CY62148DV30 4-Mbit (512 K x 8) MoBL Static RAM Datasheet.pdf


CY62148DV30
4-Mbit (512 K × 8) MoBL® Static RAM
4-Mbit (512 K × 8) MoBL® Static RAM
Features
■
Temperature Ranges
❐ Industrial: –40 °C to 85 °C
■
Very high speed: 55 ns
❐
Functional Description
Wide voltage range: 2.20 V–3.60 V
■
Pin-compatible with CY62148CV25, CY62148CV30 and
CY62148CV33
■
Ultra low active power
❐
❐
The CY62148DV30 [1] is a high-performance CMOS static RAM
organized as 512K words by 8 bits. This device features
advanced circuit design to provide ultra-low active current. This
is ideal for providing More Battery Life™ (MoBL) in portable
applications such as cellular telephones. The device also has an
automatic power-down feature that significantly reduces power
consumption. The device can be put into standby mode reducing
power consumption when deselected (CE HIGH).The eight input
and output pins (I/O0 through I/O7) are placed in a
high-impedance state when:
Typical active current: 1.5 mA at f = 1 MHz
Typical active current: 8 mA at f = fmax (55-ns speed)
■
Ultra low standby power
■
Deselected (CE HIGH)
■
Easy memory expansion with CE, and OE features
■
Outputs are disabled (OE HIGH)
■
Automatic power-down when deselected
■
When the write operation is active(CE LOW and WE LOW)
■
Complementary metal oxide semiconductor (CMOS) for
optimum speed/power
■
Available in Pb-free 32-pin Small-outline integrated circuit
(SOIC package)
Write to the device by taking Chip Enable (CE) and Write Enable
(WE) inputs LOW. Data on the eight I/O pins (I/O0 through I/O7)
is then written into the location specified on the address pins (A0
through A18).
Read from the device by taking Chip Enable (CE) and Output
Enable (OE) LOW while forcing Write Enable (WE) HIGH. Under
these conditions, the contents of the memory location specified
by the address pins will appear on the I/O pins.
For a complete list of related documentation, click here.
Logic Block Diagram
I/O0
Data in Drivers
I/O1
512K x 8
ARRAY
I/O2
SENSE AMPS
ROW DECODER
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
A10
A11
A12
I/O3
I/O4
I/O5
COLUMN
DECODER
CE
I/O6
POWER
DOWN
I/O7
A13
A14
A15
A16
A17
A18
WE
OE
Note
1. For best practice recommendations, refer to the Cypress application note “System Design Guidelines” on http://www.cypress.com.
Cypress Semiconductor Corporation
Document Number: 38-05341 Rev. *I
•
198 Champion Court
•
San Jose, CA 95134-1709
• 408-943-2600
Page 1 of 15
CY62148DV30
Contents
Pin Configuration ............................................................. 3
Product Portfolio .............................................................. 3
Maximum Ratings ............................................................. 4
Operating Range ............................................................... 4
Electrical Characteristics ................................................. 4
Capacitance ...................................................................... 5
Thermal Resistance .......................................................... 5
AC Test Loads and Waveforms ....................................... 5
Data Retention Characteristics ....................................... 6
Data Retention Waveform ................................................ 6
Switching Characteristics ................................................ 7
Switching Waveforms ...................................................... 8
Truth Table ...................................................................... 11
Document Number: 38-05341 Rev. *I
Ordering Information ...................................................... 11
Ordering Code Definitions ......................................... 11
Package Diagrams .......................................................... 12
Acronyms ........................................................................ 13
Document Conventions ................................................. 13
Units of Measure ....................................................... 13
Document History Page ................................................. 14
Sales, Solutions, and Legal Information ...................... 15
Worldwide Sales and Design Support ....................... 15
Products .................................................................... 15
PSoC® Solutions ...................................................... 15
Cypress Developer Community ................................. 15
Technical Support ..................................................... 15
Page 2 of 15
CY62148DV30
Pin Configuration
Figure 1. 32-pin SOIC pinout
Top View
A17
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
VSS
4
32
31
30
29
5
6
28
27
7
8
9
10
11
12
26
25
1
2
3
13
14
15
16
24
23
22
21
20
19
18
17
VCC
A15
A18
WE
A13
A8
A9
A11
OE
A10
CE
I/O7
I/O6
I/O 5
I/O4
I/O3
Product Portfolio
Power Dissipation
Product
VCC Range (V)
Range
CY62148DV30LL Industrial
Speed
(ns)
Min
Typ[2]
Max
2.2
3.0
3.6
55
Operating ICC (mA)
f = 1 MHz
f = fmax
Standby ISB2 (A)
Typ[2]
Max
Typ[2]
Max
Typ[2]
Max
1.5
3
8
10
2
8
Note
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
Document Number: 38-05341 Rev. *I
Page 3 of 15
CY62148DV30
DC input voltage [3, 4] ...................–0.3 V to VCC(max) + 0.3 V
Maximum Ratings
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage temperature ................................ –65 °C to +150 °C
Ambient temperature 
with power applied ..................................... 55 °C to +125 °C
Supply voltage 
to ground potential [3, 4] ...............–0.3 V to VCC(max) + 0.3 V
DC voltage applied to outputs 
in High Z state [3, 4] ......................–0.3 V to VCC(max) + 0.3 V
Output current into outputs (LOW) ............................. 20 mA
Static discharge voltage 
(per MIL-STD-883, method 3015) ......................... > 2001 V
Latch-up current .................................................... > 200 mA
Operating Range
Product
Range
Ambient
Temperature
VCC[5]
CY62148DV30LL
Industrial
–40 °C to +85 °C
2.2 V to
3.6 V
Electrical Characteristics
Over the Operating Range
Parameter
VOH
VOL
VIH
VIL
Description
Output HIGH voltage
Output LOW voltage
Input HIGH voltage
Input LOW voltage
Test Conditions
55 ns
Min
Typ [2]
Max
Unit
IOH = –0.1 mA
VCC = 2.20 V
2.0
–
–
V
IOH = –1.0 mA
VCC = 2.70 V
2.4
–
–
V
IOL = 0.1 mA
VCC = 2.20 V
–
–
0.4
V
IOL = 2.1 mA
VCC = 2.70 V
–
–
0.4
V
VCC = 2.2 V to 2.7 V
1.8
–
VCC + 0.3
V
VCC = 2.7 V to 3.6 V
2.2
–
VCC + 0.3
V
VCC = 2.2 V to 2.7 V
–0.3
–
0.6
V
VCC = 2.7 V to 3.6 V
–0.3
–
0.8
V
IIX
Input leakage current
GND < VI < VCC
–1
–
+1
A
IOZ
Output leakage current
GND < VO < VCC, output disabled
–1
–
+1
A
ICC
VCC operating supply current
8
10
mA
–
1.5
3
mA
f = fmax = 1/tRC
f = 1 MHz
VCC = VCC(max)
IOUT = 0 mA
CMOS levels
ISB1
Automatic CE Power-down
current – CMOS inputs
CE > VCC0.2 V, 
VIN > VCC – 0.2 V, VIN < 0.2 V), 
f = fmax (address and data only), 
f = 0 (OE, and WE), VCC = 3.60 V
–
2
8
A
ISB2
Automatic CE Power-down
current – CMOS inputs
CE > VCC – 0.2 V,
VIN > VCC – 0.2 V or VIN < 0.2 V, 
f = 0, VCC = 3.60 V
–
2
8
A
Notes
3. VIL(min) = –2.0 V for pulse durations less than 20 ns.
4. VIH(max) = VCC+0.75 V for pulse durations less than 20 ns.
5. Full device AC operation assumes a 100 s ramp time from 0 to VCC(min) and 200 s wait time after VCC stabilization.
Document Number: 38-05341 Rev. *I
Page 4 of 15
CY62148DV30
Capacitance
Parameter [7]
Description
CIN
Input capacitance
COUT
Output capacitance
Test Conditions
Max
Unit
10
pF
10
pF
Test Conditions
SOIC
Unit
Still air, soldered on a 3 x 4.5 inch, four-layer printed circuit
board
55
C/W
22
C/W
TA = 25 °C, f = 1 MHz, VCC = VCC(typ)
Thermal Resistance
Parameter [7]
Description
JA
Thermal resistance 
(junction to ambient)
JC
Thermal resistance 
(junction to case)
AC Test Loads and Waveforms
Figure 2. AC Test Loads and Waveforms
R1
ALL INPUT PULSES
VCC
VCC
OUTPUT
50 pF
GND
R2
90%
10%
90%
10%
Fall time: 1 V/ns
Rise Time: 1 V/ns
INCLUDING
JIG AND
SCOPE
Equivalent to:
THÉVENIN EQUIVALENT
RTH
OUTPUT
VTH
Parameters
2.5 V (2.2 V – 2.7 V)
3.0 V (2.7 V – 3.6 V)
Unit
R1
16667
1103

R2
15385
1554

RTH
8000
645

VTH
1.20
1.75
V
Document Number: 38-05341 Rev. *I
Page 5 of 15
CY62148DV30
Data Retention Characteristics
Over the Operating Range
Parameter
Description
Conditions
Min
Typ [6]
Max
Unit
1.5
–
–
V
6
A
VDR
VCC for data retention
ICCDR
Data retention current
tCDR[7]
Chip deselect to data retention
time
0
–
–
ns
tR[8]
Operation recovery time
55
–
–
ns
VCC = 1.5 V, CE > VCC 0.2 V, 

VIN > VCC 0.2 V or VIN < 0.2 V
–
Data Retention Waveform
Figure 3. Data Retention Waveform
DATA RETENTION MODE
VCC
1.5 V
tCDR
VDR > 1.5 V
1.5 V
tR
CE
Notes
6. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at VCC = VCC(typ), TA = 25 °C.
7. Tested initially and after any design or process changes that may affect these parameters.
8. Full Device AC operation requires linear VCC ramp from VDR to VCC(min) > 100 s or stable at VCC(min)  100 s.
Document Number: 38-05341 Rev. *I
Page 6 of 15
CY62148DV30
Switching Characteristics
Over the Operating Range
Parameter [9]
Description
55 ns
Min
Max
Unit
Read Cycle
tRC
Read cycle time
55
–
ns
tAA
Address to data valid
–
55
ns
tOHA
Data hold from address change
10
–
ns
tACE
CE LOW to data valid
–
55
ns
tDOE
OE LOW to data valid
–
25
ns
[10]
5
–
ns
–
20
ns
tLZOE
tHZOE
OE LOW to Low Z
OE HIGH to High Z
[10, 11]
[10]
tLZCE
CE LOW to Low Z
10
–
ns
tHZCE
CE HIGH to High Z [10, 11]
–
20
ns
tPU
CE LOW to power-up
0
–
ns
CE HIGH to power-up
–
55
ns
tPD
Write Cycle
[12, 13]
tWC
Write cycle time
55
–
ns
tSCE
CE LOW to write end
40
–
ns
tAW
Address set-up to write end
40
–
ns
tHA
Address hold from write end
0
–
ns
tSA
Address set-up to write start
0
–
ns
tPWE
WE pulse width
40
–
ns
tSD
Data set-up to write end
25
–
ns
tHD
Data hold from write end
0
–
ns
tHZWE
WE LOW to High Z [10, 11]
–
20
ns
10
–
ns
tLZWE
WE HIGH to Low Z
[10]
Notes
9. Test Conditions for all parameters other than three-state parameters assume signal transition time of 3 ns or less (1 V/ns), timing reference levels of VCC(typ)/2,
input pulse levels of 0 to VCC(typ), and output loading of the specified IOL/IOH as shown in the Figure 2 on page 5.
10. At any given temperature and voltage condition, tHZCE is less than tLZCE, tHZOE is less than tLZOE, and tHZWE is less than tLZWE for any given device.
11. tHZOE, tHZCE, and tHZWE transitions are measured when the output enter a high impedance state.
12. The internal write time of the memory is defined by the overlap of WE, CE = VIL. All signals must be ACTIVE to initiate a write and any of these signals can terminate
a write by going INACTIVE. The data input set-up and hold timing should be referenced to the edge of the signal that terminates the write.
13. The minimum write cycle pulse width for Write Cycle No. 3 (WE controlled, OE LOW) should be equal to the sum of tSD and tHZWE.
Document Number: 38-05341 Rev. *I
Page 7 of 15
CY62148DV30
Switching Waveforms
Figure 4. Read Cycle No. 1 (Address Transition Controlled) [14, 15]
tRC
ADDRESS
tOHA
DATA OUT
tAA
PREVIOUS DATA VALID
DATA VALID
Figure 5. Read Cycle No. 2 (OE Controlled) [15, 16]
ADDRESS
tRC
CE
tACE
OE
DATA OUT
tDOE
tLZOE
HIGH IMPEDANCE
tLZCE
VCC
SUPPLY
CURRENT
tHZOE
tHZCE
HIGH
IMPEDANCE
DATA VALID
tPD
tPU
50%
50%
ICC
ISB
Notes
14. Device is continuously selected. OE, CE = VIL.
15. WE is HIGH for read cycle.
16. Address valid prior to or coincident with CE transition LOW.
Document Number: 38-05341 Rev. *I
Page 8 of 15
CY62148DV30
Switching Waveforms (continued)
Figure 6. Write Cycle No. 1 (WE Controlled) [17, 18]
tWC
ADDRESS
tSCE
CE
tAW
tSA
WE
tHA
tPWE
OE
tSD
DATA I/O
NOTE 19
tHD
DATAIN VALID
tHZOE
Notes
17. Data I/O is high impedance if OE = VIH.
18. If CE goes HIGH simultaneously with WE HIGH, the output remains in high-impedance state.
19. During this period, the I/Os are in output state and input signals should not be applied.
Document Number: 38-05341 Rev. *I
Page 9 of 15
CY62148DV30
Switching Waveforms (continued)
Figure 7. Write Cycle No. 2 (CE Controlled) [20, 21]
tWC
ADDRESS
tSCE
CE
tHA
tSA
tAW
tPWE
WE
OE
tSD
DATA I/O
tHD
DATAIN VALID
Figure 8. Write Cycle No. 3 (WE Controlled, OE LOW) [21, 22]
tWC
ADDRESS
tSCE
CE
tAW
WE
tHA
tSA
tPWE
tSD
DATA I/O
NOTE 23
tHD
DATAIN VALID
tHZWE
tLZWE
Notes
20. Data I/O is high impedance if OE = VIH.
21. If CE goes HIGH simultaneously with WE HIGH, the output remains in high-impedance state.
22. The minimum write cycle pulse width should be equal to the sum of tSD and tHZWE.
23. During this period, the I/Os are in output state and input signals should not be applied.
Document Number: 38-05341 Rev. *I
Page 10 of 15
CY62148DV30
Truth Table
CE
WE
OE
Inputs/Outputs
Mode
Power
H
X
X
High Z
Deselect/Power-down
Standby (ISB)
L
H
L
Data out (I/O0-I/O7)
Read
Active (ICC)
L
H
H
High Z
Output disabled
Active (Icc)
L
L
X
Data in (I/O0-I/O7)
Write
Active (Icc)
Ordering Information
Speed
(ns)
55
Ordering Code
CY62148DV30LL-55SXI
Package
Diagram
Package Type
51-85081 32-pin SOIC (Pb-free)
Operating
Range
Industrial
Contact your local Cypress sales representative for availability of these parts.
Ordering Code Definitions
CY 621 4
8
D V30 LL - 55
S
X
I
Temperature Grade: I = Industrial
Pb-free
Package Type: S = 32 pin SOIC
Speed Grade: 55 ns
LL = Low Power
Voltage Range = 3 V typical
Process Technology: D = 130 nm
Bus Width: 8 = × 8
Density: 4 = 4-Mbit
Family Code: 621 = MoBL SRAM family
Company ID: CY = Cypress
Document Number: 38-05341 Rev. *I
Page 11 of 15
CY62148DV30
Package Diagrams
Figure 9. 32-pin SOIC (450 Mils) Package Outline, 51-85081
51-85081 *E
Document Number: 38-05341 Rev. *I
Page 12 of 15
CY62148DV30
Acronyms
Acronym
Document Conventions
Description
Units of Measure
CMOS
Complementary Metal Oxide Semiconductor
I/O
Input/Output
°C
degree Celsius
MoBL
More Battery Life
MHz
megahertz
SOIC
Small-Outline Integrated Circuit
µA
microampere
SRAM
Static Random Access Memory
mA
milliampere
ns
nanosecond
pF
picofarad
V
volt
W
watt
Document Number: 38-05341 Rev. *I
Symbol
Unit of Measure
Page 13 of 15
CY62148DV30
Document History Page
Document Title: CY62148DV30, 4-Mbit (512 K × 8) MoBL® Static RAM
Document Number: 38-05341
Rev.
ECN No.
Issue Date
Orig. of
Change
**
127480
06/17/03
HRT
Description of Change
Created new data sheet
*A
131041
01/23/04
CBD
Changed from Advance to Preliminary
*B
222180
See ECN
AJU
Changed from Preliminary to Final
Added 70 ns speed bin
Modified footnote #6 and #12
Removed MAX value for VDR on “Data Retention Characteristics” table
Modified input and output capacitance values
Added Pb-free ordering information
Removed 32-pin STSOP package
*C
498575
See ECN
NXR
Added Automotive-A Operating Range
Removed SOIC package from Product Offering
Updated Ordering Information Table
*D
729917
See ECN
VKN
Added SOIC package and its related information
Updated Ordering Information Table
*E
2896036
03/19/10
AJU
Added Table of Contents.
Removed inactive parts from Ordering Information.
Updated Packaging Information
Updated links in Sales, Solutions, and Legal Information.
*F
3166059
02/08/2011
RAME
Removed Automotive related info
Removed 70 ns speed bin related info
Remove TSOP and VFBGA package related info
Added Ordering Code Definitions.
Added Acronyms and Units of Measure.
Updated to new template.
*G
4315741
03/20/2014
VINI
Updated Package Diagrams:
spec 51-85081 – Changed revision from *C to *E.
Updated to new template.
Completing Sunset Review.
*H
4576406
01/16/2015
VINI
Added related documentation hyperlink in page 1.
Updated Switching Characteristics:
Added Note 13 and referred the same note in “Write Cycle”.
Updated Switching Waveforms:
Added Note 22 and referred the same note in Figure 8.
*I
4702987
03/27/2015
VINI
Updated Maximum Ratings:
Referred Notes 3, 4 in “Supply voltage to ground potential”.
Completing Sunset Review.
Document Number: 38-05341 Rev. *I
Page 14 of 15
CY62148DV30
Sales, Solutions, and Legal Information
Worldwide Sales and Design Support
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office
closest to you, visit us at Cypress Locations.
PSoC® Solutions
Products
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cypress.com/go/automotive
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Lighting & Power Control
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cypress.com/go/powerpsoc
cypress.com/go/memory
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cypress.com/go/psoc
Touch Sensing
cypress.com/go/touch
USB Controllers
Wireless/RF
psoc.cypress.com/solutions
PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP
Cypress Developer Community
Community | Forums | Blogs | Video | Training
Technical Support
cypress.com/go/support
cypress.com/go/USB
cypress.com/go/wireless
© Cypress Semiconductor Corporation, 2003-2015. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems
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Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer
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Use may be limited by and subject to the applicable Cypress software license agreement.
Document Number: 38-05341 Rev. *I
Revised March 27, 2015
Page 15 of 15
MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor. All product and company names mentioned in this document may be the trademarks of their respective
holders.