Freescale Semiconductor Technical Data Document Number: AFT26HW050S Rev. 2, 7/2013 RF Power LDMOS Transistors N--Channel Enhancement--Mode Lateral MOSFETs These 9 watt asymmetrical Doherty RF power LDMOS transistors are designed for cellular base station applications requiring very wide instantaneous bandwidth capability covering the frequency range of 2496 to 2690 MHz. Typical Doherty Single--Carrier W--CDMA Performance: VDD = 28 Volts, IDQA = 100 mA, VGSB = 1.4 Vdc, Pout = 9 Watts Avg., Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. Frequency Gps (dB) D (%) Output PAR (dB) ACPR (dBc) 2620 MHz 14.9 48.6 7.9 --28.4 2655 MHz 14.6 48.3 7.9 --32.6 2690 MHz 14.2 47.1 7.8 --37.3 AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 2496–2690 MHz, 9 W AVG., 28 V NI--780S--4L4S AFT26HW050SR3 Features Advanced High Performance In--Package Doherty Designed for Wide Instantaneous Bandwidth Applications Greater Negative Gate--Source Voltage Range for Improved Class C Operation Designed for Digital Predistortion Error Correction Systems In Tape and Reel. R3 Suffix = 250 Units, 44 mm Tape Width, 13--inch Reel. NI--780GS--4L4L AFT26HW050GSR3 NI--780S--4L4L AFT26H050W26SR3 N.C. 1 Carrier 8 VBWA (1) RFinA/VGSA 2 7 RFoutA/VDSA RFinB/VGSB 3 6 RFoutB/VDSB N.C. 4 Peaking 5 VBWB (1) (Top View) Figure 1. Pin Connections 1. Device can operate with the VDD current supplied through pin 5 and pin 8. Freescale Semiconductor, Inc., 2013. All rights reserved. RF Device Data Freescale Semiconductor, Inc. AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 1 Table 1. Maximum Ratings Rating Symbol Value Unit Drain--Source Voltage VDSS --0.5, +65 Vdc Gate--Source Voltage VGS --6.0, +10 Vdc Operating Voltage VDD 32, +0 Vdc Storage Temperature Range Tstg --65 to +150 C Case Operating Temperature Range TC --40 to +150 C Operating Junction Temperature Range (1,2) TJ --40 to +225 C Symbol Value (2,3) Unit RJC 0.75 C/W Table 2. Thermal Characteristics Characteristic Thermal Resistance, Junction to Case Case Temperature 72C, 9 W W--CDMA, 28 Vdc, IDQA = 100 mA, VGSB = 2.8 Vdc, 2655 MHz Table 3. ESD Protection Characteristics Test Methodology Class Human Body Model (per JESD22--A114) 1C Machine Model (per EIA/JESD22--A115) A Charge Device Model (per JESD22--C101) III Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) Symbol Min Typ Max Unit Zero Gate Voltage Drain Leakage Current (VDS = 65 Vdc, VGS = 0 Vdc) IDSS — — 10 Adc Zero Gate Voltage Drain Leakage Current (VDS = 28 Vdc, VGS = 0 Vdc) IDSS — — 1 Adc Gate--Source Leakage Current (VGS = 5 Vdc, VDS = 0 Vdc) IGSS — — 1 Adc Gate Threshold Voltage (VDS = 10 Vdc, ID = 18 Adc) VGS(th) 1.5 2.1 2.5 Vdc Gate Quiescent Voltage (VDS = 28 Vdc, IDA = 100 mA) VGSA(Q) — 2.85 — Vdc Gate Quiescent Voltage (5) (VDD = 28 Vdc, IDA = 100 mA, Measured in Functional Test) VGGA(Q) 5.0 5.7 6.0 Vdc Drain--Source On--Voltage (VGS = 10 Vdc, ID = 0.18 Adc) VDS(on) 0.1 0.21 0.3 Vdc Gate Threshold Voltage (VDS = 10 Vdc, ID = 36 Adc) VGS(th) 1.5 2.0 2.5 Vdc Gate Quiescent Voltage (VDS = 28 Vdc) VGSB(Q) — 1.4 — Vdc Gate Quiescent Voltage (5) (VDD = 28 Vdc, Measured in Functional Test) VGGB(Q) — 2.8 — Vdc Drain--Source On--Voltage (VGS = 10 Vdc, ID = 0.36 Adc) VDS(on) 0.1 0.22 0.3 Vdc Characteristic Off Characteristics (4) On Characteristics -- Side A (4) On Characteristics -- Side B (4) 1. Continuous use at maximum temperature will affect MTTF. 2. MTTF calculator available at http://www.freescale.com/rf. Select Software & Tools/Development Tools/Calculators to access MTTF calculators by product. 3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf. Select Documentation/Application Notes -- AN1955. 4. Each side of device measured separately. 5. VGG = 2 VGS(Q). Parameter measured on Freescale test fixture, due to resistor divider network on the board. Refer to test fixture layout. (continued) AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 2 RF Device Data Freescale Semiconductor, Inc. Table 4. Electrical Characteristics (TA = 25C unless otherwise noted) (continued) Characteristic Symbol Min Typ Max Unit Functional Tests (1,2,3) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 100 mA, VGSB = 1.4 Vdc, Pout = 9 W Avg., f = 2690 MHz, Single--Carrier W--CDMA, IQ Magnitude Clipping, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF. ACPR measured in 3.84 MHz Channel Bandwidth @ 5 MHz Offset. Power Gain Gps 13.5 14.2 16.5 dB Drain Efficiency D 44.0 47.1 — % PAR 7.3 7.8 — dB ACPR — --37.3 --32.5 dBc Output Peak--to--Average Ratio @ 0.01% Probability on CCDF Adjacent Channel Power Ratio Load Mismatch (In Freescale Test Fixture, 50 ohm system) IDQA = 100 mA, f = 2655 MHz No Device Degradation VSWR 10:1 at 32 Vdc, 35 W CW Output Power (3 dB Input Overdrive from 70 W CW Rated Power) Typical Performances (2) (In Freescale Doherty Test Fixture, 50 ohm system) VDD = 28 Vdc, IDQA = 100 mA, VGSB = 1.4 Vdc, 2620--2690 MHz Bandwidth Pout @ 1 dB Compression Point, CW P1dB — 42 — W Pout @ 3 dB Compression Point (4) P3dB — 54 — W — 35 — VBWres — 130 — MHz Gain Flatness in 70 MHz Bandwidth @ Pout = 9 W Avg. GF — 0.7 — dB Gain Variation over Temperature (--30C to +85C) G — 0.014 — dB/C P1dB — 0.007 — dB/C AM/PM (Maximum value measured at the P3dB compression point across the 2620--2690 MHz frequency range) VBW Resonance Point (5) (IMD Third Order Intermodulation Inflection Point) Output Power Variation over Temperature (--30C to +85C) 1. Part internally matched both on input and output. 2. Measurements made with device in an asymmetrical Doherty configuration. 3. Measurements made with device in straight lead configuration before any lead forming operation is applied. Lead forming is used for gull wing (GS) parts. 4. P3dB = Pavg + 7.0 dB where Pavg is the average output power measured using an unclipped W--CDMA single--carrier input signal where output PAR is compressed to 7.0 dB @ 0.01% probability on CCDF. 5. Measured using gull wing formed part in AFT26HW050GS characterization test fixture. See Appendix, p. 17. AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 3 AFT26HW050S Rev. 5 VGGA VDDA R4 R3 C17 C12 C1* R7 C14 C19 C18 C10 CUT OUT AREA C3 Z1 C4 R1, R2** C2* C C5 C6 C9* C7 P C8* C20 C11 R8 C21 C13 C15 R5 R6 C16 VGGB VDDB *C1, C2, C8 and C9 are mounted vertically. **R1 and R2 are stacked. Figure 2. AFT26HW050SR3 Test Circuit Component Layout Table 5. AFT26HW050SR3 Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1, C2, C8, C9, C10, C11, C14, C15 3.9 pF Chip Capacitors ATC100B3R9BT500XT ATC C3 0.4 pF Chip Capacitor ATC100B0R4BT500XT ATC C4 0.3 pF Chip Capacitor ATC100B0R3BT500XT ATC C5, C6 0.2 pF Chip Capacitors ATC100B0R2BT500XT ATC C7 0.1 pF Chip Capacitor ATC100B0R1BT500XT ATC C12, C13 4.7 F Chip Capacitors C4532X7S2A475M230KB TDK C16, C17 10 F Chip Capacitors C5750X7S2A106M230KB TDK C18, C19, C20, C21 1.0 F Chip Capacitors 12065G105ZAT2A AVX R1, R2 100 , 1/4 W Chip Resistors WCR1206-100RFI Welwyn R3, R4, R5, R6 10 k, 1/4 W Chip Resistors WCR1206-10K0FI Welwyn R7, R8 4.7 , 1/4 W Chip Resistors WCR1206-4R70FI Welwyn Z1 2300--2700 MHz Band, 90, 5 dB Hybrid Coupler X3C25P1-05S Anaren PCB 0.030, r = 3.5 RF35A2 Taconic AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 4 RF Device Data Freescale Semiconductor, Inc. 52 16.5 16 46 VDD = 28 Vdc, Pout = 9 W (Avg.) IDQA = 100 mA, VGSB = 2.8 Vdc Single--Carrier W--CDMA 15.5 15 43 40 --20 --1.5 14 --25 --1.7 13.5 --30 14.5 Gps PARC ACPR 13 12.5 12 2480 --35 3.84 MHz Channel Bandwidth, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 2510 2540 2570 2600 2630 --40 2660 ACPR (dBc) Gps, POWER GAIN (dB) 49 D --1.9 --2.1 --2.3 --45 2720 2690 PARC (dB) 17 D, DRAIN EFFICIENCY (%) TYPICAL CHARACTERISTICS --2.5 f, FREQUENCY (MHz) IMD, INTERMODULATION DISTORTION (dBc) Figure 3. Single--Carrier Output Peak--to--Average Ratio Compression (PARC) Broadband Performance @ Pout = 9 Watts Avg. --20 VDD = 28 Vdc, Pout = 4 W (PEP) IDQA = 100 mA, VGSB = 2.8 Vdc --30 IM3--L IM3--U Two--Tone Measurements (f1 + f2)/2 = Center Frequency of 2655 MHz --40 IM5--L --50 IM5--U IM7--U --60 --70 IM7--L 1 10 200 100 TWO--TONE SPACING (MHz) Note: Measured using gull wing formed part in AFT26HW050GS characterization test fixture. See Appendix, p. 17. 15 --1 14.5 14 13.5 13 12.5 --1 dB = 6 W VDD = 28 Vdc, IDQA = 100 mA VGSB = 2.8 Vdc, f = 2655 MHz D --2 Gps --3 dB = 12 W --6 30 Single--Carrier W--CDMA 3.84 MHz Channel Bandwidth, Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 6 10 --15 40 ACPR 2 60 PARC --4 --5 --10 50 --2 dB = 9 W --3 70 14 18 --20 --25 ACPR (dBc) 0 D DRAIN EFFICIENCY (%) 15.5 OUTPUT COMPRESSION AT 0.01% PROBABILITY ON CCDF (dB) Gps, POWER GAIN (dB) Figure 4. Intermodulation Distortion Products versus Two--Tone Spacing --30 20 --35 10 --40 22 Pout, OUTPUT POWER (WATTS) Figure 5. Output Peak--to--Average Ratio Compression (PARC) versus Output Power AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 5 TYPICAL CHARACTERISTICS Gps, POWER GAIN (dB) 15 2655 MHz 2620 MHz 2655 MHz 14.5 14 10 60 0 D 2620 MHz 2690 MHz ACPR 2620 MHz 2655 MHz 2690 MHz 70 13.5 50 40 30 2690 MHz Single--Carrier W--CDMA, 3.84 MHz Channel Bandwidth Input Signal PAR = 9.9 dB @ 0.01% Probability on CCDF 13 12.5 1 20 Gps 10 100 10 --10 --20 --30 ACPR (dBc) VDD = 28 Vdc, IDQA = 100 mA, VGSB= 2.8 Vdc D, DRAIN EFFICIENCY (%) 15.5 --40 --50 Pout, OUTPUT POWER (WATTS) AVG. Figure 6. Single--Carrier W--CDMA Power Gain, Drain Efficiency and ACPR versus Output Power 24 20 GAIN (dB) 16 VDD = 28 Vdc Pin = 0 dBm IDQA = 100 mA VGSB = 2.8 Vdc Gain 12 8 4 0 2400 2450 2500 2550 2600 2650 2700 2750 2800 f, FREQUENCY (MHz) Figure 7. Broadband Frequency Response AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 6 RF Device Data Freescale Semiconductor, Inc. VDD = 28 Vdc, IDQA = 87 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB f (MHz) Zsource () Zin () Zload (1) () Gain (dB) (dBm) (W) D (%) AM/PM () 2620 28.0 -- j23.1 23.9 + j22.9 27.8 -- j12.4 17.2 42.9 19 54.9 --17 2655 36.9 -- j21.1 33.1 + j21.2 29.1 -- j11.6 17.3 42.9 19 56.0 --16 2690 48.4 -- j13.5 42.1 + j16.0 30.9 -- j14.3 17.0 42.8 19 53.5 --17 Max Output Power P3dB Gain (dB) (dBm) (W) D (%) AM/PM () 29.8 -- j16.4 14.8 43.6 23 54.6 --21 37.9 + j20.4 31.0 -- j16.1 14.9 43.6 23 55.1 --21 47.7 + j12.5 32.1 -- j14.9 14.9 43.6 23 54.9 --22 f (MHz) Zsource () Zin () 2620 28.0 -- j23.1 27.1 + j23.9 2655 36.9 -- j21.1 2690 48.4 -- j13.5 Zload () (2) (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Figure 8. Carrier Side Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, IDQA = 87 mA, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB f (MHz) Zsource () Zin () 2620 28.0 -- j23.1 25.7 + j23.9 2655 36.9 -- j21.1 35.7 + j21.2 2690 48.4 -- j13.5 44.6 + j15.4 Zload () (1) Gain (dB) (dBm) (W) D (%) AM/PM () 24.3 + j8.63 19.5 41.2 13 62.2 --22 22.2 + j8.93 19.7 41.0 13 62.8 --22 21.1 + j7.02 19.6 41.1 13 62.5 --22 Max Drain Efficiency P3dB f (MHz) Zsource () Zin () 2620 28.0 -- j23.1 28.0 + j24.6 2655 36.9 -- j21.1 39.6 + j20.7 2690 48.4 -- j13.5 49.3 + j11.6 Zload () (2) Gain (dB) (dBm) (W) D (%) AM/PM () 26.6 + j5.46 17.2 42.3 17 63.1 --27 23.4 + j5.31 17.3 42.2 17 63.6 --29 21.5 + j5.46 17.4 42.0 16 63.0 --30 (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Figure 9. Carrier Side Load Pull Performance — Maximum Drain Efficiency Tuning Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 7 VDD = 28 Vdc, VGSB = 1.4 Vdc, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Output Power P1dB f (MHz) Zsource () Zin () Zload (1) () Gain (dB) (dBm) (W) D (%) AM/PM () 2620 27.1 -- j17.7 22.9 + j19.6 8.62 -- j15.3 12.8 46.1 40 58.3 --32 2655 36.7 -- j12.5 32.0 + j15.6 8.78 -- j15.7 12.8 46.1 40 58.4 --33 2690 39.5 -- j2.23 37.9 + j7.03 8.71 -- j17.3 12.4 45.9 39 54.9 --33 Max Output Power P3dB f (MHz) Zsource () Zin () 2620 27.1 -- j17.7 26.5 + j18.9 2655 36.7 -- j12.5 35.9 + j11.8 2690 39.5 -- j2.23 39.4 + j1.33 Zload () (2) Gain (dB) (dBm) (W) D (%) AM/PM () 8.56 -- j16.9 10.5 46.7 47 57.3 --37 8.57 -- j17.0 10.5 46.8 47 57.2 --38 9.02 -- j18.1 10.4 46.6 46 55.6 --38 (1) Load impedance for optimum P1dB power. (2) Load impedance for optimum P3dB power. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Figure 10. Peaking Side Load Pull Performance — Maximum Power Tuning VDD = 28 Vdc, VGSB = 1.4 Vdc, Pulsed CW, 10 sec(on), 10% Duty Cycle Max Drain Efficiency P1dB f (MHz) Zsource () Zin () Zload (1) () Gain (dB) (dBm) (W) D (%) AM/PM () 2620 27.1 -- j17.7 21.4 + j21.6 13.6 -- j7.07 14.1 44.4 28 68.7 --38 2655 36.7 -- j12.5 31.4 + j19.0 13.5 -- j5.38 14.0 44.0 25 68.6 --40 2690 39.5 -- j2.23 39.1 + j10.8 13.5 -- j7.10 13.9 44.2 26 67.7 --39 Max Drain Efficiency P3dB f (MHz) Zsource () Zin () 2620 27.1 -- j17.7 25.3 + j21.2 2655 36.7 -- j12.5 36.2 + j15.4 2690 39.5 -- j2.23 41.9 + j4.53 Zload () (2) Gain (dB) (dBm) (W) D (%) AM/PM () 13.9 -- j7.07 12.1 44.9 31 68.0 --48 12.5 -- j7.10 12.1 45.0 31 68.1 --49 12.5 -- j6.42 12.0 44.6 29 66.9 --50 (1) Load impedance for optimum P1dB efficiency. (2) Load impedance for optimum P3dB efficiency. Zsource = Measured impedance presented to the input of the device at the package reference plane. Zin = Impedance as measured from gate contact to ground. Zload = Measured impedance presented to the output of the device at the package reference plane. Figure 11. Peaking Side Load Pull Performance — Maximum Drain Efficiency Tuning Input Load Pull Tuner and Test Circuit Output Load Pull Tuner and Test Circuit Device Under Test Zsource Zin Zload AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 8 RF Device Data Freescale Semiconductor, Inc. P1dB -- TYPICAL CARRIER SIDE LOAD PULL CONTOURS — 2655 MHz IMAGINARY () 10 20 38.5 39 39.5 40 41 40.5 E 10 41.5 IMAGINARY () 20 0 42 --10 --20 P 41 20 60 58 56 62 0 54 --10 52 P 50 --20 42.5 --30 10 E 48 30 40 50 46 --30 10 60 20 30 40 50 60 REAL () REAL () Figure 12. P1dB Load Pull Output Power Contours (dBm) Figure 13. P1dB Load Pull Efficiency Contours (%) 0 20.5 19.5 19 18.5 18 10 E 17.5 --10 17 P --20 --30 10 30 40 E --20 --14 --18 0 --10 P --20 16.5 20 --30 --28 --26 20 IMAGINARY () IMAGINARY () 10 --24 --22 20 20 50 60 --30 10 --16 20 30 40 50 60 REAL () REAL () Figure 14. P1dB Load Pull Gain Contours (dB) Figure 15. P1dB Load Pull AM/PM Contours () NOTE: P = Maximum Output Power E = Maximum Drain Efficiency Power Gain Drain Efficiency Linearity Output Power AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 9 P3dB -- TYPICAL CARRIER SIDE LOAD PULL CONTOURS — 2655 MHz 20 39.5 40 40.5 20 41.5 41 56 42 E 10 42.5 IMAGINARY () IMAGINARY () 10 0 43 --10 E 0 62 --10 P --20 58 56 P 50 46 41.5 20 30 40 50 --30 10 60 20 54 52 --20 43.5 --30 10 60 48 30 40 50 60 REAL () REAL () Figure 16. P3dB Load Pull Output Power Contours (dBm) Figure 17. P3dB Load Pull Efficiency Contours (%) 20 20 --32 0 18.5 18 E 17.5 17 16.5 16 10 15.5 --10 15 P --20 --30 10 30 40 --24 --20 --22 --26 0 --18 --10 P --20 14.5 20 --28 --30 E IMAGINARY () IMAGINARY () 10 50 60 --30 10 20 30 40 50 60 REAL () REAL () Figure 18. P3dB Load Pull Gain Contours (dB) Figure 19. P3dB Load Pull AM/PM Contours () NOTE: P = Maximum Output Power E = Maximum Drain Efficiency Power Gain Drain Efficiency Linearity Output Power AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 10 RF Device Data Freescale Semiconductor, Inc. P1dB -- TYPICAL PEAKING SIDE LOAD PULL CONTOURS — 2655 MHz 42 0 43 42.5 IMAGINARY () E --5 44.5 P --10 --15 --25 62 60 58 56 54 52 --20 45.5 45 6 64 P 46 --20 8 10 12 14 16 18 --25 20 6 8 10 Figure 20. P1dB Load Pull Output Power Contours (dBm) 14 16 18 20 Figure 21. P1dB Load Pull Efficiency Contours (%) 0 0 --5 14 --10 13.5 --15 P 13 11.5 --20 6 12 8 10 12 14 16 --40 E --38 --36 --10 --34 --15 P --32 --20 12.5 11 --42 --44 --5 E IMAGINARY () IMAGINARY () 12 REAL () REAL () --25 66 E 44 45 --10 --15 68 43.5 --5 IMAGINARY () 0 18 20 --25 --30 --28 6 8 REAL () 10 12 14 16 18 20 REAL () Figure 22. P1dB Load Pull Gain Contours (dB) NOTE: Figure 23. P1dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Power Gain Drain Efficiency Linearity Output Power AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 11 P3dB -- TYPICAL PEAKING SIDE LOAD PULL CONTOURS — 2655 MHz 0 42.5 66 44 --5 45.5 --10 45 --15 E 68 --10 --15 64 P --20 --25 52 --20 46 8 62 60 58 56 54 P 46.5 6 10 12 14 16 18 --25 20 6 8 10 12 14 Figure 24. P3dB Load Pull Output Power Contours (dBm) 0 --5 --5 E IMAGINARY () IMAGINARY () --54 11.5 --15 11 P 9.5 --20 --25 10 8.5 8 10 12 20 14 16 E --10 --52 --50 --48 --46 --44 --42 --40 --15 --38 P --20 10.5 9 6 18 Figure 25. P3dB Load Pull Efficiency Contours (%) 0 12 16 REAL () REAL () --10 64 --5 44.5 E IMAGINARY () IMAGINARY () 0 43.5 43 18 20 --25 6 8 REAL () 10 12 14 16 18 20 REAL () Figure 26. P3dB Load Pull Gain Contours (dB) NOTE: Figure 27. P3dB Load Pull AM/PM Contours () P = Maximum Output Power E = Maximum Drain Efficiency Power Gain Drain Efficiency Linearity Output Power AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 12 RF Device Data Freescale Semiconductor, Inc. PACKAGE DIMENSIONS AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 13 AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 14 RF Device Data Freescale Semiconductor, Inc. AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 15 AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 16 RF Device Data Freescale Semiconductor, Inc. AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 17 AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 18 RF Device Data Freescale Semiconductor, Inc. APPENDIX VGGA C5 VDDA AFT26HW050GS Rev. 5 C4 C8 C16 C14 R2 C2 C11 C3 C C17 Z1 C10 C13 R1 P C1 R3 C15 C12 C9 C6 C7 VGGB VDDB Figure A--1. AFT26HW050GSR3 Characterization Test Circuit Component Layout Table A--1. AFT26HW050GSR3 Characterization Test Circuit Component Designations and Values Part Description Part Number Manufacturer C1 3.3 pF Chip Capacitor 08051J3R3CBTTR AVX C2, C4, C7, C10, C11 4.7 pF Chip Capacitors 08051J4R7CBTTR AVX C3, C12, C13, C15 0.5 pF Chip Capacitors 08051J0R5BBTTR AVX C5, C6 4.7 F Chip Capacitors C4532X7S2A475M230KB TDK C8, C9 3.3 F Chip Capacitors C3225X7S2A335M200AB TDK C14, C17 0.2 pF Chip Capacitors 08051J0R2ABTTR AVX C16 0.1 pF Chip Capacitor 08051J0R1ABTTR AVX R1 51 , 1/4 W Chip Resistor WCR1206-51FI Welwyn R2, R3 4.7 , 1/8 W Chip Resistors WCR0805--4R7FI Welwyn Z1 2300--2700 MHz Band, 90, 5 dB Hybrid Coupler X3C25P1-05S Anaren PCB 0.030, r = 3.5 RF35A2 Taconic AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 RF Device Data Freescale Semiconductor, Inc. 19 PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS Refer to the following documents, software and tools to aid your design process. Application Notes AN1955: Thermal Measurement Methodology of RF Power Amplifiers Engineering Bulletins EB212: Using Data Sheet Impedances for RF LDMOS Devices Software Electromigration MTTF Calculator RF High Power Model .s2p File Development Tools Printed Circuit Boards For Software and Tools, do a Part Number search at http://www.freescale.com, and select the “Part Number” link. Go to the Software & Tools tab on the part’s Product Summary page to download the respective tool. REVISION HISTORY The following table summarizes revisions to this document. Revision Date Description 0 May 2013 Initial Release of Data Sheet 1 June 2013 Added part number AFT26H050W26SR3, p. 1 Added NI--780S--4L4L package isometric, p. 1, and Mechanical Outline, p. 17, 18 2 July 2013 AFT26HW050S data sheet frequency changed from 2620 MHz to 2496 MHz to show part performance capability in the 2496--2690 MHz frequency range, p. 1 Fig. 3, Single--Carrier Output Peak--to--Average Ratio Compression (PARC) Broadband Performance @ Pout = 9 Watts Avg., updated to reflect part performance in the 2496--2690 MHz frequency range, p. 5 AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 20 RF Device Data Freescale Semiconductor, Inc. How to Reach Us: Home Page: freescale.com Web Support: freescale.com/support Information in this document is provided solely to enable system and software implementers to use Freescale products. There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based on the information in this document. Freescale reserves the right to make changes without further notice to any products herein. Freescale makes no warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale data sheets and/or specifications can and do vary in different applications, and actual performance may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by customer’s technical experts. Freescale does not convey any license under its patent rights nor the rights of others. Freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address: freescale.com/SalesTermsandConditions. Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. Airfast is a trademark of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. E 2013 Freescale Semiconductor, Inc. AFT26HW050SR3 AFT26HW050GSR3 AFT26H050W26SR3 Document Number: RF Device DataAFT26HW050S Rev. 2, 7/2013Semiconductor, Inc. Freescale 21