Si53312 Data Sheet

Si53312
1 : 1 0 L OW J I T T E R U NIVERSAL B U FF E R /L EVEL
T RANSLATOR WITH 2 : 1 I NPUT M UX (<1.25 GH Z )
Features
Ordering Information:
See page 28.
Applications
Q6
Q6
VDDOB
34
37
35
38
39
DIVA
1
33
SFOUTA[1]
SFOUTA[0]
2
32
3
31
DIVB
SFOUTB[1]
SFOUTB[0]
Q2
4
Q2
5
GND
6
Q1
7
Q1
8
Q0
9
25
Q0
10
24
Q9
NC
11
23
CLK_SEL
30
27
Q8
26
Q8
20
21
NC
GND
Q9
22
CLK1
17
19
16
18
28
Q7
Q7
NC
29
GND
PAD
OEB
CLK1
The Si53312 is an ultra low jitter ten output differential buffer with pin-selectable
output clock signal format and divider selection. The Si53312 features a 2:1 mux,
making it ideal for redundant clocking applications. The Si53312 utilizes Silicon
Laboratories' advanced CMOS technology to fanout clocks from dc to 1.25 GHz
with guaranteed low additive jitter, low skew, and low propagation delay variability.
The Si53312 features minimal cross-talk and provides superior supply noise
rejection, simplifying low jitter clock distribution in noisy environments.
Independent core and output bank supply pins provide integrated level translation
without the need for external circuitry.
40
Description
41

36

42


Si53312
43


Storage
Telecom
Industrial
Servers
Backplane clock distribution
44


15

Pin Assignments
High-speed clock distribution
Ethernet switch/router
Optical Transport Network (OTN)
SONET/SDH
PCI Express Gen 1/2/3
VDDOA

Q3
Q3
Q4
Q4
GND
Q5
Q5

14

CLK0
CLK0
OEA
VREF

12

Low output-output skew: <70 ps
Low propagation delay variation:
<400 ps
Independent VDD and VDDO :
1.8/2.5/3.3 V
Excellent power supply noise
rejection (PSRR)
Selectable LVCMOS drive strength to
tailor jitter and EMI performance
Small size: 44-QFN (7 mm x 7 mm)
RoHS compliant, Pb-free
Industrial temperature range:
–40 to +85 °C
13

10 differential or 20 LVCMOS outputs
Ultra-low additive jitter: 45 fs rms

Wide frequency range:
dc to 1.25 GHz

Any-format input with pin selectable
output formats: LVPECL, Low Power 
LVPECL, LVDS, CML, HCSL,
LVCMOS

2:1 mux with hot-swappable inputs
Asynchronous output enable

Output clock division: /1, /2, /4

(/2 and /4 for dc to 725 MHz)

NC

VDD

Patents pending
Functional Block Diagram
VREF
Vref
Generator
Power
Supply
Filtering
DIVA
VDDOA
SFOUTA[1:0]
OEA
Q0, Q1, Q2, Q3, Q4
DivA
Q0, Q1, Q2, Q3, Q4
CLK0
/CLK0
DIVB
VDDOB
SFOUTB[1:0]
OEB
CLK1
/CLK1
Q5, Q6, Q7, Q8, Q9
DivB
CLK_SEL
Rev. 1.0 9/15
Switching
Logic
Q5, Q6, Q7, Q8, Q9
Copyright © 2015 by Silicon Laboratories
Si53312
Si53312
TABLE O F C ONTENTS
Section
Page
1. Electrical Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .3
2. Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.1. Universal, Any-Format Input . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
2.2. Input Bias Resistors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2.3. Voltage Reference (VREF) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
2.4. Universal, Any-Format Output Buffer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
2.5. Input Mux and Output Enable Logic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.6. Flexible Output Divider . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.7. Power Supply (VDD and VDDOX) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
2.8. Output Clock Termination Options . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16
2.9. AC Timing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
2.10. AC Timing Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
2.11. Typical Phase Noise Performance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
2.12. Input Mux Noise Isolation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
2.13. Power Supply Noise Rejection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
3. Pin Description: 44-Pin QFN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
4. Ordering Guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
5. Package Outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
5.1. 7x7 mm 44-QFN Package Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
6. PCB Land Pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .30
6.1. 7x7 mm 44-QFN Package Land Pattern . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7. Top Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
7.1. Si53312 Top Marking . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
7.2. Top Marking Explanation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .31
Document Change List . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .32
Contact Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33
2
Rev. 1.0
Si53312
1. Electrical Specifications
Table 1. Recommended Operating Conditions
Parameter
Ambient Operating
Temperature
Supply Voltage Range*
Output Buffer Supply
Voltage*
Symbol
Test Condition
Min
Typ
Max
Unit
–40
—
85
°C
1.71
1.8
1.89
V
2.38
2.5
2.63
V
2.97
3.3
3.63
V
LVPECL, low power LVPECL,
LVCMOS
2.38
2.5
2.63
V
2.97
3.3
3.63
V
HCSL
2.97
3.3
3.63
V
LVDS, CML, LVCMOS
1.71
1.8
1.89
V
2.38
2.5
2.63
V
2.97
3.3
3.63
V
2.38
2.5
2.63
V
2.97
3.3
3.63
V
2.97
3.3
3.63
V
TA
VDD
VDDOX
LVDS, CML
LVPECL, low power LVPECL
HCSL
*Note: Core supply VDD and output buffer supplies VDDO are independent. LVCMOS clock input is not supported for VDD =
1.8V but is supported for LVCMOS clock output for VDDOX = 1.8V. LVCMOS outputs at 1.5V and 1.2V can be
supported via a simple resistor divider network. See “2.8.1. LVCMOS Output Termination To Support 1.5 V and 1.2 V”
Table 2. Input Clock Specifications
(VDD=1.8 V ± 5%, 2.5 V ± 5%, or 3.3 V ± 10%, TA=–40 to 85 °C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Differential Input Common
Mode Voltage
VCM
VDD = 2.5 V± 5%, 3.3 V± 10%
0.05
—
—
V
Differential Input Swing
(peak-to-peak)
VIN
0.2
—
2.2
V
LVCMOS Input High
Voltage
VIH
VDD = 2.5 V± 5%, 3.3 V± 10%
VDD x 0.7
—
—
V
LVCMOS Input Low
Voltage
VIL
VDD = 2.5 V± 5%, 3.3 V± 10%
—
—
VDD x
0.3
V
Input Capacitance
CIN
CLK0 and CLK1 pins with
respect to GND
—
5
—
pF
Rev. 1.0
3
Si53312
Table 3. DC Common Characteristics
(VDD = 1.8 V ± 5%, 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Supply Current
Output Buffer
Supply Current
(Per Clock Output)
@100 MHz
Symbol
Test Condition
Min
Typ
Max
Unit
—
65
100
mA
LVPECL (3.3 V)
—
35
—
mA
Low Power LVPECL (3.3 V)
—
35
—
mA
LVDS (3.3 V)
—
20
—
mA
CML (3.3 V)
—
30
—
mA
HCSL, 100 MHz, 2 pF load (3.3 V)
—
35
—
mA
CMOS (1.8 V, SFOUT = Open/0),
per output, CL = 5 pF, 200 MHz
—
5
—
mA
CMOS (2.5 V, SFOUT = Open/0),
per output, CL = 5 pF, 200 MHz
—
8
—
mA
CMOS (3.3 V, SFOUT = 0/1),
per output, CL = 5 pF, 200 MHz
—
15
—
mA
IDD
IDDOX
Voltage Reference
VREF
VREF pin
—
VDD/2
—
V
Input High Voltage
VIH
SFOUTx, DIVx, CLK_SEL, OEx
0.8 x
VDD
—
—
V
Input Mid Voltage
VIM
SFOUTx, DIVx
3-level input pins
0.45 x
VDD
0.5 x
VDD
0.55 x
VDD
V
Input Low Voltage
VIL
SFOUTx, DIVx, CLK_SEL, OEx
—
—
0.2 x
VDD
V
Internal Pull-down
Resistor
RDOWN
CLK_SEL, DIVx, SFOUTx,
—
25
—
kΩ
RUP
OEx, DIVx, SFOUTx
—
25
—
kΩ
Internal Pull-up
Resistor
Table 4. Output Characteristics (LVPECL)
(VDDOX = 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Symbol
Output DC Common Mode
Voltage
Single-Ended
Output Swing
Test Condition
Min
Typ
Max
Unit
VCOM
VDDOX – 1.595
—
VDDOX – 1.245
V
VSE
0.40
0.80
1.050
V
*Note: Unused outputs can be left floating. Do not short unused outputs to ground.
4
Rev. 1.0
Si53312
Table 5. Output Characteristics (Low Power LVPECL)
(VDDOX = 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Symbol
Test Condition
Min
Output DC Common
Mode Voltage
VCOM
RL = 100 Ω across Qn and Qn
VDDOX – 1.895
VSE
RL = 100 Ω across Qn and Qn
0.20
Single-Ended
Output Swing
Typ
Max
Unit
VDDOX – 1.275
V
0.85
V
0.60
Table 6. Output Characteristics—CML
(VDDOX = 1.8 V ± 5%, 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Single-Ended Output
Swing
VSE
Terminated as shown in Figure 8
(CML termination).
200
400
550
mV
Table 7. Output Characteristics—LVDS
(VDDOX = 1.8 V ± 5%, 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Single-Ended Output
Swing
VSE
RL = 100 Ω across QN and QN
200
—
490
mV
Output Common
Mode Voltage
(VDDO = 2.5 V or
3.3V)
VCOM1
VDDOX = 2.38 to 2.63 V, 2.97 to
3.63 V, RL = 100 Ω across QN
and QN
1.10
1.25
1.35
V
Output Common
Mode Voltage
(VDDO = 1.8 V)
VCOM2
VDDOX = 1.71 to 1.89 V,
RL = 100 Ω across QN
and QN
0.85
0.97
1.25
V
Table 8. Output Characteristics—LVCMOS
(VDDOX = 1.8 V ± 5%, 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Symbol
Output Voltage High
Output Voltage Low
Test Condition
Min
Typ
Max
Unit
VOH
0.75 x VDDOX
—
—
V
VOL
—
—
0.25 x VDDOX
V
*Note: IOH and IOL per the Output Signal Format Table for specific VDDOX and SFOUTx settings.
Rev. 1.0
5
Si53312
Table 9. Output Characteristics—HCSL
(VDDOX = 3.3 V ± 10%, TA = –40 to 85 °C))
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Output Voltage High
VOH
RL = 50 Ω to GND
550
700
900
mV
Output Voltage Low
VOL
RL = 50 Ω to GND
–150
0
150
mV
Single-Ended
Output Swing
VSE
RL = 50 Ω to GND
450
700
850
mV
Crossing Voltage
VC
RL = 50 Ω to GND
250
350
550
mV
Table 10. AC Characteristics
(VDD = VDDOX = 1.8 V ± 5%, 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Frequency
Duty Cycle6
Symbol
Test Condition
Min
Typ
Max
Unit
F
LVPECL, low power LVPECL, LVDS,
CML, HCSL
dc
—
1250
GHz
LVCMOS
dc
—
200
MHz
200 MHz, 20/80% TR/TF<10% of
period (LVCMOS)
(12 mA drive)
40
50
60
%
20/80% TR/TF<10% of period
(Differential)
47
50
53
%
DC
Minimum Input Clock
Slew Rate5
SR
Required to meet prop delay and
additive jitter specifications
(20–80%)
0.75
—
—
V/ns
Output Rise/Fall Time
TR/TF
LVDS, 20/80%
—
—
325
ps
LVPECL, 20/80%
—
—
350
ps
HCSL1, 20/80%
—
—
280
ps
CML, 20/80%
—
—
350
ps
Low-Power LVPECL, 20/80%
—
—
325
ps
LVCMOS 200 MHz, 20/80%,
2 pF load
—
—
750
ps
Notes:
1. HCSL measurements were made with receiver termination. See Figure 8 on page 17.
2. Output to Output skew specified for outputs with an identical configuration.
3. Defined as skew between any output on different devices operating at the same supply voltage, temperature, and and
equal load condition. Using the same type of inputs on each device, the outputs are measured at the differential cross
points.
4. Measured for 156.25 MHz carrier frequency. Sine-wave noise added to VDDOX (3.3 V = 100 mVPP) and noise spur
amplitude measured. See “AN491: Power Supply Rejection for Low-Jitter Clocks” for further details.
5. When using the on-chip clock divider, a minimum input clock slew rate of 30 mV/ns is required.
6. 50% input duty cycle.
6
Rev. 1.0
Si53312
Table 10. AC Characteristics (Continued)
(VDD = VDDOX = 1.8 V ± 5%, 2.5 V ± 5%, or 3.3 V ± 10%,TA = –40 to 85 °C)
Parameter
Minimum Input Pulse
Width
Propagation Delay
Output Enable Time
Output Disable Time
Output to Output Skew2
Part to Part Skew3
Power Supply Noise
Rejection4
Symbol
Test Condition
Min
Typ
Max
Unit
360
—
—
ps
LVCMOS (12mA drive with no load)
1250
2000
2750
ps
LVPECL
600
800
1000
ps
LVDS
600
800
1000
ps
F = 1 MHz
—
2500
—
ns
F = 100 MHz
—
30
—
ns
F = 725 MHz
—
5
—
ns
F = 1 MHz
—
2000
—
ns
F = 100 MHz
—
30
—
ns
F = 725 MHz
—
5
—
ns
LVCMOS (12 mA drive to no load)
—
50
120
ps
LVPECL
—
35
70
ps
LVDS
—
35
70
ps
TPS
Differential
—
—
150
ps
PSRR
10 kHz sinusoidal noise
—
–63
—
dBc
100 kHz sinusoidal noise
—
–62
—
dBc
500 kHz sinusoidal noise
—
–58
—
dBc
1 MHz sinusoidal noise
—
–55
—
dBc
TW
TPLH,
TPHL
TEN
TDIS
TSK
Notes:
1. HCSL measurements were made with receiver termination. See Figure 8 on page 17.
2. Output to Output skew specified for outputs with an identical configuration.
3. Defined as skew between any output on different devices operating at the same supply voltage, temperature, and and
equal load condition. Using the same type of inputs on each device, the outputs are measured at the differential cross
points.
4. Measured for 156.25 MHz carrier frequency. Sine-wave noise added to VDDOX (3.3 V = 100 mVPP) and noise spur
amplitude measured. See “AN491: Power Supply Rejection for Low-Jitter Clocks” for further details.
5. When using the on-chip clock divider, a minimum input clock slew rate of 30 mV/ns is required.
6. 50% input duty cycle.
Rev. 1.0
7
Si53312
Table 11. Additive Jitter, Differential Clock Input
VDD
Output
Input1,2
Freq
(MHz)
Clock Format
Amplitude
VIN
(Single-Ended,
Peak-to-Peak)
Differential
Clock Format
20%-80% Slew
Rate (V/ns)
Additive Jitter
(fs rms, 12 kHz to
20 MHz)3
Typ
Max
3.3
725
Differential
0.15
0.637
LVPECL
45
65
3.3
725
Differential
0.15
0.637
LVDS
50
65
3.3
156.25
Differential
0.5
0.458
LVPECL
160
185
3.3
156.25
Differential
0.5
0.458
LVDS
150
200
2.5
725
Differential
0.15
0.637
LVPECL
45
65
2.5
725
Differential
0.15
0.637
LVDS
50
65
2.5
156.25
Differential
0.5
0.458
LVPECL
145
185
2.5
156.25
Differential
0.5
0.458
LVDS
145
195
Notes:
1. For best additive jitter results, use the fastest slew rate possible. See “AN766: Understanding and Optimizing Clock
Buffer’s Additive Jitter Performance” for more information.
2. AC-coupled differential inputs.
3. Measured differentially using a balun at the phase noise analyzer input. See Figure 1.
8
Rev. 1.0
Si53312
Table 12. Additive Jitter, Single-Ended Clock Input
VDD
Output
Input1,2
Freq
(MHz)
Clock Format
Amplitude
VIN
(single-ended,
peak to peak)
Additive Jitter
(fs rms, 12 kHz to
20 MHz)3
SE 20%-80%
Slew Rate
(V/ns)
Clock Format
Typ
Max
3.3
200
Single-ended
1.70
1
LVCMOS4
120
160
3.3
156.25
Single-ended
2.18
1
LVPECL
160
185
3.3
156.25
Single-ended
2.18
1
LVDS
150
200
3.3
156.25
Single-ended
2.18
1
LVCMOS4
130
180
2.5
200
Single-ended
1.70
1
LVCMOS5
120
160
2.5
156.25
Single-ended
2.18
1
LVPECL
145
185
2.5
156.25
Single-ended
2.18
1
LVDS
145
195
2.5
156.25
Single-ended
2.18
1
LVCMOS5
140
180
Notes:
1. For best additive jitter results, use the fastest slew rate possible. See “AN766: Understanding and Optimizing Clock
Buffer’s Additive Jitter Performance” for more information.
2. DC-coupled single-ended inputs.
3. Measured differentially using a balun at the phase noise analyzer input. See Figure 1.
4. Drive Strength: 12 mA, 3.3 V (SFOUT = 11). LVCMOS jitter is measured single-ended.
5. Drive Strength: 9 mA, 2.5 V (SFOUT = 11). LVCMOS jitter is measured single-ended.
PSPL 5310A
CLK SYNTH
SMA103A
50
Si53312
DUT
Balun
PSPL 5310A
CLKx
AG E5052 Phase Noise
Analyzer
50ohm
/CLKx
50
Balun
Figure 1. Differential Measurement Method Using a Balun
Rev. 1.0
9
Si53312
Table 13. Thermal Conditions
Parameter
Symbol
Test Condition
Value
Unit
Thermal Resistance,
Junction to Ambient
θJA
Still air
49.6
°C/W
Thermal Resistance,
Junction to Case
θJC
Still air
32.3
°C/W
Table 14. Absolute Maximum Ratings
Parameter
Symbol
Storage Temperature
Min
Typ
Max
Unit
TS
–55
—
150
°C
Supply Voltage
VDD
–0.5
—
3.8
V
Input Voltage
VIN
–0.5
—
VDD+ 0.3
V
Output Voltage
VOUT
—
—
VDD+ 0.3
V
ESD Sensitivity
HBM
—
—
2000
V
ESD Sensitivity
CDM
—
—
500
V
Peak Soldering
Reflow Temperature
TPEAK
—
—
260
°C
—
—
125
°C
Maximum Junction
Temperature
Test Condition
HBM, 100 pF, 1.5 kΩ
Pb-Free; Solder reflow profile
per JEDEC J-STD-020
TJ
Note: Stresses beyond those listed in this table may cause permanent damage to the device. Functional operation
specification compliance is not implied at these conditions. Exposure to maximum rating conditions for extended
periods may affect device reliability.
10
Rev. 1.0
Si53312
2. Functional Description
The Si53312 is a low jitter, low skew 1:10 differential buffer with an integrated 2:1 input mux. The device has a
universal input that accepts most common differential or LVCMOS input signals. A clock select pin is used to select
the active input clock. The selected clock input is routed to two independent banks of outputs. Each output bank
features control pins to select signal format, output enable, output divider setting and LVCMOS drive strength.
2.1. Universal, Any-Format Input
The Si53312 has a universal input stage that enables simple interfacing to a wide variety of clock formats, including
LVPECL, LVCMOS, LVDS, HCSL, and CML. Tables 15 and 16 summarize the various input ac- and dc-coupling
options supported by the device. Figures 3 and 4 show the recommended input clock termination options.
Table 15. LVPECL, LVCMOS, and LVDS
LVPECL
LVCMOS
LVDS
AC-Couple
DC-Couple
AC-Couple
DC-Couple
AC-Couple
DC-Couple
1.8 V
N/A
N/A
No
No
Yes
No
2.5/3.3 V
Yes
Yes
No
Yes
Yes
Yes
Table 16. HCSL and CML
HCSL
CML
AC-Couple
DC-Couple
AC-Couple
DC-Couple
1.8 V
No
No
Yes
No
2.5/3.3 V
Yes
Yes (3.3 V)
Yes
No
0.1 µF
CLKx
100 Ω
Si53312
/CLKx
0.1 µF
Figure 2. Differential LVPECL, LVDS, CML AC-Coupled Input Termination
VDD
CMOS
Driver
VDD
1 kΩ
VDDO = 3. 3 V or 2. 5 V
Si53312
CLKx
50
CLKx
Rs
VTERM = VDD/2
1 kΩ
VREF
Figure 3. LVCMOS DC-Coupled Input Termination
Rev. 1.0
11
Si53312
VDDO
DC Coupled LVPECL Termination Scheme 1
R1
VDD
R1
VDDO = 3.3V or 2.5V
Si53312
“Standard”
LVPECL
Driver
CLKx
50
/CLKx
50
R2
R2
3.3V LVPECL: R1 = 127 Ohm, R2 = 82.5 Ohm
VTERM = VDDO – 2V
R1 // R2 = 50 Ohm
2.5V LVPECL: R1 = 250 Ohm, R2 = 62.5 Ohm
DC Coupled LVPECL Termination Scheme 2
VDD
VDDO = 3.3V or 2.5V
Si53312
50
“Standard”
LVPECL
Driver
CLKx
/CLKx
50
50
50
VTERM = VDDO – 2V
DC Coupled LVDS Termination
VDD
VDDO = 3.3V or 2.5V
Si53312
CLKx
50
Standard
LVDS
Driver
/CLKx
50
100
DC Coupled HCSL Termination Scheme
VDDO = 3.3V
Standard
HCSL Driver
VDD
33
Si53312
50
CLKx
/CLKx
33
50
50
50
Note: 33 Ohm series termination is optional depending on the location of the receiver.
Figure 4. Differential DC-Coupled Input Terminations
12
Rev. 1.0
Si53312
2.2. Input Bias Resistors
Internal bias resistors ensure a differential output low condition in the event that the clock inputs are not connected.
The noninverting input is biased with a 18.75 kΩ pulldown to GND and a 75 kΩ pullup to VDD. The inverting input is
biased with a 75 kΩ pullup to VDD.
VDD
RPU
RPU
+
RPD
CLK0 or
CLK1
–
RPU = 75 kohm
RPD = 18.75 kohm
Figure 5. Input Bias Resistors
2.3. Voltage Reference (VREF)
The VREF pin can be used to bias the input receiver, as shown in Figure 6 when a single-ended input clock (such
as LVCMOS) is used. Note that VREF = VDD/2 and should be compatible with the VCM rating of the single-ended
input clock driving the CLK0 or CLK1 inputs. To optimize jitter and duty cycle performance, use the circuit in
Figure 3. VREF pin should be left floating when differential clocks are used.
VDDO =3.3V, 2.5V, 1.8V
Rs
CMOSDriver
CLKx
50
Si53312
/CLKx
VREF
100nF
Figure 6. Using Voltage Reference with Single-Ended Input Clock
Rev. 1.0
13
Si53312
2.4. Universal, Any-Format Output Buffer
The highly flexible output drivers support a wide range of clock signal formats, including LVPECL, low power
LVPECL, LVDS, CML, HCSL, and LVCMOS. SFOUTx[1] and SFOUTx[0] are 3-level inputs that can be pinstrapped
to select the Bank A and Bank B clock signal formats independently. This feature enables the device to be used for
format/level translation in addition to clock distribution, minimizing the number of unique buffer part numbers
required in a typical application and simplifying design reuse. For EMI reduction applications, four LVCMOS drive
strength options are available for each VDDO setting.
Table 17. Output Signal Format Selection
SFOUTx[1]
SFOUTx[0]
VDDOX = 3.3 V
VDDOX = 2.5 V
VDDOX = 1.8 V
Open*
Open*
LVPECL
LVPECL
N/A
0
0
LVDS
LVDS
LVDS
0
1
LVCMOS, 24 mA drive LVCMOS, 18 mA drive
LVCMOS, 12 mA drive
1
0
LVCMOS, 18 mA drive LVCMOS, 12 mA drive
LVCMOS, 9 mA drive
1
1
LVCMOS, 12 mA drive LVCMOS, 9 mA drive
LVCMOS, 6 mA drive
Open*
0
LVCMOS, 6 mA drive
LVCMOS, 4 mA drive
LVCMOS, 2 mA drive
Open*
1
LVPECL Low power
LVPECL Low power
N/A
0
Open*
CML
CML
CML
1
Open*
HCSL
HCSL
HCSL
*Note: SFOUTx[1:0] are 3-level input pins. Tie low for “0” setting. Tie high for “1” setting. When left open, the pin is
internally biased to VDD/2.
14
Rev. 1.0
Si53312
2.5. Input Mux and Output Enable Logic
The Si53312 provides two clock inputs for applications that need to select between one of two clock sources. The
CLK_SEL pin selects the active clock input. The table below summarizes the input and output clock based on the
input mux and output enable pin settings.
Table 18. Input Mux and Output Enable Logic
CLK_SEL
CLK0
CLK1
OE1
Q2
L
L
X
H
L
L
H
X
H
H
H
X
L
H
L
H
X
H
H
H
X
X
X
L
L3
Notes:
1. Output enable active high
2. On the next negative transition of CLK0 or CLK1.
3. Single-end: Q=low, Q=high
Differential: Q=low, Q=high
2.6. Flexible Output Divider
The Si53312 provides optional clock division in addition to clock distribution. The divider setting for each bank of
output clocks is selected via 3-level control pins as shown in the table below. Leaving the DIVx pins open will force
a divider value of 1, which is the default mode of operation. Note that when using the on-chip clock divider, a
minimum input clock slew rate of 30 mV/ns is required.
Table 19. Divider Selection
DIVx1
Divider Value
Open2
÷1 (default)
03
÷2
13
÷4
Notes:
1. DIVx are 3-level input pins. Tie low for “0” setting. Tie high for “1” setting. When left open, the pin is internally
biased to VDD/2.
2. For frequency range dc to 1.25 GHz.
3. For frequency range dc to 725 MHz.
2.7. Power Supply (VDD and VDDOX)
The device includes separate core (VDD) and output driver supplies (VDDOX). This feature allows the core to
operate at a lower voltage than VDDO, reducing current consumption in mixed supply applications. The core VDD
supports 3.3, 2.5, or 1.8 V. Each output bank has its own VDDOX supply, supporting 3.3, 2.5, or 1.8 V as defined in
Table 1.
Rev. 1.0
15
Si53312
2.8. Output Clock Termination Options
The recommended output clock termination options are shown below.
VDDO
DC Coupled LVPECL Termination Scheme 1
R1
R1
VDDO = 3.3V or 2.5V
Si53312
VDD = VDDO
50
Q
LVPECL
Receiver
Qn
50
R2
VTERM = VDDO – 2V
R1 // R2 = 50 Ohm
R2
3.3V LVPECL: R1 = 127 Ohm, R2 = 82.5 Ohm
2.5V LVPECL: R1 = 250 Ohm, R2 = 62.5 Ohm
DC Coupled LVPECL Termination Scheme 2
VDDO = 3.3V or 2.5V
Si53312
VDD = VDDO
50
Q
LVPECL
Receiver
Qn
50
50
50
VTERM = VDDO – 2V
VDDO
AC Coupled LVPECL Termination Scheme 1
R1
VDDO = 3.3V or 2.5V
Si53312
R1
0.1 uF
VDD = 3.3V or 2.5V
50
Q
LVPECL
Receiver
Qn
50
0.1 uF
Rb
R2
Rb
R2
VBIAS = VDD – 1.3V
R1 // R2 = 50 Ohm
3.3V LVPECL: R1 = 82.5 Ohm, R2 = 127 Ohm, Rb = 120 Ohm
2.5V LVPECL: R1 = 62.5 Ohm, R2 = 250 Ohm, Rb = 90 Ohm
AC Coupled LVPECL Termination Scheme 2
V DDO = 3.3V or 2.5V
Si53312
0.1 uF
VDD = 3.3V or 2.5V
50
Q
LVPECL
Receiver
Qn
50
0.1 uF
Rb
Rb
50
50
V BIAS = V DD – 1.3 V
3.3V LVPECL: Rb = 120 Ohm
2.5V LVPECL: Rb = 90 Ohm
Figure 7. LVPECL Output Termination
16
Rev. 1.0
Si53312
DC Coupled LVDS and Low-Power LVPECL Termination
VDDO = 3.3 V or 2.5 V, or 1.8 V (LVDS only)
Si53312
VDD
50
Q
Standard
LVDS
Receiver
Qn
50
100
AC Coupled LVDS and Low-Power LVPECL Termination
VDDO = 3.3 V or 2.5 V or 1.8 V (LVDS only)
Si53312
0.1 uF
VDD
50
Q
Standard
LVDS
Receiver
Qn
50
0.1 uF
100
AC Coupled CML Termination
VDDO = 3.3V or 2.5V or 1.8V
Si53312
0.1 uF
VDD
50
Q
Standard
CML
Receiver
100
Qn
50
0.1 uF
DC Coupled HCSL Receiver Termination
VDDO = 3.3V
Si53312
VDD
50
Q
Standard
HCSL
Receiver
Qn
50
50
50
DC Coupled HCSL Source Termination
VDDO = 3.3V
Si53312
VDD
42.2
50
Q
Qn
42.2
50
86.6
Standard
HCSL
Receiver
86.6
Figure 8. LVDS, CML, HCSL, and Low-Power LVPECL Output Termination
Rev. 1.0
17
Si53312
CMOS
Receivers
Si53312
CMOS Driver
Zout
Zo
Rs
50
Figure 9. LVCMOS Output Termination
Table 20. Recommended LVCMOS RS Series Termination
SFOUTx[1]
SFOUTx[0]
RS (ohms)
3.3 V
2.5 V
1.8 V
0
1
33
33
33
1
0
33
33
33
1
1
33
33
0
Open
0
0
0
0
2.8.1. LVCMOS Output Termination To Support 1.5 V and 1.2 V
LVCMOS clock outputs are natively supported at 1.8 V, 2.5 V, and 3.3 V. However, 1.2 V and 1.5 V LVCMOS clock
outputs can be supported via a simple resistor divider network that will translate the buffer’s 1.8 V output to a lower
voltage as shown in Figure 10.
VDDOx= 1.8V
R1
50
R2
LVCMOS
1.5V LVCMOS: R1 = 43 ohms, R2 = 300 ohms, IOUT = 12mA
1.2V LVCMOS: R1 = 58 ohms, R2 = 150 ohms, IOUT = 12mA
R1
50
R2
Figure 10. 1.5V and 1.2V LVCMOS Low-Voltage Output Termination
18
Rev. 1.0
Si53312
2.9. AC Timing Waveforms
TPHL
TSK
VPP/2
CLK
Q
VPP/2
QN
QM
VPP/2
VPP/2
TPLH
TSK
Propagation Delay
Output-Output Skew
TF
Q
80% VPP
20% VPP
80% VPP
20% VPP
Q
Rise/Fall Time
TR
Figure 11. AC Waveforms
Rev. 1.0
19
Si53312
2.10. AC Timing Waveforms
TPHL
TSK
CLK
QN
VPP/2
Q
VPP/2
QM
VPP/2
VPP/2
TPLH
TSK
Propagation Delay
Output-Output Skew
TF
Q
80% VPP
20% VPP
80% VPP
Q
20% VPP
TR
Rise/Fall Time
Figure 12. AC Waveforms
20
Rev. 1.0
Si53312
2.11. Typical Phase Noise Performance
Each of the following three figures shows three phase noise plots superimposed on the same diagram.
Source Jitter: Reference clock phase noise.
Total Jitter (SE): Combined source and clock buffer phase noise measured as a single-ended output to the phase
noise analyzer and integrated from 12 kHz to 20 MHz.
Total Jitter (Diff): Combined source and clock buffer phase noise measured as a differential output to the phase
noise analyzer and integrated from 12 kHz to 20 MHz. The differential measurement as shown in each figure is
made using a balun. See Figure 1 on page 9.
Note: To calculate the total RMS phase jitter when adding a buffer to your clock tree, use the root-sum-square (RSS).
The total jitter is a measure of the source plus the buffer's additive phase jitter. The additive jitter (rms) of the buffer
can then be calculated (via root-sum-square addition).
Figure 13. Source Jitter (156.25 MHz)
Table 21. Source Jitter (156.25 MHz)
Frequency
(MHz)
Diff’l Input
Slew Rate
(V/ns)
Source
Jitter
(fs)
Total Jitter
(SE)
(fs)
Additive Jitter
(SE)
(fs)
Total Jitter
(Diff’l)
(fs)
Additive Jitter
(Diff’l)
(fs)
156.25
1.0
38.2
147.8
142.8
118.3
112.0
Rev. 1.0
21
Si53312
Figure 14. Single-ended Total Jitter (312.5 MHz)
Table 22. Single-ended Total Jitter (312.5 MHz)
22
Frequency
(MHz)
Diff’l Input
Slew Rate
(V/ns)
Source
Jitter
(fs)
Total Jitter
(SE)
(fs)
Additive Jitter
(SE)
(fs)
Total Jitter
(Diff’l)
(fs)
Additive Jitter
(Diff’l)
(fs)
312.5
1.0
33.10
94.39
88.39
83.80
76.99
Rev. 1.0
Si53312
Figure 15. Differential Total Jitter (625 MHz)
Table 23. Differential Total Jitter (625 MHz)
Frequency
(MHz)
Diff’l Input
Slew Rate
(V/ns)
Source
Jitter
(fs)
Total Jitter
(SE)
(fs)
Additive Jitter
(SE)
(fs)
Total Jitter
(Diff’l)
(fs)
Additive Jitter
(Diff’l)
(fs)
625
1.0
23.4
56.5
51.5
58.5
53.6
Rev. 1.0
23
Si53312
2.12. Input Mux Noise Isolation
LVPECL [email protected];
Selected clk is active
Unselected clk is static
Mux Isolation = 61dB
LVPECL [email protected];
Selected clk is static
Unselected clk is active
Figure 16. Input Mux Noise Isolation
2.13. Power Supply Noise Rejection
The device supports on-chip supply voltage regulation to reject noise present on the power supply, simplifying low
jitter operation in real-world environments. This feature enables robust operation alongside FPGAs, ASICs and
SoCs and may reduce board-level filtering requirements. For more information, see AN491: “Power Supply
Rejection for Low Jitter Clocks”.
24
Rev. 1.0
Si53312
VDDOA
Q3
Q3
Q4
Q4
GND
Q5
Q5
Q6
Q6
VDDOB
3. Pin Description: 44-Pin QFN
34
35
36
37
38
39
40
41
42
43
44
DIVA
1
33
SFOUTA[1]
SFOUTA[0]
2
32
3
31
Q2
4
30
Q2
5
29
GND
6
Q1
7
Q1
Q0
Q0
NC
DIVB
SFOUTB[1]
SFOUTB[0]
28
Q7
Q7
NC
27
Q8
8
26
Q8
9
25
Q9
10
24
Q9
11
23
CLK_SEL
22
21
20
19
18
17
16
15
14
13
NC
CLK0
CLK0
OEA
VREF
OEB
CLK1
CLK1
NC
GND
VDD
12
GND
PAD
Table 24. Si53312 44-Pin QFN Descriptions
Pin #
Name
Description
1
DIVA
Output divider control pin for Bank A.
Three-level input control. Internally biased at VDD/2. Can be left floating or tied to
ground or VDD.
2
SFOUTA[1]
Output signal format control pin for Bank A.
Three-level input control. Internally biased at VDD/2. Can be left floating or tied to
ground or VDD.
3
SFOUTA[0]
Output signal format control pin for Bank A.
Three-level input control. Internally biased at VDD/2. Can be left floating or tied to
ground or VDD.
4
Q2
Output clock 2 (complement).
5
Q2
Output clock 2.
6
GND
7
Q1
Output clock 1 (complement).
8
Q1
Output clock 1.
Ground.
Rev. 1.0
25
Si53312
Table 24. Si53312 44-Pin QFN Descriptions (Continued)
Pin #
Name
9
Q0
Output clock 0 (complement).
10
Q0
Output clock 0.
11
NC
No connect.
12
VDD
Core voltage supply.
Bypass with a 1.0 µF capacitor placed as close to the pin as possible.
13
NC
No connect.
14
CLK0
Input clock 0.
15
CLK0
Input clock 0 (complement).
When the CLK0 is driven by a single-end LVCMOS input, connect CLK0 to Vdd/2.
CLK0 contains an internal pull-up resistor.
16
OEA
Output enable—Bank A.
When OEA = high, the Bank A outputs are enabled.
When OEA = low, Q is held low and Q is held high for differential formats.
For LVCMOS, both Q and Q are held low when OEA is set low.
OEA contains an internal pull-up resistor.
17
VREF
Reference voltage for single-ended CMOS clocks.
VREF is an output voltage and is equal to VDD/2. It can be used to bias the /CLK input
for single ended input clocks. See Section 2.3 for more details.
18
OEB
Output enable—Bank B.
When OEB = high, the Bank B outputs are enabled.
When OEB = low, Q is held low and Q is held high for differential formats.
For LVCMOS, both Q and Q are held low when OEB is set low.
OEB contains an internal pull-up resistor.
19
CLK1
Input clock 1.
20
CLK1
Input clock 1 (complement).
When the CLK1 is driven by a single-end LVCMOS input, connect CLK1 to Vdd/2.
CLK1 contains an internal pull-up resistor.
21
NC
22
GND
23
CLK_SEL
24
Q9
Output clock 9 (complement).
25
Q9
Output clock 9.
26
Q8
Output clock 8 (complement).
26
Description
No connect.
Ground.
MUX input select pin (LVCMOS).
When CLK_SEL is high, CLK1 is selected.
When CLK_SEL is low, CLK0 is selected.
CLK_SEL contains an internal pull-down resistor.
Rev. 1.0
Si53312
Table 24. Si53312 44-Pin QFN Descriptions (Continued)
Pin #
Name
Description
27
Q8
Output clock 8.
28
NC
No connect.
29
Q7
Output clock 7 (complement).
30
Q7
Output clock 7.
31
SFOUTB[0]
Output signal format control pin for Bank B.
Three-level input control. Internally biased at VDD/2. Can be left floating or tied to
ground or VDD.
32
SFOUTB[1]
Output signal format control pin for Bank B.
Three-level input control. Internally biased at VDD/2. Can be left floating or tied to
ground or VDD.
33
DIVB
Output divider configuration bit for Bank B.
Three-level input control. Internally biased at VDD/2. Can be left floating or tied to
ground or VDD.
34
VDDOB
35
Q6
Output clock 6 (complement).
36
Q6
Output clock 6.
37
Q5
Output clock 5 (complement).
38
Q5
Output clock 5.
39
GND
40
Q4
Output clock 4 (complement).
41
Q4
Output clock 4.
42
Q3
Output clock 3 (complement).
43
Q3
Output clock 3.
44
VDDOA
GND
Pad
GND
Output Clock Voltage Supply—Bank B (Outputs: Q5 to Q9).
Bypass with a 1.0 µF capacitor placed as close to the pin as possible.
Ground.
Output Voltage Supply—Bank A (Outputs: Q0 to Q4).
Bypass with a 1.0 µF capacitor placed as close to the pin as possible.
Ground Pad.
Power supply ground and thermal relief.
Rev. 1.0
27
Si53312
4. Ordering Guide
28
Part Number
Package
PB-Free, ROHS-6
Temperature
Si53312-B-GM
44-QFN
Yes
–40 to 85 °C
Rev. 1.0
Si53312
5. Package Outline
5.1. 7x7 mm 44-QFN Package Diagram
Figure 17. Si53312 7x7 mm 44-QFN Package Diagram
Table 25. Package Diagram Dimensions
Dimension
MIN
NOM
MAX
A
0.80
0.85
0.90
A1
0.00
0.02
0.05
b
0.18
0.25
0.30
D
D2
7.00 BSC
2.65
e
2.80
2.95
0.50 BSC
E
7.00 BSC
E2
2.65
2.80
2.95
L
0.30
0.40
0.50
aaa
—
—
0.10
bbb
—
—
0.10
ccc
—
—
0.08
ddd
—
—
0.10
Notes:
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. Dimensioning and Tolerancing per ANSI Y14.5M-1994.
3. This drawing conforms to the JEDEC Solid State Outline MO-220.
4. Recommended card reflow profile is per the JEDEC/IPC J-STD-020 specification for Small
Body Components.
Rev. 1.0
29
Si53312
6. PCB Land Pattern
6.1. 7x7 mm 44-QFN Package Land Pattern
Figure 18. Si53312 7x7 mm 44-QFN Package Land Pattern
Table 26. PCB Land Pattern
Dimension
Min
Max
Dimension
Min
Max
C1
6.80
6.90
X2
2.85
2.95
C2
6.80
6.90
Y1
0.75
0.85
Y2
2.85
2.95
E
X1
0.50 BSC
0.20
0.30
Notes:
General
1. All dimensions shown are in millimeters (mm) unless otherwise noted.
2. This Land Pattern Design is based on the IPC-7351 guidelines.
Solder Mask Design
1. All metal pads are to be non-solder mask defined (NSMD). Clearance between the solder mask and the metal pad is to
be 60 μm minimum, all the way around the pad.
Stencil Design
1. A stainless steel, laser-cut and electro-polished stencil with trapezoidal walls should be used to assure good solder
paste release.
2. The stencil thickness should be 0.125 mm (5 mils).
3. The ratio of stencil aperture to land pad size should be 1:1 for all perimeter pads.
4. A 2x2 array of 1.0 mm square openings on 1.45 mm pitch should be used for the center ground pad.
Card Assembly
1. A No-Clean, Type-3 solder paste is recommended.
2. The recommended card reflow profile is per the JEDEC/IPC J-STD-020 specification for Small Body Components.
30
Rev. 1.0
Si53312
7. Top Marking
7.1. Si53312 Top Marking
7.2. Top Marking Explanation
Mark Method:
Laser
Font Size:
1.9 Point (26 mils)
Right-Justified
Line 1 Marking: Device Part Number
53312-B-GM
Line 2 Marking: YY=Year
WW=Work Week
Assigned by Assembly Supplier.
Corresponds to the year and work
week of the mold date.
TTTTTT=Mfg Code
Line 3 Marking: Circle=1.3 mm Diameter
Center-Justified
Line 4 Marking
Manufacturing Code from the
Assembly Purchase Order form.
“e3” Pb-Free Symbol
Country of Origin
ISO Code Abbreviation
TW
Circle = 0.75 mm Diameter
Filled
Pin 1 Identification
Rev. 1.0
31
Si53312
DOCUMENT CHANGE LIST
Revision 0.4 to Revision 1.0








32
Updated frequency spec from 1MHz to dc.
Updated operating conditions, including LVCMOS
and HCSL voltage support.
Updated tables 1-11.
Fixed package error to reflect 44-pin instead of 32pin throughout document.
Updated section 2.1-2.12 text descriptions and
diagrams.
Improved data for additive jitter specifications.
Improved typical phase noise plots.
Improved performance specifications with more
detail.
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