AON2410 30V N-Channel MOSFET General Description Product Summary The AON2410 combines advanced trench MOSFET technology with a low resistance package to provide extremely low RDS(ON). This device is ideal for load switch and battery protection applications. ID (at VGS=4.5V) 30V 8A RDS(ON) (at VGS = 4.5V) < 21mΩ RDS(ON) (at VGS = 2.5V) < 28mΩ VDS DFN 2x2B Top View S D Bottom View D D D S Pin 1 D Pin 1 G D G S Absolute Maximum Ratings TA=25°C unless otherwise noted Parameter Symbol Drain-Source Voltage VDS Gate-Source Voltage Continuous Drain Current G VGS TA=25°C Pulsed Drain Current C Power Dissipation A Junction and Storage Temperature Range Thermal Characteristics Parameter Maximum Junction-to-Ambient A Maximum Junction-to-Ambient A D Rev 0 : Dec 2011 Steady-State A A 32 W 1.8 TJ, TSTG Symbol t ≤ 10s V 2.8 PD TA=70°C ±12 6 IDM TA=25°C Units V 8 ID TA=70°C Maximum 30 RθJA www.aosmd.com -55 to 150 Typ 37 66 °C Max 45 80 Units °C/W °C/W Page 1 of 5 AON2410 Electrical Characteristics (TJ=25°C unless otherwise noted) Symbol Parameter STATIC PARAMETERS Drain-Source Breakdown Voltage BVDSS Conditions Min ID=250µA, VGS=0V IGSS Gate-Body leakage current VDS=0V, VGS=±12V VGS(th) Gate Threshold Voltage VDS=VGS,ID=250µA 0.6 ID(ON) On state drain current VGS=4.5V, VDS=5V 32 TJ=55°C VGS=4.5V, ID=8A TJ=125°C VGS=2.5V, ID=4A ±100 nA 1.07 1.5 V 17.1 21 26 32 21.2 28 A Forward Transconductance VDS=5V, ID=8A 50 VSD Diode Forward Voltage IS=1A,VGS=0V 0.7 IS Maximum Body-Diode Continuous Current Coss Output Capacitance Crss Reverse Transfer Capacitance Rg Gate resistance µA 5 gFS DYNAMIC PARAMETERS Ciss Input Capacitance Units V 1 Zero Gate Voltage Drain Current Static Drain-Source On-Resistance Max 30 VDS=30V, VGS=0V IDSS RDS(ON) Typ mΩ mΩ S 1 V 3.5 A 813 pF VGS=0V, VDS=15V, f=1MHz 98 pF VGS=0V, VDS=0V, f=1MHz 2.3 3.5 8 12 VGS=4.5V, VDS=15V, ID=8A 1.2 nC 56 SWITCHING PARAMETERS Qg Total Gate Charge pF Ω nC Qgs Gate Source Charge Qgd Gate Drain Charge 2.6 nC tD(on) Turn-On DelayTime 3 ns tr Turn-On Rise Time tD(off) Turn-Off DelayTime 3 ns 26 ns tf Turn-Off Fall Time 3.5 ns trr Body Diode Reverse Recovery Time Qrr IF=8A, dI/dt=100A/µs 10 Body Diode Reverse Recovery Charge IF=8A, dI/dt=100A/µs 2.4 ns nC VGS=4.5V, VDS=15V, RL=1.8Ω, RGEN=3Ω A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment with TA =25°C. The Power dissipation PDSM is based on R θJA t ≤ 10s value and the maximum allowed junction temperature of 150°C. The value in any given application depends on the user's specific board design. B. The power dissipation PD is based on TJ(MAX)=150°C, using junction-to-case thermal resistance, and is more useful in setting the upper dissipation limit for cases where additional heatsinking is used. C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and duty cycles to keep initial TJ =25°C. D. The RθJA is the sum of the thermal impedance from junction to case RθJC and case to ambient. E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max. F. These curves are based on the junction-to-case thermal impedance which is measured with the device mounted to a large heatsink, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a single pulse rating. G. The maximum current rating is package limited. H. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C. THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN, FUNCTIONS AND RELIABILITY WITHOUT NOTICE. Rev 0 : Dec. 2011 www.aosmd.com Page 2 of 5 AON2410 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 40 20 10V 3V VDS=5V 16 30 2.5V 4.5V ID(A) ID (A) 12 20 8 125°C 10 4 25°C VGS=1.5V 0 0 0 1 2 3 4 0 5 35 1 1.5 2 2.5 3 Normalized On-Resistance 1.8 30 RDS(ON) (mΩ Ω) 0.5 VGS(Volts) Figure 2: Transfer Characteristics (Note E) VDS (Volts) Fig 1: On-Region Characteristics (Note E) VGS=2.5V 25 20 15 VGS=4.5V VGS=4.5V ID=8A 1.6 1.4 17 5 2 VGS=2.5V 10 ID=4A 1.2 1 0.8 10 0 5 10 0 15 ID (A) Figure 3: On-Resistance vs. Drain Current and Gate Voltage (Note E) 25 50 75 100 125 150 175 0 Temperature (°C) Figure 4: On-Resistance vs. Junction 18Temperature (Note E) 40 1.0E+02 ID=8A 1.0E+01 35 40 IS (A) RDS(ON) (mΩ Ω) 1.0E+00 125°C 30 25 20 125°C 1.0E-01 1.0E-02 25°C 1.0E-03 15 25°C 1.0E-04 1.0E-05 10 0 6 8 10 VGS (Volts) Figure 5: On-Resistance vs. Gate-Source Voltage (Note E) Rev 0 : Dec. 2011 2 4 www.aosmd.com 0.0 0.2 0.4 0.6 0.8 1.0 1.2 VSD (Volts) Figure 6: Body-Diode Characteristics (Note E) Page 3 of 5 AON2410 TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS 5 1200 VDS=15V ID=8A 1000 Ciss Capacitance (pF) VGS (Volts) 4 3 2 800 600 400 Coss 1 200 0 0 0 2 4 6 8 Qg (nC) Figure 7: Gate-Charge Characteristics 10 0 5 10 15 20 25 VDS (Volts) Figure 8: Capacitance Characteristics 30 10000 100.0 10µs RDS(ON) limited 100µs 1ms 1.0 10ms 0.1 TA=25°C 1000 TJ(Max)=150°C TA=25°C Power (W) 10.0 ID (Amps) Crss 17 5 2 10 100 DC 10 0.0 0.01 0.1 1 VDS (Volts) 10 1 100 0.1 10 0 1000 Pulse Width (s) 18 Figure 15: Single Pulse Power Rating Junction-toAmbient (Note H) 1E-05 Figure 9: Maximum Forward Biased Safe Operating Area (Note F) Zθ JA Normalized Transient Thermal Resistance 10 1 D=Ton/T TJ,PK=TA+PDM.ZθJA.RθJA 0.001 In descending order D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse 40 RθJA=80°C/W 0.1 0.01 Single Pulse 0.001 1E-05 0.0001 0.001 0.01 0.1 1 10 100 1000 Pulse Width (s) Figure 16: Normalized Maximum Transient Thermal Impedance (Note H) Rev 0 : Dec. 2011 www.aosmd.com Page 4 of 5 AON2410 Gate Charge Test Circuit & Waveform Vgs Qg 10V + + Vds VDC - Qgs Qgd VDC - DUT Vgs Ig Charge Resistive Switching Test Circuit & Waveforms RL Vds Vds 90% + Vdd DUT Vgs VDC - Rg 10% Vgs Vgs t d(on) tr t d(off) t on tf toff Unclamped Inductive Switching (UIS) Test Circuit & Waveforms L 2 E AR = 1/2 LIAR Vds BVDSS Vds Id + Vdd Vgs Vgs I AR VDC - Rg Id DUT Vgs Vgs Diode Recovery Test Circuit & Waveforms Q rr = - Idt Vds + DUT Vds Isd Vgs Ig Rev 0 : Dec. 2011 Vgs L Isd + Vdd t rr dI/dt I RM Vdd VDC - IF Vds www.aosmd.com Page 5 of 5