MARCH 17, 2009 TEST REPORT #209070 REVISION 1.1 QUALIFICATION TESTING PART NUMBERS SEAF-50-01-S-06-2-RA-GP SEAM-50-02.0-S-06-2-GP SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH RESEARCH, INC. Test Laboratory Contech Research An Independent Test and Research Laboratory REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 3/17/2009 1.0 Initial Issue DA 2/10/2011 1.1 Correct Mechanical Shock and Vibration test conditions APH Test Laboratory TR#209070, REV.1.1 2 of 68 Contech Research An Independent Test and Research Laboratory CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed with the concurrence of Samtec, Inc. of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and Contech Research. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH RESEARCH, INC. DA:cf Test Laboratory TR#209070, REV.1.1 3 of 68 Contech Research An Independent Test and Research Laboratory SCOPE To perform Qualification testing on SEAF/SEAM connectors as manufactured and submitted by the test sponsor Samtec, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Samtec Test Plan: TC0853—2158 3. Standard: EIA Publication 364 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Samtec, Inc., for the evaluation to be performed by Contech Research, Inc. Part Number a) SEAF-50-01-S-06-2-RA-GP b) SEAM-50-02.0-S-06-2-GP 2. Test samples were supplied assembled and terminated to test boards by the test sponsor. 3. Test boards for mounting test samples were supplied by the test sponsor. 4. The test samples were tested mounted to printed circuit boards. 5. Figure #1 illustrates the mounted connectors used for test. 6. Test leads were attached to the appropriate measurement areas of the test samples and applicable mating elements. 7. The test samples were tested in their ‘as received’ condition. 8. Unless otherwise specified in the test procedures used, no further preparation was used. Test Laboratory TR#209070, REV.1.1 4 of 68 Contech Research An Independent Test and Research Laboratory TEST SELECTION 1. See Test Plan Flow Diagram, Figure #2, for test sequences used. 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification. SAMPLE CODING 1. All samples were coded. Mated test samples remained with each other throughout the test group/sequences for which they were designated. Coding was performed in a manner which remained legible for the test duration. 2. The test samples were coded in the following manner: Group A: Group Group Group Group A B1 B2 B3 – – – – A-A-1, A-A-2 A-B1-B, A-B1-2 A-B2-1, A-B2-2 A-B3-1, A-B3-2 Group B: Group A1 – B-A-1, B-A-2, B-A-3, B-A-4 B-A-5, B-A-6, B-A-7, B-A-8 Group C: Group A – C-A-1, C-A-2, C-A-3, C-A-4 C-A-5, C-A-6, C-A-7, C-A-8 Group D: Group A – D-A-1, D-A-2, D-A-3 Board Number Group ID Sequence Test Laboratory TR#209070, REV.1.1 5 of 68 Contech Research An Independent Test and Research Laboratory FIGURE #1 TYPICAL TEST SAMPLE Test Laboratory TR#209070, REV.1.1 6 of 68 Contech Research An Independent Test and Research Laboratory FIGURE #2 TEST PLAN FLOW DIAGRAM SAMPLE PREPARATION SEQ. A IR DWV TH. SHOCK SEQ. B TH. SHOCK DWV LLCR CYCLIC HUMIDITY DURABILITY SEQ. C SEQ.D LLCR MECH. SHOCK MECH. SHOCK DWV RANDOM VIBRATION LLCR LLCR IR TH. SHOCK RANDOM VIBRATION CYCLIC HUMDITY LLCR LLCR IR CYCLIC HUMIDITY LLCR GR.A GR.B1 GR. B2 GR. B3 GR. A Test Laboratory TR#209070, REV.1.1 7 of 68 GR. A GR. A Contech Research An Independent Test and Research Laboratory DATA SUMMARY TEST REQUIREMENTS RESULTS 1000 MEGOHMS MIN. NO DAMAGE 1000 MEGOHMS MIN. NO DAMAGE 1000 MEGOHMS MIN. >50,000 MEGOHMS PASSED >50,000 MEGOHMS PASSED >50,000 MEGOHMS NO BREAKDOWN, ETC. PASSED NO DAMAGE NO BREAKDOWN, ETC. PASSED PASSED NO DAMAGE NO BREAKDOWN, ETC. PASSED PASSED RECORD NO DAMAGE +10.0 m MAX.CHG. NO DAMAGE +10.0 m MAX.CHG. NO DAMAGE +10.0 m MAX.CHG. 14.6 m PASSED +2.5 m PASSED +1.4 m PASSED +2.4 m SEQUENCE A GROUP A INSULATION RESISTANCE THERMAL SHOCK INSULATION RESISTANCE CYCLIC HUMIDITY INSULATION RESISTANCE GROUP B1 DWV GROUP B2 THERMAL SHOCK DWV GROUP B3 CYCLIC HUMIDITY DWV SEQUENCE B GROUP A DATA LLCR DURABILITY LLCR THERMAL SHOCK LLCR CYCLIC HUMIDITY LLCR Test Laboratory TR#209070, REV.1.1 8 of 68 MAX. MAX.CHG. MAX.CHG. MAX.CHG. Contech Research An Independent Test and Research Laboratory DATA SUMMARY -continued TEST REQUIREMENTS RESULTS SEQUENCE C GROUP A LLCR MECHANICAL SHOCK LLCR RANDOM VIBRATION LLCR RECORD NO DAMAGE +10.0 m MAX.CHG. NO DAMAGE +10.0 m MAX.CHG. 15.0 m MAX. PASSED +2.2 m MAX.CHG. PASSED +3.2 m MAX.CHG. NO 50 NO 50 PASSED PASSED PASSED PASSED SEQUENCE D GROUP A MECHANICAL SHOCK RANDOM VIBRATION DAMAGE NANOSECOND DAMAGE NANOSECOND Test Laboratory TR#209070, REV.1.1 9 of 68 Contech Research An Independent Test and Research Laboratory EQUIPMENT LIST ID# 27 150 244 282 297 321 323 340 545 553 614 629 684 874 1116 1147 1314 1315 1361 1366 1367 1368 1474 1549 1550 1609 5045 Next Cal Last Cal 9/22/2009 9/22/2008 11/13/2009 3/12/2009 11/13/2008 3/12/2008 4/10/2009 3/13/2010 4/10/2008 3/13/2009 10/27/2009 4/24/2009 10/27/2008 4/24/2008 12/5/2009 3/5/2010 1/21/2010 3/5/2010 12/5/2008 3/5/2009 1/21/2009 3/5/2009 3/25/2009 3/25/2008 1/30/2010 1/21/2010 1/2/2010 12/5/2009 1/30/23009 1/21/2009 1/2/2009 12/5/2008 Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal Temp. Humid. Chamber Drill Press Stand Micro-Ohm Meter Vibration Shaker Table Micro-Ohm Meter AC-DC Hipot/Megometer Computer X-Y Table Event Detector 12 channel Power Unit Oven Digital Thermometer Accelerometer Computer Computer Digital O-Scope Multiplexer card Data Aquisition Multimeter Multiplexer Card Main Frame Interface Sine/Rnd Control digitizer Vib Pwr Amp Multiplexer Card Multiplexer Card Vert Thermal Shock Chamber TDR -Sampling Head Blue M Co. Craftsman Keithley Instr. Ling Dynamics Keithley Instr. Hipotronics Co. Legatech NE Affiliated Tech Anatech PCB Co. Tenney Co. Omega Eng. PCB. Co. M&P ARC. Co. Tektronix Keithley Co. Keithley Co. Keithley Agilent H.P. Agilent H.P. Agilent H.P. tira Keithley Keithley C.S.Z. Tektroniks FR-256PC-1 25921 580-1 V-730 580 H300B 286-12 XY-6060 32/64 EHD 483A TH Jr. DP 116 353B04 Vectra P111-450 11801C 7708 2700 7708 8408A E8491A E1432A A58312 7708 7708 VTS-1.0-2-2-H/AC SD-24 F2-249 N/A 467496 163 485414 DS16-201 N/A N/A 941206 1303 9712-510 6232189 47648 us75203327 See Cal Cert N/A See Cal Cert N/A See Cal Cert See Cal Cert N/A N/A See Cal Cert See Cal Cert See Manual ±1.1DegC See Cal Cert. N/A N/A See Cal Cert. See CERT See CERT See Cal Cert N/A N/A See Manual N/A See Cert See Cert See Manual See Cal Cert Ea Test N/A 12mon N/A 12mon 12 mon. N/A N/A 12mon 12mon Ea Test 12mon 12mon N/A N/A 12mon. 12mon 12mon 12mon N/A N/A 12mon N/A 12mon 12mon 12mon 12mon B030915 0862544 0862680 1067661 US35470169 003/06 171629 171626 08-VT14810 B0221502 Test Laboratory Contech Research TR#209070, REV.1.1 10 of 68 An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP A Test Laboratory TR#209070, REV.1.1 11 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAF/SEAM Conn. -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/11/09 COMPLETE DATE: 2/11/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 29% -----------------------------------------------------------EQUIPMENT ID#: 321 -----------------------------------------------------------INSULATION RESISTANCE(IR) PURPOSE: To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 21. 2. Test Conditions: a) b) c) d) e) 3. Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Test Voltage : : : : : Yes Yes Mated Mounted 500 DC The test voltage was applied to specific test points on the test board. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, the insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: The insulation resistance exceeded 50,000 megohms. Test Laboratory TR#209070, REV.1.1 12 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAF/SEAM Conn. -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: S.Rath -----------------------------------------------------------START DATE: 2/18/09 COMPLETE DATE: 2/23/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 1314, 1315, 1361, 1609 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions. 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85°C +3C/-0C -55°C +0C/-3C 30 Minutes Mated Mounted Within 1.0 minute 3. The total number of cycles was performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#209070, REV.1.1 13 of 68 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The insulation resistance exceeded 50,000 megohms. Test Laboratory TR#209070, REV.1.1 14 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/24/09 COMPLETE DATE: 3/6/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 22% -----------------------------------------------------------EQUIPMENT ID#: 27, 614, 629, 1314, 1315, 1361 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. Measurements made under high humidity conditions may reflect the peculiar conditions under which the readings were made, and should be compared only to initial readings when careful analysis indicates that such a comparison is valid and applicable. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, with the following conditions. 2. Test Conditions: a) b) c) d) e) f) g) h) 3. Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : : 50C ± 5C 90% to 95% 25C to 65C No No Mated Mounted 240 hours Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -continued on next page. Test Laboratory TR#209070, REV.1.1 15 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The final insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The final insulation resistance exceeded 50,000 megohms after air dry of 2 hours. Test Laboratory TR#209070, REV.1.1 16 of 68 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP B1 Test Laboratory TR#209070, REV.1.1 17 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/11/09 COMPLETE DATE: 2/11/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 26% -----------------------------------------------------------EQUIPMENT ID#: 321 -----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL) PURPOSE: To determine if the mated connectors can operate at its rated voltage and withstand momentary overpotentials due to switching, surges and other similar phenomenon. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 20. 2. Test Conditions: a) b) c) d) e) f) g) 3. Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Hold Time Rate of Application Test Voltage : : : : : : : Yes Yes Mated Mounted 60 seconds 500 volts/sec. 900 VAC The test voltage was applied to specific test points on the test board. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, there shall be no evidence of breakdown, arcing, etc. -----------------------------------------------------------RESULTS: All test samples as tested met the requirements as specified. Test Laboratory TR#209070, REV.1.1 18 of 68 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP B2 Test Laboratory TR#209070, REV.1.1 19 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/18/09 COMPLETE DATE: 2/23/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 1334, 1315, 1361, 1609 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions. 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85°C +3C/-0C -55°C +0C/-3C 30 Minutes Mated Mounted Within 1.0 minute 3. The total number of cycles was performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#209070, REV.1.1 20 of 68 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. When a 900 test voltage is applied, there shall be no evidence of arcing, breakdown, etc. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no evidence of arcing, breakdown, etc., when a 900 voltage was applied. Test Laboratory TR#209070, REV.1.1 21 of 68 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP B3 Test Laboratory TR#209070, REV.1.1 22 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: S.Rath -----------------------------------------------------------START DATE: 11/20/08 COMPLETE DATE: 12/01/08 -----------------------------------------------------------ROOM AMBIENT: 21C RELATIVE HUMIDITY: 23% -----------------------------------------------------------EQUIPMENT ID#: 27, 321, 614, 629, 1315, 1549, 1550 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. Measurements made under high humidity conditions may reflect the peculiar conditions under which the readings were made, and should be compared only to initial readings when careful analysis indicates that such a comparison is valid and applicable. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, with the following conditions. 2. Test Conditions: a) b) c) d) e) f) g) h) 3. Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : : 50C ± 5C 90% to 95% 25C to 65C No No Mated Mounted 240 hours Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -continued on next page. Test Laboratory TR#209070, REV.1.1 23 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. There shall be no evidence of arcing or breakdown when a 900 test voltage is applied. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. There was no evidence of breakdown, arcing, etc., when a 900 test voltage was applied. Test Laboratory TR#209070, REV.1.1 24 of 68 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE B GROUP A Test Laboratory TR#209070, REV.1.1 25 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: DAM, AJP -----------------------------------------------------------START DATE: 2/10/09 COMPLETE DATE: 2/10/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 244, 297, 323, 1116 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions were applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23 with the following conditions. -continued on next page. Test Laboratory TR#209070, REV.1.1 26 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 2. Test Conditions: a) Test Current : 10 milliamps maximum b) Open Circuit Voltage : 20 minutes c) No. of Positions Tested : 25 per test sample -----------------------------------------------------------REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (milliohms) SIGNAL DATA Sample ID# B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 2. Avg. Max. Min. 12.0 11.4 11.8 11.9 12.1 11.7 12.5 11.9 14.4 13.1 13.8 14.3 13.9 13.7 14.6 14.1 8.5 8.4 8.5 8.1 9.0 8.6 9.1 8.7 See data files 20907001 through 20907008 for individual data points. Test Laboratory TR#209070, REV.1.1 27 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: AJP -----------------------------------------------------------START DATE: 2/12/09 COMPLETE DATE: 2/12/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 34% -----------------------------------------------------------EQUIPMENT ID#: 150, 340 -----------------------------------------------------------DURABILITY PURPOSE: 1. This is a conditioning sequence which is used to induce the type of wear on the contacting surfaces which may occur under normal service conditions. The connectors are mated and unmated a predetermined number of cycles. Upon completion, the units being evaluated are exposed to the environments as specified to assess any impact on electrical stability resulting from wear or other wear dependent phenomenon. 2. This type of conditioning sequence is also used to mechanically stress the connector system as would normally occur in actual service. This sequence in conjunction with other tests is used to determine if a significant loss of contact pressure occurs from said stresses which in turn, may result in an unstable electrical condition to exist. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 09. 2. Test Conditions: a) No. of Cycles b) Rate 3. : : 100 1.0 inch per minute The plug side was assembled to special holding devices, the receptacle side was attached to an X,Y. Speed is approximate. -continued on next page. Test Laboratory TR#209070, REV.1.1 28 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 4. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement. 5. Care was taken to prevent the mating faces of the test samples from contacting each other. 6. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples so tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) SIGNAL DATA Sample ID# B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 3. Avg. Change Max. Change +0.6 -0.7 +0.2 -0.2 -0.1 -0.1 +0.1 -0.1 +1.7 +0.5 +2.5 +0.6 +0.9 +0.4 +1.7 +0.7 See data files 20907001 through 20907008 for individual data points. Test Laboratory TR#209070, REV.1.1 29 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/18/09 COMPLETE DATE: 2/23/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 1314, 1315, 1361, 1609 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions. 2. Test Conditions: a) b) c) d) e) f) h) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85°C +3C/-0C -55°C +0C/-3C 30 Minutes Mated Mounted Within 1.0 minute 3. The total number of cycles was performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#209070, REV.1.1 30 of 68 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) SIGNAL DATA 3. Sample ID# Avg. Change Max. Change B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 +0.1 -1.2 -0.4 -0.3 -0.4 -0.3 -0.6 +0.0 +0.9 -0.2 +0.4 +1.4 +0.6 +0.3 -0.2 +1.0 See data files 20907001 through 20907008 for individual data points. Test Laboratory TR#209070, REV.1.1 31 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/23/09 COMPLETE DATE: 3/06/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 22% -----------------------------------------------------------EQUIPMENT ID#: 27, 1314, 1315, 1361 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as: a) Fretting corrosion due to wear resulting from micromotion, induced by thermal cycling. Humidity accelerates the oxidation process. b) Oxidation of wear debris or from particulates from the surrounding atmosphere which may have become entrapped between the contacting surfaces. c) Failure mechanisms resulting from a wet oxidation process. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, with the following conditions. 2. Test Conditions: a) b) c) d) e) f) g) h) Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : : 50C ± 5C 90% to 95% 25C to 65C No No Mated Mounted 240 hours -continued on next page. Test Laboratory TR#209070, REV.1.1 32 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 3. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) SIGNAL DATA 3. Sample ID# Avg. Change Max. Change B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 +0.0 -0.7 +0.4 +0.4 -0.2 +0.0 -0.4 +0.0 +1.2 +1.1 +1.5 +1.6 +2.3 +2.4 +1.8 +0.7 See data files 20907001 through 20907008 for individual data points. Test Laboratory TR#209070, REV.1.1 33 of 68 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES FILE NUMBERS 20907001 20907002 20907003 20907004 20907005 20907006 20907007 20907008 Test Laboratory TR#209070, REV.1.1 34 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-1 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907001 Tech: DAM Current: 100mA 20 39 11Feb09 Initial 20 34 12Feb09 Durability 20 26 23Feb09 T.Shock 22 25 06Mar09 Aft Hum 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.6 11.8 14.0 14.4 11.6 12.9 13.4 8.7 13.7 11.4 8.8 13.6 13.1 13.3 11.1 13.8 13.0 11.8 9.9 13.5 10.8 13.0 13.0 11.4 8.5 0.0 0.4 0.2 0.1 0.9 1.0 1.0 0.8 -0.1 0.3 1.4 -0.3 0.6 0.0 0.2 0.7 0.4 0.3 1.1 0.4 1.5 0.5 0.5 1.7 0.9 0.0 -1.0 -0.4 -1.2 -0.1 0.2 0.0 -0.3 -0.3 0.2 0.1 0.0 0.4 0.9 0.7 0.4 0.3 0.5 0.0 0.8 0.8 0.7 0.0 0.6 -0.1 -0.1 -0.6 -0.4 -1.0 -0.2 0.4 0.2 -0.2 0.0 0.3 -0.2 0.2 -0.1 0.6 -0.1 -0.4 0.2 -0.3 -0.1 0.0 -0.1 0.3 1.2 -0.1 -0.4 MAX MIN AVG STD Open Tech 14.4 8.5 12.0 1.8 0 AJP 1.7 -0.3 0.6 0.5 0 AJP 0.9 -1.2 0.1 0.5 0 DAM 1.2 -1.0 0.0 0.4 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 35 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-2 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID 20 39 11Feb09 Initial Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907002 Tech: DAM Current: 100mA 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.5 9.8 12.4 12.2 10.3 12.2 12.5 9.6 12.5 10.9 10.2 11.9 12.5 12.0 10.7 11.8 12.1 11.6 11.6 12.9 11.1 13.1 12.2 11.2 8.4 20 34 12Feb09 Dura 100X -1.0 0.0 -0.2 -0.4 -0.7 -0.2 -0.4 -1.6 0.5 -1.1 -2.3 0.0 -0.9 -0.1 -0.7 -0.1 -0.7 -1.2 -2.9 -1.2 -0.9 -1.3 0.0 -0.2 -0.1 MAX MIN AVG STD Open Tech 13.1 8.4 11.4 1.3 0 AJP 0.5 -2.9 -0.7 0.8 0.0 AJP -0.2 -3.3 -1.2 0.7 0 DAM 1.1 -2.8 -0.7 0.9 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 36 of 68 20 26 23Feb09 T.Shock 22 25 06Mar09 Hum -0.9 -0.6 -1.0 -0.9 -0.9 -0.9 -0.2 -2.3 -1.2 -1.0 -2.7 -0.8 -1.5 -0.9 -1.2 -0.6 -1.3 -1.7 -3.3 -1.2 -1.9 -1.8 -0.5 -1.3 -0.6 -0.3 0.5 -0.7 -0.2 0.6 -0.4 -0.5 -1.8 -0.6 0.3 -2.1 0.2 -0.8 -0.5 -1.0 1.1 -0.7 -0.8 -2.8 -0.8 -1.5 -1.7 -0.6 -1.3 -0.7 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-3 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907003 Tech: DAM Current: 100mA 20 39 11Feb09 Initial 20 34 12Feb09 Durability 20 26 23Feb09 T.Shock 22 25 06Mar09 Hum 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.5 10.8 13.8 13.5 10.7 13.3 13.4 8.5 12.9 10.7 9.3 13.0 12.8 13.8 11.1 13.1 13.0 11.9 9.9 13.3 11.6 13.4 13.0 11.1 8.7 0.2 0.1 -0.5 -0.2 0.2 -0.1 -0.6 0.3 0.4 0.3 1.1 0.3 0.3 0.8 -0.1 0.1 0.3 -0.3 2.5 0.7 -0.1 -0.3 0.2 -0.1 0.1 0.0 0.4 -0.7 -0.4 0.0 -0.5 -0.8 -0.4 -0.3 -0.2 -0.6 -0.2 -0.1 -0.5 -0.5 -0.6 -0.5 -0.7 -0.6 -1.7 -0.7 -0.5 -0.6 -0.4 -0.1 0.4 0.8 0.0 0.5 1.3 -0.1 -0.5 0.5 0.2 0.4 1.5 1.0 0.5 1.3 -0.2 -0.1 0.3 0.0 0.4 0.4 -0.3 0.2 0.3 0.3 0.0 MAX MIN AVG STD Open Tech 13.8 8.5 11.8 1.8 0 AJP 2.5 -0.6 0.2 0.6 0 AJP 0.4 -1.7 -0.4 0.4 0 DAM 1.5 -0.5 0.4 0.5 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 37 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-4 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907004 Tech: DAM Current: 100mA 20 39 11Feb09 Initial 20 34 12Feb09 Durability 20 26 23Feb09 T.Shock 22 25 06Mar09 Hum 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.1 10.6 12.8 12.9 10.9 12.9 13.4 8.5 13.5 12.3 8.6 13.4 13.7 13.7 11.5 13.6 13.4 11.8 10.1 14.3 11.0 13.3 13.0 11.3 8.8 0.2 0.1 0.3 0.2 -0.2 0.2 -0.4 0.1 -0.1 -1.0 0.6 -0.4 -0.5 -0.6 -0.3 -0.4 -0.3 -0.5 -0.6 -1.1 -0.2 -0.3 0.0 0.1 0.2 0.3 0.2 0.7 0.8 -0.3 0.4 0.1 0.1 -0.4 -1.5 0.1 -0.8 -0.3 -0.9 -0.6 1.4 -0.7 -0.8 -1.2 -1.5 -0.8 -0.8 -0.3 -0.5 -0.2 0.6 1.6 1.5 1.2 0.5 0.8 0.6 0.4 0.5 -1.0 0.7 0.1 0.0 -0.2 0.3 0.3 0.0 -0.6 -0.1 -0.5 1.0 -0.2 0.8 1.2 0.7 MAX MIN AVG STD Open Tech 14.3 8.1 11.9 1.9 0 AJP 0.6 -1.1 -0.2 0.4 0 AJP 1.4 -1.5 -0.3 0.7 0 DAM 1.6 -1.0 0.4 0.7 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 38 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-5 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907005 Tech: DAM Current: 100mA 20 39 11Feb09 Initial 20 34 12Feb09 Durability 20 26 23Feb09 T.Shock 22 25 06Mar09 Hum 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 9.0 10.7 13.5 13.9 10.7 13.9 13.4 9.8 13.4 10.9 10.0 13.8 13.7 13.8 10.9 13.6 13.9 11.3 10.3 13.7 11.7 12.7 13.1 11.0 9.3 0.0 0.4 -0.1 -0.4 0.1 -0.9 -0.4 -0.7 -0.5 0.4 -0.6 0.1 -0.9 -0.3 0.0 -0.2 -0.7 0.9 0.2 -0.3 -0.3 0.3 0.1 0.2 0.6 -0.7 0.6 -0.8 -0.9 0.4 -1.1 -0.3 -1.0 -0.3 -0.1 -0.5 -0.1 -0.6 -0.4 -0.3 -0.4 -1.0 0.4 -0.6 -0.4 -0.5 -0.1 -0.3 0.2 -0.2 -0.3 0.7 -0.2 -0.5 -0.1 -0.9 -0.8 -1.0 -0.5 -0.6 -0.9 2.3 -0.7 -0.5 -0.2 -0.9 -0.9 0.4 -0.7 -0.1 -0.3 0.4 0.3 0.2 -0.4 MAX MIN AVG STD Open Tech 13.9 9.0 12.1 1.7 0 AJP 0.9 -0.9 -0.1 0.5 0 AJP 0.6 -1.1 -0.4 0.4 0 DAM 2.3 -1.0 -0.2 0.7 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 39 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-6 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907006 Tech: DAM Current: 100mA 20 39 11Feb09 Initial 20 34 12Feb09 Durability 20 26 23Feb09 T.Shock 22 25 06Mar09 Hum 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.7 11.4 13.5 13.6 11.0 13.7 13.1 9.1 13.3 10.7 8.7 12.6 12.6 13.0 10.7 13.2 13.2 11.7 9.8 13.4 10.9 13.0 13.1 10.9 8.6 0.0 -0.5 0.1 -0.4 -0.5 -0.4 -0.1 -0.6 -0.1 -0.4 0.3 0.1 0.4 -0.2 -0.2 -0.1 0.0 -0.4 0.0 -0.2 -0.3 -0.2 0.0 0.2 -0.1 -0.3 -0.6 -0.5 -0.7 -0.6 -0.5 -0.1 -0.9 -0.4 -0.3 -0.7 -0.2 -0.1 -0.3 -0.5 -0.1 -0.2 0.0 -0.4 0.3 -0.2 -0.6 0.1 0.0 -0.3 0.4 2.4 -0.1 -0.6 -0.1 0.2 0.2 -1.2 -0.1 0.1 -0.5 0.3 0.6 0.0 -0.3 0.2 0.8 0.1 -0.6 1.1 -0.5 -0.2 0.0 -0.4 -0.6 MAX MIN AVG STD Open Tech 13.7 8.6 11.7 1.7 0 AJP 0.4 -0.6 -0.1 0.3 0 AJP 0.3 -0.9 -0.3 0.3 0 DAM 2.4 -1.2 0.0 0.7 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 40 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-7 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907007 Tech: DAM Current: 100mA 20 39 11Feb09 Initial 20 34 12Feb09 Durability 20 26 23Feb09 T.Shock 22 25 06Mar09 Hum 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 9.3 12.0 13.8 14.6 12.1 14.5 14.3 9.1 14.3 11.6 9.3 13.7 13.9 13.9 12.0 14.6 13.4 12.1 10.5 13.9 11.8 13.6 13.4 11.4 9.2 0.0 0.1 1.7 -0.4 0.8 -1.0 1.3 0.3 0.7 0.2 0.8 -0.3 -0.5 -0.3 -0.4 -0.1 0.2 -0.2 -0.3 0.2 0.5 0.1 -0.1 0.0 -0.1 -0.7 -0.9 -0.4 -1.3 -1.3 -0.5 -0.3 -0.9 -0.3 -0.8 -0.3 -0.4 -0.6 -0.8 -0.9 -1.1 -0.2 -0.3 -0.5 -0.5 -0.9 -0.4 -0.2 -0.3 -0.4 -0.6 -0.1 1.4 -0.1 -0.6 -0.5 -1.0 -1.1 -1.0 -1.4 -0.7 -0.6 -0.4 -0.9 -1.5 -1.3 0.1 -0.4 -0.9 1.1 1.8 -0.3 -0.1 0.3 -0.4 MAX MIN AVG STD Open Tech 14.6 9.1 12.5 1.9 0 AJP 1.7 -1.0 0.1 0.6 0 AJP -0.2 -1.3 -0.6 0.3 0 DAM 1.8 -1.5 -0.4 0.8 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 41 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :B-A-8 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq b Gp A File No: 20907008 Tech: DAM Current: 100mA 20 39 11Feb09 Initial 20 34 12Feb09 Durability 20 26 23Feb09 T.Shock 22 25 06Mar09 Hum 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 9.2 11.0 14.0 13.6 11.4 13.0 14.1 8.9 13.4 11.3 9.3 13.0 12.8 12.8 11.1 14.0 12.9 11.3 9.5 14.0 10.6 13.1 13.1 11.1 8.7 -0.3 -0.2 -0.1 0.7 -0.3 0.4 -0.3 0.3 -0.1 -0.6 -0.5 -0.4 -0.2 -0.3 -0.4 -0.6 0.0 -0.1 -0.2 -0.3 0.1 0.0 0.0 -0.3 -0.1 0.0 0.6 0.1 1.0 -0.1 0.4 0.4 0.0 0.2 -0.4 -0.2 0.8 0.2 0.1 -0.5 -1.1 -0.2 0.3 0.0 -0.6 -0.3 -0.3 -0.3 -0.1 0.1 -0.1 0.1 0.1 0.7 -0.2 0.4 0.5 0.3 0.0 -0.5 -0.7 0.0 0.5 0.0 -0.4 0.5 0.0 0.4 0.0 -0.8 -0.2 -0.6 -0.3 -0.1 -0.4 MAX MIN AVG STD Open Tech 14.1 8.7 11.9 1.8 0 AJP 0.7 -0.6 -0.1 0.3 0 AJP 1.0 -1.1 0.0 0.4 0 DAM 0.7 -0.8 0.0 0.4 0 DAM Equip ID 244 1116 244 1116 323 297 323 297 Test Laboratory TR#209070, REV.1.1 42 of 68 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE C GROUP A Test Laboratory TR#209070, REV.1.1 43 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: DAM, AJP -----------------------------------------------------------START DATE: 2/13/09 COMPLETE DATE: 2/13/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 28% -----------------------------------------------------------EQUIPMENT ID#: 244, 297, 323, 1116 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions were applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23 with the following conditions. 2. Test Conditions: a) Test Current : 10 milliamps maximum b) Open Circuit Voltage : 20 minutes c) No. of Positions Tested : 25 per test sample -continued on next page. Test Laboratory TR#209070, REV.1.1 44 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 3. The points of application are shown in Figure #3. -----------------------------------------------------------REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (milliohms) SIGNAL DATA 2. Sample ID# Avg. Max. Min. C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 12.6 12.2 11.6 12.0 12.0 12.1 12.1 11.9 14.8 14.4 13.6 13.6 14.0 14.0 13.9 15.0 8.7 9.0 8.2 8.7 8.3 8.4 8.7 8.4 See data files 20907009 through 20907016 for individual data points. Test Laboratory TR#209070, REV.1.1 45 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/17/09 COMPLETE DATE: 2/18/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 282, 545, 553, 684, 874, 1366, 1367, 1368, 1474 -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance EIA 364, Test Procedure 27. 2. Test Conditions: a) b) c) d) e) Peak Value Duration Wave Form Velocity No. of Shocks : : : : : 100 G 6 milliseconds Half-Sine 12.3 feet per second 3 Shocks/Direction, 3 Axes (18 Total) 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. Figure #3 illustrates the test sample fixturing utilized during the test. 5. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#209070, REV.1.1 46 of 68 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) SIGNAL DATA Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 Avg. Change -0.3 -0.4 +0.2 +0.4 +0.5 +0.2 -0.1 +0.6 Max. Change +0.5 +0.2 +1.0 +1.2 +1.4 +1.8 +0.5 +2.2 3. See data files 20907009 through 20907016 for individual data points. 4. The Mechanical Shock characteristics are shown in Figures #4 (Calibration Pulse) and #5 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification. Test Laboratory TR#209070, REV.1.1 47 of 68 Contech Research An Independent Test and Research Laboratory FIGURE #3 TYPICAL FIXTURING – MECHANICAL SHOCK/RANDOM VIBRATION Test Laboratory TR#209070, REV.1.1 48 of 68 Contech Research An Independent Test and Research Laboratory FIGURE #4 Channel 5 Classical Shock [g] 200 UPPER LIMIT------ Project: 209070 100G’s 6ms Halfsine Tech:DAM Date: 18Feb09 Cal 1 ACCELERATION (g) 150 ACTUAL PULSE----- 100 50 0 -50 -100 LOWER LIMIT-----150 0.96 0.97 0.98 0.99 1.00 1.01 1.02 DURATION (Seconds) 1.04 [s] Contech Research Test Laboratory TR#209070, REV.1.1 1.03 49 of 68 An Independent Test and Research Laboratory FIGURE #5 Channel 5 Classical Shock [g] 200 UPPER LIMIT------ Project: 209070 100G’s 6ms Halfsine Tech:DAM Date: 18Feb09 Actual ACCELERATION (g) 150 100 ACTUAL PULSE----- 50 0 -50 -100 LOWER LIMIT-----150 0.96 0.97 0.98 0.99 1.00 1.01 1.02 DURATION (Seconds) 1.04 [s] Contech Research Test Laboratory TR#209070, REV.1.1 1.03 50 of 68 An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/19/09 COMPLETE DATE: 2/19/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 30% -----------------------------------------------------------EQUIPMENT ID#: 282, 545, 553, 684, 874, 1366, 1367, 1368, 1474 -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To establish the mechanical integrity of the test samples exposed to external mechanical stresses. 2. To determine if the contact system is susceptible to fretting corrosion. 3. To determine if the electrical stability of the system has degraded when exposed to a vibratory environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 28. 2. Test Conditions: a) b) c) D) Power Spectral Density : 0.04 G2/Hz G ’RMS’ : 7.56 Frequency : 50 to 2000 Hz Duration : 2.0 hour per axis (3 axes total) 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. Figure #3 illustrates the test sample fixturing utilized during the test. -continued on next page. Test Laboratory TR#209070, REV.1.1 51 of 6868 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 5. All subsequent variable testing was performed in accordance with procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) SIGNAL DATA Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 3. Avg. Change Max. Change -0.2 -0.2 +0.2 +0.2 +0.3 +0.2 -0.2 +0.2 +0.6 +0.5 +1.4 +1.7 +1.1 +1.3 +0.6 +3.2 See data files 20907009 through 20907016 for individual data points. Test Laboratory TR#209070, REV.1.1 52 of 68 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES FILE NUMBERS 20907009 20907010 20907011 20907012 20907013 20907014 20907015 20907016 Test Laboratory TR#209070, REV.1.1 53 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-1 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907009 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M-Shock 20 28 20Feb09 R.Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 9.5 11.3 14.6 13.6 11.2 13.9 14.4 8.7 14.2 11.4 9.6 13.7 13.4 14.2 12.5 14.8 13.8 12.5 10.9 14.6 12.4 14.3 14.4 11.8 8.9 -0.8 -0.3 -0.9 -0.5 0.4 0.4 -0.4 0.0 -0.5 -0.7 -0.7 0.5 0.4 0.2 -0.8 -1.7 0.1 -0.7 -0.7 0.0 -0.3 -0.7 -0.5 0.0 0.0 -0.3 0.1 -0.6 0.1 -0.1 0.1 0.0 0.6 0.1 0.0 0.2 0.4 0.4 -0.3 -1.0 -0.9 0.2 -0.6 -0.9 -0.3 -0.9 -0.8 -0.2 -0.5 0.0 MAX MIN AVG STD Open Tech 14.8 8.7 12.6 1.9 0 DAM 0.5 -1.7 -0.3 0.5 0 BE 0.6 -1.0 -0.2 0.4 0 DAM Equip ID 323 297 601 677 323 297 Test Laboratory TR#209070, REV.1.1 54 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-2 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907010 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M.Shock 20 28 20Feb09 R.Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 9.0 11.4 14.1 14.4 11.7 13.3 13.2 9.7 13.7 11.9 9.5 13.5 13.0 13.0 12.4 13.3 13.2 12.7 10.3 14.0 11.8 12.9 13.1 11.0 9.2 -0.3 -0.5 -0.5 -0.1 -0.7 -0.2 -0.2 -1.0 -0.2 -0.7 -0.4 -0.5 -0.2 0.0 -1.5 -0.3 -0.4 -0.8 0.2 -0.5 -1.0 -0.1 0.2 0.2 -0.3 -0.3 0.0 -0.9 -0.8 -0.3 0.5 0.1 -0.9 0.1 0.1 -0.2 0.2 -0.3 -0.2 -1.3 -0.1 -0.5 -0.5 -0.3 -0.2 0.0 0.2 0.2 -0.2 -0.2 MAX MIN AVG STD Open Tech 14.4 9.0 12.2 1.6 0 DAM 323 297 0.2 -1.5 -0.4 0.4 0 DAM 323 297 0.5 -1.3 -0.2 0.4 0 DAM 323 297 Equip ID Test Laboratory TR#209070, REV.1.1 55 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-3 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907011 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M.Shock 20 28 20Feb09 R.Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.3 10.9 13.2 13.6 10.6 12.7 13.2 8.4 12.3 11.2 8.5 12.9 13.2 13.1 11.1 13.5 12.7 11.3 9.7 13.5 10.8 12.7 12.7 10.7 8.2 0.2 -0.1 0.5 -0.1 0.2 0.2 1.0 0.3 0.5 -0.1 0.2 0.1 -0.3 0.1 0.1 0.0 0.1 0.3 -0.1 0.1 0.1 0.2 0.4 0.4 0.5 0.4 0.1 0.1 -0.9 0.6 -0.1 0.5 0.4 1.3 0.3 0.0 -0.1 -0.3 -0.3 0.0 -0.6 -0.3 0.4 0.1 -0.5 0.4 0.2 0.8 1.4 0.3 MAX MIN AVG STD Open Tech 13.6 8.2 11.6 1.8 0 DAM 1.0 -0.3 0.2 0.3 0 DAM 1.4 -0.9 0.2 0.5 0 DAM Equip ID 323 297 323 297 323 297 Test Laboratory TR#209070, REV.1.1 56 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-4 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907012 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M-Shock 20 28 20Feb09 R Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.7 11.4 13.6 13.6 9.8 13.2 13.1 9.8 13.4 11.4 9.8 13.1 12.9 13.4 11.6 13.5 13.2 12.6 10.5 13.5 11.6 12.8 13.4 11.1 9.1 0.6 0.0 0.8 0.0 1.2 0.8 0.6 -0.4 0.3 0.2 -0.5 0.1 0.5 0.3 0.5 1.2 0.5 -0.3 0.2 0.9 -0.1 0.3 0.7 0.3 0.3 0.4 0.1 0.5 -0.1 1.7 0.0 0.0 0.0 0.1 0.2 -0.3 0.4 0.7 0.4 0.0 0.2 0.1 -0.2 0.6 0.1 0.0 0.2 -0.5 -0.1 0.3 MAX MIN AVG STD Open Tech 13.6 8.7 12.0 1.6 0 DAM 1.2 -0.5 0.4 0.4 0 BE 1.7 -0.5 0.2 0.4 0 DAM Equip ID 323 297 601 677 323 297 Test Laboratory TR#209070, REV.1.1 57 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-5 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907013 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M-Shock 20 28 20Feb09 R Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 9.1 11.4 13.5 13.8 11.1 13.1 13.3 8.9 13.6 11.2 8.3 13.4 13.2 13.3 11.4 13.8 12.8 12.1 10.6 14.0 11.4 13.2 13.5 11.2 9.1 0.1 -0.1 0.6 -0.4 0.1 0.6 0.3 -0.4 -0.1 0.9 1.2 0.4 0.5 0.5 0.2 0.9 1.0 0.2 0.6 1.3 0.6 0.6 0.2 1.4 1.1 0.0 -0.1 0.6 0.5 0.5 1.1 0.1 0.4 0.4 1.1 0.8 0.7 0.7 0.1 0.5 0.0 0.9 -0.5 0.0 0.4 0.0 -0.1 -0.7 -0.1 0.1 MAX MIN AVG STD Open Tech 14.0 8.3 12.0 1.7 0 DAM 1.4 -0.4 0.5 0.5 0 BE 1.1 -0.7 0.3 0.5 0 DAM Equip ID 323 297 601 677 323 297 Test Laboratory TR#209070, REV.1.1 58 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-6 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907014 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M.Shock 20 28 20Feb09 R Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.4 11.1 13.3 13.4 11.4 12.8 13.5 9.0 13.7 11.6 9.3 13.8 13.6 13.6 11.1 13.7 14.0 12.0 10.9 13.6 11.2 13.3 13.1 11.3 9.3 0.5 0.3 0.4 0.6 -0.1 0.7 -0.4 -0.3 0.3 -0.6 -0.8 0.3 0.5 0.5 -0.2 1.8 -0.4 -0.1 -0.3 1.2 0.2 -0.3 -0.1 -0.3 0.3 0.7 0.2 0.0 0.2 0.2 0.5 0.6 0.0 0.3 -0.1 0.0 0.3 0.0 0.4 -0.1 0.9 0.3 0.1 0.0 1.3 0.0 -0.4 0.4 -0.5 -0.1 MAX MIN AVG STD Open Tech 14.0 8.4 12.1 1.7 0 DAM 1.8 -0.8 0.2 0.6 0 DAM 1.3 -0.5 0.2 0.4 0 DAM Equip ID 323 297 323 297 323 297 Test Laboratory TR#209070, REV.1.1 59 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-7 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907015 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M.Shock 20 28 20Feb09 R Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.7 11.4 13.6 13.9 11.2 13.2 13.4 9.0 13.3 11.5 8.9 13.4 13.5 13.4 11.2 13.8 13.2 12.0 10.5 13.5 11.5 13.3 13.2 12.0 9.2 0.1 -0.4 0.0 -0.2 -0.4 -0.1 0.0 0.5 -0.3 -0.8 0.0 -0.3 -0.4 -0.2 -0.2 -0.8 -0.2 0.2 -0.5 0.3 -0.2 0.0 0.2 -0.1 0.4 0.6 -0.6 -0.4 -0.1 -0.5 -0.2 -0.1 -0.4 -0.2 -0.4 -0.1 0.0 -0.3 -0.1 -0.4 0.0 0.2 -0.1 -0.3 0.5 -0.7 -0.3 0.3 -0.4 -0.1 MAX MIN AVG STD Open Tech 13.9 8.7 12.1 1.7 0 DAM 0.5 -0.8 -0.1 0.3 0 DAM 0.6 -0.7 -0.2 0.3 0 DAM Equip ID 323 297 323 297 323 297 Test Laboratory TR#209070, REV.1.1 60 of 68 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209070 Customer: Samtec Product:Series SEAF/SEAM connector Description :C-A-8 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: EIA 364, TP23 Subgroup: Seq c Gp A File No: 20907016 Tech: DAM Current: 100mA 20 28 13Feb09 Initial 20 24 18Feb09 M-Shock 20 28 20Feb09 R.Vib 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 8.4 11.3 12.6 13.8 10.6 13.3 13.0 8.7 13.0 10.5 8.9 13.2 13.2 13.4 10.9 13.3 13.5 11.9 10.5 15.0 10.5 13.9 13.4 11.3 9.3 0.3 -0.3 0.5 0.7 0.7 1.1 1.8 0.3 1.7 0.4 -0.1 0.8 0.9 0.1 0.4 0.7 2.2 0.0 -0.3 -0.3 1.0 0.4 0.3 1.8 0.1 -0.1 -0.7 0.2 -0.1 -0.1 0.1 0.6 -0.2 0.8 0.3 -0.5 1.9 0.9 0.6 0.1 3.2 -0.3 -0.1 -0.1 -1.0 1.0 -0.5 -0.6 -0.2 0.0 MAX MIN AVG STD Open Tech 15.0 8.4 11.9 1.8 0 DAM 2.2 -0.3 0.6 0.7 0 BE 3.2 -1.0 0.2 0.9 0 DAM Equip ID 323 297 601 677 323 297 Test Laboratory TR#209070, REV.1.1 61 of 68 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE D GROUP A Test Laboratory TR#209070, REV.1.1 62 of 68 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/17/09 COMPLETE DATE: 2/18/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 21% -----------------------------------------------------------EQUIPMENT ID#: 282,545, 553, 684, 874, 1147, 1366, 1367, 1368, 1474, 5045R -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27, Test Condition C. 2. Test Conditions: a) b) c) d) e) Peak Value Duration Wave Form Velocity No. of Shocks : : : : : 100 G 6 milliseconds Half-Sine 12.3 feet per second 3 Shocks/Direction, 3 Axes (18 Total) 3. Figure #3 illustrates the test sample fixturing utilized during the test. 4. The samples were characterized to assure that the low nanosecond event being monitored will trigger the detector. 5. After characterization, it was determined the samples could be monitored for a 50 nanosecond event. -continued on next page. Test Laboratory TR#209070, REV.1.1 63 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 6. The low nanosecond monitoring was performed in accordance with EIA 364, Test Procedure 87. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of axial movement of the test samples relative to each other. 2. There shall be no low nanosecond event detected greater than 50 nanoseconds. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no low nanosecond event detected greater than 50 nanoseconds. 3. The Mechanical Shock characteristics are shown in Figures #6 (Calibration Pulse) and #7 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification. Test Laboratory TR#209070, REV.1.1 64 of 68 Contech Research An Independent Test and Research Laboratory FIGURE #6 Channel 5 Classical Shock [g] 200 UPPER LIMIT------ Project: 209070 100G’s 6ms Halfsine Tech:DAM Date: 18Feb09 Cal 1 ACCELERATION (g) 150 ACTUAL PULSE----- 100 50 0 -50 -100 LOWER LIMIT-----150 0.96 0.97 0.98 0.99 1.00 1.01 1.02 DURATION (Seconds) 1.04 [s] Contech Research Test Laboratory TR#209070, REV.1.1 1.03 65 of 68 An Independent Test and Research Laboratory FIGURE #7 Channel 5 Classical Shock [g] 200 UPPER LIMIT------ Project: 209070 100G’s 6ms Halfsine Tech:DAM Date: 18Feb09 Actual ACCELERATION (g) 150 100 ACTUAL PULSE----- 50 0 -50 -100 LOWER LIMIT-----150 0.96 0.97 0.98 0.99 1.00 1.01 1.02 DURATION (Seconds) Test Laboratory TR#209070, REV.1.1 66 of 68 1.03 1.04 [s] Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209070 SPECIFICATION: TC0853-2158 -----------------------------------------------------------PART NO.: See page 4 PART DESCRIPTION: SEAM/SEAF Conn. -----------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: DAM -----------------------------------------------------------START DATE: 2/19/09 COMPLETE DATE: 2/20/09 -----------------------------------------------------------ROOM AMBIENT: 20C RELATIVE HUMIDITY: 30% -----------------------------------------------------------EQUIPMENT ID#: 282,545, 553, 684, 874, 1147, 1366, 1367, 1368, 1474, 5045R -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To determine if electrical discontinuities at the level specified exist. 2. To determine if the contact system is susceptible to fretting corrosion. 3. To determine if the electrical stability of the system has degraded when exposed to a vibratory environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 28, Test Condition V, Test Letter B. 2. Test Conditions: a) b) c) d) Power Spectral Density : 0.04 G2/Hz G ’RMS’ : 7.56 Frequency : 50 to 2000 Hz Duration : 2.0 hours per axis (3 axes total) 3. Figure #4 illustrates the test sample fixturing utilized during the test. 4. Prior to testing, the connectors were characterized to assure that the desired event being monitored were capable of being detected. -continued on next page. Test Laboratory TR#209070, REV.1.1 67 of 68 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 5. After characterization, it was determined the samples could be monitored for a 50 nanosecond event. 6. The low nanosecond event detection was performed in accordance with EIA 364, Test Procedure 87. 7. Due to the design of the PCB only the signal contacts were monitored for the 50 nanosecond detection. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no events detected greater than 50 nanoseconds. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no evidence of low nanosecond events in excess of 50 nanoseconds. Test Laboratory TR#209070, REV.1.1 68 of 68 Contech Research An Independent Test and Research Laboratory