CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT QUARTER 4, 1998 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 STANDARD STRESS TEST DESCRIPTIONS TEST DESCRIPTION HTOL HTOL2 HTSSL HTSSL2 DRET DRET2 PCT HAST TC TC2 HTS High Temp Op Life, 150ºC, Dynamic 115% Vcc Nominal High Temp Op Life, 125ºC, Dynamic 115% Vcc Nominal High Temp Steady State Life, 150ºC, Static 115% Vcc Nominal High Temp Steady State Life, 125ºC, Static 115% Vcc Nominal Data Retension Test, Data Bake 165ºC, Plastic Data Retension Test, Data Bake 250ºC, Hermetic Pressure Cooker Test, 121ºC, 100%RH, No Bias Hi-Accel Saturation Test, 140ºC, 85%RH, Static 100% Vcc Nominal Temp Cycle, 125ºC to -40ºC Temp Cycle, 150ºC to -65ºC High Temp Storage, 165ºC, No Bias Page 2 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 WAFER FAB AREAS FAB # LOCATION CA TX MN FR San Jose, California Round Rock, Texas Bloomington, Minnesota MHS, France ASSEMBLY LOCATION ID COMPANY/LOCATION KOREA-A ASAT-B USA-C PHIL-D USA-E INDNS-F TAIWAN-G KOREA-H MALAY-J THLAND-K KOREA-L PHIL-M USA-N INDNS-O USA-P KOREA-Q PHIL-R USA-S TAIWAN-T MALAY-U USA-V USA-W ALPHA-X ALPHA-Y THLAND-Z Anam-Buchon/Korea Asat/Hongkong Cypress/USA Dynesem/Philippines Cypress-Minnesota/USA Astra/Indonesia ASE/Taiwan Hyundai/Korea ASE/Malaysia TMS/Thailand Anam-Seoul/Korea Anam/Philippines Express/USA Omedata/Indonesia Pantronix/USA Anam-Bupyong/Korea Cypress/Philippines ATM/USA OSE/Taiwan Unisem/Malaysia Aplus/USA Toshiba/USA Cypress Bangkok/Thailand Alphatech/Thailand Hana/Thailand Page 3 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 DESCRIPTION OF DATA TABLE COLUMN HEADINGS COLUMN HEADING DESCRIPTION OF COLUMN CONTENTS Division Test Test Condition Device ID Date Code Lot Number Function Description Technology Process Pkg Material Pkg Type Pkg Location # Pins Duration # Test # Failed Fail Mode Cypress Manufacturing Division Common code for the stress performed. See table on previous page for detail. Tem/humidity/bias condition for the stress. See table on previous for detail Cypress part number Week in which specific lot was marked/sealed/molded. Manufacturing (assembly) lot number Generic product family at Cypress Brief description of device function Fabrication process technology. Generic fabrication process Generic packaging material Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package). Country Location + Initial of assembly house (see table on prvious page for detail). Pin cont of package in which device is assembled. Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours. Quantity of devices submitted to this stress/test. Quantity of devices failing at this specific readpoint. Failure analysis results from this test, if any. Page 4 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 RELIABILITY DATA SUMMARY (Q498) * Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition. Page 5 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 RELIABILITY DATA SUMMARY (Q498) Page 6 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- BICMOS-SM1 CY7B991-JC HAST 130C/4.5V DCD CHNL M83025 9818 219803361 PSCB BiCMOS TX PLCC ALPHA-X No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------32 128 76 4 4 Open- Bond Lift 140C/4.5V DCD CHNL CY7B991-JC M84019 9838 219806615 PSCB BiCMOS TX PLCC ALPHA-X 32 128 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V DCD CHNL CY7B991-JC M82053 9807 219800993 PSCB BiCMOS TX PLCC ALPHA-X 32 M83015 9818 219803361 PSCB BiCMOS TX PLCC ALPHA-X 32 M82026 9807 219800993 PSCB BiCMOS TX PLCC ALPHA-X 32 500 1000 2000 115 114 111 0 0 1 EOS 0 3 EOS 500 120 0 1000 120 0 2000 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5 DCD CHNL CY7B991-JC 96 114 0 1 EOS 500 115 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD CHNL CY7B991-JC M84017 9838 219806615 PSCB BiCMOS TX PLCC ALPHA-X 32 168 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C DCD CHNL CY7B991-JC M84018 9838 219806615 PSCB BiCMOS TX PLCC ALPHA-X 32 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 7 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- FAMOS-E3 CY37256P160-AC HAST 130C/5.5V PLD 37K No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 98415 9840 619811133 256 MCEL CMOS TW TQFP TAIWAN-G 160 128 128 20 29 0 0 CY37256P256-BGC 98193 9825 619805724 256 MCEL CMOS TW BGA 128 45 0 TAIWAN-G 292 140C/5.5V PLD 37K CY37256P256-BGC 98193 9828 619807607 256 MCEL CMOS TW BGA TAIWAN-G 292 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/-55C PLD 37K CY37256P256-BGC 98193 9828 619807607 256 MCEL CMOS TW BGA TAIWAN-G 292 48 250 0 150C/5.75 PLD 37K CY37256VP160-AC 98423 9838 619810670 256 MCEL CMOS TW TQFP KOREA-Q 160 108 76 0 150C/5.75V PLD 37K CY37256P256-BGC 98193 9825 619805724 256 MCEL CMOS TW BGA TAIWAN-G 292 48 80 500 250 76 76 0 0 0 9828 619807607 256 MCEL CMOS TW BGA TAIWAN-G 292 98415 9840 619811133 256 MCEL CMOS TW TQFP TAIWAN-G 160 CY37256P256-BGC 98193 9825 619805724 256 MCEL CMOS TW BGA 80 76 0 500 76 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS PLD 37K CY37256P160-AC 336 48 0 TAIWAN-G 292 336 45 0 1000 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.75V PLD 37K CY37256VP160-AC 98423 9838 619810670 256 MCEL CMOS TW TQFP KOREA-Q 160 168 76 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C PLD 37K CY37256P160-AC 98415 9840 619811133 256 MCEL CMOS TW TQFP TAIWAN-G 160 100 200 48 48 0 0 CY37256P256-BGC 98193 9828 619807607 256 MCEL CMOS TW BGA CY37256P160-AC 9840 619811133 256 MCEL CMOS TW TQFP TAIWAN-G 160 300 48 0 619811134 256 MCEL CMOS TW TQFP TAIWAN-G 160 300 48 0 100 45 0 200 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C PLD 37K 98415 CY37256P256-BGC 98193 TAIWAN-G 292 619811135 256 MCEL CMOS TW TQFP TAIWAN-G 160 300 48 0 9825 619805724 256 MCEL CMOS TW BGA TAIWAN-G 292 300 45 0 9828 619807607 256 MCEL CMOS TW BGA TAIWAN-G 292 300 45 0 Page 8 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FAMOS-E3 TC2 -65C TO 150C PLD 37K CY37256VP256-BG 98193 9830 619807496 256 MCEL CMOS TW BGA TAIWAN-G 292 300 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 9 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- FAMOS-P20 CY7C344-HMB HTOL 140C/5.75V PLD MAX 98153 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 9815 219802900P REPROG.PAL CMOS TX CERQ ALPHA-X 28 72 213 0 219802901P REPROG.PAL CMOS TX CERQ ALPHA-X 28 72 211 0 9818 219803380P REPROG.PAL CMOS TX CERQ ALPHA-X 28 72 206 0 6 EOS CY7C344-JC 98241 9838 219806567 REPROG.PAL CMOS TX PLCC ALPHA-X 28 72 1408 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V PLD MAX CY7C341-JC M84034 9843 619812107 REPROG.PAL CMOS TX PLCC KOREA-A 84 96 83 0 M84037 9843 619812108 REPROG.PAL CMOS TX PLCC KOREA-A 84 96 96 40 135 0 0 125C/5/75 PLD MAX CY7C341-JC M82032 9814 619803505 REPROG.PAL CMOS TX PLCC KOREA-A 84 96 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH PLD MAX CY7C341-JC M84035 9843 619812107 REPROG.PAL CMOS TX PLCC KOREA-A 84 168 83 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 10 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FAMOS-P26 HTOL2 125C/5.75V MPD PROM CY27C010-PC M82010 9747 619709651 128K x 8 CMOS TX PDIP KOREA-H 32 96 499 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 11 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- FLASH-FL24D TC2 -65C TO 150C PLD FLASH CY7C372I-JC M82002 9810 219801660 64-MCEL FL CMOS TX PLCC ALPHA-X 44 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 12 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-L27 CY7C955-NI 128 HTSSL2 125C/5.5V DCD CHNL M83033 9729 619704922 96 120 0 500 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 13 of TRANSCEIVER CMOS 28 MN PQFP KOREA-L CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-L28 CY2278APAC HAST 140C/3.63 CPD TTECH 98396 9842 619811691 CLOCK SYN. CMOS MN TSSO CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------48 128 50 0 140C/3.63V CPD TTECH CY2210PVC 98235 9826 619807319/ CLOCK SYN. CMOS TX SSOP CSPI-R 28 128 47 0 1 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/4.62V CPD TTECH CY2210PVC 98235 9826 619807319/ CLOCK SYN. CMOS TX SSOP CSPI-R 28 48 48 48 48 210 210 299 300 0 0 0 1 EOS 0 150C/4.6V CPD TTECH CY2210PVC 98235 9826 619807319/ CLOCK SYN. CMOS TX SSOP CSPI-R 28 500 119 0 150C/5.75V CPD TTECH CY5037AES 98225 9828 619808136 CLOCK SYN. CMOS MN SOIC CSPI-R 20 HTOL2 125C/5.75V DCD VME CY7C960-NC 98267 9831 619808580/ BUS Inter. CMOS TX PQFP HK-B 64 HTS 165C/NO BIAS CPD TTECH CY2278APAC 98396 9842 619811691 CMOS MN TSSO CSPI-R 48 48 112 0 48 148 0 48 148 0 48 148 0 48 148 0 48 148 0 48 148 0 500 116 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------96 405 0 96 600 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------CLOCK SYN. 336 50 0 1000 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD VME CY7C960-NC 98267 9831 619808580/ BUS Inter. CMOS TX PQFP HK-B 64 168 54 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C CPD TTECH CY2278APAC 98396 9842 619811691 CLOCK SYN. CMOS MN TSSO CSPI-R 48 100 50 0 200 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C CPD TTECH CY2210PVC 98235 9826 619807319/ CLOCK SYN. CMOS TX SSOP CSPI-R 28 300 60 1 1 Open- Bond Lift CY22751PVC M83018 9804 619800309 CLOCK SYN. CMOS MN SSOP CSPI-R 48 300 50 0 CY2278APAC 98396 9842 619811691 CLOCK SYN. CMOS MN TSSO CSPI-R 48 300 47 0 619811722 CLOCK SYN. CMOS MN TSSO CSPI-R 48 300 45 0 619811781 CLOCK SYN. CMOS MN TSSO CSPI-R 48 300 48 0 Page 14 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R28 HAST 130C/5.5V DCD FIFO CY7C4245-AC 140C/5.5V DCD DPORT CY7C131-JC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- M82008 9750 619710597 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 128 77 2 1 Open- Bond Lift / 1 Open- Heel M84022 9837 619810547 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 128 80 0 98491 9835 519810680 1K x 8 DP CMOS MN PLCC INDNS-O 52 128 46 0 140C/5.75 MPD COMDTY CY7C188-VC 98252 9829 619807917 32K x 9 CMOS TX SOJ CSPI-R 32 128 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75 MPD COMDTY CY7C188-VC 98252 9829 619807917 150C/5.75V DCD FIFO CY7C4245-JC 98323 CY7C457-JC 98312 CY7C425-JC CY7C433-JC 150C/6.5 DCD FIFO 32K x 9 CMOS TX SOJ CSPI-R 32 48 80 500 1500 120 120 0 0 0 9833 619809187L 4Kx18 FIFO CMOS TX PLCC PHIL-M 68 48 1026 0 9833 519809904S 2Kx18 FIFO CMOS TX PLCC INDNS-O 52 48 48 111 889 0 0 98321 9832 219805631 1Kx9 FIFO CMOS TX PLCC ALPHA-X 28 48 48 48 48 147 277 293 299 0 0 0 0 98324 9832 219805630 4Kx9 FIFO CMOS TX PLCC ALPHA-X 32 48 286 0 48 357 0 48 357 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY7C199-VC 98358 619805353 32K x 8 CMOS MN SOJ PHIL-GW 28 336 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.75 MPD COMDTY CY7C188-VC 98252 9829 619807917 32K x 9 CMOS TX SOJ 80 81 0 168 81 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V DCD DPORT M80122 9742 519713305 2K x 8 DP CMOS MN PLCC INDNS-O 52 M83023 9811 519802844 2K x 8 DP CMOS MN PLCC INDNS-O 52 98491 9835 519810680 1K x 8 DP CMOS MN PLCC INDNS-O 52 CY7C136-JC CSPI-R 32 96 96 96 500 12 52 52 64 0 0 0 0 96 120 0 500 120 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD DPORT CY7C131-JC Page 15 of 28 168 46 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R28 DPORT CY7C136-JC M84010 9839 519811761 2K x 8 DP CMOS MN PLCC INDNS-O 52 168 80 0 FIFO CY7C4245-AC 168 80 0 PCT 121C/100%RH DCD No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- M84021 9837 619810547 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 MPD COMDTY CY7C188-VC 98252 9829 619807917 32K x 9 CMOS TX SOJ 32 DCD DPORT CY7C131-JC 98491 9835 519810680 1K x 8 DP CMOS MN PLCC INDNS-O 52 300 50 0 CY7C136-JC M84011 9839 519811761 2K x 8 DP CMOS MN PLCC INDNS-O 52 300 50 0 CY7C4245-AC M84023 9837 619810547 4Kx18 FIFO CMOS MN TQFP KOREA-Q 64 300 50 0 96 50 0 168 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C FIFO CSPI-R MPD COMDTY CY7C188-VC 98252 9829 619807917 32K x 9 CMOS TX SOJ CSPI-R 32 300 52 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 16 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R3 CY7C1031-JC HTOL2 125C/5.75V MPD SYNC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- M82033 9804 519800339 64K x 18 CMOS MN PLCC INDNS-O 52 M82045 9804 519800339 64K x 18 CMOS MN PLCC INDNS-O 52 M84001 9826 619807437 32KX9 FIFO CMOS MN TQFP KOREA-Q 32 96 500 0 500 120 0 1000 119 0 1 EOS 2000 119 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C DCD FIFO CY7C4271-AC 300 50 0 CY7C4271-JC M84002 9819 219803518 32Kx9 FIFO CMOS MN PLCC ALPHA-X 32 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 17 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R30 CY7C1399-VC PCT 121C/100%RH MPD SYNC M82039 9740 619707822 2 1 Particle Defect/1 Topside Crack 168 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 18 of 32K x 8 28 CMOS MN TSOP CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------28 96 47 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R32 HAST 140C/3.63 MPD COMDTY CY62128-ZAC 98345 9833 619808192 128K x 8 CMOS MN STSO CSPI-R 32 128 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY62128-SC 98344 9821 619805763 128K x 8 CMOS MN SOIC TAIWAN-G 32 336 1000 50 45 0 0 619805764L 128K x 8 CMOS MN SOIC TAIWAN-G 32 336 1000 50 45 0 0 619805765L 128K x 8 CMOS MN SOIC TAIWAN-G 32 336 1000 50 45 0 0 CY62128-ZAC 98345 9833 619808192 128K x 8 CMOS MN STSO CSPI-R 32 336 50 0 1000 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C MPD COMDTY CY62128-ZAC 98345 9833 619808192 128K x 8 CMOS MN STSO CSPI-R 32 100 50 0 200 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62128-ZAC 98345 9833 619808192 128K x 8 CMOS MN STSO CSPI-R 32 300 50 0 619808193 128K x 8 CMOS MN STSO CSPI-R 32 300 50 0 9834 619808195 128K x 8 CMOS MN STSO CSPI-R 32 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 19 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R32D CY7C4285-ASC HTOL 150C/5.75V DCD FIFO 98379 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 9833 619809266 64Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 683 1 1 Void in Oxide 9834 619809529 64Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 699 0 619809725 64Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 695 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 20 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R42 HAST 140C/5.5 MPD COMDTY CY62148-SC 98343 9835 619809040 512K x 8 CMOS MN TSOP KOREA-H 32 128 47 0 2 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY62148-SC 98343 9835 619809040 512K x 8 CMOS MN TSOP KOREA-H 32 336 53 0 1000 53 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C MPD COMDTY CY62148-SC 98343 9835 619809040 512K x 8 CMOS MN TSOP KOREA-H 32 100 49 0 200 49 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62148-SC 98343 9835 619809038 512K x 8 CMOS MN TSOP KOREA-H 32 300 49 0 619809039 512K x 8 CMOS MN TSOP KOREA-H 32 300 50 0 619809040 512K x 8 CMOS MN TSOP KOREA-H 32 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 21 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R42D CY7C43684V-AC 128 HAST 130C/3.63V DCD FIFO 98268 9838 619810894 16Kx36x2 CMOS MN TQFP KOREA-Q 128 128 48 48 0 0 130C/3.65V MPD COMDTY CY7C1325-AC 98081 9823 619805641 256K x 18 CMOS MN TQFP CSPI-R 100 128 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8V DCD FIFO CY7C4285V-ASC 98378 9832 619808818 64Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 807 0 9834 619809626L 64Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 783 0 64Kx18 FIFO CMOS MN TQFP KOREA-Q 64 48 725 0 9838 619810894 16Kx36x2 CMOS MN TQFP KOREA-Q 128 48 48 395 581 0 0 9839 619811151 16Kx36x2 CMOS MN TQFP KOREA-Q 128 48 30 0 619809627 CY7C43684V-AC MPD 150C/5.75V MPD 98268 COMDTY CY7C1324-AC 98234 9833 619809322 128 x 18 CMOS MN TQFP CSPI-R 100 48 48 500 378 1875 385 0 0 0 CY7C1325-AC 98081 9823 619805641 256K x 18 CMOS MN TQFP CSPI-R 100 48 80 500 120 120 120 0 0 0 9826 619806417 256K x 18 CMOS MN TQFP CSPI-R 100 48 80 500 850 396 396 0 0 0 9829 619807576 256K x 18 CMOS MN TQFP CSPI-R 100 48 80 500 750 395 395 0 2 EOS 0 1 EOS 0 9830 619808550 32K x 8(5) CMOS MN SOJ CSPI-R 28 48 1012 0 9834 619809494 32K x 8(5) CMOS MN SOJ CSPI-R 28 48 1008 0 COMDTY CY7C199-VC 98424 9844 619812830 32K x 8(5) CMOS MN SOJ CSPI-R 28 48 1000 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/3.63V MPD COMDTY CY7C1325-AC 98081 9823 619805641 256K x 18 CMOS MN TQFP CSPI-R 100 80 78 0 168 78 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD FIFO 98268 9838 619810894 16Kx36x2 CMOS MN TQFP KOREA-Q 128 CY7C43684V-AC Page 22 of 28 168 48 0 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42D PCT 121C/100%RH MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1324-AC 98234 9831 619808689 128 x 18 CMOS MN TQFP CSPI-R No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------100 168 48 0 CY7C1325-AC 98081 9842 619811767 256K x 18 CMOS MN TQFP CSPI-R 100 168 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C DCD FIFO CY7C43684V-AC MPD COMDTY CY7C1325-AC 98268 9838 619810894 16Kx36x2 CMOS MN TQFP KOREA-Q 128 300 300 48 48 0 0 98081 9823 619805641 256K x 18 CMOS MN TQFP CSPI-R 100 300 48 0 9829 619807575 256K x 18 CMOS MN TQFP CSPI-R 100 300 48 0 619807576 256K x 18 CMOS MN TQFP CSPI-R 100 300 48 0 CY7C199-VC 98424 9844 619812830 32K x 8(5) CMOS MN SOJ CSPI-R 28 300 48 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 23 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- SRAM/LOGIC-R42H 125C/6.5V MPD COMDTY CY62128-SC 98175 9840 619811086 128K x 8 CMOS MN SOIC TAIWAN-G 32 48 3435 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75 MPD COMDTY CY62128-ZAC 98175 9829 619807966 128K x 8 CMOS MN STSO CSPI-R 32 80 1498 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/6.5V MPD COMDTY CY62256-SNC 98434 9842 519812495 32K x 8 CMOS MN NSOI INDNS-O 28 48 1172 0 519812496 32K x 8 CMOS MN NSOI INDNS-O 28 48 944 0 519812497 32K x 8 CMOS MN NSOI INDNS-O 28 48 1162 1 FA PENDING ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY62128-ZAC 98175 9829 619807966 128K x 8 CMOS MN STSO CSPI-R 32 168 49 0 CY62256-SNC 98434 9832 519809733/ 32K x 8 CMOS MN NSOI INDNS-O 28 168 51 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62256-SNC 98434 9832 519809733/ 32K x 8 CMOS MN NSOI INDNS-O 28 300 50 0 3 EOS ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 24 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42HD HAST 140C/5.5 MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY7C1041-VC CY7C1041-ZSC No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 98441 9841 619810854 256K x 16 CMOS MN SOJ CSPI-R 44 128 49 0 98356 9836 619810469 256K x 16 CMOS MN TSOP CSPI-R 44 128 45 0 140C/5.5V MPD COMDTY CY7C1041-ZSC 98356 9838 619810469 256K x 16 CMOS MN TSOP CSPI-R 44 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/5.75V DCD FIFO CY7C4265-AC 98266 9847 619814558 16KX18 FIFO CMOS MN PLCC KOREA-Q 68 48 48 595 734 0 0 MPD COMDTY CY7C1009-VC 98353 9840 619810788 256K x 4 MN SOJ 32 48 48 80 653 867 120 0 1 1 Open - Bond lift 0 CMOS CSPI-R CY7C1021-ZSC 98353 9845 619811218 64K x16 CMOS MN TSOP CSPI-R 44 48 1520 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2 125C/5.75V MPD SYNC CY7C1031-JC DCD DPORT CY7C026-AC 165C/NO BIAS MPD COMDTY CY7C1041-VC 9824 519806477 64K x 18 CMOS MN PLCC INDNS-O 52 96 805 0 9827 519807505 64K x 18 CMOS MN PLCC INDNS-O 52 96 96 436 786 0 0 519807506 64K x 18 CMOS MN PLCC INDNS-O 52 96 792 0 48 56 0 48 476 0 48 476 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 125C/6.5V 98437 CY7C1041-ZSC 98244 9833 619809368L 8K x 18 DP CMOS MN TQFP TAIWAN-G 100 98441 - 619812613 256K x 16 CMOS MN SOJ CSPI-R 44 98356 9836 619809707 256K x 16 CMOS MN TSOP CSPI-R 44 256K x 4 CMOS MN SOJ 32 336 50 0 336 49 0 1000 47 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/5.5V MPD COMDTY CY7C1009-VC 98353 9840 619810788 80 80 0 168 80 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH DCD DPORT CY7C026-AC 98244 9833 619809368L 8K x 18 DP CMOS MN TQFP TAIWAN-G 100 168 48 0 FIFO CY7C4265-AC 98266 9847 619814558 16KX18 FIFO CMOS MN PLCC KOREA-Q 68 168 50 0 COMDTY CY7C199-VC 98424 9844 619812830 32K x 8(5) CMOS MN SOJ 28 168 48 0 SYNC 98437 9833 519809798 64K x 18 CMOS MN PLCC INDNS-O 52 168 46 0 MPD CY7C1031-JC Page 25 of 28 CSPI-R CSPI-R CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----- Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- SRAM/LOGIC-R42HD PCT CY7C1031-JC 121C/100%RH MPD SYNC 98437 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 9833 519809799 64K x 18 CMOS MN PLCC INDNS-O 52 168 46 0 9835 519810438 64K x 18 CMOS MN PLCC INDNS-O 52 168 46 0 519810439 64K x 18 CMOS MN PLCC INDNS-O 52 168 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S -55C TO 150C MPD COMDTY CY7C1041-VC 98441 - 619812613 256K x 16 CMOS MN SOJ CSPI-R 44 100 200 50 50 0 0 CY7C1041-ZSC 98356 9836 619809707 256K x 16 CMOS MN TSOP CSPI-R 44 CY7C026-AC 98244 9833 619809368L 8K x 18 DP CMOS MN TQFP TAIWAN-G 100 300 48 0 98441 9841 619810798 256K x 16 CMOS MN SOJ CSPI-R 44 300 50 0 619810854 256K x 16 CMOS MN SOJ CSPI-R 44 300 49 0 9842 619810895 256K x 16 CMOS MN SOJ CSPI-R 44 300 50 0 9836 619809706 256K x 16 CMOS MN TSOP CSPI-R 44 300 48 0 619809707 256K x 16 CMOS MN TSOP CSPI-R 44 300 50 0 619810470 100 50 0 200 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C DCD DPORT MPD COMDTY CY7C1041-VC CY7C1041-ZSC SYNC CY7C1031-JC 98356 98437 256K x 16 CMOS MN TSOP CSPI-R 44 300 50 0 9833 519809798 64K x 18 CMOS MN PLCC INDNS-O 52 300 46 0 519809799 64K x 18 CMOS MN PLCC INDNS-O 52 300 46 0 9835 519810438 64K x 18 CMOS MN PLCC INDNS-O 52 300 46 0 519810439 64K x 18 CMOS MN PLCC INDNS-O 52 300 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 26 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R52H HAST 140C/3.63 140C/3.63V MPD MPD Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- COMDTY CY62128V-VC COMDTY CY62128V-VC 98311 98311 No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- 9832 619809145/ 128K x 8 CMOS MN SOJ CSPI-R 32 256 51 0 9833 619809438/ 128K x 8 CMOS MN SOJ CSPI-R 32 128 256 51 51 0 0 619806482/ 128K x 8 CMOS MN SOJ CSPI-R 32 128 256 50 50 0 0 CY62128V-ZSC 98372 9828 619807177 128K x 8 CMOS MN STSO CSPI-R 32 128 45 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL 150C/3.8 MPD COMDTY CY62128V-VC CY62128V-ZSC 150C/3.8V 150C/5.75V MPD MPD COMDTY CY62128V-VC COMDTY CY62128V-VC 98311 98372 98311 98311 9832 619809145/ 128K x 8 CMOS MN SOJ CSPI-R 32 48 80 500 1050 540 528 0 0 0 9833 619809438/ 128K x 8 CMOS MN SOJ CSPI-R 32 48 1050 0 9841 619811946 128K x 8 CMOS MN STSO CSPI-R 32 48 80 500 1501 270 268 0 0 0 9842 619811945 128K x 8 CMOS MN STSO CSPI-R 32 48 80 500 1504 270 268 0 0 0 9823 619806702/ 128K x 8 CMOS MN SOJ CSPI-R 32 48 48 48 80 300 500 334 334 334 540 540 539 0 0 0 0 0 0 1 EOS 9833 619809438/ 128K x 8 CMOS MN SOJ CSPI-R 32 80 200 500 540 540 539 0 1 1 UNKNOWN 0 9823 619806702/ 128K x 8 CMOS MN SOJ CSPI-R 32 1000 2000 539 539 0 1 FA PENDING 9833 619809438/ 128K x 8 CMOS MN SOJ CSPI-R 32 577 419 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS 165C/NO BIAS MPD COMDTY CY62128V-VC 98311 619806447/ 128K x 8 CMOS MN SOJ CSPI-R 32 336 48 0 619806482/ 128K x 8 CMOS MN SOJ CSPI-R 32 336 50 0 Page 27 of 28 CYPRESS SEMICONDUCTOR CORPORATION PRODUCT RELIABILITY REPORT Quarter 4, 1998 Issued: 1/22/99 Cypress Semiconductor Corporation Quarterly Reliability Report Quarter 4, 1998 Divi- FuncTechnology Test Test Condition sion tion ---------------- ------ ---------------- ----- ----SRAM/LOGIC-R52H Assembly ProWfr Pkg Assy Device Eval# D/C Lot No Description cess Loc type Loc --------------- ------- ---- ---------- ----------- ------ --- ---- ------- No Dura Qty Qty Pin tion Test Fail Fail Mode --- ---- ----- ---- ------------------------- HTS 165C/NO BIAS MPD COMDTY CY62128V-VC 98311 9823 619806702/ 128K x 8 CMOS MN SOJ CSPI-R 32 336 50 0 1000 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL 150C/3.63V MPD COMDTY CY62128V-VC 98311 619806482/ 128K x 8 CMOS MN SOJ CSPI-R 32 9823 619806702/ 128K x 8 CMOS MN SOJ CSPI-R 32 80 168 154 154 0 0 80 154 0 168 154 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL -30C/4.3V MPD COMDTY CY62128V-VC 98311 9833 619809438/ 128K x 8 CMOS MN SOJ CSPI-R 32 300 46 0 500 46 0 1000 46 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT 121C/100%RH MPD COMDTY CY62128V-VC 98311 619806447/ 128K x 8 CMOS MN SOJ CSPI-R 32 168 45 0 619806482/ 128K x 8 CMOS MN SOJ CSPI-R 32 168 46 0 9832 619809145/ 128K x 8 CMOS MN SOJ CSPI-R 32 107 168 51 51 0 0 9833 619809438/ 128K x 8 CMOS MN SOJ CSPI-R 32 168 51 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2 -65C TO 150C MPD COMDTY CY62128V-VC CY62128V-ZSC 98311 98372 9823 619806702/ 128K x 8 CMOS MN SOJ CSPI-R 32 300 50 0 9832 619809145/ 128K x 8 CMOS MN SOJ CSPI-R 32 300 51 0 9833 619809438/ 128K x 8 CMOS MN SOJ CSPI-R 32 300 51 0 9828 619807177 128K x 8 CMOS MN STSO CSPI-R 32 300 45 0 619807389 128K x 8 CMOS MN STSO CSPI-R 32 300 47 0 9837 619810887 128K x 8 CMOS MN STSO CSPI-R 32 300 50 0 9838 619811028 128K x 8 CMOS MN STSO CSPI-R 32 300 50 0 619811056 128K x 8 CMOS MN STSO CSPI-R 32 300 50 0 ------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- Page 28 of 28