Contech Research

APRIL 7, 2003
TEST REPORT #203073, REV.1.1
QSS/QST CONNECTOR TESTING
PART NUMBER
QSS-100-01-L-D-RA
QTS-100-01-L-D-RA
SAMTEC, INC.
APPROVED BY: THOMAS PEEL
PRESIDENT AND
DIRECTOR OF TEST PROGRAM DEVELOPMENT
CONTECH RESEARCH, INC.
Contech Research
REVISION HISTORY
DATE
REV. NO.
DESCRIPTION
ENG.
4/7/2003
1.0
Initial Issue
TP
5/20/03
1.1
Editorial Changes Pg. 3, 4
TP
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CERTIFICATION
This is to certify that the QTS-RA/QSS-RA evaluation described
herein was designed and executed by personnel of Contech
Research, Inc. It was performed with the concurrence of
Samtec, Inc. of New Albany, IN who was the test sponsor.
All equipment and measuring instruments used during testing
were calibrated and traceable to NIST according to ISO 10012-1
and ANSI/NCSL Z540-1, as applicable.
All data, raw and summarized, analysis and conclusions
presented herein are the property of the test sponsor. No copy
of this report, except in full, shall be forwarded to any
agency, customer, etc., without the written approval of the
test sponsor and Contech Research.
Thomas Peel
President and
Director of Test Program Development
Contech Research, Inc.
TP:js
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SCOPE
To perform qualification testing on the QSS/QTS-RA connector
as manufactured and submitted by the test sponsor Samtec, Inc.
APPLICABLE DOCUMENTS
1.
Unless otherwise specified, the following documents of
issue in effect at the time of testing performed form a
part of this report to the extent as specified herein. The
requirements of sub-tier specifications and/or standards
apply only when specifically referenced in this report.
2.
Samtec Specifications: TC0245-0036
3.
Standards: EIA Publication 364
TEST SAMPLES AND PREPARATION
1.
The following test samples were submitted by the test
sponsor, Samtec, Inc., for the evaluation to be performed
by Contech Research, Inc.
Description
a)
b)
QSS-RA Connectors
QTS-RA Connectors
Part Number
QSS-100-01-L-D-RA
QTS-100-01-L-D-RA
2.
A “stabilizing medium” was assembled between the test
samples.
3.
Test samples were supplied assembled and terminated to test
boards by the test sponsor.
4.
Figure #1 illustrates the test board layout used for
mounting test samples.
5.
The test samples were tested in their ‘as received’
condition.
6.
Unless otherwise specified in the test procedures used, no
further preparation was used.
TEST SELECTION
1.
See Test Plan Flow Diagram, Figure #2, for test sequences
used.
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TEST SELECTION – Continued
2.
Test set ups and/or procedures which are standard or common
are not detailed or documented herein provided they are
certified as being performed in accordance with the
applicable (industry or military) test methods, standards
and/or drawings as specified in the detail specification.
SAMPLE CODING
1.
All samples were coded. Mated test samples remained with
each other throughout the test group/sequences for which
they were designated. Coding was performed in a manner
which remained legible for the test duration.
2.
The test samples were coded in the following manner:
Sequence A :
:
:
:
Group
Group
Group
Group
A
B1
B2
B3
-
A-A-1,A-A-2
A-B1-1,A-B1-2
A-B2-1,A-B2-2
A-B3-1,A-B3-2
Sequence B : Group A
-
B-A-1,B-A-2,B-A-3,B-A-4,
B-A-5,B-A-6,B-A-7,B-A-8
Sequence C : Group A
-
C-A-1,C-A-2,C-A-3
Sequence D : Group A
-
D-A-1,D-A-2,D-A-3,D-A-4,D-A-5,
D-A-6,D-A-7,D-A-8
Sequence E : Group A
-
E-A-1,E-A-2,E-A-3
Sample ID Key
A
–
A
-
1
Sample Number
Test Group
Test Sequence
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FIGURE #1
TYPICAL TEST SAMPLE/TEST BOARD
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FIGURE #2
TEST PLAN FLOW DIAGRAM
SAMPLE PREPARATION
Seq. A
Seq. B Seq. C
IR
Breakdown Thermal Humidity
Voltage
Shock
and
Thermal
DWV
Shock
Breakdown
Voltage
IR
and
IR
DWV
Breakdown
Voltage
and
Humidity
IR
DWV
LLCR
Seq. D
LLCR
Mech.
Thermal
|
Shock
Shock
Thermal 1.0 µsec 1.0 µsec
Shock
Monitor Monitor
Mech.
Shock
LLCR
LLCR
Random
Vibration
1.0 µsec
Monitor
Random
Vibration
1.0 µsec
Monitor
Humidity
IR
IR
Seq. E
Random
Vibration
LLCR
LLCR
Group
A
Group
B1
Group
B2
Group
B3
Group
A
Group
A
Group
A
Group
A
IR
: Insulation Resistance
DWV : Dielectric Withstanding Voltage
LLCR : Low Level Circuit Resistance
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DATA SUMMARY
TEST
REQUIREMENT
RESULTS
SEQUENCE A
Group A
Insulation Resistance
Thermal Shock
Insulation Resistance
Humidity
Insulation Resistance
1000 Megohms Min.
No Damage
1000 Megohms Min.
No Damage
1000 Megohms Min.
>15000 Megohms
Passed
>15000 Megohms
Passed
>50000 Megohms
Record Voltage
1100 VAC
75% of VAC
825 VAC
No Damage
Record Voltage
Passed
1200 VAC
75% of VAC
900 VAC
No Damage
Record Voltage
Passed
1000 VAC
75% of VAC
750 VAC
Record
No Damage
Record
No Damage
Record
41.3 mΩ Max.
Passed
+14.0 mΩ Max.Chg.
Passed
+14.0 mΩ Max.Chg.
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Group B1
Breakdown Voltage
DWV @ 75%
of Breakdown Voltage
Group B2
Thermal Shock
Breakdown Voltage
DWV @ 75%
of Breakdown Voltage
Group B3
Humidity
Breakdown Voltage
DWV @ 75%
of Breakdown Voltage
SEQUENCE B
Group A
LLCR
Mechanical Shock
LLCR
Random Vibration
LLCR
TR#203073, REV.1.1
DATA SUMMARY – Continued:
TEST
REQUIREMENT
RESULTS
Record
No Damage
Record
No Damage
Record
40.3 mΩ Max.
Passed
+2.7 mΩ Max.Chg.
Passed
+6.7 mΩ Max.Chg.
No Damage
1.0 Microsecond
No Damage
1.0 Microsecond
Passed
Passed
Passed
Passed
No Damage
1.0 Microsecond
No Damage
1.0 Microsecond
Passed
Passed
Passed
Passed
SEQUENCE C
Group A
LLCR
Thermal Shock
LLCR
Humidity
LLCR
SEQUENCE D
Group A
Mechanical Shock
Random Vibration
SEQUENCE E
Group A
Thermal Shock
Random Vibration
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EQUIPMENT LIST
ID#
27
30
192
281
282
321
465
466
545
553
599
620
681
684
874
1045
1166
1167
1168
1169
1271
1272
1360
1361
1366
1367
1368
Next Cal
Last Cal
3/7/04
3/7/03
1/29/04
6/21/03
6/21/03
9/23/03
12/6/03
1/29/03
6/21/02
6/21/02
9/23/02
12/6/02
10/16/03
10/16/02
6/14/03
6/14/02
6/14/03
3/21/03
6/14/02
3/7/02
4/8/03
4/8/03
10/8/02
10/8/02
10/17/03
10/17/02
TR#203073, REV.1.1
Equipment Name
Manufacturer
Model #
Temp. Humid. Chamber
Discontinuity Monitor
Vertical Thermal Shock
Vibration Power Amp
Vibration Shaker Table
AC-DC Hipot/Megometer
Precision Resistor
Precision Resistor
Event Detector
12 channel Power Unit
Printer
Accelerometer
Computer
Accelerometer
Computer
Microohm Meter
Sine/Rndm Vib Control Digitizer
Interface
Mainframe
Computer
Amplifier
Shaker Table
Data Aquisition Multimeter
Multiplexer Card
Main Frame
Interface
Sine/Rnd Control digitizer
Blue M Co.
Assoc. Test Lab
Cincinnati Sub-Zero
Ling Dynamics
Ling Dynamics
Hipotronics Co.
Victoreen Co.
Victoreen Co.
Anatech
PCB Co.
Brother
PCB
ARC Co.
PCB. Co.
M&P
Keithley
Hewlett Packard
Hewlett Packard
Hewlett Packard
ARC
Unholtz Dickie
Unholtz Dickie
Keithley
Keithley
Aiglent H.P.
Aiglent H.P.
Aiglent H.P.
FR-256PC-1
DM-600-01
VTS-1-5-3
DPA 10K
V-730
H300B
5000 Megohm
50,000 mego
32/64 EHD
483A
HL-630
A353B15
P166
353B04
Vectra
580
E1432A
E8491B
E8408A
PC133
SA15
S202PB
2700
7708
8408A
E8491A
E1432A
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Serial #
F2-249
382-1
88-11094
156
163
DS16-201
N/A
N/A
941206
1303
B66729516
34197
N/A
47648
708216
US39342279
US390100753
US39000357
none
3483
263
0914136
US35470169
Accuracy
Freq.Cal
See Cal Cert
See Cal Cert
See Cal Cert
N/A
N/A
See Cal Cert
±1%
±1%
See Cal Cert
See Cal Cert
N/A
See Cal. Cert
N/A
See Cal Cert.
N/A
See Cal Cert
See Cal Cert
N/A
N/A
N/A
See Manual
N/A
See Cal Cert
See Cal Cert
N/A
N/A
See Manual
Each Test
12mon
Each Test
N/A
N/A
12 mon.
12 mon.
12 mon.
12mon
12mon
N/A
12mon
N/A
12mon
N/A
12mon
12mon
N/A
N/A
N/A
N/A
N/A
6mon
6mon
N/A
N/A
12mon
Contech Research
TEST RESULTS
SEQUENCE A
Group A
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# A-A-1,A-A-2,
TECHNICIAN: MHB
A-A-3
-----------------------------------------------------------START DATE: 3/15/03
COMPLETE DATE: 3/15/03
-----------------------------------------------------------ROOM AMBIENT: 20°C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#:
321, 465, 466
-----------------------------------------------------------INSULATION RESISTANCE(IR)
PURPOSE:
To determine the resistance of insulation materials to leakage
of current through or on the surface of these materials when a
DC potential is applied.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 21.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
3.
Between Adjacent Contacts
Between Rows
Mated Condition
Mounting Condition
Electrification Time
Test Voltage
:
:
:
:
:
:
Yes
Yes
Mated
Mounted
2.0 Minutes
500 VDC
The test voltage was applied to designated test points
on the board.
-----------------------------------------------------------REQUIREMENTS:
When the specified test voltage is applied, the insulation
resistance shall not be less than 1000 megohms.
-----------------------------------------------------------RESULTS:
The insulation resistance exceeded 15000 megohms.
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# A-A-1,A-A-2,
TECHNICIAN: MHB
A-A-3
-----------------------------------------------------------START DATE: 3/15/03
COMPLETE DATE: 3/19/03
-----------------------------------------------------------ROOM AMBIENT: 20°C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#:
192, 321, 465, 466, 1360, 1361
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles was performed continuously.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
5.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See next page.
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REQUIREMENTS:
1.
There shall be no evidence of physical damage or
deterioration of the test samples so exposed.
2.
The insulation resistance shall exceed 1000 megohms.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of visual or physical damage to the
test samples as tested.
2.
The insulation resistance was in excess of 15000 megohms.
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# A-A-1,A-A-2,
TECHNICIAN: MHB
A-A-3
-----------------------------------------------------------START DATE: 3/21/03
COMPLETE DATE: 3/31/03
-----------------------------------------------------------ROOM AMBIENT: 21°C
RELATIVE HUMIDITY: 41%
-----------------------------------------------------------EQUIPMENT ID#:
27, 321, 465, 466, 1360, 1361
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
1.
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity
and heat conditions. Measurements made under
high humidity conditions may reflect the peculiar
conditions under which the readings were made, and should
be compared only to initial readings when careful analysis
indicates that such a comparison is valid and applicable.
2.
This test obtains added effectiveness in employment of
temperature cycling that provides a breathing action,
inducing corrosion processes, and the introduction of
moisture into partially sealed test samples. This
condition imposes a vapor pressure on the samples which
constitutes the major force behind the moisture migration
and penetration.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with EIA
364, Test Procedure 31, Method III (omit Step 7a, 7b) with
the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
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:
:
:
:
:
:
:
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
Contech Research
PROCEDURE – Continued
3.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of
the test samples as tested.
2.
The final insulation resistance shall not be less than
1000 megohms.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The final insulation resistance exceeded 50000 megohms.
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TEST RESULTS
SEQUENCE A
Group B1
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# A-B1-1,A-B1-2, TECHNICIAN: MHB
A-B1-3
-----------------------------------------------------------START DATE: 3/15/03
COMPLETE DATE: 3/15/03
-----------------------------------------------------------ROOM AMBIENT:
20°C
RELATIVE HUMIDITY:
30%
-----------------------------------------------------------EQUIPMENT ID#:
321
-----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL)
PURPOSE:
To determine the voltage at which dielectric breakdown occurs.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 20.
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
Between Adjacent Contacts
Between Rows
Mated Condition
Mounting Condition
Hold Time
Rate of Application
:
:
:
:
:
:
Yes
Yes
Mated
Mounted
60 Seconds
500 volts/sec.
3.
The voltage was applied to specific test points on the
board.
4.
Sample ID# A-B1-3 was used to determine the breakdown
voltage. Sample ID #’s A-B1-1 and A-B1-2 were
subsequently tested at 75% of the breakdown voltage.
-----------------------------------------------------------REQUIREMENTS:
1.
The voltage at which dielectric breakdown occurs shall be
measured and recorded.
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REQUIREMENTS:
2.
Continued
When 75% of the breakdown voltage is applied to previously
untested samples, there shall be no evidence of breakdown,
arcing, etc.
-----------------------------------------------------------RESULTS:
1.
The voltage at which dielectric breakdown occurred
1100 VAC.
2.
No dielectric breakdown occurred on the separate test
samples when tested at 75% of the breakdown voltage. The
test voltage was 825 VAC.
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TEST RESULTS
SEQUENCE A
Group B2
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# A-B2-1,A-B2-2, TECHNICIAN: MHB
A-B2-3
-----------------------------------------------------------START DATE: 3/15/03
COMPLETE DATE: 3/19/03
-----------------------------------------------------------ROOM AMBIENT:
20°C
RELATIVE HUMIDITY:
30%
-----------------------------------------------------------EQUIPMENT ID#:
192, 321, 1360, 1361
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-(55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles was performed continuously.
4.
All subsequent variable testing was performed in accordance
with the procedures as previously indicated.
5.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
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PROCEDURE:
Continued
6.
The final dielectric breakdown test and dielectric
withstanding voltage test was performed in accordance with
EIA 364, Test Procedure 20 and the procedures previously
indicated.
7.
Sample ID# A-B2-3 was used to determine the breakdown
voltage. Sample ID# A-B2-1 and A-B2-2 were subsequently
tested at 75% of the breakdown voltage.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The dielectric breakdown voltage shall be measured and
recorded.
3.
When 75% of the breakdown voltage is applied to previously
untested samples, there shall be no evidence of breakdown,
arcing, etc.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The voltage at which dielectric breakdown occurred was
1200 VAC.
3.
No dielectric breakdown occurred on the separate test
samples when tested at 75% of the breakdown voltage. The
test voltage was 900 VAC.
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TEST RESULTS
SEQUENCE A
Group B3
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# A-B3-1,A-B3-2, TECHNICIAN: MHB
A-B3-3
-----------------------------------------------------------START DATE: 3/21/03
COMPLETE DATE: 3/31/03
-----------------------------------------------------------ROOM AMBIENT: 21°C
RELATIVE HUMIDITY: 41%
-----------------------------------------------------------EQUIPMENT ID#:
27, 321, 1360, 1361
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
1.
The purpose of this test is to permit evaluation of the
properties of materials used in connectors as they are
influenced or deteriorated by the effects of high humidity
and heat conditions. Measurements made under
high humidity conditions may reflect the peculiar
conditions under which the readings were made, and should
be compared only to initial readings when careful analysis
indicates that such a comparison is valid and applicable.
2.
This test obtains added effectiveness in employment of
temperature cycling that provides a breathing action,
inducing corrosion processes, and the introduction of
moisture into partially sealed test samples. This
condition imposes a vapor pressure on the samples which
constitutes the major force behind the moisture migration
and penetration.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31 Method III (omit Step 7a,7b),
with the following conditions:
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PROCEDURE:
2.
Continued
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
:
:
:
:
:
:
:
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
3.
The final dielectric breakdown test and dielectric
withstanding voltage test was performed in accordance with
EIA 364, Test Procedure 20 and the procedures as previously
indicated.
4.
Sample ID# A-B3-3 was used to determine the breakdown
voltage. Sample ID #’s A-B3-1 and A-B3-2 were
subsequently tested at 75% of the breakdown voltage.
5.
The voltage was applied to specific test points on the
board.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of the
test samples as tested.
2.
The voltage at which dielectric breakdown occurs shall be
measured and recorded.
3.
When 75% of the breakdown voltage is applied to previously
untested samples, there shall be no evidence of breakdown,
arcing, etc.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The voltage at which dielectric breakdown occurred was
1000 VAC.
3.
No dielectric breakdown occurred on the separate test
samples when tested at 75% of the breakdown voltage. The
test voltage was 750 VAC.
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TEST RESULTS
SEQUENCE B
Group A
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# B-A1-1, B-A1-2,
TECHNICIAN: MHB
B-A1-3,B-A1-4, B-A1-5,
B-A1-6,B-A1-7, B-A1-8
-----------------------------------------------------------START DATE: 3/17/03
COMPLETE DATE: 3/17/03
-----------------------------------------------------------ROOM AMBIENT:
21°C
RELATIVE HUMIDITY: 34%
-----------------------------------------------------------EQUIPMENT ID#: 681, 1045
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23, with the following conditions:
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PROCEDURE – Continued:
2.
Test Conditions:
a) Test Current
b) Open Circuit Voltage
3.
: 10 milliamps
: 20 millivolts
The points of application are shown in Figure #3.
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
B-A1-1
B-A1-2
B-A1-3
B-A1-4
B-A1-5
B-A1-6
B-A1-7
B-A1-8
2.
Avg.
37.0
37.4
37.4
36.9
37.5
36.4
37.1
37.9
Max.
39.5
40.3
41.0
39.4
40.5
39.3
39.8
41.3
Min.
32.3
31.8
32.1
31.7
31.0
30.8
31.3
31.9
See data files 20307301 through 20307308 for individual
data points.
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FIGURE #3
TYPICAL LLCR SET UP
+V, +I
-I
-V
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# B-A1-1, B-A1-2,
TECHNICIAN: MHB
B-A1-3,B-A1-4, B-A1-5,
B-A1-6,B-A1-7, B-A1-8
-----------------------------------------------------------START DATE: 3/19/03
COMPLETE DATE: 3/20/03
-----------------------------------------------------------ROOM AMBIENT:
20°C
RELATIVE HUMIDITY: 32%
-----------------------------------------------------------EQUIPMENT ID#: 553, 681, 684, 1045, 1166, 1167, 1168, 1169,
1271, 1272,
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity of
connectors for use with electronic equipment subjected to shocks
such as those expected from handling, transportation, etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 27.
2.
Test Conditions:
a)
b)
c)
d)
e)
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Sawtooth
11.3 feet per second
3 Shocks/Direction, 3 Axis (18 Total)
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #4 illustrates the test sample fixturing utilized
during the test.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
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REQUIREMENTS:
2.
Continued
The change in low level circuit resistance be measured
and recorded.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
Avg.
Change
B-A1-1
B-A1-2
B-A1-3
B-A1-4
B-A1-5
B-A1-6
B-A1-7
B-A1-8
+0.2
+0.3
+0.7
+0.1
+0.1
+0.2
+0.3
+0.0
Max.
Change
+4.7
+1.5
+14.0
+1.4
+1.3
+1.2
+1.8
+1.7
3.
See data files 20307301 through 2030708 for individual data
points.
4.
The Mechanical Shock characteristics are shown in Figures
#5 (Calibration Pulse) and #6 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
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FIGURE #4
TYPICAL MECHANICAL SHOCK
RANDOM VIBRATION SET-UP
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FIGURE #5
Channel 1
Classical Shock
[g]
200
150
100
Project 203073
Cal. Wave 2
20Mar03
Tech: /MHB
UPPER LIMIT-----50
ACCELERATION (g)
ACTUAL PULSE----0
-50
LOWER LIMIT-----
-100
0.45
0.46
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
0.55
[s]
DURATION (Seconds)
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FIGURE #6
Channel 1
Classical Shock
[g]
200
Project 203073
Actual Wave
19Mar03
Tech: /MHB
UPPER LIMIT------
ACCELERATION (g)
150
ACTUAL PULSE-----
100
50
0
-50
LOWER LIMIT-----100
0.45
0.46
0.47
0.48
0.49
0.50
0.51
0.52
DURATION (Seconds)
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0.53
0.54
0.55
[s]
Contech Research
PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# B-A1-1, B-A1-2,
TECHNICIAN: MHB
B-A1-3,B-A1-4, B-A1-5,
B-A1-6,B-A1-7, B-A1-8
-----------------------------------------------------------START DATE: 3/21/03
COMPLETE DATE: 3/21/03
-----------------------------------------------------------ROOM AMBIENT: 20°C
RELATIVE HUMIDITY: 32%
-----------------------------------------------------------EQUIPMENT ID#: 553, 620, 681, 1045, 1166, 1167, 1168, 1169,
1271, 1272
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if the electrical stability of the system has
degraded when exposed to a vibratory environment.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a) G ’RMS’
b) Frequency
c) Duration
:
:
:
7.56
50 to 2000 Hz
2.0 hours per axis, 3-axis total
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #4 illustrates the test sample fixturing utilized
during the test.
5.
All subsequent variable testing was performed in accordance
with procedures previously indicated.
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REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall be
measured and recorded.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the observed data:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
3.
Sample ID#
Avg.
Change
B-A1-1
B-A1-2
B-A1-3
B-A1-4
B-A1-5
B-A1-6
B-A1-7
B-A1-8
+0.2
+0.3
+0.8
+0.0
+0.1
+0.2
+0.5
+0.2
Max.
Change
+4.7
+1.6
+14.0
+1.1
+1.4
+1.2
+2.6
+4.0
See data files 20307301 through 2030708 for individual data
points.
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LLCR DATA FILES
DATA FILE NUMBERS
20307301
20307302
20307303
20307304
20307305
20307306
20307307
20307308
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Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# B-A1-1
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307301
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
21
40
21Mar03
Vibration
38.1
38.7
39.2
38.6
39.3
38.4
39.4
39.2
38.5
38.9
38.8
38.7
38.7
37.6
37.7
38.5
38.5
39.5
39.1
38.7
38.4
39.4
39.0
38.9
38.8
33.3
33.0
32.6
32.3
32.7
32.3
32.5
38.5
38.6
38.6
0.3
-0.3
-0.2
-0.2
0.0
-0.1
-0.1
0.0
0.4
4.7
1.6
0.8
0.4
0.5
1.1
0.4
2.0
1.5
0.3
0.4
-0.1
-0.3
-0.1
-0.1
0.0
-0.4
-0.5
0.2
-0.2
0.0
0.0
-0.7
-0.3
0.4
-0.3
0.0
0.0
-0.2
-0.3
-0.4
0.4
-0.3
-0.4
1.1
4.7
1.6
1.2
0.3
0.6
1.2
0.4
1.8
1.6
0.0
0.2
-0.1
-0.2
0.0
-0.1
0.0
-0.5
-0.4
0.0
-0.3
0.3
0.0
-0.7
-0.5
-0.2
-0.2
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Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
21
40
21Mar03
Vibration
38.4
38.2
38.2
38.4
38.6
38.2
38.0
38.4
32.9
32.5
33.0
32.3
32.8
32.8
33.5
-0.3
-0.4
0.0
0.0
-0.1
0.2
0.0
0.7
-0.7
-0.2
0.6
-0.5
-0.5
-0.1
-0.7
-0.2
-0.1
0.0
0.0
0.0
0.0
0.1
0.2
-0.8
-0.2
0.7
-0.4
-0.5
-0.1
-0.5
MAX
MIN
AVG
STD
Open
Tech
39.5
32.3
37.0
2.7
0
MHB
4.7
-0.7
0.2
0.9
0
MHB
4.7
-0.8
0.2
0.9
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
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Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# B-A1-2
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307302
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
21
40
21Mar03
Vibration
39.6
38.6
39.7
39.2
39.2
40.0
39.7
39.7
40.2
40.3
40.0
39.6
39.8
39.0
39.9
39.8
39.3
39.8
39.8
39.5
39.0
40.0
38.9
38.9
38.9
32.4
32.9
33.1
31.8
32.3
32.5
31.8
39.8
39.2
39.6
-0.1
0.3
0.1
0.7
0.9
0.7
0.6
0.8
0.3
0.6
0.7
-0.1
0.0
-0.3
-1.0
-0.9
-0.1
-0.3
-0.3
-0.2
0.3
-0.2
0.0
-0.5
-0.4
0.8
-0.5
0.5
1.1
0.9
0.5
0.7
1.5
1.1
1.0
-0.1
0.2
0.2
1.3
0.9
1.0
0.7
0.7
0.4
0.5
0.6
-0.5
-0.5
0.0
-0.8
-0.7
0.7
-0.3
-0.4
-0.1
0.1
-0.4
0.1
-0.5
-0.4
1.6
0.7
0.2
1.2
1.0
0.1
0.7
0.1
0.9
0.0
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Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
21
40
21Mar03
Vibration
39.1
38.6
38.7
38.6
39.3
39.4
38.9
39.2
31.8
31.8
32.5
32.2
32.4
32.9
32.6
1.0
0.5
0.6
0.7
0.5
0.3
0.1
0.3
0.9
0.7
1.2
-0.7
0.4
0.0
1.1
-0.1
0.8
0.7
0.8
0.5
0.2
0.0
0.3
0.8
0.7
1.2
-0.7
0.2
0.0
1.1
MAX
MIN
AVG
STD
Open
Tech
40.3
31.8
37.4
3.2
0
MHB
1.5
-1.0
0.3
0.6
0
MHB
1.6
-0.8
0.3
0.6
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
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Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# B-A1-3
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307303
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
21
40
21Mar03
Vibration
39.0
38.8
39.2
39.0
39.1
40.0
40.0
38.9
39.0
41.0
40.4
40.0
39.0
38.7
38.1
39.6
38.7
39.3
39.6
38.8
38.7
39.4
38.8
38.8
39.0
32.6
33.8
32.2
32.1
33.0
32.5
32.1
39.1
38.9
39.3
0.0
-0.2
-0.1
0.6
0.5
-0.5
-0.3
0.0
0.4
0.7
-0.2
-0.3
0.9
0.2
0.1
0.7
0.7
-0.3
0.3
-0.1
0.3
0.1
0.1
0.3
-0.1
0.5
0.8
3.0
1.1
-1.0
1.2
2.1
-0.4
-0.1
0.1
0.1
-0.2
0.1
0.5
0.6
-0.5
-0.2
-0.1
0.5
0.9
-0.1
-0.2
0.9
0.3
0.3
1.2
0.8
-0.1
0.4
-0.1
0.3
0.2
0.1
0.2
-0.1
0.5
1.0
3.4
1.3
-1.0
0.4
2.4
-0.1
0.1
0.0
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Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
21
40
21Mar03
Vibration
38.7
38.5
38.6
39.3
39.2
39.2
39.1
39.0
32.4
33.1
32.5
32.9
33.9
32.7
33.0
0.4
0.8
0.4
-0.1
-0.3
0.0
-0.1
0.0
3.0
-0.4
1.1
5.6
7.3
1.7
0.0
1.1
1.1
0.5
0.1
-0.3
0.3
0.0
-0.1
2.9
-0.4
1.1
5.6
8.0
1.2
-0.1
MAX
MIN
AVG
STD
Open
Tech
41.0
32.1
37.4
3.0
0
MHB
7.3
-1.0
0.6
1.5
0
MHB
8.0
-1.0
0.7
1.5
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
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Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# B-A1-4
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307304
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
38.7
38.7
38.4
38.4
38.4
39.4
38.9
38.3
38.3
38.7
39.1
38.4
38.6
38.4
38.7
38.9
38.4
38.5
38.9
38.6
38.7
38.2
38.1
38.5
38.6
31.7
32.1
32.2
32.7
32.7
32.1
32.4
38.4
38.7
38.9
0.1
-0.2
0.3
0.0
0.6
-0.4
0.1
0.6
0.4
0.2
-0.5
0.1
0.2
-0.3
0.0
-0.5
0.1
-0.1
-0.2
-0.3
0.0
0.1
0.4
-0.1
-0.2
-0.1
0.1
0.2
-0.9
-0.6
-0.8
-0.3
-0.2
-0.1
-0.3
-0.2
-0.2
0.1
-0.1
0.4
-0.5
0.0
0.5
0.2
0.2
-0.5
0.1
0.2
-0.4
0.0
-0.6
0.1
-0.1
-0.2
-0.4
-0.1
0.1
0.3
-0.2
-0.2
0.1
0.2
0.3
-1.1
-0.8
-0.8
-0.2
-0.1
0.1
-0.5
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Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
38.5
38.3
38.4
38.6
38.3
38.9
38.9
38.4
32.6
32.3
33.2
33.6
32.1
32.8
32.6
0.5
0.4
-0.1
0.1
0.5
0.3
-0.2
0.5
0.7
0.6
0.2
-0.1
0.3
1.4
1.3
0.4
0.4
-0.1
0.1
0.5
0.1
0.1
0.8
0.5
0.1
0.2
-0.2
0.3
1.1
1.1
MAX
MIN
AVG
STD
Open
Tech
39.4
31.7
36.9
2.8
0
MHB
1.4
-0.9
0.1
0.4
0
MHB
1.1
-1.1
0.0
0.4
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
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Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# B-A1-5
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307305
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
39.0
39.6
40.2
40.0
39.4
40.4
40.3
40.3
40.0
40.5
39.5
39.8
40.1
39.3
39.6
40.0
39.6
40.4
39.6
39.9
40.2
39.7
39.1
38.6
38.1
31.0
31.3
31.9
31.8
31.5
31.7
31.3
40.1
40.2
39.7
-0.3
0.2
0.3
0.5
1.1
0.7
0.2
0.5
-0.3
0.0
0.2
-0.2
-1.0
-0.1
0.7
1.3
-0.1
-0.4
0.3
0.1
-0.5
0.0
0.7
-0.1
0.3
0.5
1.0
-0.1
-0.8
-0.5
-0.6
-0.1
0.0
-0.2
-0.1
-0.3
0.2
0.4
0.5
1.0
0.6
0.2
0.5
-0.4
0.0
0.3
-0.3
-0.8
0.0
0.7
1.4
-0.1
-0.5
0.3
0.1
-0.5
0.2
0.7
-0.1
0.3
0.1
1.0
0.7
-0.4
-0.5
-0.8
0.2
0.1
0.3
0.0
TR#203073, REV.1.1
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Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
40.0
39.2
39.2
38.8
39.1
38.8
39.0
38.9
32.0
32.6
33.2
32.0
32.5
33.0
32.1
0.7
-0.4
-0.2
0.3
-0.1
0.5
0.2
0.5
-0.1
-0.8
-1.9
1.0
0.2
-0.9
0.6
1.0
-0.4
-0.1
0.2
-0.1
0.3
0.3
0.5
-0.1
-0.8
-1.8
1.0
0.1
-1.1
0.3
MAX
MIN
AVG
STD
Open
Tech
40.5
31.0
37.5
3.5
0
MHB
1.3
-1.9
0.1
0.6
0
MHB
1.4
-1.8
0.1
0.6
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
47 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product:
Series QTS/QSS connectors
Description: Sample ID# B-A1-6
Open circuit voltage:
20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307306
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
38.5
38.1
38.3
38.0
38.1
38.2
37.8
37.9
38.2
37.7
37.9
38.4
38.4
37.7
37.8
37.9
38.1
38.4
38.1
38.4
38.5
38.5
38.4
38.4
38.5
30.9
30.8
31.8
31.2
31.2
31.3
31.0
38.5
39.3
38.2
-0.2
0.5
0.3
1.2
0.5
0.0
0.8
0.6
1.0
0.8
0.2
0.8
0.3
0.4
0.1
0.5
0.5
0.1
0.4
0.4
0.4
0.6
-0.1
0.1
-0.1
0.9
0.0
0.7
0.2
-0.5
-0.8
-0.3
0.0
-0.6
0.2
-0.2
0.7
0.5
1.2
0.5
0.0
0.9
0.8
1.1
0.9
0.1
0.8
0.4
0.3
0.1
0.5
0.6
0.2
0.5
0.4
0.4
0.7
0.1
0.2
-0.1
0.8
0.3
0.7
0.9
-0.3
-0.8
0.0
0.2
-0.6
-0.2
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Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
38.4
38.2
38.5
38.5
38.7
38.7
38.6
38.5
31.2
32.0
31.8
33.0
31.7
31.8
31.3
0.1
-0.4
0.3
0.2
-0.3
0.4
-0.3
0.1
0.3
-0.4
0.0
-1.5
-0.3
0.2
-0.2
0.5
-0.3
0.2
0.2
-0.5
0.5
-0.1
0.3
-0.2
-0.4
0.0
-1.2
-0.2
0.0
-0.3
MAX
MIN
AVG
STD
Open
Tech
39.3
30.8
36.4
3.1
0
MHB
1.2
-1.5
0.2
0.5
0
MHB
1.2
-1.2
0.2
0.5
0
MHB
Equip ID
681
1045
681
1045
681
1045
TR#203073, REV.1.1
49 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# B-A1-7
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307307
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
39.1
38.8
39.4
38.8
39.4
39.1
39.3
39.4
39.4
38.7
39.8
39.4
39.1
38.9
39.1
39.5
39.0
38.7
39.7
39.2
38.4
39.6
38.6
38.3
38.4
32.3
32.4
31.8
31.7
32.4
32.8
32.0
39.0
39.0
38.9
1.0
1.1
0.0
0.7
0.5
1.1
1.8
0.6
0.9
1.5
0.1
0.1
-0.1
-0.2
-0.5
0.4
-0.2
0.1
-0.7
0.3
0.8
-0.2
0.3
0.4
-0.1
0.4
0.0
0.8
0.0
-0.1
0.5
0.2
0.6
0.7
0.6
1.4
1.2
0.1
0.7
0.5
1.1
2.0
1.3
2.6
1.8
0.0
0.1
0.1
-0.2
-0.6
0.3
-0.3
0.0
-0.6
0.1
0.7
0.3
0.8
0.0
-0.2
0.3
0.0
0.8
0.0
-0.1
0.6
0.3
0.6
0.6
0.5
TR#203073, REV.1.1
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Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
39.2
38.6
38.4
38.4
38.6
38.7
38.7
38.6
31.3
32.5
32.9
32.8
32.4
32.6
31.9
0.8
0.9
0.0
0.2
0.1
0.2
-0.1
0.2
1.0
-0.2
-0.1
-0.1
0.4
0.2
0.3
0.7
1.0
0.1
0.5
0.2
0.3
0.1
0.2
0.9
0.1
-0.1
0.0
0.9
0.2
0.2
MAX
MIN
AVG
STD
Open
Tech
39.8
31.3
37.1
3.1
0
MHB
1.8
-0.7
0.3
0.5
0
MHB
2.6
-0.6
0.5
0.6
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
51 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# B-A1-8
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq B
File #:
20307308
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
39.5
39.4
40.0
39.9
39.5
40.3
40.2
40.5
40.8
40.0
40.4
40.9
39.1
40.3
40.0
40.7
40.2
40.2
40.2
40.0
40.4
40.1
39.9
39.7
38.7
33.3
32.5
31.9
32.3
32.6
31.9
31.9
41.3
40.7
40.5
0.9
1.0
0.5
0.2
1.7
1.0
0.5
0.7
-0.4
0.2
-0.7
-1.0
0.5
-0.2
0.1
-0.3
0.1
-0.3
0.3
0.5
0.1
-0.1
-0.3
0.4
0.1
-0.3
-0.1
1.5
-0.3
-0.5
-0.4
0.5
-1.4
-1.2
-1.0
1.3
1.6
0.5
0.5
1.6
1.0
0.5
1.3
-0.1
0.3
-0.6
-1.1
0.5
-0.2
0.0
-0.4
-0.1
-0.4
0.0
0.4
0.0
0.0
-0.3
0.4
-0.1
4.0
0.3
2.0
-0.2
-0.3
0.0
1.2
-1.0
-0.9
-1.1
TR#203073, REV.1.1
52 of 89
Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
21
34
17Mar03
Initial
20
32
20Mar03
M.Shock
22
39
24Mar03
Vibration
41.2
40.7
38.9
39.3
39.5
39.5
39.2
39.4
32.8
32.9
32.6
32.6
32.3
32.7
33.1
-1.2
-0.1
-0.1
0.1
0.5
0.1
1.1
0.1
-0.8
0.4
-0.1
-1.0
-0.3
-0.1
-0.2
-0.4
0.1
0.0
0.1
0.5
0.3
0.9
0.2
-0.8
0.4
-0.1
-0.9
-0.1
-0.1
-0.4
MAX
MIN
AVG
STD
Open
Tech
41.3
31.9
37.9
3.5
0
MHB
1.7
-1.4
0.0
0.7
0
MHB
4.0
-1.1
0.2
0.9
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
53 of 89
Contech Research
TEST RESULTS
SEQUENCE C
Group A
TR#203073, REV.1.1
54 of 89
Contech Research
PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# C-A1-1,C-A1-2,
TECHNICIAN: MHB
C-A1-3,C-A1-4,C-A1-5,
C-A1-6,C-A1-7,C-A1-8
-----------------------------------------------------------START DATE: 3/14/03
COMPLETE DATE: 3/14/03
-----------------------------------------------------------ROOM AMBIENT: 20°C
RELATIVE HUMIDITY: 29%
-----------------------------------------------------------EQUIPMENT ID#: 681, 1045
-----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)
PURPOSE:
1.
To evaluate contact resistance characteristics of the
contact systems under conditions where applied voltages and
currents do not alter the physical contact interface and
will detect oxides and films which degrade electrical
stability. It is also sensitive to and may detect the
presence of fretting corrosion induced by mechanical or
thermal environments as well as any significant loss of
contact pressure.
2.
This attribute was monitored after each preconditioning
and/or test exposure in order to determine said stability
of the contact systems as they progress through the
applicable test sequences.
3.
The electrical stability of the system is determined by
comparing the initial resistance value to that observed
after a given test exposure. The difference is the change
in resistance occurring whose magnitude establishes the
stability of the interface being evaluated.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 23, with the following conditions:
TR#203073, REV.1.1
55 of 89
Contech Research
PROCEDURE – Continued:
2.
Test Conditions:
a) Test Current
b) Open Circuit Voltage
3.
: 10 milliamps
: 20 millivolts
The points of application are shown in Figure #3.
-----------------------------------------------------------REQUIREMENTS:
Low level circuit resistance shall be measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The following is a summary of the data observed:
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
Sample ID#
C-A1-1
C-A1-2
C-A1-3
C-A1-4
C-A1-5
C-A1-6
C-A1-7
C-A1-8
2.
Avg.
36.6
36.8
37.1
37.1
37.4
36.9
36.7
36.7
Max.
39.6
39.9
40.1
39.7
40.3
39.9
39.1
39.0
Min.
31.4
31.8
31.9
31.7
31.6
31.2
31.4
31.4
See data files 20307309 through 20307316 for individual
data points.
TR#203073, REV.1.1
56 of 89
Contech Research
PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# C-A1-1,C-A1-2,
TECHNICIAN: MHB
C-A1-3,C-A1-4,C-A1-5,
C-A1-6,C-A1-7,C-A1-8
-----------------------------------------------------------START DATE: 3/15/03
COMPLETE DATE: 3/19/03
-----------------------------------------------------------ROOM AMBIENT:
21°C
RELATIVE HUMIDITY: 32%
-----------------------------------------------------------EQUIPMENT ID#:
192, 321, 465, 466, 681, 1045, 1360, 1361
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
3.
The total number of cycles was performed continuously.
4.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
5.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS: See next page.
TR#203073, REV.1.1
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Contech Research
REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
The change in low level circuit resistance shall be
measured and recorded.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
The following is a summary of the observed data:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
3.
Sample ID#
Avg.
Change
Max.
Change
C-A1-1
C-A1-2
C-A1-3
C-A1-4
C-A1-5
C-A1-6
C-A1-7
C-A1-8
+0.0
-0.1
+0.3
+0.2
+0.0
-0.2
-0.2
+0.8
+0.7
+0.9
+1.2
+0.9
+1.2
+0.6
+0.1
+2.7
See data files 20307309 through 20307316 for individual
data points.
TR#203073, REV.1.1
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Contech Research
PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# C-A1-1,C-A1-2,
TECHNICIAN: MHB
C-A1-3,C-A1-4,C-A1-5,
C-A1-6,C-A1-7,C-A1-8
-----------------------------------------------------------START DATE: 3/21/03
COMPLETE DATE: 3/31/03
-----------------------------------------------------------ROOM AMBIENT:
20°C
RELATIVE HUMIDITY: 40%
-----------------------------------------------------------EQUIPMENT ID#:
27, 681, 1045, 1360, 1361
-----------------------------------------------------------HUMIDITY (THERMAL CYCLING)
PURPOSE:
To evaluate the impact on electrical stability of the contact
system when exposed to any environment which may generate
thermal/moisture type failure mechanisms such as:
a)
Fretting corrosion due to wear resulting from
micromotion, induced by thermal cycling. Humidity
accelerates the oxidation process.
b)
Oxidation of wear debris or from particulates from the
surrounding atmosphere which may have become entrapped
between the contacting surfaces.
c)
Failure mechanisms resulting from a wet oxidation
process.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 31, Method II with the following
conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
h)
Preconditioning (24 hours)
Relative Humidity
Temperature Conditions
Cold Cycle
Polarizing Voltage
Mating Conditions
Mounting Conditions
Duration
TR#203073, REV.1.1
59 of 89
:
:
:
:
:
:
:
:
50°C ± 5°C
90% to 95%
25°C to 65°C
No
No
Mated
Mounted
240 hours
Contech Research
PROCEDURE:
Continued
3.
Prior to performing variable measurements, the test samples
were allowed to recover to room ambient conditions.
4.
All subsequent variable testing was performed in accordance
with the procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical deterioration of
the test samples as tested.
2.
The change in low level circuit resistance shall be
measured and recorded.
-----------------------------------------------------------RESULTS:
1.
The test samples as tested showed no evidence of physical
deterioration.
2.
The following is a summary of the data observed:
CHANGE IN
LOW LEVEL CIRCUIT RESISTANCE
(Milliohms)
3.
Sample ID#
Avg.
Change
Max.
Change
C-A1-1
C-A1-2
C-A1-3
C-A1-4
C-A1-5
C-A1-6
C-A1-7
C-A1-8
+0.8
+0.0
+0.2
+0.1
+0.0
+0.0
+0.1
+1.7
+4.1
+0.9
+2.5
+1.0
+1.0
+0.9
+1.0
+6.7
See data files 20307309 through 20307316 for individual
data points.
TR#203073, REV.1.1
60 of 89
Contech Research
LLCR DATA FILES
DATA FILE NUMBERS
20307309
20307310
20307311
20307312
20307313
20307314
20307315
20307316
TR#203073, REV.1.1
61 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-1
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307309
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.0
38.4
38.0
38.3
37.7
38.5
38.7
38.2
38.1
39.1
39.5
38.3
38.3
38.9
38.0
38.6
38.6
38.8
39.6
38.4
38.5
38.6
39.2
37.8
37.4
32.2
32.2
32.4
32.4
31.9
31.7
31.4
38.3
38.8
39.3
-0.2
-0.4
-0.2
-0.1
-0.1
-0.1
0.7
0.5
0.0
-0.1
-0.3
-0.3
-0.3
-0.3
-0.2
-0.2
0.0
0.0
-0.1
-0.1
-0.1
0.0
-0.3
0.1
0.3
-0.1
0.1
0.1
0.0
0.0
-0.3
0.0
-0.1
-0.2
-0.6
1.6
2.2
3.8
1.2
1.1
1.0
2.7
3.3
3.7
1.1
4.1
0.7
-0.2
-0.2
0.3
0.2
0.1
0.0
0.2
-0.1
0.0
-0.1
-0.4
0.3
0.4
0.2
1.2
3.4
0.3
0.7
0.2
2.5
0.6
1.1
0.5
TR#203073, REV.1.1
62 of 89
Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.3
37.9
38.0
38.5
38.3
38.4
38.4
38.2
31.7
31.7
31.6
32.0
31.7
31.9
31.8
-0.1
0.1
0.0
0.0
0.2
0.1
0.3
0.6
0.2
-0.1
0.0
0.1
0.1
0.2
0.1
1.7
0.5
-0.1
0.4
0.1
-0.2
-0.1
0.2
0.2
0.0
0.1
0.0
0.1
0.0
0.2
MAX
MIN
AVG
STD
Open
Tech
39.6
31.4
36.6
3.0
0
MHB
0.7
-0.6
0.0
0.2
0
MHB
4.1
-0.4
0.8
1.2
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
63 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-2
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307310
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.1
38.0
38.2
38.7
38.3
38.8
38.8
38.9
39.5
38.1
38.6
38.9
38.2
39.6
38.9
39.9
39.1
38.6
38.6
38.9
38.5
39.0
38.3
37.9
38.1
32.2
32.6
32.2
31.9
32.7
32.7
32.1
38.5
38.4
39.0
0.3
-0.5
-0.2
-0.2
-0.1
0.3
0.2
-0.4
-0.4
-0.1
0.0
0.0
-0.7
-1.6
-0.6
0.1
-0.9
0.2
0.3
-0.2
0.0
0.1
0.1
0.0
-0.2
-0.1
-0.3
-0.3
0.4
-0.4
-0.5
-0.6
0.2
0.1
-0.4
0.9
0.2
0.8
0.6
0.1
0.2
0.3
-0.1
-0.4
0.1
0.1
0.1
-0.3
-1.5
-0.4
-0.1
-0.8
0.4
0.4
0.1
0.3
-0.1
-0.1
-0.1
-0.2
0.1
-0.3
-0.3
0.4
-0.4
-0.5
-0.5
0.3
0.5
0.0
TR#203073, REV.1.1
64 of 89
Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.0
38.1
38.3
38.3
38.2
38.8
38.2
38.5
32.3
32.0
32.6
31.8
32.5
32.1
32.2
0.1
0.0
-0.3
0.0
0.1
0.7
0.8
0.9
-0.6
-0.1
0.4
-0.1
0.0
-0.2
-0.1
-0.1
0.1
-0.1
0.1
0.2
-0.3
0.3
0.8
-0.3
-0.2
0.3
-0.2
-0.1
-0.2
-0.3
MAX
MIN
AVG
STD
Open
Tech
39.9
31.8
36.8
2.9
0
MHB
0.9
-1.6
-0.1
0.4
0
MHB
0.9
-1.5
0.0
0.4
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
65 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-3
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307311
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.6
40.1
38.8
38.9
38.2
38.3
38.4
37.9
38.7
39.1
39.0
39.2
38.3
38.8
38.8
38.6
39.0
38.4
39.5
38.7
38.7
39.1
38.6
38.4
38.3
33.2
32.9
33.4
32.9
31.9
32.0
31.9
38.7
38.2
39.2
0.0
0.2
0.2
0.3
-0.2
1.2
0.1
0.7
0.4
0.2
0.1
-0.2
0.0
0.2
0.3
1.2
0.5
-0.4
1.0
0.1
1.0
0.7
0.5
0.5
0.1
0.2
0.5
0.6
0.5
0.9
0.3
0.7
0.5
0.7
0.9
-0.2
-0.2
-0.1
0.1
-0.4
0.8
-0.3
0.6
0.3
0.0
0.0
-0.2
0.3
0.0
0.1
0.9
-0.2
-0.7
0.8
-0.4
0.5
0.4
0.2
2.5
0.3
0.1
0.3
0.3
0.3
0.8
0.1
0.1
0.4
1.4
1.6
TR#203073, REV.1.1
66 of 89
Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.3
38.8
38.3
39.6
39.5
38.5
39.6
39.2
32.8
32.9
33.6
33.1
33.1
32.9
33.3
0.3
0.4
-0.2
-0.9
-0.1
-0.2
-0.8
0.2
0.1
0.0
0.1
0.5
0.3
0.3
-0.1
0.5
0.2
-0.4
-0.9
-0.9
0.0
-0.9
0.2
-0.1
-0.2
0.0
0.3
0.2
0.4
0.0
MAX
MIN
AVG
STD
Open
Tech
40.1
31.9
37.1
2.7
0
MHB
1.2
-0.9
0.3
0.4
0
MHB
2.5
-0.9
0.2
0.6
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
67 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-4
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307312
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.1
38.8
39.0
38.8
39.3
39.2
39.2
39.1
39.5
39.7
38.6
39.5
39.3
39.4
39.3
39.2
39.1
38.8
39.1
38.8
39.6
39.0
39.0
38.6
38.8
32.2
31.7
32.8
32.6
32.6
32.0
32.0
38.9
39.1
39.0
-0.2
0.1
0.4
0.3
0.4
0.3
0.1
0.4
-0.1
-0.2
0.0
-0.2
-0.2
-0.3
0.9
0.5
0.2
0.4
0.1
0.2
-0.1
0.0
0.2
-0.1
0.1
0.8
0.9
0.1
0.2
0.0
-0.1
0.5
0.0
-0.1
0.1
0.5
-0.2
-0.1
-0.2
0.0
0.2
-0.1
-0.2
-0.3
-0.5
-0.1
-0.1
-0.1
-0.1
1.0
0.7
0.6
0.1
0.0
-0.2
-0.2
0.3
0.3
0.0
0.1
0.4
0.8
-0.2
-0.3
-0.5
0.2
-0.1
0.1
-0.4
0.3
TR#203073, REV.1.1
68 of 89
Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
39.1
38.4
38.5
38.7
38.6
38.7
39.2
38.0
32.3
32.1
33.4
32.5
32.4
32.0
32.3
0.1
0.5
0.1
0.1
0.5
0.7
0.2
0.7
0.0
-0.5
0.0
0.2
0.3
0.0
0.4
-0.3
0.2
-0.1
0.1
0.4
0.0
0.0
0.9
0.4
-0.5
0.3
0.0
0.5
-0.1
0.2
MAX
MIN
AVG
STD
Open
Tech
39.7
31.7
37.1
3.0
0
MHB
0.9
-0.5
0.2
0.3
0
MHB
1.0
-0.5
0.1
0.4
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
69 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-5
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307313
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
39.2
39.4
39.6
40.1
39.8
40.1
40.1
39.7
39.1
39.4
38.9
39.7
39.3
38.8
39.2
40.3
40.2
40.1
39.8
39.7
38.6
38.3
39.1
39.0
38.7
32.2
32.7
32.4
32.2
32.6
32.4
32.6
39.7
39.2
39.3
-0.4
-0.2
-0.1
-0.1
-0.1
-0.1
0.0
0.5
0.1
0.0
0.2
0.0
-0.3
-0.3
0.0
-0.2
-0.3
0.1
0.1
0.1
0.3
-0.1
-0.3
-0.4
-0.1
-0.4
0.4
0.1
0.1
0.2
-0.1
0.3
0.0
-0.3
0.6
-0.4
-0.2
-0.2
-0.1
-0.1
-0.1
-0.1
0.4
0.4
0.3
0.6
0.1
-0.3
-0.3
-0.1
-0.2
-0.2
0.2
-0.1
1.0
0.2
-0.1
-0.3
-0.5
-0.1
-0.3
0.3
0.0
0.4
0.6
0.0
0.8
-0.2
0.2
0.3
TR#203073, REV.1.1
70 of 89
Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
39.6
39.2
38.7
39.2
38.6
39.3
38.5
38.7
32.8
31.6
33.5
32.2
31.8
32.7
31.6
-0.1
-0.2
-0.1
-0.5
-0.1
-0.1
0.1
0.6
-0.3
0.1
-0.5
-0.4
1.2
0.2
-0.1
-0.1
-0.2
0.1
-0.6
-0.1
-0.3
0.2
0.4
-0.5
0.2
-0.5
-0.6
1.0
0.1
0.4
MAX
MIN
AVG
STD
Open
Tech
40.3
31.6
37.4
3.2
0
MHB
1.2
-0.5
0.0
0.3
0
MHB
1.0
-0.6
0.0
0.4
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
TR#203073, REV.1.1
71 of 89
Contech Research
Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-6
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307314
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.5
38.9
38.8
39.3
39.5
39.3
38.7
38.7
39.1
39.9
38.7
39.0
38.9
38.4
38.5
38.7
38.1
38.5
38.8
38.8
38.6
39.3
38.6
38.5
38.7
32.6
31.9
32.0
31.5
32.2
31.2
32.2
38.7
38.7
38.8
-0.2
0.0
-0.3
-0.6
-0.5
0.4
-0.1
-0.1
-0.2
-0.6
0.0
-0.4
0.1
0.0
-0.2
-0.2
0.1
-0.3
-0.3
-0.3
-0.2
-0.4
0.0
-0.3
-0.4
-0.6
-0.3
0.2
0.2
-0.1
-0.3
-0.4
-0.1
-0.2
0.0
0.0
0.6
-0.2
-0.7
-0.1
0.4
-0.2
-0.2
-0.3
-0.3
-0.2
-0.2
-0.2
-0.1
-0.3
-0.4
0.1
-0.2
-0.1
-0.3
0.2
-0.1
0.0
-0.1
-0.4
-0.7
-0.3
0.2
0.2
-0.1
-0.3
-0.3
0.9
0.9
0.4
TR#203073, REV.1.1
72 of 89
Contech Research
Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.9
38.7
38.4
38.6
38.8
38.5
38.7
38.8
31.5
32.4
32.3
33.0
32.4
32.2
32.1
-0.4
-0.3
-0.1
-0.1
0.0
0.0
-0.2
-0.3
-0.6
-0.7
0.1
-0.5
0.3
0.3
0.6
-0.1
-0.2
0.1
-0.3
0.0
0.1
0.2
0.2
-0.5
0.1
0.9
-0.1
0.2
0.4
0.5
MAX
MIN
AVG
STD
Open
Tech
39.9
31.2
36.9
3.1
0
MHB
0.6
-0.7
-0.2
0.3
0
MHB
0.9
-0.7
0.0
0.4
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
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Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-7
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307315
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.4
38.2
38.4
38.2
38.5
38.4
38.9
39.1
38.8
38.3
38.4
38.7
38.7
38.7
38.4
38.5
38.5
38.3
38.7
38.6
38.7
38.5
38.4
38.4
38.3
31.7
32.4
32.5
33.0
33.1
32.1
32.1
38.8
38.9
38.3
-0.2
-0.2
-0.2
0.0
-0.2
-0.2
-0.1
0.0
-0.3
-0.2
-0.2
-0.2
-0.3
-0.1
0.1
-0.2
-0.1
-0.2
-0.2
-0.2
-0.3
-0.1
-0.2
0.1
-0.1
-0.3
-0.3
0.0
-0.2
-0.4
-0.4
-0.1
-0.2
-0.1
-0.1
-0.2
0.0
-0.2
-0.1
0.0
0.0
-0.1
0.2
-0.2
0.3
-0.1
0.1
-0.1
0.1
0.6
0.1
0.5
0.0
0.3
-0.2
0.0
-0.1
-0.1
0.6
0.4
-0.1
0.1
0.5
0.1
0.2
0.2
0.0
-0.1
-0.2
0.2
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Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.2
37.9
38.3
38.0
38.4
38.4
38.4
37.9
31.4
32.7
31.8
32.1
32.2
31.9
32.1
0.0
-0.1
-0.3
-0.2
-0.3
0.0
-0.3
0.1
-0.1
-0.8
-0.6
-0.3
-0.3
-0.2
-0.3
-0.1
0.2
-0.3
0.2
0.1
0.4
0.0
0.4
0.9
-0.1
1.0
0.5
-0.2
0.3
-0.4
MAX
MIN
AVG
STD
Open
Tech
39.1
31.4
36.7
2.8
0
MHB
0.1
-0.8
-0.2
0.2
0
MHB
1.0
-0.4
0.1
0.3
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
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Low Level Contact Resistance
Project:
203073
Customer: Samtec
Product: Series QTS/QSS connectors
Description: Sample ID# C-A1-8
Open circuit voltage: 20mv
Spec:
EIA 364 TP 23
Subgroup: Seq C
File #:
20307316
Current:
100ma
Delta values
units: milliohms
Temp ºC
R.H. %
Date:
Pos. ID
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.3
38.2
38.3
38.2
38.5
38.4
38.8
39.0
38.8
38.2
38.4
38.7
38.6
38.7
38.4
38.5
38.5
38.3
38.7
38.6
38.7
38.5
38.4
38.4
38.3
31.8
32.4
32.6
32.9
33.1
32.1
32.0
38.7
38.9
38.3
0.0
0.4
0.5
1.1
0.0
0.1
0.7
0.2
0.9
0.5
1.6
0.6
0.0
-0.3
0.3
0.4
-0.1
0.8
1.2
1.1
1.4
2.7
1.2
0.8
0.1
0.0
0.4
0.3
0.0
0.1
0.3
0.4
0.3
0.8
0.7
0.6
1.0
1.3
0.9
1.7
1.8
1.1
1.1
1.2
1.9
2.3
2.0
1.6
0.9
1.3
1.9
1.2
2.2
1.5
1.0
1.9
1.9
1.4
1.2
0.4
6.7
1.9
1.9
1.0
1.9
1.5
3.4
1.4
2.0
3.8
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Temp ºC
R.H. %
Date:
Pos. ID
20
29
14Mar03
Initial
21
32
19Mar03
T.Shock
20
40
31Mar03
Humidity
38.1
37.8
38.3
37.9
38.3
38.3
38.4
37.9
31.4
32.6
31.7
32.1
32.2
31.7
32.0
0.2
0.6
0.4
0.8
1.2
1.2
1.4
1.9
1.4
1.2
2.7
2.2
1.9
1.7
1.2
1.1
1.1
1.0
1.5
1.3
1.8
1.3
1.9
2.1
1.3
2.5
2.3
1.6
1.2
1.3
MAX
MIN
AVG
STD
Open
Tech
39.0
31.4
36.7
2.8
0
MHB
2.7
-0.3
0.8
0.7
0
MHB
6.7
0.4
1.7
0.9
0
MHB
Equip ID
681
1045
681
1045
681
1045
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
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TEST RESULTS
SEQUENCE D
Group A
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# D-A-1,D-A-2,D-A-3 TECHNICIAN: MHB
-----------------------------------------------------------START DATE:
3/20/03
COMPLETE DATE:
3/20/03
-----------------------------------------------------------ROOM AMBIENT: 20°C
RELATIVE HUMIDITY: 32%
-----------------------------------------------------------EQUIPMENT ID#: 30, 545, 553, 684, 1166, 1167, 1168, 1169,
1271, 1272,
-----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)
PURPOSE:
To determine the mechanical and electrical integrity
of connectors for use with electronic equipment subjected to
shocks such as those expected from handling, transportation,
etc.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364,
Test Procedure 27, Test Condition C.
2.
Test Conditions:
a)
b)
c)
d)
e)
3.
Peak Value
Duration
Wave Form
Velocity
No. of Shocks
:
:
:
:
:
100 G
6 Milliseconds
Half-Sine
12.3 feet Per Second
3 Shocks/Direction, 3 Axis (18 Total)
Figure #4 illustrates the test sample fixturing utilized
during the test.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no contact interruption greater than
1.0 microsecond.
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RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no contact interruption greater than
1.0 microsecond.
3.
The Mechanical Shock characteristics are shown in Figures
#7 (Calibration Pulse) and #8 (Test Pulse). Each figure
displays the shock pulse contained within the upper and
lower limits as defined by the appropriate test
specification.
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FIGURE #7
Channel 1
Classical Shock
[g]
200
Project 203073
Cal Wave 1
20Mar03
Tech: /MHB
UPPER LIMIT------
ACCELERATION (g)
150
ACTUAL PULSE-----
100
50
0
-50
LOWER LIMIT-----
-100
0.45
0.46
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
0.55
[s]
DURATION (Seconds)
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FIGURE #8
Channel 1
Classical Shock
[g]
200
Project 203073
Actual Wave
20Mar03
UPPER LIMIT------
ACCELERATION (g)
150
100
Tech: /MHB
ACTUAL PULSE-----
50
0
-50
LOWER LIMIT-----
-100
0.45
0.46
0.47
0.48
0.49
0.50
0.51
0.52
0.53
0.54
0.55
[s]
DURATION (Seconds)
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE:ID# D-A-1,D-A-2,D-A-3 TECHNICIAN: MHB
-----------------------------------------------------------START DATE: 3/21/03
COMPLETE DATE: 3/24/03
-----------------------------------------------------------ROOM AMBIENT: 20°C
RELATIVE HUMIDITY: 33%
-----------------------------------------------------------EQUIPMENT ID#: 30, 545, 553, 620, 1166, 1167, 1168, 1169,
1271, 1272,
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To determine if electrical discontinuities at the level
specified exist.
2.
To determine if the contact system is susceptible to
fretting corrosion.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 28, Test Condition, Letter B.
2.
Test Conditions:
a) G ’RMS’
: 7.56
b) Frequency : 50 to 2000 HZ
c) Duration : 2.0 Hours Per Axis,
3 Axis Total
3.
Figure #4 illustrates the test sample fixturing utilized
during the test.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no contact interruption greater than
1.0 microsecond.
-----------------------------------------------------------RESULTS: See next page.
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RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no interruption greater than 1.0 microsecond.
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TEST RESULTS
SEQUENCE E
Group A
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# E-A1-1,E-A1-2, TECHNICIAN: MHB
E-A1-3
-----------------------------------------------------------START DATE: 3/15/03
COMPLETE DATE: 3/19/03
-----------------------------------------------------------ROOM AMBIENT: 20°C
RELATIVE HUMIDITY: 30%
-----------------------------------------------------------EQUIPMENT ID#:
30, 192, 1360, 1361
-----------------------------------------------------------THERMAL SHOCK
PURPOSE:
To determine the resistance of a given electrical connector to
exposure at extremes of high and low temperatures and the shock
of alternate exposures to these extremes, simulating the worst
probable conditions of storage, transportation and application.
-----------------------------------------------------------PROCEDURE:
1.
The test environment was performed in accordance with
EIA 364, Test Procedure 32, with the following conditions:
2.
Test Conditions:
a)
b)
c)
d)
e)
f)
g)
3.
Number of Cycles
Hot Extreme
Cold Extreme
Time at Temperature
Mating Conditions
Mounting Conditions
Transfer Time
:
:
:
:
:
:
:
100 Cycles
+85 +3°C/-0°C
-55 +0°C/-3°C
30 Minutes
Mated
Mounted
Instantaneous
The total number of cycles was performed continuously.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
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REQUIREMENTS:
2.
Continued
There shall be no contact interruption greater than 1.0
microsecond.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no contact interruption greater than
1.0 microsecond.
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PROJECT NO.: 203073
SPECIFICATION: TC036-0094
-----------------------------------------------------------PART NO.: QSS-100-01-L-D-RA
PART DESCRIPTION: QSS/QTS-RA
QTS-100-01-L-D-RA
Connectors
-----------------------------------------------------------SAMPLE SIZE: ID# E-A-1,E-A-2,
TECHNICIAN: MHB
E-A-3
-----------------------------------------------------------START DATE: 3/24/03
COMPLETE DATE: 3/24/03
-----------------------------------------------------------ROOM AMBIENT: 22°C
RELATIVE HUMIDITY: 39%
-----------------------------------------------------------EQUIPMENT ID#: 30, 281, 282, 553, 599, 684, 874, 1366,
1367, 1368
-----------------------------------------------------------VIBRATION, RANDOM
PURPOSE:
1.
To establish the mechanical integrity of the test samples
exposed to external mechanical stresses.
2.
To determine if the contact system is susceptible to
fretting corrosion.
3.
To determine if the electrical stability of the system has
degraded when exposed to a vibratory environment.
4.
To determine if electrical discontinuities at the level
specified exist.
-----------------------------------------------------------PROCEDURE:
1.
The test was performed in accordance with EIA 364, Test
Procedure 28, Test Condition V, Letter B.
2.
Test Conditions:
a) G ’RMS’
b) Frequency
c) Duration
:
:
:
7.56
50 to 2000 Hz
2.0 hours per axis, 3-axis total
3.
A stabilizing medium was used such that the mated test
samples did not separate during the test.
4.
Figure #4 illustrates the test sample fixturing utilized
during the test.
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PROCEDURE:
5.
Continued
All subsequent variable testing was performed in accordance
with procedures previously indicated.
-----------------------------------------------------------REQUIREMENTS:
1.
There shall be no evidence of physical damage to the test
samples as tested.
2.
There shall be no contact interruption greater than
1.0 microsecond.
-----------------------------------------------------------RESULTS:
1.
There was no evidence of physical damage to the test
samples as tested.
2.
There was no interruption greater than 1.0 microsecond.
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