed with the concurrence
of Samtec, Inc. of New Albany, IN who was the test sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1,
ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
Dominic Arpino
Program Manager
Contech Research, Inc.
DA:cf
Test Laboratory
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SCOPE
To perform qualification testing on the MPTC connector series
as manufactured and submitted by the test sponsor Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Samtec Specifications:
3.
Standards: EIA Publication 364
MTCA Test Plan
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
a)
2.
Description
Part Number
MTCA Connector
MTCA-085-02-S-DV
Test samples were supplied assembled and terminated to test
boards by the test sponsor. Specific test boards were
designed for the following tests:
- IR/DWV
- LLCR
- Nanosecond Event Detection
3.
The test samples for vibration and mechanical shock were
prepared by terminating positions in series for monitoring
contact events during vibration and/or shock.
4.
Unless otherwise specified in the test procedures used, no
further preparation was used.
Test Laboratory
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An Independent Test and Research Laboratory
TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #1, for test sequences
used.
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner,
which remained legible for the test duration.
2.
The test samples were coded in the following manner:
Seq a:
Seq b:
Group
Group
Group
Group
Group
A
B1
B2
B3
A
Seq c:
Group A
Seq d:
Group A
–
-
A-A-1, A-A-2
A-B1-1, A-B1-2
A-B2-1, A-B2-2
A-B3-1, A-B3-2
B-A-1, B-A-2, B-A-3, B-A-4, B-A-5, B-A-6,
B-A-7, B-A-8
- C-A-1, C-A-2, C-A-3, C-A-4, C-A-5, C-A-6,
C-A-7, C-A-8
- D-A-1, D-A-2, D-A-3
Sample ID Key
Board number
Group
Sequence
Test Laboratory
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FIGURE #1
TEST PLAN FLOW DIAGRAM
SAMPLE PREPARATION
Seq. a
IR
DWV
Thermal
Shock
Seq. b
Seq. c
Thermal Humidity LLCR
LLCR
Shock
Durability.
DWV
IR
DWV
LLCR
|
Thermal
Shock
Seq. d
Mech.
Shock
50 Nanosecond
Monitoring
Mech.
Shock
Random
Vibration
50 Nanosecond
Monitoring
LLCR
Humidity
LLCR
Random
Vibration
IR
Cyclic
Humidity
LLCR
LLCR
Group
A
IR
:
DWV :
LLCR :
Group
B1
Group
B2
Group
B3
Group
A
Group
A
Group
A
Insulation Resistance
Dielectric Withstanding Voltage
Low Level Circuit Resistance
Test Laboratory
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Contech Research
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DATA SUMMARY
MTCA-085-02-S-DV CONNECTOR DATA
TEST
REQUIREMENT
RESULTS
1000 Megohms Min.
No Damage
1000 Megohms Min.
No Damage
1000 Megohms Min.
>50,000 Megohms
Passed
>50,000 Megohms
Passed
>50,000 Megohms
900 VAC - Mated
Passed
No Damage
900 VAC - Mated
Passed
Failed **
SEQUENCE a
GROUP A
Insulation Resistance
Thermal Shock
Insulation Resistance
Cyclic Humidity
Insulation Resistance
GROUP B1
DWV
GROUP B2
Thermal Shock
DWV
** Samples were re-tested in the unmated condition and all
samples passed the specified requirement.
GROUP B3
Cyclic Humidity
DWV
No Damage
900 VAC - Mated
Passed
Failed **
** Samples were re-tested in the unmated condition and all
samples passed the specified requirement.
SEQUENCE b
GROUP A1
LLCR
Durability
LLCR
Thermal Shock
LLCR
Cyclic Humidity
LLCR
Record
No Damage
+10.0 mΩ Max.Chg.
No Damage
+10.0 mΩ Max.Chg.
No Damage
+10.0 mΩ Max.Chg.
15.7 mΩ Max
Passed
+0.5 mΩ Max.Chg.
Passed
+1.3 mΩ Max.Chg.
Passed
+1.6 mΩ Max.Chg.
.
Test Laboratory
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DATA SUMMARY – continued
TEST
REQUIREMENT
RESULTS
SEQUENCE c
GROUP A
LLCR
Mechanical Shock
LLCR
Random Vibration
LLCR
Record
No Damage
+10.0 mΩ Max.Chg.
No Damage
+10.0 mΩ Max.Chg.
21.4 mΩ Max
Passed
+3.0 mΩ Max.Chg.
Passed
+1.6 mΩ Max.Chg.
SEQUENCE d
GROUP A
Mechanical Shock
Random Vibration
No
50
No
50
Damage
Nanosecond
Damage
Nanosecond
Passed
Passed
Passed
Passed
Test Laboratory
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EQUIPMENT LIST
ID#
18
95
244
282
295
321
340
466
518
553
874
1032
1047
1231
1248
1345
1351
1363
1366
1367
1368
1457
1474
1549
1550
1564
Next Cal
Last Cal
11/8/2008
10/5/2008
11/8/2007
10/5/2007
10/16/2008
3/12/2009
10/16/2007
3/12/2008
8/1/2008
8/1/2007
2/11/2009
2/11/2008
12/3/2008
12/3/2007
3/25/2009
12/26/2008
3/25/2008
12/26/2007
12/15/2008
12/14/2008
12/15/2007
12/14/2007
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Cal
Bench Oven
AC Hypot
Micro-Ohm Meter
Vibration Shaker Table
Micro-Ohm Meter
AC-DC Hipot/Megometer
X-Y Table
Precision Resistor
Computer
12 channel Power Unit
Computer
Computer
Microohm Meter
Temp-humid-Chamber
Power Condtioner
Drill Press Stand
Polisher
Temp Humid Chamber
Main Frame
Interface
Sine/Rnd Control digitizer
Precision Resistor
Vib Pwr Amp
Multiplexer Card
Multiplexer Card
computer
Blue M Co.
Peschell Instr.
Keithley Instr.
Ling Dynamics
Keithley Instr.
Hipotronics Co.
NE Affiliated Tech.
Victoreen Co.
ARC Elect.
PCB Co.
M&P
Magitronic
Keithley
Blue M.
APC Co.
Milescraft
General Elect
Blue M
Aiglent H.P.
Aiglent H.P.
Aiglent H.P.
Victorine
tira
Keithley
Keithley
ARC CO
POM7-256C
P10*
580-1
V-730
580
H300B
XY-6060
50,000 mego
486-40
483A
Vectra
486DX4
580
FR-381B-MP
BP650S
5000
224
BTH-4 100-C
8408A
E8491A
E1432A
5KMOHM
A58312
7708
7708
71902
P38-1452
5570
467496
163
480781
DS16-201
N/A
N/A
N/A
1303
us75203327
100VL
0705731
FL-520
NB0040150658
N/A
N/A
±3%Full Scale
See Cal Cert
N/A
See Cal Cert
See Cal Cert
N/A
±1%
N/A
See Cal Cert
N/A
N/A
See Cal Cert
See Manual
N/A
N/A
N/A
See Cert
N/A
N/A
See Manual
See Cal Cert
N/A
See Cert
See Cert
N/A
Ea Test
12mon
12mon
N/A
12 mon.
12 mon.
N/A
12 mon.
N/A
12mon
N/A
N/A
12mon
Ea Test
N/A
N/A
N/A
Ea Test
N/A
N/A
12mon
12mon
N/A
See Cert
See Cert
N/A
US35470169
465
003/06
171629
171626
021260817
Contech Research
Test Laboratory
TR#208131, REV.1.1
BTH-140
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An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE A
Group A
MTCA SERIES
Test Laboratory
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Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 2 mated pairs
TECHNICIAN: S.Rath, RJC
-----------------------------------------------------------START DATE: 4/8/08
COMPLETE DATE: 5/7/08
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 28%
-----------------------------------------------------------EQUIPMENT ID#: 321, 466, 1457
-----------------------------------------------------------INSULATION RESISTANCE (IR)
PURPOSE:
To determine the resistance of insulation materials to leakage
of current through or on the surface of these materials when a
DC potential is applied.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 21.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
Between Adjacent Contacts
Between Rows
Mated Condition
Mounting Condition
Electrification Time
Test Voltage
:
:
:
:
:
:
No
Yes
Mated
Mounted
2.0 Minutes
500 VDC
3.
The test voltage was applied to designated test points
on the board.
4.
Insulation resistance was measured between the closest
adjacent contacts, which was between row to row.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, the insulation
resistance shall not be less than 1,000 megohms.
-----------------------------------------------------------RESULTS:
The insulation resistance exceeded 50,000 megohms.
Test Laboratory
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11 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 2 mated pairs
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 4/18/08
COMPLETE DATE: 4/23/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 32%
-----------------------------------------------------------EQUIPMENT ID#: 18, 1363
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles was performed continuously.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
5.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
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12 of 78
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage or
deterioration of the test samples so exposed.
2.
The insulation resistance shall exceed 1,000 megohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of visual or physical damage to the
test samples as tested.
2.
The insulation resistance exceeded 50,000 megohms.
Test Laboratory
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13 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 2 mated pairs
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 4/25/08
COMPLETE DATE:
5/5/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 28%
-----------------------------------------------------------EQUIPMENT ID#: 518, 1231, 1248, 1351, 1549, 1550
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
1.
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity
and heat conditions. Measurements made under
high humidity conditions may reflect the peculiar
conditions under which the readings were made, and should
be compared only to initial readings when careful analysis
indicates that such a comparison is valid and applicable.
2.
This test obtains added effectiveness in employment of
temperature cycling that provides a breathing action,
inducing corrosion processes, and the introduction of
moisture into partially sealed test samples. This
condition imposes a vapor pressure on the samples which
constitutes the major force behind the moisture migration
and penetration.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, Method III (omit Step 7a, 7b)
with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
Test Laboratory
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Contech Research
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PROCEDURE: –continued
3.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of
the test samples as tested.
2.
The final insulation resistance shall not be less than
1,000 megohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The final insulation resistance exceeded 50,000 megohms.
Test Laboratory
TR#208131, REV.1.1
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Contech Research
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TEST RESULTS
SEQUENCE A
Group B1
MTCA SERIES
Test Laboratory
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Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 2 mated pairs
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 4/24/08
COMPLETE DATE: 4/24/08
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 28%
-----------------------------------------------------------EQUIPMENT ID#: 95, 321
-----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL)
PURPOSE:
To determine if the connectors can operate at its rated voltage
and withstand momentary over potentials due to switching,
surges and other similar phenomenon.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 20.
2.
Test Conditions:
a) Between Adjacent Contacts
b) Between Rows
c) Mated Condition
d) Mounting Condition
e) Hold Time
f) Rate of Application
g) Test Voltage
:
:
:
:
:
:
:
No
Yes
Mated
Mounted
60 Seconds
500 volts/sec.
900 VAC
3.
The voltage was applied to specific test points on the
board.
4.
Dielectric withstanding voltage was measured between the
closest adjacent contacts which was between row to row.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, there shall be no
evidence of breakdown, arcing, etc.
-----------------------------------------------------------RESULTS: See Next Page
Test Laboratory
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17 of 78
Contech Research
An Independent Test and Research Laboratory
RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no evidence of arcing, breakdown, etc., when a
900 Vac voltage was applied.
3.
All test samples as tested met the requirements as
specified.
Test Laboratory
TR#208131, REV.1.1
18 of 78
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE A
Group B2
MTCA SERIES
Test Laboratory
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19 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 2 mated pairs
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 4/18/08
COMPLETE DATE: 4/24/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 28%
-----------------------------------------------------------EQUIPMENT ID#: 18, 321, 466, 1363, 1457
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85°C +3°C/-0°C
-55°C +0°C/-3°C
30 Minutes
Mated
Mounted
<5 minutes
3.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#208131, REV.1.1
20 of 78
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
When a 900 VAC test voltage is applied, there shall be no
evidence of arcing, breakdown, etc.
-----------------------------------------------------------RESULTS:
1
There was no evidence of physical damage to the test
samples as tested.
2.
There was evidence of breakdown when a 900 VAC voltage was
applied.
Comments:
a) Following discussions with the test sponsor, the sample
was retested in the unmated condition.
b) There was no evidence of arcing, breakdown, etc., when a
900 VAC voltage was applied.
Test Laboratory
TR#208131, REV.1.1
21 of 78
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE A
Group B3
MTCA SERIES
Test Laboratory
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22 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 2 mated pairs TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 4/25/08
COMPLETE DATE: 5/7/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#: 321, 466, 1231, 1457
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
1.
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity
and heat conditions. Measurements made under
high humidity conditions may reflect the peculiar
conditions under which the readings were made, and should
be compared only to initial readings when careful analysis
indicates that such a comparison is valid and applicable.
2.
This test obtains added effectiveness in employment of
temperature cycling that provides a breathing action,
inducing corrosion processes, and the introduction of
moisture into partially sealed test samples. This
condition imposes a vapor pressure on the samples which
constitutes the major force behind the moisture migration
and penetration.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31 Method III (omit Step 7a,7b),
with the following conditions.
-continued on next page.
Test Laboratory
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An Independent Test and Research Laboratory
PROCEDURE: –continued
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
3.
The final dielectric withstanding voltage test was
performed in accordance with EIA 364, Test Procedure 20
and the procedures as previously indicated.
4.
The voltage was applied to specific test points on the
board.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of
the test samples as tested.
2.
There shall be no evidence of arcing or breakdown when
a 900 VAC test voltage is applied.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2. There was evidence of breakdown when a 900 VAC voltage was
applied.
Comments:
a) Following discussions with the test sponsor, the sample
was retested in the unmated condition.
b) There was no evidence of arcing, breakdown, etc., when a
900 VAC voltage was applied.
Test Laboratory
TR#208131, REV.1.1
24 of 78
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE B
Group A1
MTCA SERIES
Test Laboratory
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An Independent Test and Research Laboratory
PROJECT NO.: 208350
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DH
-----------------------------------------------------------START DATE: 6/24/08
COMPLETE DATE: 6/24/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 44%
-----------------------------------------------------------EQUIPMENT ID#: 673, 681
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23, with the following conditions.
2.
Test Conditions:
a) Test Current
: 10 milliamps
b) Open Circuit Voltage
: 20 millivolts
c) No. of Positions Tested : 25 per test samples
-----------------------------------------------------------REQUIREMENTS: See Next Page
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REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCIUT RESISTANCE
(Milliohms)
Sample ID
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
2.
Avg.
11.5
11.5
11.7
11.7
12.1
12.0
12.0
12.4
Max.
14.1
14.3
14.7
15.5
15.7
15.3
15.6
15.5
Min.
6.4
6.2
6.4
6.2
6.4
6.5
6.5
6.6
See data files 20835001 through 208835008 for individual
data points.
Test Laboratory
TR#208131, REV.1.1
27 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208350
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: DH
-----------------------------------------------------------START DATE: 6/24/08
COMPLETE DATE: 6/25/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 44%
-----------------------------------------------------------EQUIPMENT ID#: 315, 673, 681, 1371
-----------------------------------------------------------DURABILITY
PURPOSE:
1.
This is a preconditioning sequence which is used to induce
the type of wear on the contacting surfaces which may occur
under normal service conditions. The connectors are mated
and unmated a predetermined number of cycles. Upon
completion, the units being evaluated are exposed to the
environments as specified to assess any impact on
electrical stability resulting from wear or other wear
dependent phenomenon.
2.
This type or preconditioning sequence is also used to
mechanically stress the connector system as would normally
occur in actual service. This sequence in conjunction with
other tests is used to determine if a significant loss of
contact pressure occurs from said stresses which in turn,
may result in an unstable electrical condition to exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 09.
2.
Test Conditions:
a) No. of Cycles : 100
b) Rate
: 500 cycles per hour
3.
The test samples were assembled to special holding devices
and attached to the manual cycling equipment.
Test Laboratory
TR#208131, REV.1.1
28 of 78
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: –continued
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples so tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCIUT RESISTANCE
(Milliohms)
Sample ID
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
3.
Avg.
Change
+0.1
+0.1
-0.5
-0.2
-0.4
-0.2
-0.4
-0.5
Min.
Change
+0.5
+0.4
+0.0
+0.1
+0.0
+0.1
-0.1
+0.2
See data files 20835001 through 20835008 for individual
data points.
Test Laboratory
TR#208131, REV.1.1
29 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208350
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 samples
TECHNICIAN: DH
-----------------------------------------------------------START DATE: 7/10/08
COMPLETE DATE: 7/18/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 42%
-----------------------------------------------------------EQUIPMENT ID#: 192, 673, 681, 1315, 1549, 1550
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85°C +3°C/-0°C
-55°C +0°C/-3°C
30 Minutes
Mated
Mounted
<5 minutes
3.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#208131, REV.1.1
30 of 78
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCIUT RESISTANCE
(Milliohms)
Sample ID
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
3.
Avg.
Change
+0.4
+0.1
+0.0
+0.0
-0.3
+0.3
+0.2
-0.6
Min.
Change
+0.8
+0.5
+1.3
+0.7
+0.2
+0.7
+1.3
+0.2
See data files 20835001 through 20835008 for individual
data points.
Test Laboratory
TR#208131, REV.1.1
31 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208350
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 samples
TECHNICIAN: DH
-----------------------------------------------------------START DATE:
7/18/08
COMPLETE DATE: 7/28/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 50%
-----------------------------------------------------------EQUIPMENT ID#: 236, 547, 681, 1315, 1549, 1550
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
To evaluate the impact on electrical stability of the contact
system when exposed to any environment which may generate
thermal/moisture type failure mechanisms such as:
a)
Fretting corrosion due to wear resulting from
micromotion, induced by thermal cycling. Humidity
accelerates the oxidation process.
b)
Oxidation of wear debris or from particulates from the
surrounding atmosphere which may have become entrapped
between the contacting surfaces.
c)
Failure mechanisms resulting from a wet oxidation
process.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, with the following conditions.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
:
50°C ± 5°C
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
Test Laboratory
TR#208131, REV.1.1
32 of 78
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: –continued
3.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of the
test samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCIUT RESISTANCE
(Milliohms)
Sample ID
B-A-1
B-A-2
B-A-3
B-A-4
B-A-5
B-A-6
B-A-7
B-A-8
3.
Avg.
Change
+0.4
+0.2
-0.2
+0.1
-0.2
+0.0
+0.1
-0.1
Min.
Change
+1.0
+0.9
+0.3
+0.9
+0.5
+0.7
+0.5
+1.6
See data files 20835001 through 20835008 for individual
data points.
Test Laboratory
TR#208131, REV.1.1
33 of 78
Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
DATA FILE NUMBERS
20835001
20835002
20835003
20835004
20835005
20835006
20835007
20835008
Test Laboratory
TR#208131, REV.1.1
34 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-1
Open circuit voltage:
20mV
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835001
Current:
Delta Values
Units: Milliohms
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.5
12.1
12.0
6.4
13.2
13.0
11.8
6.4
13.0
13.6
13.7
13.8
13.7
14.1
6.6
12.5
12.7
13.0
12.9
14.0
13.4
13.0
12.5
6.6
6.5
23
44
24Jun08
Durability
100X
0.2
0.5
0.5
0.1
-0.1
0.1
0.5
0.2
0.3
-0.2
-0.2
0.0
0.4
0.3
0.0
-0.3
-0.2
0.0
-0.1
-0.2
-0.2
0.0
0.1
-0.2
0.0
23
43
18Jul08
Thermal
Shock
0.3
0.8
0.8
0.3
0.2
0.4
0.6
0.3
0.5
0.4
0.4
0.4
0.6
0.5
0.3
0.4
0.0
0.0
0.4
0.4
0.4
0.6
0.6
0.3
0.2
23
50
28Jul08
Cyclic
Humidity
0.2
0.8
1.0
0.3
0.2
0.4
0.5
0.2
0.6
0.5
0.5
0.5
0.6
0.6
0.5
0.2
0.0
0.2
0.7
0.3
0.4
0.5
0.6
0.3
0.2
MAX
MIN
AVG
STD
Open
Tech
14.1
6.4
11.5
2.9
0
DH
0.5
-0.3
0.1
0.2
0
DH
0.8
0.0
0.4
0.2
0
DH
1.0
0.0
0.4
0.2
0
DH
Equip ID
673
681
673
681
673
681
236
681
100mA
Test Laboratory
TR#208131, REV.1.1
35 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-2
Open circuit voltage:
20mV
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835002
Current:
Delta Values
Units: Milliohms
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.3
12.2
12.1
6.3
13.4
13.2
11.8
6.2
13.1
13.3
13.9
13.9
14.1
14.3
6.3
12.8
12.4
13.3
12.8
14.2
13.5
12.7
12.5
6.2
6.3
23
44
24Jun08
Durability
100X
0.1
-0.1
0.2
0.1
0.3
0.2
0.2
0.1
-0.4
0.1
0.3
0.3
0.2
0.4
0.1
-0.2
0.0
-0.8
0.0
0.4
0.0
0.2
0.2
0.0
0.1
23
43
18Jul08
Thermal
Shock
0.2
0.2
0.4
0.1
0.2
0.3
0.4
0.1
-0.2
0.5
0.2
0.3
0.4
0.2
0.2
-0.2
-0.1
-0.6
0.0
0.4
0.2
0.2
0.2
0.1
0.1
23
50
28Jul08
Cyclic
Humidity
0.0
0.4
0.4
0.2
0.2
0.1
0.2
0.2
0.3
0.2
0.4
0.4
0.5
0.4
0.1
-0.3
0.0
0.0
0.0
0.9
0.2
0.1
0.3
0.2
0.2
MAX
MIN
AVG
STD
Open
Tech
14.3
6.2
11.5
3.1
0
DH
0.4
-0.8
0.1
0.3
0
DH
0.5
-0.6
0.1
0.2
0
DH
0.9
-0.3
0.2
0.2
0
DH
Equip ID
673
681
673
681
673
681
236
681
100mA
Test Laboratory
TR#208131, REV.1.1
36 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-3
Open circuit voltage:
20mV
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835003
Current:
Delta Values
Units: Milliohms
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.7
12.2
12.8
6.6
13.6
13.4
12.3
6.5
13.3
14.0
14.1
14.2
14.7
14.0
6.5
13.0
12.7
12.6
12.4
13.8
13.9
13.3
13.5
6.5
6.4
23
44
24Jun08
Durability
100X
-0.2
-0.3
-0.8
-0.1
-0.8
-0.6
-0.7
-0.1
-1.1
-1.3
-0.6
-0.6
-0.6
-0.3
0.0
-0.5
-0.6
-0.4
-0.4
-0.4
-0.4
-0.7
-1.2
-0.1
0.0
23
43
18Jul08
Thermal
Shock
0.3
1.3
0.5
0.2
0.4
0.2
0.1
0.3
-0.8
-0.9
-0.1
0.1
-0.3
0.1
0.1
-0.1
-0.2
-0.1
0.0
0.1
0.2
-0.1
-0.4
0.1
0.1
23
50
28Jul08
Cyclic
Humidity
0.2
-0.1
-0.4
0.3
-0.4
-0.5
-0.4
0.1
-0.4
-0.7
-0.3
-0.1
-0.2
0.0
0.0
-0.3
0.0
-0.4
-0.3
-0.3
-0.3
-0.3
-0.9
0.1
0.1
MAX
MIN
AVG
STD
Open
Tech
14.7
6.4
11.7
3.0
0
DH
0.0
-1.3
-0.5
0.3
0
DH
1.3
-0.9
0.0
0.4
0
DH
0.3
-0.9
-0.2
0.3
0
DH
Equip ID
673
681
673
681
673
681
236
681
100mA
Test Laboratory
TR#208131, REV.1.1
37 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-4
Open circuit voltage:
20mV
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835004
Current:
Delta Values
Units: Milliohms
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.4
12.1
12.9
6.4
13.2
13.6
11.9
6.3
12.7
13.7
13.9
14.8
15.5
14.4
6.2
13.3
13.0
13.0
12.3
14.3
13.8
13.3
12.9
6.4
6.3
23
44
24Jun08
Durability
100X
0.0
0.0
-0.4
0.0
-0.4
-0.6
0.0
0.0
-0.5
-0.5
-0.3
-0.4
-0.6
0.1
0.1
-0.3
-0.4
-0.7
-0.2
0.0
0.0
0.1
0.1
0.0
0.1
23
43
18Jul08
Thermal
Shock
0.1
0.2
0.3
0.1
0.2
-0.4
0.3
0.0
0.0
-0.1
-0.1
-0.2
-0.5
0.2
0.0
-0.4
-0.6
-0.6
0.0
0.4
0.0
0.7
0.2
0.1
0.1
23
50
28Jul08
Cyclic
Humidity
0.2
0.1
0.2
0.1
0.0
-0.4
0.0
0.0
0.3
-0.2
0.1
0.6
-0.6
0.9
0.2
-0.3
-0.4
-0.4
0.2
0.2
0.0
0.3
0.0
0.1
0.2
MAX
MIN
AVG
STD
Open
Tech
15.5
6.2
11.7
3.2
0
DH
0.1
-0.7
-0.2
0.3
0
DH
0.7
-0.6
0.0
0.3
0
DH
0.9
-0.6
0.1
0.3
0
DH
Equip ID
673
681
673
681
673
681
236
681
100mA
Test Laboratory
TR#208131, REV.1.1
38 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-5
Open circuit voltage:
20mV
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835005
Current:
Delta Values
Units: Milliohms
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.7
13.0
13.4
6.5
14.0
13.9
12.7
6.6
13.4
14.2
14.6
14.7
15.7
15.2
6.4
14.0
13.1
13.4
13.8
14.6
14.2
13.6
13.1
6.5
6.5
23
41
25Jun08
Durability
100X
-0.1
-0.5
-0.5
-0.2
-0.6
-0.4
-0.4
-0.1
-0.7
-0.7
-0.5
-0.2
-0.8
-0.6
-0.1
-0.8
-0.2
-0.5
-0.6
-0.1
-0.3
-0.3
-0.1
0.0
0.0
23
43
18Jul08
Thermal
Shock
0.1
0.1
0.1
0.1
-0.2
-0.4
-0.6
0.0
-0.8
-0.7
-0.5
-0.2
-0.8
-0.7
0.0
-0.9
-0.4
-0.5
-1.0
0.0
0.0
0.2
-0.1
0.0
0.0
23
50
28Jul08
Cyclic
Humidity
0.0
0.0
0.2
0.5
-0.1
-0.3
0.1
0.2
-0.1
-0.5
-0.4
-0.1
-0.6
-0.5
0.1
-0.7
-0.4
-0.6
-1.1
-0.1
-0.1
0.2
0.0
0.1
0.0
MAX
MIN
AVG
STD
Open
Tech
15.7
6.4
12.1
3.3
0
DH
0.0
-0.8
-0.4
0.3
0
DH
0.2
-1.0
-0.3
0.4
0
DH
0.5
-1.1
-0.2
0.4
0
DH
Equip ID
673
681
673
681
673
681
236
681
100mA
Test Laboratory
TR#208131, REV.1.1
39 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-6
Open circuit voltage:
20mV
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835006
Current:
Delta Values
Units: Milliohms
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.6
13.3
12.7
6.6
13.6
14.5
12.9
6.6
12.9
13.5
15.0
15.3
14.7
15.2
6.6
13.0
12.8
12.7
12.7
14.5
14.8
13.3
13.0
6.5
6.5
23
41
25Jun08
Durability
100X
0.1
-0.2
-0.1
-0.2
-0.3
-0.6
-0.3
-0.2
-0.3
-0.3
-0.2
-0.3
-0.1
-0.2
-0.1
-0.1
-0.2
0.0
0.0
-0.3
-0.4
-0.2
-0.2
0.0
0.0
23
43
18Jul08
Thermal
Shock
0.1
-0.2
0.7
0.1
0.6
0.0
0.6
0.1
0.6
0.5
0.1
-0.2
0.5
0.2
0.1
0.0
0.5
0.3
0.2
0.3
0.6
0.5
0.7
0.2
0.2
23
50
28Jul08
Cyclic
Humidity
0.1
-0.2
0.0
-0.1
-0.1
-0.5
0.7
0.0
0.0
0.0
0.0
-0.2
0.2
-0.2
0.0
-0.2
-0.3
0.2
0.1
-0.3
-0.4
0.0
0.0
0.0
0.0
MAX
MIN
AVG
STD
Open
Tech
15.3
6.5
12.0
3.2
0
DH
0.1
-0.6
-0.2
0.1
0
DH
0.7
-0.2
0.3
0.3
0
DH
0.7
-0.5
0.0
0.2
0
DH
Equip ID
673
681
673
681
673
681
236
681
100mA
Test Laboratory
TR#208131, REV.1.1
40 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-7
Open circuit voltage:
20mV
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835007
Current:
Delta Values
Units: Milliohms
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.5
12.6
12.5
6.5
13.3
13.6
13.0
6.5
13.6
14.2
14.7
14.6
15.6
15.0
6.6
13.4
13.2
13.5
13.3
14.3
14.5
13.4
13.1
6.6
6.6
23
41
25Jun08
Durability
100X
-0.1
-0.1
-0.2
-0.2
-0.2
-0.1
-0.6
-0.1
-0.7
-1.0
-0.7
-0.4
-1.2
-0.7
-0.2
-0.3
-0.6
-0.5
-0.7
-0.2
-0.6
-0.5
-0.5
-0.2
-0.1
23
43
18Jul08
Thermal
Shock
-0.1
0.1
0.2
0.0
1.3
1.0
0.3
0.4
0.8
-0.2
0.2
0.6
-0.2
0.2
0.0
0.1
0.3
-0.3
-0.2
0.4
0.0
0.3
0.1
0.1
0.2
23
50
28Jul08
Cyclic
Humidity
0.1
0.2
0.3
0.2
0.5
0.1
-0.3
0.2
-0.3
-0.2
0.1
0.5
-0.5
0.1
0.1
-0.2
0.3
0.0
-0.1
0.3
0.0
0.3
0.1
0.1
0.1
MAX
MIN
AVG
STD
Open
Tech
15.6
6.5
12.0
3.2
0
DH
-0.1
-1.2
-0.4
0.3
0
DH
1.3
-0.3
0.2
0.4
0
DH
0.5
-0.5
0.1
0.2
0
DH
Equip ID
673
681
673
681
673
681
236
681
100mA
Test Laboratory
TR#208131, REV.1.1
41 of 78
Contech Research
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project: 208350
Customer: Samtec
Product: Series MTCA connector
Description: Sample ID: B-A-8
Open circuit voltage:
20mV
Spec: EIA 364, TP 23
Subgroup: Seq. B
File No: 20835008
Current:
100mA
Delta Values
Units: Milliohms
Temp ºC
R.H. %
Date:
Pos. ID
23
44
24Jun08
Initial
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
6.9
12.5
13.8
6.6
14.9
14.0
13.0
6.6
13.8
14.6
14.9
15.3
15.5
15.2
6.6
13.8
13.9
14.1
14.0
15.3
14.0
14.0
13.9
6.7
6.8
23
41
25Jun08
Durability
100X
0.1
-0.1
-0.8
-0.1
-1.0
-0.3
-0.6
0.2
-1.0
-1.2
-0.5
-0.4
-0.6
-0.2
0.0
-0.8
-0.8
-1.2
-1.0
-0.2
-0.2
-0.5
-0.8
0.0
-0.1
23
43
18Jul08
Thermal
Shock
0.0
0.0
-0.9
-0.1
-1.1
-0.3
-0.8
0.2
-0.7
-1.0
-0.7
-0.7
-0.7
-0.2
-0.1
-0.8
-1.1
-1.2
-1.1
-0.9
-0.1
-0.6
-0.8
0.0
-0.1
23
50
28Jul08
Cyclic
Humidity
0.4
0.3
-0.8
0.0
-0.7
-0.1
-0.2
0.2
0.3
-0.4
-0.2
0.0
0.0
0.4
0.2
-0.1
-0.5
-0.6
-0.4
-0.7
-0.1
-0.1
-0.4
1.6
0.1
MAX
MIN
AVG
STD
Open
Tech
15.5
6.6
12.4
3.4
0
DH
0.2
-1.2
-0.5
0.4
0
DH
0.2
-1.2
-0.6
0.4
0
DH
1.6
-0.8
-0.1
0.5
0
DH
Equip ID
673
681
673
681
673
681
236
681
Test Laboratory
TR#208131, REV.1.1
42 of 78
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE C
Group A
MTCA SERIES
Test Laboratory
TR#208131, REV.1.1
43 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 samples
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 3/26/08
COMPLETE DATE: 3/26/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 22%
-----------------------------------------------------------EQUIPMENT ID#: 244, 1032
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 23, with the following conditions.
2.
Test Conditions:
a) Test Current
: 10 milliamps
b) Open Circuit Voltage
: 20 millivolts
c) No. of Positions Tested : 25 per test sample
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#208131, REV.1.1
44 of 78
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCIUT RESISTANCE
(Milliohms)
Sample ID
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
2.
Avg.
14.6
14.8
14.2
14.8
14.1
14.6
15.1
14.0
Max.
20.4
21.1
20.3
21.4
19.0
20.2
21.3
19.2
Min.
7.2
7.2
7.0
7.3
7.1
7.4
7.3
7.0
See data files 20813109 through 20813116 for individual
data points.
Test Laboratory
TR#208131, REV.1.1
45 of 78
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 samples
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 4/15/08
COMPLETE DATE: 4/16/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 22%
-----------------------------------------------------------EQUIPMENT ID#: 282, 553, 874, 1032, 1047, 1366, 1367, 1368,
1474
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity of
connectors for use with electronic equipment subjected to shocks
such as those expected from handling, transportation, etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 27.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Half-Sine
11.3 feet per second
3 Shocks/Direction, 3 Axis (18 Total)
3.
A stabilizing medium was used to maintain the mechanical
stability of the samples during test.
4.
Figure #3 through #5 illustrates the test sample fixturing
utilized during the test.
5.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#208131, REV.1.1
46 of 78
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not
exceed +10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCIUT RESISTANCE
(Milliohms)
Sample ID
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
Avg.
Change
+0.2
-0.1
+0.2
+0.0
+0.3
-0.1
+1.0
+0.2
Min.
Change
+0.7
+0.2
+0.7
+2.4
+1.0
+0.9
+3.0
+0.6
3.
See data files 20813109 through 20813116 for individual
data points.
4.
The Mechanical Shock characteristics are shown in Figures
#6 (Calibration Pulse) and #7 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#208131, REV.1.1
47 of 78
Contech Research
An Independent Test and Research Laboratory
FIGURE #3
Test Laboratory
TR#208131, REV.1.1
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Contech Research
An Independent Test and Research Laboratory
FIGURE #4
Test Laboratory
TR#208131, REV.1.1
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Contech Research
An Independent Test and Research Laboratory
FIGURE #5
Test Laboratory
TR#208131, REV.1.1
50 of 78
Contech Research
An Independent Test and Research Laboratory
FIGURE #6
Channel 5
Classical Shock
[g]
160
140
Project:208131
Samtec
Cal Wave 1
Tech: S.Rath
Date:04-15-08
100 G 6mS
half-sine
UPPER LIMIT------
120
ACTUAL PULSE-----
ACCELERATION (g)
100
80
60
40
20
0
-20
-40
-60
LOWER LIMIT-----
-80
-100
0.20
0.21
0.22
0.23
0.24
0.25
0.26
0.27
DURATION (Seconds)
0.29
0.30
[s]
Contech Research
Test Laboratory
TR#208131, REV.1.1
0.28
51 of 78
An Independent Test and Research Laboratory
FIGURE #7
Channel 5
Classical Shock
[g]
160
140
Project:208131
Samtec
Actual Wave
Tech: S.Rath
Date:04-15-08
100 G 6mS
half-sine
UPPER LIMIT------
120
ACTUAL PULSE-----
ACCELERATION (g)
100
80
60
40
20
0
-20
-40
-60
LOWER LIMIT-----
-80
-100
0.20
0.21
0.22
0.23
0.24
0.25
0.26
0.27
DURATION (Seconds)
0.29
0.30
[s]
Contech Research
Test Laboratory
TR#208131, REV.1.1
0.28
52 of 78
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 samples
TECHNICIAN: S.Rath
-----------------------------------------------------------START DATE: 4/16/08
COMPLETE DATE: 4/17/08
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 282, 553, 874, 1032, 1047,1366, 1367, 1368,
1474
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if the electrical stability of the system has
degraded when exposed to a vibratory environment.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a) G ’RMS’
b) Frequency
c) Duration
:
:
:
7.56
50 to 2000 Hz
2.0 hours per axis, 3 axis total
3.
A stabilizing medium was used to maintain the mechanical
stability of the samples during test.
4.
Figure #’s 3 through 5 illustrate the test sample fixturing
utilized during the test.
5.
All subsequent variable testing was performed in accordance
with procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#208131, REV.1.1
Contech Research
53 of 78
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCIUT RESISTANCE
(Milliohms)
Sample ID
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
3.
Avg.
Change
+0.3
+0.4
+0.5
+0.1
+0.1
+0.0
+0.8
+0.3
Min.
Change
+1.0
+1.1
+1.2
+0.6
+0.9
+0.4
+1.6
+1.1
See data files 20813109 through 20813116 for individual
data points.
Test Laboratory
TR#208131, REV.1.1
Contech Research
54 of 78
An Independent Test and Research Laboratory
LLCR DATA FILES
DATA FILE NUMBERS
20813109
20813110
20813111
20813112
20813113
20813114
20813115
20813116
Test Laboratory
TR#208131, REV.1.1
Contech Research
55 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer:
Samtec
Product:
Series MTCA connector
Description: C-A-1
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813109
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
7.9
15.2
15.6
7.2
16.2
16.9
15.9
7.4
15.4
17.5
19.2
19.8
20.4
20.1
7.2
15.5
15.2
15.6
15.5
18.4
16.9
15.5
14.9
7.4
7.3
0.3
0.7
0.6
0.2
0.7
0.5
0.3
0.4
0.7
0.5
0.3
0.0
-0.1
0.2
0.0
0.0
-0.2
-0.3
-0.1
0.0
0.0
0.1
0.1
-0.2
-0.1
0.5
1.0
0.7
0.2
0.7
0.6
0.9
0.5
0.9
0.5
0.5
0.2
0.2
0.4
0.0
0.1
-0.2
-0.3
-0.1
0.0
0.1
0.3
0.1
-0.1
-0.1
Test Laboratory
TR#208131, REV.1.1
Contech Research
56 of 78
An Independent Test and Research Laboratory
File #: 20813109
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
20.4
7.2
14.6
4.4
0
S.Rath
0.7
-0.3
0.2
0.3
0
MHB
1.0
-0.3
0.3
0.4
0
S.Rath
Equip ID
244
1032
295
1564
1047
1032
Test Laboratory
TR#208131, REV.1.1
Contech Research
57 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer:
Samtec
Product:
Series MTCA connector
Description: C-A-2
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813110
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
7.8
14.6
15.2
7.3
16.7
16.3
16.2
7.3
16.5
17.6
19.8
20.6
21.1
21.1
7.3
16.4
15.9
15.9
16.1
18.1
17.2
15.7
15.1
7.3
7.2
0.0
0.1
0.0
0.0
-0.3
-0.1
-1.1
-0.1
-0.4
-0.2
-0.1
-0.1
-0.2
-0.4
0.0
0.0
0.0
0.2
-0.2
-0.1
0.0
-0.2
0.0
0.1
0.1
0.1
0.4
0.3
0.2
0.1
0.5
-0.6
0.1
0.4
0.3
0.3
0.3
0.6
0.2
0.3
0.5
0.7
0.8
0.2
0.5
0.5
1.1
0.7
0.3
0.3
Test Laboratory
TR#208131, REV.1.1
Contech Research
58 of 78
An Independent Test and Research Laboratory
File #: 20813110
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
21.1
7.2
14.8
4.6
0
S.Rath
0.2
-1.1
-0.1
0.2
0
S.Rath
1.1
-0.6
0.4
0.3
0
S.Rath
Equip ID
244
1032
295
1564
1032
1047
Test Laboratory
TR#208131, REV.1.1
Contech Research
59 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer: Samtec
Product:
Series MTCA connector
Description: C-A-3
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813111
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
7.0
14.0
14.1
7.0
15.7
15.4
14.1
7.2
15.7
17.0
18.9
20.1
20.3
20.2
7.1
15.7
15.3
15.5
15.4
17.7
16.9
15.1
14.9
7.0
7.4
0.2
0.5
0.4
0.1
0.3
0.7
0.0
-0.1
0.3
0.3
-0.1
-0.1
0.1
-0.2
0.1
0.1
0.2
0.1
0.3
0.4
0.3
0.3
0.5
0.2
-0.1
0.3
0.7
0.6
0.2
0.5
1.2
0.7
0.7
0.8
0.8
0.4
0.3
0.4
0.3
0.2
0.4
0.4
0.4
0.4
0.6
0.6
0.4
0.6
0.2
0.0
Test Laboratory
TR#208131, REV.1.1
Contech Research
60 of 78
An Independent Test and Research Laboratory
File #: 20813111
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
20.3
7.0
14.2
4.4
0
S.Rath
0.7
-0.2
0.2
0.2
0
MHB
1.2
0.0
0.5
0.3
0
S.Rath
Equip ID
244
1032
1047
1032
1047
1032
Test Laboratory
TR#208131, REV.1.1
Contech Research
61 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer:
Samtec
Product:
Series MTCA connector
Description: C-A-4
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813112
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
8.1
14.4
15.2
7.4
16.7
16.7
15.1
7.3
16.5
18.1
20.1
20.9
21.4
21.0
7.5
15.9
15.1
14.3
12.9
19.0
18.1
16.6
16.6
7.5
7.5
2.4
-0.1
-0.4
-0.1
-0.4
-0.4
-0.3
0.0
-0.3
-0.3
0.0
-0.2
-0.2
-0.2
0.3
-0.2
-0.2
-0.1
0.0
-0.2
-0.1
0.3
-0.2
-0.1
0.1
-0.6
0.0
-0.2
0.0
0.0
-0.2
-0.1
0.1
-0.3
-0.1
0.0
0.0
0.1
0.1
0.6
0.1
0.1
0.1
0.1
0.1
0.2
0.5
0.2
0.0
0.6
Test Laboratory
TR#208131, REV.1.1
Contech Research
62 of 78
An Independent Test and Research Laboratory
File #: 20813112
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
21.4
7.3
14.8
4.7
0
S.Rath
2.4
-0.4
0.0
0.5
0
MHB
0.6
-0.6
0.1
0.3
0
S.Rath
Equip ID
244
1032
1047
1032
1047
1032
Test Laboratory
TR#208131, REV.1.1
Contech Research
63 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer:
Samtec
Product:
Series MTCA connector
Description: C-A-5
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813113
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
7.6
14.9
14.7
7.1
16.1
16.8
14.5
7.2
14.8
16.4
17.9
18.9
18.7
19.0
7.2
14.9
14.5
14.8
14.7
18.2
17.6
15.7
14.9
7.3
7.3
0.3
0.6
0.7
0.1
0.4
0.5
0.4
0.2
1.0
0.0
0.2
0.6
0.3
0.2
0.2
0.2
0.3
0.1
0.4
0.3
0.4
0.5
0.3
0.2
0.1
0.2
0.3
0.3
0.0
0.0
0.0
0.1
0.0
0.9
0.0
0.0
0.0
0.3
0.2
0.0
0.1
0.2
0.1
0.4
0.1
-0.1
0.0
0.0
0.1
0.1
Test Laboratory
TR#208131, REV.1.1
Contech Research
64 of 78
An Independent Test and Research Laboratory
File #: 20813113
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
19.0
7.1
14.1
4.1
0
S.Rath
1.0
0.0
0.3
0.2
0
MHB
0.9
-0.1
0.1
0.2
0
S.Rath
Equip ID
244
1032
295
1564
1047
1032
Test Laboratory
TR#208131, REV.1.1
Contech Research
65 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer:
Samtec
Product:
Series MTCA connector
Description: C-A-6
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813114
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
7.7
14.8
15.2
7.4
16.5
16.4
15.5
7.4
15.4
17.0
19.1
20.2
20.0
20.2
7.4
15.6
15.9
16.2
16.3
17.5
17.3
15.5
14.9
7.4
7.6
0.0
0.1
-0.1
-0.2
-0.1
-0.2
-0.3
-0.1
-0.3
-0.2
-0.3
0.9
-0.3
-0.4
0.0
-0.2
-0.3
-0.4
-0.5
0.1
0.1
0.1
0.1
0.0
-0.2
0.0
0.1
0.0
-0.1
-0.1
-0.1
-0.3
0.0
-0.1
-0.1
-0.2
0.2
-0.1
-0.3
0.0
0.1
0.0
-0.2
0.0
0.3
0.1
0.3
0.4
0.0
-0.2
Test Laboratory
TR#208131, REV.1.1
Contech Research
66 of 78
An Independent Test and Research Laboratory
File #: 20813114
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
20.2
7.4
14.6
4.4
0
S.Rath
0.9
-0.5
-0.1
0.3
0
MHB
0.4
-0.3
0.0
0.2
0
S.Rath
Equip ID
244
1032
295
1564
1032
1047
Test Laboratory
TR#208131, REV.1.1
Contech Research
67 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer:
Samtec
Product:
Series MTCA connector
Description: C-A-7
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813115
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
7.9
15.1
16.3
7.7
17.7
18.0
15.9
7.6
16.6
18.5
20.2
20.3
21.1
21.3
7.3
16.0
16.2
16.1
16.0
18.9
17.4
15.8
15.2
7.3
7.4
0.7
2.7
2.4
0.5
1.2
3.0
1.2
0.7
1.0
0.1
0.5
0.8
0.9
1.2
0.4
1.4
0.9
0.7
0.6
0.9
0.7
1.0
0.9
0.4
0.3
0.4
1.2
0.9
0.4
0.5
1.3
0.9
0.4
0.8
0.1
0.6
0.9
0.8
1.6
0.4
1.4
0.8
0.7
0.7
0.8
0.8
1.0
0.9
0.4
0.2
Test Laboratory
TR#208131, REV.1.1
Contech Research
68 of 78
An Independent Test and Research Laboratory
File #: 20813115
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
21.3
7.3
15.1
4.7
0
S.Rath
3.0
0.1
1.0
0.7
0
MHB
1.6
0.1
0.8
0.4
0
S.Rath
Equip ID
244
1032
295
1564
1032
1047
Test Laboratory
TR#208131, REV.1.1
Contech Research
69 of 78
An Independent Test and Research Laboratory
Low Level Contact Resistance
Project:208131
Customer:
Samtec
Product:
Series MTCA connector
Description: C-A-8
Open circuit voltage:
20mv
Spec: EIA 364, TP 23
Subgroup: Grp A Seq. C
File #: 20813116
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
7.4
14.5
14.8
7.1
16.3
16.2
14.5
7.1
15.0
16.1
18.5
18.8
19.2
18.9
7.1
15.2
15.1
14.9
14.8
17.6
17.0
15.4
14.7
7.0
7.1
0.2
0.3
0.4
0.2
0.3
0.6
0.3
0.1
0.4
0.6
-0.3
0.4
0.1
0.2
0.1
0.2
0.0
0.2
-0.1
0.3
0.3
0.5
0.6
0.2
0.1
0.2
0.3
0.3
0.2
0.5
0.4
0.3
0.2
0.5
1.1
-0.3
0.5
-0.1
0.2
0.0
0.5
0.1
0.5
0.1
0.4
0.4
0.3
0.5
0.2
0.2
Test Laboratory
TR#208131, REV.1.1
Contech Research
70 of 78
An Independent Test and Research Laboratory
File #: 20813116
Temp ºC
R.H. %
Date:
Pos. ID
23
22
26Mar08
Initial
22
24
16Apr08
M.Shock
23
25
17Apr08
Vibration
MAX
MIN
AVG
STD
Open
Tech
19.2
7.0
14.0
4.2
0
S.Rath
0.6
-0.3
0.2
0.2
0
MHB
1.1
-0.3
0.3
0.3
0
S.Rath
Equip ID
244
1032
295
1564
1047
1032
Test Laboratory
TR#208131, REV.1.1
Contech Research
71 of 78
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE D
Group A
MTCA SERIES
Test Laboratory
TR#208131, REV.1.1
Contech Research
72 of 78
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
-----------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
-----------------------------------------------------------SAMPLE SIZE: 8 samples
TECHNICIAN: S.Rath, MOB
-----------------------------------------------------------START DATE: 4/15/08
COMPLETE DATE: 4/15/08
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 22%
-----------------------------------------------------------EQUIPMENT ID#: 282, 553, 874, 1366, 1367, 1368, 1474
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity of
connectors for use with electronic equipment subjected to
shocks such as those expected from handling, transportation,
etc.
-----------------------------------------------------------PROCEDURE:
1. The test was performed in accordance with EIA 364, Test
Procedure 27.
2. Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Half-Sine
12.3 Feet per Second
3 Shocks/Direction, 3 Axis (18 total)
3. A stabilizing medium was used to maintain the mechanical
stability of the samples during test.
4. Figure #’s 3 through #5 illustrate the test sample
fixturing utilized during the test.
5. The samples were characterized to determine nanosecond
event requirement. Following characterization the
requirement level was established at 50 nanoseconds.
Test Laboratory
TR#208131, REV.1.1
Contech Research
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An Independent Test and Research Laboratory
PROCEDURE: -continued
6. The low nanosecond monitoring was performed in accordance
with EIA 364, Test Procedure 87.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no low nanosecond event detected greater
than 50 nanoseconds.
-----------------------------------------------------------RESULTS:
1. There was no evidence of physical damage to test samples as
tested.
2. There was no low nanosecond event detected greater than 50
nanoseconds.
3. The Mechanical Shock characteristics are shown in Figure
#’s 8 (Calibration Pulse) and #9 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#208131, REV.1.1
Contech Research
74 of 78
An Independent Test and Research Laboratory
FIGURE #8
Channel 5
Classical Shock
[g]
160
140
Project:208131
Samtec
Cal Wave 1
Tech: S.Rath
Date:04-15-08
100 G 6mS
half-sine
UPPER LIMIT------
120
ACTUAL PULSE-----
ACCELERATION (g)
100
80
60
40
20
0
-20
-40
-60
LOWER LIMIT-----
-80
-100
0.20
0.21
0.22
0.23
0.24
0.25
0.26
0.27
DURATION (Seconds)
0.29
0.30
[s]
Contech Research
Test Laboratory
TR#208131, REV.1.1
0.28
75 of 78
An Independent Test and Research Laboratory
FIGURE #9
Channel 5
Classical Shock
[g]
160
140
Project:208131
Samtec
Actual Wave
Tech: S.Rath
Date:04-15-08
100 G 6mS
half-sine
UPPER LIMIT------
120
ACTUAL PULSE-----
ACCELERATION (g)
100
80
60
40
20
0
-20
-40
-60
LOWER LIMIT-----
-80
-100
0.20
0.21
0.22
0.23
0.24
0.25
0.26
0.27
DURATION (Seconds)
0.29
0.30
[s]
Contech Research
Test Laboratory
TR#208131, REV.1.1
0.28
76 of 78
An Independent Test and Research Laboratory
PROJECT NO.: 208131
SPECIFICATION: MTCA Test Plan
--------------------------------------------------------------PART NO.: See page 4
PART DESCRIPTION: See page 4
--------------------------------------------------------------SAMPLE SIZE: 3 pairs
TECHNICIAN: S.Rath
--------------------------------------------------------------START DATE: 4/16/08
COMPLETE DATE: 4/17/08
--------------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
--------------------------------------------------------------EQUIPMENT ID#: 282, 553, 874, 1366, 1367, 1368, 1474
--------------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if electrical discontinuities at the level
specified exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with Specification
EIA 364, Test Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a)
b)
c)
d)
G ’RMS’
Frequency
Duration
Test Current
:
:
:
:
7.56
50 to 2000 Hz
2.0 Hours per Axis, 3 Axis Total
100 mA
3.
A stabilizing medium was used to maintain the mechanical
stability of the samples during test.
4.
Figure #3 through #5 illustrate the test sample fixturing
utilized during the test.
5.
The samples were characterized prior to test to determine
nanosecond event requirement. Following characterization
the requirement level was established at 50 nanoseconds.
-continued on next page.
Test Laboratory
TR#208131, REV.1.1
77 of 78
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
6. The low nanosecond monitoring was performed in accordance
with EIA 364, Test Procedure 87.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no low nanosecond event detected greater
than 50 nanoseconds.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no low nanosecond event detected greater than
50 nanoseconds.
Test Laboratory
TR#208131, REV.1.1
78 of 78
Contech Research
An Independent Test and Research Laboratory