CHIP DIODES February, 2013 Additional Assembly/Test Location for TVS Diode DFN Packages To support our fast growing demand, secure continuity of supply and provide maximum flexibility to our customers, Bourns is adding an additional assembly/test location in China for the assembly/test of the DFN package for our TVS diode products. The affected part number using the DFN package is the Model CDDFN10-3304N TVS/Steering Diode Array. Product Labeling: The product marking is unchanged except for the country code information. Identification of the Changed Product: Bourns maintains traceability back to source wafer lots and assembly sites for all products. Impact on Form, Fit, Function and Reliability: The package outline dimensions will continue to meet the current Bourns data sheet. Product ratings and electrical characteristics are unaffected by the change. There is no impact on form, fit, function, quality or reliability. For qualification information and results, please see the data below. Implementation Dates are as Follows: • Last date of manufacture of existing product: Bourns has no plans to discontinue assembly and test of products at its existing subcontract sites. • Deliveries to customers from new site may occur from July, 2013 onward. • First date code from new site: 1313 New Assembly/Test Location Qualification: Qualification Information: Die Technology Product Name Top Metal Back Metal Assembly Site Pins/Package Mold Compound Die Attach Bond Wire L/F Material Marking Termination Finish All Products TVS Diode Products CDDFN10-3304N Al AlNiAu China DFN 10 CEL9220 8006N Au Copper Laser Matte Sn (Pb Free) ESD1307 Additional Assembly/Test Location for TVS Diode DFN Packages February, 2013 Page 2 of 2 Qualification Results: Test Plan Stress Test Conditions Moisture Induced Stress Sensitivity HTRB 125 °C,1000 h HTST 150 °C, 1000 h 121 °C / 100 % PCT RH, 2 atm, 168 h 65 / +150 °C, TCT 500 cs Solderability 8 h Steam Dimensions Data Sheet Flammability 3 mm W/Bond Pull Strength Die Shear X-Ray - Standard J-STD-020 MIL STD 750 J-STD-22 Method 1048 A103 SS/Acc Level 1 22/0 22/0 Lot 1 SS/fail 154/0 22/0 22/0 J-STD-22 A102 22/0 22/0 J-STD-22 A104 22/0 22/0 JESD22MIL STD 883 UL 94-VO B102E 2025 5/0 5/0 5/0 5 MIL STD 883 2011 76/0 76/0 MIL STD 883 MIL STD 883 2019 2012 5/0 5/0 5/0 5/0 Samples subjected are preconditioned according to JESD22-A113 (260 °C). If you have any questions or need additional information, please feel free to contact Customer Service/Inside Sales.