INTEGRATED CIRCUITS 74F173 Quad D-type flip-flop (3-State) Product specification IC15 Data Handbook 1990 Aug 31 Philips Semiconductors Product specification Quad D-type flip–flop (3-State) 74F173 Data inputs and clock enable inputs are fully edge–triggered and must be stable only one setup time before the low–to–high clock transition. FEATURES • Edge–triggered D–type register • Gated clock enable for hold ”do nothing” mode • 3–state output buffers • Gated output enable control • Speed upgrade of N8T10 and current sink upgrade • Controlled output edges to minimize ground bounces • 48mA sinking capability The master reset (MR) is an active–high asynchronous input. When the MR is high, all four flip–flops are reset (cleared) independently of any other input condition. The 3–state output buffers are controlled by a 2–input NOR gate. When both output enable (OE0 and OE1) inputs are low, the data in the register is presented at the Q output. When one or both OE inputs are high, the outputs are forced to a high impedance ”off” state. DESCRIPTION The 3–state output buffers are completely independent of the register operation; the OE transition does not affect the clock and reset operations. The 74F173 is a high speed 4–bit parallel load register with clock enable control, 3–state buffered outputs, and master reset (MR). When the two clock enable (E0 and E1) inputs are low, the data on the D inputs is loaded into the register simultaneously with low–to–high clock (CP) transition. When one or both enable inputs are high one setup time before the low–to–high clock transition, the register retains the previous data. TYPE TYPICAL fmax TYPICAL SUPPLY CURRENT (TOTAL) 125MHz 23mA 74F173 ORDERING INFORMATION ORDER CODE DESCRIPTION COMMERCIAL RANGE VCC = 5V ±10%, Tamb = 0°C to +70°C PKG DWG # 16–pin plastic DIP N74F173N SOT38-4 16–pin plastic SO N74F173D SOT109-1 INPUT AND OUTPUT LOADING AND FAN OUT TABLE PINS DESCRIPTION 74F (U.L.) HIGH/ LOW LOAD VALUE HIGH/LOW D0 – D3 Data inputs 1.0/1.0 20µA/0.6mA CP Clock input 1.0/1.0 20µA/0.6mA Clock enable inputs 1.0/1.0 20µA/0.6mA Master reset input 1.0/1.0 20µA/0.6mA Output enable inputs 1.0/1.0 20µA/0.6mA Data outputs 750/80 15mA/48mA E0, E1 MR OE0, OE1 Q0 – Q3 Note to input and output loading and fan out table 1. One (1.0) FAST unit load is defined as: 20µA in the high state and 0.6mA in the low state. August 31, 1990 2 853–1160 00286 Philips Semiconductors Product specification Quad D-type flip–flop (3-State) 74F173 PIN CONFIGURATION IEC/IEEE SYMBOL 9 OE0 1 16 V CC OE1 2 15 MR 7 Q0 3 14 D0 1 Q1 4 13 D3 12 D2 Q3 6 11 Q2 CP 7 10 E1 GND 8 C1 & 2 15 Q2 5 & 10 14 9 E0 EN R 3 1D 13 4 12 5 11 6 SF00290 SF00292 LOGIC SYMBOL 14 13 12 11 9 10 E0 E1 7 15 1 CP MR OE0 2 OE1 VCC = Pin 16 GND = Pin 8 D0 D1 D2 D3 Q0 Q1 Q2 Q3 3 4 5 6 SF00291 FUNCTION TABLE INPUTS OUTPUTS OUTPUTS MR CP E0 E1 Dn Qn (register) H X X X X L Reset (clear) L ↑ l l l L Parallel load L ↑ l l h H L X h X X qn Hold (do nothing) L X X h X qn Notes to function table H = High–voltage level h = High state one setup time before the low–to–high clock transition L = Low–voltage level l = Low state one setup time before the low–to–high clock transition qn = Lower case letters indicate the state of the referenced input (or output) on setup time prior to the low–to–high clock transition X = Don’t care ↑ = Low–to–high clock transition August 31, 1990 3 Philips Semiconductors Product specification Quad D-type flip–flop (3-State) 74F173 FUNCTION TABLE INPUTS OUTPUTS Qn (register) OE0 OE1 Qn L L L L H L L H X H X Z H Z X X Notes to function table H = High–voltage level L = Low–voltage level X = Don’t care Z = High impedance ”off” state OUTPUTS Read Disabled LOGIC DIAGRAM D1 D0 E0 E1 9 D3 D2 13 14 11 12 10 7 CP D D Q D CP CP RD Q Q RD D Q CP CP Q RD Q Q RD Q 15 MR OE0 OE1 1 2 4 3 Q1 Q0 VCC = Pin 16 GND = Pin 8 6 5 Q2 Q3 SF00293 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free air temperature range.) SYMBOL PARAMETER RATING UNIT V VCC Supply voltage –0.5 to +7.0 VIN Input voltage –0.5 to +7.0 V IIN Input current –30 to +5 mA VOUT Voltage applied to output in high output state –0.5 to VCC V IOUT Current applied to output in low output state 96 mA Tamb Operating free air temperature range 0 to +70 °C Tstg Storage temperature range –65 to +150 °C August 31, 1990 4 Philips Semiconductors Product specification Quad D-type flip–flop (3-State) 74F173 RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT MIN NOM MAX 5.0 5.5 VCC Supply voltage 4.5 VIH High–level input voltage 2.0 V VIL Low–level input voltage 0.8 V IIk Input clamp current –18 mA IOH High–level output current –15 mA IOL Low–level output current 48 mA Tamb Operating free air temperature range +70 °C V 0 DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) PARAMETER SYMBOL TEST LIMITS CONDITIONS1 VOH High-level output voltage MIN VCC = MIN, VIL = MAX, ±10%VCC 2.4 VIH = MIN, IOH = MAX ±5%VCC 2.7 VCC = MIN, VIL = MAX, ±10%VCC 2.0 VIH = MIN, IOH = –15mA ±5%VCC 2.0 VCC = MIN, VIL = MAX, ±10%VCC VIH = MIN, IOL = MAX ±5%VCC VOL Low-level output voltage VIK Input clamp voltage VCC = MIN, II = IIK II Input current at maximum input voltage IIH High–level input current IIL TYP2 UNIT MAX V 3.4 V V 3.1 V 0.35 0.50 V 0.35 0.50 V –0.73 -1.2 V VCC = MAX, VI = 7.0V 100 µA VCC = MAX, VI = 2.7V 20 µA Low–level input current VCC = MAX, VI = 0.5V –0.6 mA IOZH Off–state output current, high–level voltage applied VCC = MAX, VO = 2.7V 50 µA IOZL Off–state output current, low–level voltage applied VCC = MAX, VO = 0.5V –50 µA IOS Short–circuit output current3 VCC = MAX -150 mA 19 26 mA 27 37 mA 23 32 ICCH ICC Supply current (total) ICCL VCC = MAX ICCZ -60 mA Notes to DC electrical characteristics 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. August 31, 1990 5 Philips Semiconductors Product specification Quad D-type flip–flop (3-State) 74F173 AC ELECTRICAL CHARACTERISTICS LIMITS Tamb = +25°C SYMBOL PARAMETER TEST CONDITION Tamb = 0°C to +70°C VCC = +5.0V CL = 50pF, RL = 500Ω MIN TYP VCC = +5.0V ± 10% CL = 50pF, RL = 500Ω MAX MIN UNIT MAX fmax Maximum clock frequency Waveform 1 100 125 90 MHz tPLH tPHL Propagation delay CP to Qn Waveform 1 4.5 6.0 6.5 8.0 9.0 10.5 4.0 5.5 10.0 11.5 ns tPHL Propagation delay MR to Qn Waveform 2 6.5 8.5 11.5 6.0 12.5 ns tPZH tPZL Output enable time to high or low level Waveform 4 Waveform 5 3.5 5.5 5.0 7.0 8.0 10.0 2.5 4.5 8.5 11.0 ns tPHZ tPLZ Output disable time from high or low level Waveform 4 Waveform 5 1.5 3.0 3.5 5.0 7.0 8.5 1.0 2.5 8.0 9.0 ns tTHL tTLH Transition time 10% to 90%, 90% to 10% Waveform 5 Waveform 4 2.0 4.0 5.0 7.5 8.0 10.0 2.0 4.0 8.5 11.0 ns AC SETUP REQUIREMENTS LIMITS Tamb = +25°C SYMBOL PARAMETER TEST CONDITION VCC = +5.0V CL = 50pF, RL = 500Ω MIN tsu (H) tsu (L) Setup time, high or low level Dn to CP th (H) th (L) TYP MAX Tamb = 0°C to +70°C VCC = +5.0V ± 10% CL= 50pF, RL = 500Ω MIN UNIT MAX Waveform 3 2.5 2.5 3.0 4.0 ns Hold time, high or low level Dn to CP Waveform 3 0 0 0 0 ns tsu (H) tsu (L) Setup time, high or low level E to CP Waveform 3 4.5 7.5 5.0 8.5 ns th (H) th (L) Hold time, high or low level E to CP Waveform 3 0 0 0 0 ns tw (H) tw (L) CP Pulse width, high or low Waveform 1 3.0 6.0 3.0 6.0 ns tw (H) MR Pulse width, high Waveform 2 3.5 3.5 ns trec Recovery time, MR to CP Waveform 2 4.5 5.5 ns AC WAVEFORMS 1/fmax CP VM VM VM tw(H) tPHL Qn tw(L) VM tPLH VM SF00294 Waveform 1. Propagation delay for clock input to output, clock pulse widths, and maximum clock frequency August 31, 1990 6 Philips Semiconductors Product specification Quad D-type flip–flop (3-State) MR VM 74F173 OE VM trec tw(H) CP VM VM tPZH tPHZ 90% VM Qn VM VOH -0.3V 10% 0V tPHL SF00297 VM VM Qn Waveform 4. 3-state output enable time to high level, output disable time from high level and transition time to high level SF00295 OE Waveform 2. Master reset pulse width, master reset to output delay and master reset to clock recovery time VM VM tPZL tPLZ 90% En, Dn VM tsu(H) VM VM tsu(L) th(H) Qn VM 3.5V VM 10% VOL +0.3V th(L) SF00298 CP VM VM Waveform 5. 3-state output enable time to low level, output disable time from low level and transition time to low level SF00296 Waveform 3. Data and enable setup time and hold times Notes to AC waveforms 1. For all waveforms, VM = 1.5V. 2. The shaded areas indicate when the input is permitted to change for predictable output performance. TEST CIRCUIT AND WAVEFORMS VCC 7.0V VIN RL VOUT PULSE GENERATOR tw 90% NEGATIVE PULSE VM CL AMP (V) VM 10% D.U.T. RT 90% 10% tTHL (tf ) tTLH (tr ) tTLH (tr ) tTHL (tf ) 0V RL AMP (V) 90% 90% Test Circuit for Open Collector Outputs POSITIVE PULSE VM VM 10% TEST tPLZ tPZL All other SWITCH closed closed open DEFINITIONS: RL = Load resistor; see AC electrical characteristics for value. CL = Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value. RT = Termination resistance should be equal to ZOUT of pulse generators. 10% tw SWITCH POSITION 0V Input Pulse Definition INPUT PULSE REQUIREMENTS family amplitude VM 74F 3.0V 1.5V rep. rate tw tTLH tTHL 1MHz 500ns 2.5ns 2.5ns SF00128 August 31, 1990 7 Philips Semiconductors Product specification Quad D-type flip-flop (3-State) 74F173 DIP16: plastic dual in-line package; 16 leads (300 mil) 1990 Aug 31 8 SOT38-4 Philips Semiconductors Product specification Quad D-type flip-flop (3-State) 74F173 SO16: plastic small outline package; 16 leads; body width 3.9 mm 1990 Aug 31 9 SOT109-1 Philips Semiconductors Product specification Quad D-type flip-flop (3-State) 74F173 Data sheet status Data sheet status Product status Definition [1] Objective specification Development This data sheet contains the design target or goal specifications for product development. Specification may change in any manner without notice. Preliminary specification Qualification This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips Semiconductors reserves the right to make chages at any time without notice in order to improve design and supply the best possible product. Product specification Production This data sheet contains final specifications. Philips Semiconductors reserves the right to make changes at any time without notice in order to improve design and supply the best possible product. [1] Please consult the most recently issued datasheet before initiating or completing a design. Definitions Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see the relevant data sheet or data handbook. Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or modification. Disclaimers Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application. Right to make changes — Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless otherwise specified. Copyright Philips Electronics North America Corporation 1998 All rights reserved. Printed in U.S.A. Philips Semiconductors 811 East Arques Avenue P.O. Box 3409 Sunnyvale, California 94088–3409 Telephone 800-234-7381 print code Document order number: yyyy mmm dd 10 Date of release: 10-98 9397-750-05088