RH1078M - SPEC NO. 05-08-5020

SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
REVISION RECORD
DESCRIPTION
REV
0
A
DATE
INITIAL RELEASE
• PAGE 2, ADDED PARAGRAPHS 3.2.1, 3.2.2, AND 3.2.3.
PARAGRAPH 3.3.b: ADDED “(SEE PARAGRAPH 3.2)”.
• PAGE 3, ADDED PARAGRAPHS 3.8.1, 3.8.2, AND 3.8.3. PARAGRAPH 3.10.3, OPTION
3, REDEFINED. PARAGRAPH 3.12: WAFER LOT ACCEPTANCE REDEFINED.
• PAGE 4, PARAGRAPH 4.4.2, GROUP B INSPECTION WAS REDEFINED.
PARAGRAPH 4.4.3, GROUP D INSPECTION WAS REDEFINED. PARAGRAPH 4.5, SOURCE
INSPECTION, REDEFINED.
• PAGE 6, FIGURES 1, TO5 CASE OUTLINES, ADDED θja AND θjc.
• PAGE 7, FIGURE 2, CERDIP CASE OUTLINES, ADDED θja AND θjc.
• PAGE 8, FIGURE 3, BB FLATPACK CASE OUTLINES, ADDED θja AND θjc.
• PAGE 16, TABLE IA, ELECTRICAL CHARACTERISTICS, (POST-IRRADIATION)
CHANGE AVOL FOR 10K RAD FROM “100V/mV” TO “1000V/mV”. CHANGE VOUT
UNIT FROM “mV” TO “V”.
• PAGE 4, AMENDED PARAGRAPH 4.1 AND 4.1.1 TAKING EXCEPTION TO ANALYSIS
OF CATASTROPHIC FAILURES.
06/14/96
12/01/97
C
•
02/08/99
D
E
• PAGE 6,7,8, FIGURE 1,2,3, CHANGED θJA AND θJC.
• PAGE 3, PARAGRAPH 3.2.1, 3.2.2, 3.2.3 HAD FIGURES 1, 2, AND 3 REMOVED.
• PAGE 4, PARAGRAPH 3.7, CHANGED VERBIAGE FROM “SPECIFIED IN TABLE III TO
“AND AS SPECIFIED IN TABLE III HEREIN”, LINE 2. PARAGRAPH 3.9, ADDED “HEREIN”
AFTER “TABLE II”, LINE 2.
• PAGE 5, PARAGRAPH 4.3, ADDED “HEREIN” AFTER “TABLE III”, LINE 2.
PARAGRAPH 4.4.1, ADDED “HEREIN” AFTER “TABLE III”, LINE 2.
PARAGRAPH 4.4.2.2, CHANGED VERBIAGE IN LINE 1 FROM “ALL FOOTNOTES OF
TABLE IIA OF MIL-STD-883” TO “ALL FOOTNOTES PERTAINING TO TABLE IIA IN
MIL-STD-883”. PARAGRAPH 4.4.3.2, CHANGED VERBIAGE IN LINE 1 FROM “ALL
FOOTNOTES OF TABLE IV OF MIL-STD-883” TO “ALL FOOTNOTES PERTAINING TO
TABLE IV IN MIL-STD-883”.
B
04/08/98
CHANGED OPTION 3 TO RH1078MW (GLASS SEAL FLATPACK 10 LEAD)
09/24/99
01/04/00
REVISION RECORD AND DESCRIPTION CONTINUED ON NEXT PAGE.
CAUTION: ELECTROSTATIC DISCHARGE SENSITIVE PART
REVISION
INDEX
REVISION
INDEX
PAGE NO.
REVISION
PAGE NO.
REVISION
APPLICATION
1
K
18
K
ORIG
DSGN
ENGR
MFG
CM
QA
PROG
FUNCT
2
K
3
K
4
K
5
K
6
K
7
K
8
K
9
K
10
K
11
K
12
K
13
K
14
K
15
K
16
K
17
K
LINEAR TECHNOLOGY CORPORATION
MILPITAS, CALIFORNIA
TITLE:
MICROCIRCUIT, LINEAR, RH1078M,
MICROPOWER, DUAL, SINGLE SUPPLY
PRECISION OP AMP
SIZE
SIGNOFFS
LINEAR TECHNOLOGY CORPORATION
DATE
CAGE CODE
DRAWING NUMBER
REV
64155
05-08-5020
K
CONTRACT:
PAGE 1 OF 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
FOR OFFICIAL USE ONLY
REVISION RECORD
DESCRIPTION
REV
F
G
DATE
•
PAGE 9, CHANGED THETA JA TO θJA=170°C/W AND THETA JC TO θJC=40°C/W
FROM θJA=225°C/W AND θJC=18°C/W PER PACKAGE ENGINEER.
• PAGE 3:
PARAGRAPH 3.2.1 ADDED “OPTION 1”, PARAGRAPH 3.2.2, ADDED “OPTION 2”,
PARAGRAPH 3.2.3, ADDED “OPTION 3”.
09/05/00
05/14/03
• PAGE 4:
PARAGRAPH 3.6, TABLE IA CHANGED TO TABLE II.
PARAGRAPH 3.7, TABLE III CHANGED TO TABLE IV.
PARAGRAPH 3.9, TABLE II CHANGED TO TABLE III.
PARAGRAPH 3.10.3, ADDED “DEVICE OPTIONS 1, 2, AND 3” TO LINE 1.
PARAGRAPH 3.11.1 WAS CHANGED FROM “…dosage rate of approximately 20 Rads per
second” TO “…dosage rate of less than or equal to 10 Rads per second”.
• PAGE 5:
PARAGRAPHS 4.1 THROUGH 4.4.2.1 CHANGES WERE DONE TO CLARIFY GROUP
SAMPLING.
• PAGE 6:
PARAGRAPH 4.4.3 CHANGE WAS DONE TO CLARIFY GROUP SAMPLING.
PARAGRAPHS 4.6.2 THROUGH 4.6.4 WERE RE-WRITTEN. THESE DATA PROVIDED, AND
DATA AVAILABLE.
PARAGRAPH 4.6.10 NOTE, ADDED FURTHER EXPLANATION OF MINIMUM DELIVERED
DATA.
• PAGES 7 THROUGH 17, ALL FIGURE TITLES CHANGED TO HAVE DEVICE OPTIONS
AND PACKAGE TYPES AT TOP OF PAGE, AND HAVE ALL FIGURES AT BOTTOM OF
PAGE.
• PAGE 8:
CASE OUTLINE REVISED. LEAD DIMENSION CHANGED FROM .068 TO 0.065.
• PAGE 9:
CASE OUTLINE UPDATED TO MIL-STD-1835.
•
PAGE 10, MOVED FIGURES TO BETTER FIT THE PAGE.
•
PAGE 11, CORRECTED THE TO5 BURN-IN CIRCUIT’S TJ TO +134°C MAXIMUM, AND
TA TO +125°C.
•
PAGE 12, CORRECTED THE CERDIP BURN-IN CIRCUIT’S TJ TO +134°C MAXIMUM,
AND TA TO +125°C. REPLACED DYNAMIC CIRCUIT WITH STATIC.
•
PAGE 13 REPLACED DYNAMIC ONLY CIRCUIT WITH STATIC / DYNANIC.
H
J
•
•
PAGE 4, CHANGED INITIAL RATE OF RADS TO 240 RADS/SEC.
K
•
•
PAGE 5, CHANGED IN BOTH PARAGRAPHS 4.2, 4.3 IN CONJUNCTION TO 3.3 CHANGED TO
3.4 AND PARAGRAPH 4.3 CHANGED 3.1.1 TO 3.1 AND 3.2.1 TO 3.1.1
PAGE 4, PARAGRAPH 3.10.3 ADDED OPTION 3 IS ALLOY 42 FOR FLATPACK.
03/15/05
10/04/07
PAGE 4 PARAGRAPH 3.10.3 CHANGED OPTION 2 TO ALLOY 42 PACKAGE
REQUIREMENT. PARAGRAPH 3.11.1 CHANGED VERBIAGE.
LINEAR TECHNOLOGY CORPORATION
PAGE 2 of 18
SPEC NO. 05-08-5020 REV. K
1.0
SCOPE:
1.1
2.0
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
This specification defines the performance and test requirements for a microcircuit processed to a space
level manufacturing flow.
APPLICABLE DOCUMENTS:
2.1
Government Specifications and Standards: the following documents listed in the Department of Defense
Index of Specifications and Standards, of the issue in effect on the date of solicitation, form a part of this
specification to the extent specified herein.
SPECIFICATIONS:
2.2
3.0
MIL-PRF-38535
Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-STD-883
Test Method and Procedures for Microcircuits
MIL-STD-1835
Microcircuits Case Outlines
Order of Precedence: In the event of a conflict between the documents referenced herein and the contents
of this specification, the order of precedence shall be this specification, MIL-PRF-38535 and other
referenced specifications.
REQUIREMENTS:
3.1
General Description: This specification details the requirements for the RH1078M, MICROPOWER,
DUAL, SINGLE SUPPLY PRECISION OP AMP, processed to space level manufacturing flow.
3.2
Part Number:
3.3
3.2.1
Option 1 – RH1078MH (TO5 Metal Can, 8 Leads)
3.2.2
Option 2 – RH1078MJ8 (Ceramic Dip, 8 Leads)
3.2.3
Option 3 – RH1078MW (Glass Sealed Flatpack, 10 Leads)
Part Marking Includes:
a.
LTC Logo
b.
LTC Part Number (See Paragraph 3.2)
c.
Date Code
d.
Serial Number
e.
ESD Identifier per MIL-PRF-38535, Appendix A
LINEAR TECHNOLOGY CORPORATION
PAGE 3 of 18
SPEC NO. 05-08-5020 REV. K
3.4
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
The Absolute Maximum Ratings:
. . .
Supply Voltage
Differential Input Voltage
. . .
Input Voltage
.
.
.
.
.
.
.
.
. . . . . . . . . . . . . . +22V
. . . . . . . . . . . . . . +30V
. . . . Equal to Positive Supply Voltage
. . .
. . . . 0.5v Below Negative Supply Voltage
. . . . . . . . . . .
Output Short Circuit Duration
Indefinite
. . . . . . . . . . -55°C to +125°C
Operating Temperature Range
. . . . . . . . . . -65°C to +150°C
Storage Temperature Range
. . . . . . . . . . . +300°C
Lead Temperature (Soldering, 10 sec)
3.5
Electrostatic discharge sensitivity, ESDS, shall be Class 1.
3.6
Electrical Performance Characteristics: The electrical performance characteristics shall be as specified in
Table I and Table II.
3.7
Electrical Test Requirements: Screening requirements shall be in accordance with 4.1 herein,
MIL-STD-883, Method 5004, and as specified in Table IV herein.
3.8
Burn-In Requirement:
3.8.1
Option 1 (TO5): Static Burn-In, Figure 7;
3.8.2
Option 2 (Ceramic Dip): Static Burn-In, Figure 8;
3.8.3
Option 3 (Glass Sealed Flatpack) : Static/Dynamic Burn-In, Figure 9;
3.9
Delta Limit Requirement: Delta limit parameters are specified in Table III herein, are calculated after
each burn-in, and the delta rejects are included in the PDA calculation.
3.10
Design, Construction, and Physical Dimensions: Detail design, construction, physical dimensions, and
electrical requirements shall be specified herein.
3.10.1 Mechanical / Packaging Requirements: Case outlines and dimensions are in accordance with
Figure 1, Figure 2, and Figure 3.
3.10.2 Terminal Connections: The terminal connections shall be as specified in Figure 4, Figure 5, and
Figure 6.
3.10.3 Lead Material and Finish: The lead material and finish for Device Options 1, shall be Kovar and
options 2, 3 are Alloy 42. The lead finishes shall be hot solder dip (Finish letter A) in accordance
with MIL-PRF-38535.
3.11
Radiation Hardness Assurance (RHA):
3.11.1 The manufacturer shall perform a lot sample test as an internal process monitor for total dose
radiation tolerance. The sample test is performed with MIL-STD-883 TM1019 Condition A as a
guideline.
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PAGE 4 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
3.11.2 For guaranteed radiation performance to MIL-STD-883, Method 1019, total dose irradiation, the
manufacturer will provide certified RAD testing and report through an independent test laboratory
when required as a customer purchase order line item.
3.11.3 Total dose bias circuit is specified in Figure 10.
4.0
3.12
Wafer Lot Acceptance: Wafer lot acceptance shall be in accordance with MIL-PRF-38535, Appendix A,
except for the following: Topside glassivation thickness shall be a minimum of 4KÅ.
3.13
Wafer Lot Acceptance Report: SEM is performed per MIL-STD-883, Method 2018 and copies of SEM
photographs shall be supplied with the Wafer Lot Acceptance Report as part of a Space Data Pack when
specified as a customer purchase order line item.
VERIFICATION (QUALITY ASSURANCE PROVISIONS)
4.1
Quality Assurance Provisions: Quality Assurance provisions shall be in accordance with MIL-PRF-38535.
Linear Technology is a QML certified company and all Rad Hard candidates are assembled on qualified
Class S manufacturing lines.
4.2
Sampling and Inspection: Sampling and Inspection shall be in accordance with MIL-STD-883, Method
5005 with QML allowed and TRB approved deviations in conjunction with paragraphs 3.1.1, 3.2.1, and
3.4 of the test method.
4.3
Screening: Screening requirements shall be in accordance with MIL-STD-883, Method 5004 with QML
allowed and TRB approved deviations in conjunction with paragraphs 3.1, 3.1.1, and 3.4 of the test
method. Electrical testing shall be as specified in Table IV herein.
4.3.1
4.4
Analysis of catastrophic (open/short) failures from burn-in will be conducted only when a lot fails
the burn-in or re-burn-in PDA requirements.
Quality Conformance Inspection: Quality conformance inspection shall be in accordance with 4.2 and 4.3
herein and as follows:
4.4.1
Group A Inspection: Group A inspection shall be performed in accordance with 4.1 herein, per
MIL-STD-883, Method 5005, and specified in Table IV herein.
4.4.2
Group B Inspection: When purchased, a full Group B is performed on an inspection lot. As a
minimum, Subgroup B2 (Resistance to Solvents / Mark Permanency) and Subgroup B3
(Solderability) are performed prior to the first shipment from any inspection lot and Attributes
provided when a Full Space Data Pack is ordered. Subgroup B5 (Operating Life) is performed on
each wafer lot. This subgroup may or may not be from devices built in the same package style as
the current inspection lot. Attributes and variables data for this subgroup will be provided upon
request at no charge.
4.4.2.1
Group B, Subgroup 2c = 10%
Group B, Subgroup 3 = 10%
Group B, Subgroup 4 = 5%
4.4.2.2
Group B, Subgroup 5 = *5%
(*per wafer or inspection lot
whichever is the larger quantity)
Group B, Subgroup 6 = 15%
All footnotes pertaining to Table IIa in MIL-STD-883, Method 5005 apply. The
quantity (accept number) of all other subgroups are per MIL-STD-883, Method 5005,
Table IIa.
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PAGE 5 of 18
SPEC NO. 05-08-5020 REV. K
4.4.3
Group D Inspection: When purchased, a full Group D is performed on an inspection lot. As a
minimum, periodic full Group D sampling is performed on each package family for each
assembly location every 26 weeks. A generic Group D Summary is provided when a full Space
Data Pack is ordered.
4.4.3.1 Group D, Subgroups 3, 4 and 5 = 15% each (Sample Size Series).
4.4.3.2
4.5
4.6
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
All footnotes pertaining to Table IV in MIL-STD-883, Method 5005 apply. The
quantity (accept number) or sample number and accept number of all other subgroups
are per MIL-STD-883, Method 5005, Table IV.
Source Inspection:
4.5.1
The manufacturer will coordinate Source Inspection at wafer lot acceptance and pre-seal internal
visual.
4.5.2
The procuring activity has the right to perform source inspection at the supplier’s facility prior to
shipment for each lot of deliverables when specified as a customer purchase order line item. This
may include wafer lot acceptance and final data review.
Deliverable Data: Deliverable data that will ship with devices when a Space Data Pack is ordered:
4.6.1
Lot Serial Number Sheets identifying all devices accepted through final inspection by serial
number.
4.6.2
100% attributes (completed lot specific traveler; includes Group A Summary)
4.6.3
Burn-In Variables Data and Deltas (if applicable)
4.6.4
Group B2, B3, and B5 Attributes (Variables data, if performed on lot shipping)
4.6.5
Generic Group D data (4.4.3 herein)
4.6.6
SEM photographs (3.13 herein)
4.6.7
Wafer Lot Acceptance Report (3.13 herein)
4.6.8
X-Ray Negatives and Radiographic Report
4.6.9
A copy of outside test laboratory radiation report if ordered
4.6.10 Certificate of Conformance certifying that the devices meet all the requirements of this
specification and have successfully completed the mandatory tests and inspections herein.
Note: Items 4.6.1 and 4.6.10 will be delivered as a minimum, with each shipment. This is
noted on the Purchase Order Review Form as “No Charge Data”.
5.0
Packaging Requirements: Packaging shall be in accordance with Appendix A of MIL-PRF-38535. All devices
shall be packaged in conductive material or packaged in anti-static material with an external conductive field
shielding barrier.
LINEAR TECHNOLOGY CORPORATION
PAGE 6 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
DEVICE OPTION # 1
(H) TO5 / 8 LEADS CASE OUTLINE
θja = +150°C/W
θjc = +40°C/W
FIGURE 1
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PAGE 7 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
DEVICE OPTION # 2
(J8) CERAMIC DIP / 8 LEADS CASE OUTLINE
0.045 – 0.065
(1.14 – 1.65)
FULL LEAD
OPTION
NOTE: 1. LEAD DIMENSIONS APPLY TO SOLDER DIP OR TIN PLATE LEADS.
2. 8 LEAD D MAX = .405 (10.287)
θja = +110°C/W
θjc = +30°C/W
FIGURE 2
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PAGE 8 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
DEVICE OPTION # 3
(W10) GLASS SEALED FLATPACK / 10LEADS CASE OUTLINE
NOTE: 1. THIS DIMENSION ALLOWS FOR OFFCENTER LID, MENISCUS AND GLASS OVER RUN.
NOTE: 2. INCREASE DIMENSION BY 0.003 INCH
WHEN LEAD FINISH IS APPLIED (SOLDER DIPPED).
θja = +170°C/W
θjc = +40°C/W
FIGURE 3
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PAGE 9 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
TERMINAL CONNECTIONS
DEVICE OPTION #1, TO5 8 LEAD METAL CAN
DEVICE OPTION #2, 8 LEAD
CERAMIC DIP
FIGURE 4
FIGURE 5
DEVICE OPTION #3, GLASS SEALED
10 LEAD FLATPACK
FIGURE 6
LINEAR TECHNOLOGY CORPORATION
PAGE 10 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
STATIC BURN-IN CIRCUIT
OPTION 1, TO5 METAL CAN / 8 LEADS
FIGURE 7
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PAGE 11 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
STATIC BURN-IN CIRCUIT
OPTION #2, CERDIP / 8 LEADS
FIGURE 8
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PAGE 12 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
STATIC BURN-IN CIRCUIT
OPTION 3, GLASS SEALED FLATPACK / 10 LEAD
FIGURE 9
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PAGE 13 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
TOTAL DOSE BIAS CIRCUIT
FIGURE 10
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PAGE 14 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
TABLE I: ELECTRICAL CHARACTERISTICS (PRE-IRRADIATION)
NOTE: TABLE I IS CONTINUE ON THE FOLLOWING PAGE. NOTES FOR TABLE I ARE
ON THE FOLLOWING PAGE.
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PAGE 15 OF 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
TABLE I: ELECTRICAL CHARACTERISTICS (PRE-IRRADIATION) continued
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PAGE 16 of 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
TABLE II: ELECTRICAL CHARACTERISTICS (POST-IRRADIATION)
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PAGE 17 OF 18
SPEC NO. 05-08-5020 REV. K
RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY PRECISION OP AMP
TABLE III: POST BURN-IN ENDPOINTS AND DELTA LIMIT REQUIREMENTS
TA = 25°C
PARAMETER
VOS
+IB
-IB
ENDPOINT LIMIT
MIN
MAX
-350
350
-15
0
-15
0
DELTA
MIN
-70
-1.5
-1.5
MAX
70
1.5
1.5
UNITS
μV
nA
nA
TABLE IV: ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
FINAL ELECTRICAL TEST REQUIREMENTS (METHOD
5004)
GROUP A TEST REQUIREMENTS (METHOD 5005)
GROUP B AND D FOR CLASS S ENDPOINT ELECTRICAL
PARAMETERS (METHOD 5005)
SUBGROUP
1*, 2, 3, 4, 5, 6
1, 2, 3, 4, 5, 6
1, 2, 3
*PDA APPLIES TO SUBGROUP 1.
PDA TEST NOTE: The PDA is specified as 5% based on failures from Group A, Subgroup 1, tests after cooldown as the
final electrical test in accordance with method 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1 and
delta rejects after burn-in divided by the total number of devices submitted for burn-in in that lot shall be used to determine
the percent for the lot.
LINEAR TECHNOLOGY CORPORATION
PAGE 18 of 18