SAMWIN SW P 4N65 Features General Description zN-Channel MOSFET zBVDSS (Minimum) zRDS(ON) (Maximum) zID zQg (Typical) zPD (@TC=25 ℃) This power MOSFET is produced with advanced VDMOS technology of SAMWIN. This technology enable power MOSFET to have better characteristics, such as fast switching time, low on resistance, low gate charge and especially excellent avalanche characteristics. This power MOSFET is usually used at high efficient DC to DC converter block and switch mode power supply. : 650 V : 2.2 ohm : 4.0 A : 16nc : 106W D G TO-220 SW P 4N65 S Absolute Maximum Ratings Symbol VDSS ID IDM Parameter Value Units Drain to Source Voltage 650 V Continuous Drain Current (@Tc=25℃) 4.0 A Continuous Drain Current (@Tc=100℃) 2.8 A 16 A ±30 V Drain Current Pulsed (Note 1) VGS Gate to Source Voltage EAS Single Pulsed Avalanche Energy (Note 2) 250 mJ EAR Repetitive Avalanche Energy (Note 1) 10.6 mJ Peak Diode Recovery dv/dt (Note 3) 4.5 V/ns Total Power Dissipation (@Tc=25℃) 106 W Derating Factor above 25℃ 0.85 W/℃ -55~+150 ℃ 300 ℃ dv/dt PD TSTG,TJ TL Operating junction temperature &Storage temperature Maximum Lead Temperature for soldering purpose, 1/8 from Case for 5 seconds. Thermal Characteristics Value Symbol Parameter Units Min Typ Max 1.18 ℃/ W RθJC Thermal Resistance, Junction-to-Case - - RθCS Thermal Resistance, Case-to-Sink - 0.5 ℃/ W RθJA Thermal Resistance, Junction-to-Ambient - 62.5 ℃/ W 1/6 REV 1.01 07.06.05 SAMWIN Electrical Characteristics SW P 4N65 (Tc=25℃ unless otherwise noted) Value Symbol Parameter Test Conditions Units Min Typ Max 650 - - V - 0.5 - V/℃ - - 1 uA Off Characteristics BVDSS Drain- Source Breakdown Voltage VGS=0V,ID=250uA △BVDSS/△ Tj Breakdown Voltage Temperature coefficient ID=250uA,referenced to 25℃ IDSS Drain-Source Leakage Current VDS=600V, VGS=0V VDS=480V, Tc=125℃ Gate-Source Leakage Current VGS=30V,VDS=0V - - 100 nA Gate-Source Leakage Reverse VGS=-30V, VDS=0V - - -100 nA 2.0 - 4.0 V - 2.03 2.2 ohm - 600 700 - 75 95 - 9 12 - 20 40 - 28 100 - 45 160 - 48 165 IGSS On Characteristics VGS(th) Gate Threshold Voltage VDS=VGS,ID=250uA RDS(ON) Static Drain-Source On-state Resistance VGS=10V,ID=2A Dynamic Characteristics Ciss Input Capacitance Coss Output Capacitance Crss Reverse Transfer Capacitance VGS=0V,VDS=25V, f=1MHz pF Dynamic Characteristics td(on) tr td(off) tf Qg Turn-on Delay Time VDD=300V,ID=4.0A Rise Time ns Turn-off Delay Time (Note4,5) Fall Time Total Gate Charge Qgs Gate-Source Charge Qgd Gate-Drain Charge (Miller Charge) - 16.5 22 VDS=480V,VGS=10V, ID=4.0A - 3.8 - (Note4,5) - 7.5 - Min. Typ. Max. - - 4.0 - - 16.0 nc Source-Drain Diode Ratings and Characteristics Symbol Parameter Test Conditions Integral Reverse p-n Junction Diode in the MOSFET Unit. IS Continuous Source Current ISM Pulsed Source Current VSD Diode Forward Voltage IS=1.0A,VGS=0V - - 1.4 V trr Reverse Recovery Time - 250 - ns Qrr Reverse Recovery Charge IS=1.0A,VGS=0V, dIF/dt=100A/us - 1.5 - uc ※NOTES 1. Repeativity rating: pulse width limited by junction temperature 2. L=25mH,IAS=4.0A,VDD=50V,RG=0ohm, Starting TJ=25℃ 3. ISD≤4.0A,di/dt≤100A/us,VDD≤BVDSS, Starting TJ=25℃ 4. Pulse Test: Pulse Width≤300us,Duty Cycle≤2% 5. Essentially independent of operating temperature. REV 1.01 A 2/6 07.06.05 SAMWIN VGS top:10V 9V 8V 7V 6V 5.5V 5V bottom:5.0V 10 o 1 ID,Drain Current [A] ID,Drain Current [A] 10 SW P 4N65 5.0V 25 C o 150 C 1 Note: 0.1 ∗ Note: 1.250us pulse test 1.VDS=50V 2.TC=25 C o 2.250us pulse test. 0.1 0.1 1 2 10 4 6 8 10 VGS, Gate-Source Voltage [V] VDS,Drain-to-Source voltage [V] Fig 1. On-State Characteristics Fig 2. Transfer Characteristics 6 10 IDR,Reverse Drain Current[A] RDS(ON) Drain-Source On-Resistance[ohm] 5 VGS=20V 4 VGS=10V 3 2 o 150 C o 25 C 1 ∗ Note: 1 1.vGS=0v o ∗ Note:TJ=25 C 2.250us test 0 0 2 4 6 8 10 0.1 0.2 12 0.4 0.6 ID, Drain Current[A] 0.8 1.0 1.2 1.4 1.6 1.8 VSD,Source-Drain Voltage[V] Fig 3. On Resistance Variation vs. Drain Current and Gate Voltage Fig 4. On State Current vs. Allowable Case Temperature 12 Ciss = Cgs+Cgd(Cds=shorted) 1200 Coss= Cds+Cgd Capacitance [pF] 1000 800 Coss 600 ∗ Note: 1.VGS=0V 400 Crss VDS=480V 10 Crss = Cgd VGS,Gate-Source Voltage [V] Ciss 2.f=1MHz. 200 VDS=300V 8 VDS=120V 6 4 2 ∗ Note:I =4A D 0 0 0.1 1 0 10 VDS,Drain-Source Voltage [V] 5 10 15 20 25 QG,Total Gate Charge [nC] Fig 6. Gate Charge Characteristics Fig 5. Capacitance Characteristics (Non-Repetitive) 3/6 REV 1.01 07.06.05 SAMWIN SW P 4N65 3.0 2.5 RDs(on)(Normalized) 1.1 1.0 0.9 ∗ Note: 1.VGS=0V Drain-Source On-Resistance BVDSS[Normalized] Drain-Source Breakdown Voltage 1.2 2.0 1.5 1.0 ∗Note: 0.5 1.VGS=10V 2.ID=250uA 0.8 -100 -50 0 50 100 150 2.ID=4A 0.0 -100 200 -50 0 50 100 150 200 o TJ,Junction Temperature[ C] o TJ,Junction Temperatur [ C] Fig 8. On-Resistance Variation vs. Junction Temperature Fig 7. Breakdown Voltage Variation vs. Junction Temperature 5 Operation In This Area Limted By RDS(ON) 100us 1ms ID, Drain Current[A] ID, Drain Current[A] 4 10 10ms DC 1 ∗Note: 1.Tc=25°C 2.Tj=150°C 3.Single Pulse 0.1 1 10 100 3 2 1 0 25 1000 50 75 VD,Drain-Source Voltage[V] 100 125 150 o Tc,Case Temperature [ C] Fig9. Maximum Safe Operating Fig 10. Maximum Drain Current Vs. Case Temperature 0 .1 ∗ N o te : θJC (t),Thermal Response 1 o Z 1 .Z Θ J C (t)= 1 .1 8 C /w M a x 2 .D u ty F a c to r ,D = t1 /t2 3 .T j-T c = P D M * Z Θ J C (t) 0 .0 1 1 E -5 1 E -4 1 E -3 0 .0 1 0 .1 1 10 t 1 ,S q u a r e W a v e P u ls e D u r a tio n ( s e c ) Fig 11. Transient Thermal Response Curve 4/6 REV 1.01 07.06.05 SAMWIN SW P 4N65 VGS Same Type as DUT 50KΩ Qg 10V 200nF 300nF Qgd Qgs VDS VGS DUT 1mA Charge Fig 12. Gate Charge test Circuit & Waveforms RL VDS VDD (0.5 rated VDS) 10V Pulse Generator RG DUT VDS Vin 90% 10% tf td(on) tr ton td(off) toff Fig 13. Switching test Circuit & Waveforms L 1 BVDSS EAS= --- LLIAS2--------------2 BVDSS-VDD VDS VDD BVDSS IAS RG VDD DUT ID(t) VDS(t) 10V tp Time Fig 14. Unclamped Inductive Switching test Circuit & Waveforms 5/6 REV 1.01 07.06.05 SAMWIN SW P 4N65 + DUT VDS __ L Driver VDD RG Same Type as DUT VGS ● ● VGS (Driver) dv/dt controlled by RG Is controlled by pulse period Gate Pulse Width D = --------------------------Gate Pulse Period 10V IFM,Body Diode Forward Current di/dt IS (DUT) IRM Body Diode Reverse Current VDS (DUT) Body Diode Recovery dv/dt VDD Vf Body Diode Forward Voltage Drop Fig 15. Peak Diode Recovery dv/dt test Circuit & Waveforms 6/6 REV 1.01 07.06.05 SAMWIN SW P 4N65 Package Dimensions TO-220 • • Package Dimensions TO-220 REV 1.01 A(mm) 9.66~10.28 A2(mm) 9.80~10.20 B(mm) 15.6~15.8 C(mm) 12.70~14.27 D(mm) 4.30~4.70 E(mm) 8.59~9.40 F(mm) typical 2.54 G1(mm) 1.32~1.72 G2(mm) 0.70~0.95 G3(mm) 0.4~0.60 H(mm) dia. 3.50~3.83 I(mm) 2.7~2.9 J(mm) 15.70~16.25 K(mm) 2.20~2.90 L(mm) 1.15~1.40 a(degree) 45° a2(degree) 3°±0.5° a3(degree) 3°±0 07.06.05 SAMWIN SW P 4N65 HISTORY Issue No Changed Characteristics V 1.01 REV 1.01 Origination Date Issuer 2007.06.05 07.06.05