DISCRETE SEMICONDUCTORS DATA SHEET BF909WR N-channel dual-gate MOS-FET Product specification Supersedes data of 1995 Apr 25 File under Discrete Semiconductors, SC07 1997 Sep 05 Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR FEATURES PINNING • Specially designed for use at 5 V supply voltage • Short channel transistor with high forward transfer admittance to input capacitance ratio • Low noise gain controlled amplifier up to 1 GHz • Superior cross-modulation performance during AGC. PIN SYMBOL DESCRIPTION 1 s, b 2 d drain 3 g2 gate 2 4 g1 gate 1 source APPLICATIONS • VHF and UHF applications with 3 to 7 V supply voltage such as television tuners and professional communications equipment. d handbook, halfpage 3 4 DESCRIPTION g2 Enhancement type field-effect transistor in a plastic microminiature SOT343R package. The transistor consists of an amplifier MOS-FET with source and substrate interconnected and an internal bias circuit to ensure good cross-modulation performance during AGC. g1 2 1 Top view s,b MAM192 CAUTION Marking code: ME. The device is supplied in an antistatic package. The gate-source input must be protected against static discharge during transport or handling. Fig.1 Simplified outline (SOT343R) and symbol. QUICK REFERENCE DATA SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT VDS drain-source voltage − − 7 V ID drain current − − 40 mA Ptot total power dissipation − − 280 mW Tj operating junction temperature − − 150 °C yfs forward transfer admittance 36 43 50 mS Cig1-s input capacitance at gate 1 − 3.6 4.3 pF Crs reverse transfer capacitance f = 1 MHz − 30 50 fF F noise figure f = 800 MHz − 2 2.8 dB 1997 Sep 05 2 Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134). SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VDS drain-source voltage − 7 V ID drain current − 40 mA IG1 gate 1 current − ±10 mA IG2 gate 2 current Ptot total power dissipation Tstg Tj − ±10 mA − 280 mW storage temperature range −65 +150 °C operating junction temperature − +150 °C up to Tamb = 50 °C; see Fig.2; note 1 Note 1. Device mounted on a printed-circuit board. MLD150 300 handbook, halfpage Ptot (mW) 200 100 0 0 50 100 150 200 Tamb ( oC) Fig.2 Power derating curve. 1997 Sep 05 3 Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR THERMAL CHARACTERISTICS SYMBOL PARAMETER CONDITIONS VALUE UNIT Rth j-a thermal resistance from junction to ambient note 1 350 K/W Rth j-s thermal resistance from junction to soldering point Ts = 91 °C; note 2 210 K/W Notes 1. Device mounted on a printed-circuit board. 2. Ts is the temperature at the soldering point of the source lead. STATIC CHARACTERISTICS Tj = 25 °C; unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT V(BR)G1-SS gate 1-source breakdown voltage VG2-S = VDS = 0; IG1-S = 10 mA 6 15 V V(BR)G2-SS gate 2-source breakdown voltage VG1-S = VDS = 0; IG2-S = 10 mA 6 15 V V(F)S-G1 forward source-gate 1 voltage VG2-S = VDS = 0; IS-G1 = 10 mA 0.5 1.5 V V(F)S-G2 forward source-gate 2 voltage VG1-S = VDS = 0; IS-G2 = 10 mA 0.5 1.5 V VG1-S(th) gate 1-source threshold voltage VG2-S = 4 V; VDS = 5 V; ID = 20 µA 0.3 1 V VG2-S(th) gate 2-source threshold voltage VG1-S = VDS = 5 V; ID = 20 µA 0.3 1.2 V IDSX drain-source current VG2-S = 4 V; VDS = 5 V; RG1 = 120 kΩ; note 1 12 20 mA IG1-SS gate 1 cut-off current VG2-S = VDS = 0; VG1-S = 5 V − 50 nA IG2-SS gate 2 cut-off current VG1-S = VDS = 0; VG2-S = 5 V − 50 nA Note 1. RG1 connects gate 1 to VGG = 5 V. DYNAMIC CHARACTERISTICS Common source; Tamb = 25 °C; VDS = 5 V; VG2-S = 4 V; ID = 15 mA; unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT yfs forward transfer admittance pulsed; Tj = 25 °C 36 43 50 mS Cig1-s input capacitance at gate 1 f = 1 MHz − 3.6 4.3 pF Cig2-s input capacitance at gate 2 f = 1 MHz − 2.3 3 pF Cos drain-source capacitance f = 1 MHz − 2.3 3 pF Crs reverse transfer capacitance f = 1 MHz − 30 50 fF F noise figure − 2 2.8 dB 1997 Sep 05 f = 800 MHz; GS = GSopt; BS = BSopt 4 Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR MLB937 30 MLB936 handbook, halfpage 110 handbook, halfpage V G2 S = 4 V 3 V ID Vunw 2.5 V (mA) (dBµV) 2V 20 100 1.5 V 10 90 1V 80 0 0 10 20 30 40 50 gain reduction (dB) 0 0.4 0.8 1.2 1.6 2.0 V G1 S (V) VDS = 5 V; VGG = 5 V; fw = 50 MHz. funw = 60 MHz; Tamb = 25 °C; RG1 = 120 kΩ. Fig.3 VDS = 5 V. Tj = 25 °C. Unwanted voltage for 1% cross-modulation as a function of gain reduction; typical values; see Fig.17. Fig.4 Transfer characteristics; typical values. MLB938 30 handbook, halfpage I G1 (µA) ID (mA) 1.3 V 20 MLB939 200 handbook, halfpage V G1 S = 1.4 V V G2 S = 4 V 150 3.5 V 1.2 V 3V 100 1.1 V 2.5 V 1.0 V 10 50 0.9 V 0 0 2 4 6 8 2V 0 10 V DS (V) 0 VDS = 5 V. VG2-S = 4 V. Tj = 25 °C. 2 V G1 S (V) 3 VDS = 5 V. Tj = 25 °C. Fig.6 Fig.5 Output characteristics; typical values. 1997 Sep 05 1 5 Gate 1 current as a function of gate 1 voltage; typical values. Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR MLB941 MLB940 25 60 handbook, halfpage handbook, halfpage ID (mA) 20 V G2 S = 4 V y fs (mS) 3.5 V 3V 40 15 2.5 V 10 20 5 2V 0 0 0 10 20 I D (mA) 0 30 40 I G1 (µA) 60 VDS = 5 V. VG2-S = 4 V. VDS = 5 V. Tj = 25 °C. Fig.7 20 Tj = 25 °C. Forward transfer admittance as a function of drain current; typical values. Fig.8 Drain current as a function of gate 1 current; typical values. MLB942 16 MLB943 30 handbook, halfpage handbook, halfpage ID (mA) R G1 = 47 kΩ ID (mA) 68 kΩ 82 kΩ 12 100 kΩ 20 120 kΩ 150 kΩ 8 180 kΩ 220 kΩ 10 4 0 0 0 2 4 V GG (V) 6 0 VDS = 5 V; VG2-S = 4 V. RG1 = 120 kΩ (connected to VGG); Tj = 25 °C. Fig.9 1997 Sep 05 2 4 6 V GG = V DS (V) 8 VG2-S = 4 V. RG1 connected to VGG; Tj = 25 °C. Drain current as a function of gate 1 supply voltage (= VGG); typical values; see Fig.17. Fig.10 Drain current as a function of gate 1 (= VGG) and drain supply voltage; typical values; see Fig.17. 6 Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR MLB944 MLB945 40 20 handbook, halfpage handbook, halfpage ID (mA) 16 V GG = 5 V I G1 (µA) 4.5 V V GG = 5 V 30 4V 4.5 V 3.5 V 12 4V 3V 3.5 V 20 3V 8 10 4 0 0 0 2 4 V G2 S (V) 0 6 VDS = 5 V; Tj = 25 °C. RG1 = 120 kΩ (connected to VGG). 2 4 V G2 S (V) 6 VDS = 5 V; Tj = 25 °C. RG1 = 120 kΩ (connected to VGG). Fig.11 Drain current as a function of gate 2 voltage; typical values; see Fig.17. Fig.12 Gate 1 current as a function of gate 2 voltage; typical values; see Fig.17. MLB946 10 2 handbook, halfpage MLB947 10 3 y is (mS) ϕ rs (deg) y rs (µS) ϕ rs 10 2 10 10 3 10 2 b is y rs 1 10 10 g is 10 1 10 102 f (MHz) 10 VDS = 5 V; VG2 = 4 V. ID = 15 mA; Tamb = 25 °C. 102 f (MHz) 10 3 VDS = 5 V; VG2 = 4 V. ID = 15 mA; Tamb = 25 °C. Fig.13 Input admittance as a function of frequency; typical values. 1997 Sep 05 1 1 10 3 Fig.14 Reverse transfer admittance and phase as a function of frequency; typical values. 7 Philips Semiconductors Product specification N-channel dual-gate MOS-FET MLB948 10 2 BF909WR y fs y fs MLB949 10 2 10 handbook, halfpage yos (mS) ϕ fs bos (deg) (mS) 1 ϕfs 10 10 gos 10 1 10 2 10 1 1 10 102 10 3 f (MHz) VDS = 5 V; VG2 = 4 V. ID = 15 mA; Tamb = 25 °C. 102 10 3 VDS = 5 V; VG2 = 4 V. ID = 15 mA; Tamb = 25 °C. Fig.15 Forward transfer admittance and phase as a function of frequency; typical values. Fig.16 Output admittance as a function of frequency; typical values. VAGC R1 10 k Ω C1 4.7 nF R GEN 50 Ω R2 50 Ω C3 R3 10 Ω C2 DUT 4.7 nF C5 2.2 pF R G1 12 pF L1 ≈ 350 nH RL 50 Ω C4 4.7 nF VI VGG VDS Fig.17 Cross-modulation test set-up. 1997 Sep 05 f (MHz) 8 MLD151 Philips Semiconductors Product specification N-channel dual-gate MOS-FET Table 1 f (MHz) BF909WR Scattering parameters: VDS = 5 V; VG2-S = 4 V; ID = 15 mA; Tamb = 25 °C s21 s11 s12 s22 MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) 50 0.985 −6.4 4.064 172.3 0.001 86.9 0.985 −3.2 100 0.978 −12.6 3.997 164.9 0.002 82.7 0.982 −6.4 200 0.957 −25.0 3.886 150.8 0.005 74.3 0.973 −12.6 300 0.931 −36.5 3.682 137.3 0.006 68.9 0.960 −18.6 400 0.899 −47.6 3.484 123.8 0.007 59.6 0.947 −24.2 500 0.868 −57.4 3.260 111.7 0.007 57.9 0.936 −29.6 600 0.848 −66.6 3.053 101.0 0.006 58.5 0.927 −34.8 700 0.816 −74.6 2.829 90.3 0.005 65.5 0.919 −39.8 800 0.792 −82.2 2.652 79.9 0.005 83.3 0.913 −44.6 900 0.772 −89.3 2.470 69.5 0.005 114.9 0.910 −49.5 1000 0.754 −95.6 2.328 59.5 0.006 138.7 0.909 −54.6 Table 2 Noise data: VDS = 5 V; VG2-S = 4 V; ID = 15 mA; Tamb = 25 °C Γopt f (MHz) Fmin (dB) (ratio) (deg) 800 2.00 0.603 67.71 1997 Sep 05 9 rn 0.581 Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR PACKAGE OUTLINE 1.00 max handbook, full pagewidth 0.2 M A 0.1 max 0.4 0.2 0.2 M B 0.2 3 4 A 1.35 1.15 2.2 2.0 2 0.3 0.1 1 0.25 0.10 0.7 0.5 1.4 1.2 2.2 1.8 B Dimensions in mm. Fig.18 SOT343R. 1997 Sep 05 10 MSB367 Philips Semiconductors Product specification N-channel dual-gate MOS-FET BF909WR DEFINITIONS Data Sheet Status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications. Limiting values Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability. 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