APRIL 19, 2010 TEST REPORT #209698 S2SD CABLE ASSEMBLY QUALIFICATION TESTING PART: S2SD-30-24-S-02.75-D-NUS MATING PART: T2M-130-01-L-D-TH SAMTEC, INC. APPROVED BY: ALICE HATHAWAY PROJECT ENGINEER CONTECH RESEARCH, INC. ATTLEBORO, MA Test Laboratory Contech Research An Independent Test and Research Laboratory REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 4/19/2010 1.0 Initial Issue APH Test Laboratory TR#209698, REV.1.0 2 of 76 Contech Research An Independent Test and Research Laboratory CERTIFICATION This is to certify that the S2SD series cable assembly evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed with the concurrence of Samtec, Inc. of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1, ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and Contech Research. Alice Hathaway Project Engineer Contech Research, Inc. Attleboro, MA APH:cf Test Laboratory TR#209698, REV.1.0 3 of 76 Contech Research An Independent Test and Research Laboratory SCOPE To perform qualification testing on the S2SD series cable assembly as manufactured and submitted by the test sponsor, Samtec, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Samtec Test Plan: TC0946-2877 (S2SD) Test Plan 3. Standard: EIA Publication 364 TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Samtec, Inc., for the evaluation to be performed by Contech Research, Inc. a) b) Description Part Number Cable assembly Mating part S2SD-30-24-S-02.75-D-NUS T2M-130-01-L-D-TH 2. Mating parts were supplied assembled and terminated to test boards by the test sponsor. Specific test boards and cable assembly orientations were supplied for the following tests: - LLCR - IR and DWV - Shock & Vibration, nanosecond event detection 3. Test leads were attached to the appropriate measurement areas of the test samples and applicable mating elements. 4. The test samples were tested in their ‘as received’ condition. 5. Unless otherwise specified in the test procedures used, no further preparation was used. 6. The mated test samples were secured via a stabilizing medium to maintain mechanical stability during testing, as noted in the specific test procedures. Test Laboratory TR#209698, REV.1.0 4 of 76 Contech Research An Independent Test and Research Laboratory TEST SELECTION 1. See Test Plan Flow Diagram, Figure #1, for test sequences used. 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification. SAMPLE CODING 1. All samples were coded. Mated test samples remained with each other throughout the test group/sequences for which they were designated. Coding was performed in a manner which remained legible for the test duration. 2. The test samples were coded in the following manner: Seq A: Group Group Group Group A1 A2 A3 B Seq B: Group A1 Group A2 Seq C: Group A Seq D: Group A – – - A-A1-1, A-A1-2 A-A2-1, A-A2-2 A-A3-1, A-A3-2 A-B-1, A-B-2 - B-A1-1, B-A1-6, - B-A2-1, B-A2-6, B-A1-2, B-A1-7, B-A2-2, B-A2-7, B-A1-3, B-A1-4, B-A1-5, B-A1-8 B-A2-3, B-A2-4, B-A2-5, B-A2-8 - C-A-1, C-A-2, C-A-3, C-A-4, C-A-5, C-A-6, C-A-7, C-A-8 - D-A-1, D-A-2, D-A-3 Sample ID Key Board number Group Seq. Test Laboratory TR#209698, REV.1.0 5 of 76 Contech Research An Independent Test and Research Laboratory FIGURE #1 TEST PLAN FLOW DIAGRAM 209698 Samtec S2SD full qualification Part: S2SD-30-24-S-02.75-D-NUS (cable) Mating Part: T2M-130-01-L-D-TH (board) Sample Preparation Solder Joint Inspection Sequence b Sequence a DWV IR DWV DWV MATED UNMATED UNMATED Test to DWV *CABLE* *BOARD* Breakdown Test to Test to Voltage Thermal Breakdown Breakdown Shock Voltage Voltage (100 hours) UNMATED IR Sequence c LLCR LLCR LLCR Durability 50x Durability 100x Mechanical Shock LLCR LLCR LLCR Thermal Shock (100 hrs) MATED Thermal Shock (100 hrs) MATED Random Vibration LLCR LLCR Cyclic Humidity (240 hrs) MATED Cyclic Humidity (240 hrs) MATED LLCR LLCR Sequence d 50 Nanosecond Characterization Mechanical Shock Random Vibration LLCR DWV Cyclic Humidity (240 hrs) UNMATED IR DWV Group A1 2 pairs, mated Double cables Group A2 2 of part, unmated Double cables Group A3 2 of mating part, unmated Double cables Group B 2 pair, mated and unmated Double cables Group A1 176 points 8 mated pairs 12” single cables Group A2 176 points 8 mated pairs 12” single cables Group A 176 points, 8 mated pairs 12” single cables Group A 3 mated pairs 2.5” single cables 4th for antenna IR : Insulation Resistance DWV : Dielectric Withstanding Voltage LLCR : Low Level Circuit Resistance Test Laboratory TR#209698, REV.1.0 6 of 76 Contech Research An Independent Test and Research Laboratory DATA SUMMARY TEST REQUIREMENT RESULTS SEQUENCE A GROUP A1 DWV, BOTH MATED PAIRS BREAKDOWN 1200 VAC GROUP A2 DWV, 2 CABLES, UNMATED BREAKDOWN 1200 VAC GROUP A3 DWV, 2 BOARDS, UNMATED BREAKDOWN 2400 VAC INITIAL IR, MATED PAIRS IR, UNMATED DWV, MATED PAIRS DWV, UNMATED >5000 MEGOHMS >5000 MEGOHMS 900 VAC 900 VAC 50,000 MEGOHMS 50,000 MEGOHMS PASSED PASSED POST THERMAL SHOCK THERMAL SHOCK IR, MATED PAIRS IR, UNMATED DWV, MATED PAIRS DWV, UNMATED NO DAMAGE >5000 MEGOHMS >5000 MEGOHMS 900 VAC 900 VAC PASSED 50,000 MEGOHMS 50,000 MEGOHMS PASSED PASSED POST CYCLIC HUMIDITY CYCLIC HUMIDITY IR, MATED PAIR A-B-1 IR, UNMATED A-B-1 IR, MATED PAIR A-B-2 IR, UNMATED A-B-2 DWV, MATED PAIRS DWV, UNMATED NO DAMAGE >5000 MEGOHMS >5000 MEGOHMS >5000 MEGOHMS >5000 MEGOHMS 900 VAC 900 VAC PASSED 25,000 25,000 50,000 50,000 PASSED PASSED GROUP B MEGOHMS MEGOHMS MEGOHMS MEGOHMS -Continued on next page. Test Laboratory TR#209698, REV.1.0 7 of 76 Contech Research An Independent Test and Research Laboratory DATA SUMMARY -continued TEST REQUIREMENT RESULTS SEQUENCE B GROUP A1 LLCR DURABILITY LLCR THERMAL SHOCK LLCR CYCLIC HUMIDITY LLCR RECORD NO DAMAGE +10.0 M MAX.CHG. NO DAMAGE +10.0 M MAX.CHG. NO DAMAGE +10.0 M MAX.CHG. 34.6 M PASSED +2.4 M PASSED +2.7 M PASSED +3.3 M MAX. GROUP A2 LLCR DURABILITY LLCR THERMAL SHOCK LLCR CYCLIC HUMIDITY LLCR RECORD NO DAMAGE +10.0 M MAX.CHG. NO DAMAGE +10.0 M MAX.CHG. NO DAMAGE +10.0 M MAX.CHG. 34.0 M PASSED +3.4 M PASSED +2.1 M PASSED +4.5 M MAX. RECORD NO DAMAGE +10.0 M MAX.CHG. NO DAMAGE +10.0 M MAX.CHG. 32.9 M MAX. PASSED +2.7 M MAX.CHG. PASSED +2.8 M MAX.CHG. NO 50 NO 50 PASSED PASSED PASSED PASSED MAX.CHG. MAX.CHG. MAX.CHG. MAX.CHG. MAX.CHG. MAX.CHG. SEQUENCE C LLCR MECHANICAL SHOCK LLCR RANDOM VIBRATION LLCR SEQUENCE D MECHANICAL SHOCK RANDOM VIBRATION DAMAGE NANOSECOND DAMAGE NANOSECOND Test Laboratory TR#209698, REV.1.0 8 of 76 Contech Research An Independent Test and Research Laboratory EQUIPMENT LIST ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Ca l 14 34 95 150 192 200 315 421 466 7/13/2010 7/13/2009 12/1/2010 12/1/2009 5/27/2010 1/19/2011 5/27/2009 1/19/2010 4/14/2010 12/3/2010 3/31/2009 12/3/2009 Accelerometer Shock Machine AC Hypot Drill Press Stand Vertical Thermal Shock Power Supply X-Y Table Megohmeter Precision Resistor PCB Piezotronics Avco Peschell Instr. Craftsman Cincinnati Sub-Zero PCB Piezotronics NE Affiliated Tech. Hipotronics Co. Victoreen Co. 7040 1047 5570 N/A 88-11094 4210 N/A 031423-00 N/A See Cal Cert N/A ±3%Full Scale N/A See Cal Cert N/A N/A See Cal Cert ±1% 12mon Ea Test 12mon N/A 12mon 12mon N/A 12 mon. 12 mon. 545 553 585 614 628 681 1010 1028 1147 1166 5/8/2010 3/19/2011 8/28/2010 5/8/2009 3/19/2010 8/28/2009 10/20/2010 10/20/2009 2/16/2011 12/10/2010 8/24/2010 2/16/2010 12/10/2009 8/24/2009 Event Detector 12 channel Power Unit Digitizing Scope Oven Digital Thermometer Computer Plotter Event Detector Digital O-Scope Sine/Rndm Vib Control Digitizer Interface Mainframe Temp-humid-Chamber Amplifier Shaker Table Microohm mtr Data Aquisition Multimeter Anatech PCB Co. Hewlett Packard Co. Tenney Co. Omega Eng. ARC Co. Hewlett Packard Analysis Tech Tektronix Hewlett Packard 302A SM110-3 P10* 25921 VTS-1-5-3 482A XY-6060 HM3A 50,000 mego 32/64 EHD 483A 54200A TH Jr. DP 116 P166 7225B 32 EHD 11801C E1432A 941206 1303 2740A-02154 9712-510 6210125 N/A 2160A2293 981019 B030915 US39342279 See Cal Cert See Cal Cert ±2% See Manual ±1.1DegC N/A N/A See Cal.Cert. See Cal Cert. See Cal Cert 12mon 12mon 12mon Ea Test 12mon N/A N/A 12mon 12mon. 12mon Hewlett Packard Hewlett Packard Blue M. Unholtz Dickie Unholtz Dickie Keithley Keithley E8491B E8408A FRM-256B SA15 S202PB 580 2700 US390100753 US39000357 FRM277 3483 263 0803947 0914136 N/A N/A See Manual N/A N/A See Manual See Cal Cert N/A N/A Ea Test N/A N/A 12mon 12mon 1167 1168 1230 1271 1272 1278 1360 9/24/2010 2/2/2011 9/24/2009 2/2/2010 Contech Research Test Laboratory TR#209698, REV.1.0 9 of 76 An Independent Test and Research Laboratory EQUIPMENT LIST –continued ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Ca l 1426 1457 1521 1549 1550 1634 5045 1/19/2011 4/20/2010 2/2/2011 2/2/2011 9/11/2010 12/10/2010 11/19/2010 4/20/2009 2/2/2010 2/2/2010 9/11/2009 12/10/2009 Computer Precision Resistor Accelerometer Multiplexer Card Multiplexer Card Vibration Controller TDR -Sampling Head E-Machines Victorine PCB Keithley Keithley HP Agilent Tektroniks T2341 5KMOHM 353B04 7708 7708 E1434A SD-24 QL235-703-00880 465 118492 171629 171626 US38090307 B0221502 N/A See Cal Cert See Cal Cert See Cert See Cert See Cal Cert See Cal Cert N/A 12mon 12mon 12mon 12mon 12 mon 12 mon Contech Research Test Laboratory TR#209698, REV.1.0 10 of 76 An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A Group B Test Laboratory TR#209698, REV.1.0 11 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/1/2010 COMPLETE DATE: 3/1/2010 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 421, 466, 1457 -----------------------------------------------------------INSULATION RESISTANCE(IR) PURPOSE: To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 21. 2. Test Conditions: a) b) c) d) e) 3. Between Adjacent Contacts Mated Condition Mounting Condition Electrification Time Test Voltage : : : : : Yes Mated and Unmated Mounted and Unmounted 2.0 Minutes 500 VDC The test voltage was applied to specific test points on the test boards or cables. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, the insulation resistance shall not be less than 5,000 megohms. -----------------------------------------------------------RESULTS: See Next Page Test Laboratory TR#209698, REV.1.0 12 of 76 Contech Research An Independent Test and Research Laboratory RESULTS: 1. All test samples as tested met the requirements as specified. 2. Actual initial Insulation Resistance values: TEST SAMPLE RESULTS IR, IR, IR, IR, IR, IR, 50,000 50,000 50,000 50,000 50,000 50,000 MATED PAIR, A-B-1 UNMATED, S2SD CABLE UNMATED, T2M CONNECTOR MATED PAIR, A-B-2 UNMATED, S2SD CABLE UNMATED, T2M CONNECTOR Test Laboratory TR#209698, REV.1.0 13 of 76 MEGOHMS MEGOHMS MEGOHMS MEGOHMS MEGOHMS MEGOHMS Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/1/10 COMPLETE DATE: 3/2/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 95 -----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL) PURPOSE: 1. To determine if the connector can operate at its rated voltage and withstand momentary overpotentials due to switching, surges and other similar phenomenon. 2. To determine if the connectors maintain their dielectric integrity after being stressed by exposure to environmental conditioning. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 20. 2. Test Conditions: a) Between Adjacent Contacts b) Mated Condition c) Mounting Condition d) Hold Time e) Rate of Application f) Test Voltage g) Applied Voltage 3. : : : : : : : Yes Mated and Unmated Mounted and Unmounted 60 Seconds 500 volts/sec. 75% of Breakdown Voltage 900 VAC To determine the Applied Voltage as listed above, AC voltage was applied to the specified test points until breakdown. The Applied Voltage used was 75% of the minimum breakdown voltage as tested. The test samples were tested mated (Sequence a Group A1), and each S2SD cable and T2M connector was tested unmated (Sequence a Groups A2, A3)to determine the minimum breakdown voltage. -continued on next page. Test Laboratory TR#209698, REV.1.0 14 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE:-continued 4. The voltage was applied to specific test points on each board or cable. ------------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, there shall be no evidence of breakdown, arcing, etc. -----------------------------------------------------------RESULTS: All test samples as tested met the requirements as specified. Test Laboratory TR#209698, REV.1.0 15 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/4/10 COMPLETE DATE: 3/8/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 95, 192, 421, 466, 1360, 1457, 1549, 1550 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, Method A, Test Condition I. 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85°C +3C/-0C -55°C +0C/-3C 30 Minutes Unmated Mounted and Unmounted Instantaneous 3. The total number of cycles was performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -continued on next page. Test Laboratory TR#209698, REV.1.0 16 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 6. Testing was completed within 1 hour of removal of the samples from the chamber. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The insulation resistance shall not be less than 5,000 megohms. 3. When a 900 VAC test voltage is applied, there shall be no evidence of arcing, breakdown, etc. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The insulation resistance exceeded 5,000 megohms. 3. Post Thermal Shock Insulation resistance values: 4. TEST SAMPLE RESULTS IR, IR, IR, IR, IR, IR, 50,000 50,000 50,000 50,000 50,000 50,000 MATED PAIR, A-B-1 UNMATED, S2SD CABLE UNMATED, T2M CONNECTOR MATED PAIR, A-B-2 UNMATED, S2SD CABLE UNMATED, T2M CONNECTOR MEGOHMS MEGOHMS MEGOHMS MEGOHMS MEGOHMS MEGOHMS There was no evidence of arcing, breakdown, etc., when a 900 VAC voltage was applied. Test Laboratory TR#209698, REV.1.0 17 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/12/10 COMPLETE DATE: 3/22/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 95, 421, 466, 614, 628, 1230, 1360, 1457, 1549, 1550 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. Measurements made under high humidity conditions may reflect the peculiar conditions under which the readings were made, and should be compared only to initial readings when careful analysis indicates that such a comparison is valid and applicable. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, Test Condition B, Method III (omitting steps 7a and 7b). 2. Test Conditions: a) b) c) d) e) f) g) h) 3. Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : : 50°C ± 5°C 90% to 98% 25C to 65C No No Unmated Mounted and Unmounted 240 hours Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -continued on next page. Test Laboratory TR#209698, REV.1.0 18 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE:-continued 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. The voltage was applied to specific test points on the board or cable. 6. Testing was completed within 1 hour of removal of the samples from the chamber. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The insulation resistance shall not be less than 5,000 megohms. 3. There shall be no evidence of arcing or breakdown when a 900 VAC test voltage is applied. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The insulation resistance exceeded 5000 megohms. 3. Post Cyclic Humidity Insulation Resistance values: TEST SAMPLE IR, IR, IR, IR, IR, IR, 4. RESULTS MATED PAIR, A-B-1 UNMATED, S2SD CABLE UNMATED, T2M CONNECTOR MATED PAIR, A-B-2 UNMATED, S2SD CABLE UNMATED, T2M CONNECTOR 25,000 25,000 25,000 50,000 50,000 50,000 MEGOHMS MEGOHMS MEGOHMS MEGOHMS MEGOHMS MEGOHMS There was no evidence of breakdown, arcing, etc., when a 900 VAC test voltage was applied. Test Laboratory TR#209698, REV.1.0 19 of 76 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE B Group A1 Group A2 Test Laboratory TR#209698, REV.1.0 20 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 16 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 2/24/10 COMPLETE DATE: 2/24/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 681, 1278 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23. -continued on next page. Test Laboratory TR#209698, REV.1.0 21 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 2. Test Conditions: a) Test Current : 10 milliamps maximum b) Open Circuit Voltage : 20 millivolts c) No. of Positions Tested : 22 per test sample -----------------------------------------------------------REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (milliohms) 2. Sample ID# Avg. Max. Min. B-A1-1 B-A1-2 B-A1-3 B-A1-4 B-A1-5 B-A1-6 B-A1-7 B-A1-8 29.5 29.6 29.6 29.7 29.4 29.7 30.0 30.0 30.1 32.6 32.3 32.6 31.3 32.0 34.6 31.6 29.0 29.1 28.9 28.9 28.5 28.4 29.0 29.8 B-A2-1 B-A2-2 B-A2-3 B-A2-4 B-A2-5 B-A2-6 B-A2-7 B-A2-8 29.7 30.1 29.6 29.4 29.6 29.7 29.6 29.6 33.7 34.0 33.0 29.8 30.3 31.3 29.9 30.7 29.1 29.1 29.0 28.9 29.2 29.3 29.1 29.0 See data files 20969801 through 20969816 for individual data points. Test Laboratory TR#209698, REV.1.0 22 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 16 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 2/25/10 COMPLETE DATE: 2/26/10 -----------------------------------------------------------ROOM AMBIENT: 21°C RELATIVE HUMIDITY: 28% -----------------------------------------------------------EQUIPMENT ID#: 150, 315, 681, 1278 -----------------------------------------------------------DURABILITY PURPOSE: 1. This is a conditioning sequence which is used to induce the type of wear on the contacting surfaces which may occur under normal service conditions. The connectors are mated and unmated a predetermined number of cycles. Upon completion, the units being evaluated are exposed to the environments as specified to assess any impact on electrical stability resulting from wear or other wear dependent phenomenon. 2. This type of conditioning sequence is also used to mechanically stress the connector system as would normally occur in actual service. This sequence in conjunction with other tests is used to determine if a significant loss of contact pressure occurs from said stresses which in turn, may result in an unstable electrical condition to exist. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 09. 2. Test Conditions: a) No. of Cycles : 50 – Group A1; 100 – Group A2 b) Rate : 1.0 inch per minute 3. The part (cable) was assembled to special holding devices; the mating part (LLCR board) was attached to an X-Y table. Speed is approximate. -continued on next page. Test Laboratory TR#209698, REV.1.0 23 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE:–continued 4. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement. 5. Care was taken to prevent the mating faces of the test samples from contacting each other. 6. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples so tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# B-A1-1 B-A1-2 B-A1-3 B-A1-4 B-A1-5 B-A1-6 B-A1-7 B-A1-8 Avg. Change Max. Change -0.1 +0.1 -0.1 +0.3 +0.2 +0.1 -0.0 -0.4 +0.3 +0.8 +0.3 +2.4 +0.8 +1.1 +0.6 +1.2 -continued on next page. Test Laboratory TR#209698, REV.1.0 24 of 76 Contech Research An Independent Test and Research Laboratory RESULTS:–continued CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# B-A2-1 B-A2-2 B-A2-3 B-A2-4 B-A2-5 B-A2-6 B-A2-7 B-A2-8 3. Avg. Change Max. Change -0.1 -0.1 -0.1 -0.0 -0.1 -0.2 -0.1 +0.0 +3.4 +0.5 +0.7 +0.3 +0.4 +1.7 +0.2 +1.2 See data files 20969801 through 20969816 for individual data points. Test Laboratory TR#209698, REV.1.0 25 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 16 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/4/10 COMPLETE DATE: 3/8/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 192, 681, 1278, 1360, 1549, 1550 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, Method A, Test Condition I. 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85C +3C/-0C -55C +0C/-3C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles were performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#209698, REV.1.0 26 of 76 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Avg. Change Max. Change B-A1-1 B-A1-2 B-A1-3 B-A1-4 B-A1-5 B-A1-6 B-A1-7 B-A1-8 +0.4 +0.5 +0.1 +0.2 +0.3 +0.1 -0.4 -0.2 +0.7 +2.7 +0.4 +1.1 +1.5 +1.1 +0.7 +2.2 B-A2-1 B-A2-2 B-A2-3 B-A2-4 B-A2-5 B-A2-6 B-A2-7 B-A2-8 -0.4 -0.2 +0.1 +0.0 -0.0 +0.3 +0.0 +0.2 +0.3 +0.8 +0.7 +0.3 +0.4 +1.7 +0.3 +2.1 Sample ID# 3. See data files 20969801 through 20969816 for individual data points. Test Laboratory TR#209698, REV.1.0 27 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 16 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/12/10 COMPLETE DATE: 3/22/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 24% -----------------------------------------------------------EQUIPMENT ID#: 614, 628, 681, 1230, 1278, 1360, 1549, 1550 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as: a) Fretting corrosion due to wear resulting from micromotion, induced by thermal cycling. Humidity accelerates the oxidation process. b) Oxidation of wear debris or from particulates from the surrounding atmosphere which may have become entrapped between the contacting surfaces. c) Failure mechanisms resulting from a wet oxidation process. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, Test Condition B, Method III (omitting steps 7a and 7b) with the following conditions. -continued on next page. Test Laboratory TR#209698, REV.1.0 28 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE:–continued 2. Test Conditions: a) b) c) d) e) f) g) h) Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : : 50C ± 5C 90% to 98% 25C to 65C No No Mated Mounted 240 hours 3. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# B-A1-1 B-A1-2 B-A1-3 B-A1-4 B-A1-5 Avg. Change Max. Change +0.2 +0.5 +0.8 +0.6 +1.2 +2.2 +2.7 +2.9 +3.3 +2.7 -continued on next page. Test Laboratory TR#209698, REV.1.0 29 of 76 Contech Research An Independent Test and Research Laboratory RESULTS -continued CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Avg. Change Max. Change B-A1-6 B-A1-7 B-A1-8 +0.3 -0.5 +0.6 +1.2 +0.3 +2.8 B-A2-1 B-A2-2 B-A2-3 B-A2-4 B-A2-5 B-A2-6 B-A2-7 B-A2-8 -0.2 +0.2 +0.4 +0.2 +0.6 +1.1 +0.4 +0.5 +0.5 +1.7 +2.9 +0.6 +4.5 +3.8 +2.1 +3.4 Sample ID# 3. See data files 20969801 through 20969816 for individual data points. Test Laboratory TR#209698, REV.1.0 30 of 76 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES FILE NUMBERS 20969801 20969802 20969803 20969804 20969805 20969806 20969807 20969808 20969809 20969810 20969811 20969812 20969813 20969814 20969815 20969816 Test Laboratory TR#209698, REV.1.0 31 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-1 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969801 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50 X 22 23 08Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.4 29.2 30.1 29.2 29.2 29.2 29.9 29.6 29.0 29.2 29.3 29.4 29.4 29.6 29.5 29.5 29.6 29.4 29.7 29.9 29.8 29.3 -1.4 -0.1 -0.7 0.2 0.2 0.3 -0.2 0.2 0.0 0.1 0.2 0.2 0.0 -0.1 0.2 -1.0 0.1 0.0 0.0 -0.3 0.3 0.0 0.4 0.2 -0.4 0.6 0.5 0.4 0.1 0.5 0.5 0.5 0.4 0.4 0.3 0.4 0.5 0.6 0.2 0.6 0.7 0.5 0.5 0.5 1.2 0.1 -0.7 0.0 0.0 0.0 0.4 0.1 0.1 0.4 0.0 -0.1 0.0 0.1 0.0 0.3 0.3 0.0 0.4 0.4 2.2 -0.1 MAX MIN AVG STD Open Tech 30.1 29.0 29.5 0.3 0 S-R 0.3 -1.4 -0.1 0.4 0 S-R 0.7 -0.4 0.4 0.2 0 S-R 2.2 -0.7 0.2 0.6 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 32 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-2 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969802 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50 X 22 23 08Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.2 29.2 30.1 29.7 29.4 29.6 29.6 29.2 29.6 29.5 29.1 30.7 29.4 29.5 29.4 29.3 29.3 29.4 29.6 32.6 29.2 29.3 0.0 -0.1 0.2 -0.2 0.0 0.1 0.1 0.2 -0.2 0.0 0.0 0.2 0.0 -0.2 0.6 0.0 -0.1 -0.2 -0.1 0.8 0.0 0.0 0.3 0.2 0.3 0.2 0.4 0.8 0.9 0.5 0.2 0.4 0.3 0.4 0.4 0.2 0.7 0.3 0.4 0.3 0.3 2.7 0.7 0.5 0.4 0.4 1.2 0.2 0.4 0.9 0.7 1.0 0.0 0.1 0.0 2.7 0.1 0.0 0.4 -0.1 0.0 -0.1 0.1 2.6 0.2 0.1 MAX MIN AVG STD Open Tech 32.6 29.1 29.6 0.8 0 S-R 0.8 -0.2 0.1 0.2 0 S-R 2.7 0.2 0.5 0.5 0 S-R 2.7 -0.1 0.5 0.8 0 S-R Equip ID 681 1278 681 1279 681 1280 681 1281 Test Laboratory TR#209698, REV.1.0 33 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-3 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969803 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50X 22 23 08Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.4 30.0 29.3 29.5 29.4 29.5 32.3 29.5 30.2 29.2 29.4 29.3 29.4 29.1 29.2 29.5 29.5 29.5 29.2 28.9 29.5 29.4 0.0 0.3 0.0 -0.2 0.0 -0.2 0.0 0.0 0.3 0.1 -0.1 0.0 -0.1 0.0 0.0 -0.2 -0.1 -0.3 -0.3 -0.1 -0.2 -0.1 0.2 -0.2 0.1 0.4 0.3 0.3 -1.0 0.2 0.1 0.1 0.3 0.3 0.3 0.2 0.3 0.2 0.2 0.1 0.2 0.3 0.1 0.3 0.6 1.0 -0.1 1.7 0.2 0.5 2.3 0.2 1.3 0.5 1.4 0.6 0.3 1.3 0.1 0.0 0.8 -0.1 2.9 0.7 0.2 1.8 MAX MIN AVG STD Open Tech 32.3 28.9 29.6 0.7 0 S-R 0.3 -0.3 -0.1 0.2 0 S-R 0.4 -1.0 0.1 0.3 0 S-R 2.9 -0.1 0.8 0.8 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 34 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-4 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969804 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.3 29.4 29.1 29.4 29.0 29.6 29.4 29.4 29.3 29.6 29.9 29.3 29.6 29.4 30.4 32.6 29.4 29.2 31.4 28.9 29.4 29.4 -0.1 -0.1 0.0 -0.1 -0.1 0.5 -0.1 0.0 0.3 0.0 -0.2 -0.1 0.2 0.0 0.6 2.1 0.0 0.4 2.4 0.6 0.1 0.1 0.2 0.2 0.2 0.0 -0.1 0.2 0.2 -0.1 0.0 0.1 -0.3 -0.1 0.0 0.1 0.0 0.9 0.0 0.6 1.1 0.7 0.2 0.0 0.1 0.5 0.4 0.1 0.0 0.9 0.4 0.9 0.8 0.4 -0.1 0.2 1.1 0.3 0.2 1.6 0.1 0.6 3.3 0.8 0.6 0.6 MAX MIN AVG STD Open Tech 32.6 28.9 29.7 0.8 0 S-R 2.4 -0.2 0.3 0.7 0 S-R 1.1 -0.3 0.2 0.3 0 S-R 3.3 -0.1 0.6 0.7 0.0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 35 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-5 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969805 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.3 29.2 31.3 28.9 29.9 29.4 29.4 29.3 29.8 30.7 29.1 29.4 29.4 29.3 29.4 29.1 29.3 29.4 28.5 29.0 29.2 29.1 0.1 0.1 0.2 0.0 0.0 0.2 0.2 0.1 -0.2 0.8 0.1 0.3 0.0 0.1 0.1 0.2 0.1 -0.1 0.8 0.0 0.1 0.3 0.6 0.3 1.4 0.1 0.2 0.0 0.3 0.3 -0.3 1.5 0.3 1.4 0.1 0.1 0.2 0.3 -0.4 -0.6 0.4 0.2 0.2 0.3 1.1 0.3 2.7 2.6 1.1 2.2 0.5 0.6 1.4 2.1 1.7 2.4 0.3 0.8 0.6 1.3 0.0 -0.1 2.3 0.8 0.6 0.6 MAX MIN AVG STD Open Tech 31.3 28.5 29.4 0.6 0 S-R 0.8 -0.2 0.2 0.2 0 S-R 1.5 -0.6 0.3 0.5 0 S-R 2.7 -0.1 1.2 0.9 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 36 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-6 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969806 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.4 29.3 29.2 31.9 29.6 29.6 30.1 29.8 29.4 29.5 29.2 29.2 30.1 28.4 30.0 29.2 29.2 29.7 29.4 30.0 32.0 29.1 0.3 -0.1 0.0 -1.1 -0.1 0.1 0.9 -0.4 0.1 -0.1 0.0 0.2 -0.3 -0.4 0.1 0.0 0.0 0.2 -0.1 1.1 0.7 0.0 0.1 -0.1 0.0 -0.8 0.0 0.1 -0.1 -0.3 0.1 0.0 0.0 0.0 1.0 0.2 0.1 0.0 0.0 0.6 -0.1 1.1 -0.4 0.0 0.5 0.2 0.2 -0.1 0.2 0.4 0.8 -0.1 0.4 0.3 0.1 0.2 1.0 -0.5 0.4 0.1 0.3 1.0 0.1 1.2 -0.7 0.1 MAX MIN AVG STD Open Tech 32.0 28.4 29.7 0.8 0 S-R 1.1 -1.1 0.1 0.4 0 S-R 1.1 -0.8 0.1 0.4 0 S-R 1.2 -0.7 0.3 0.4 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 37 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-7 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969807 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.6 29.2 29.8 32.8 30.5 31.2 34.6 30.2 29.3 29.9 29.0 29.2 29.2 29.1 30.0 29.4 29.5 29.8 29.4 29.3 29.5 29.7 0.0 0.0 -0.2 0.6 -0.1 0.4 -0.8 -0.5 -0.1 -0.4 0.1 0.0 0.0 0.1 0.5 0.1 0.1 0.1 0.1 0.1 0.1 0.1 -0.5 0.0 -0.2 -0.2 -1.1 -1.8 -2.2 -1.0 -0.4 -0.8 0.1 0.0 -0.1 0.1 -0.2 0.0 0.7 -0.2 -0.3 0.2 -0.1 -0.1 -0.2 -0.4 0.3 -3.1 -1.0 -1.3 -3.4 -0.3 -0.4 -1.3 0.1 0.0 0.3 0.2 -0.2 0.0 0.0 0.0 0.0 -0.2 -0.1 0.1 MAX MIN AVG STD Open Tech 34.6 29.0 30.0 1.3 0 S-R 0.6 -0.8 0.0 0.3 0 S-R 0.7 -2.2 -0.4 0.7 0 S-R 0.3 -3.4 -0.5 1.0 0.0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 38 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A1-8 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969808 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 50X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.9 29.8 29.9 30.2 29.9 30.1 30.1 29.9 31.6 29.9 30.3 29.9 30.1 29.9 30.0 29.8 29.9 30.0 30.0 29.8 29.8 29.8 -0.6 -0.5 -0.3 -0.3 -0.4 -0.7 -0.5 -0.3 1.2 -0.6 -0.2 -0.6 -0.6 -0.4 -0.6 -0.4 -0.4 -0.5 -0.5 -0.3 -0.4 -0.4 -0.4 -0.6 -0.3 0.1 -0.1 -0.4 -0.5 2.2 -2.1 0.2 -0.9 -0.1 -0.5 -0.3 -0.4 -0.2 -0.2 0.0 -0.5 0.1 -0.2 -0.1 -0.3 1.6 2.0 1.8 0.6 2.8 0.5 0.4 2.4 -0.2 0.1 1.7 -0.1 0.1 -0.2 1.1 0.0 -0.1 -0.1 0.0 0.2 0.0 MAX MIN AVG STD Open Tech 31.6 29.8 30.0 0.4 0 S-R 1.2 -0.7 -0.4 0.4 0 S-R 2.2 -2.1 -0.2 0.7 0 S-R 2.8 -0.3 0.6 1.0 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 39 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-1 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969809 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.5 29.5 29.5 29.6 29.5 29.4 29.3 29.5 29.1 29.1 29.5 29.3 29.4 33.7 29.7 29.5 29.7 29.8 29.4 29.8 29.8 30.0 -0.3 -0.3 -0.2 -0.2 1.2 -0.3 -0.1 -0.5 -0.2 0.2 -0.3 0.2 3.4 -4.1 -0.1 0.1 0.0 -0.3 0.3 0.0 -0.1 -0.5 -0.4 -0.3 -0.1 -0.4 -0.1 -0.2 0.0 -0.5 -0.1 0.3 -0.5 -0.1 0.2 -4.3 -0.4 0.0 -0.3 -0.4 0.0 -0.2 -0.1 -0.7 -0.4 -0.1 -0.1 0.2 0.5 0.4 0.0 0.2 0.3 0.4 -0.4 0.1 0.2 -4.2 -0.3 0.0 -0.3 -0.4 0.2 -0.5 -0.2 -0.7 MAX MIN AVG STD Open Tech 33.7 29.1 29.7 0.9 0 S-R 3.4 -4.1 -0.1 1.2 0 S-R 0.3 -4.3 -0.4 0.9 0 S-R 0.5 -4.2 -0.2 1.0 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 40 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-2 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969810 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.5 33.6 29.5 29.6 34.0 29.7 29.3 29.6 31.9 31.1 29.5 29.6 29.4 29.4 29.4 29.1 29.4 29.3 29.6 29.6 30.2 29.5 -0.1 0.5 -0.1 0.1 -0.6 -0.2 -0.2 -0.4 -0.1 -1.0 0.0 -0.1 0.0 -0.1 -0.2 0.1 -0.1 0.2 -0.1 0.5 -0.7 -0.1 0.1 -2.1 0.0 0.2 0.8 0.1 0.1 -0.1 -1.2 -1.7 -0.1 -0.2 -0.2 -0.1 -0.2 0.1 -0.1 0.1 -0.1 0.5 -0.5 0.1 0.0 -1.2 0.0 0.5 0.8 0.2 0.3 0.1 -1.2 -1.0 0.2 0.7 0.1 0.5 0.1 0.3 0.2 0.5 0.5 1.4 0.0 1.7 MAX MIN AVG STD Open Tech 34.0 29.1 30.1 1.4 0 S-R 0.5 -1.0 -0.1 0.3 0 S-R 0.8 -2.1 -0.2 0.7 0 S-R 1.7 -1.2 0.2 0.7 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 41 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-3 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 20969811 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.5 29.3 29.3 29.5 29.9 29.5 29.6 29.4 29.5 29.2 29.4 29.6 29.5 29.7 29.4 29.5 29.8 29.0 29.9 29.3 33.0 29.3 -0.1 -0.1 -0.2 -0.3 -0.3 -0.2 -0.4 -0.2 -0.1 0.0 0.0 -0.2 -0.2 -0.2 -0.1 -0.1 -0.1 0.7 -0.2 0.0 -0.8 0.0 -0.1 0.1 0.0 0.0 0.2 -0.1 -0.2 -0.1 0.0 0.1 0.1 0.0 -0.1 -0.1 0.0 0.1 0.1 0.7 0.0 0.4 0.1 0.1 0.0 0.3 0.3 0.4 0.6 0.0 -0.2 0.2 0.1 0.6 0.5 0.3 0.2 0.1 0.2 0.1 0.2 0.5 0.4 -0.1 2.9 0.4 MAX MIN AVG STD Open Tech 33.0 29.0 29.6 0.8 0 S-R 0.7 -0.8 -0.1 0.2 0 S-R 0.7 -0.2 0.1 0.2 0 S-R 2.9 -0.2 0.4 0.6 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 42 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-4 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 209698012 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.4 29.2 29.4 29.4 29.6 29.5 28.9 29.2 29.2 29.1 29.4 29.1 29.4 29.4 29.1 29.5 29.3 29.4 29.4 29.5 29.6 29.8 0.1 0.2 0.1 0.0 0.0 -0.1 0.3 -0.2 -0.1 0.0 -0.1 0.0 -0.2 -0.2 0.1 -0.1 0.0 -0.1 0.0 0.0 -0.1 0.0 0.1 0.0 -0.1 0.0 0.1 -0.1 0.1 -0.1 -0.1 0.1 -0.1 -0.1 0.1 -0.1 0.0 0.0 0.1 -0.1 0.2 0.0 0.3 0.1 0.3 0.1 0.1 0.1 0.6 0.2 0.3 0.2 0.2 0.1 0.1 0.1 0.1 0.1 0.2 0.1 0.2 0.0 0.2 0.0 0.3 0.3 MAX MIN AVG STD Open Tech 29.8 28.9 29.4 0.2 0 S-R 0.3 -0.2 0.0 0.1 0 S-R 0.3 -0.1 0.0 0.1 0 S-R 0.6 0.0 0.2 0.1 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 43 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-5 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 209698013 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.7 29.6 30.3 29.5 29.5 29.6 29.2 29.3 29.4 29.6 29.5 29.3 29.5 29.4 29.6 29.6 29.7 29.4 29.5 29.9 29.6 29.8 -0.4 -0.5 -0.1 -0.2 0.2 0.0 0.4 0.1 0.0 -0.2 -0.1 0.0 0.0 0.0 -0.4 -0.3 0.1 -0.1 -0.1 -0.6 -0.1 -0.1 -0.4 -0.4 -0.3 0.0 0.3 0.0 0.4 0.0 0.0 0.0 0.0 0.1 0.1 0.1 -0.2 -0.1 0.2 0.0 -0.1 -0.5 0.0 0.0 -0.3 -0.4 -0.1 0.5 0.7 3.2 4.5 0.4 0.2 0.1 0.3 0.2 1.5 0.3 0.0 1.3 0.4 0.1 0.0 0.4 0.2 0.1 MAX MIN AVG STD Open Tech 30.3 29.2 29.6 0.2 0 S-R 0.4 -0.6 -0.1 0.2 0 S-R 0.4 -0.5 0.0 0.2 0 S-R 4.5 -0.4 0.6 1.2 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 44 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-6 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 209698014 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.4 29.7 29.5 29.7 30.0 30.2 31.3 29.3 29.7 29.7 29.6 29.5 30.7 29.4 29.3 29.7 29.3 29.7 29.7 29.5 29.4 29.4 1.7 -0.3 0.0 -0.2 -0.4 -0.6 -1.9 0.3 -0.5 -0.2 0.0 0.2 -1.5 -0.3 -0.3 -0.1 -0.1 -0.3 -0.2 0.0 -0.3 -0.1 0.2 0.0 0.4 0.1 0.1 0.5 1.7 0.1 0.1 0.1 0.1 0.0 1.7 0.0 0.2 0.8 0.2 0.1 0.4 -0.1 -0.1 0.2 0.4 0.6 3.8 0.6 0.0 1.6 3.0 1.5 0.6 1.6 1.1 1.7 1.8 0.4 2.3 1.0 1.3 0.4 0.2 0.3 0.3 0.5 MAX MIN AVG STD Open Tech 31.3 29.3 29.7 0.5 0 S-R 1.7 -1.9 -0.2 0.7 0 S-R 1.7 -0.1 0.3 0.5 0 S-R 3.8 0.0 1.1 1.0 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 45 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-7 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 209698015 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.6 29.9 29.1 29.6 29.6 29.6 29.5 29.9 29.4 29.9 29.8 29.9 29.4 29.3 29.2 29.7 29.5 29.4 29.5 29.7 29.2 29.8 -0.1 -0.4 0.0 0.1 0.0 0.1 0.0 0.0 -0.1 -0.2 -0.2 0.0 -0.1 0.0 0.0 0.0 -0.2 0.2 0.0 -0.1 0.1 -0.4 0.0 -0.2 0.0 0.0 0.0 0.0 0.0 0.0 0.0 -0.2 -0.1 -0.1 0.0 0.1 0.0 0.2 -0.1 0.3 0.3 0.0 0.1 -0.2 0.2 -0.2 0.3 2.1 0.1 0.2 0.1 0.2 0.0 0.2 0.1 0.1 0.0 1.2 0.2 0.3 1.8 0.4 0.6 0.1 0.3 0.2 MAX MIN AVG STD Open Tech 29.9 29.1 29.6 0.2 0 S-R 0.2 -0.4 -0.1 0.2 0 S-R 0.3 -0.2 0.0 0.1 0 S-R 2.1 -0.2 0.4 0.6 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 46 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# B-A2-8 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "b" 209698016 S-R 10ma 22 24 24Feb10 Initial 22 24 01Mar10 Dura 100X 21 24 09Mar10 T.Shock 20 33 22Mar10 Humidity 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 30.7 29.7 29.5 30.0 29.2 29.5 29.4 29.4 29.3 29.7 30.2 29.5 29.7 29.4 30.1 29.7 29.9 29.0 29.8 29.5 29.6 29.3 1.2 -0.7 -0.2 0.1 0.6 0.0 0.0 0.1 -0.1 -0.2 -0.8 -0.2 -0.3 -0.2 0.2 0.1 -0.1 0.8 0.0 0.0 0.1 0.1 0.2 0.1 0.0 0.3 2.1 0.2 0.2 0.3 0.1 0.2 -0.5 -0.1 -0.2 -0.1 0.5 0.2 1.3 0.1 0.2 -0.2 0.0 0.1 1.9 -0.3 0.6 1.2 1.0 0.1 0.1 0.7 0.2 0.3 -0.4 0.2 -0.2 0.1 0.7 0.4 3.4 0.2 1.1 0.2 0.1 0.2 MAX MIN AVG STD Open Tech 30.7 29.0 29.6 0.4 0 S-R 1.2 -0.8 0.0 0.4 0 S-R 2.1 -0.5 0.2 0.5 0 S-R 3.4 -0.4 0.5 0.8 0 S-R Equip ID 681 1278 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 47 of 76 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE C Group A Test Laboratory TR#209698, REV.1.0 48 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/15/10 COMPLETE DATE: 3/15/10 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 30% -----------------------------------------------------------EQUIPMENT ID#: 681, 1278 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23. -continued on next page. Test Laboratory TR#209698, REV.1.0 49 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE:–continued 2. Test Conditions: a) Test Current : 10 milliamps b) Open Circuit Voltage : 20 millivolts c) No. of positions tested : 22 per sample -----------------------------------------------------------REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 2. Avg. 29.5 29.8 30.8 30.0 30.2 30.3 29.9 30.3 Max. Min. 30.1 32.1 32.9 31.1 31.4 31.1 30.9 32.8 28.8 28.9 28.9 28.8 29.2 29.6 29.1 28.4 See data files 20969825 through 20969832 for individual data points. Test Laboratory TR#209698, REV.1.0 50 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/17/10 COMPLETE DATE: 3/17/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 26% -----------------------------------------------------------EQUIPMENT ID#: 34, 200, 585, 681, 1010, 1278, 1521 -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27, Test Condition C. 2. Test Conditions: a) b) c) d) e) Peak Value Duration Wave Form Velocity No. of Shocks : : : : : 100 G 6 Milliseconds Half-Sine 12.3 feet per second 3 Shocks/Direction, 3 Axes (18 Total) 3. A stabilizing medium was used such that the mated test samples did not separate during testing. 4. Figure #2 illustrates the test sample fixturing utilized during the test. 5. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#209698, REV.1.0 51 of 76 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 Avg. Change Max. Change +0.2 +0.0 +0.5 +0.3 +0.1 +0.1 +0.2 +0.2 +0.7 +0.3 +2.7 +2.1 +0.6 +0.9 +0.4 +0.7 3. See data files 20969825 through 20969832 for individual data points. 4. The Mechanical Shock characteristics are shown in Figures #3 (Calibration Pulse) and #4 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification. Test Laboratory TR#209698, REV.1.0 52 of 76 Contech Research An Independent Test and Research Laboratory FIGURE #2 Test Laboratory TR#209698, REV.1.0 53 of 76 Contech Research An Independent Test and Research Laboratory FIGURE #3 Test Laboratory TR#209698, REV.1.0 Contech Research 54 of 76 An Independent Test and Research Laboratory FIGURE #4 Test Laboratory TR#209698, REV.1.0 Contech Research 55 of 76 An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/18/10 COMPLETE DATE: 3/22/10 -----------------------------------------------------------ROOM AMBIENT: 21°C RELATIVE HUMIDITY: 28% -----------------------------------------------------------EQUIPMENT ID#: 14, 553, 681, 1166, 1167, 1168, 1271, 1272, 1278, 1426, 1634 -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To establish the mechanical integrity of the test samples exposed to external mechanical stresses. 2. To determine if the contact system is susceptible to fretting corrosion. 3. To determine if the electrical stability of the system has degraded when exposed to a vibratory environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 28, Test Condition V, Letter B. 2. Test Conditions: a) b) c) d) Power Spectral Density : 0.04 g2/Hz G ’rms’ : 7.56 Frequency : 50 to 2000 Hz Duration : 2.0 hrs per axis, 3 axes total 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. Figure #5 illustrates the test sample fixturing utilized during the test. -continued on next page. Test Laboratory TR#209698, REV.1.0 56 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE:-continued 5. All subsequent variable testing was performed in accordance with procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (milliohms) Sample ID# C-A-1 C-A-2 C-A-3 C-A-4 C-A-5 C-A-6 C-A-7 C-A-8 3. Avg. Change Max. Change -0.2 +0.1 +0.5 +0.3 +0.1 +0.2 +0.4 +0.3 +0.7 +0.8 +2.8 +1.3 +0.5 +0.7 +1.3 +1.0 See data files 20969825 through 20969832 for individual data points. Test Laboratory TR#209698, REV.1.0 57 of 76 Contech Research An Independent Test and Research Laboratory FIGURE #5 Test Laboratory TR#209698, REV.1.0 58 of 76 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES DATA FILE NUMBERS 20969825 20969826 20969827 20969828 20969829 20969830 20969831 20969832 Test Laboratory TR#209698, REV.1.0 59 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-1 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 20969825 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.8 29.2 29.6 29.8 30.1 30.1 29.9 29.8 29.4 29.7 29.2 29.1 29.0 29.1 29.2 29.7 29.4 28.9 29.0 29.7 29.5 28.8 0.2 0.1 0.2 0.0 0.5 0.1 0.6 0.0 0.7 0.0 0.5 0.0 0.0 0.1 0.0 0.2 0.0 0.0 -0.1 0.1 0.4 0.0 -0.6 0.0 -0.6 -0.6 0.1 -1.0 -0.7 -0.1 0.7 -0.7 0.7 -0.3 0.1 0.1 0.0 -0.5 -0.4 0.1 0.0 -0.4 0.2 0.1 MAX MIN AVG STD Open Tech 30.1 28.8 29.5 0.4 0 S-R 0.7 -0.1 0.2 0.2 0 S-R 0.7 -1.0 -0.2 0.4 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 60 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-2 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 20969826 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.6 29.9 29.9 30.1 29.7 32.1 31.2 31.7 31.0 29.5 29.8 29.4 29.3 29.6 29.2 29.1 29.2 28.9 29.1 29.5 29.6 29.0 0.3 0.1 0.2 -0.1 0.0 0.0 -0.1 -0.1 0.1 -0.1 0.0 0.0 0.1 0.1 0.0 -0.1 0.0 0.2 -0.2 0.1 0.0 0.1 0.2 0.1 0.0 -0.2 0.0 0.0 -0.1 0.1 0.1 0.1 0.0 -0.1 0.1 0.2 0.1 0.3 0.0 0.3 0.2 0.6 -0.2 0.8 MAX MIN AVG STD Open Tech 32.1 28.9 29.8 0.9 0 S-R 0.3 -0.2 0.0 0.1 0 S-R 0.8 -0.2 0.1 0.2 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 61 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-3 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 20969827 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 32.2 30.5 31.4 32.9 32.5 32.8 31.9 31.2 31.2 31.3 30.5 30.5 30.1 29.9 29.7 29.3 28.9 29.7 30.2 30.7 30.6 30.4 0.1 0.0 0.1 -0.2 -0.1 0.9 0.1 0.5 -0.1 0.1 0.2 0.1 0.4 0.5 0.1 0.6 0.4 0.7 2.7 1.9 0.8 0.5 0.2 0.0 0.1 -0.3 0.4 0.7 -0.1 1.0 0.1 0.2 0.2 0.2 0.6 0.7 -0.3 0.7 -0.4 0.3 0.1 2.8 2.2 0.7 MAX MIN AVG STD Open Tech 32.9 28.9 30.8 1.1 0 S-R 2.7 -0.2 0.5 0.7 0 S-R 2.8 -0.4 0.5 0.8 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 62 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-4 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 20969828 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 30.2 30.7 30.6 30.4 28.8 31.1 30.5 30.6 30.9 30.5 29.9 30.0 29.9 30.0 29.7 29.4 28.9 28.9 28.8 30.7 29.4 29.8 -0.1 0.6 0.8 -0.2 -0.3 0.2 -0.1 -0.1 0.1 0.3 0.1 0.1 0.1 0.1 0.1 -0.1 0.4 0.2 0.0 1.5 0.2 2.1 0.0 -0.3 1.3 0.2 0.5 0.4 -0.1 0.5 0.3 0.3 0.2 0.3 0.3 0.2 0.2 0.1 0.4 0.2 0.3 1.0 0.8 -0.1 MAX MIN AVG STD Open Tech 31.1 28.8 30.0 0.7 0 S-R 2.1 -0.3 0.3 0.6 0 S-R 1.3 -0.3 0.3 0.4 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 63 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-5 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 20969829 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 29.3 29.6 30.9 31.3 31.4 31.4 31.0 30.7 30.9 30.6 30.3 29.3 29.3 29.4 29.2 29.3 29.8 29.7 30.5 30.6 29.9 30.4 0.1 -0.2 0.1 -0.2 0.0 0.3 0.0 0.1 0.1 0.0 0.1 0.1 0.0 0.0 0.2 0.1 0.0 0.6 -0.1 -0.1 0.1 0.0 0.3 -0.2 0.1 0.0 0.2 0.1 0.1 0.5 0.0 0.1 0.3 0.3 0.2 0.2 0.5 -0.6 0.1 -0.1 0.2 0.3 -0.1 0.3 MAX MIN AVG STD Open Tech 31.4 29.2 30.2 0.8 0 S-R 0.6 -0.2 0.1 0.2 0 S-R 0.5 -0.6 0.1 0.3 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 64 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-6 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 209698030 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 30.5 30.5 31.0 30.7 30.9 31.1 30.7 30.6 30.7 30.5 30.1 29.9 29.9 29.6 29.7 29.9 30.4 31.0 30.1 30.0 30.1 29.8 -0.2 0.0 0.2 0.0 0.0 0.1 0.1 0.1 -0.1 0.2 0.1 0.0 -0.2 0.4 0.1 0.1 0.2 -0.3 0.2 0.9 0.1 0.1 0.1 0.2 0.3 0.2 0.2 0.2 0.4 0.2 0.1 0.3 0.5 0.2 0.1 0.1 0.2 0.1 0.1 -1.2 0.4 0.7 0.2 0.3 MAX MIN AVG STD Open Tech 31.1 29.6 30.3 0.5 0 S-R 0.9 -0.3 0.1 0.2 0 S-R 0.7 -1.2 0.2 0.3 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 65 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-7 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 20969831 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 30.0 30.6 30.7 30.6 30.9 30.6 30.4 30.3 30.8 29.5 29.9 29.7 29.6 29.5 29.2 29.1 29.7 29.4 29.2 29.4 29.6 29.6 0.0 0.1 0.2 -0.1 0.2 0.3 0.2 0.3 0.3 0.4 0.2 0.2 0.2 0.2 0.2 0.1 0.2 0.3 0.2 0.3 0.3 0.1 0.1 0.3 0.4 0.4 0.5 1.3 0.3 0.5 0.3 0.4 0.1 0.3 0.3 0.3 0.3 0.3 0.3 0.5 0.2 0.5 0.3 0.2 MAX MIN AVG STD Open Tech 30.9 29.1 29.9 0.6 0 S-R 0.4 -0.1 0.2 0.1 0 S-R 1.3 0.1 0.4 0.2 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 66 of 76 Contech Research An Independent Test and Research Laboratory Low Level Circuit Resistance - Delta Values Project: 209698 Customer: Samtec Product: S2SD series cable Description: ID# C-A-8 Open circuit voltage: 20mV Units: milliohms Temp ºC R.H. % Date: Pos. ID Spec: Subgroup: File No: Tech: Current: EIA 364 TP 23 Sequence "c" 20969832 S-R 10ma 23 30 15Mar10 Initial 21 28 18Mar10 M-Shock 21 32 23Mar10 VIB 1 2 3 4 5 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 23 24 31.6 31.1 30.6 31.8 32.5 32.8 32.7 31.5 32.0 30.4 30.5 29.5 29.8 28.5 29.0 28.6 29.0 28.9 28.4 28.8 29.1 28.8 0.2 -0.2 0.0 0.2 0.3 0.1 0.2 0.0 0.1 0.1 0.1 0.2 0.3 0.3 0.3 0.1 0.3 0.3 0.7 0.1 0.3 0.2 0.2 0.2 0.3 0.3 0.4 0.2 0.4 0.2 0.3 0.2 0.2 0.3 0.3 0.4 0.4 0.3 0.4 0.3 -0.2 0.1 1.0 0.2 MAX MIN AVG STD Open Tech 32.8 28.4 30.3 1.5 0 S-R 0.7 -0.2 0.2 0.2 0 S-R 1.0 -0.2 0.3 0.2 0 S-R Equip ID 681 1278 681 1278 681 1278 Test Laboratory TR#209698, REV.1.0 67 of 76 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE D Group A Test Laboratory TR#209698, REV.1.0 68 of 76 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS cable -----------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: S-R -----------------------------------------------------------START DATE: 3/17/10 COMPLETE DATE: 3/17/10 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 26% -----------------------------------------------------------EQUIPMENT ID#: 34, 200, 585, 1010, 1028, 1147, 1521, 5045 -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 27, Test Condition C. 2. Test Conditions: a) b) c) d) e) Peak Value Duration Wave Form Velocity No. of Shocks : : : : : 100 G 6 Milliseconds Half-Sine 12.3 feet Per Second 3 Shocks/Direction, 3 Axes (18 Total) 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. Figure #6 illustrates the test sample fixturing utilized during the test. 5. The samples were characterized to assure that the low nanosecond event being monitored will trigger the detector. -continued on next page. Test Laboratory TR#209698, REV.1.0 69 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE:-continued 6. The low nanosecond monitoring was performed in accordance with EIA 364, Test Procedure 87. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no low nanosecond event detected greater than 50 nanoseconds. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no low nanosecond event detected greater than 50 nanoseconds. 3. The Mechanical Shock characteristics are shown in Figures #7 (Calibration Pulse) and #8 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification. Test Laboratory TR#209698, REV.1.0 70 of 76 Contech Research An Independent Test and Research Laboratory FIGURE #6 Test Laboratory TR#209698, REV.1.0 71 of 76 Contech Research An Independent Test and Research Laboratory FIGURE #7 Contech Research Test Laboratory TR#209698, REV.1.0 72 of 76 An Independent Test and Research Laboratory FIGURE #8 Contech Research Test Laboratory TR#209698, REV.1.0 73 of 76 An Independent Test and Research Laboratory PROJECT NO.: 209698 SPECIFICATION: TC0946-2877 -----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series 02.75-D-NUS connector -----------------------------------------------------------SAMPLE SIZE: 3 Samples TECHNICIAN: GL -----------------------------------------------------------START DATE: 8/20/09 COMPLETE DATE: 8/20/09 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 50% -----------------------------------------------------------EQUIPMENT ID#: 14, 545, 553, 1147, 1166, 1167, 1168, 1271, 1272, 1426, 1634, 5045 -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To establish the mechanical integrity of the test samples exposed to external mechanical stresses. 2. To determine if the contact system is susceptible to fretting corrosion. 3. To determine if electrical discontinuities at the level specified exist. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with Specification EIA 364, Test Procedure 28, Test Condition V, Letter B. 2. Test Conditions: a) b) c) d) Power Spectral Density : 0.04 g2/Hz G ’rms’ : 7.56 Frequency : 50 to 2000 Hz Duration : 2.0 hrs per axis, 3 axes total 3. A stabilizing medium was used such that the mated test samples did not separate during the test. 4. Figure #9 illustrates the test sample fixturing utilized during the test. -continued on next page. Test Laboratory TR#209698, REV.1.0 74 of 76 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 5. Prior to testing, the connectors were characterized to assure that the desired event being monitored was capable of being detected. 6. The low nanosecond event detection was performed in accordance with EIA 364, Test Procedure 87. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no low nanosecond event detected greater than 50 nanoseconds. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no low nanosecond event detected greater than 50 nanoseconds. Test Laboratory TR#209698, REV.1.0 75 of 76 Contech Research An Independent Test and Research Laboratory FIGURE #9 Test Laboratory TR#209698, REV.1.0 76 of 76 Contech Research An Independent Test and Research Laboratory