AUGUST 18, 2008 TEST REPORT #208315A QUALIFICAITON TESTING PART NUMBERS ERF8-050-01-S-D-RA ERM8-050-05.0-S-DV-L SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH RESEARCH, INC. Test Laboratory Contech Research An Independent Test and Research Laboratory REVISION HISTORY DATE REV. NO. DESCRIPTION ENG. 8/15/2008 1.0 Initial Issue TP Test Laboratory TR#208315A, REV.1.0 2 of 50 Contech Research An Independent Test and Research Laboratory CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed with the concurrence of Samtec, Inc. of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing were calibrated and traceable to NIST according to ISO 10012-1 and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable. All data, raw and summarized, analysis and conclusions presented herein are the property of the test sponsor. No copy of this report, except in full, shall be forwarded to any agency, customer, etc., without the written approval of the test sponsor and Contech Research. APPROVED BY: DOMINIC AR PROGRAM MANAGER CONTECH RESEARCH, INC. TP:cf Test Laboratory TR#208315A, REV.1.0 3 of 50 Contech Research An Independent Test and Research Laboratory SCOPE To perform Qualificaiton testing on the ERF8/ERM8 connector series as manufactured and submitted by the test sponsor Samtec, Inc. APPLICABLE DOCUMENTS 1. Unless otherwise specified, the following documents of issue in effect at the time of testing performed form a part of this report to the extent as specified herein. The requirements of sub-tier specifications and/or standards apply only when specifically referenced in this report. 2. Samtec test plan: 3. Standards: EIA Publication 364 ERF8-RA Flow Chart TEST SAMPLES AND PREPARATION 1. The following test samples were submitted by the test sponsor, Samtec, Inc., for the evaluation to be performed by Contech Research, Inc. Description Part Number a) Receptacle Connector b) Plug Connector ERF8-050-01-S-D-RA ERM8-050-05.0-S-DV-L 2. Test samples were supplied assembled and terminated to test boards by the test sponsor. 3. Test boards for mounting test samples were supplied by the test sponsor. 4. Figure #1 illustrates the connectors used for test. 5. Test leads were attached to the appropriate measurement areas of the test samples and applicable mating elements. 6. The mated test samples were secured via a stabilizing medium to maintain mechanical stability during test. -continued on next page. Test Laboratory TR#208315A, REV.1.0 4 of 50 Contech Research An Independent Test and Research Laboratory TEST SAMPLES AND PREPARATION –continued 7. Unless otherwise specified in the test procedures used, no further preparation was used. TEST SELECTION 1. See Test Plan Flow Diagram, Figure #2, for test sequences used. 2. Test set ups and/or procedures which are standard or common are not detailed or documented herein provided they are certified as being performed in accordance with the applicable (industry or military) test methods, standards and/or drawings as specified in the detail specification. SAMPLE CODING 1. All samples were coded. Mated test samples remained with each other throughout the test group/sequences for which they were designated. Coding was performed in a manner which remained legible for the test duration. 2. The test samples were coded in the following manner: Group A: Group Group Group Group A B1 B2 B3 – – – – A-A-1, A-A-2 A-B1-B, A-B1-2 A-B2-1, A-B2-2 A-B3-1, A-B3-2 Group B: Group A1 – B-A-1, B-A-2, B-A-3, B-A-4 B-A-5, B-A-6, B-A-7, B-A-8 Group D: Group A – D-A-1, D-A-2, D-A-3 Board Number Group ID Sequence Test Laboratory TR#208315A, REV.1.0 5 of 50 Contech Research An Independent Test and Research Laboratory FIGURE #1 TYPICAL MATED TEST SAMPLE Test Laboratory TR#208315A, REV.1.0 6 of 50 Contech Research An Independent Test and Research Laboratory FIGURE #2 TEST PLAN FLOW DIAGRAM SAMPLE PREPARATION SEQ. A IR DWV TH. SHOCK TH. SHOCK DWV SEQ. B SEQ. C LLCR CHARACTERIZATION DURABILITY MECH. SHOCK CYCLIC HUMIDITY DWV LLCR RANDOM VIBRATION IR TH. SHOCK CYCLIC HUMDITY LLCR IR CYCLIC HUMIDITY LLCR GR.A GR.B1 GR. B2 GR. B3 GR. A Test Laboratory TR#208315A, REV.1.0 7 of 50 GR. A Contech Research An Independent Test and Research Laboratory DATA SUMMARY TEST REQUIREMENTS RESULTS 1000 MEGOHMS MIN. NO DAMAGE 1000 MEGOHMS MIN. NO DAMAGE 1000 MEGOHMS MIN. >50,000 MEGOHMS PASSED >50,000 MEGOHMS PASSED >50,000 MEGOHMS NO BREAKDOWN, ETC. PASSED NO DAMAGE NO BREAKDOWN, ETC. PASSED PASSED NO DAMAGE NO BREAKDOWN, ETC. PASSED PASSED SEQUENCE A GROUP A INSULATION RESISTANCE THERMAL SHOCK INSULATION RESISTANCE CYCLIC HUMIDITY INSULATION RESISTANCE GROUP B1 DWV GROUP B2 THERMAL SHOCK DWV GROUP B3 CYCLIC HUMIDITY DWV SEQUENCE B GROUP A LLCR DURABILITY LLCR THERMAL SHOCK LLCR CYCLIC HUMIDITY LLCR RECORD NO DAMAGE +10.0 mΩ MAX.CHG. NO DAMAGE +10.0 mΩ MAX.CHG. NO DAMAGE +10.0 mΩ MAX.CHG. 24.1 mΩ MAX. PASSED +2.2 mΩ MAX.CHG. PASSED +2.0 mΩ MAX.CHG. PASSED +3.4 mΩ MAX.CHG. SEQUENCE C GROUP A MECHANICAL SHOCK RANDOM VIBRATION NO DAMAGE 1.0 MICROSECOND NO DAMAGE 1.0 MICROSECOND PASSED PASSED PASSED PASSED 8 of 50 An Independent Test and Research Laboratory Test Laboratory TR#208315A, REV.1.0 Contech Research EQUIPMENT LIST ID# 52 192 321 488 547 553 601 673 677 681 1166 1167 1168 1169 1271 1272 1315 1549 1550 1556 Next Cal Last Cal 4/29/2009 3/12/2009 4/29/2008 3/12/2008 6/12/2009 2/11/2009 6/12/2008 2/11/2008 8/12/2009 10/5/2008 8/12/2008 10/5/2007 7/17/2009 7/17/2008 2/7/2009 12/15/2008 12/14/2008 2/5/2009 2/7/2008 12/15/2007 12/14/2007 2/5/2008 Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal Drill Press Stand Vertical Thermal Shock AC-DC Hipot/Megometer X-Y Table Temp Humid Chamber 12 channel Power Unit Computer Microohm Meter Microohm Meter Computer Sine/Rndm Vib Control Digitizer Interface Mainframe Computer Amplifier Shaker Table Data Aquisition Multimeter Multiplexer Card Multiplexer Card Accelerometer Craftsman Cincinnati Sub-Zero Hipotronics Co. N.E.Affiliated Tech. CSZ PCB Co. A.M.I. Keithley Co. Keithley Co. ARC Co. Hewlett Packard 25921 VTS-1-5-3 H300B N/A ZH-8-1-H-AC 483A P111-450 580 580 P166 E1432A 4001-2 88-11094 DS16-201 932021 ZG9442057 1303 082714 0681911 0685122 N/A US39342279 N/A See Cal Cert See Cal Cert N/A See Cal Cert See Cal Cert N/A See Cal Cert See Cal Cert N/A See Cal Cert N/A 12mon 12 mon. N/A 12mon 12mon N/A 12 mon. 12 mon N/A 12mon Hewlett Packard Hewlett Packard ARC Unholtz Dickie Unholtz Dickie Keithley Co. Keithley Keithley PCB E8491B E8408A PC133 SA15 S202PB 2700 7708 7708 353B04 US390100753 US39000357 none 3483 263 0862680 171629 171626 122769 N/A N/A N/A N/A N/A See CERT See Cert See Cert See Cal Cert N/A N/A N/A N/A N/A 12mon See Cert See Cert 12mon Test Laboratory Contech Research TR#208315A, REV.1.0 9 of 50 An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP A Test Laboratory TR#208315A, REV.1.0 10 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: BE -----------------------------------------------------------START DATE: 7/10/08 COMPLETE DATE: 7/10/08 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 42% -----------------------------------------------------------EQUIPMENT ID#: 321 -----------------------------------------------------------INSULATION RESISTANCE(IR) PURPOSE: To determine the resistance of insulation materials to leakage of current through or on the surface of these materials when a DC potential is applied. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 21. 2. Test Conditions: a) b) c) d) e) 3. Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Test Voltage : : : : : Yes Yes Mated Mounted 500 VDC The test voltage was applied to specific test points on the test board. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, the insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: The insulation resistance exceeded 50,000 megohms. Test Laboratory TR#208315A, REV.1.0 11 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: BE -----------------------------------------------------------START DATE: 7/10/08 COMPLETE DATE: 7/16/08 -----------------------------------------------------------ROOM AMBIENT: 22 °C RELATIVE HUMIDITY: 42% -----------------------------------------------------------EQUIPMENT ID#: 192, 321, 1315, 1549, 1550 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles were performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#208315A, REV.1.0 12 of 50 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The insulation resistance exceeded 50,000 megohms. Test Laboratory TR#208315A, REV.1.0 13 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: BE -----------------------------------------------------------START DATE: 7/18/08 COMPLETE DATE: 7/29/08 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 48% -----------------------------------------------------------EQUIPMENT ID#: 321, 547, 1315, 1549, 1550 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. Measurements made under high humidity conditions may reflect the peculiar conditions under which the readings were made, and should be compared only to initial readings when careful analysis indicates that such a comparison is valid and applicable. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) h) 3. Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : : 50°C ± 5°C 90% to 95% 25°C to 65°C No No Mated Mounted 240 hours Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#208315A, REV.1.0 14 of 50 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The final insulation resistance shall not be less than 1,000 megohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The final insulation resistance exceeded 50,000 megohms after air dry of 2 hours. Test Laboratory TR#208315A, REV.1.0 15 of 50 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP B1 Test Laboratory TR#208315A, REV.1.0 16 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: DH -----------------------------------------------------------START DATE: 7/14/08 COMPLETE DATE: 7/14/08 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 46% -----------------------------------------------------------EQUIPMENT ID#: 321 -----------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL) PURPOSE: To determine if the connectors can operate at its rated voltage and withstand momentary overpotentials due to switching, surges and other similar phenomenon. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 20. 2. Test Conditions: a) b) e) f) i) j) k) 3. Between Adjacent Contacts Between Rows Mated Condition Mounting Condition Hold Time Rate of Application Test Voltage : : : : : : : Yes Yes Mated Mounted 60 seconds 500 volts/sec. 900 VAC The test voltage was applied to specific test points on the test board. -----------------------------------------------------------REQUIREMENTS: When the specified test voltage is applied, there shall be no evidence of breakdown, arcing, etc. -----------------------------------------------------------RESULTS: All test samples as tested met the requirements as specified. Test Laboratory TR#208315A, REV.1.0 17 of 50 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP B2 Test Laboratory TR#208315A, REV.1.0 18 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: BE -----------------------------------------------------------START DATE: 7/10/08 COMPLETE DATE: 7/16/08 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 32% -----------------------------------------------------------EQUIPMENT ID#: 192, 321, 1315, 1549, 1550 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles were performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#208315A, REV.1.0 19 of 50 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. When a 900 VAC test voltage is applied, there shall be no evidence of arcing, breakdown, etc. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no evidence of arcing, breakdown, etc., when a 900 VAC voltage was applied. Test Laboratory TR#208315A, REV.1.0 20 of 50 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE A GROUP B3 Test Laboratory TR#208315A, REV.1.0 21 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 2 Samples TECHNICIAN: BE -----------------------------------------------------------START DATE: 7/18/08 COMPLETE DATE: 7/29/08 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 48% -----------------------------------------------------------EQUIPMENT ID#: 321, 547, 1315, 1549, 1550 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: The purpose of this test is to permit evaluation of the properties of materials used in connectors as they are influenced or deteriorated by the effects of high humidity and heat conditions. Measurements made under high humidity conditions may reflect the peculiar conditions under which the readings were made, and should be compared only to initial readings when careful analysis indicates that such a comparison is valid and applicable. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) g) h) 3. Preconditioning (24 hours) Relative Humidity Temperature Conditions Cold Cycle Polarizing Voltage Mating Conditions Mounting Conditions Duration : : : : : : : : 50°C ± 5°C 90% to 95% 25°C to 65°C No No Mated Mounted 240 hours Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#208315A, REV.1.0 22 of 50 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. There shall be no evidence of arcing or breakdown when a 900 VAC test voltage is applied. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. There was no evidence of breakdown, arcing, etc., when a 900 VAC test voltage was applied. Test Laboratory TR#208315A, REV.1.0 23 of 50 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE B GROUP A Test Laboratory TR#208315A, REV.1.0 24 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: BE, DH -----------------------------------------------------------START DATE: 7/10/08 COMPLETE DATE: 7/10/08 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 42% -----------------------------------------------------------EQUIPMENT ID#: 601, 673, 677, 681 -----------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR) PURPOSE: 1. To evaluate contact resistance characteristics of the contact systems under conditions where applied voltages and currents do not alter the physical contact interface and will detect oxides and films which degrade electrical stability. It is also sensitive to and may detect the presence of fretting corrosion induced by mechanical or thermal environments as well as any significant loss of contact pressure. 2. This attribute was monitored after each preconditioning and/or test exposure in order to determine said stability of the contact systems as they progress through the applicable test sequences. 3. The electrical stability of the system is determined by comparing the initial resistance value to that observed after a given test exposure. The difference is the change in resistance occurring whose magnitude establishes the stability of the interface being evaluated. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 23 with the following conditions: -continued on next page. Test Laboratory TR#208315A, REV.1.0 25 of 50 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 2. Test Conditions: a) Test Current : 10 milliamps maximum b) Open Circuit Voltage : 20 minutes c) No. of Positions Tested : 23 per test sample 3. The points of application are shown in Figure #3. -----------------------------------------------------------REQUIREMENTS: Low level circuit resistance shall be measured and recorded. -----------------------------------------------------------RESULTS: 1. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 2. Avg. 19.7 19.7 20.3 19.6 20.0 19.5 20.0 19.6 Max. 20.8 23.2 24.1 22.3 22.2 21.0 24.0 22.8 Min. 17.1 16.9 17.2 16.3 17.1 17.3 17.0 17.2 See data files 20831501 through 20831508 for individual data points. Test Laboratory TR#208315A, REV.1.0 26 of 50 Contech Research An Independent Test and Research Laboratory FIGURE #3 TYPICAL LLCR SET-UP Test Laboratory TR#208315A, REV.1.0 27 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: BE, DH -----------------------------------------------------------START DATE: 7/10/08 COMPLETE DATE: 7/10/08 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 42% -----------------------------------------------------------EQUIPMENT ID#: 52, 488, 601, 673, 677, 681 -----------------------------------------------------------DURABILITY PURPOSE: 1. This is a conditioning sequence which is used to induce the type of wear on the contacting surfaces which may occur under normal service conditions. The connectors are mated and unmated a predetermined number of cycles. Upon completion, the units being evaluated are exposed to the environments as specified to assess any impact on electrical stability resulting from wear or other wear dependent phenomenon. 2. This type of conditioning sequence is also used to mechanically stress the connector system as would normally occur in actual service. This sequence in conjunction with other tests is used to determine if a significant loss of contact pressure occurs from said stresses which in turn, may result in an unstable electrical condition to exist. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 09. 2. Test Conditions: a) No. of Cycles b) Rate 3. : : 100 1.0 inch per minute The test samples were assembled to special holding devices and attached to the manual cycling equipment. -continued on next page. Test Laboratory TR#208315A, REV.1.0 28 of 50 Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 4. The test samples were axially aligned to accomplish the mating and unmating function allowing for self-centering movement. 5. Care was taken to prevent the mating faces of the test samples from contacting each other. 6. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples so tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the data observed: LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 2. Avg. Change Max. Change +0.1 +0.0 -0.7 +0.0 -0.3 +0.0 -0.4 +0.1 +1.7 +2.2 +1.2 +0.6 +0.7 +0.8 +0.9 +1.4 See data files 20831501 through 20831508 for individual data points. Test Laboratory TR#208315A, REV.1.0 29 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: BE -----------------------------------------------------------START DATE: 7/10/08 COMPLETE DATE: 7/16/08 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 32% -----------------------------------------------------------EQUIPMENT ID#: 192, 601, 673, 677, 681, 1315, 1549, 1550 -----------------------------------------------------------THERMAL SHOCK PURPOSE: To determine the resistance of a given electrical connector to exposure at extremes of high and low temperatures and the shock of alternate exposures to these extremes, simulating the worst probable conditions of storage, transportation and application. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 32, with the following conditions: 2. Test Conditions: a) b) c) d) e) f) h) Number of Cycles Hot Extreme Cold Extreme Time at Temperature Mating Conditions Mounting Conditions Transfer Time : : : : : : : 100 Cycles +85 +3°C/-0°C -55 +0°C/-3°C 30 Minutes Mated Mounted Instantaneous 3. The total number of cycles were performed continuously. 4. All subsequent variable testing was performed in accordance with the procedures as previously indicated. 5. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#208315A, REV.1.0 30 of 50 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. The following is a summary of the observed data: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) Sample ID# B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 3. Avg. Change +0.2 -0.2 -1.0 -0.5 -0.4 +0.1 -0.2 +0.1 Max. Change +2.0 +1.0 +0.8 +0.4 +0.5 +1.3 +1.1 +1.3 See data files 20831501 through 20831508 for individual data points. Test Laboratory TR#208315A, REV.1.0 31 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: BE, DH -----------------------------------------------------------START DATE: 7/18/08 COMPLETE DATE: 7/29/08 -----------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 43% -----------------------------------------------------------EQUIPMENT ID#: 547, 601, 673, 677, 681, 1315, 1549, 1550 -----------------------------------------------------------HUMIDITY (THERMAL CYCLING) PURPOSE: To evaluate the impact on electrical stability of the contact system when exposed to any environment which may generate thermal/moisture type failure mechanisms such as: a) Fretting corrosion due to wear resulting from micromotion, induced by thermal cycling. Humidity accelerates the oxidation process. b) Oxidation of wear debris or from particulates from the surrounding atmosphere which may have become entrapped between the contacting surfaces. c) Failure mechanisms resulting from a wet oxidation process. -----------------------------------------------------------PROCEDURE: 1. The test environment was performed in accordance with EIA 364, Test Procedure 31, with the following conditions: 2. Test Conditions: a) Preconditioning (24 hours) b) Relative Humidity c) Temperature Conditions d) Cold Cycle e) Polarizing Voltage f) Mating Conditions g) Mounting Conditions h) Duration -continued on next page. Test Laboratory TR#208315A, REV.1.0 32 of 50 : : : : : : : : 50°C ± 5°C 90% to 95% 25°C to 65°C No No Mated Mounted 240 hours Contech Research An Independent Test and Research Laboratory PROCEDURE: -continued 3. Prior to performing variable measurements, the test samples were allowed to recover to room ambient conditions. 4. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: 1. There shall be no evidence of physical deterioration of the test samples as tested. 2. The change in low level circuit resistance shall not exceed +10.0 milliohms. -----------------------------------------------------------RESULTS: 1. The test samples as tested showed no evidence of physical deterioration. 2. The following is a summary of the data observed: CHANGE IN LOW LEVEL CIRCUIT RESISTANCE (Milliohms) 3. Sample ID# Avg. Change Max. Change B-A-1 B-A-2 B-A-3 B-A-4 B-A-5 B-A-6 B-A-7 B-A-8 +0.2 -0.2 -1.1 -0.9 -0.8 -0.3 -0.9 -0.3 +3.4 +2.2 +0.8 +0.6 +0.8 +0.7 +0.2 +1.0 See data files 20831501 through 20831508 for individual data points. Test Laboratory TR#208315A, REV.1.0 33 of 50 Contech Research An Independent Test and Research Laboratory LLCR DATA FILES FILE NUMBERS 20831501 20831502 20831503 20831504 20831505 20831506 20831507 20831508 Test Laboratory TR#208315A, REV.1.0 34 of 50 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-1 20831501 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 18.5 18.1 18.4 17.1 20.3 20.3 20.2 20.1 20.6 19.9 20.8 20.0 20.1 20.1 20.6 20.2 20.2 19.8 20.1 19.6 19.4 20.7 17.2 23 42 10Jul08 Durability 100X 0.2 -0.7 -0.5 0.0 1.7 0.2 1.0 0.0 -0.1 0.5 -0.2 0.5 1.1 0.2 0.2 0.0 0.3 0.1 0.3 -0.6 -2.2 -1.3 0.7 MAX MIN AVG STD Open Tech 20.8 17.1 19.7 1.1 0 BE 1.7 -2.2 0.1 0.8 0 BE 2.0 -2.5 0.2 1.1 0 BE 3.4 -2.7 0.2 1.4 0 DH Equip ID 601 677 601 677 601 677 236 681 Test Laboratory TR#208315A, REV.1.0 35 of 50 23 42 16Jul08 Thermal Shock 0.0 -1.1 -0.3 -0.1 0.7 1.0 0.9 -0.1 0.2 0.4 0.4 0.3 2.0 0.9 1.0 0.3 0.6 1.6 0.6 -1.1 -2.3 -2.5 0.1 23 48 29Jul08 Cyclic Humidity -0.7 -1.2 -0.7 -0.5 1.6 0.9 0.4 1.0 3.4 0.5 1.4 1.1 1.0 0.4 1.3 0.0 0.6 0.1 0.1 -1.5 -2.4 -2.7 -0.3 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-2 20831502 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 17.7 17.2 18.6 16.9 20.4 19.5 20.9 19.9 20.2 19.9 20.4 23.2 21.1 20.5 20.8 20.0 20.1 20.2 20.5 18.7 17.7 21.3 17.3 23 42 10Jul08 Durability 100X 1.2 -0.5 0.1 0.6 -0.4 0.3 -0.2 -0.1 -0.4 0.1 0.7 -3.4 -0.3 0.0 0.8 -0.1 0.3 -0.3 -0.4 0.7 -0.2 -0.5 2.2 MAX MIN AVG STD Open Tech 23.2 16.9 19.7 1.6 0 BE 2.2 -3.4 0.0 1.0 0 BE 1.0 -2.5 -0.2 0.9 0 BE 2.2 -2.6 -0.2 0.9 0 DH Equip ID 601 677 601 677 601 677 236 681 Test Laboratory TR#208315A, REV.1.0 36 of 50 23 42 16Jul08 Thermal Shock 0.4 -0.6 -0.8 -0.1 -0.1 0.4 -0.2 0.4 -0.3 0.4 1.0 -2.5 -0.1 0.9 -0.2 0.0 1.0 -0.3 -0.2 -0.7 -0.6 -2.3 0.3 23 48 29Jul08 Cyclic Humidity -0.1 0.3 -1.0 -0.4 -0.2 0.6 -0.2 0.0 -0.3 2.2 1.4 -1.1 -0.2 -0.4 -0.2 -0.4 0.0 -0.6 -0.4 -0.9 -1.0 -2.6 0.2 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-3 20831503 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 18.8 18.7 19.5 17.2 20.9 19.9 20.5 19.8 21.4 21.9 23.3 19.9 21.3 20.5 23.1 24.1 22.1 20.6 22.0 17.8 17.7 18.5 17.7 23 42 10Jul08 Durability 100X -0.2 -1.4 -1.0 0.0 -0.7 -0.3 1.0 0.1 0.1 -1.3 -2.0 1.2 -0.3 0.2 -2.4 -4.4 -1.5 -0.7 -0.8 0.0 -0.5 -0.4 -0.6 MAX MIN AVG STD Open Tech 24.1 17.2 20.3 1.9 0 BE 1.2 -4.4 -0.7 1.2 0 BE 0.8 -4.1 -1.0 1.1 0 BE 0.8 -4.4 -1.1 1.1 0 DH Equip ID 601 677 601 677 601 677 236 681 Test Laboratory TR#208315A, REV.1.0 37 of 50 23 42 16Jul08 Thermal Shock -0.9 -1.6 -1.9 -0.4 -0.7 -0.4 0.4 0.2 -0.1 -0.8 -2.4 0.8 -0.7 -0.5 -2.9 -4.1 -1.6 -1.0 -0.8 -0.7 -1.2 -1.0 -1.2 23 48 29Jul08 Cyclic Humidity -1.4 -1.9 -2.3 -0.5 -0.8 -0.4 0.8 0.0 -0.3 -0.8 -2.2 0.1 -0.9 -0.6 -2.1 -4.4 -1.6 -0.6 -0.9 -0.7 -1.2 -1.2 -1.3 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-4 20831504 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 18.0 16.6 17.9 16.8 20.6 20.0 20.4 20.4 20.8 19.5 20.8 20.0 21.3 21.1 20.9 20.5 21.5 22.2 22.3 18.4 17.3 17.4 16.3 23 42 10Jul08 Durability 100X 0.6 0.3 0.2 0.1 0.2 0.5 -0.3 0.1 -0.1 0.5 -0.6 0.4 0.3 -0.2 -0.3 0.2 -0.4 -1.2 -1.3 -0.4 0.1 0.3 0.2 MAX MIN AVG STD Open Tech 22.3 16.3 19.6 1.9 0 BE 0.6 -1.3 0.0 0.5 0 BE 0.4 -1.6 -0.5 0.6 0 BE 0.6 -2.4 -0.9 0.7 0 DH Equip ID 601 677 601 677 601 677 236 681 Test Laboratory TR#208315A, REV.1.0 38 of 50 23 42 16Jul08 Thermal Shock 0.4 -0.2 -0.7 -0.8 0.3 -0.4 -0.5 -0.5 -1.0 0.4 -0.8 0.0 -0.9 -1.4 0.0 -0.9 -0.6 -1.6 -1.5 -1.5 -0.6 0.1 0.4 23 48 29Jul08 Cyclic Humidity 0.2 -0.3 -0.7 -0.6 -0.9 -0.3 -0.8 -1.3 -1.5 -0.3 -1.2 -0.9 -1.4 -1.8 -1.2 -1.4 -1.5 -2.4 -1.9 -0.7 -0.5 0.3 0.6 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-5 20831505 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 17.87 17.07 17.72 17.06 21.01 20.24 20.67 20.23 20.83 20.48 21.57 20.78 21.38 21.49 22.17 21.99 21.45 21.13 21.40 19.04 18.11 18.49 17.88 23 42 10Jul08 Durability 100X 0.2 -0.1 0.3 0.1 0.2 0.2 0.0 -0.2 0.0 -0.1 0.7 -0.2 -0.1 -1.3 -1.4 -1.2 -0.3 -0.8 -1.4 0.0 -0.3 0.1 -0.4 MAX MIN AVG STD Open Tech 22.2 17.1 20.0 1.7 0 DH 0.7 -1.4 -0.3 0.6 0 DH 0.5 -1.4 -0.4 0.5 0 BE 0.8 -2.1 -0.8 0.7 0 DH Equip ID 673 681 673 681 601 677 673 681 Test Laboratory TR#208315A, REV.1.0 39 of 50 23 42 16Jul08 Thermal Shock 0.0 -0.5 0.1 -0.4 0.5 0.4 -0.1 -0.2 -0.1 -0.6 -0.6 0.2 -0.2 -1.3 -0.2 -1.2 -0.5 0.2 -1.1 -1.4 -1.0 -0.7 -1.0 23 48 29Jul08 Cyclic Humidity -0.4 -0.4 0.8 -0.6 -0.5 0.2 -0.1 -0.5 -0.6 -0.6 -0.8 -0.8 -1.1 -1.8 -1.5 -2.1 -1.4 -0.1 -1.1 -1.5 -1.5 -0.6 -1.3 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-6 20831506 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 17.3 17.8 18.9 17.4 20.7 20.2 21.0 21.0 20.5 20.2 20.3 19.8 20.4 20.0 20.5 19.7 20.0 20.1 19.9 17.7 18.0 18.5 18.7 23 42 10Jul08 Durability 100X 0.8 -1.0 -0.4 -0.1 0.4 0.6 -0.2 0.4 0.8 0.4 0.1 -0.1 0.0 0.3 -0.3 0.5 0.0 -0.2 0.1 0.4 -0.1 -0.5 -1.6 MAX MIN AVG STD Open Tech 21.0 17.3 19.5 1.2 0 DH 0.8 -1.6 0.0 0.6 0 DH 1.3 -1.9 0.1 0.9 0 BE 0.7 -1.7 -0.3 0.6 0 DH Equip ID 673 681 673 681 601 677 673 681 Test Laboratory TR#208315A, REV.1.0 40 of 50 23 42 16Jul08 Thermal Shock 0.5 -1.2 -1.3 -0.4 0.1 0.6 -0.2 0.3 0.2 0.1 0.5 0.9 1.3 1.2 0.8 1.2 0.3 0.7 0.2 -0.4 -0.9 -0.8 -1.9 23 48 29Jul08 Cyclic Humidity 0.2 -1.0 -1.2 -0.6 -0.1 0.3 -0.4 -0.5 -0.2 -0.3 0.0 0.0 0.6 -0.1 -0.2 0.7 -0.2 -0.4 0.1 -0.8 -1.1 -1.1 -1.7 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-7 20831507 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 18.1 17.5 17.9 17.0 21.5 20.3 21.2 20.9 20.7 20.2 21.5 21.4 21.8 24.0 22.0 20.8 21.3 20.6 21.5 18.0 17.7 17.6 17.2 23 42 10Jul08 Durability 100X 0.8 0.2 0.0 0.3 -0.8 0.4 0.5 -0.8 0.4 0.0 -1.0 -1.5 -0.4 -3.1 -0.5 -0.5 0.9 -0.7 -1.5 -0.1 -0.8 -0.1 -0.4 MAX MIN AVG STD Open Tech 24.0 17.0 20.0 2.0 0 DH 0.9 -3.1 -0.4 0.9 0 DH 1.1 -3.1 -0.2 0.8 0 BE 0.2 -4.1 -0.9 0.9 0 DH Equip ID 673 681 673 681 601 677 673 681 Test Laboratory TR#208315A, REV.1.0 41 of 50 23 42 16Jul08 Thermal Shock 0.2 -0.4 1.1 -0.4 0.0 0.8 0.7 -0.8 0.2 -0.2 -0.1 -0.9 -0.7 -3.1 0.3 -0.1 -0.1 0.1 -0.8 -0.3 -0.6 0.5 -0.5 23 48 29Jul08 Cyclic Humidity -0.3 -0.6 -0.4 -0.6 -1.2 0.2 -0.3 -1.4 -0.3 -0.7 -1.9 -2.1 -1.2 -4.1 -1.4 -1.2 -0.4 -0.4 -0.7 -0.6 -1.1 -0.2 -0.8 Contech Research An Independent Test and Research Laboratory Low Level Contact Resistance Project: 208315A Customer: Samtec Product: Series ERF8-RA Conn. Description: B-A-1 - B-A-8 Open circuit voltage: 20mV Spec: Subgroup: File No: EIA 364, TP 23 B-A-8 20831508 Current: 10mA Delta Values Units: Milliohms Temp ºC R.H. % Date: Pos. ID 23 42 10Jul08 Initial 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 17.8 17.8 18.0 17.2 20.3 19.8 20.5 19.9 21.7 20.1 21.1 20.2 22.8 20.3 20.8 19.9 20.1 20.6 21.1 17.8 17.4 17.5 17.3 23 42 10Jul08 Durability 100X 0.8 -1.0 -0.2 0.6 0.1 -0.2 1.0 0.0 0.1 0.5 -0.6 0.3 -1.7 1.4 -0.1 0.7 0.5 -0.6 -0.2 0.7 -0.2 1.3 -0.4 MAX MIN AVG STD Open Tech 22.8 17.2 19.6 1.6 0 DH 1.4 -1.7 0.1 0.7 0 DH 1.3 -1.7 0.1 0.8 0 BE 1.0 -2.3 -0.3 0.7 0 DH Equip ID 673 681 673 681 601 677 673 681 Test Laboratory TR#208315A, REV.1.0 42 of 50 23 42 16Jul08 Thermal Shock 1.0 -1.2 -0.5 -0.4 0.2 0.4 0.4 0.8 0.1 0.7 -0.2 0.7 -1.7 1.3 1.0 1.0 0.5 -0.3 0.0 -0.4 -1.1 0.1 -0.9 23 48 29Jul08 Cyclic Humidity 0.2 -1.6 -1.0 -0.6 0.1 -0.2 0.1 0.0 -0.8 -0.1 0.1 0.0 -2.3 0.2 -0.3 -0.1 0.4 -0.8 -0.7 -0.2 -1.0 0.0 1.0 Contech Research An Independent Test and Research Laboratory TEST RESULTS SEQUENCE C GROUP A Test Laboratory TR#208315A, REV.1.0 43 of 50 Contech Research An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: BE, DH, MO -----------------------------------------------------------START DATE: 7/24/08 COMPLETE DATE: 7/25/08 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 48% -----------------------------------------------------------EQUIPMENT ID#: 553, 1166, 1167, 1168, 1169, 1271, 1272, 1556 -----------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE) PURPOSE: To determine the mechanical and electrical integrity of connectors for use with electronic equipment subjected to shocks such as those expected from handling, transportation, etc. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance EIA 364, Test Procedure 27. 2. Test Conditions: a) b) c) d) e) Peak Value Duration Wave Form Velocity No. of Shocks : : : : : 100 G 6 Milliseconds Half-Sine 9.7 feet Per Second 3 Shocks/Direction, 3 Axis (18 Total) 3. A stabilizing medium was used to maintain mechanical stability throughout testing. 4. Figure #4 illustrates the test sample fixturing utilized during the test. 5. All subsequent variable testing was performed in accordance with the procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#208315A, REV.1.0 44 of 50 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of axial movement of the test samples relative to each other. 2. There shall be no contact interruption greater than 1.0 microsecond. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no contact interruption greater than 1.0 microsecond. 3. The Mechanical Shock characteristics are shown in Figures #5 (Calibration Pulse) and #6 (Test Pulse). Each figure displays the shock pulse contained within the upper and lower limits as defined by the appropriate test specification. Test Laboratory TR#208315A, REV.1.0 45 of 50 Contech Research An Independent Test and Research Laboratory FIGURE #4 TYPICAL MECHANICAL SHOCK /RANDOM VIBRATION FIXTURE Test Laboratory TR#208315A, REV.1.0 46 of 50 Contech Research An Independent Test and Research Laboratory FIGURE #5 Channel 1 Classical Shock [g] 160 140 Project: 208315 7-24-08 Cal.Wave 1 Samtec/ERFA8-RA Series 100G’s, 6mS, 12.3 ft/sec., Half Sine Tech: DH UPPER LIMIT------ 120 100 80 ACCELERATION (g) 60 40 20 ACTUAL PULSE---0 -20 -40 -60 LOWER LIMIT----80 -100 0.20 0.21 0.22 0.23 0.24 0.25 0.26 0.27 0.28 0.29 0.30 [s] DURATION (Seconds) Contech Research Test Laboratory TR#208315A, REV.1.0 47 of 50 An Independent Test and Research Laboratory FIGURE #6 Channel 1 Classical Shock [g] 160 140 Project: 208315 7-25-08 Actual Wave Samtec/ERFA8-RA Series 100G’s, 6mS, 12.3 ft/sec., Half Sine Tech: DH UPPER LIMIT------ 120 100 80 ACCELERATION (g) 60 40 20 ACTUAL PULSE---0 -20 -40 -60 LOWER LIMIT----80 -100 0.20 0.21 0.22 0.23 0.24 0.25 0.26 0.27 0.28 0.29 0.30 [s] DURATION (Seconds) Contech Research Test Laboratory TR#208315A, REV.1.0 48 of 50 An Independent Test and Research Laboratory PROJECT NO.: 208315A SPECIFICATION: ERF8-RA Flow Chart -----------------------------------------------------------PART NO.: ERF8-050-01-S-D-RA PART DESCRIPTION: Plug/Receptacle ERM8-050-05.0-S-DV-L Connector -----------------------------------------------------------SAMPLE SIZE: 8 Samples TECHNICIAN: DH -----------------------------------------------------------START DATE: 7/25/08 COMPLETE DATE: 7/28/08 -----------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 45% -----------------------------------------------------------EQUIPMENT ID#: 553, 1166, 1167, 1168, 1169, 1271, 1272, 1556 -----------------------------------------------------------VIBRATION, RANDOM PURPOSE: 1. To establish the mechanical integrity of the test samples exposed to external mechanical stresses. 2. To determine if the contact system is susceptible to fretting corrosion. 3. To determine if the electrical stability of the system has degraded when exposed to a vibratory environment. -----------------------------------------------------------PROCEDURE: 1. The test was performed in accordance with EIA 364, Test Procedure 28. 2. Test Conditions: a) Power Spectral Density : 0.01 G2/Hz b) G ’RMS’ : 7.56 c) Frequency : 50 to 2000 Hz d) Duration : 2.0 hour per axis (3 axis total) 3. A stabilizing medium was used to maintain mechanical stability throughout testing. 4. Figure #4 illustrates the test sample fixturing utilized during the test. 5. All subsequent variable testing was performed in accordance with procedures previously indicated. -----------------------------------------------------------REQUIREMENTS: See Next Page Test Laboratory TR#208315A, REV.1.0 49 of 50 Contech Research An Independent Test and Research Laboratory REQUIREMENTS: 1. There shall be no evidence of physical damage to the test samples as tested. 2. There shall be no contact interruption greater than 1.0 microsecond. -----------------------------------------------------------RESULTS: 1. There was no evidence of physical damage to the test samples as tested. 2. There was no contact interruption greater than 1.0 microsecond. Test Laboratory TR#208315A, REV.1.0 50 of 50 Contech Research An Independent Test and Research Laboratory