V23990 P629 L81 D1 14

V23990-P629-L81-PM
datasheet
flow BOOST 0 SiC
1200 V / 80 mΩ
Features
●
●
●
●
●
flow 0 12mm housing
High efficiency dual boost
Ultra fast switching frequency
Low Inductive Layout
1200V SiC MOSFET (Rohm) and 1200V SiC diode (Rohm)
Integrated bypass diode
Schematic
Target applications
● Solar Inverter
● UPS
Types
● V23990-P629-L81-PM
Maximum Ratings
Tj=25°C, unless otherwise specified
Parameter
Symbol
Condition
Value
Unit
1200
V
20
A
140
A
68
W
Boost Switch
Drain-source voltage
V DSS
Drain current
ID
T j = T jmax
Peak drain current
I DM
t p limited by T jmax
Total power dissipation
P tot
T j = T jmax
Gate-source voltage
V GSS
-6/+22
V
Maximum Junction Temperature
T jmax
175
°C
Copyright Vincotech
1
T s= 80 °C
T s = 80 °C
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Parameter
Symbol
Condition
Value
Unit
1200
V
19
A
50
A
56
W
Boost Diode
Peak Repetitive Reverse Voltage
Continuous (direct) forward current
V RRM
IF
T j = T jmax
T s = 80°C
Repetitive peak forward current
I FRM
Total power dissipation
P tot
Maximum Junction Temperature
T jmax
175
°C
V RRM
1600
V
33
A
200
A
200
A s
43
W
T j = T jmax
T s = 80°C
Bypass Diode
Peak Repetitive Reverse Voltage
Continuous (direct) forward current
Surge (non-repetitive) forward current
IF
I FSM
2
T j = T jmax
T s = 80°C
60 Hz Single Half Sine Wave
t p = 8,3 ms
T j = 150°C
2
Surge current capability
I t
Total power dissipation
P tot
Maximum Junction Temperature
T jmax
150
°C
Storage temperature
T stg
-40…+125
°C
Operation temperature under switching
condition
T jop
-40…+(T jmax - 25)
°C
4000
V
min 12,7
mm
9,55
mm
T j = T jmax
T s = 80°C
Module Properties
Thermal Properties
Isolation Properties
Isolation voltage
DC voltage
V isol
Creepage distance
Clearance
Comparative Tracking Index
Copyright Vincotech
t p=2s
>200
CTI
2
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Characteristic Values
Parameter
Symbol
Conditions
VGE [V] VCE [V]
Value
IC [A]
Tj[°C]
Min
Unit
Typ
Max
79
111
Boost Switch
Static
25
Drain-sourc e on-state resistanc e
Gate-source threshold voltage
18
r DS(on)
V GS(th)
10
V GS = V DS
0,0044
Gate to Sourc e Leakage Current
I GSS
-6/+22
0
Zero Gate Voltage Drain Current
I DSS
0
1200
125
108
150
121
25
1,7*
3
25
±100
125
25
10
125
rg
9
Gate c harge
Qg
110
Gate to source charge
Q GS
Gate to drain charge
Q GD
38
Short-circ uit input capacitance
C iss
2070
Short-circ uit output capacitance
C oss
Reverse transfer capac itance
C rss
f=1MHz
0
400
4**
125
Internal gate resistance
18
mΩ
10
800
25
25
24
80
V
nA
µA
Ω
nC
pF
20
* VG S =-6V for 100msec is applied. Measuring time: 2.5msec .
** VG S =+22V for 100msec is applied. Measuring time: 2.5msec.
Thermal
Thermal resistance junction to sink
R th(j-s)
phase-change
material λ=3,4
W/mK
1,41
K/W
MOSFET Switching
Turn-on delay time
Rise time
Turn-off delay time
t d(on)
tr
R goff = 4 Ω
R gon = 4 Ω
t d(off)
+16/0
Fall time
tf
Turn-on energy (per pulse)
E on
Turn-off energy (per pulse)
E off
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Q rFWD = 0,1 µC
Q rFWD = 0,1 µC
3
700
16
25
125
25
125
25
125
25
125
25
125
25
125
15
14
8
7
113
129
5
5
0,399
0,303
0,174
0,186
ns
mWs
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Diode
Parameter
Symbol
Conditions
VGE [V] VCE [V]
Value
IC [A]
Tj[°C]
Min
Unit
Typ
Max
25
1,40
1,6
125
1,70
150
1,83
Static
Forward voltage
Reverse leakage c urrent
10
VF
25
1200
Ir
V
200
150
µA
Thermal
Thermal resistance junc tion to sink
R th(j-s)
phase-change
material
ʎ =3,4W /mK
1,7
K/W
FWD Switching
Peak recovery current
I RRM
Reverse recovery time
t rr
Recovered charge
Reverse recovered energy
Peak rate of fall of recovery current
Qr
di /dt = 1914 A/µs
+16/0
di /dt = 2353 A/µs
700
16
E rec
(di rf/dt )max
25
125
25
125
25
125
25
125
25
125
9
10
9
9
0,083
0,102
0,018
0,029
3218
3711
A
ns
µC
mWs
A/µs
Bypass Diode
Static
Forward voltage
Reverse leakage c urrent
25
VF
1600
Ir
25
1,22
125
1,21
25
1,9
50
150
1100
V
µA
Thermal
Thermal resistance junc tion to sink
R th(j-s)
phase-change
material
ʎ = 3,4 W /mK
1,61
K/W
21,5
kΩ
Thermistor
Rated resistance
25
R
Deviation of R100
ΔR/R
Power dissipation
P
R100=1486 Ω
100
Power dissipation constant
-4,5
+4,5
%
25
210
mW
25
3,5
mW/K
B-value
B(25/50)
25
3884
K
B-value
B(25/100)
25
3964
K
Vincotech NTC Reference
Copyright Vincotech
F
4
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switch Characteristics
MOSFET
Typical output characteristics
MOSFET
Typical output characteristics
I D = f(V DS)
I D= f(V DS)
80
ID (A)
I D (A)
80
70
60
60
40
50
40
20
30
0
20
-20
10
0
-40
0
2
4
6
tp =
250
µs
V GS=
18
V
8
10
12
T j:
14
16
18
VDS (V)
20
-10
-5
0
5
15
20
VDS (V)
25 °C
tp =
250
125 °C
Tj =
150
150 °C
V GS from
0 V to 20 V in steps of 2 V
MOSFET
Typical transfer characteristics
10
µs
°C
Transient thermal impedance as a function of pulse width
I D = f(V GS)
MOSFET
Z th(j-s)= f(t p)
35
I D (A)
101
30
25
100
20
15
0,5
10-1
0,2
10
0,1
0,05
0,02
5
0,01
0,005
0
10-2
0
0
2
4
6
8
10
12
14
10-4
16
10-3
10-2
10-1
100
101
102
VGS (V)
tp =
100
µs
V DS =
10
V
T j:
25 °C
D=
tp / T
125 °C
R th(j-s) =
1,48
K/W
150 °C
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5
R (K/W)
Tau(s)
1,30E-01
1,00E+00
4,11E-01
1,66E-01
7,09E-01
6,11E-02
1,27E-01
5,50E-03
1,00E-01
8,02E-04
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Diode Characteristics
FWD
Typical forward characteristics
I F = f(V F)
Z th(j-s) = f(t p)
30
101
Z t h(j
h(j--s) (K/W)
IF (A)
FWD
Transient thermal impedance as a function of pulse width
25
100
20
15
D = 0,5
0,2
0,1
0,05
0,02
0,01
0,005
0.000
10-1
10
5
10-2
0
0
1
2
3
4
10-4
5
10-3
10-2
VF (V)
tp =
250
µs
T j:
10-1
100
101
102
t p (s)
25 °C
D=
tp / T
125 °C
R th(j-s) =
1,7
K/W
150 °C
FWD thermal model values
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6
R (K/W)
4,5560E-02
τ (s)
3,2070E+00
1,6530E-01
3,8810E-01
7,8640E-01
6,5190E-02
3,2730E-01
1,1130E-02
2,5420E-01
2,7080E-03
1,2040E-01
6,1510E-04
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Bypass Diode Characteristics
Bypass diode
Typical forward characteristics
Transient thermal impedance as a function of pulse width
Z th(j-s) = f(t p)
75
101
Z t h(j
h(j--s) (K/W)
IF (A)
I F = f(V F)
Bypass diode
60
100
45
30
D = 0,5
0,2
0,1
0,05
0,02
0,01
0,005
0.000
10-1
15
10-2
0
0
1
2
3
4
10-4
5
10-3
10-2
VF (V)
tp =
250
µs
T j:
10-1
100
101
102
t p (s)
25 °C
D=
tp / T
125 °C
R th(j-s) =
1,61
K/W
150 °C
Diode thermal model values
R (K/W)
6,7170E-02
τ (s)
2,7200E+00
1,4760E-01
4,1400E-01
8,6760E-01
8,3320E-02
2,5310E-01
2,8890E-02
1,6900E-01
5,1460E-03
1,0640E-01
9,0980E-04
Thermistor
Typical Thermistor resistance values
Thermistor typical temperature characteristic
Typical NTC characteristic
as a function of temperature
R T = f(T )
NTC-typical temperature characteristic
R (Ω)
25000
20000
15000
10000
5000
0
25
50
75
100
125
T (°C)
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7
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switching Characteristics
Figure 1.
MOSFET
Figure 2.
MOSFET
E = f(I D)
E = f(rg)
1,2
1,2
E ( mWs)
Typical swit ching energy losses as a f unct ion of gate resistor
E (mWs)
Typical swit ching energy losses as a f unction of collector current
Eo n
0,9
Eo n
0,9
Eon
Eon
0,6
0,6
Eoff
Eoff
0,3
0,3
E off
Eo ff
0
0
0
5
10
15
20
25
30
0
I C (A)
25 °C
With an induc tive load at
700
V
V DS =
+16/0
V
V GS =
R gon =
4
Ω
R goff =
4
Ω
T j:
2
4
6
8
150 °C
ID =
Figure 3.
FWD
16
T j:
14
16
R g ( Ω)
18
125 °C
150 °C
A
Figure 4.
FWD
Typical reverse recovered energy loss as a f unction of collector current
Typical reverse recovered energy loss as a f unct ion of gat e resist or
E rec = f(I D)
E rec = f(r g )
0,05
0,03
E ( mWs)
E (mWs)
12
25 °C
With an inductive load at
700
V
V DS =
+16/0
V
V GS =
125 °C
10
0,025
0,04
Erec
0,02
0,03
Erec
0,015
0,02
0,01
Erec
0,01
0,005
Erec
0
-1,73E-17
0
5
10
With an induc tive load at
700
V
V DS =
+16/0
V
V GS =
R gon =
4
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15
20
25
I D (A)
0
30
25 °C
T j:
2
4
6
With an inductive load at
700
V
V DS =
+16/0
V
V GS =
125 °C
150 °C
Ω
ID =
8
16
8
10
12
14
16
r g (Ω)
18
25 °C
T j:
125 °C
150 °C
A
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switching Characteristics
Figure 5.
MOSFET
Figure 6.
MOSFET
Typical swit ching t imes as a f unct ion of collector current
Typical swit ching t imes as a f unct ion of gate resistor
t = f(I D)
t = f(r g)
1
t ( μs)
t ( μ s)
1
td(off )
td(off )
0,1
0,1
td(on)
td(on)
tr
0,01
0,01
tr
tf
tf
0,001
0,001
0
5
10
15
20
25
30
0
(A )
I D (A)
With an induc tive load at
125
°C
Tj=
700
V
V DS =
V GS =
+16/0
V
R gon =
4
Ω
R goff =
4
Ω
2
4
6
8
10
12
16
r g (Ω)
18
With an inductive load at
125
°C
Tj=
700
V
V DS =
V GS =
ID =
Figure 7.
FWD
+16/0
V
16
A
Figure 8.
FWD
Typical reverse recovery t ime as a f unction of collector current
Typical reverse recovery t ime as a f unct ion of MOSFET turn on gat e resist or
t rr = f(I D)
t rr = f(R gon)
0,012
t rr (μs)
t rr (μs)
0,012
0,009
trr
trr
0,009
trr
trr
0,006
0,006
0,003
0,003
0
0
0
5
10
15
20
25
30
0
I D (A)
At
14
V DS=
V GS =
R gon =
700
V
+16/0
V
4
Ω
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4
6
8
10
12
14
16
18
R g on (Ω)
25 °C
T j:
2
At
125 °C
150 °C
9
V DS =
V GS =
ID =
700
V
+16/0
V
16
A
25 °C
T j:
125 °C
150 °C
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switching Characteristics
Figure 9.
FWD
Figure 10.
FWD
Typical recovered charge as a f unction of collector current
Typical recoved charge as a f unct ion of MOSFET t urn on gate resistor
Qr = f(I D)
Q r = f(R gon)
0,12
Q r (µC)
Q r (μ C)
0,15
0,09
Qr
0,12
Qr
0,09
0,06
Qr
0,06
Qr
0,03
0,03
0
At
0
0
5
10
15
20
25
30
0
2
4
6
8
10
12
14
16
=
A
V DS
V GS =
R gon =
700
V
+16/0
V
4
Ω
25 °C
T j:
At
V DS =
700
V GS =
ID=
125 °C
150 °C
Figure 11.
18
R g o n (Ω)
I D (A)
FWD
V
+16/0
V
16
A
25 °C
T j:
125 °C
150 °C
Figure 12.
FWD
Typical peak reverse recovery current current as a f unct ion of collect or current
Typical peak reverse recovery current as a f unct ion of MOSFET t urn on gate resistor
I RM = f(I D)
I RM = f(R gon)
12
I R M (A)
I R M (A)
16
I RM
9
12
I RM
6
8
3
4
IRM
0
0
0
At
IRM
5
10
V DS =
V GS =
700
V
+16/0
V
R gon =
4
Ω
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15
20
25
I D (A)
0
30
4
6
8
10
12
14
16
18
R g o n (Ω)
25 °C
T j:
2
At
125 °C
150 °C
10
V DS =
V GS =
ID =
700
V
+16/0
V
16
A
25 °C
T j:
125 °C
150 °C
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switching Characteristics
Figure 13.
FWD
Figure 14.
FWD
Typical rat e of f all of f orward and reverse recovery current as a f unction of MOSFET t urn on gat e resist or
di F/dt ,di rr/dt = f(I c)
di F/dt ,di rr/dt = f(R g)
5000
d i /dt (A/
(A/µ
µs)
d i /dt (A/
(A/µs)
s)
Typical rat e of f all of f orward and reverse recovery current as a f unct ion of collect or current
diF / dt
dir r/dt
4000
6000
di F / dt
di r r/ dt
5000
4000
3000
3000
2000
2000
1000
1000
0
0
0
5
10
15
20
25
0
30
2
4
6
8
10
12
I C (A)
At
700
V
V GS =
+16/0
V
R gon =
4
Ω
V DS
=
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25 °C
T j:
At
V DS
=
125 °C
V GS =
150 °C
I D=
11
700
+16/0
V
16
A
14
16
R g on (Ω)
18
25 °C
V
T j:
125 °C
150 °C
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switching Definitions
General conditions
=
125 °C
=
4Ω
Tj
R gon
=
R goff
Figure 1.
MOSFET
Turn-of f Swit ching Wavef orms & def init ion of t dof f , t Eof f (t Eof f = int egrat ing t ime f or Eof f )
4Ω
Figure 2.
MOSFET
Turn-on Swit ching Wavef orms & def init ion of tdon, t Eon (t Eon = int egrating t ime f or Eon)
125
175
tdoff
%
%
VDS
ID
150
100
VGS 90%
VDS 90%
125
VDS
75
100
ID
VGS
50
VGS
75
tdon
tEoff
50
25
ID 1%
25
VGS 10%
0
-25
-0,1
-0,05
0
0,05
0,1
0,15
V GS (0%) =
V GS (100%) =
0
V
16
V DS (100%) =
700
I D (100%) =
16
3
3,02
3,04
0
V
V
V GS (0%) =
V GS (100%) =
16
V
V
V DS (100%) =
700
V
A
I D (100%) =
t don =
16
A
t doff =
0,129
µs
t Eoff =
Figure 3.
0,155
µs
MOSFET
Turn-of f Swit ching Wavef orms & def init ion of t f
t E on =
Figure 4.
0,014
µs
0,067
µs
3,06
3,08
3,1
t (µs)
MOSFET
Turn-on Swit ching Wavef orms & def init ion of tr
125
%
tEon
-25
2,98
0,2
t (µs)
VDS 3%
ID 10%
0
175
fitted
ID
ID
%
VDS
150
100
ID 90%
125
VCE
75
100
ID 60%
50
IC 90%
75
tr
ID 40%
50
25
ID 10%
25
0
IC 10%
0
tf
-25
0,03
0,05
0,07
0,09
0,11
0,13
-25
3,005
0,15
t ( µs)
V C (100%) =
700
I D (100%) =
tf =
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3,015
3,025
3,035
3,045
3,055
3,065
3,075
t (µs)
V
V C (100%) =
700
V
16
A
A
µs
I D (100%) =
tr =
16
0,005
0,007
µs
12
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switching Definitions
Figure 5.
MOSFET
Turn-of f Swit ching Wavef orms & def init ion of t Eof f
Figure 6.
MOSFET
Turn-on Swit ching Wavef orms & def init ion of tEon
125
150
%
ID 1%
100
Pon
%
Eoff
125
Eon
100
75
75
50
50
Poff
25
25
VGS 90%
0
tEoff
-25
-0,05
VDS 3%
VGS 10%
0
-0,025
0
0,025
0,05
0,075
0,1
0,125
-25
2,99
0,15
tEon
3,005
3,02
3,035
3,05
P off (100%) =
11,08
kW
P on (100%) =
11,08
kW
E off (100%) =
0,19
mJ
E on (100%) =
0,30
mJ
t Eoff =
0,155
µs
t E on =
0,067
µs
Figure 7.
3,065
3,08
3,095
t ( µs)
t (µs)
FWD
Turn-of f Swit ching Wavef orms & def init ion of t rr
150
%
Id
100
trr
50
fitted
Vd
0
IRRM 10%
IRRM 90%
IRRM 100%
-50
-100
3,01
3,02
3,03
3,04
3,05
3,06
t (µs)
V d (100%) =
I d (100%) =
700
V
16
A
I RRM (100%) =
-10
A
t rr =
0,009
µs
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13
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Boost Switching Definitions
Figure 8.
FWD
Turn-on Switching Waveforms & definition of tQrr (tQrr = integrating time for Qrr)
Figure 9.
FWD
Turn-on Switching Waveforms & definition of tErec (tErec= integrating time for Erec)
150
150
%
%
Qrr
Id
Erec
125
100
100
tErec
50
75
tQrr
50
0
25
Prec
-50
0
-100
3,01
3,02
3,03
3,04
3,05
-25
3,02
3,06
t (µs)
3,025
3,03
3,035
3,045
3,05
t (µs)
I d (100%) =
16
A
P rec (100%) =
11,08
kW
Q rr (100%) =
0,10
µC
E rec (100%) =
0,03
mJ
t Q rr =
0,02
µs
t E rec =
0,02
µs
Copyright Vincotech
3,04
14
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Ordering Code & Marking
Version
without thermal paste 12mm housing and solder pins
Vinco WWYY
NNNNNNNVV UL
LLLLL SSSS
Text
Datamatrix
Ordering Code
V23990-P629-L81-PM
Vinco
Date code
Name&Ver
UL
Lot
Serial
Vinco
WWYY
NNNNNNNVV
UL
LLLLL
SSSS
Type&Ver
Lot number
Serial
Date code
TTTTTTTVV
LLLLL
SSSS
WWYY
Outline
Pin table [mm]
Pin
X
Y
Function
1
0
22,5
G1
2
2,9
22,5
S1
3
8,3
22,5
DC-Boost1
4
10,8
22,5
DC-Boost1
5
19,6
22,5
DC+Boost
6
22,1
22,5
DC+Boost
7
29,1
22,5
DC+In1
8
32
22,5
DC+In1
9
33,5
17,8
Boost1
10
33,5
15,3
Boost1
11
12
13
33,5
33,5
32
7,2
4,7
0
Boost2
Boost2
14
29,1
0
DC+In2
15
22,1
0
DC+Boost
16
19,6
0
DC+Boost
17
10,8
0
DC-Boost2
18
8,3
0
DC-Boost2
19
2,9
0
S2
20
0
0
G2
21
0
8
22
0
14,5
Therm1
Therm2
Copyright Vincotech
DC+In2
15
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Pinout
Identification
ID
Component
Voltage
Current
Function
T1,T2
MOSFET
1200V
80mΩ
Boost Switch
D1,D3
FWD
1200V
10A
Boost Diode
D5,D6
Rectifier
1600V
25A
Bypass Diode
Rt
NTC
-
-
Thermistor
Copyright Vincotech
16
Comment
19 Nov. 2015 / Revision 1
V23990-P629-L81-PM
datasheet
Packaging instruction
Standard packaging quantity (SPQ)
135
>SPQ
Standard
<SPQ
Sample
Handling instruction
Handling instructions for flow 0 packages see vincotech.com website.
Package data
Package data for flow 0 packages see vincotech.com website.
Document No.:
Date:
V23990-P629-L81-D1-14
19 Nov. 2015
Modification:
Pages
DISCLAIMER
The information, specifications, procedures, methods and recommendations herein (together “information”) are presented by Vincotech to
reader in good faith, are believed to be accurate and reliable, but may well be incomplete and/or not applicable to all conditions or situations
that may exist or occur. Vincotech reserves the right to make any changes without further notice to any products to improve reliability,
function or design. No representation, guarantee or warranty is made to reader as to the accuracy, reliability or completeness of said
information or that the application or use of any of the same will avoid hazards, accidents, losses, damages or injury of any kind to persons
or property or that the same will not infringe third parties rights or give desired results. It is reader’s sole responsibility to test and determine
the suitability of the information and the product for reader’s intended use.
LIFE SUPPORT POLICY
Vincotech products are not authorised for use as critical components in life support devices or systems without the express written approval
of Vincotech.
As used herein:
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or
sustain life, or (c) whose failure to perform when properly used in accordance with instructions for use provided in labelling can be
reasonably expected to result in significant injury to the user.
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause
the failure of the life support device or system, or to affect its safety or effectiveness.
Copyright Vincotech
17
19 Nov. 2015 / Revision 1