DISCRETE SEMICONDUCTORS DATA SHEET fpage M3D302 PBSS4350D 50 V low VCEsat NPN transistor Product data sheet Supersedes data of 2001 Jan 26 2001 Jul 13 NXP Semiconductors Product data sheet 50 V low VCEsat NPN transistor PBSS4350D FEATURES QUICK REFERENCE DATA • Low collector-emitter saturation voltage SYMBOL • High current capability VCEO collector-emitter voltage 50 V ICM peak collector current 5 A RCEsat equivalent on-resistance <145 mΩ • Improved device reliability due to reduced heat generation • Replacement for SOT89/SOT223 standard packaged transistors due to enhanced performance. PARAMETER MAX. UNIT PINNING PIN APPLICATIONS • Supply line switching circuits • Battery management applications • DC/DC convertor applications • Strobe flash units • Heavy duty battery powered equipment (motor and lamp drivers). DESCRIPTION 1 collector 2 collector 3 base 4 emitter 5 collector 6 collector DESCRIPTION handbook, halfpage 6 5 4 NPN low VCEsat transistor in a SOT457 (SC-74) plastic package. PNP complement: PBSS5350D. 1, 2, 5, 6 3 MARKING 4 1 TYPE NUMBER PBSS4350D MARKING CODE Top view 3 MAM436 43 Fig.1 2001 Jul 13 2 2 Simplified outline (SOT457; SC-74) and symbol. NXP Semiconductors Product data sheet 50 V low VCEsat NPN transistor PBSS4350D LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 60134). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VCBO collector-base voltage open emitter − 60 V VCEO collector-emitter voltage open base − 50 V VEBO emitter-base voltage open collector − 6 V IC collector current (DC) − 3 A ICM peak collector current − 5 A IBM peak base current − 1 A Ptot total power dissipation Tamb ≤ 25 °C; note 1 − 600 mW Tamb ≤ 25 °C; note 2 − 750 mW Tstg storage temperature −65 +150 °C Tj junction temperature − 150 °C Tamb operating ambient temperature −65 +150 °C Notes 1. Device mounted on a printed-circuit board, single sided copper, tinplated and mounting pad for collector 1 cm2. 2. Device mounted on a printed-circuit board, single sided copper, tinplated and mounting pad for collector 6 cm2. THERMAL CHARACTERISTICS SYMBOL Rth j-a PARAMETER thermal resistance from junction to ambient CONDITIONS VALUE UNIT in free air; note 1 208 K/W in free air; note 2 160 K/W Notes 1. Device mounted on a printed-circuit board, single sided copper, tinplated and mounting pad for collector 1 cm2. 2. Device mounted on a printed-circuit board, single sided copper, tinplated and mounting pad for collector 6 cm2. 2001 Jul 13 3 NXP Semiconductors Product data sheet 50 V low VCEsat NPN transistor PBSS4350D CHARACTERISTICS Tamb = 25 °C unless otherwise specified. SYMBOL ICBO PARAMETER collector-base cut-off current CONDITIONS MIN. TYP. MAX. UNIT VCB = 50 V; IE = 0 − − 100 nA VCB = 50 V; IE = 0; Tj = 150 °C − − 50 μA nA IEBO emitter-base cut-off current VEB = 5 V; IC = 0 − − 100 hFE DC current gain VCE = 2 V; IC = 500 mA 200 − − VCE = 2 V; IC = 1 A; note 1 200 − − VCE = 2 V; IC = 2 A; note 1 100 − − IC = 500 mA; IB = 50 mA − − 90 mV IC = 1 A; IB = 50 mA − − 170 mV IC = 2 A; IB = 200 mA; note 1 − − 290 mV VCEsat collector -emitter saturation voltage RCEsat equivalent on-resistance IC = 2 A; IB = 200 mA; note 1 − 110 <145 mΩ VBEsat base-emitter saturation voltage IC = 2 A; IB = 200 mA; note 1 − − 1.2 V VBEon base-emitter turn-on voltage VCE = 2 V; IC = 1 A; note 1 − − 1.1 V fT transition frequency IC = 100 mA; VCE = 5 V; f = 100 MHz 100 − − MHz Cc collector capacitance VCB = 10 V; IE = Ie = 0; f = 1 MHz − − 30 pF Note 1. Pulse test: tp ≤ 300 μs; δ ≤ 0.02. 2001 Jul 13 4 NXP Semiconductors Product data sheet 50 V low VCEsat NPN transistor PBSS4350D MGW175 600 MGW176 1.2 VBE (V) 1.0 handbook, halfpage handbook, halfpage hFE 500 (1) (1) 0.8 400 (2) (2) 300 0.6 (3) 200 0.4 (3) 0.2 100 0 10 −1 1 10 102 0 10 −1 103 104 I C (mA) 1 10 102 103 104 I C (mA) VCE = 2 V. (1) Tamb = −55 °C. (2) Tamb = 25 C. (3) Tamb = 150 °C. VCE = 2 V. (1) Tamb = 150 °C. (2) Tamb = 25 °C. (3) Tamb = −55 °C. Fig.3 Fig.2 DC current gain; typical values. MGW181 103 handbook, halfpage Base-emitter voltage as a function of collector-current; typical values. MGW178 1.2 VBEsat (V) 1.0 handbook, halfpage VCEsat (mV) (1) 102 0.8 (2) (1) 0.6 (2) (3) (3) 0.4 10 0.2 1 10 −1 1 10 102 0 10 −1 103 104 I C (mA) 1 IC/IB = 20. (1) Tamb = 150 °C. (2) Tamb = 25 °C. (3) Tamb = −55 °C. IC/IB = 20. (1) Tamb = 150 °C. (2) Tamb = 25 °C. (3) Tamb = −55 °C. Fig.4 Fig.5 Collector-emitter saturation as a function of collector current; typical values. 2001 Jul 13 5 10 102 103 104 I C (mA) Base-emitter saturation voltage as a function of collector current; typical values. NXP Semiconductors Product data sheet 50 V low VCEsat NPN transistor PBSS4350D MGW180 MGW179 1200 5 handbook, halfpage handbook, halfpage I C (mA) 1000 (2) (3) (4) (5) (1) IC (A) (1) (2) 4 (6) (7) (3) (8) (4) 800 (5) 3 (9) (6) 600 (7) (10) 2 (8) 400 (9) (10) 200 1 (11) (12) 0 0 0.4 0 0.8 1.2 VCE = 5 V. (5) IB = 2.64 nA. (6) IB = 2.31 nA. (7) IB = 1.98 nA. (8) IB = 1.65 nA. (9) IB = 1.32 nA. (10) IB = 0.99 nA. (11) IB = 0.66 nA. (12) IB = 0.33 nA. (1) IB = 150 mA. (2) IB = 135 mA. (3) IB = 120 mA. (4) IB = 105 mA. Collector current as a function of collector-emitter voltage; typical values. Fig.7 MGW182 103 handbook, halfpage RCEsat (Ω) 102 10 1 (1) 10 −1 (2) (3) 10 −2 10 −1 1 10 102 103 104 I C (mA) IC/IB = 20. (1) Tamb = 150 °C. Fig.8 (2) Tamb = 25 °C. (3) Tamb = −55 °C. Collector-emitter equivalent on-resistance as a function of collector current; typical values. 2001 Jul 13 0.8 1.2 1.6 2 VCE (V) VCE = 5 V. (1) IB = 3.96 nA. (2) IB = 3.63 nA. (3) IB = 3.30 nA. (4) IB = 2.97 mA. Fig.6 0.4 0 1.6 2 VCE (V) 6 (5) IB = 90 mA. (6) IB = 75 mA. (7) IB = 60 mA. (8) IB = 45 mA. (9) IB = 30 mA. (10) IB = 15 mA. Collector current as a function of collector-emitter voltage; typical values. NXP Semiconductors Product data sheet 50 V low VCEsat NPN transistor PBSS4350D PACKAGE OUTLINE Plastic surface mounted package; 6 leads SOT457 D E B y A HE 6 X v M A 4 5 Q pin 1 index A A1 c 1 2 3 Lp bp e w M B detail X 0 1 2 mm scale DIMENSIONS (mm are the original dimensions) UNIT A A1 bp c D E e HE Lp Q v w y mm 1.1 0.9 0.1 0.013 0.40 0.25 0.26 0.10 3.1 2.7 1.7 1.3 0.95 3.0 2.5 0.6 0.2 0.33 0.23 0.2 0.2 0.1 OUTLINE VERSION SOT457 2001 Jul 13 REFERENCES IEC JEDEC EIAJ SC-74 7 EUROPEAN PROJECTION ISSUE DATE 97-02-28 01-05-04 NXP Semiconductors Product data sheet 50 V low VCEsat NPN transistor PBSS4350D DATA SHEET STATUS DOCUMENT STATUS(1) PRODUCT STATUS(2) DEFINITION Objective data sheet Development This document contains data from the objective specification for product development. Preliminary data sheet Qualification This document contains data from the preliminary specification. Product data sheet Production This document contains the product specification. Notes 1. Please consult the most recently issued document before initiating or completing a design. 2. The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status information is available on the Internet at URL http://www.nxp.com. DISCLAIMERS above those given in the Characteristics sections of this document is not implied. Exposure to limiting values for extended periods may affect device reliability. General ⎯ Information in this document is believed to be accurate and reliable. However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information. 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Export might require a prior authorization from national authorities. Quick reference data ⎯ The Quick reference data is an extract of the product data given in the Limiting values and Characteristics sections of this document, and as such is not complete, exhaustive or legally binding. Applications ⎯ Applications that are described herein for any of these products are for illustrative purposes only. NXP Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Limiting values ⎯ Stress above one or more limiting values (as defined in the Absolute Maximum Ratings System of IEC 60134) may cause permanent damage to the device. Limiting values are stress ratings only and operation of the device at these or any other conditions 2001 Jul 13 8 NXP Semiconductors Customer notification This data sheet was changed to reflect the new company name NXP Semiconductors. No changes were made to the content, except for the legal definitions and disclaimers. Contact information For additional information please visit: http://www.nxp.com For sales offices addresses send e-mail to: [email protected] © NXP B.V. 2009 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner. The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights. Printed in The Netherlands 613514/03/pp9 Date of release: 2001 Jul 13 Document order number: 9397 750 08426