FAIRCHILD FDMB506P

FDMB506P
December 2005
FDMB506P
P-Channel 1.8V Logic Level PowerTrench MOSFET
General Description
Features
This P-Channel MOSFET is produced using Fairchild
• –6.8 A, –20V. RDS(ON) = 30 mΩ @ VGS = –4.5V
Semiconductor’s advanced PowerTrench process that
RDS(ON) = 38 mΩ @ VGS = –2.5V
has been especially tailored to minimize the on-state
RDS(ON) = 70 mΩ @ VGS = –1.8V
resistance and yet maintain low gate charge for
superior switching performance.
These devices are
• Low profile – 0.8 mm maximum
well suited for portable electronics applications.
• Fast switching
Applications
• RoHS compliant
• Load switch
• DC/DC Conversion
PIN 1
GATE
SOURCE
S
5
4
G
D
6
3
D
D
7
2
D
D
8
1
D
MicroFET
3x1.9
Absolute Maximum Ratings
Symbol
TA=25oC unless otherwise noted
Parameter
Ratings
Units
VDSS
Drain-Source Voltage
–20
V
VGSS
Gate-Source Voltage
±8
V
ID
Drain Current
–6.8
A
– Continuous
(Note 1a)
– Pulsed
70
PD
Power Dissipation
TJ, TSTG
Operating and Storage Junction Temperature Range
(Note 1a)
1.9
W
–55 to +150
°C
°C/W
Thermal Characteristics
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1a)
65
RθJA
Thermal Resistance, Junction-to-Ambient
(Note 1b)
208
Package Marking and Ordering Information
Device Marking
Device
Reel Size
Tape width
Quantity
506
FDMB506P
7’’
8mm
3000 units
2005 Fairchild Semiconductor Corporation
FDMB506P Rev C1(W)
Symbol
TA = 25°C unless otherwise noted
Parameter
Test Conditions
Min Typ Max
Units
Off Characteristics
ID = –250 µA
VGS = 0 V,
ID = –250 µA, Referenced to 25°C
–20
V
BVDSS
∆BVDSS
∆TJ
IDSS
Drain–Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
VDS = –16 V,
VGS = 0 V
–1
µA
IGSS
Gate–Body Leakage
VGS = ± 8 V,
VDS = 0 V
±100
nA
On Characteristics
VGS(th)
mV/°C
–13
(Note 2)
ID = –250 µA
VDS = VGS,
ID = –250 µA, Referenced to 25°C
∆VGS(th)
∆TJ
RDS(on)
Gate Threshold Voltage
Gate Threshold Voltage
Temperature Coefficient
Static Drain–Source
On–Resistance
gFS
Forward Transconductance
–0.4
–0.7
–1.5
V
mV/°C
3
VGS = –4.5 V, ID = –6.8 A
VGS = –2.5 V, ID = –2.5 A
VGS = –1.8 V, ID = –1.8 A
VGS= –4.5 V, ID = –6.8 A, TJ=125°C
25
30
40
36
30
38
70
44
VDS = –5 V,
ID = –6.8 A
26
VDS = –10 V,
f = 1.0 MHz
V GS = 0 V,
2216
2960
pF
351
470
pF
167
260
pF
mΩ
S
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Switching Characteristics
td(on)
Turn–On Delay Time
tr
Turn–On Rise Time
(Note 2)
VDD = –10 V, ID = –1 A,
VGS = –4.5 V, RGEN = 6 Ω
14
25
ns
8
16
ns
td(off)
Turn–Off Delay Time
175
280
ns
tf
Turn–Off Fall Time
80
128
ns
Qg
Total Gate Charge
21
30
nC
Qgs
Gate–Source Charge
Qgd
Gate–Drain Charge
VDS = –10 V,
VGS = –4.5 V
ID = –6.8 A,
3.5
nC
4.5
nC
Drain–Source Diode Characteristics and Maximum Ratings
IS
Maximum Continuous Drain–Source Diode Forward Current
VSD
trr
Drain–Source Diode Forward
Voltage
Diode Reverse Recovery Time
Qrr
Diode Reverse Recovery Charge
VGS = 0 V,
IS = –0.8 A(Note 2)
IF = –6.8 A,
diF/dt = 100 A/µs
1.6
A
–0.6
–1.2
V
26
48
nS
12
22
nC
Notes:
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.
a)
50°C/W when
2
mounted on a 1in pad
of 2 oz copper
b)
160°C/W when mounted
on a minimum pad of 2 oz
copper
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%
FDMB506P Rev C1(W)
FDMB506P
Electrical Characteristics
FDMB506P
Dimensional Outline and Pad Layout
NOTES:
A.
DOES NOT FULLY CONFORM TO JEDEC REGISTRATION,
B.
DIMENSIONS ARE IN MILLIMETERS.
C.
DIMENSIONS AND TOLERANCES PER ASME Y14.5M, 1994
MO-229, DATED 11/2001.
FDMB506P Rev C1(W)
FDMB506P
Typical Characteristics
2.4
-ID, DRAIN CURRENT (A)
VGS=-4.5V
-3.0V
-3.5V
40
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
50
-2.5V
30
-2.0V
20
-1.8V
10
0
2.2
VGS=-1.8V
2
1.8
-2.0V
1.6
-2.5V
1.4
-3.0V
1.2
1
2
3
4
5
0
10
20
-VDS, DRAIN TO SOURCE VOLTAGE (V)
30
40
50
-ID, DRAIN CURRENT (A)
Figure 1. On-Region Characteristics.
Figure 2. On-Resistance Variation with
Drain Current and Gate Voltage.
1.5
0.08
ID = -3.4A
ID = -6.8A
VGS = -4.5V
1.4
RDS(ON), ON-RESISTANCE (OHM)
RDS(ON), NORMALIZED
DRAIN-SOURCE ON-RESISTANCE
-4.5V
1
0.8
0
1.3
1.2
1.1
1
0.9
0.8
0.7
0.07
0.06
0.05
TA = 125oC
0.04
0.03
TA = 25oC
0.02
0.01
-50
-25
0
25
50
75
100
125
150
1
1.5
2
2.5
3
3.5
4
4.5
5
-VGS, GATE TO SOURCE VOLTAGE (V)
TJ, JUNCTION TEMPERATURE (oC)
Figure 3. On-Resistance Variation with
Temperature.
Figure 4. On-Resistance Variation with
Gate-to-Source Voltage.
100
VDS = -5V
-IS, REVERSE DRAIN CURRENT (A)
50
-ID, DRAIN CURRENT (A)
-3.5V
o
25 C
40
TA = -55oC
125oC
30
20
10
VGS=0V
10
TA = 125oC
1
25oC
0.1
-55oC
0.01
0.001
0.0001
0
0.5
1
1.5
2
2.5
-VGS, GATE TO SOURCE VOLTAGE (V)
Figure 5. Transfer Characteristics.
3
0
0.2
0.4
0.6
0.8
1
1.2
1.4
-VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature.
FDMB506P Rev C1(W)
FDMB506P
Typical Characteristics
3200
ID = -6.8A
VDS = -5V
2800
-10V
4
-15V
CAPACITANCE (pF)
-VGS, GATE-SOURCE VOLTAGE (V)
5
3
2
2400
2000
1600
1200
1
COSS
800
400
0
CRSS
0
0
5
10
15
20
25
0
5
Qg, GATE CHARGE (nC)
10
15
20
-VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 7. Gate Charge Characteristics.
Figure 8. Capacitance Characteristics.
100
10
P(pk), PEAK TRANSIENT POWER (W)
100µs
RDS(ON) LIMIT
-ID, DRAIN CURRENT (A)
f = 1 MHz
VGS = 0 V
CISS
1ms
10ms
10
100ms
1s
1
10s
DC
VGS = -4.5V
SINGLE PULSE
RθJA = 160oC/W
0.1
TA = 25oC
0.01
0.1
1
10
100
SINGLE PULSE
RθJA = 160°C/W
TA = 25°C
8
6
4
2
0
0.01
0.1
1
Figure 9. Maximum Safe Operating Area.
r(t), NORMALIZED EFFECTIVE TRANSIENT
THERMAL RESISTANCE
10
100
1000
t1, TIME (sec)
-VDS, DRAIN-SOURCE VOLTAGE (V)
Figure 10. Single Pulse Maximum
Power Dissipation.
1
D = 0.5
RθJA(t) = r(t) * RθJA
0.2
0.1
o
RθJA = 160 C/W
0.1
0.05
P(pk)
0.02
0.01
t1
t2
TJ - TA = P * RθJA(t)
Duty Cycle, D = t1 / t2
0.01
0.001
0.0001
SINGLE PULSE
0.001
0.01
0.1
1
10
100
1000
t1, TIME (sec)
Figure 9. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.
FDMB506P Rev C1(W)
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As used herein:
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support device or system whose failure to perform can
systems which, (a) are intended for surgical implant into
be reasonably expected to cause the failure of the life
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support device or system, or to affect its safety or
failure to perform when properly used in accordance
with instructions for use provided in the labeling, can be
effectiveness.
reasonably expected to result in significant injury to the
user.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or
In Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I17