< L/S band internally matched power GaAs FET > MGFS45A2527B 2.5 – 2.7 GHz BAND / 32W OUTLINE DRAWING DESCRIPTION The MGFS45V2527B is an internally impedance-matched GaAs power FET especially designed for use in 2.5 – 2.7 GHz band amplifiers. The hermetically sealed metal-ceramic package guarantees high reliability. Unit : millimeters (inches) 2.0MIN. (0.079MIN.) 24.0± 0.3(0.945±0.012) 0.6± 0.15 (0.024± 0.006) 2 2.0MIN. (0.079MIN.) 17.4±0.2 (0.685±0.008) Class A operation Internally matched to 50(ohm) system High output power P1dB=32W (TYP.) @f=2.5 – 2.7GHz High power gain GLP=12.0dB (TYP.) @f=2.5 – 2.7GHz High power added efficiency P.A.E.=40% (TYP.) @f=2.5 – 2.7GHz Low distortion [item -51] IM3=-45dBc (TYP.) @Po=34.5dBm S.C.L 1 8.0±0.2 (0.315±0.008) FEATURES APPLICATION 3 QUALITY GG 1.4 (0.055) 0.1±0.05 3.65±0.4 (0.144±0.016) 15.8(0.622) RECOMMENDED BIAS CONDITIONS VDS=10V ID=6.5A RG=25ohm 1 GF-51 2.4±0.2 (0.094±0.008) 20.4± 0.2(0.803± 0.008) item 01 : 2.5 – 2.7 GHz band power amplifier item 51 : 2.5 – 2.7 GHz band digital radio communication GATE 2 SOURCE(FLANGE) 3 DRAIN Keep Safety first in your circuit designs! Absolute maximum ratings Symbol VGDO Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable , but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury , fire or property damage. Remember to give due consideration to safety when making your circuit designs , with appropriate measure such as (I) placement of substitutive , auxiliary circuits , (ii) use of non-flammable material or (iii) prevention against any malfunction or mishap. (Ta=25C) Parameter Gate to drain breakdown voltage Ratings Unit -20 V VGSO Gate to source breakdown voltage -10 V PT *1 Total power dissipation 107 W Tch Cannel temperature 175 C Tstg Storage temperature -65 to +175 C *1 : Tc=25C Electrical characteristics Symbol (Ta=25C) Parameter Test conditions Limits Min. Unit Typ. Max. Gate to source cut-off voltage VDS=3V,ID=84mA - - -5 V Output power at 1dB gain compression VDS=10V,ID(RF off)=6.5A 44 45 - dBm GLP Linear Power Gain f=2.5 – 2.7GHz 11 12 - dB ID Drain current - 7.5 - A P.A.E. Power added efficiency - 40 - % IM3 *2 3rd order IM distortion -42 -45 - dBc Rth(ch-c) *3 Thermal resistance - 1.2 1.4 C/W VGS(off) P1dB delta Vf method *2 :item -51 ,2 tone test,Po=34.5dBm Single Carrier Level ,f=2.5,2.6,2.7GHz,delta f=5MHz *3 :Channel-case Publication Date : Apr., 2011 1 < L/S band internally matched power GaAs FET > MGFS45A2527B 2.5 – 2.7 GHz BAND / 32W MGFS45A2527B TYPICAL CHARACTERISTICS Pout , PAE , GAIN vs. Pin 18 50 17 45 40 16 35 f= 2 .7 GHz 40 16 40 16 15 35 15 35 15 30 14 30 14 30 14 25 13 25 13 25 13 20 12 20 12 20 12 15 11 15 11 15 11 10 10 10 10 10 10 5 9 5 9 5 9 8 0 8 0 0 15 20 25 30 Pin(dBm) 35 Gp(dB) 40 15 20 25 30 35 Po(dBm) P.A.E(%) 45 Po(dBm) PAE(%) GAIN(dB) Gp(dB) 17 Po(dBm) P.A.E( %) 50 45 Po(dBm) P.A.E(%) f= 2. 6GHz 18 Po(dBm) PAE(%) G AIN(dB) 40 20 25 14.5 45.5 30 35 40 Pin(dBm) P1dB vs. f q 17 8 15 Pin(dBm) GAIN vs. f 18 Po(dBm) PAE(%) GAIN(dB) Gp(dB) f=2 .5 GHz 50 IM3 vs. f y q -51 y 14 -50 45 13.5 13 12.5 IM3(dBC) P1dB(dBm) GLP(dB) -49 44.5 -48 44 -47 12 43.5 Vds=10(V) Ids(RFOFF)=6.5(A) 11 Vds=10(V) Ids(RFOFF)=6.5(A) Vds=10(V) Ids(RFOFF)=6.5(A) 11.5 -46 43 2.4 2.5 2.6 2.7 Freq(GHz) 2.8 -45 2.4 2.5 2.6 Freq(GHz) Publication Date : Apr., 2011 2 2.7 2.8 2.4 2.5 2.6 Freq(GHz) 2.7 2.8 < L/S band internally matched power GaAs FET > MGFS45A2527B 2.5 – 2.7 GHz BAND / 32W MGFS45A2528B S-parameters( Ta=25deg.C , VDS=10(V),IDS=6.5(A) ) Freq 2.00 2.05 2.10 2.15 2.20 2.25 2.30 2.35 2.40 2.45 2.50 2.55 2.60 2.65 2.70 2.75 2.80 2.85 2.90 2.95 3.00 S11 (mag) 0.88 0.87 0.85 0.82 0.79 0.76 0.72 0.66 0.59 0.51 0.40 0.28 0.16 0.07 0.12 0.22 0.30 0.38 0.45 0.51 0.58 (ang) 74.01 67.63 60.94 53.50 45.38 36.25 26.06 14.95 1.86 -13.16 -31.23 -51.53 -78.16 -146.41 127.83 95.47 74.56 56.47 40.38 24.35 8.80 S21 (mag) 1.42 1.56 1.72 1.91 2.12 2.38 2.66 2.99 3.34 3.70 4.01 4.24 4.32 4.27 4.09 3.80 3.51 3.18 2.88 2.58 2.30 (ang) -115.63 -124.88 -134.47 -144.48 -155.53 -167.27 -179.79 166.21 150.86 133.43 115.11 95.76 75.62 55.31 35.45 16.42 -1.65 -19.06 -35.49 -51.73 -67.16 S12 (mag) 0.01 0.01 0.01 0.01 0.01 0.01 0.01 0.02 0.02 0.02 0.02 0.02 0.02 0.02 0.03 0.03 0.03 0.03 0.03 0.03 0.03 (ang) -79.30 -86.26 -102.29 -111.11 -129.00 -140.42 -159.19 176.25 155.14 126.07 98.68 71.43 43.53 15.41 -11.45 -33.34 -54.63 -75.33 -94.35 -111.68 -126.90 S22 (mag) 0.79 0.77 0.75 0.73 0.70 0.67 0.64 0.59 0.54 0.48 0.43 0.39 0.38 0.40 0.45 0.49 0.53 0.57 0.60 0.62 0.64 This S-Parameter data show measurements performed on each single-ended FET Publication Date : Apr., 2011 3 (ang) 101.57 95.64 89.25 83.20 75.83 67.92 58.86 47.67 34.08 16.39 -5.01 -31.79 -61.12 -87.87 -109.18 -125.33 -137.70 -147.32 -154.95 -161.21 -166.56 < L/S band internally matched power GaAs FET > MGFS45A2527B 2.5 – 2.7 GHz BAND / 32W Keep safety first in your circuit designs! Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of non-flammable material or (iii) prevention against any malfunction or mishap. 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