Contech Research

APRIL 19, 2010
TEST REPORT #209698
S2SD CABLE ASSEMBLY QUALIFICATION TESTING
PART: S2SD-30-24-S-02.75-D-NUS
MATING PART: T2M-130-01-L-D-TH
SAMTEC, INC.
APPROVED BY: ALICE HATHAWAY
PROJECT ENGINEER
CONTECH RESEARCH, INC.
ATTLEBORO, MA
Test Laboratory
Contech Research
An Independent Test and Research Laboratory
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
4/19/2010
1.0
Initial Issue
APH
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CERTIFICATION
This is to certify that the S2SD series cable assembly
evaluation described herein was designed and executed by
personnel of Contech Research, Inc. It was performed with the
concurrence of Samtec, Inc. of New Albany, IN who was the test
sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1,
ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
Alice Hathaway
Project Engineer
Contech Research, Inc.
Attleboro, MA
APH:cf
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SCOPE
To perform qualification testing on the S2SD series cable
assembly as manufactured and submitted by the test sponsor,
Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Samtec Test Plan: TC0946-2877 (S2SD) Test Plan
3.
Standard: EIA Publication 364
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
a)
b)
Description
Part Number
Cable assembly
Mating part
S2SD-30-24-S-02.75-D-NUS
T2M-130-01-L-D-TH
2.
Mating parts were supplied assembled and terminated to test
boards by the test sponsor. Specific test boards and cable
assembly orientations were supplied for the following
tests:
- LLCR
- IR and DWV
- Shock & Vibration, nanosecond event detection
3.
Test leads were attached to the appropriate measurement
areas of the test samples and applicable mating elements.
4.
The test samples were tested in their ‘as received’
condition.
5.
Unless otherwise specified in the test procedures used, no
further preparation was used.
6.
The mated test samples were secured via a stabilizing
medium to maintain mechanical stability during testing, as
noted in the specific test procedures.
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TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #1, for test sequences
used.
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner
which remained legible for the test duration.
2.
The test samples were coded in the following manner:
Seq A:
Group
Group
Group
Group
A1
A2
A3
B
Seq B:
Group A1
Group A2
Seq C:
Group A
Seq D:
Group A
–
–
-
A-A1-1, A-A1-2
A-A2-1, A-A2-2
A-A3-1, A-A3-2
A-B-1, A-B-2
- B-A1-1,
B-A1-6,
- B-A2-1,
B-A2-6,
B-A1-2,
B-A1-7,
B-A2-2,
B-A2-7,
B-A1-3, B-A1-4, B-A1-5,
B-A1-8
B-A2-3, B-A2-4, B-A2-5,
B-A2-8
- C-A-1, C-A-2, C-A-3, C-A-4, C-A-5,
C-A-6, C-A-7, C-A-8
- D-A-1, D-A-2, D-A-3
Sample ID Key
Board number
Group
Seq.
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FIGURE #1
TEST PLAN FLOW DIAGRAM
209698
Samtec S2SD full qualification
Part: S2SD-30-24-S-02.75-D-NUS (cable)
Mating Part: T2M-130-01-L-D-TH (board)
Sample Preparation
Solder Joint Inspection
Sequence b
Sequence a
DWV
IR
DWV
DWV
MATED UNMATED
UNMATED
Test to
DWV
*CABLE*
*BOARD*
Breakdown
Test to
Test to
Voltage
Thermal
Breakdown
Breakdown
Shock
Voltage
Voltage
(100 hours)
UNMATED
IR
Sequence c
LLCR
LLCR
LLCR
Durability
50x
Durability
100x
Mechanical
Shock
LLCR
LLCR
LLCR
Thermal
Shock
(100 hrs)
MATED
Thermal
Shock
(100 hrs)
MATED
Random
Vibration
LLCR
LLCR
Cyclic
Humidity
(240 hrs)
MATED
Cyclic
Humidity
(240 hrs)
MATED
LLCR
LLCR
Sequence d
50 Nanosecond
Characterization
Mechanical
Shock
Random
Vibration
LLCR
DWV
Cyclic
Humidity
(240 hrs)
UNMATED
IR
DWV
Group A1
2 pairs,
mated
Double
cables
Group A2
2 of part,
unmated
Double
cables
Group A3
2 of mating
part, unmated
Double cables
Group B
2 pair, mated
and unmated
Double cables
Group A1
176 points
8 mated pairs
12” single cables
Group A2
176 points
8 mated pairs
12” single cables
Group A
176 points,
8 mated pairs
12” single cables
Group A
3 mated pairs
2.5” single cables
4th for antenna
IR
: Insulation Resistance
DWV : Dielectric Withstanding Voltage
LLCR : Low Level Circuit Resistance
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DATA SUMMARY
TEST
REQUIREMENT
RESULTS
SEQUENCE A
GROUP A1
DWV, BOTH MATED PAIRS
BREAKDOWN
1200 VAC
GROUP A2
DWV, 2 CABLES, UNMATED
BREAKDOWN
1200 VAC
GROUP A3
DWV, 2 BOARDS, UNMATED
BREAKDOWN
2400 VAC
INITIAL
IR, MATED PAIRS
IR, UNMATED
DWV, MATED PAIRS
DWV, UNMATED
>5000 MEGOHMS
>5000 MEGOHMS
900 VAC
900 VAC
50,000 MEGOHMS
50,000 MEGOHMS
PASSED
PASSED
POST THERMAL SHOCK
THERMAL SHOCK
IR, MATED PAIRS
IR, UNMATED
DWV, MATED PAIRS
DWV, UNMATED
NO DAMAGE
>5000 MEGOHMS
>5000 MEGOHMS
900 VAC
900 VAC
PASSED
50,000 MEGOHMS
50,000 MEGOHMS
PASSED
PASSED
POST CYCLIC HUMIDITY
CYCLIC HUMIDITY
IR, MATED PAIR A-B-1
IR, UNMATED A-B-1
IR, MATED PAIR A-B-2
IR, UNMATED A-B-2
DWV, MATED PAIRS
DWV, UNMATED
NO DAMAGE
>5000 MEGOHMS
>5000 MEGOHMS
>5000 MEGOHMS
>5000 MEGOHMS
900 VAC
900 VAC
PASSED
25,000
25,000
50,000
50,000
PASSED
PASSED
GROUP B
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
-Continued on next page.
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DATA SUMMARY -continued
TEST
REQUIREMENT
RESULTS
SEQUENCE B
GROUP A1
LLCR
DURABILITY
LLCR
THERMAL SHOCK
LLCR
CYCLIC HUMIDITY
LLCR
RECORD
NO DAMAGE
+10.0 M MAX.CHG.
NO DAMAGE
+10.0 M MAX.CHG.
NO DAMAGE
+10.0 M MAX.CHG.
34.6 M
PASSED
+2.4 M
PASSED
+2.7 M
PASSED
+3.3 M
MAX.
GROUP A2
LLCR
DURABILITY
LLCR
THERMAL SHOCK
LLCR
CYCLIC HUMIDITY
LLCR
RECORD
NO DAMAGE
+10.0 M MAX.CHG.
NO DAMAGE
+10.0 M MAX.CHG.
NO DAMAGE
+10.0 M MAX.CHG.
34.0 M
PASSED
+3.4 M
PASSED
+2.1 M
PASSED
+4.5 M
MAX.
RECORD
NO DAMAGE
+10.0 M MAX.CHG.
NO DAMAGE
+10.0 M MAX.CHG.
32.9 M MAX.
PASSED
+2.7 M MAX.CHG.
PASSED
+2.8 M MAX.CHG.
NO
50
NO
50
PASSED
PASSED
PASSED
PASSED
MAX.CHG.
MAX.CHG.
MAX.CHG.
MAX.CHG.
MAX.CHG.
MAX.CHG.
SEQUENCE C
LLCR
MECHANICAL SHOCK
LLCR
RANDOM VIBRATION
LLCR
SEQUENCE D
MECHANICAL SHOCK
RANDOM VIBRATION
DAMAGE
NANOSECOND
DAMAGE
NANOSECOND
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EQUIPMENT LIST
ID#
Next Cal
Last Cal
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Ca
l
14
34
95
150
192
200
315
421
466
7/13/2010
7/13/2009
12/1/2010
12/1/2009
5/27/2010
1/19/2011
5/27/2009
1/19/2010
4/14/2010
12/3/2010
3/31/2009
12/3/2009
Accelerometer
Shock Machine
AC Hypot
Drill Press Stand
Vertical Thermal Shock
Power Supply
X-Y Table
Megohmeter
Precision Resistor
PCB Piezotronics
Avco
Peschell Instr.
Craftsman
Cincinnati Sub-Zero
PCB Piezotronics
NE Affiliated Tech.
Hipotronics Co.
Victoreen Co.
7040
1047
5570
N/A
88-11094
4210
N/A
031423-00
N/A
See Cal Cert
N/A
±3%Full Scale
N/A
See Cal Cert
N/A
N/A
See Cal Cert
±1%
12mon
Ea Test
12mon
N/A
12mon
12mon
N/A
12 mon.
12 mon.
545
553
585
614
628
681
1010
1028
1147
1166
5/8/2010
3/19/2011
8/28/2010
5/8/2009
3/19/2010
8/28/2009
10/20/2010
10/20/2009
2/16/2011
12/10/2010
8/24/2010
2/16/2010
12/10/2009
8/24/2009
Event Detector
12 channel Power Unit
Digitizing Scope
Oven
Digital Thermometer
Computer
Plotter
Event Detector
Digital O-Scope
Sine/Rndm Vib Control
Digitizer
Interface
Mainframe
Temp-humid-Chamber
Amplifier
Shaker Table
Microohm mtr
Data Aquisition Multimeter
Anatech
PCB Co.
Hewlett Packard Co.
Tenney Co.
Omega Eng.
ARC Co.
Hewlett Packard
Analysis Tech
Tektronix
Hewlett Packard
302A
SM110-3
P10*
25921
VTS-1-5-3
482A
XY-6060
HM3A
50,000
mego
32/64 EHD
483A
54200A
TH Jr.
DP 116
P166
7225B
32 EHD
11801C
E1432A
941206
1303
2740A-02154
9712-510
6210125
N/A
2160A2293
981019
B030915
US39342279
See Cal Cert
See Cal Cert
±2%
See Manual
±1.1DegC
N/A
N/A
See Cal.Cert.
See Cal Cert.
See Cal Cert
12mon
12mon
12mon
Ea Test
12mon
N/A
N/A
12mon
12mon.
12mon
Hewlett Packard
Hewlett Packard
Blue M.
Unholtz Dickie
Unholtz Dickie
Keithley
Keithley
E8491B
E8408A
FRM-256B
SA15
S202PB
580
2700
US390100753
US39000357
FRM277
3483
263
0803947
0914136
N/A
N/A
See Manual
N/A
N/A
See Manual
See Cal Cert
N/A
N/A
Ea Test
N/A
N/A
12mon
12mon
1167
1168
1230
1271
1272
1278
1360
9/24/2010
2/2/2011
9/24/2009
2/2/2010
Contech Research
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EQUIPMENT LIST –continued
ID#
Next Cal
Last Cal
Equipment Name
Manufacturer
Model #
Serial #
Accuracy
Freq.Ca
l
1426
1457
1521
1549
1550
1634
5045
1/19/2011
4/20/2010
2/2/2011
2/2/2011
9/11/2010
12/10/2010
11/19/2010
4/20/2009
2/2/2010
2/2/2010
9/11/2009
12/10/2009
Computer
Precision Resistor
Accelerometer
Multiplexer Card
Multiplexer Card
Vibration Controller
TDR -Sampling Head
E-Machines
Victorine
PCB
Keithley
Keithley
HP Agilent
Tektroniks
T2341
5KMOHM
353B04
7708
7708
E1434A
SD-24
QL235-703-00880
465
118492
171629
171626
US38090307
B0221502
N/A
See Cal Cert
See Cal Cert
See Cert
See Cert
See Cal Cert
See Cal Cert
N/A
12mon
12mon
12mon
12mon
12 mon
12 mon
Contech Research
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TEST RESULTS
SEQUENCE A
Group B
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PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/1/2010
COMPLETE DATE: 3/1/2010
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 421, 466, 1457
-----------------------------------------------------------INSULATION RESISTANCE(IR)
PURPOSE:
To determine the resistance of insulation materials to leakage
of current through or on the surface of these materials when a
DC potential is applied.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 21.
2.
Test Conditions:
a)
b)
c)
d)
e)
3.
Between Adjacent Contacts
Mated Condition
Mounting Condition
Electrification Time
Test Voltage
:
:
:
:
:
Yes
Mated and Unmated
Mounted and Unmounted
2.0 Minutes
500 VDC
The test voltage was applied to specific test points
on the test boards or cables.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, the insulation
resistance shall not be less than 5,000 megohms.
-----------------------------------------------------------RESULTS: See Next Page
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RESULTS:
1.
All test samples as tested met the requirements as
specified.
2.
Actual initial Insulation Resistance values:
TEST SAMPLE
RESULTS
IR,
IR,
IR,
IR,
IR,
IR,
50,000
50,000
50,000
50,000
50,000
50,000
MATED PAIR, A-B-1
UNMATED, S2SD CABLE
UNMATED, T2M CONNECTOR
MATED PAIR, A-B-2
UNMATED, S2SD CABLE
UNMATED, T2M CONNECTOR
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MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/1/10
COMPLETE DATE: 3/2/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 95
-----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL)
PURPOSE:
1.
To determine if the connector can operate at its rated
voltage and withstand momentary overpotentials due to
switching, surges and other similar phenomenon.
2.
To determine if the connectors maintain their dielectric
integrity after being stressed by exposure to environmental
conditioning.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 20.
2.
Test Conditions:
a) Between Adjacent Contacts
b) Mated Condition
c) Mounting Condition
d) Hold Time
e) Rate of Application
f) Test Voltage
g) Applied Voltage
3.
:
:
:
:
:
:
:
Yes
Mated and Unmated
Mounted and Unmounted
60 Seconds
500 volts/sec.
75% of Breakdown Voltage
900 VAC
To determine the Applied Voltage as listed above, AC
voltage was applied to the specified test points until
breakdown. The Applied Voltage used was 75% of the
minimum breakdown voltage as tested. The test samples
were tested mated (Sequence a Group A1), and each S2SD
cable and T2M connector was tested unmated (Sequence a
Groups A2, A3)to determine the minimum breakdown voltage.
-continued on next page.
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PROCEDURE:-continued
4.
The voltage was applied to specific test points on each
board or cable.
------------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, there shall be no
evidence of breakdown, arcing, etc.
-----------------------------------------------------------RESULTS:
All test samples as tested met the requirements as
specified.
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PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/4/10
COMPLETE DATE: 3/8/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 95, 192, 421, 466, 1360, 1457, 1549, 1550
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, Method A, Test Condition I.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85°C +3C/-0C
-55°C +0C/-3C
30 Minutes
Unmated
Mounted and Unmounted
Instantaneous
3.
The total number of cycles was performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-continued on next page.
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PROCEDURE: -continued
6.
Testing was completed within 1 hour of removal of the
samples from the chamber.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The insulation resistance shall not be less than 5,000
megohms.
3.
When a 900 VAC test voltage is applied, there shall be no
evidence of arcing, breakdown, etc.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The insulation resistance exceeded 5,000 megohms.
3.
Post Thermal Shock Insulation resistance values:
4.
TEST SAMPLE
RESULTS
IR,
IR,
IR,
IR,
IR,
IR,
50,000
50,000
50,000
50,000
50,000
50,000
MATED PAIR, A-B-1
UNMATED, S2SD CABLE
UNMATED, T2M CONNECTOR
MATED PAIR, A-B-2
UNMATED, S2SD CABLE
UNMATED, T2M CONNECTOR
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
There was no evidence of arcing, breakdown, etc., when a
900 VAC voltage was applied.
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PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 2 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/12/10
COMPLETE DATE: 3/22/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 95, 421, 466, 614, 628, 1230, 1360, 1457, 1549,
1550
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity and
heat conditions. Measurements made under high humidity
conditions may reflect the peculiar conditions under which the
readings were made, and should be compared only to initial
readings when careful analysis indicates that such a comparison
is valid and applicable.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, Test Condition B, Method III
(omitting steps 7a and 7b).
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
3.
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
:
50°C ± 5°C
90% to 98%
25C to 65C
No
No
Unmated
Mounted and Unmounted
240 hours
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-continued on next page.
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PROCEDURE:-continued
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
The voltage was applied to specific test points on the
board or cable.
6.
Testing was completed within 1 hour of removal of the
samples from the chamber.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of
the test samples as tested.
2.
The insulation resistance shall not be less than 5,000
megohms.
3.
There shall be no evidence of arcing or breakdown when
a 900 VAC test voltage is applied.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The insulation resistance exceeded 5000 megohms.
3.
Post Cyclic Humidity Insulation Resistance values:
TEST SAMPLE
IR,
IR,
IR,
IR,
IR,
IR,
4.
RESULTS
MATED PAIR, A-B-1
UNMATED, S2SD CABLE
UNMATED, T2M CONNECTOR
MATED PAIR, A-B-2
UNMATED, S2SD CABLE
UNMATED, T2M CONNECTOR
25,000
25,000
25,000
50,000
50,000
50,000
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
MEGOHMS
There was no evidence of breakdown, arcing, etc., when a
900 VAC test voltage was applied.
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE B
Group A1
Group A2
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PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 16 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 2/24/10
COMPLETE DATE: 2/24/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 681, 1278
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23.
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
2.
Test Conditions:
a) Test Current
: 10 milliamps maximum
b) Open Circuit Voltage
: 20 millivolts
c) No. of Positions Tested : 22 per test sample
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
2.
Sample ID#
Avg.
Max.
Min.
B-A1-1
B-A1-2
B-A1-3
B-A1-4
B-A1-5
B-A1-6
B-A1-7
B-A1-8
29.5
29.6
29.6
29.7
29.4
29.7
30.0
30.0
30.1
32.6
32.3
32.6
31.3
32.0
34.6
31.6
29.0
29.1
28.9
28.9
28.5
28.4
29.0
29.8
B-A2-1
B-A2-2
B-A2-3
B-A2-4
B-A2-5
B-A2-6
B-A2-7
B-A2-8
29.7
30.1
29.6
29.4
29.6
29.7
29.6
29.6
33.7
34.0
33.0
29.8
30.3
31.3
29.9
30.7
29.1
29.1
29.0
28.9
29.2
29.3
29.1
29.0
See data files 20969801 through 20969816 for individual
data points.
Test Laboratory
TR#209698, REV.1.0
22 of 76
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 16 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 2/25/10
COMPLETE DATE: 2/26/10
-----------------------------------------------------------ROOM AMBIENT: 21°C
RELATIVE HUMIDITY: 28%
-----------------------------------------------------------EQUIPMENT ID#: 150, 315, 681, 1278
-----------------------------------------------------------DURABILITY
PURPOSE:
1.
This is a conditioning sequence which is used to induce the
type of wear on the contacting surfaces which may occur
under normal service conditions. The connectors are mated
and unmated a predetermined number of cycles. Upon
completion, the units being evaluated are exposed to the
environments as specified to assess any impact on
electrical stability resulting from wear or other wear
dependent phenomenon.
2.
This type of conditioning sequence is also used to
mechanically stress the connector system as would normally
occur in actual service. This sequence in conjunction with
other tests is used to determine if a significant loss of
contact pressure occurs from said stresses which in turn,
may result in an unstable electrical condition to exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 09.
2.
Test Conditions:
a) No. of Cycles : 50 – Group A1; 100 – Group A2
b) Rate
: 1.0 inch per minute
3.
The part (cable) was assembled to special holding devices;
the mating part (LLCR board) was attached to an X-Y table.
Speed is approximate.
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
PROCEDURE:–continued
4.
The test samples were axially aligned to accomplish the
mating and unmating function allowing for self-centering
movement.
5.
Care was taken to prevent the mating faces of the test
samples from contacting each other.
6.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples so tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
B-A1-1
B-A1-2
B-A1-3
B-A1-4
B-A1-5
B-A1-6
B-A1-7
B-A1-8
Avg.
Change
Max.
Change
-0.1
+0.1
-0.1
+0.3
+0.2
+0.1
-0.0
-0.4
+0.3
+0.8
+0.3
+2.4
+0.8
+1.1
+0.6
+1.2
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
RESULTS:–continued
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
B-A2-1
B-A2-2
B-A2-3
B-A2-4
B-A2-5
B-A2-6
B-A2-7
B-A2-8
3.
Avg.
Change
Max.
Change
-0.1
-0.1
-0.1
-0.0
-0.1
-0.2
-0.1
+0.0
+3.4
+0.5
+0.7
+0.3
+0.4
+1.7
+0.2
+1.2
See data files 20969801 through 20969816 for individual
data points.
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 16 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/4/10
COMPLETE DATE: 3/8/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 192, 681, 1278, 1360, 1549, 1550
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, Method A, Test Condition I.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85C +3C/-0C
-55C +0C/-3C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles were performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Avg.
Change
Max.
Change
B-A1-1
B-A1-2
B-A1-3
B-A1-4
B-A1-5
B-A1-6
B-A1-7
B-A1-8
+0.4
+0.5
+0.1
+0.2
+0.3
+0.1
-0.4
-0.2
+0.7
+2.7
+0.4
+1.1
+1.5
+1.1
+0.7
+2.2
B-A2-1
B-A2-2
B-A2-3
B-A2-4
B-A2-5
B-A2-6
B-A2-7
B-A2-8
-0.4
-0.2
+0.1
+0.0
-0.0
+0.3
+0.0
+0.2
+0.3
+0.8
+0.7
+0.3
+0.4
+1.7
+0.3
+2.1
Sample ID#
3.
See data files 20969801 through 20969816 for individual
data points.
Test Laboratory
TR#209698, REV.1.0
27 of 76
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 16 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/12/10
COMPLETE DATE: 3/22/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 24%
-----------------------------------------------------------EQUIPMENT ID#: 614, 628, 681, 1230, 1278, 1360, 1549, 1550
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
To evaluate the impact on electrical stability of the contact
system when exposed to any environment which may generate
thermal/moisture type failure mechanisms such as:
a)
Fretting corrosion due to wear resulting from
micromotion, induced by thermal cycling. Humidity
accelerates the oxidation process.
b)
Oxidation of wear debris or from particulates from the
surrounding atmosphere which may have become entrapped
between the contacting surfaces.
c)
Failure mechanisms resulting from a wet oxidation
process.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, Test Condition B, Method III
(omitting steps 7a and 7b) with the following conditions.
-continued on next page.
Test Laboratory
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Contech Research
An Independent Test and Research Laboratory
PROCEDURE:–continued
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
:
50C ± 5C
90% to 98%
25C to 65C
No
No
Mated
Mounted
240 hours
3.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of the
test samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
B-A1-1
B-A1-2
B-A1-3
B-A1-4
B-A1-5
Avg.
Change
Max.
Change
+0.2
+0.5
+0.8
+0.6
+1.2
+2.2
+2.7
+2.9
+3.3
+2.7
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
29 of 76
Contech Research
An Independent Test and Research Laboratory
RESULTS -continued
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Avg.
Change
Max.
Change
B-A1-6
B-A1-7
B-A1-8
+0.3
-0.5
+0.6
+1.2
+0.3
+2.8
B-A2-1
B-A2-2
B-A2-3
B-A2-4
B-A2-5
B-A2-6
B-A2-7
B-A2-8
-0.2
+0.2
+0.4
+0.2
+0.6
+1.1
+0.4
+0.5
+0.5
+1.7
+2.9
+0.6
+4.5
+3.8
+2.1
+3.4
Sample ID#
3.
See data files 20969801 through 20969816 for individual
data points.
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
FILE NUMBERS
20969801
20969802
20969803
20969804
20969805
20969806
20969807
20969808
20969809
20969810
20969811
20969812
20969813
20969814
20969815
20969816
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-1
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969801
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50 X
22
23
08Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.4
29.2
30.1
29.2
29.2
29.2
29.9
29.6
29.0
29.2
29.3
29.4
29.4
29.6
29.5
29.5
29.6
29.4
29.7
29.9
29.8
29.3
-1.4
-0.1
-0.7
0.2
0.2
0.3
-0.2
0.2
0.0
0.1
0.2
0.2
0.0
-0.1
0.2
-1.0
0.1
0.0
0.0
-0.3
0.3
0.0
0.4
0.2
-0.4
0.6
0.5
0.4
0.1
0.5
0.5
0.5
0.4
0.4
0.3
0.4
0.5
0.6
0.2
0.6
0.7
0.5
0.5
0.5
1.2
0.1
-0.7
0.0
0.0
0.0
0.4
0.1
0.1
0.4
0.0
-0.1
0.0
0.1
0.0
0.3
0.3
0.0
0.4
0.4
2.2
-0.1
MAX
MIN
AVG
STD
Open
Tech
30.1
29.0
29.5
0.3
0
S-R
0.3
-1.4
-0.1
0.4
0
S-R
0.7
-0.4
0.4
0.2
0
S-R
2.2
-0.7
0.2
0.6
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
32 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-2
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969802
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50 X
22
23
08Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.2
29.2
30.1
29.7
29.4
29.6
29.6
29.2
29.6
29.5
29.1
30.7
29.4
29.5
29.4
29.3
29.3
29.4
29.6
32.6
29.2
29.3
0.0
-0.1
0.2
-0.2
0.0
0.1
0.1
0.2
-0.2
0.0
0.0
0.2
0.0
-0.2
0.6
0.0
-0.1
-0.2
-0.1
0.8
0.0
0.0
0.3
0.2
0.3
0.2
0.4
0.8
0.9
0.5
0.2
0.4
0.3
0.4
0.4
0.2
0.7
0.3
0.4
0.3
0.3
2.7
0.7
0.5
0.4
0.4
1.2
0.2
0.4
0.9
0.7
1.0
0.0
0.1
0.0
2.7
0.1
0.0
0.4
-0.1
0.0
-0.1
0.1
2.6
0.2
0.1
MAX
MIN
AVG
STD
Open
Tech
32.6
29.1
29.6
0.8
0
S-R
0.8
-0.2
0.1
0.2
0
S-R
2.7
0.2
0.5
0.5
0
S-R
2.7
-0.1
0.5
0.8
0
S-R
Equip ID
681
1278
681
1279
681
1280
681
1281
Test Laboratory
TR#209698, REV.1.0
33 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-3
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969803
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50X
22
23
08Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.4
30.0
29.3
29.5
29.4
29.5
32.3
29.5
30.2
29.2
29.4
29.3
29.4
29.1
29.2
29.5
29.5
29.5
29.2
28.9
29.5
29.4
0.0
0.3
0.0
-0.2
0.0
-0.2
0.0
0.0
0.3
0.1
-0.1
0.0
-0.1
0.0
0.0
-0.2
-0.1
-0.3
-0.3
-0.1
-0.2
-0.1
0.2
-0.2
0.1
0.4
0.3
0.3
-1.0
0.2
0.1
0.1
0.3
0.3
0.3
0.2
0.3
0.2
0.2
0.1
0.2
0.3
0.1
0.3
0.6
1.0
-0.1
1.7
0.2
0.5
2.3
0.2
1.3
0.5
1.4
0.6
0.3
1.3
0.1
0.0
0.8
-0.1
2.9
0.7
0.2
1.8
MAX
MIN
AVG
STD
Open
Tech
32.3
28.9
29.6
0.7
0
S-R
0.3
-0.3
-0.1
0.2
0
S-R
0.4
-1.0
0.1
0.3
0
S-R
2.9
-0.1
0.8
0.8
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
34 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-4
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969804
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.3
29.4
29.1
29.4
29.0
29.6
29.4
29.4
29.3
29.6
29.9
29.3
29.6
29.4
30.4
32.6
29.4
29.2
31.4
28.9
29.4
29.4
-0.1
-0.1
0.0
-0.1
-0.1
0.5
-0.1
0.0
0.3
0.0
-0.2
-0.1
0.2
0.0
0.6
2.1
0.0
0.4
2.4
0.6
0.1
0.1
0.2
0.2
0.2
0.0
-0.1
0.2
0.2
-0.1
0.0
0.1
-0.3
-0.1
0.0
0.1
0.0
0.9
0.0
0.6
1.1
0.7
0.2
0.0
0.1
0.5
0.4
0.1
0.0
0.9
0.4
0.9
0.8
0.4
-0.1
0.2
1.1
0.3
0.2
1.6
0.1
0.6
3.3
0.8
0.6
0.6
MAX
MIN
AVG
STD
Open
Tech
32.6
28.9
29.7
0.8
0
S-R
2.4
-0.2
0.3
0.7
0
S-R
1.1
-0.3
0.2
0.3
0
S-R
3.3
-0.1
0.6
0.7
0.0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
35 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-5
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969805
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.3
29.2
31.3
28.9
29.9
29.4
29.4
29.3
29.8
30.7
29.1
29.4
29.4
29.3
29.4
29.1
29.3
29.4
28.5
29.0
29.2
29.1
0.1
0.1
0.2
0.0
0.0
0.2
0.2
0.1
-0.2
0.8
0.1
0.3
0.0
0.1
0.1
0.2
0.1
-0.1
0.8
0.0
0.1
0.3
0.6
0.3
1.4
0.1
0.2
0.0
0.3
0.3
-0.3
1.5
0.3
1.4
0.1
0.1
0.2
0.3
-0.4
-0.6
0.4
0.2
0.2
0.3
1.1
0.3
2.7
2.6
1.1
2.2
0.5
0.6
1.4
2.1
1.7
2.4
0.3
0.8
0.6
1.3
0.0
-0.1
2.3
0.8
0.6
0.6
MAX
MIN
AVG
STD
Open
Tech
31.3
28.5
29.4
0.6
0
S-R
0.8
-0.2
0.2
0.2
0
S-R
1.5
-0.6
0.3
0.5
0
S-R
2.7
-0.1
1.2
0.9
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
36 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-6
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969806
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.4
29.3
29.2
31.9
29.6
29.6
30.1
29.8
29.4
29.5
29.2
29.2
30.1
28.4
30.0
29.2
29.2
29.7
29.4
30.0
32.0
29.1
0.3
-0.1
0.0
-1.1
-0.1
0.1
0.9
-0.4
0.1
-0.1
0.0
0.2
-0.3
-0.4
0.1
0.0
0.0
0.2
-0.1
1.1
0.7
0.0
0.1
-0.1
0.0
-0.8
0.0
0.1
-0.1
-0.3
0.1
0.0
0.0
0.0
1.0
0.2
0.1
0.0
0.0
0.6
-0.1
1.1
-0.4
0.0
0.5
0.2
0.2
-0.1
0.2
0.4
0.8
-0.1
0.4
0.3
0.1
0.2
1.0
-0.5
0.4
0.1
0.3
1.0
0.1
1.2
-0.7
0.1
MAX
MIN
AVG
STD
Open
Tech
32.0
28.4
29.7
0.8
0
S-R
1.1
-1.1
0.1
0.4
0
S-R
1.1
-0.8
0.1
0.4
0
S-R
1.2
-0.7
0.3
0.4
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
37 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-7
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969807
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.6
29.2
29.8
32.8
30.5
31.2
34.6
30.2
29.3
29.9
29.0
29.2
29.2
29.1
30.0
29.4
29.5
29.8
29.4
29.3
29.5
29.7
0.0
0.0
-0.2
0.6
-0.1
0.4
-0.8
-0.5
-0.1
-0.4
0.1
0.0
0.0
0.1
0.5
0.1
0.1
0.1
0.1
0.1
0.1
0.1
-0.5
0.0
-0.2
-0.2
-1.1
-1.8
-2.2
-1.0
-0.4
-0.8
0.1
0.0
-0.1
0.1
-0.2
0.0
0.7
-0.2
-0.3
0.2
-0.1
-0.1
-0.2
-0.4
0.3
-3.1
-1.0
-1.3
-3.4
-0.3
-0.4
-1.3
0.1
0.0
0.3
0.2
-0.2
0.0
0.0
0.0
0.0
-0.2
-0.1
0.1
MAX
MIN
AVG
STD
Open
Tech
34.6
29.0
30.0
1.3
0
S-R
0.6
-0.8
0.0
0.3
0
S-R
0.7
-2.2
-0.4
0.7
0
S-R
0.3
-3.4
-0.5
1.0
0.0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
38 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A1-8
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969808
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 50X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.9
29.8
29.9
30.2
29.9
30.1
30.1
29.9
31.6
29.9
30.3
29.9
30.1
29.9
30.0
29.8
29.9
30.0
30.0
29.8
29.8
29.8
-0.6
-0.5
-0.3
-0.3
-0.4
-0.7
-0.5
-0.3
1.2
-0.6
-0.2
-0.6
-0.6
-0.4
-0.6
-0.4
-0.4
-0.5
-0.5
-0.3
-0.4
-0.4
-0.4
-0.6
-0.3
0.1
-0.1
-0.4
-0.5
2.2
-2.1
0.2
-0.9
-0.1
-0.5
-0.3
-0.4
-0.2
-0.2
0.0
-0.5
0.1
-0.2
-0.1
-0.3
1.6
2.0
1.8
0.6
2.8
0.5
0.4
2.4
-0.2
0.1
1.7
-0.1
0.1
-0.2
1.1
0.0
-0.1
-0.1
0.0
0.2
0.0
MAX
MIN
AVG
STD
Open
Tech
31.6
29.8
30.0
0.4
0
S-R
1.2
-0.7
-0.4
0.4
0
S-R
2.2
-2.1
-0.2
0.7
0
S-R
2.8
-0.3
0.6
1.0
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
39 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-1
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969809
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.5
29.5
29.5
29.6
29.5
29.4
29.3
29.5
29.1
29.1
29.5
29.3
29.4
33.7
29.7
29.5
29.7
29.8
29.4
29.8
29.8
30.0
-0.3
-0.3
-0.2
-0.2
1.2
-0.3
-0.1
-0.5
-0.2
0.2
-0.3
0.2
3.4
-4.1
-0.1
0.1
0.0
-0.3
0.3
0.0
-0.1
-0.5
-0.4
-0.3
-0.1
-0.4
-0.1
-0.2
0.0
-0.5
-0.1
0.3
-0.5
-0.1
0.2
-4.3
-0.4
0.0
-0.3
-0.4
0.0
-0.2
-0.1
-0.7
-0.4
-0.1
-0.1
0.2
0.5
0.4
0.0
0.2
0.3
0.4
-0.4
0.1
0.2
-4.2
-0.3
0.0
-0.3
-0.4
0.2
-0.5
-0.2
-0.7
MAX
MIN
AVG
STD
Open
Tech
33.7
29.1
29.7
0.9
0
S-R
3.4
-4.1
-0.1
1.2
0
S-R
0.3
-4.3
-0.4
0.9
0
S-R
0.5
-4.2
-0.2
1.0
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
40 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-2
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969810
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.5
33.6
29.5
29.6
34.0
29.7
29.3
29.6
31.9
31.1
29.5
29.6
29.4
29.4
29.4
29.1
29.4
29.3
29.6
29.6
30.2
29.5
-0.1
0.5
-0.1
0.1
-0.6
-0.2
-0.2
-0.4
-0.1
-1.0
0.0
-0.1
0.0
-0.1
-0.2
0.1
-0.1
0.2
-0.1
0.5
-0.7
-0.1
0.1
-2.1
0.0
0.2
0.8
0.1
0.1
-0.1
-1.2
-1.7
-0.1
-0.2
-0.2
-0.1
-0.2
0.1
-0.1
0.1
-0.1
0.5
-0.5
0.1
0.0
-1.2
0.0
0.5
0.8
0.2
0.3
0.1
-1.2
-1.0
0.2
0.7
0.1
0.5
0.1
0.3
0.2
0.5
0.5
1.4
0.0
1.7
MAX
MIN
AVG
STD
Open
Tech
34.0
29.1
30.1
1.4
0
S-R
0.5
-1.0
-0.1
0.3
0
S-R
0.8
-2.1
-0.2
0.7
0
S-R
1.7
-1.2
0.2
0.7
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
41 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-3
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
20969811
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.5
29.3
29.3
29.5
29.9
29.5
29.6
29.4
29.5
29.2
29.4
29.6
29.5
29.7
29.4
29.5
29.8
29.0
29.9
29.3
33.0
29.3
-0.1
-0.1
-0.2
-0.3
-0.3
-0.2
-0.4
-0.2
-0.1
0.0
0.0
-0.2
-0.2
-0.2
-0.1
-0.1
-0.1
0.7
-0.2
0.0
-0.8
0.0
-0.1
0.1
0.0
0.0
0.2
-0.1
-0.2
-0.1
0.0
0.1
0.1
0.0
-0.1
-0.1
0.0
0.1
0.1
0.7
0.0
0.4
0.1
0.1
0.0
0.3
0.3
0.4
0.6
0.0
-0.2
0.2
0.1
0.6
0.5
0.3
0.2
0.1
0.2
0.1
0.2
0.5
0.4
-0.1
2.9
0.4
MAX
MIN
AVG
STD
Open
Tech
33.0
29.0
29.6
0.8
0
S-R
0.7
-0.8
-0.1
0.2
0
S-R
0.7
-0.2
0.1
0.2
0
S-R
2.9
-0.2
0.4
0.6
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
42 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-4
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
209698012
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.4
29.2
29.4
29.4
29.6
29.5
28.9
29.2
29.2
29.1
29.4
29.1
29.4
29.4
29.1
29.5
29.3
29.4
29.4
29.5
29.6
29.8
0.1
0.2
0.1
0.0
0.0
-0.1
0.3
-0.2
-0.1
0.0
-0.1
0.0
-0.2
-0.2
0.1
-0.1
0.0
-0.1
0.0
0.0
-0.1
0.0
0.1
0.0
-0.1
0.0
0.1
-0.1
0.1
-0.1
-0.1
0.1
-0.1
-0.1
0.1
-0.1
0.0
0.0
0.1
-0.1
0.2
0.0
0.3
0.1
0.3
0.1
0.1
0.1
0.6
0.2
0.3
0.2
0.2
0.1
0.1
0.1
0.1
0.1
0.2
0.1
0.2
0.0
0.2
0.0
0.3
0.3
MAX
MIN
AVG
STD
Open
Tech
29.8
28.9
29.4
0.2
0
S-R
0.3
-0.2
0.0
0.1
0
S-R
0.3
-0.1
0.0
0.1
0
S-R
0.6
0.0
0.2
0.1
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
43 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-5
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
209698013
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.7
29.6
30.3
29.5
29.5
29.6
29.2
29.3
29.4
29.6
29.5
29.3
29.5
29.4
29.6
29.6
29.7
29.4
29.5
29.9
29.6
29.8
-0.4
-0.5
-0.1
-0.2
0.2
0.0
0.4
0.1
0.0
-0.2
-0.1
0.0
0.0
0.0
-0.4
-0.3
0.1
-0.1
-0.1
-0.6
-0.1
-0.1
-0.4
-0.4
-0.3
0.0
0.3
0.0
0.4
0.0
0.0
0.0
0.0
0.1
0.1
0.1
-0.2
-0.1
0.2
0.0
-0.1
-0.5
0.0
0.0
-0.3
-0.4
-0.1
0.5
0.7
3.2
4.5
0.4
0.2
0.1
0.3
0.2
1.5
0.3
0.0
1.3
0.4
0.1
0.0
0.4
0.2
0.1
MAX
MIN
AVG
STD
Open
Tech
30.3
29.2
29.6
0.2
0
S-R
0.4
-0.6
-0.1
0.2
0
S-R
0.4
-0.5
0.0
0.2
0
S-R
4.5
-0.4
0.6
1.2
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
44 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-6
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
209698014
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.4
29.7
29.5
29.7
30.0
30.2
31.3
29.3
29.7
29.7
29.6
29.5
30.7
29.4
29.3
29.7
29.3
29.7
29.7
29.5
29.4
29.4
1.7
-0.3
0.0
-0.2
-0.4
-0.6
-1.9
0.3
-0.5
-0.2
0.0
0.2
-1.5
-0.3
-0.3
-0.1
-0.1
-0.3
-0.2
0.0
-0.3
-0.1
0.2
0.0
0.4
0.1
0.1
0.5
1.7
0.1
0.1
0.1
0.1
0.0
1.7
0.0
0.2
0.8
0.2
0.1
0.4
-0.1
-0.1
0.2
0.4
0.6
3.8
0.6
0.0
1.6
3.0
1.5
0.6
1.6
1.1
1.7
1.8
0.4
2.3
1.0
1.3
0.4
0.2
0.3
0.3
0.5
MAX
MIN
AVG
STD
Open
Tech
31.3
29.3
29.7
0.5
0
S-R
1.7
-1.9
-0.2
0.7
0
S-R
1.7
-0.1
0.3
0.5
0
S-R
3.8
0.0
1.1
1.0
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
45 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-7
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
209698015
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.6
29.9
29.1
29.6
29.6
29.6
29.5
29.9
29.4
29.9
29.8
29.9
29.4
29.3
29.2
29.7
29.5
29.4
29.5
29.7
29.2
29.8
-0.1
-0.4
0.0
0.1
0.0
0.1
0.0
0.0
-0.1
-0.2
-0.2
0.0
-0.1
0.0
0.0
0.0
-0.2
0.2
0.0
-0.1
0.1
-0.4
0.0
-0.2
0.0
0.0
0.0
0.0
0.0
0.0
0.0
-0.2
-0.1
-0.1
0.0
0.1
0.0
0.2
-0.1
0.3
0.3
0.0
0.1
-0.2
0.2
-0.2
0.3
2.1
0.1
0.2
0.1
0.2
0.0
0.2
0.1
0.1
0.0
1.2
0.2
0.3
1.8
0.4
0.6
0.1
0.3
0.2
MAX
MIN
AVG
STD
Open
Tech
29.9
29.1
29.6
0.2
0
S-R
0.2
-0.4
-0.1
0.2
0
S-R
0.3
-0.2
0.0
0.1
0
S-R
2.1
-0.2
0.4
0.6
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
46 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# B-A2-8
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "b"
209698016
S-R
10ma
22
24
24Feb10
Initial
22
24
01Mar10
Dura 100X
21
24
09Mar10
T.Shock
20
33
22Mar10
Humidity
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
30.7
29.7
29.5
30.0
29.2
29.5
29.4
29.4
29.3
29.7
30.2
29.5
29.7
29.4
30.1
29.7
29.9
29.0
29.8
29.5
29.6
29.3
1.2
-0.7
-0.2
0.1
0.6
0.0
0.0
0.1
-0.1
-0.2
-0.8
-0.2
-0.3
-0.2
0.2
0.1
-0.1
0.8
0.0
0.0
0.1
0.1
0.2
0.1
0.0
0.3
2.1
0.2
0.2
0.3
0.1
0.2
-0.5
-0.1
-0.2
-0.1
0.5
0.2
1.3
0.1
0.2
-0.2
0.0
0.1
1.9
-0.3
0.6
1.2
1.0
0.1
0.1
0.7
0.2
0.3
-0.4
0.2
-0.2
0.1
0.7
0.4
3.4
0.2
1.1
0.2
0.1
0.2
MAX
MIN
AVG
STD
Open
Tech
30.7
29.0
29.6
0.4
0
S-R
1.2
-0.8
0.0
0.4
0
S-R
2.1
-0.5
0.2
0.5
0
S-R
3.4
-0.4
0.5
0.8
0
S-R
Equip ID
681
1278
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
47 of 76
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE C
Group A
Test Laboratory
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48 of 76
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/15/10
COMPLETE DATE: 3/15/10
-----------------------------------------------------------ROOM AMBIENT: 23°C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#: 681, 1278
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23.
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
49 of 76
Contech Research
An Independent Test and Research Laboratory
PROCEDURE:–continued
2.
Test Conditions:
a) Test Current
: 10 milliamps
b) Open Circuit Voltage
: 20 millivolts
c) No. of positions tested : 22 per sample
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
2.
Avg.
29.5
29.8
30.8
30.0
30.2
30.3
29.9
30.3
Max.
Min.
30.1
32.1
32.9
31.1
31.4
31.1
30.9
32.8
28.8
28.9
28.9
28.8
29.2
29.6
29.1
28.4
See data files 20969825 through 20969832 for individual
data points.
Test Laboratory
TR#209698, REV.1.0
50 of 76
Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/17/10
COMPLETE DATE: 3/17/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 26%
-----------------------------------------------------------EQUIPMENT ID#: 34, 200, 585, 681, 1010, 1278, 1521
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity of
connectors for use with electronic equipment subjected to shocks
such as those expected from handling, transportation, etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 27, Test Condition C.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Half-Sine
12.3 feet per second
3 Shocks/Direction, 3 Axes (18 Total)
3.
A stabilizing medium was used such that the mated test
samples did not separate during testing.
4.
Figure #2 illustrates the test sample fixturing utilized
during the test.
5.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See Next Page
Test Laboratory
TR#209698, REV.1.0
51 of 76
Contech Research
An Independent Test and Research Laboratory
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not
exceed +10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
Avg.
Change
Max.
Change
+0.2
+0.0
+0.5
+0.3
+0.1
+0.1
+0.2
+0.2
+0.7
+0.3
+2.7
+2.1
+0.6
+0.9
+0.4
+0.7
3.
See data files 20969825 through 20969832 for individual
data points.
4.
The Mechanical Shock characteristics are shown in Figures
#3 (Calibration Pulse) and #4 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#209698, REV.1.0
52 of 76
Contech Research
An Independent Test and Research Laboratory
FIGURE #2
Test Laboratory
TR#209698, REV.1.0
53 of 76
Contech Research
An Independent Test and Research Laboratory
FIGURE #3
Test Laboratory
TR#209698, REV.1.0
Contech Research
54 of 76
An Independent Test and Research Laboratory
FIGURE #4
Test Laboratory
TR#209698, REV.1.0
Contech Research
55 of 76
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 8 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/18/10
COMPLETE DATE: 3/22/10
-----------------------------------------------------------ROOM AMBIENT: 21°C
RELATIVE HUMIDITY: 28%
-----------------------------------------------------------EQUIPMENT ID#: 14, 553, 681, 1166, 1167, 1168, 1271, 1272,
1278, 1426, 1634
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if the electrical stability of the system has
degraded when exposed to a vibratory environment.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a)
b)
c)
d)
Power Spectral Density : 0.04 g2/Hz
G ’rms’
: 7.56
Frequency
: 50 to 2000 Hz
Duration
: 2.0 hrs per axis, 3 axes total
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #5 illustrates the test sample fixturing utilized
during the test.
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
56 of 76
Contech Research
An Independent Test and Research Laboratory
PROCEDURE:-continued
5.
All subsequent variable testing was performed in accordance
with procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall not exceed
+10.0 milliohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the observed data:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(milliohms)
Sample ID#
C-A-1
C-A-2
C-A-3
C-A-4
C-A-5
C-A-6
C-A-7
C-A-8
3.
Avg.
Change
Max.
Change
-0.2
+0.1
+0.5
+0.3
+0.1
+0.2
+0.4
+0.3
+0.7
+0.8
+2.8
+1.3
+0.5
+0.7
+1.3
+1.0
See data files 20969825 through 20969832 for individual
data points.
Test Laboratory
TR#209698, REV.1.0
57 of 76
Contech Research
An Independent Test and Research Laboratory
FIGURE #5
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
LLCR DATA FILES
DATA FILE NUMBERS
20969825
20969826
20969827
20969828
20969829
20969830
20969831
20969832
Test Laboratory
TR#209698, REV.1.0
59 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-1
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
20969825
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.8
29.2
29.6
29.8
30.1
30.1
29.9
29.8
29.4
29.7
29.2
29.1
29.0
29.1
29.2
29.7
29.4
28.9
29.0
29.7
29.5
28.8
0.2
0.1
0.2
0.0
0.5
0.1
0.6
0.0
0.7
0.0
0.5
0.0
0.0
0.1
0.0
0.2
0.0
0.0
-0.1
0.1
0.4
0.0
-0.6
0.0
-0.6
-0.6
0.1
-1.0
-0.7
-0.1
0.7
-0.7
0.7
-0.3
0.1
0.1
0.0
-0.5
-0.4
0.1
0.0
-0.4
0.2
0.1
MAX
MIN
AVG
STD
Open
Tech
30.1
28.8
29.5
0.4
0
S-R
0.7
-0.1
0.2
0.2
0
S-R
0.7
-1.0
-0.2
0.4
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
60 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-2
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
20969826
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.6
29.9
29.9
30.1
29.7
32.1
31.2
31.7
31.0
29.5
29.8
29.4
29.3
29.6
29.2
29.1
29.2
28.9
29.1
29.5
29.6
29.0
0.3
0.1
0.2
-0.1
0.0
0.0
-0.1
-0.1
0.1
-0.1
0.0
0.0
0.1
0.1
0.0
-0.1
0.0
0.2
-0.2
0.1
0.0
0.1
0.2
0.1
0.0
-0.2
0.0
0.0
-0.1
0.1
0.1
0.1
0.0
-0.1
0.1
0.2
0.1
0.3
0.0
0.3
0.2
0.6
-0.2
0.8
MAX
MIN
AVG
STD
Open
Tech
32.1
28.9
29.8
0.9
0
S-R
0.3
-0.2
0.0
0.1
0
S-R
0.8
-0.2
0.1
0.2
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
61 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-3
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
20969827
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
32.2
30.5
31.4
32.9
32.5
32.8
31.9
31.2
31.2
31.3
30.5
30.5
30.1
29.9
29.7
29.3
28.9
29.7
30.2
30.7
30.6
30.4
0.1
0.0
0.1
-0.2
-0.1
0.9
0.1
0.5
-0.1
0.1
0.2
0.1
0.4
0.5
0.1
0.6
0.4
0.7
2.7
1.9
0.8
0.5
0.2
0.0
0.1
-0.3
0.4
0.7
-0.1
1.0
0.1
0.2
0.2
0.2
0.6
0.7
-0.3
0.7
-0.4
0.3
0.1
2.8
2.2
0.7
MAX
MIN
AVG
STD
Open
Tech
32.9
28.9
30.8
1.1
0
S-R
2.7
-0.2
0.5
0.7
0
S-R
2.8
-0.4
0.5
0.8
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
62 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-4
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
20969828
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
30.2
30.7
30.6
30.4
28.8
31.1
30.5
30.6
30.9
30.5
29.9
30.0
29.9
30.0
29.7
29.4
28.9
28.9
28.8
30.7
29.4
29.8
-0.1
0.6
0.8
-0.2
-0.3
0.2
-0.1
-0.1
0.1
0.3
0.1
0.1
0.1
0.1
0.1
-0.1
0.4
0.2
0.0
1.5
0.2
2.1
0.0
-0.3
1.3
0.2
0.5
0.4
-0.1
0.5
0.3
0.3
0.2
0.3
0.3
0.2
0.2
0.1
0.4
0.2
0.3
1.0
0.8
-0.1
MAX
MIN
AVG
STD
Open
Tech
31.1
28.8
30.0
0.7
0
S-R
2.1
-0.3
0.3
0.6
0
S-R
1.3
-0.3
0.3
0.4
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
63 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-5
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
20969829
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
29.3
29.6
30.9
31.3
31.4
31.4
31.0
30.7
30.9
30.6
30.3
29.3
29.3
29.4
29.2
29.3
29.8
29.7
30.5
30.6
29.9
30.4
0.1
-0.2
0.1
-0.2
0.0
0.3
0.0
0.1
0.1
0.0
0.1
0.1
0.0
0.0
0.2
0.1
0.0
0.6
-0.1
-0.1
0.1
0.0
0.3
-0.2
0.1
0.0
0.2
0.1
0.1
0.5
0.0
0.1
0.3
0.3
0.2
0.2
0.5
-0.6
0.1
-0.1
0.2
0.3
-0.1
0.3
MAX
MIN
AVG
STD
Open
Tech
31.4
29.2
30.2
0.8
0
S-R
0.6
-0.2
0.1
0.2
0
S-R
0.5
-0.6
0.1
0.3
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
64 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-6
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
209698030
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
30.5
30.5
31.0
30.7
30.9
31.1
30.7
30.6
30.7
30.5
30.1
29.9
29.9
29.6
29.7
29.9
30.4
31.0
30.1
30.0
30.1
29.8
-0.2
0.0
0.2
0.0
0.0
0.1
0.1
0.1
-0.1
0.2
0.1
0.0
-0.2
0.4
0.1
0.1
0.2
-0.3
0.2
0.9
0.1
0.1
0.1
0.2
0.3
0.2
0.2
0.2
0.4
0.2
0.1
0.3
0.5
0.2
0.1
0.1
0.2
0.1
0.1
-1.2
0.4
0.7
0.2
0.3
MAX
MIN
AVG
STD
Open
Tech
31.1
29.6
30.3
0.5
0
S-R
0.9
-0.3
0.1
0.2
0
S-R
0.7
-1.2
0.2
0.3
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
65 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-7
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
20969831
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
30.0
30.6
30.7
30.6
30.9
30.6
30.4
30.3
30.8
29.5
29.9
29.7
29.6
29.5
29.2
29.1
29.7
29.4
29.2
29.4
29.6
29.6
0.0
0.1
0.2
-0.1
0.2
0.3
0.2
0.3
0.3
0.4
0.2
0.2
0.2
0.2
0.2
0.1
0.2
0.3
0.2
0.3
0.3
0.1
0.1
0.3
0.4
0.4
0.5
1.3
0.3
0.5
0.3
0.4
0.1
0.3
0.3
0.3
0.3
0.3
0.3
0.5
0.2
0.5
0.3
0.2
MAX
MIN
AVG
STD
Open
Tech
30.9
29.1
29.9
0.6
0
S-R
0.4
-0.1
0.2
0.1
0
S-R
1.3
0.1
0.4
0.2
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
66 of 76
Contech Research
An Independent Test and Research Laboratory
Low Level Circuit Resistance - Delta Values
Project:
209698
Customer:
Samtec
Product:
S2SD series cable
Description:
ID# C-A-8
Open circuit voltage:
20mV
Units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
Spec:
Subgroup:
File No:
Tech:
Current:
EIA 364 TP 23
Sequence "c"
20969832
S-R
10ma
23
30
15Mar10
Initial
21
28
18Mar10
M-Shock
21
32
23Mar10
VIB
1
2
3
4
5
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
23
24
31.6
31.1
30.6
31.8
32.5
32.8
32.7
31.5
32.0
30.4
30.5
29.5
29.8
28.5
29.0
28.6
29.0
28.9
28.4
28.8
29.1
28.8
0.2
-0.2
0.0
0.2
0.3
0.1
0.2
0.0
0.1
0.1
0.1
0.2
0.3
0.3
0.3
0.1
0.3
0.3
0.7
0.1
0.3
0.2
0.2
0.2
0.3
0.3
0.4
0.2
0.4
0.2
0.3
0.2
0.2
0.3
0.3
0.4
0.4
0.3
0.4
0.3
-0.2
0.1
1.0
0.2
MAX
MIN
AVG
STD
Open
Tech
32.8
28.4
30.3
1.5
0
S-R
0.7
-0.2
0.2
0.2
0
S-R
1.0
-0.2
0.3
0.2
0
S-R
Equip ID
681
1278
681
1278
681
1278
Test Laboratory
TR#209698, REV.1.0
67 of 76
Contech Research
An Independent Test and Research Laboratory
TEST RESULTS
SEQUENCE D
Group A
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
cable
-----------------------------------------------------------SAMPLE SIZE: 3 Samples
TECHNICIAN: S-R
-----------------------------------------------------------START DATE: 3/17/10
COMPLETE DATE: 3/17/10
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 26%
-----------------------------------------------------------EQUIPMENT ID#: 34, 200, 585, 1010, 1028, 1147, 1521, 5045
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity of
connectors for use with electronic equipment subjected to
shocks such as those expected from handling, transportation,
etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 27, Test Condition C.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Half-Sine
12.3 feet Per Second
3 Shocks/Direction, 3 Axes (18 Total)
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #6 illustrates the test sample fixturing utilized
during the test.
5.
The samples were characterized to assure that the low
nanosecond event being monitored will trigger the detector.
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
69 of 76
Contech Research
An Independent Test and Research Laboratory
PROCEDURE:-continued
6.
The low nanosecond monitoring was performed in accordance
with EIA 364, Test Procedure 87.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no low nanosecond event detected greater
than 50 nanoseconds.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no low nanosecond event detected greater than 50
nanoseconds.
3.
The Mechanical Shock characteristics are shown in Figures
#7 (Calibration Pulse) and #8 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
Test Laboratory
TR#209698, REV.1.0
70 of 76
Contech Research
An Independent Test and Research Laboratory
FIGURE #6
Test Laboratory
TR#209698, REV.1.0
71 of 76
Contech Research
An Independent Test and Research Laboratory
FIGURE #7
Contech Research
Test Laboratory
TR#209698, REV.1.0
72 of 76
An Independent Test and Research Laboratory
FIGURE #8
Contech Research
Test Laboratory
TR#209698, REV.1.0
73 of 76
An Independent Test and Research Laboratory
PROJECT NO.: 209698
SPECIFICATION: TC0946-2877
-----------------------------------------------------------PART NO.: S2SD-30-24-SPART DESCRIPTION: S2SD series
02.75-D-NUS
connector
-----------------------------------------------------------SAMPLE SIZE: 3 Samples
TECHNICIAN: GL
-----------------------------------------------------------START DATE: 8/20/09
COMPLETE DATE: 8/20/09
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 50%
-----------------------------------------------------------EQUIPMENT ID#: 14, 545, 553, 1147, 1166, 1167, 1168, 1271,
1272, 1426, 1634, 5045
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if electrical discontinuities at the level
specified exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with Specification
EIA 364, Test Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a)
b)
c)
d)
Power Spectral Density : 0.04 g2/Hz
G ’rms’
: 7.56
Frequency
: 50 to 2000 Hz
Duration
: 2.0 hrs per axis, 3 axes total
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #9 illustrates the test sample fixturing utilized
during the test.
-continued on next page.
Test Laboratory
TR#209698, REV.1.0
74 of 76
Contech Research
An Independent Test and Research Laboratory
PROCEDURE: -continued
5.
Prior to testing, the connectors were characterized to
assure that the desired event being monitored was capable
of being detected.
6.
The low nanosecond event detection was performed in
accordance with EIA 364, Test Procedure 87.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no low nanosecond event detected greater
than 50 nanoseconds.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no low nanosecond event detected greater than
50 nanoseconds.
Test Laboratory
TR#209698, REV.1.0
75 of 76
Contech Research
An Independent Test and Research Laboratory
FIGURE #9
Test Laboratory
TR#209698, REV.1.0
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Contech Research
An Independent Test and Research Laboratory