Q3 - 1998

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 3, 1998
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
High Temp Op Life, 150ºC, 5.75V
High Temp Op Life, 125ºC, 5.75V
High Temp Steady State Life, 150ºC, 5.75V
High Temp Steady State Life, 125ºC, 5.75V
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC, 85%RH, 5.5V Bias
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 165ºC, No Bias
Page 2 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
FR
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
MHS, France
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-K
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
ALPHA-Y
THLAND-Z
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
Aplus/USA
Toshiba/USA
Cypress Bangkok/Thailand
Alphatech/Thailand
Hana/Thailand
Page 3 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
RELIABILITY DATA SUMMARY
(Q398)
1
Equivalent Total Device Hours/Cycles. Derating factors are used for lower stress condition.
Page 5 of 39
Quarter 3, 1998
Issued: 11/12/98
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
RELIABILITY DATA SUMMARY
(Q398)
Page 6 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Technology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Divi- FuncAssembly
ProWfr Pkg Assy
No Dura Qty
Qty
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
Pin tion Test Fail Fail Mode
--------------- ------- ---- ---------- ----------- ------ --- ---- ------- --- ---- ----- ---- -------------------------
BICMOS-SM1
CY7B991-JC
DRET
165C/NO BIAS
DCD
CHNL
M83027
9818 219803361
PSCB
BiCMOS TX
PLCC ALPHA-X
32
168
1000
76
76
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
130/3.63V
DCD
CHNL
CY7B9514V-AC
98051
9823 619803937
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
128
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/4.8V
DCD
CHNL
CY7B9514V-AC
98051
9823 619803937
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
48
500
0
619805327
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
48
499
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/4.8V
DCD
CHNL
CY7B9514V-AC
CY7B991-VC
125C/5.75V
DCD
CHNL
CY7B991-JC
98051
9823 619803937
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
80
500
120
120
0
0
619805327
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
80
500
120
120
0
0
97501
9819 219803586L PSCB
BiCMOS TX
PLCC ALPHA-X
32
48
48
80
500
353
647
120
120
0
0
0
0
98293
9827 219804875L PSCB
BiCMOS TX
PLCC ALPHA-X
32
48
48
450
600
0
0
98221
9822 219803965
PSCB
BiCMOS TX
PLCC ALPHA-X
32
96
96
430
570
0
0
219803966
PSCB
BiCMOS TX
PLCC ALPHA-X
32
96
96
140
860
0
0
9818 219803361
PSCB
BiCMOS TX
PLCC ALPHA-X
32
96
96
120
380
0
0
M83010
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 7 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
BICMOS-SM1
CY7B9514V-AC
HTSSL
150C/3.63V
DCD
CHNL
98051
9823 619803937
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
80
168
80
80
0
0
619805327
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
80
168
80
80
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
CHNL
CY7B9514V-AC
98051
9823 619803937
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
168
50
0
CY7B991-JC
M83024
9818 219803361
PSCB
BiCMOS TX
PLCC ALPHA-X
32
168
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
CHNL
CY7B9514V-AC
98051
9823 619803937
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
300
50
0
9828 619807608
SONET/SHD
BiCMOS TX
TQFP CSPI-R
100
300
55
0
CY7B991-JC
M83026
9818 219803361
PSCB
BiCMOS TX
PLCC ALPHA-X
32
300
45
0
CY7B991-VC
97501
9819 219803586L PSCB
BiCMOS TX
PLCC ALPHA-X
32
300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 8 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Technology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Divi- FuncAssembly
ProWfr Pkg Assy
No Dura Qty
Qty
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
Pin tion Test Fail Fail Mode
--------------- ------- ---- ---------- ----------- ------ --- ---- ------- --- ---- ----- ---- -------------------------
FAMOS-E3
CY37256VP160-AC 98376
DRET
165C/NO BIAS
PLD
37K
9823 619806102
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
168
552
76
76
0
0
9830 619808070
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
168
552
76
76
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
130C/5.5V
PLD
37K
CY37256VP160-AC 98376
9823 619806102
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
128
43
0 3 Thermal EOS
9830 619808070
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
PLD
37K
CY37256VP160-AC 98376
9823 619806102
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
48
80
500
250
116
88
0
0
0
9830 619808070
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
48
48
80
500
50
200
140
140
0
0
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/5.5V
PLD
37K
CY37256VP160-AC 98376
9823 619806102
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
80
168
76
76
0
0
9830 619808070
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
80
168
76
75
0
0 1 Latch-up Induced Overst
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL
-30C/6.50V
PLD
37K
CY37256VP160-AC 98376
9823 619806102
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
230
500
750
45
45
45
0
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
PLD
37K
CY37256VP160-AC 98376
9823 619806102
288
50
Page 9 of
39
256 MCEL-3V CMOS
0
TW
TQFP KOREA-Q
160
168
50
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FAMOS-E3
CY37256VP160-AC 98376
160
PCT
121C/100%RH
PLD
37K
9830 619808070
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
168
288
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
37K
CY37256VP160-AC 98376
9823 619806102
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
300
50
0
9830 619808070
256 MCEL-3V CMOS
TW
TQFP KOREA-Q
160
300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 10 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P20
CY7C341-RMB
97453
9743 349705389
REPROG.PAL
CMOS
TX
WPGA PHIL-M
84
184
184
10
40
0
0
CY7C344-HMB
97457
9742 349705317
REPROG.PAL
CMOS
TX
CERQ PHIL-M
28
184
50
0
HTOL
150C/5.75V
PLD
MAX
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
PLD
MAX
CY7C341-JC
M82035
9814 619803505
REPROG.PAL
CMOS
TX
PLCC KOREA-A
84
500
1000
2000
120
120
120
0
0
0
M82038
9814 619803505
REPROG.PAL
CMOS
TX
PLCC KOREA-A
84
96
284
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
PLD
MAX
CY7C341-JC
M82036
9814 619803505
REPROG.PAL
CMOS
TX
PLCC KOREA-A
84
96
500
120
120
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
PLD
MAX
CY7C341-RMB
97453
9743 349705389
REPROG.PAL
CMOS
TX
WPGA PHIL-M
84
100
50
0
CY7C344-HMB
97457
9742 349705317
REPROG.PAL
CMOS
TX
CERQ PHIL-M
28
100
46
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 11 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
FAMOS-P26
CY27C010-PC
HTOL2
125C/5.75V
MPD
PROM
M82050
9747 619709651
128K x 8
CMOS
TX
PDIP KOREA-H
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------32
500
1000
2000
120
120
119
0
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
MPD
PROM
CY27C010-PC
M82021
9747 619709651
128K x 8
CMOS
TX
PDIP KOREA-H
32
96
500
120
120
0
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 12 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-C2AN
VIC068A-BC
144
DRET
165C/NO BIAS
DCD
VME
M83031
9821 349800804
VME INTERF. CMOS
MN
PPGA PHIL-M
168
1000
80
80
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
VME
VIC068A-BC
M83029
9821 349800804
VME INTERF. CMOS
MN
PPGA PHIL-M
144
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
VME
VIC068A-BC
M83030
9821 349800804
VME INTERF. CMOS
MN
PPGA PHIL-M
144
300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 13 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L20
CY7C611A-NC
160
DRET
165C/NO BIAS
DCD
VME
M83003
9818 619804439
RISC CONTRL CMOS
TX
PQFP HK-B
168
1000
82
82
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC
-40C TO 125C
DCD
VME
CY7C611A-NC
M83004
9818 619804439
RISC CONTRL CMOS
TX
PQFP HK-B
160
300
52
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 14 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
SRAM/LOGIC-L27
HTOL2
125C/5.75V
DCD
CHNL
CY7C955-NI
M83007
9729 619704922
TRANSCEIVER CMOS
MN
PQFP KOREA-L
128
96
273
1 1 Shorted Metal (Bridging
125C/6.5V
DCD
CHNL
CY7C955-NC
98319
9833 619808961
TRANSCEIVER CMOS
TX
PQFP KOREA-L
128
48
48
241
806
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
CHNL
CY7C955-NI
M83034
9732 619705642
TRANSCEIVER CMOS
MN
PQFP KOREA-L
128
168
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
CHNL
CY7C955-NI
M83036
9732 619705642
TRANSCEIVER CMOS
MN
PQFP KOREA-L
128
300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 15 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L28
HAST
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
140C/3.63V
CPD
TTECH
CY22751PVC
M82055
9804 619800214
CLOCK SYN.
CMOS
MN
SSOP CSPI-R
48
128
128
11
69
0
0
140C/5.5V
DCD
PCLOG
CY82C693-NC
98209
9828 619807947
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
128
45
0
619807948
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CPD
TTECH
CY2291SC
98195
9823 34980844/7 CLOCK SYN.
CMOS
TX
SOIC PHIL-M
20
48
48
48
48
149
209
298
299
0
0
0
0
DCD
PCLOG
CY82C693-NC
98209
9828 619807947
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
48
80
168
78
0
0
619807948
PC CHIPSET
CMOS
500
75
0 3 EOS
TX
PQFP MALAY-J
208
48
80
500
785
168
78
73
70
0
0
0 5 EOS
0
9829 619808385
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
48
167
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
DCD
PCLOG
CY82C693-NC
98209
9828 619807948
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
336
1000
48
48
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/5.5V
DCD
PCLOG
CY82C693-NC
98209
9828 619807948
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
80
168
73
72
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL
-30C/5.75V
CPD
FCT
CY74FCT543TSOC
98209
9822 619805959/ BUS SWITCH
Page 16 of
39
CMOS
TX
SOIC CSPI-R
24
500
45
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Technology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Divi- FuncAssembly
ProWfr Pkg Assy
No Dura Qty
Qty
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
Pin tion Test Fail Fail Mode
--------------- ------- ---- ---------- ----------- ------ --- ---- ------- --- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-L28
PCT
121C/100%RH
CPD
TTECH
CY22751PVC
M83017
9804 619800309
CLOCK SYN.
CMOS
MN
SSOP CSPI-R
48
168
78
0
DCD
PCLOG
CY82C693-NC
98209
9828 619807948
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
168
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
PCLOG
CY82C693-NC
98209
9828 619807947
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
300
47
0
619807948
PC CHIPSET
CMOS
TX
PQFP MALAY-J
208
300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 17 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L31
HAST
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
140C/3.63
CPD
FCT
CY74FCT163LD952 98298
-
619807278
16 BIT REG. CMOS
MN
TSSO CSPI-R
56
128
45
0
140C/3.63V
CPD
FCT
CY74FCT163LD827 98133
9810 619802795
20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
128
44
0
619802795S 20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
128
128
46
46
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
CPD
FCT
CY74FCT163LD827 98133
9810 619802795
20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
24
80
500
116
116
116
0
0
0
619802795S 20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
24
24
80
80
500
500
116
116
116
116
116
116
0
0
0
0
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CPD
FCT
CY74FCT163LD827 98133
CY74FCT163LD952 98298
9810 619802795
-
20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
336
45
0
619802795S 20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
336
336
44
47
0
0
619807278
MN
TSSO CSPI-R
56
336
500
45
45
0
0
16 BIT REG. CMOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CPD
FCT
CY74FCT163LD952 98298
-
619807278
16 BIT REG. CMOS
MN
TSSO CSPI-R
56
100
200
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CPD
FCT
CY74FCT163LD827 98133
9810 619802795
20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
300
45
0
619802795S 20 BIT BUF. CMOS
MN
TSSO TAIWAN-T
56
300
44
0
Page 18 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-L31
CY74FCT163LD827 98133
9810 619802795S 20 BIT BUF. CMOS
CY74FCT163LD952 98298
-
TC2
-65C TO 150C
CPD
FCT
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MN
TSSO TAIWAN-T
56
300
45
0
619807278
16 BIT REG. CMOS
MN
TSSO CSPI-R
56
300
45
0
619807279
16 BIT REG. CMOS
MN
TSSO CSPI-R
56
300
45
0
619807280
16 BIT REG. CMOS
MN
TSSO CSPI-R
56
300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 19 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R28
HAST
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
130C/5.5
DCD
FIFO
CY7C4245-AC
M82060
9981 619804361
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
128
76
0
130C/5.5V
DCD
FIFO
CY7C4245-AC
M82059
9727 619704335
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
128
76
0
140C/5.5
MPD
COMDTY CY7C1009-VC
MR83033 9802 619711572
256K x 4
CMOS
MN
SOJ
CSPI-R
32
128
80
0
CY7C109-VC
MR83093 9820 519805328
128K x 8
CMOS
MN
SOJ
INDNS-O
32
128
80
0
DPORT
CY7C136-JC
M83022
9811 519802844
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
128
80
0
FIFO
CY7C4245-AC
M83016
9750 619710221
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
128
76
0
97442
9735 349704960
128K x 8
CMOS
MN
TSOP KOREA-GQ
32
128
48
0
98191
9817 619803751
128K x 8
CMOS
MN
TSOP PHIL-GW
32
128
128
45
47
0
0
619803752
128K x 8
CMOS
MN
TSOP PHIL-GW
32
128
128
46
46
0
0
619803753
128K x 8
CMOS
MN
TSOP PHIL-GW
32
128
128
45
48
0
0
140C/5.5V
DCD
MPD
COMDTY CY7C109-ZC
CY7C188-VC
MR83028 9821 619805225
32K x 9
CMOS
MN
SOJ
CSPI-R
32
128
80
0
CY7C199-VC
98210
32K x 8
CMOS
MN
SOJ
PHIL-GW
28
128
50
0
619805353L 32K x 8
CMOS
MN
SOJ
PHIL-GW
28
128
128
50
50
0
0
-
619805353
CY7C199-ZC
98301
9821 619805266
32K x 8
CMOS
MN
TSOP CSPI-R
28
128
45
0
CY7C199-ZI
MR82080 9808 619802112
32K x 8
CMOS
MN
TSOP CSPI-R
28
128
76
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 20 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncAssembly
ProWfr Pkg Assy
No Dura Qty
Qty
Technology
Test
Test Condition
sion tion
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
Pin tion Test Fail Fail Mode
---------------- ------ ---------------- ----- ----- --------------- ------- ---- ---------- ----------- ------ --- ---- ------- --- ---- ----- ---- ------------------------SRAM/LOGIC-R28
HTOL
150C/5.5V
150C/5.75V
MPD
MPD
COMDTY CY7C199-VC
98210
-
619805353
32K x 8
CMOS
MN
SOJ
PHIL-GW
28
80
120
0
619805353L 32K x 8
CMOS
MN
SOJ
PHIL-GW
28
80
80
120
120
0
0
COMDTY CY7C185-VC
98296
9836 619810123
SML/64K
CMOS
TX
SOJ
CSPI-R
28
48
1512
0
CY7C197-VC
98236
9827 519807749
256K x 1
CMOS
TX
SOJ
CSPI-R
24
48
1518
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/
MPD
COMDTY CY7C109-VC
MR83020 9820 519805328
128K x 8
CMOS
MN
SOJ
INDNS-O
32
96
406
0
125C/5.75V
DCD
DPORT
M80121
9742 519713305
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
96
96
96
500
1000
2000
12
52
52
116
116
116
0
0
0
0
0
0
M82052
9704 349700386
2K x 8 DP
CMOS
MN
PLCC PHIL-M
52
500
1000
2000
120
120
120
0
0
0
M83013
9811 519802844
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
500
1000
2000
120
120
120
0
0
0
MR83001 9802 619711572
256K x 4
CMOS
MN
SOJ
CSPI-R
32
96
477
0
CY7C188-VC
MR83003 9821 619805225
32K x 9
CMOS
MN
SOJ
CSPI-R
32
96
377
0
CY7C136-JC
M83005
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
96
96
143
357
0
0
MPD
125C/5.7V
DCD
CY7C136-JC
COMDTY CY7C1009-VC
DPORT
9811 519802844
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 21 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R28
HTS
165C/NO BIAS
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
COMDTY CY7C109-ZC
98191
9817 619803751
128K x 8
CMOS
MN
TSOP PHIL-GW
32
336
45
0
CY7C199-VC
98210
-
32K x 8
CMOS
MN
SOJ
PHIL-GW
28
336
500
50
44
0
0
619805353L 32K x 8
CMOS
MN
SOJ
PHIL-GW
28
336
336
500
500
50
50
36
44
0
0
0
0
619805353
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
DCD
DPORT
CY7C136-JC
M82015
9704 349700386
2K x 8 DP
CMOS
MN
PLCC PHIL-M
52
96
500
120
120
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
DCD
DPORT
CY7C136-JC
MPD
COMDTY CY7C109-VC
M83020
9811 519802844
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
168
80
0
MR83091 9820 519805328
128K x 8
CMOS
MN
SOJ
INDNS-O
32
168
80
0
CY7C185-VC
98296
9828 619807754
SML/64K
CMOS
TX
SOJ
CSPI-R
28
168
50
0
CY7C188-VC
MR83029 9821 619805225
32K x 9
CMOS
MN
SOJ
CSPI-R
32
168
70
0
CY7C197-VC
98236
256K x 1
CMOS
TX
SOJ
CSPI-R
24
168
48
0
9827 519807749
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
MPD
COMDTY CY7C109-ZC
98191
9817 619803751
128K x 8
CMOS
MN
TSOP PHIL-GW
32
100
200
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
DPORT
CY7C136-JC
M83021
9811 519802844
2K x 8 DP
CMOS
MN
PLCC INDNS-O
52
300
50
0
FIFO
CY7C4245-AC
M83008
9750 619710221
4Kx18 FIFO
CMOS
MN
TQFP KOREA-Q
64
300
48
0
Page 22 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R28
TC2
-65C TO 150C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1009-VC
CY7C109-ZC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MR82063 9807 619711668
256K x 4
CMOS
MN
SOJ
CSPI-R
32
300
43
5 5 Open- Bond Lift (Die)
MR83035 9802 619711572
256K x 4
CMOS
MN
SOJ
CSPI-R
32
300
50
0
97442
9735 349704960
128K x 8
CMOS
MN
TSOP KOREA-GQ
32
300
48
0
349704961
128K x 8
CMOS
MN
TSOP KOREA-GQ
32
300
48
0
349704962
128K x 8
CMOS
MN
TSOP KOREA-GQ
32
300
48
1 1 Mixed Reject
9817 619803751
128K x 8
CMOS
MN
TSOP PHIL-GW
32
300
45
0
619803752
128K x 8
CMOS
MN
TSOP PHIL-GW
32
300
45
0
619803753
98191
128K x 8
CMOS
MN
TSOP PHIL-GW
32
300
45
0
CY7C185-VC
98296
9828 619807754
SML/64K
CMOS
TX
SOJ
CSPI-R
28
300
48
0
CY7C199-VC
98210
-
32K x 8
CMOS
MN
SOJ
PHIL-GW
28
300
50
0
619805353L 32K x 8
CMOS
MN
SOJ
PHIL-GW
28
300
300
50
50
0
0
CMOS
MN
TSOP CSPI-R
28
300
50
0
CY7C199-ZI
619805353
MR83067 9819 619805260
32K x 8
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 23 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R3
HAST
140C/5.5V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1020-VC
CY7C199-VC
98222
9801 619711135
MR83082 9816 619804270
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
32K x16
CMOS
MN
SOJ
CSPI-R
44
128
45
0
256K
CMOS
MN
SOJ
CSPI-R
28
128
80
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/6.5V
DCD
FIFO
CY7C4265-JC
CY7C4271-JC
97415
97415
9710 619700831S 16KX18 FIFO CMOS
MN
PLCC PHIL-M
68
48
428
0
9711 619700973S 16KX18 FIFO CMOS
MN
PLCC PHIL-M
68
48
363
1 1 Non Visual
9737 619707057S 32Kx9 FIFO
CMOS
MN
PLCC KOREA-A
32
48
382
0
9819 219803518P 32Kx9 FIFO
CMOS
MN
PLCC KOREA-A
32
48
863
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
MPD
COMDTY CY7C1021-ZSC
CY7C199-VC
MR83044 9825 619806720
64K x16
CMOS
MN
TSOP CSPI-R
44
96
530
0
M80193
256K
CMOS
MN
SOJ
28
96
500
1000
2000
111
103
103
102
0 5 EOS
0
1 1 Unknown Cause
0
9802 619711953
CSPI-R
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY7C1020-VC
98222
9801 619711135
32K x16
CMOS
MN
SOJ
CSPI-R
44
336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
MPD
COMDTY CY7C199-VC
M82005
9802 619711953
256K
CMOS
MN
SOJ
SYNC
M82046
9804 519800339
64K x 18
CMOS
MN
PLCC INDNS-O
CY7C1031-JC
CSPI-R
28
96
500
108
108
0
0
52
96
500
120
120
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C199-VC
MR83080 9816 619804270
Page 24 of
256K
39
CMOS
MN
SOJ
CSPI-R
28
168
80
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R3
T/S
-55C TO 150C
MPD
COMDTY CY7C1020-VC
98222
9801 619711135
32K x16
CMOS
MN
SOJ
CSPI-R
44
100
200
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1020-VC
98222
9801 619711135
32K x16
CMOS
MN
SOJ
CSPI-R
44
300
45
0
619711136
32K x16
CMOS
MN
SOJ
CSPI-R
44
300
45
0
9825 619806605
32K x16
CMOS
MN
SOJ
CSPI-R
44
300
45
0
CY7C1021-VC
MR83053 9817 619804496
64K x16
CMOS
MN
SOJ
CSPI-R
44
300
53
0
CY7C199-VC
MR83081 9816 619804270
256K
CMOS
MN
SOJ
CSPI-R
28
300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 25 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R31
CY7C1399-VC
HAST
140C/3.3V
140C/5.5V
MPD
MPD
SYNC
SYNC
CY7C1399-ZC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MR82038 9742 619708394
32K x 8
CMOS
MN
SOJ
PHIL-M
28
128
128
26
58
0
0
MR83076 9816 619804105
32K x 8
CMOS
MN
SOJ
PHIL-M
28
128
80
0
98206
9823 349800821
32K x 8
CMOS
MN
TSOP PHIL-M
28
128
45
0
349800822
32K x 8
CMOS
MN
TSOP PHIL-M
28
128
45
0
349800823
32K x 8
CMOS
MN
TSOP PHIL-M
28
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
MPD
SYNC
CY7C1399-ZC
98206
9823 349800821
32K x 8
CMOS
MN
TSOP PHIL-M
28
80
116
0
349800822
32K x 8
CMOS
MN
TSOP PHIL-M
28
80
116
0
349800823
32K x 8
CMOS
MN
TSOP PHIL-M
28
80
116
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.65V
MPD
SYNC
CY7C1399-VC
MR82003 9742 619708394
32K x 8
CMOS
MN
SOJ
PHIL-M
28
96
493
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
SYNC
CY7C1399-ZC
98206
9823 349800821
32K x 8
CMOS
MN
TSOP PHIL-M
28
336
500
45
40
0
0
349800822
32K x 8
CMOS
MN
TSOP PHIL-M
28
336
500
45
40
0
0
349800823
32K x 8
CMOS
MN
TSOP PHIL-M
28
336
500
45
40
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
SYNC
CY7C1399-VC
MR82040 9742 619708394
32K x 8
CMOS
MN
SOJ
PHIL-M
28
168
80
0
MR83074 9816 619804105
32K x 8
CMOS
MN
SOJ
PHIL-M
28
168
80
0
Page 26 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R31
TC2
-65C TO 150C
MPD
SYNC
CY7C1399-VC
CY7C1399-ZC
MR82039 9742 619708394
32K x 8
CMOS
MN
SOJ
PHIL-M
28
300
50
0
MR83075 9816 619804105
32K x 8
CMOS
MN
SOJ
PHIL-M
28
300
50
0
98206
9823 349800821
32K x 8
CMOS
MN
TSOP PHIL-M
28
300
45
0
349800822
32K x 8
CMOS
MN
TSOP PHIL-M
28
300
45
0
349800823
32K x 8
CMOS
MN
TSOP PHIL-M
28
300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 27 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32
HAST
140C/5.5V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY62128-SC
CY7C109-VC
98154
98207
9821 619805763
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
128K x 8
CMOS
MN
SOIC TAIWAN-G
32
128
50
0
619805764L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
128
50
0
619805765L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
128
50
0
9815 519803680
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
44
0 1 Thermal EOS
519804082
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.45V
150C/5.75V
MPD
MPD
SYNC
CY6157R202V0-ZC 98364
COMDTY CY62128-SC
98154
98265
9828 619808086
256K/2M ROM CMOS
MN
TSOP KOREA-GQ
32
48
3956
1 ***** FA IS PENDING *****
619808087
256K/2M ROM CMOS
MN
TSOP KOREA-GQ
32
48
2679
0
9830 619808759
256K/2M ROM CMOS
MN
TSOP KOREA-GQ
32
48
2892
0
9821 619805763
128K x 8
CMOS
MN
SOIC TAIWAN-G
32
80
500
120
120
0
0
619805764L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
80
500
120
120
0
0
619805765L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
80
500
120
120
0
0
9827 619807408D 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
1233
0
9828 619807508D 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
1190
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.8V
125C/5.75
MPD
MPD
COMDTY CY62256V-ZC
COMDTY CY62256-SNC
MR82011 9807 619801398
32K x 8
CMOS
MN
TSOP CSPI-G
28
96
484
0
MR83007 9807 619801398
32K x 8
CMOS
MN
TSOP CSPI-G
28
96
500
0
MR82012 9809 519802034
32K x 8
CMOS
CA
NSOI INDNS-O
28
96
96
150
153
0 3 Test Program Revision
0
Page 28 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R32
HTOL2
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
125C/5.75
MPD
COMDTY CY7C109-VC
MR83021 9825 519806900
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
96
239
0
125C/5.75V
MPD
COMDTY CY62256V-NSC
MR83022 9803 519800428
32K x 8
CMOS
MN
NSOI INDNS-O
28
96
453
0
125C/6.5V
MPD
COMDTY CY7C109-VC
97438
9745 519712349D 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
96
742
0
9746 519712283D 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
96
648
0
9752 519714712d 128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
96
849
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
COMDTY CY62128-SC
CY7C109-VC
98154
98207
9821 619805763
128K x 8
CMOS
MN
SOIC TAIWAN-G
32
336
50
0
619805764L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
336
50
0
619805765L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
336
1000
50
45
0
0
9815 519803680
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
336
1000
45
40
0
0
519804082
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
336
1000
45
40
0
0
519804109
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
336
1000
45
40
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62256-SNC
CY62256V-NSC
CY62256V-ZC
MR83097 9820 519805349
32K x 8
CMOS
CA
NSOI INDNS-O
28
168
79
0
MR82076 9745 519712511
32K x 8
CMOS
MN
NSOI INDNS-O
28
96
168
80
77
0 1 Test Program Revision
0
MR83054 9803 499802341
32K x 8
CMOS
MN
NSOI INDNS-O
28
168
80
0
MR82070 9807 619801398
32K x 8
CMOS
MN
TSOP CSPI-G
28
168
80
0
MR83024 9807 619801398
32K x 8
CMOS
MN
TSOP CSPI-G
28
96
80
0
Page 29 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R32
PCT
121C/100%RH
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1009-ZC
98192
-
619804698
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
128K x 8(5) CMOS
MN
TSOP PHIL-GW
32
168
45
0
619804698L 128K x 8(5) CMOS
MN
TSOP PHIL-GW
32
168
168
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62128-SC
CY62256V-NSC
CY62256V-ZC
CY7C1009-ZC
CY7C109-VC
98154
9821 619805763
128K x 8
CMOS
MN
SOIC TAIWAN-G
32
300
50
0
619805764L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
300
50
0
619805765L 128K x 8
CMOS
MN
SOIC TAIWAN-G
32
300
50
0
MR82075 9745 519712511
32K x 8
CMOS
MN
NSOI INDNS-O
28
300
50
0
MR83055 9803 499802341
32K x 8
CMOS
MN
NSOI INDNS-O
28
300
51
0
MR82069 9807 619801398
32K x 8
CMOS
MN
TSOP CSPI-G
28
300
50
0
MR83025 9807 619801398
32K x 8
CMOS
MN
TSOP CSPI-G
28
300
50
0
98192
128K x 8(5) CMOS
MN
TSOP PHIL-GW
32
300
45
0
619804698L 128K x 8(5) CMOS
MN
TSOP PHIL-GW
32
300
300
45
45
0
0
98207
-
619804698
9815 519803680
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
45
0
519804082
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
45
0
519804109
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
44
1 1 Topside Crack
MR82045 9807 519801541
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 30 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R32D
HTOL
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
150C/3.80V
MPD
SYNC
CY7C1399-VC
97508
9732 619706098
32K x 8
CMOS
MN
SOJ
CSPI-R
28
48
1010
150C/5.75V
MPD
COMDTY CY7C1599-VC
97508
9740 619707953
32K x 8(5)
CMOS
MN
SOJ
CSPI-R
28
48
998
9746 619709540
32K x 8(5)
CMOS
MN
SOJ
CSPI-R
28
48
1534
0
1 1 EOS/1 Non Visual
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.5V
MPD
COMDTY CY7C1049-VC
M82057
9747 619709647
512K x 8
CMOS
MN
SOJ
KOREA-L
36
96
500
120
120
0
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 31 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R33
TC2
-65C TO 150C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1021V33-VC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
MR83015 9731 619705415
64K x16
CMOS
MN
SOJ
TAIWN-G
44
300
60
0
MR83016 9740 619707946
64K x16
CMOS
MN
SOJ
TAIWN-G
44
300
60
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 32 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42
HTOL
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
150C/3.8V
MPD
COMDTY CY62148V-SC
98112
9826 619806743
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
48
48
48
48
48
188
301
323
323
390
0
0
0
0
0
150C/5.75V
MPD
COMDTY CY62148-SC
98111
9827 619807424
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
500
120
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
MPD
COMDTY CY62148-SC
98111
9827 619807424
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
96
1595
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY62148-SC
CY62148V-SC
98111
9827 619807424
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
168
48
0
98112
9826 619806743
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
168
46
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY62148-SC
CY62148V-SC
98111
9827 619807424
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
300
48
0
98112
9826 619806743
512K x 8
CMOS
MN
SOIC TAIWAN-G
32
300
48
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 33 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- ----SRAM/LOGIC-R42D
HAST
130C/3.63V
140C/
MPD
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SYNCHR CY7C1350-AC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
98231
9824 619805770
128K x 36
CMOS
MN
TQFP CSPI-R
100
128
256
45
44
1 1 Poly Fuse Defect
0
98357
619808643
128K x 36
CMOS
MN
TQFP CSPI-R
100
128
48
0
64K x16
CMOS
MN
TSOP KOREA-H
44
128
79
0
COMDTY CY7C1021V33-ZSC MR82050 9816 619803608
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.8V
MPD
SYNCHR CY7C1350-AC
CY7C1352-AC
98357
98357
9824 619805770
128K x 36
CMOS
MN
TQFP CSPI-R
100
48
80
500
750
393
390
0
1 1 Unknown Cause/1 EOS
0
9828 619807192
128K x 36
CMOS
MN
TQFP CSPI-R
100
48
48
80
548
288
396
396
396
0
0
0
0
9832 619809153
128K x 36
CMOS
MN
TQFP CSPI-R
100
48
66
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/3.8V
MPD
COMDTY CY7C1021V33-VC
98261
9833 619808408
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
906
906
0
0
619808409
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
950
950
0
0
619808410
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
905
905
0
0
619808411
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
923
923
0
0
619808412
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
979
979
0
0
619808413
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
962
963
0
0
619808414
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
1040
1041
0
0
Page 34 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R42D
HTOL2
125C/3.8V
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
COMDTY CY7C1021V33-VC
98261
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9833 619808415
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
1081
1081
0
0
619808416
64K x16
CMOS
MN
SOJ
CSPI-R
44
96
96
986
986
0
0
CY7C1021V33-ZSC MR82047 9816 619803608
64K x16
CMOS
MN
TSOP KOREA-H
44
96
494
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
SYNCHR CY7C1350-AC
98231
9824 619805769
128K x 36
CMOS
MN
TQFP CSPI-R
100
336
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
MPD
COMDTY CY7C1021V33-ZSC MR82052 9816 619803608
64K x16
CMOS
MN
TSOP KOREA-H
44
168
76
0
MR83085 9812 619802905
64K x16
CMOS
MN
TSOP KOREA-H
44
168
80
0
98357
128K x 36
CMOS
MN
TQFP CSPI-R
100
168
288
45
45
0
0
SYNCHR CY7C1352-AC
619808642
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
MPD
SYNCHR CY7C1350-AC
98231
9824 619805769
128K x 36
CMOS
MN
TQFP CSPI-R
100
100
200
45
45
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
MPD
COMDTY CY7C1021V33-ZSC MR82052 9816 619803608
64K x16
CMOS
MN
TSOP KOREA-H
44
300
50
0
MR83086 9812 619802905
64K x16
CMOS
MN
TSOP KOREA-H
44
300
50
0
98231
9824 619805769
128K x 36
CMOS
MN
TQFP CSPI-R
100
300
45
0
619805770
128K x 36
CMOS
MN
TQFP CSPI-R
100
300
45
0
9828 619807192
128K x 36
CMOS
MN
TQFP CSPI-R
100
300
45
0
9824 619805769
128K x 36
CMOS
MN
TQFP CSPI-R
100
300
45
0
SYNCHR CY7C1350-AC
98357
Page 35 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
SRAM/LOGIC-R42D
TC2
-65C TO 150C
MPD
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SYNCHR CY7C1350-AC
98357
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9824 619805770
128K x 36
CMOS
MN
TQFP CSPI-R
100
300
45
0
9828 619807192
128K x 36
CMOS
MN
TQFP CSPI-R
100
300
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 36 of
39
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R42HD HAST
CY7C1011-ZC
140C/5.5V
MPD
SYNC
98313
9817 619804340
128K x 16
CMOS
MN
TSOP KOREA-H
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- ------------------------44
128
50
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75
150C/5.75V
MPD
DCD
MPD
COMDTY CY7C1020-ZSC
DPORT
CY7C038-AC
COMDTY CY7C1009-VC
CY7C1020-ZSC
SYNC
CY7C1011-ZC
98077
98368
98382
98077
98313
9816 619803865
32K x16
CMOS
MN
TSOP KOREA-H
44
48
500
0
619803866
32K x16
CMOS
MN
TSOP KOREA-H
44
48
500
0
9817 619803867
32K x16
CMOS
MN
TSOP KOREA-H
44
48
500
0
9826 619806813
64K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
48
289
0
9829 619808005
64K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
48
1234
0
9834 619809780
256K x 4
CMOS
MN
SOJ
CSPI-R
32
48
1000
1 ***** FA IS PENDING *****
619809782
256K x 4
CMOS
MN
SOJ
CSPI-R
32
48
1000
0
619809783
CSPI-R
256K x 4
CMOS
MN
SOJ
32
48
1000
0
9816 619803865
32K x16
CMOS
MN
TSOP KOREA-H
44
80
120
0
619803866
32K x16
CMOS
MN
TSOP KOREA-H
44
80
120
0
9817 619803867
32K x16
CMOS
MN
TSOP KOREA-H
44
80
120
0
9825 619806805
128K x 16
CMOS
MN
TSOP KOREA-H
44
48
1021
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL2
125C/5.75V
MPD
COMDTY CY7C1021-VC
98263
9825 619807027
64K x16
CMOS
MN
SOJ
SYNC
98313
9825 619806805
128K x 16
CMOS
MN
TSOP KOREA-H
CY7C1011-ZC
CSPI-R
44
96
1545
0
44
96
452
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
MPD
SYNC
CY7C1011-ZC
98297
9829 619807660
Page 37 of
128K x 16
39
CMOS
MN
TSOP CSPI-R
44
336
49
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------SRAM/LOGIC-R42HD PCT
121C/100%RH
DCD
DPORT
MPD
COMDTY CY7C1020-ZSC
SYNC
CY7C038-AC
98368
9824 619806221
64K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
168
44
0
98077
9816 619803865
32K x16
CMOS
MN
TSOP KOREA-H
44
96
168
45
45
0
0
619803866
32K x16
CMOS
MN
TSOP KOREA-H
44
96
45
0
9817 619803867
32K x16
CMOS
MN
TSOP KOREA-H
44
96
45
0
CY7C109-VC
MR83039 9806 519801396
128K x 8(5) CMOS
MN
SOJ
INDNS-O
32
168
80
0
CY7C1011-ZC
98313
128K x 16
MN
TSOP KOREA-H
44
168
50
0
9817 619804340
CMOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
MPD
SYNC
CY7C1011-ZC
98297
9829 619807660
128K x 16
CMOS
MN
TSOP CSPI-R
44
100
200
50
50
0
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
DCD
DPORT
MPD
COMDTY CY7C1020-ZSC
SYNC
CY7C038-AC
98368
9824 619806221
64K x 18 DP CMOS
MN
TQFP TAIWAN-G 100
300
48
0
98077
9816 619803865
32K x16
CMOS
MN
TSOP KOREA-H
44
300
45
0
619803866
32K x16
CMOS
MN
TSOP KOREA-H
44
300
45
0
9817 619803867
32K x16
CMOS
MN
TSOP KOREA-H
44
300
45
0
CY7C109-VC
MR83040 9806 519801396
128K x 8(5) CMOS
MN
SOJ
32
300
50
0
CY7C1011-ZC
98297
9829 619807660
128K x 16
CMOS
MN
TSOP CSPI-R
44
300
50
0
619807703
128K x 16
CMOS
MN
TSOP CSPI-R
44
300
50
0
Page 38 of
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INDNS-O
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1998
Issued: 11/12/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 3, 1998
Divi- FuncTechnology
Test
Test Condition
sion tion
---------------- ------ ---------------- ----- -----
Assembly
ProWfr Pkg Assy
Device
Eval#
D/C Lot No
Description cess
Loc type Loc
--------------- ------- ---- ---------- ----------- ------ --- ---- -------
SRAM/LOGIC-R42HD TC2
CY7C1011-ZC
-65C TO 150C
MPD
SYNC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
98297
9829 619807756
128K x 16
CMOS
MN
TSOP CSPI-R
44
300
50
0
98313
9817 619804340
128K x 16
CMOS
MN
TSOP KOREA-H
44
300
50
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 39 of
39