Q4 - 1997

CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
QUARTER 4, 1997
PERFORM PER THE REQUIREMENT OF 25-00008, RELIABILITY MONITOR PROGRAM SPECIFICATION
Marc Hartranft
QA Engineering Department Manager
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
STANDARD STRESS TEST DESCRIPTIONS
TEST
DESCRIPTION
HTOL
HTOL2
HTSSL
HTSSL2
DRET
DRET2
PCT
HAST
TC
TC2
HTS
TEV
High Temp Op Life, 150ºC, 5.75V
High Temp Op Life, 125ºC, 5.75V
High Temp Steady State Life, 150ºC, 5.75V
High Temp Steady State Life, 125ºC, 5.75V
Data Retension Test, Data Bake 165ºC, Plastic
Data Retension Test, Data Bake 250ºC, Hermetic
Pressure Cooker Test, 121ºC, 100%RH, No Bias
Hi-Accel Saturation Test, 140ºC, 85%RH, 5.5V Bias
Temp Cycle, 125ºC to -40ºC
Temp Cycle, 150ºC to -65ºC
High Temp Storage, 165ºC, No Bias
Temperature Extreme Verification
Page 2 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
WAFER FAB AREAS
FAB #
LOCATION
CA
TX
MN
FR
San Jose, California
Round Rock, Texas
Bloomington, Minnesota
MHS, France
ASSEMBLY LOCATION
ID
COMPANY/LOCATION
KOREA-A
ASAT-B
USA-C
PHIL-D
USA-E
INDNS-F
TAIWAN-G
KOREA-H
MALAY-J
THLAND-K
KOREA-L
PHIL-M
USA-N
INDNS-O
USA-P
KOREA-Q
PHIL-R
USA-S
TAIWAN-T
MALAY-U
USA-V
USA-W
ALPHA-X
ALPHA-Y
THLAND-Z
Anam-Buchon/Korea
Asat/Hongkong
Cypress/USA
Dynesem/Philippines
Cypress-Minnesota/USA
Astra/Indonesia
ASE/Taiwan
Hyundai/Korea
ASE/Malaysia
TMS/Thailand
Anam-Seoul/Korea
Anam/Philippines
Express/USA
Omedata/Indonesia
Pantronix/USA
Anam-Bupyong/Korea
Cypress/Philippines
ATM/USA
OSE/Taiwan
Unisem/Malaysia
Aplus/USA
Toshiba/USA
Cypress Bangkok/Thailand
Alphatech/Thailand
Hana/Thailand
Page 3 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
DESCRIPTION OF DATA TABLE COLUMN HEADINGS
COLUMN HEADING
DESCRIPTION OF COLUMN CONTENTS
Division
Test
Test Condition
Device ID
Date Code
Lot Number
Function
Description
Technology
Process
Pkg Material
Pkg Type
Pkg Location
# Pins
Duration
# Test
# Failed
Fail Mode
Cypress Manufacturing Division
Common code for the stress performed. See table on previous page for detail.
Tem/humidity/bias condition for the stress. See table on previous for detail
Cypress part number
Week in which specific lot was marked/sealed/molded.
Manufacturing (assembly) lot number
Generic product family at Cypress
Brief description of device function
Fabrication process technology.
Generic fabrication process
Generic packaging material
Common code for standard package configuration (PDIP=Plastic Dual-In-Line-Package).
Country Location + Initial of assembly house (see table on prvious page for detail).
Pin cont of package in which device is assembled.
Data Readpoint of stress. For Temp Cycle (TC) = Cycles; all other stresses=Hours.
Quantity of devices submitted to this stress/test.
Quantity of devices failing at this specific readpoint.
Failure analysis results from this test, if any.
Page 4 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CPD
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX
PQFP HK-B
160
DRET
165C/NO BIAS
CY7C611A-NC
M73055 9725 349703371
VME
168
1000
77
77
0
0
CY7C63413-PC
97219
9731 519707719/ USB
USB
FAMOS-P26
CMOS
TX
PDIP INDNS-O
40
140C/3.63V
CY2278PAC
97386
9722 619703688
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
TSSO KOREA-L
48
128
128
36
40
0 4 EOS
0
140C/5.5V
CY2276APVC
96513
3705598.A
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
128
50
0
619704633
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-A
56
128
45
0
97385
3705598.A
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
128
50
0
97181
9636 519610991
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SOIC INDNS-O
16
128
45
0
168
76
0
552
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
CY2292SC
CY7C63513-PVC
97219 9729 619705203/ USB
USB
FAMOS-P26
CMOS
TX SSOP CSPI-R
48 128
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.65V
CY2273APVC
96513
97223
9716 3705598
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-A
48
48
48
48
48
48
80
500
120
120
120
120
150
120
120
0
0
0
0
0
0
0
9724 619704148
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP TAIWAN-T
48
48
48
48
48
48
48
48
48
500
34
34
34
34
34
72
116
150
116
0
0
0
0
0
0
0
0
0
9716 3705598
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-A
48
48
48
48
48
48
80
500
120
120
120
120
150
120
120
0
0
0
0
0
0
0
Page 5 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
CPD
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP TAIWAN-T
48
48
48
48
48
48
48
48
48
500
34
34
34
34
34
72
116
150
116
0
0
0
0
0
0
0
0
0
HTOL
TTECH
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
150C/3.65V
CY2273APVC
97223
9724 619704148
150C/5.50V
CY7C63101-SC
97223
9714 219703088/ USB
USB
FAMOS-P26
CMOS
TX
SOIC ALPHA-X
24
48
993
0 5 EOS
150C/5.75V
CY7C63413-PC
97219
9730 519707928/ USB
USB
FAMOS-P26
CMOS
TX
PDIP INDNS-O
40
48
48
80
510
510
120
0
0
0
9731 519707719/ USB
USB
FAMOS-P26
CMOS
TX
PDIP INDNS-O
40
48
410
0
48
614
0
80
116
0
500
116
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
CY2276APVC
97385
9725 619702200
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
556
1000
46
52
0
0
CY2278PAC
97386
9722 619703688
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
TSSO KOREA-L
48
336
1000
49
47
0
0
CY2292SC
97181
9636 519610991
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SOIC INDNS-O
16
CY7C63413-PC
97219
9730 519707928/ USB
USB
FAMOS-P26
CMOS
TX
PDIP INDNS-O
40
9731 519707719/ USB
USB
FAMOS-P26
CMOS
TX
PDIP INDNS-O
40
CMOS
TX
PQFP HK-B
336
48
0
1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/5.25V
80
168
76
76
0
0
80
76
0
168
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY7C611A-NC
M73056 9725 349703371
VME
RISC CONTRL SRAM/LOGIC-L20
160
96
168
77
72
5 5 LIFTING BOND/S
0 2 EXTERNAL CONTAMINATION
M74063 9728 349703682 VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX PQFP HK-B
160
96
76
0 39 EXTERNAL CONTAMINATION
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY2276APVC
97385
9725 619702200
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
Page 6 of 25
CMOS
MN
SSOP KOREA-L
56
100
51
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
CPD
T/S
-55C TO 150C
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY2276APVC
97385
9725 619702200
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
200
51
0
CY2278PAC
97386
9722 619703688
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
TSSO KOREA-L
48
100
200
47
47
0
0
CY2292SC
97181
9636 519610991
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SOIC INDNS-O
16
100
48
0
200
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC
-40C TO 125C
CY7C611A-NC
M73054 9725 349703371
VME
RISC CONTRL SRAM/LOGIC-L20
CMOS
TX
PQFP HK-B
500
48
0
1500
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65C TO 150C
CY2276APVC
96513
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
300
1000
50
50
0
0
3713782.03 TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-A
56
300
1000
47
47
0
0
9714 3701143.03 TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
300
1000
50
50
0
0
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
300
1000
50
50
0
0
3713782.03 TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-A
56
300
1000
47
47
0
0
97385
CY2278PAC
CY2292SC
97386
97181
3705598.A
3705598.A
160
9725 619702200
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SSOP KOREA-L
56
300
1000
50
50
0
0
9722 619703688
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
TSSO KOREA-L
48
300
1000
47
47
0
0
619703689
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
TSSO KOREA-L
48
300
1000
47
46
0
0
619703690
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
TSSO KOREA-L
48
300
1000
45
45
0
0
9636 519610991
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SOIC INDNS-O
16
300
1000
48
48
0
0
519610992
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SOIC INDNS-O
16
300
1000
48
48
0
0
519610993
TTECH
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SOIC INDNS-O
16
300
48
0
Page 7 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
CPD
CLOCK SYN.
SRAM/LOGIC-L28
CMOS
MN
SOIC INDNS-O
16 1000
48
0
USB
FAMOS-P26
CMOS
TX
SSOP CSPI-R
48
46
46
0
0
TC2
-65C TO 150C
CY2292SC
97181
9636 519610993
TTECH
CY7C63513-PVC
97219
9729 619705203/ USB
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
300
1000
9730 619705383 USB
USB
FAMOS-P26
CMOS
TX SSOP CSPI-R
48 300
45
0
1000
45
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 8 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
DCD
HAST
140C/5.5V
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY101E383-JC
97264
9625 349608970
CHNL
ECL/TTL
BICMOS-SM1
BiCMOS TX
PLCC KOREA-A
84
128
128
20
30
0
0
CY7B4663-JC
96392
9713 519703469
ENET
TRANSCEIVER BICMOS-SM1
BiCMOS TX
PLCC INDNS-O
28
128
50
0
CY7C136-JC
M74002 9716 349616269
SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN
PLCC PHIL-M
52
128
78
0
CY7C4245-AC
M73084 9729 619704796
SPCM
4Kx18 FIFO
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
64
128
128
38
40
0
0
CY7C4285-JC
97235
9736 219709635
SPCM
64Kx18 FIFO SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
64
128
128
18
30
0
0
CY7C466A-JC
97222
9735 219709366
SPCM
64Kx9 FIFO
SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
32
CY7C0251-AC
97382
9732 619705578P SPCM
8K x 16 DP
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
100
48
427
1 1 UNKNOWN
9736 619706519P SPCM
8K x 16 DP
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
100
48
459
1 1 PARTICLE
619706520P SPCM
8K x 16 DP
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
100
48
472
0
8K x 9 DP
SRAM/LOGIC-R28
CMOS
MN
PLCC KOREA-A
68
48
80
500
1010
120
120
0
0
0
SRAM/LOGIC-R30
CMOS
MN
LCC
ALPHA-X
32
48
48
48
80
184
500
324
333
372
126
48
126
0
4 4 PKG CHIP OUT
0
0 4 EOS
0
0
128
36
0
128
58
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY7C145-JC
97414
9747 619709746
CY7C4271-LMB
97242
9721 219705179/ SPCM
32KX9 FIFO
CY7C4285-JC
97235
9736 219709635
SPCM
64Kx18 FIFO SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
64
80
500
394
394
0
0
9743 219711234
SPCM
64Kx18 FIFO SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
64
80
500
383
383
0
0
9735 219709366
SPCM
64Kx9 FIFO
CMOS
MN
PLCC ALPHA-X
32
80
500
400
400
0
0
CY7C466A-JC
97222
SPCM
SRAM/LOGIC-R32D
9739 219710431 SPCM
64Kx9 FIFO SRAM/LOGIC-R32D CMOS
MN PLCC ALPHA-X
32
80
400
0
500
400
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 9 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
DCD
HTOL2
125C/5.75V
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY101E383-JC
97264
9625 349608970
CHNL
ECL/TTL
BICMOS-SM1
BiCMOS TX
PLCC KOREA-A
84
96
96
327
678
0
0
CY101E383-NC
97264
9716 619702398
CHNL
ECL/TTL
BICMOS-SM1
BiCMOS TX
PQFP HK-B
80
168
168
1000
1000
120
238
119
236
0
0
0 5 THERMAL EOS
0 2 EOS
125C/6.50
CY7B4663-JC
96392
9713 519703469
ENET
TRANSCEIVER BICMOS-SM1
BiCMOS TX
PLCC INDNS-O
28
80
500
118
118
0
0
125C/6.50V
CY7B4663-JC
96392
9713 519703469
ENET
TRANSCEIVER BICMOS-SM1
BiCMOS TX
PLCC INDNS-O
28
150C/5.50V
CY7B4663-JC
96392
9713 519703469
ENET
TRANSCEIVER BICMOS-SM1
BiCMOS TX
PLCC INDNS-O
28
80
168
78
78
0
0
CY7C4285-JC
97235
9736 219709635
SPCM
64Kx18 FIFO SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
64
80
168
162
162
0
0
CY7C466A-JC
97222
9735 219709366
SPCM
64Kx9 FIFO
SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
32
80
160
0
CY7C4271-LMB
97242
9721 219705179/ SPCM
32KX9 FIFO
SRAM/LOGIC-R30
CMOS
MN
LCC
ALPHA-X
32
80
168
78
78
0
0
CY7C4285-JC
97235
9743 219711234
SPCM
64Kx18 FIFO SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
64
80
168
162
162
0
0
CY7C466A-JC
97222
9735 219709366
SPCM
64Kx9 FIFO
CMOS
MN
PLCC ALPHA-X
32
168
160
0
48
477
0
48
480
0
48
556
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/5.75V
SRAM/LOGIC-R32D
9739 219710431 SPCM
64Kx9 FIFO SRAM/LOGIC-R32D CMOS
MN PLCC ALPHA-X
32
80
160
0
168
160
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.75V
CY101E383-JC
97264
9625 349608970
CHNL
ECL/TTL
BICMOS-SM1
BiCMOS TX
PLCC KOREA-A
84
168
80
0
336
78
0 1 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
CY7B8392-JC
M74076 9716 519704354
ENET
TRANSCEIVER BICMOS-SM1
BiCMOS TX
PLCC INDNS-O
28
96
168
76
76
0
0
CY7C136-JC
M74003 9716 349616269
SPCM
2K x 8 DP
SRAM/LOGIC-R28
CMOS
MN
PLCC PHIL-M
52
96
168
78
78
0
0
CY7C4245-AC
M74059 9729 619705320
SPCM
4Kx18 FIFO
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
64
96
77
0
121C/100%RH
Page 10 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
DCD
PCT
121C/100%RH
CY7C4245-AC
M74059 9729 619705320 SPCM
4Kx18 FIFO SRAM/LOGIC-R28
CMOS
MN TQFP KOREA-Q
64 168
77
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CY7C4271-LMB
97242
9721 219705179/ SPCM
32KX9 FIFO
SRAM/LOGIC-R30
CMOS
-65C TO 150C
CY101E383-JC
97264
9526 349512318
CHNL
ECL/TTL
BICMOS-SM1
9625 349608970
CHNL
ECL/TTL
BICMOS-SM1
349608976
CHNL
ECL/TTL
MN
LCC
ALPHA-X
32
100
1000
48
48
0
0
BiCMOS TX
PLCC KOREA-A
84
300
48
0
BiCMOS TX
PLCC KOREA-A
84
300
50
0
BICMOS-SM1
BiCMOS TX
PLCC KOREA-A
84
300
50
0
CY7B4663-JC
96392
9713 519703469
ENET
TRANSCEIVER BICMOS-SM1
BiCMOS TX
PLCC INDNS-O
28
300
49
0
CY7B991-JC
M74071 9733 219708729
CHNL
PSCB
BICMOS-SM1
BiCMOS TX
PLCC ALPHA-X
32
300
500
1000
46
46
46
0
0
0
CY7C4245-AC
M74061 9729 619705320
SPCM
4Kx18 FIFO
SRAM/LOGIC-R28
CMOS
MN
TQFP KOREA-Q
64
300
500
1000
46
46
46
0
0
0
CY7C4285-JC
97235
9736 219709635
SPCM
64Kx18 FIFO SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
64
300
1000
90
90
0
0
9743 219711234
SPCM
64Kx18 FIFO SRAM/LOGIC-R32D
CMOS
MN
PLCC ALPHA-X
64
300
1000
92
92
0
0
9735 219709366
SPCM
64Kx9 FIFO
CMOS
MN
PLCC ALPHA-X
32
300
1000
94
94
0
0
CY7C466A-JC
97222
SRAM/LOGIC-R32D
9739 219710431 SPCM
64Kx9 FIFO SRAM/LOGIC-R32D CMOS
MN PLCC ALPHA-X
32 300
90
0
1000
90
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY7B991-JC
M74065 9733 219708729
CHNL
PSCB
BICMOS-SM1
-5
116
1 1 UNKNOWN
25
116
0
85
115
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 11 of 25
BiCMOS TX
PLCC ALPHA-X
32
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
MPD
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
DRET
165C/NO BIAS
CY27H256-PC
96404
9713 519703206/ PROM
32K x 8
FAMOS-P26
CMOS
TX
PDIP INDNS-O
28
168
76
0
552
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------DRET2
250C/NO BIAS
CY27C010-WMB
97371
9735 219709517
128K x 8
FAMOS-P26
CMOS
TX
WCER PHIL-M
32
CY27H256-WC
96404
9712 219702752/ PROM
32K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
28
140C/3.0V
CY7C1021V33-VC
97211
9727 619704310
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
44
128
256
64
64
0
0
140C/3.3V
CY7C1399-ZC
M73044 9645 349613772
SYNC
SRAM/LOGIC-R31
CMOS
CA
TSOP PHIL-M
28
128
128
8
72
0 1 EOS
0
140C/3.63V
CY62128V-SC
97195
9732 619705603
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
128
47
0
CY62256V-VC
97412
9740 619708054
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
128
256
45
45
0
0
619708055
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
128
256
45
45
0
0
619708056
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
128
256
45
45
0
0
9745 619709132/ COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
128
256
45
45
0
0
619709356/ COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
128
256
47
47
0
0
PROM
96
96
168
168
28
48
28
48
0
0
0
0
96
76
0
168
76
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HAST
32K x 8
TAIWN-G
CY62256V-ZI
M74057 9721 349702963
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
128
77
0
CY7C1399-VC
M74043 9727 619704667
SYNC
SRAM/LOGIC-R31
CMOS
MN
SOJ
28
128
77
0
140C/3.6V
CY62128V-SC
97195
9732 619705603
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
256
47
0
140C/5.5V
CY27C010-JC
97371
9735 349704701
PROM
128K x 8
FAMOS-P26
CMOS
TX
PLCC PHIL-M
32
128
47
0
CY27H256-JC
96404
9712 219702832
PROM
32K x 8
FAMOS-P26
CMOS
TX
PLCC ALPHA-X
32
128
48
0
CY62128-SC
97195
9731 619705451
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
128
45
0
32K x 8
Page 12 of 25
PHIL-M
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HAST
140C/5.5V
CY62128-SC
97195
CY62256-SNC
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
128
256
47
45
0
0
M74008 9732 519707894
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
128
77
0
CY7C1009-VC
M74019 9732 619705971
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
CSPI-R
32
128
77
0
CY7C1021V33-VC
97211
9730 619705012
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
128
96
0
CY7C1049-VC
97344
9740 619707668
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
KOREA-L
36
128
256
50
50
0
0
9741 619708016
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
KOREA-L
36
128
256
384
49
49
49
0
0
0
97383
9731 519708179
COMDTY 128K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
128
49
0
97411
9731 519708180
COMDTY 128K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
128
256
48
48
0
0
M74025 9734 519708340
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
128
77
0
97348
9726 619703878
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
32
128
48
0
97351
9735 349704960
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-GQ
32
128
48
0
SYNC
SRAM/LOGIC-R31
CMOS
CA
TSOP PHIL-M
28
128
65
0
SRAM/LOGIC-R32D
CMOS
MN
SOJ
CSPI-R
28
128
256
47
47
0
0
CY7C109-VC
CY7C109-ZC
9731 619705451
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
CY7C1399-ZI
M72053 9704 349700156
CY7C1599-VC
97202
CY7C185-VI
M74030 9734 519708252
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
SOJ
INDNS-O
28
128
77
0
CY7C186-ZC
M72029 9713 619701453
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
128
128
22
56
0
0
M73019 9723 619703886
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
128
77
0
M74013 9725 619704309
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
128
76
0
97476
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
128
128
45
48
0
0
9736 619707330/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
128
256
48
48
0
0
CY7C199-VC
32K x 8
9727 619704763/ COMDTY 32K x 8(5)
619708288
Page 13 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HAST
140C/5.5V
CY7C199-VC
97476
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9740 619707989
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
128
128
45
50
0
0
9744 619708989
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
128
47
0
M72006 9715 619702274/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
128
79
M73003 9720 219704818
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
ALPHA-X
28
128
128
23
52
1 1 EOS/1 TOP SIDE DEFECT
0
M73006 9724 619703780
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
128
77
2 2 TOP SIDE DEFECT
M74049 9729 619705121
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
128
128
21
56
0
0
34 34 TOP SIDE DEFECT
CY7C199-ZI
M74036 9730 619705361 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP CSPI-R
28 128
77
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/3.80V
150C/5.75V
CY62128V-SC
97195
9732 619705603
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
48
80
80
500
500
500
407
121
121
12
121
395
0
0
0
0
0
0
CY7C1021V33-VC
97211
9727 619704310
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
80
500
1000
2000
538
538
527
526
0
1 1 UNKNOWN
0
0 1 EOS
9730 619705012
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
80
500
528
528
0
1 1 UNKNOWN
9733 619705819
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
80
500
525
525
0
0
9735 349704701
PROM
128K x 8
FAMOS-P26
CMOS
TX
PLCC PHIL-M
32
48
531
0 5 EOS
9738 519705071
PROM
128K x 8
FAMOS-P26
CMOS
TX
PLCC PHIL-M
32
48
510
0
CY27C010-JC
97371
CY27C010-WMB
97371
9735 219709517
PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER PHIL-M
32
184
47
0
CY27H256-PC
96404
9713 519703206
PROM
32K x 8
FAMOS-P26
CMOS
TX
PDIP INDNS-O
28
80
500
116
116
0
0
519703206/ PROM
32K x 8
FAMOS-P26
CMOS
TX
PDIP INDNS-O
28
48
500
0
Page 14 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
MPD
32K x 8
HTOL
150C/5.75V
CY27H256-WC
96404
9712 219702752/ PROM
CY62128-SC
97195
9731 619705451
9735 349704738
CY62256-SNC
97397
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
FAMOS-P26
CMOS
TX
WCER ALPHA-X
28
48
80
500
500
116
116
0
0
0
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
48
48
80
500
500
1000
2000
25
510
121
121
198
121
121
0
0
0
0
0
0
0
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
48
498
0
9735 519709206/ COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
48
3589
1 5 EOS/1 UNKNOWN
519709289/ COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
48
3600
0
519709341/ COMDTY 32K x 8
0
SRAM/LOGIC-R32
CMOS
MN
NSOI INDNS-O
28
48
3600
CY7C1009-VC
97411
9736 619706411
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOJ
32
80
500
522
522
CY7C1048-FJMB
97229
9724 219705887
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
CSOJ ALPHA-X
32
184
45
97315
9724 219705887
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
CSOJ ALPHA-X
32
80
80
184
500
500
116
291
45
114
291
2 1 CRACKED DIE/1 BROKEN BO
0 5 EOS
0
0
0 4 EOS
CY7C1599-VC
97202
9727 619704763/ COMDTY 32K x 8(5)
SRAM/LOGIC-R32D
CMOS
MN
SOJ
CSPI-R
28
80
500
1000
125
124
114
0
0 1 EOS
0
CY7C199-VC
97476
9736 619707330/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
48
80
500
1000
535
535
533
120
0
0
0 2 EOS
0
9740 619707989
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
48
80
500
535
527
527
0
0
0
9742 519711442D COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
INDNS-O
28
48
80
500
540
540
534
0
0
0 5 EOS
Page 15 of 25
TAIWAN-G
0
0 1 EOS
0
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------MPD
HTOL2
125C/3.80V
CY7C1399-ZI
M72052 9704 349700156
SYNC
32K x 8
SRAM/LOGIC-R30
CMOS
CA
TSOP PHIL-M
28
96
500
1000
2000
113
113
113
113
0
0
0
0
125C/5.75V
CY27C010-PC
M72009 9707 349700791
PROM
128K x 8
FAMOS-P26
CMOS
TX
PDIP KOREA-H
32
96
500
1000
2000
118
118
118
100
0
0
0
0 18 EOS
CY27H010-WC
M73069 9727 219706861/ PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
32
96
500
1000
2000
120
120
120
120
0
0
0
0
CY62256-SNC
M72080 9721 519705680
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
96
500
1000
2000
120
120
120
119
0
0
0
0
M73038 9720 519705368
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
96
500
1000
2000
120
120
119
119
0
0
0
0
CY7C1009-VC
M72086 9647 349613727
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
96
500
1000
2000
123
123
122
122
0
1 1 SPEED DEGRADATION
0
0
CY7C109-VC
M73034 9722 519705873
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
96
500
1000
2000
120
120
120
119
0
0
0
0 1 EOS
CY7C185-45PC
M72068 9717 219703823
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
96
500
1000
2000
120
120
120
120
0
0
0
0
M73028 9723 219705968
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
96
500
1000
2000
119
119
119
119
0
0
0
0
Page 16 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HTOL2
125C/5.75V
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C199-VC
M73032 9724 619703780
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
96
500
1000
2000
120
120
120
120
0
0
0
0
CY7C199-ZC
M73076 9721 349703035
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
TSOP PHIL-M
28
CY62128-SC
97195
9731 619705451
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
336
1000
45
45
0
0
CY7C1021V33-VC
97211
9727 619704310
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
336
1000
48
48
0
0
CY7C109-VC
97383
9731 519708179
COMDTY 128K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
336
500
1000
49
48
48
0
0
0
CY7C109-ZC
97348
9726 619703878
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
32
336
1000
48
48
0
0
CY7C1599-VC
97202
9727 619704763/ COMDTY 32K x 8(5)
SRAM/LOGIC-R32D
CMOS
MN
SOJ
CSPI-R
28
336
1000
48
48
0
0
CY7C199-VC
97476
9736 619707330/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
CY7C1021V33-VC
97211
9727 619704310
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
80
168
160
160
0
0
9730 619705012
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
80
168
160
160
0
0
9733 619705819
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
80
168
156
156
0
0
96
117
0
500
117
0
1000
117
0
2000
116
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTS
165C/NO BIAS
336
48
0
500
48
0
1000
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL
150C/3.63V
150C/3.80
CY62128V-SC
97195
9732 619705603
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
80
168
78
78
0
0
150C/3.90V
CY62256V-VC
97412
9740 619708054
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
28
80
168
76
76
0
0
Page 17 of 25
CSPI-R
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
HTSSL
150C/3.90V
150C/5.50V
150C/5.75V
CY62256V-VC
97412
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9740 619708055
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
80
168
76
76
0
0
619708056
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
80
168
76
76
0
0
9745 619709132/ COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
80
168
76
76
0
0
619709356/ COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
80
168
77
77
0 1 EOS
0
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
80
168
79
78
0
0
CY7C109-VC
97411
9731 519708180
COMDTY 128K x 8
CY7C199-VC
97476
9736 619707330/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
80
168
81
81
0
0
9740 619707989
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
80
168
80
80
0
0
COMDTY 32K x 8
CY27H256-PC
96404
9713 519703206/ PROM
32K x 8
FAMOS-P26
CMOS
TX
PDIP INDNS-O
28
80
168
78
78
0
0
CY27H256-WC
96404
9712 219702752/ PROM
32K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
28
80
168
77
77
0
0
CY62128-SC
97195
9731 619705451
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
80
168
78
78
0
0
CY7C1048-FJMB
97315
9724 219705887
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
CSOJ ALPHA-X
32
80
168
78
75
0
0
CY7C1599-VC
97202
9727 619704763/ COMDTY 32K x 8(5)
SRAM/LOGIC-R32D
CMOS
MN
SOJ
28
CY62256-SNC
M72081 9721 519705680
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
96
500
1000
2000
118
118
118
118
0
0
0
0
M73039 9720 519705368
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
96
500
1000
2000
120
120
120
120
0
0
0
0
80
80
0
168
79
0 1 EOS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTSSL2 125C/5.50V
Page 18 of 25
CSPI-R
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
HTSSL2 125C/5.50V
CY7C1009-VC
M72087 9647 349613727
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
TAIWN-G
32
96
500
1000
2000
123
123
123
123
0
0
0
0
125C/5.75V
CY27C010-PC
M72010 9707 349700791
PROM
128K x 8
FAMOS-P26
CMOS
TX
PDIP KOREA-H
32
96
500
1000
2000
119
119
119
101
0
0
0
0 18 EOS
CY27H010-WC
M73070 9727 219706861/ PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
32
96
500
1000
2000
120
120
120
120
0
0
0
0
CY7C185-45PC
M72069 9717 219703823
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
96
500
1000
2000
120
120
120
120
0
0
0
0
CY7C199-VC
M73033 9724 619703780
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
PHIL-M
28
96
500
1000
2000
120
120
119
118
0
1 1 TOPSIDE CRACKS
0
1 1 EOS/1 LIFTING BOND
CY7C199-ZC
M73077 9721 349703035
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
TSOP PHIL-M
28
96
117
0
500
117
0
1000
117
0
2000
117
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------LTOL
-30C/6.5V
CY7C199-VC
97476 9736 619707330/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX SOJ CSPI-R
28 500
45
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------PCT
121C/100%RH
CY62256-SNC
M74007 9732 519707894
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
96
168
77
77
0
0
CY62256V-ZI
M74058 9721 349702963
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
96
168
78
77
0
0
CY7C1009-VC
M74017 9732 619705971
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
CSPI-R
32
96
168
77
77
0
0
CY7C109-VC
M74023 9734 519708340
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
96
168
77
69
6 6 TOPSIDE CRACKS
0
CY7C1399-VC
M74041 9727 619704667
SYNC
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
96
77
0
32K x 8
Page 19 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
MPD
PCT
121C/100%RH
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C1399-VC
M74041 9727 619704667
SYNC
32K x 8
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
168
77
CY7C1399-ZI
M72055 9704 349700156
SYNC
32K x 8
SRAM/LOGIC-R31
CMOS
CA
TSOP PHIL-M
28
96
59
CY7C185-VI
M74031 9734 519708252
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
SOJ
INDNS-O
28
96
168
77
77
0
0
CY7C186-ZC
M74011 9725 619704309
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
96
168
45
45
0
0
CY7C199-VC
M74047 9729 619705121
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
28
CSPI-R
0
18 18 OTHERS
96
77
0
168
77
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------T/S
-55C TO 150C
CY7C109-ZC
97348
9726 619703878
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
32
100
48
0
200
48
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CY27C010-WMB
97371
9735 219709517
PROM
128K x 8
FAMOS-P26
CMOS
TX
WCER PHIL-M
32
100
1000
48
48
0
0
CY27H256-WC
96404
9712 219702752/ PROM
32K x 8
FAMOS-P26
CMOS
TX
WCER ALPHA-X
28
100
1000
46
46
0
0
CY7C1048-FJMB
97229
9724 219705887
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
CSOJ ALPHA-X
32
100
1000
45
45
0
0
97315
9724 219705887
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
CSOJ ALPHA-X
32
100
1000
45
45
0
0
CY27C010-JC
97371
9735 349704701
PROM
128K x 8
FAMOS-P26
CMOS
TX
PLCC PHIL-M
32
300
1000
47
47
0
0
CY27H256-JC
96404
9712 219702832
PROM
32K x 8
FAMOS-P26
CMOS
TX
PLCC ALPHA-X
32
300
1000
48
48
0
0
CY62128-SC
97195
9731 619705451
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
300
45
0
CY62128V-SC
97195
9732 619705603
COMDTY 128K x 8
SRAM/LOGIC-R32
CMOS
MN
SOIC TAIWAN-G
32
300
300
1000
46
47
47
0 1 EOS
0
0
CY62256-SNC
M74009 9732 519707894
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
300
500
1000
46
43
43
0
0
0
-65C TO 150C
Page 20 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
TC2
-65C TO 150C
CY62256V-VC
97412
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
9740 619708054
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
300
1000
90
90
0
0
619708055
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
300
1000
90
90
0
0
619708056
COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
300
1000
90
90
0
0
9745 619709132/ COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
300
90
0
619709356/ COMDTY 32K x 8
SRAM/LOGIC-R42
CMOS
MN
SOJ
CSPI-R
28
300
1000
90
90
0
0
CY62256V-ZC
M74094 9705 349700731
COMDTY 32K x 8
SRAM/LOGIC-R3
CMOS
CA
TSOP PHIL-M
28
300
500
1000
46
46
46
0
0
0
CY62256V-ZI
M74056 9721 349702963
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP PHIL-M
28
300
500
1000
45
45
45
0
0
0
CY7C1009-VC
M74018 9732 619705971
COMDTY 256K x 4
SRAM/LOGIC-R28
CMOS
MN
SOJ
CSPI-R
32
300
500
1000
46
46
46
0
0
0
CY7C1021V33-VC
97211
9727 619704310
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
300
1000
90
90
0
0
9730 619705012
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
300
1000
96
96
0
0
9733 619705819
COMDTY 64K x16
SRAM/LOGIC-R42
CMOS
MN
SOJ
TAIWN-G
44
300
90
0
SRAM/LOGIC-R3
CMOS
MN
PLCC INDNS-O
52
300
1000
1500
2000
2500
3000
3500
4000
4500
46
46
46
46
46
46
46
46
46
0
0
0
0
0
0
0
0
0
SRAM/LOGIC-R32D
CMOS
MN
SOJ
36
300
1000
49
49
0
0
CY7C1031-JC
M72022 9718 519704043
SYNC
CY7C1049-VC
97344
COMDTY 512K x 8
9740 619707668
64K x 18
Page 21 of 25
KOREA-L
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
TC2
-65C TO 150C
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C1049-VC
97344
9741 619708016
COMDTY 512K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
KOREA-L
36
300
1000
49
49
0
0
CY7C107-VC
97383
9732 519708413
COMDTY 1M x 1
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
300
1000
48
48
0
0
519708434
COMDTY 256K x 4
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
300
1000
48
48
0
0
CY7C109-20VC
M73030 9716 619701975
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
KOREA-L
32
300
84
0
CY7C109-VC
97383
9731 519708179
COMDTY 128K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
300
1000
49
49
0
0
97411
9731 519708180
COMDTY 128K x 8
SRAM/LOGIC-R32D
CMOS
MN
SOJ
INDNS-O
32
300
1000
48
48
0
0
M73010 9722 519705873
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
300
48
2 2 TOPSIDE CRACKS
M73043 9725 519706781
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
300
1000
50
42
8 8 TOPSIDE CRACKS
0
M74024 9734 519708340
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
300
46
11 11 TOPSIDE CRACKS
97348
9726 619703876
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
32
300
1000
48
48
0
0
619703877
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
32
300
1000
48
48
0
0
619703878
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-H
32
300
1000
48
48
0
0
9735 349704960
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-GQ
32
300
1000
48
48
0
0
349704961
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-GQ
32
300
1000
48
47
0
0
349704962
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP KOREA-GQ
32
300
1000
48
48
0
0
CY7C109-ZC
97351
CY7C1399-VC
M74042 9727 619704667
SYNC
32K x 8
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
300
500
1000
46
46
46
0
0
0
CY7C1399-ZC
M73045 9645 349613772
SYNC
32K x 8
SRAM/LOGIC-R31
CMOS
CA
TSOP PHIL-M
28
300
50
0
Page 22 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
MPD
TC2
-65C TO 150C
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C1399-ZC
M73045 9645 349613772
SYNC
32K x 8
SRAM/LOGIC-R31
CMOS
CA
TSOP PHIL-M
28 1000
50
0
CY7C1399-ZI
M72054 9704 349700156
SYNC
32K x 8
SRAM/LOGIC-R31
CMOS
CA
TSOP PHIL-M
28
300
48
0
CY7C1599-VC
97202
SRAM/LOGIC-R32D
CMOS
MN
SOJ
28
300
1000
48
48
0
0
CY7C185-45PC
M72071 9717 219703823
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
PDIP ALPHA-X
28
300
1000
48
48
0
0
CY7C185-VI
M74029 9734 519708252
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
SOJ
INDNS-O
28
300
500
1000
46
46
46
0
0
0
CY7C186-ZC
M74012 9725 619704309
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
TSOP KOREA-Q
32
300
500
1000
76
76
76
0
0
0
CY7C199-VC
97476
9736 619707330/ COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
300
1000
48
48
0
0
9740 619707989
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
300
1000
50
50
0
0
M74048 9729 619705121
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
SOJ
CSPI-R
28
300
500
1000
46
46
46
0
0
0
M73079 9721 349703035
COMDTY 256K
SRAM/LOGIC-R3
CMOS
MN
TSOP PHIL-M
28
300
1000
46
45
0
0
CY7C199-ZC
9727 619704763/ COMDTY 32K x 8(5)
CSPI-R
CY7C199-ZI
M74037 9730 619705361 COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN TSOP CSPI-R
28 300
40
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY62256-SNC
M74004 9732 519707894
COMDTY 32K x 8
SRAM/LOGIC-R32
CMOS
CA
NSOI INDNS-O
28
-5
25
85
116
116
116
0
0
0
CY7C109-VC
M74020 9734 519708340
COMDTY 128K x 8
SRAM/LOGIC-R28
CMOS
MN
SOJ
INDNS-O
32
-5
25
85
116
116
115
1 1 UNKNOWN
0
0
CY7C1399-VC
M80108 9744 619709194
SYNC
32K x 8
SRAM/LOGIC-R31
CMOS
MN
SOJ
PHIL-M
28
-5
25
85
117
117
117
0
0
0
CY7C185-VI
M74026 9734 519708252
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
SOJ
INDNS-O
28
-5
116
0
Page 23 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- ----MPD
TEV
0 READ POINT
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
CY7C185-VI
M74026 9734 519708252
COMDTY SML/64K
SRAM/LOGIC-R21
CMOS
TX
SOJ
INDNS-O
28
25
85
116
116
0
0
CY7C199-VC
M80112 9746 619709733
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
TX
SOJ
CSPI-R
28
-5
25
85
117
117
117
0
0
0
CY7C199-ZI
M74032 9730 619705361
COMDTY 32K x 8
SRAM/LOGIC-R28
CMOS
MN
TSOP CSPI-R
28
-5
116
0
25
116
0
85
116
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 24 of 25
CYPRESS SEMICONDUCTOR CORPORATION
PRODUCT RELIABILITY REPORT
Quarter 3, 1997
Issued: 1/20/98
Cypress Semiconductor Corporation
Quarterly Reliability Report
Quarter 4, 1997
DiviAssembly
Funcsion Test
Test Condition
Device
Eval# D/C Lot No
tion
----- ------ ---------------- --------------- ------ ---- ---------- -----
Descr
ProWfr Pkg Assy
Description Technology
cess
Loc type Loc
----------- ---------------- ------ --- ---- -------
PLD
No Dura Qty
Qty
Pin tion Test Fail Fail Mode
--- ---- ----- ---- -------------------------
HAST
140C/5.5V
CY7C341-JI
M72057 9711 619700872
MAX
REPROG.PAL
FAMOS-P20
CMOS
TX
PLCC KOREA-A
84
128
12
0
128
18
0
128
18
0
128
32
1 1 TOP SIDE DEFECT
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------HTOL
150C/5.75V
CY7C341-HMB
97314
9735 219709372
MAX
REPROG.PAL
FAMOS-P20
CMOS
TX
CERQ ALPHA-X
84
48
235
0
219709373
MAX
REPROG.PAL
FAMOS-P20
CMOS
TX
CERQ ALPHA-X
84
48
171
0
FAMOS-P20
CMOS
TX
WPGA ALPHA-X
84
48
183
0
CY7C341-RMB
97314
9735 219709278
MAX
REPROG.PAL
CY7C374I-YMB
97341
9729 219707592
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
CLCC ALPHA-X
84
184
48
0
CY7C375I-UMB
97061
9649 349701384
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
CQFP USA-GA
160
184
50
0
PALCE22V10-DMB
97492
9747 219711972
PLD
FLASH ERAS. FLASH-FL24D
CMOS
TX
CERD ALPHA-X
24
24
72
1103
1100
0
0
219711973
PLD
FLASH ERAS. FLASH-FL24D
CMOS
TX
CERD ALPHA-X
24
24
56
735
735
0
0
219711974
PLD
FLASH ERAS. FLASH-FL24D
CMOS
TX
CERD ALPHA-X
24
FLASH
128 MCEL FL FLASH-FL28D
CMOS
TX
CQFP USA-GA
160
24 1061
0
56 1061
0
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TC2
-65 TO 150C
CY7C375I-UMB
97061
9649 349701384
100
1000
48
48
0
0
-65C TO 150C
CY7C374I-JC
M73058 9704 219700578 FLASH 128 MCEL FL FLASH-FL28D
CMOS
TX PLCC ALPHA-X
84 300
47
1 1 TOPSIDE CRACKS
------------------------------------------------------------------------------------------------------------------------------------------------------------------------------TEV
0 READ POINT
CY7C341-JI
M74079 9735 219709449
MAX
REPROG.PAL
FAMOS-P20
-5
109
0
25
109
0 7 ESD
85
109
0
-------------------------------------------------------------------------------------------------------------------------------------------------------------------------------
Page 25 of 25
CMOS
TX
PLCC ALPHA-X
84