Data Sheet

DF
N1
01
0B
-6
PMDXB550UNE
30 V, dual N-channel Trench MOSFET
25 March 2015
Product data sheet
1. General description
Dual N-channel enhancement mode Field-Effect Transistor (FET) in a leadless ultra small
DFN1010B-6 (SOT1216) Surface-Mounted Device (SMD) plastic package using Trench
MOSFET technology.
2. Features and benefits
•
•
•
•
•
Low threshold voltage
Leadless ultra small and ultra thin SMD plastic package: 1.1 × 1.0 × 0.37 mm
Trench MOSFET technology
ElectroStatic Discharge (ESD) protection > 2 kV HBM
Exposed drain pad for excellent thermal conduction
3. Applications
•
•
•
•
Relay driver
High-speed line driver
Low-side load switch
Switching circuits
4. Quick reference data
Table 1.
Quick reference data
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VDS
drain-source voltage
Tj = 25 °C
-
-
30
V
VGS
gate-source voltage
-8
-
8
V
ID
drain current
-
-
590
mA
-
550
670
mΩ
Per transistor
VGS = 4.5 V; Tamb = 25 °C
[1]
Static characteristics (per transistor)
RDSon
drain-source on-state
resistance
[1]
VGS = 4.5 V; ID = 590 mA; Tj = 25 °C
Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated, mounting pad for
2
drain 1 cm .
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PMDXB550UNE
NXP Semiconductors
30 V, dual N-channel Trench MOSFET
5. Pinning information
Table 2.
Pinning information
Pin
Symbol Description
1
S1
Simplified outline
Graphic symbol
source TR1
D1
1
2
G1
gate TR1
3
D2
drain TR2
4
S2
source TR2
5
G2
gate TR2
6
D1
drain TR1
Transparent top view
7
D1
drain TR1
DFN1010B-6 (SOT1216)
8
D2
drain TR2
7
2
3
G1
5
8
D2
6
G2
4
S1
S2
017aaa256
6. Ordering information
Table 3.
Ordering information
Type number
Package
PMDXB550UNE
Name
Description
Version
DFN1010B-6
DFN1010B-6: plastic thermal enhanced ultra thin small outline
package; no leads; 6 terminals
SOT1216
7. Marking
Table 4.
Marking codes
Type number
Marking code
PMDXB550UNE
01 10 00
MARKING CODE
(EXAMPLE)
READING
DIRECTION
MARK-FREE AREA
PIN 1
INDICATION MARK
READING EXAMPLE:
YEAR DATE
CODE
11
01
10
Fig. 1.
aaa-007665
DFN1010B-6 (SOT1216) binary marking code description
PMDXB550UNE
Product data sheet
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30 V, dual N-channel Trench MOSFET
8. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
VDS
drain-source voltage
Tj = 25 °C
-
30
V
VGS
gate-source voltage
-8
8
V
ID
drain current
Per transistor
VGS = 4.5 V; Tamb = 25 °C
[1]
-
590
mA
VGS = 4.5 V; Tamb = 100 °C
[1]
-
370
mA
-
2.3
A
[2]
-
285
mW
[1]
-
410
mW
Tsp = 25 °C
-
4030
mW
Tamb = 25 °C
-
380
mA
IDM
peak drain current
Tamb = 25 °C; single pulse; tp ≤ 10 µs
Ptot
total power dissipation
Tamb = 25 °C
Source-drain diode
IS
source current
Per device
Tj
junction temperature
-55
150
°C
Tamb
ambient temperature
-55
150
°C
Tstg
storage temperature
-65
150
°C
PMDXB550UNE
Product data sheet
[1]
Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated, mounting pad for
[2]
drain 1 cm .
Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard
footprint.
2
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NXP Semiconductors
30 V, dual N-channel Trench MOSFET
017aaa123
120
017aaa124
120
Pder
(%)
Ider
(%)
80
80
40
40
0
- 75
Fig. 2.
- 25
25
75
125
Tj (°C)
0
- 75
175
Normalized total power dissipation as a
function of junction temperature
Fig. 3.
- 25
25
75
125
Tj (°C)
175
Normalized continuous drain current as a
function of junction temperature
aaa-017279
10
ID
(A)
tp = 10 µs
Limit RDSon = VDS/ID
1
100 µs
1 ms
10-1
DC; Tsp = 25 °C
100 ms
DC; Tamb = 25 °C;
drain mounting pad 1 cm2
10-2
10-3
10-1
Fig. 4.
10 ms
1
10
102
VDS (V)
Safe operating area; junction to ambient; continuous and peak drain currents as a function of drainsource voltage
9. Thermal characteristics
Table 6.
Thermal characteristics
Symbol
Parameter
Conditions
thermal resistance
from junction to
ambient
in free air
Min
Typ
Max
Unit
[1]
-
380
440
K/W
[2]
-
275
305
K/W
Per transistor
Rth(j-a)
PMDXB550UNE
Product data sheet
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NXP Semiconductors
30 V, dual N-channel Trench MOSFET
Symbol
Parameter
Rth(j-sp)
thermal resistance
from junction to solder
point
[1]
[2]
Conditions
Min
Typ
Max
Unit
-
27
31
K/W
Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.
2
Device mounted on an FR4 PCB, single-sided copper, tin-plated, mounting pad for drain 1 cm .
aaa-015677
103
duty cycle = 1
Zth(j-a)
(K/W)
0.75
0.50
0.33
102
0.20
0.25
0.10
0.05
0
0.01
0.02
10
10-3
10-2
10-1
1
10
102
tp (s)
103
FR4 PCB, standard footprint
Fig. 5.
Transient thermal impedance from junction to ambient as a function of pulse duration; typical values
aaa-015678
103
Zth(j-a)
(K/W)
duty cycle = 1
0.75
102
0.50
0.33
0.25
0.20
0.10
0.05
0
0.01
10
10-3
0.02
10-2
10-1
FR4 PCB, mounting pad for drain 1 cm
Fig. 6.
1
10
102
tp (s)
103
2
Transient thermal impedance from junction to ambient as a function of pulse duration; typical values
PMDXB550UNE
Product data sheet
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NXP Semiconductors
30 V, dual N-channel Trench MOSFET
10. Characteristics
Table 7.
Characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Static characteristics (per transistor)
V(BR)DSS
drain-source
breakdown voltage
ID = 250 µA; VGS = 0 V; Tj = 25 °C
30
-
-
V
VGSth
gate-source threshold
voltage
ID = 250 µA; VDS = VGS; Tj = 25 °C
0.45
0.7
0.95
V
IDSS
drain leakage current
VDS = 30 V; VGS = 0 V; Tj = 25 °C
-
-
1
µA
IGSS
gate leakage current
VGS = 8 V; VDS = 0 V; Tj = 25 °C
-
-
5
µA
VGS = -8 V; VDS = 0 V; Tj = 25 °C
-
-
-5
µA
VGS = 4.5 V; VDS = 0 V; Tj = 25 °C
-
-
1
µA
VGS = -4.5 V; VDS = 0 V; Tj = 25 °C
-
-
-1
µA
VGS = 2.5 V; VDS = 0 V; Tj = 25 °C
-
-
100
nA
VGS = -2.5 V; VDS = 0 V; Tj = 25 °C
-
-
-100
nA
VGS = 4.5 V; ID = 590 mA; Tj = 25 °C
-
550
670
mΩ
VGS = 4.5 V; ID = 590 mA; Tj = 150 °C
-
960
1170
mΩ
VGS = 2.5 V; ID = 590 mA; Tj = 25 °C
-
660
900
mΩ
VGS = 1.8 V; ID = 80 mA; Tj = 25 °C
-
770
1120
mΩ
VGS = 1.5 V; ID = 10 mA; Tj = 25 °C
-
890
1500
mΩ
VDS = 10 V; ID = 590 mA; Tj = 25 °C
-
600
-
mS
RDSon
gfs
drain-source on-state
resistance
forward
transconductance
Dynamic characteristics (per transistor)
QG(tot)
total gate charge
VDS = 15 V; ID = 590 mA; VGS = 4.5 V;
-
0.6
1.05
nC
QGS
gate-source charge
Tj = 25 °C
-
0.1
-
nC
QGD
gate-drain charge
-
0.1
-
nC
Ciss
input capacitance
VDS = 15 V; f = 1 MHz; VGS = 0 V;
-
30.3
-
pF
Coss
output capacitance
Tj = 25 °C
-
5.8
-
pF
Crss
reverse transfer
capacitance
-
4.2
-
pF
td(on)
turn-on delay time
VDS = 15 V; ID = 590 mA; VGS = 4.5 V;
-
4
-
ns
tr
rise time
RG(ext) = 6 Ω; Tj = 25 °C
-
7
-
ns
td(off)
turn-off delay time
-
12
-
ns
tf
fall time
-
3
-
ns
-
0.86
1.2
V
Source-drain diode (per transistor)
VSD
source-drain voltage
PMDXB550UNE
Product data sheet
IS = 380 mA; VGS = 0 V; Tj = 25 °C
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NXP Semiconductors
30 V, dual N-channel Trench MOSFET
aaa-017177
3
VGS = 4.5 V
ID
(A)
ID
(A)
3.0 V
2.5 V
2
aaa-017178
10-3
10-4
2.0 V
1.8 V
(1)
10-5
1
(2)
(3)
1.5 V
1.2 V
0
Fig. 7.
0
1
2
3
VDS (V)
10-6
4
0
0.5
1
Tj = 25 °C
Tj = 25 °C; VDS = 5 V
Output characteristics: drain current as a
function of drain-source voltage; typical values
(1) minimum values
(2) typical values
(3) maximum values
Fig. 8.
aaa-017179
2.0
1.2 V
RDSon
(Ω)
1.8 V
1.5 V
aaa-017180
RDSon
(Ω)
3.0 V
1.5
1.5
1.0
1.0
Tj = 150 °C
VGS = 4.5 V
0.5
0
1
2
ID (A)
0
3
Tj = 25 °C
Fig. 9.
Tj = 25 °C
0.5
0
Product data sheet
0
1
2
3
4
VGS (V)
5
ID = 1 A
Drain-source on-state resistance as a function
of drain current; typical values
PMDXB550UNE
1.5
Sub-threshold drain current as a function of
gate-source voltage
2.0
2.5 V
2.0 V
VGS (V)
Fig. 10. Drain-source on-state resistance as a function
of gate-source voltage; typical values
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NXP Semiconductors
30 V, dual N-channel Trench MOSFET
aaa-017181
1.0
aaa-017182
2.0
ID
(A)
a
0.8
1.5
0.6
0.4
0.5
0.2
0
1.0
Tj = 150 °C
Tj = 25 °C
0
1
2
3
VGS (V)
0
-60
4
VDS > ID × RDSon
Fig. 11. Transfer characteristics: drain current as a
function of gate-source voltage; typical values
60
120
C
(pF)
1.0
(1)
(1)
10
(2)
0.5
0
-60
(2)
(3)
0
60
(3)
120
Tj (°C)
1
10-1
180
1
ID = 0.25 mA; VDS = VGS
f = 1 MHz; VGS = 0 V
(1) maximum values
(2) typical values
(3) minimum values
(1) Ciss
Product data sheet
10
VDS (V)
102
(2) Coss
(3) Crss
Fig. 13. Gate-source threshold voltage as a function of
junction temperature
PMDXB550UNE
180
aaa-017184
102
VGS(th)
(V)
Tj (°C)
Fig. 12. Normalized drain-source on-state resistance
as a function of junction temperature; typical
values
aaa-017183
1.5
0
Fig. 14. Input, output and reverse transfer capacitances
as a function of drain-source voltage; typical
values
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30 V, dual N-channel Trench MOSFET
aaa-017185
5
VDS
VGS
(V)
ID
4
VGS(pl)
3
VGS(th)
VGS
2
QGS1
QGS2
QGS
1
QGD
QG(tot)
003aaa508
0
0
0.2
0.4
0.6
QG (nC)
Fig. 16. Gate charge waveform definitions
0.8
ID = 0.6 A; VDS = 15 V; Tamb = 25 °C
Fig. 15. Gate-source voltage as a function of gate
charge; typical values
aaa-017186
2.0
IS
(A)
1.5
1.0
Tj = 150 °C
0.5
Tj = 25 °C
0
0
0.4
0.8
1.2
VSD (V)
1.6
VGS = 0 V
Fig. 17. Source current as a function of source-drain voltage; typical values
11. Test information
P
t2
duty cycle δ =
t1
t2
t1
t
006aaa812
Fig. 18. Duty cycle definition
PMDXB550UNE
Product data sheet
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30 V, dual N-channel Trench MOSFET
12. Package outline
DFN1010B-6: plastic thermal enhanced ultra thin small outline package; no leads;
6 terminals; body: 1.1 x 1.0 x 0.37 mm
pin 1
index area
SOT1216
visible depend upon
used manufacturing
technology (6x)
e
e
b (6x)
1
2
3
L (6x)
E1 (2x)
E
D
6
A1
e1
A
0
A
A1
b
D
D1
4
D1 (2x)
e1
1 mm
scale
Dimensions (mm are the original dimensions)
Unit
5
E
E1
e
e1
L
min 0.34
0.15 1.05 0.32 0.95 0.22
0.125
nom 0.37
0.18 1.10 0.35 1.00 0.25 0.35 0.275 0.155
max 0.40 0.04 0.23 1.15 0.40 1.05 0.30
0.205
mm
Note
1. Dimension A is including plating thickness.
Outline
version
sot1216_po
References
IEC
JEDEC
JEITA
European
projection
Issue date
13-03-05
13-03-06
SOT1216
Fig. 19. Package outline DFN1010B-6 (SOT1216)
PMDXB550UNE
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30 V, dual N-channel Trench MOSFET
13. Soldering
Footprint information for reflow soldering of DFN1010B-6 package
SOT1216
0.9
0.35
0.35
0.15 0.2 (6x) 0.15
1.3
1.2
0.35
0.25
0.5
0.6
0.35
0.25
1.1
0.3 (6x)
1
1.35
solder land
solder land plus solder paste
occupied area
solder resist
Dimensions in mm
Issue date
13-03-06
14-07-28
sot1216_fr
Fig. 20. Reflow soldering footprint for DFN1010B-6 (SOT1216)
PMDXB550UNE
Product data sheet
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14. Revision history
Table 8.
Revision history
Data sheet ID
Release date
Data sheet status
Change notice
Supersedes
PMDXB550UNE v.1
20150325
Product data sheet
-
-
PMDXB550UNE
Product data sheet
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30 V, dual N-channel Trench MOSFET
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
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Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Document
status [1][2]
Product
status [3]
Objective
[short] data
sheet
Development This document contains data from
the objective specification for product
development.
Preliminary
[short] data
sheet
Qualification
This document contains data from the
preliminary specification.
Product
[short] data
sheet
Production
This document contains the product
specification.
[1]
[2]
[3]
Definition
Right to make changes — NXP Semiconductors reserves the right to
make changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Please consult the most recently issued document before initiating or
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The term 'short data sheet' is explained in section "Definitions".
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relevant full data sheet, which is available on request via the local NXP
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data sheet shall define the specification of the product as agreed between
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is deemed to offer functions and qualities beyond those described in the
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PMDXB550UNE
Product data sheet
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Semiconductors product has been qualified for use in automotive
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product data given in the Limiting values and Characteristics sections of this
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Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those
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repeated exposure to limiting values will permanently and irreversibly affect
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reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
15.4 Trademarks
Notice: All referenced brands, product names, service names and
trademarks are the property of their respective owners.
Bitsound, CoolFlux, CoReUse, DESFire, FabKey, GreenChip,
HiPerSmart, HITAG, I²C-bus logo, ICODE, I-CODE, ITEC, MIFARE,
MIFARE Plus, MIFARE Ultralight, SmartXA, STARplug, TOPFET,
TrenchMOS, TriMedia and UCODE — are trademarks of NXP
Semiconductors N.V.
HD Radio and HD Radio logo — are trademarks of iBiquity Digital
Corporation.
PMDXB550UNE
Product data sheet
All information provided in this document is subject to legal disclaimers.
25 March 2015
© NXP Semiconductors N.V. 2015. All rights reserved
14 / 15
PMDXB550UNE
NXP Semiconductors
30 V, dual N-channel Trench MOSFET
16. Contents
1
General description ............................................... 1
2
Features and benefits ............................................1
3
Applications ........................................................... 1
4
Quick reference data ............................................. 1
5
Pinning information ............................................... 2
6
Ordering information ............................................. 2
7
Marking ................................................................... 2
8
Limiting values .......................................................3
9
Thermal characteristics .........................................4
10
Characteristics ....................................................... 6
11
Test information ..................................................... 9
12
Package outline ................................................... 10
13
Soldering .............................................................. 11
14
Revision history ................................................... 12
15
15.1
15.2
15.3
15.4
Legal information .................................................13
Data sheet status ............................................... 13
Definitions ...........................................................13
Disclaimers .........................................................13
Trademarks ........................................................ 14
© NXP Semiconductors N.V. 2015. All rights reserved
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 25 March 2015
PMDXB550UNE
Product data sheet
All information provided in this document is subject to legal disclaimers.
25 March 2015
© NXP Semiconductors N.V. 2015. All rights reserved
15 / 15