Data Sheet

Freescale Semiconductor
Technical Data
Document Number: MRFE6VP61K25N
Rev. 2, 4/2015
RF Power LDMOS Transistors
MRFE6VP61K25N
MRFE6VP61K25GN
High Ruggedness N--Channel
Enhancement--Mode Lateral MOSFETs
These high ruggedness devices are designed for use in high VSWR
industrial, medical, broadcast, aerospace and mobile radio applications. Their
unmatched input and output design allows for wide frequency range use from
1.8 to 600 MHz.
Typical Performance: VDD = 50 Vdc
Frequency
(MHz)
Signal Type
Pout
(W)
Gps
(dB)
D
(%)
87.5–108 (1,2)
CW
1309 CW
24.1
77.6
230 (3)
Pulse
(100 sec, 20% Duty Cycle)
1250 Peak
23.0
72.3
1.8–600 MHz, 1250 W CW, 50 V
WIDEBAND
RF POWER LDMOS TRANSISTORS
OM--1230--4L
PLASTIC
MRE6VP61K25N
Load Mismatch/Ruggedness
Frequency
(MHz)
230
(3)
Signal Type
VSWR
Pulse
(100 sec, 20%
Duty Cycle)
> 65:1 at all
Phase Angles
Pin
(W)
Test
Voltage
11.5 Peak
(3 dB
Overdrive)
50
Result
No Device
Degradation
OM--1230G--4L
PLASTIC
MRE6VP61K25GN
1. Measured in 87.5–108 MHz broadband reference circuit.
2. The values shown are the center band performance numbers across the indicated
frequency range.
3. Measured in 230 MHz narrowband test circuit.
Features
 Unmatched Input and Output Allowing Wide Frequency Range Utilization
 Device can be used Single--Ended or in a Push--Pull Configuration
Gate A 3
1 Drain A
Qualified up to a Maximum of 50 VDD Operation
Characterized from 30 to 50 V for Extended Power Range
Suitable for Linear Application with Appropriate Biasing
Integrated ESD Protection with Greater Negative Gate--Source Voltage Range
for Improved Class C Operation
 Characterized with Series Equivalent Large--Signal Impedance Parameters
Gate B 4
2 Drain B




 Recommended drivers: AFT05MS004N (4 W) or MRFE6VS25N (25 W)
Typical Applications
 Broadcast
– FM broadcast
– HF and VHF broadcast
 Industrial, Scientific, Medical (ISM)
– CO2 laser generation
– Plasma etching
– Particle accelerators (synchrotrons)
– MRI
– Industrial heating/welding
 Freescale Semiconductor, Inc., 2015. All rights reserved.
RF Device Data
Freescale Semiconductor, Inc.
(Top View)
Note: Exposed backside of the package is
the source terminal for the transistors.
Figure 1. Pin Connections
 Aerospace
– VHF omnidirectional range (VOR)
– Weather radar
 Mobile Radio
– HF and VHF communications
– PMR base stations
MRFE6VP61K25N MRFE6VP61K25GN
1
Table 1. Maximum Ratings
Rating
Symbol
Value
Unit
Drain--Source Voltage
VDSS
–0.5, +133
Vdc
Gate--Source Voltage
VGS
–6.0, +10
Vdc
Storage Temperature Range
Tstg
– 65 to +150
C
Case Operating Temperature Range
TC
–40 to +150
C
Operating Junction Temperature Range
(1,2)
TJ
–40 to +225
C
PD
3333
16.67
W
W/C
Symbol
Value (2,3)
Unit
Thermal Resistance, Junction to Case
CW: Case Temperature 109C, 1250 W CW, 50 Vdc, IDQ(A+B) = 245 mA, 98 MHz
RJC
0.06
C/W
Thermal Impedance, Junction to Case
Pulse: Case Temperature 74C, 1250 W Peak, 100 sec Pulse Width, 20% Duty Cycle,
IDQ(A+B) = 100 mA, 230 MHz
ZJC
0.016
C/W
Total Device Dissipation @ TC = 25C
Derate above 25C
Table 2. Thermal Characteristics
Characteristic
Table 3. ESD Protection Characteristics
Test Methodology
Class
Human Body Model (per JESD22--A114)
2, passes 2500 V
Machine Model (per EIA/JESD22--A115)
B, passes 250 V
Charge Device Model (per JESD22--C101)
IV, passes 2000 V
Table 4. Moisture Sensitivity Level
Test Methodology
Per JESD22--A113, IPC/JEDEC J--STD--020
Rating
Package Peak Temperature
Unit
3
260
C
Table 5. Electrical Characteristics (TA = 25C unless otherwise noted)
Characteristic
Off Characteristics
Symbol
Min
Typ
Max
Unit
IGSS
—
—
1
Adc
133
—
—
Vdc
(4)
Gate--Source Leakage Current
(VGS = 5 Vdc, VDS = 0 Vdc)
Drain--Source Breakdown Voltage
(VGS = 0 Vdc, ID = 100 mAdc)
V(BR)DSS
Zero Gate Voltage Drain Leakage Current
(VDS = 50 Vdc, VGS = 0 Vdc)
IDSS
—
—
10
Adc
Zero Gate Voltage Drain Leakage Current
(VDS = 100 Vdc, VGS = 0 Vdc)
IDSS
—
—
20
Adc
Gate Threshold Voltage (4)
(VDS = 10 Vdc, ID = 1776 Adc)
VGS(th)
1.7
2.2
2.7
Vdc
Gate Quiescent Voltage
(VDD = 50 Vdc, ID(A+B) = 100 mAdc, Measured in Functional Test)
VGS(Q)
1.9
2.4
2.9
Vdc
Drain--Source On--Voltage (4)
(VGS = 10 Vdc, ID = 2 Adc)
VDS(on)
—
0.2
—
Vdc
Forward Transconductance (4)
(VDS = 10 Vdc, ID = 30 Adc)
gfs
—
28.0
—
S
On Characteristics
1.
2.
3.
4.
Continuous use at maximum temperature will affect MTTF.
MTTF calculator available at http://www.freescale.com/rf/calculators.
Refer to AN1955 – Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.freescale.com/rf and search AN1955.
Each side of device measured separately.
(continued)
MRFE6VP61K25N MRFE6VP61K25GN
2
RF Device Data
Freescale Semiconductor, Inc.
Table 5. Electrical Characteristics (TA = 25C unless otherwise noted) (continued)
Characteristic
Symbol
Min
Typ
Max
Unit
Reverse Transfer Capacitance (1)
(VDS = 50 Vdc  30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Crss
—
2.8
—
pF
Output Capacitance (1)
(VDS = 50 Vdc  30 mV(rms)ac @ 1 MHz, VGS = 0 Vdc)
Coss
—
185
—
pF
Input Capacitance (1)
(VDS = 50 Vdc, VGS = 0 Vdc  30 mV(rms)ac @ 1 MHz)
Ciss
—
562
—
pF
Dynamic Characteristics
Functional Tests (2,3) (In Freescale Test Fixture, 50 ohm system) VDD = 50 Vdc, IDQ(A+B) = 100 mA, Pout = 1250 W Peak (250 W Avg.),
f = 230 MHz, 100 sec Pulse Width, 20% Duty Cycle
Power Gain
Gps
22.0
23.0
24.5
dB
Drain Efficiency
D
68.5
72.3
—
%
Input Return Loss
IRL
—
–13
–9
dB
Table 6. Load Mismatch/Ruggedness (In Freescale Test Fixture, 50 ohm system) IDQ(A+B) = 100 mA
Frequency
(MHz)
230
Signal Type
VSWR
Pin
(W)
Pulse
(100 sec, 20% Duty Cycle)
> 65:1 at all
Phase Angles
11.5 Peak
(3 dB Overdrive)
Test Voltage, VDD
Result
50
No Device Degradation
Table 7. Ordering Information
Device
MRFE6VP61K25NR6
MRFE6VP61K25GNR6
Tape and Reel Information
R6 Suffix = 150 Units, 56 mm Tape Width, 13--Reel
Package
OM--1230--4L
OM--1230G--4L
1. Each side of device measured separately.
2. Devices tested without thermal grease.
3. Measurements made with device in straight lead configuration before any lead forming operation is applied. Lead forming is used for gull
wing (GN) parts.
MRFE6VP61K25N MRFE6VP61K25GN
RF Device Data
Freescale Semiconductor, Inc.
3
TYPICAL CHARACTERISTICS
Measured with 30 mV(rms)ac @ 1 MHz
VGS = 0 Vdc
1000
Ciss
NORMALIZED VGS(Q)
C, CAPACITANCE (pF)
10000
Coss
100
10
Crss
1
0
10
20
30
40
50
VDS, DRAIN--SOURCE VOLTAGE (VOLTS)
Note: Each side of device measured separately.
Figure 2. Capacitance versus Drain--Source Voltage
1.06
1.05
1.04
1.03
1.02
1.01
1
0.99
IDQ(A+B) = 100 mA
VDD = 50 Vdc
500 mA
1500 mA
2000 mA
0.98
0.97
0.96
0.95
0.94
–50
–25
0
25
50
75
100
TC, CASE TEMPERATURE (C)
IDQ (mA)
Slope (mV/C)
100
–2.70
500
–2.42
1500
–2.22
2000
–2.05
Figure 3. Normalized VGS versus Quiescent
Current and Case Temperature
MRFE6VP61K25N MRFE6VP61K25GN
4
RF Device Data
Freescale Semiconductor, Inc.
230 MHz NARROWBAND PRODUCTION TEST FIXTURE
C10
C22
C13
C11 C12
C23
C24
C21
COAX1
COAX3
R1
L3
C16
L1
C3
L2
C5
C14
C29
C18
C20
C19
L4
R2
COAX2
C17
C15
CUT OUT AREA
C1
C2 C4
COAX4
C25
C6
C9
C7
D63312
C26
MRFE6VP61K25N
Rev. 0
C8
C27
C28
Figure 4. MRFE6VP61K25N Narrowband Test Circuit Component Layout — 230 MHz
Table 8. MRFE6VP61K25N Narrowband Test Circuit Component Designations and Values — 230 MHz
Part
Description
Part Number
Manufacturer
C1
20 pF Chip Capacitor
ATC100B200JT500XT
ATC
C2, C3, C5
27 pF Chip Capacitors
ATC100B270JT500XT
ATC
C4
0.8–8.0 pF Variable Capacitor, Gigatrim
27291SL
Johanson
C6, C10
22 F, 35 V Tantalum Capacitors
T491X226K035AT
Kemet
C7, C11
0.1 F Chip Capacitors
CDR33BX104AKWS
AVX
C8, C12
220 nF Chip Capacitors
C1812C224K5RAC-TU
Kemet
C9, C13, C21, C25
1000 pF Chip Capacitors
ATC100B102JT50XT
ATC
C14
39 pF Chip Capacitor
ATC100B390JT500XT
ATC
C15
39 pF Chip Capacitor
ATC100C390JT250XT
ATC
C16, C17, C18, C19
240 pF Chip Capacitors
ATC100B241JT200XT
ATC
C20
9.1 pF Chip Capacitor
ATC100B9R1BT500XT
ATC
C22, C23, C24, C26, C27, C28
470 F, 63 V Electrolytic Capacitors
MCGPR63V477M13X26-RH
Multicomp
C29
47 pF Chip Capacitor
ATC100C470JT250XT
ATC
Coax1, 2, 3, 4
25  Semi Rigid Coax, 2.2 Shield Length
UT-141C-25
Micro--Coax
L1, L2
5 nH Inductors
A02TKLC
Coilcraft
L3, L4
6.6 nH Inductors
GA3093-ALC
Coilcraft
R1, R2
10 , 1/4 W Chip Resistors
CRCW120610R0JNEA
Vishay
PCB
Arlon AD255A 0.030, r = 2.55
D63312
MTL
MRFE6VP61K25N MRFE6VP61K25GN
RF Device Data
Freescale Semiconductor, Inc.
5
MRFE6VP61K25N MRFE6VP61K25GN
6
RF Device Data
Freescale Semiconductor, Inc.
RF
INPUT
Z1
C1
Z2
COAX2
COAX1
C3
C2
Z6
Z5
C6
+
C4
C10
+
Z8
Z7
C7
Z9
C12
C8
C5
Z10
C11
C9
Z12
L2
L1
Z11
C13
R2
Z14
Z13
R1
DUT
Z16
Z15
L4
Z20
Z18
Z22
C14
Z21
Z17
Z19
L3
Z24
Z23
Z25
C25
Z26
C29
C21
C26
+
Z28
C15
Z27
C22
C27
+
C23
+
0.170  0.100 Microstrip
0.116  0.285 Microstrip
0.116  0.285 Microstrip
0.108  0.285 Microstrip
0.872  0.058 Microstrip
0.412  0.726 Microstrip
0.416  0.507 Microstrip
Z3, Z4
Z5, Z6
Z7, Z8
Z9, Z10
Z11*, Z12*
Z13, Z14
Z15, Z16
* Line lengths include microstrip bends
0.175  0.082 Microstrip
Z2
Description
0.192  0.082 Microstrip
Z1
Microstrip
0.179  0.082 Microstrip
0.125  0.300 Microstrip
Z27, Z28
Z32
0.247  0.300 Microstrip
Z25, Z26
0.116  0.300 Microstrip
1.006  0.300 Microstrip
Z23, Z24
0.186  0.082 Microstrip
0.059  0.507 Microstrip
Z21, Z22
Z31
0.187  0.154 Microstrip
Z19*, Z20*
Z29, Z30
Description
0.466  0.363 Microstrip
Microstrip
Z17*, Z18*
Table 9. MRFE6VP61K25N Narrowband Test Circuit Microstrips — 230 MHz
Figure 5. MRFE6VP61K25N Narrowband Test Circuit Schematic — 230 MHz
VGG
Z4
Z3
VGG
+
C28
+
C19
C18
C17
C16
C24
+
VDD
Z30
Z29
VDD
COAX4
COAX3
Z31
C20
RF
Z32 OUTPUT
TYPICAL CHARACTERISTICS — 230 MHz
Pout, OUTPUT POWER (WATTS) PEAK
1600
VDD = 50 Vdc, f = 230 MHz
Pulse Width = 100 sec, 20% Duty Cycle
1400
1200
1000
Pin = 6 W
800
Pin = 3 W
600
400
200
0
0.5
0
1.5
1
2
2.5
3
3.5
VGS, GATE--SOURCE VOLTAGE (VOLTS)
Figure 6. Output Power versus Gate--Source
Voltage at a Constant Input Power
26
60
25
56
52
48
28
30
32
34
36
38
50
D
20
100 mA
40
Gps
100 mA
18
50
42
40
60
300 mA
19
44
26
70
600 mA
23
21
80
IDQ(A+B) = 900 mA
24
22
90
VDD = 50 Vdc, IDQ(A+B) = 100 mA, f = 230 MHz
Pulse Width = 100 sec, 20% Duty Cycle
600 mA
300 mA
900 mA
20
10
100
Pin, INPUT POWER (dBm)
30
D, DRAIN EFFICIENCY (%)
27
VDD = 50 Vdc, IDQ(A+B) = 100 mA, f = 230 MHz
Pulse Width = 100 sec, 20% Duty Cycle
Gps, POWER GAIN (dB)
Pout, OUTPUT POWER (dBm) PEAK
64
1000
0
2000
Pout, OUTPUT POWER (WATTS) PEAK
f
(MHz)
P1dB
(W)
P3dB
(W)
230
1295
1518
Figure 8. Power Gain and Drain Efficiency
versus Output Power and Quiescent Current
Figure 7. Output Power versus Input Power
26
25_C
70
23
60
Gps
22
25_C
20
19
18
40
D
85_C
100
85_C
–40_C
50
40
30
VDD = 50 Vdc, IDQ(A+B) = 100 mA, f = 230 MHz 20
Pulse Width = 100 sec, 20% Duty Cycle
10
1000
2000
24
Gps, POWER GAIN (dB)
TC = –40_C
24
21
25
80
D, DRAIN EFFICIENCY (%)
Gps, POWER GAIN (dB)
25
26
90
23
22
21
45 V
20
40 V
19
35 V
18
VDD = 30 V
17
16
50 V
0
200
400
IDQ(A+B) = 100 mA, f = 230 MHz
Pulse Width = 100 sec, 20% Duty Cycle
600
800
1000
1200
1400
Pout, OUTPUT POWER (WATTS) PEAK
Pout, OUTPUT POWER (WATTS) PEAK
Figure 9. Power Gain and Drain Efficiency
versus Output Power
Figure 10. Power Gain versus Output Power
and Drain--Source Voltage
1600
MRFE6VP61K25N MRFE6VP61K25GN
RF Device Data
Freescale Semiconductor, Inc.
7
230 MHz NARROWBAND PRODUCTION TEST FIXTURE
f
MHz
Zsource

Zload

230
2.10 + j3.70
2.55 + j1.90
Zsource = Test circuit impedance as measured from
gate to gate, balanced configuration.
Zload
50 
Input
Matching
Network
= Test circuit impedance as measured from
drain to drain, balanced configuration.
+
-Zsource
Device
Under
Test
--
Output
Matching
Network
50 
+
Zload
Figure 11. Narrowband Series Equivalent Source and Load Impedance — 230 MHz
MRFE6VP61K25N MRFE6VP61K25GN
8
RF Device Data
Freescale Semiconductor, Inc.
87.5–108 MHz BROADBAND REFERENCE CIRCUIT
Table 10. 87.5–108 MHz Broadband Performance (In Freescale Reference Circuit, 50 ohm system)
VDD = 50 Vdc, IDQ(A+B) = 250 mA, Pin = 5 W, CW
Frequency
(MHz)
Gps
(dB)
D
(%)
Pout
(W)
87.5
23.8
78.3
1212
98
24.1
77.6
1309
108
23.6
77.8
1161
MRFE6VP61K25N MRFE6VP61K25GN
RF Device Data
Freescale Semiconductor, Inc.
9
87.5–108 MHz BROADBAND REFERENCE CIRCUIT — 2.88  5.11 (73.1 mm  130 mm)
C25
C28
C6
C26
C22
C7
C27
C21
C5
L4
L1 R2
C4
R1
C12
L3
Q1
C3
C24
C11
C1
C23*
C15*
C13
C2
L2
C20
C19
C18
C17
C16
R3
C14
C8
C9
MRFE6VP61K25N
C10
D62499
*C15 and C23 are mounted vertically.
0.472
(12)
0.196
(5)
0.472
(12)
0.472
(12)
0.472
(12)
Bend Here
0.196
(5)
Side view
0.669
(17)
0.197
(5)
0.197
(5)
Inches
(mm)
45 degree
L3 total wire length = 2.2 (56 mm)
Figure 12. MRFE6VP61K25N 87.5–108 MHz Broadband Reference Circuit
Component Layout
Figure 13. MRFE6VP61K25N 87.5–108 MHz Broadband Reference Circuit
Component Layout — Bottom
MRFE6VP61K25N MRFE6VP61K25GN
10
RF Device Data
Freescale Semiconductor, Inc.
87.5–108 MHz BROADBAND REFERENCE CIRCUIT
Table 11. MRFE6VP61K25N 87.5–108 MHz Broadband Reference Circuit Component Designations and Values
Part
Description
Part Number
Manufacturer
C1, C3, C6, C9, C18, C19,
C20, C21, C22
1000 pF Chip Capacitors
ATC100B102JT50XT
ATC
C2
22 pF Chip Capacitor
ATC100B220JT500XT
ATC
C4, C5, C8
10000 pF Chip Capacitors
ATC200B103KT50XT
ATC
C7, C10, C15, C16, C17, C23 470 pF Chip Capacitors
ATC100B471JT200XT
ATC
C11
100 pF, 300 V Mica
MIN02-002EC101J-F
CDE
C12
15 pF, 300 V Mica
MIN02-002CC150J-F
CDE
C13
6.2 pF Chip Capacitor
ATC100B6R2BT500XT
ATC
C14
15 pF Chip Capacitor
ATC100B150JT500XT
ATC
C24
12 pF Chip Capacitor
ATC100B120JT500XT
ATC
C25, C26, C27
220 F, 63 V Electrolytic Capacitors
EEU-FC1J221
Panasonic
C28
22 F, 35 V Electrolytic Capacitor
UUD1V220MCL1GS
Nichicon
L1, L2
17.5 nH Inductors, 6 Turns
B06TJLC
Coilcraft
L3
1.5 mm Non--Tarnish Silver Plated Copper Wire, SP1500NT-001
Total Wire Length = 2.2/56 mm
—
L4
22 nH Inductor
1212VS-22NMEB
Coilcraft
Q1
RF Power LDMOS Transistor
MRFE6VP61K25NR6
Freescale
R1
10 , 1/4 W Chip Resistor
CRCW120610R0JNEA
Vishay
R2, R3
33 , 2 W Chip Resistors
1-2176070-3
TE Connectivity
PCB
Arlon TC350 0.030, r = 3.5
D62499
MTL
Note: Refer to MRFE6VP61K25N’s printed circuit boards and schematics to download the 87.5–108 MHz heatsink drawing.
MRFE6VP61K25N MRFE6VP61K25GN
RF Device Data
Freescale Semiconductor, Inc.
11
28
79
27
78
77
D
25
76
24
75
Gps
23
22
1400
1300
Pout
21
20
19
87
1200
VDD = 50 Vdc, Pin = 5 W, IDQ(A+B) = 250 mA
89
91
93
95
97
99
101 103
105 107
1100
1000
109
Pout, OUTPUT
POWER (WATTS)
Gps, POWER GAIN (dB)
26
D, DRAIN
EFFICIENCY (%)
TYPICAL CHARACTERISTICS — 87.5–108 MHz
BROADBAND REFERENCE CIRCUIT
f, FREQUENCY (MHz)
Figure 14. Power Gain, Drain Efficiency and CW Output
Power versus Frequency
27
26
108 MHz
80
60
98 MHz
40
20
0
98 MHz
25
24
Gps
87.5 MHz
108 MHz
23
22
1500
1250
98 MHz
21
20
19
18
87.5 MHz
Pout
1000
750
VDD = 50 Vdc
lDQ(A+B) = 250 mA
500
250
108 MHz
17
D, DRAIN
EFFICIENCY (%)
100
D
f = 87.5 MHz
Pout, OUTPUT
POWER (WATTS)
Gps, POWER GAIN (dB)
29
28
0
0
1
2
3
4
5
6
7
8
Pin, INPUT POWER (WATTS)
Figure 15. Power Gain, Drain Efficiency and CW Output
Power versus Input Power and Frequency
MRFE6VP61K25N MRFE6VP61K25GN
12
RF Device Data
Freescale Semiconductor, Inc.
87.5–108 MHz BROADBAND REFERENCE CIRCUIT
f = 87.5 MHz
Zo = 10 
Zsource
f = 108 MHz
f = 108 MHz
Zload
f = 87.5 MHz
f
MHz
Zsource

87.5
2.10 + j6.67
4.11 + j3.87
98
2.80 + j6.96
3.33 + j3.85
108
3.60 + j6.65
2.97 + j4.45
Zload

Zsource = Test circuit impedance as measured from
gate to gate, balanced configuration.
Zload
50 
= Test circuit impedance as measured
from drain to drain, balanced configuration.
Input
Matching
Network
+
Device
Under
Test
--
-Z
source
Output
Matching
Network
50 
+
Z
load
Figure 16. Broadband Series Equivalent Source and Load Impedance — 87.5–108 MHz
MRFE6VP61K25N MRFE6VP61K25GN
RF Device Data
Freescale Semiconductor, Inc.
13
HARMONIC MEASUREMENTS — 87.5–108 MHz
BROADBAND REFERENCE CIRCUIT
F1
H2
H3
H4
Fundamental (F1)
87.5 MHz
175 MHz –37 dB
262.5 MHz –30 dB
350 MHz –42 dB
H3
H4
H2
(175 MHz) (262.5 MHz) (350 MHz)
–37 dB
–30 dB
–42 dB
H3
H2
Center: 228.5 MHz
H4
35 MHz
Span: 350 MHz
Figure 17. 87.5 MHz Harmonics @ 1215 W CW
MRFE6VP61K25N MRFE6VP61K25GN
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RF Device Data
Freescale Semiconductor, Inc.
PACKAGE DIMENSIONS
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Freescale Semiconductor, Inc.
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MRFE6VP61K25N MRFE6VP61K25GN
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PRODUCT DOCUMENTATION, SOFTWARE AND TOOLS
Refer to the following resources to aid your design process.
Application Notes
 AN1907: Solder Reflow Attach Method for High Power RF Devices in Over--Molded Plastic Packages
 AN1955: Thermal Measurement Methodology of RF Power Amplifiers
Engineering Bulletins
 EB212: Using Data Sheet Impedances for RF LDMOS Devices
White Paper
 RFPLASTICWP: Designing with Plastic RF Power Transistors
Software
 Electromigration MTTF Calculator
 RF High Power Model
 .s2p File
Development Tools
 Printed Circuit Boards
To Download Resources Specific to a Given Part Number:
1.
2.
3.
4.
Go to http://www.freescale.com/rf
Search by part number
Click part number link
Choose the desired resource from the drop down menu
REVISION HISTORY
The following table summarizes revisions to this document.
Revision
Date
Description
0
Feb. 2015
 Initial Release of Data Sheet
1
Feb. 2015
 Table 2, Maximum Ratings: added Total Device Dissipation, p. 2
 Table 3, Thermal Characteristics: added CW Thermal Resistance, p. 2
 Added Fig. 11, Narrowband Series Equivalent Source and Load Impedance -- 230 MHz, p. 8
2
Apr. 2015
 Added part number MRFE6VP61K25GN, p. 1
 Added OM--1230G--4L package photo, p. 1, and Mechanical Outline, pp. 18--20
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Freescale Semiconductor, Inc.
21
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E 2015 Freescale Semiconductor, Inc.
MRFE6VP61K25N MRFE6VP61K25GN
Document Number: MRFE6VP61K25N
Rev. 2, 4/2015
22
RF Device Data
Freescale Semiconductor, Inc.