STMICROELECTRONICS T2550H-600T

T2550H-600T
®
HIGH TEMPERATURE TRIAC FOR HOT APPLIANCES
MAIN FEATURES :
HIGH JUNCTION TEMPERATURE:
Tj (MAX) = 150°C
IT(RMS) = 25 A
VDRM/VRRM = 600 V
SENSITIVITY : IGT (MAX) = 50mA
A2
A1
A2
DESCRIPTION
Specifically developed for use in high temperature
and harsh environments, the T2550H-600T triac is
perfectly suited to driving heating elements found
in hot appliances such as ovens, electric ranges or
halogen ranges.
The T2550H-600T, which is specified for use in
temperature up to Tj = 150 °C, offers the additional
benefit of improved thermal resistance (1 °C/W).
Thanks to this feature, heatsink dimensionning can
be optimized to suit typical conditions in such
applications. The devices surge features, which
have proven to be highly performing, ensure safe
operation under peak inrush current conditions for example, in halogen ranges.
A1
A2
G
TO-220
ABSOLUTE MAXIMUM RATINGS
Symbol
VRRM
VDRM
IT(RMS)
ITSM
I2t
dI/dt
Tstg
Tj
Parameter
Value
Unit
Tj = 150 °C
600
V
Tc = 120 °C
25
A
tp = 8.3 ms
260
A
tp = 10 ms
250
I t Value for fusing
tp = 10 ms
310
A2s
Critical rate of rise of on-state current
Repetitive
F = 50 Hz
20
A/µs
(Tj initial = 25 °C)
IG = 60 mA tr ≤100ns
Non
Repetitive
100
Repetitive peak-off state voltage
RMS on-state current
(360° conduction angle)
Non repetitive surge peak on-state current
(Tj initial = 25°C )
2
Storage and operating junction temperature range
June 1999 - Ed: 1
- 40 to + 150
°C
1/5
T2550H-600T
THERMAL RESISTANCES
Symbol
Parameter
Rth(j-c)
Junction to case for DC
Rth(j-c)
Junction to case for AC
360 ° conduction angle (F = 50 Hz)
Value
Unit
1.3
°C/W
1
°C/W
Value
Unit
MIN
5
mA
MAX
50
GATE CHARACTERISTICS
PGM = 10 W (tp = 20 µs)
PG(AV) = 1 W
Symbol
IGT
IGM = 4 A (tp = 20 µs)
Test Conditions
RL=33 Ω
VD=12V (DC)
VGT
VD=12V (DC)
VGD
VD=VDRM
IH
IT= 500 mA
IL
IG = 1.2 IGT
VTM
ITM = 35 A
IDRM
IRRM
Quadrant
Tj = 25 °C
RL=33 Ω
I - II - III
Tj = 25 °C
I - II - III
MAX
1.3
V
Tj = 150 °C
I - II - III
MIN
0.15
V
MAX
75
mA
MAX
90
mA
Tj = 25 °C
MAX
1.5
V
VD = VDRM
Tj = 25 °C
MAX
5
µA
VR = VRRM
Tj = 150 °C
MAX
8.5
mA
VD / VR = 400 V (operating application
conditions)
Tj = 150 °C
MAX
5.5
dV/dt
VD= 67% VDRM
Tj = 150 °C
MIN
250
V/µs
(dI/dt)c
(dV/dt)c = 5 V/µs
Tj = 150 °C
MIN
10
A/ms
RL=3.3 kΩ
Gate open
Tj = 25 °C
Tj = 25 °C
tp = 380 µs
Gate open
I - II - III
Without snubber
7
ORDER INFORMATION
2/5
T
25
Triac
Current
50
H
-
High
Gate
Sensitivity Temperature
Triac
600
T
Voltage
Package
T: TO-220
T2550H-600T
Fig. 1: Maximum power dissipation versus RMS
on-state current.
Fig. 2: Correlation between maximum power dissipation and maximum allowable temperatures (Tamb
and Tcase) for different thermal resistances
heatsink+contact.
P(W)
P(W)
35
Tcase (°C)
35
Rth=3°C/W
30
25
Rth=0°C/W
120
20
α = 90°
15
Rth=1°C/W
25
α = 120°
20
Rth=2°C/W
30
α = 180°
130
15
α = 60°
140
10
10
α = 30°
5
5
IT(RMS)(A)
0
0.0
2.5
5.0
0
7.5 10.0 12.5 15.0 17.5 20.0 22.5 25.0
Fig. 3: RMS on-state current versus case temperature.
α = 180°
0
Tamb(°C)
25
50
75
100
125
150
150
Fig. 4: Relative variation of thermal impedance
versus pulse duration.
IT(RMS)(A)
K=[Zth/Rth]
30
1.00
α = 180°
25
Zth(j-c)
20
Zth(j-a)
0.10
15
10
5
tp(s)
Tcase(°C)
0
0
25
50
75
100
125
150
Fig. 5: Relative variation of gate trigger current,
holding current and latching current versus junction temperature (typical values).
0.01
1E-3
IGT
IH & IL
1.0
0.5
Tj(°C)
-20
0
20
40
60
80
1E+0
1E+1
1E+2 5E+2
ITSM(A)
1.5
0.0
-40
1E-1
Fig. 6: Surge peak on-state current versus number
of cycles.
IGT,IH,IL [Tj] / IGT,IH,IL [Tj=25°C]
2.5
2.0
1E-2
100 120 140 160
220
200
180
160
140
120
100
80
60
40
20
0
Tj initial=25°C
F=50Hz
Non repetitive
Repetitive
Number of cycles
1
10
100
1000
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T2550H-600T
Fig. 8: On-state characteristics (maximum values).
Fig. 7: Non repetitive surge peak on-state current
for a sinusoidal pulse with width tp<10ms, and corresponding value of I2t.
ITM(A)
ITSM(A),I²t(A²s)
300
2000
Tj initial=25°C
1000
100
ITSM
dI/dt limitation:
100A/µs
Tj=Tj max.
I²t
100
tp(ms)
10
0.01
Tj max.:
Vto = 0.85 V
Rd = 19 m Ω
Tj=25°C
10
VTM(V)
0.10
1.00
1
0.0
10.00
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
Fig. 10: Typical variation of leakage current versus
junction temperature for different values of blocking
voltage.
Fig. 9: Relative variation of critical rate of decrease
of main current versus junction temperature (typical values).
IDRM/IRRM(mA)
(dI/dt)c [Tj]/(dI/dt)c [Tj = 150°C]
1E+1
8
7
VD=VR=600V
1E+0
6
VD=VR=400V
5
VD=VR=200V
1E-1
4
3
1E-2
2
1
0
25
Tj(°C)
Tj(°C)
50
75
100
125
1E-3
50
150
75
100
Fig. 11: Acceptable repetitive peak off state voltage
versus thermal resistance case-ambient.
VDRM/VRRM(V)
800
Tj=150°C
Rth(j-c)=1°C/W
700
600
500
400
300
200
100
0
4/5
Rth(c-a)(°C/W)
0
2
4
6
8
10
12
14
16
18
20
125
150
T2550H-600T
PACKAGE MECHANICAL DATA
TO-220 (Plastic)
B
DIMENSIONS
C
b2
REF.
Millimeters
Min.
A
L
F
I
A
l4
c2
a1
l3
Typ.
15.20
a1
Max.
Inches
Min.
Typ.
15.90 0.598
3.75
Max.
0.625
0.147
a2
13.00
14.00 0.511
0.551
B
10.00
10.40 0.393
0.409
b1
0.61
0.88 0.024
0.034
b2
1.23
1.32 0.048
0.051
C
4.40
4.60 0.173
0.181
c1
0.49
0.70 0.019
0.027
c2
2.40
2.72 0.094
0.107
e
2.40
2.70 0.094
0.106
F
I
6.20
3.75
6.60 0.244
3.85 0.147
0.259
0.151
I4
15.80 16.40 16.80 0.622 0.646 0.661
L
2.65
2.95 0.104
0.116
l2
1.14
1.70 0.044
0.066
l3
1.14
1.70 0.044
0.066
l2
a2
b1
M
c1
e
M
2.60
0.102
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsIbility for the consequences of
use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by
implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to
change without notice. This publication supersedes and replaces all information previously supplied.
STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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© 1999 STMicroelectronics - Printed in Italy - All rights reserved.
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