WSE128K16-XXX 128KX16 SRAM/EEPROM MODULE PRELIMINARY* FEATURES ■ TTL Compatible Inputs and Outputs ■ Access Times of 35ns (SRAM) and 150ns (EEPROM) ■ Built-in Decoupling Caps and Multiple Ground Pins for Low Noise Operation ■ Access Times of 45ns (SRAM) and 120ns (EEPROM) ■ Weight - 13 grams typical ■ Access Times of 70ns (SRAM) and 300ns (EEPROM) ■ Packaging EEPROM MEMORY FEATURES • 66 pin, PGA Type, 1.075" square HIP, Hermetic Ceramic HIP (H1) (Package 400) ■ Write Endurance 10,000 Cycles • 68 lead, Hermetic CQFP (G2T), 22mm (0.880") square (Package 509). Designed to fit JEDEC 68 lead 0.990" CQFJ footprint (Fig. 2) ■ Low Power CMOS Operation ■ Data Retention at 25°C, 10 Years ■ Automatic Page Write Operation ■ 128Kx16 SRAM ■ Page Write Cycle Time 10ms Max. ■ 128Kx16 EEPROM ■ Data Polling for End of Write Detection ■ Organized as 128Kx16 of SRAM and 128Kx16 of EEPROM Memory with separate Data Buses ■ Hardware and Software Data Protection ■ TTL Compatible Inputs and Outputs ■ Both blocks of memory are User Configurable as 256Kx8 * This data sheet describes a product under development, not fully characterized, and is subject to change without notice. ■ Low Power CMOS ■ Commercial, Industrial and Military Temperature Ranges FIG.1 PIN CONFIGURATION FOR WSE128K16-XH1X PIN DESCRIPTION TOP VIEW 1 12 23 34 45 56 ED0-15 EEPROM Data Inputs/Outputs SD0-15 SRAM Data Inputs/Outputs SD8 SWE2 SD15 ED8 VCC ED15 A0-16 Address Inputs SD9 SCS2 SD14 ED9 ECS2 ED14 SWE1-2 SRAM Write Enable SCS1-2 SRAM Chip Selects OE Output Enable VCC Power Supply GND SD10 SD13 EWE2 ED10 ED13 A13 SD11 SD12 A6 ED11 ED12 A14 A10 OE A7 A3 A0 GND Ground A15 A11 NC NC A4 A1 NC Not Connected A16 A12 SWE1 A8 A5 A2 EWE1-2 EEPROM Write Enable ECS1-2 EEPROM Chip Select NC VCC SD7 A9 EWE1 ED7 SD0 SCS1 SD6 ED0 ECS1 ED6 SD1 NC SD5 ED1 GND ED5 SD2 SD3 SD4 ED2 ED3 ED4 BLOCK DIAGRAM S W E1 S CS1 11 22 33 44 55 E W E1 E CS1 E W E2 E CS2 128K x 8 SRAM 128K x 8 SRAM 128K x 8 EEPROM 128K x 8 EEPROM 66 8 SD0-7 May 2001, Rev. 4 S W E2 S CS2 OE A0-16 1 8 SD8-15 8 ED0-7 8 ED8-15 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WSE128K16-XXX FIG. 2 PIN CONFIGURATION FOR WSE128K16-XG2TX PIN DESCRIPTION NC A0 A1 A2 A3 A4 A5 ECS1 GND ECS2 SWE1 A6 A7 A8 A9 A10 VCC TOP VIEW 9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 SD0 SD1 SD2 SD3 SD4 SD5 SD6 SD7 GND SD8 SD9 SD10 SD11 SD12 SD13 SD14 SD15 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 ED0 ED1 ED2 ED3 ED4 ED5 ED6 ED7 GND ED8 ED9 ED10 ED11 ED12 ED13 ED14 ED15 The WEDC 68 lead G2T CQFP fills the same fit and function as the JEDEC 68 lead CQFJ or 68 PLCC. But the G2T has the TCE and lead inspection advantage of the CQFP form. SRAM Data Inputs/Outputs A0-16 Address Inputs SWE1-2 SRAM Write Enable SCS1-2 SRAM Chip Selects OE Output Enable VCC Power Supply GND Ground NC Not Connected EWE1-2 EEPROM Write Enable ECS1-2 EEPROM Chip Select BLOCK DIAGRAM NC NC NC EWE2 EWE1 SWE2 A16 SCS1 OE SCS2 NC A15 A14 A13 A12 A11 VCC EEPROM Data Inputs/Outputs 0.940" 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 S W E1 S CS1 S W E2 S CS2 E W E1 E CS1 E W E2 E CS2 OE A0-16 128K x 8 SRAM 8 SD0-7 White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520 ED0-15 SD0-15 2 128K x 8 SRAM 8 SD8-15 128K x 8 EEPROM 8 ED0-7 128K x 8 EEPROM 8 ED8-15 WSE128K16-XXX ABSOLUTE MAXIMUM RATINGS Parameter Symbol Operating Temperature Storage Temperature VG Junction Temperature TJ Supply Voltage Min Max Unit °C V CC 4.5 5.5 V °C Input High Voltage V IH 2.0 V CC + 0.3 V Vcc+0.5 V Input Low Voltage V IL -0.3 +0.8 V 150 °C Operating Temp. (Mil.) TA -55 +125 °C 7.0 V -55 -65 TSTG Signal Voltage Relative to GND Symbol Supply Voltage Min TA -0.5 -0.5 VCC RECOMMENDED OPERATING CONDITIONS Max Unit +125 +150 Parameter EEPROM TRUTH TABLE CS H L L X X X OE X L H H X L SCS H L L L OE X L H X CAPACITANCE (TA = +25°C) Parameter Symbol Conditions OE capacitance COE VIN = 0 V, f = 1.0 MHz WE1-4 capacitance HIP (PGA) CQFP G2T CWE VIN = 0 V, f = 1.0 MHz Max 50 Unit pF pF 20 20 CS1-4 capacitance CCS VIN = 0 V, f = 1.0 MHz 20 pF Data I/O capacitance CI/O VI/O = 0 V, f = 1.0 MHz 20 pF Address input capacitance CAD VIN = 0 V, f = 1.0 MHz 50 pF WE X H L X H X Mode Standby Read Write Out Disable Write Inhibit Data I/O High Z Data Out Data In High Z/Data Out SRAM TRUTH TABLE This parameter is guaranteed by design but not tested. SWE X H H L Mode Standby Read Read Write Data I/O High Z Data Out High Z Data In Power Standby Active Active Active DC CHARACTERISTICS (VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C) Parameter Max Unit Input Leakage Current Symbol I LI V CC = 5.5, V IN = GND to VCC 10 µA Output Leakage Current I LO SCS = VIH, OE = VIH, VOUT = GND to VCC 10 µA ICCx16 SCS = VIL, OE = ECS = VIH, f = 5MHz, V CC = 5.5 360 mA SRAM Operating Supply Current x 16 Mode Standby Current Conditions Min I SB ECS = SCS = VIH, OE = VIH, f = 5MHz, V CC = 5.5 31.2 mA (35 to 45ns) V OL I OL = 8.0mA, V CC = 4.5 0.4 V (70ns) V OL I OL = 2.1mA, V CC = 4.5 0.4 V (35 to 45ns) V OH I OH = -4.0mA, V CC = 4.5 2.4 V (70ns) V OH I OH = -1mA, V CC = 4.5 2.4 V EEPROM Operating Supply Current x 16 Mode I CC1 ECS = VIL, OE = SCS = VIH 155 EEPROM Output Low Voltage V OL I OL = 2.1 mA, V CC = 4.5V 0.45 EEPROM Output High Voltage V OH1 I OH = 400 µA, V CC = 4.5V SRAM Output Low Voltage SRAM Output High Voltage 2.4 mA V V NOTES: 1. The I CC current listed includes both the DC operating current and the frequency dependent component (@ 5 MHz). The frequency component typically is less than 2 mA/MHz, with OE at VIH. 2. DC test conditions: V IL = 0.3V, VIH = V CC - 0.3V 3 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WSE128K16-XXX SRAM AC CHARACTERISTICS (VCC = 5.0V, GND = 0V, TA = -55°C to +125°C) Parameter Symbol Read Cycle -35 Min Read Cycle Time t RC Address Access Time t AA Output Hold from Address Change t OH Chip Select Access Time t ACS -45 Max 35 Min -70 Max 45 Max 70 35 0 Units Min ns 45 0 70 ns 70 ns 35 ns 3 35 ns 45 Output Enable to Output Valid t OE Chip Select to Output in Low Z t CLZ 1 3 20 3 25 3 Output Enable to Output in Low Z t OLZ 1 0 0 0 Chip Disable to Output in High Z t CHZ 1 20 20 25 ns Output Disable to Output in High Z t OHZ 1 20 20 25 ns ns ns 1. This parameter is guaranteed by design but not tested. SRAM AC CHARACTERISTICS (VCC = 5.0V, GND = 0V, TA = -55°C to +125°C) Parameter Symbol Write Cycle -35 Min -45 Max Min -70 Max Units Min Max Write Cycle Time t WC 35 45 70 ns Chip Select to End of Write t CW 25 30 60 ns Address Valid to End of Write t AW 25 30 60 ns Data Valid to End of Write t DW 20 25 30 ns Write Pulse Width t WP 25 30 50 ns Address Setup Time t AS 0 0 5 ns Address Hold Time t AH 0 0 5 ns Output Active from End of Write t OW 1 4 4 5 Write Enable to Output in High Z t WHZ 1 Data Hold Time t DH 20 0 ns 25 0 25 ns 0 ns 1. This parameter is guaranteed by design but not tested. FIG. 3 AC TEST CIRCUIT AC TEST CONDITIONS Parameter I OL Current Source VZ D.U.T. ≈ 1.5V (Bipolar Supply) C eff = 50 pf I OH Current Source White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520 4 Typ Unit Input Pulse Levels VIL = 0, VIH = 3.0 V Input Rise and Fall 5 ns Input and Output Reference Level 1.5 V Output Timing Reference Level 1.5 V NOTES: V Z is programmable from -2V to +7V. I OL & IOH programmable from 0 to 16mA. Tester Impedance Z0 = 75 Ω. V Z is typically the midpoint of VOH and V OL. I OL & IOH are adjusted to simulate a typical resistive load circuit. ATE tester includes jig capacitance. WSE128K16-XXX FIG. 4 SRAM READ CYCLE tRC ADDRESS tAA SCS tRC tCHZ tACS ADDRESS tCLZ tAA SOE tOE tOLZ tOH SRAM SRAM DATA I/O DATA I/O PREVIOUS DATA VALID DATA VALID tOHZ DATA VALID HIGH IMPEDANCE READ CYCLE 2, (SWE = VIH) READ CYCLE 1, (SCS = OE = VIL, SWE = VIH) FIG. 5 SRAM WRITE CYCLE SWE CONTROLLED tWC ADDRESS tAW tAH tCW SCS tAS tWP SWE tOW tWHZ tDW tDH SRAM DATA I/O DATA VALID WRITE CYCLE 1, SWE CONTROLLED FIG. 6 SRAM WRITE CYCLE SCS CONTROLLED tWC WS32K32-XHX ADDRESS tAS tAW tAH tCW SCS tWP SWE tDW SRAM DATA I/O tDH DATA VALID WRITE CYCLE 2, SCS CONTROLLED 5 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WSE128K16-XXX EEPROM AC WRITE CHARACTERISTICS (VCC = 5.0V, V SS = 0V, TA = -55°C to +125°C) EEPROM WRITE A write cycle is initiated when OE is high and a low pulse is on EWE or ECS with ECS or EWE low. The address is latched on the falling edge of ECS or EWE whichever occurs last. The data is latched by the rising edge of ECS or EWE, whichever occurs first. A byte write operation will automatically continue to completion. Write Cycle Parameter WRITE CYCLE TIMING Figures 7 and 8 show the write cycle timing relationships. A write cycle begins with address application, write enable and chip select. Chip select is accomplished by placing the ECS line low. Write enable consists of setting the EWE line low. The write cycle begins when the last of either ECS or EWE goes low. The EWE line transition from high to low also initiates an internal 150 µsec delay timer to permit page mode operation. Each subsequent EWE transition from high to low that occurs before the completion of the 150 µsec time out will restart the timer from zero. The operation of the timer is the same as a retriggerable one-shot. White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520 6 Symbol Min Max Unit 10 ms Write Cycle Time, TYP = 6ms tWC Address Set-up Time tAS 0 ns Write Pulse Width (EWE or ECS) tWP 150 ns Chip Select Set-up Time tCS 0 ns Address Hold Time tAH 100 ns Data Hold Time tDH 10 ns Chip Select Hold Time tCSH 0 ns Data Set-up Time tDS 100 ns Output Enable Set-up Time tOES 10 ns Output Enable Hold Time tOEH 10 ns Write Pulse Width High tWPH 50 ns WSE128K16-XXX FIG. 7 EEPROM WRITE WAVEFORMS EWE CONTROLLED t WC OE t OEH t OES ADDRESS t AS ECS 1-2 tCSH t AH t CS EWE 1-2 t WP t WPH t DS t DH EEPROM DATA IN FIG. 8 EEPROM WRITE WAVEFORMS ECS CONTROLLED t WC OE t OEH t OES ADDRESS t AS tCSH t AH ECS 1-2 t CS EWE 1-2 t WP t WPH t DS t DH EEPROM DATA IN 7 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WSE128K16-XXX EEPROM READ The WSE128K16-XXX EEPROM stores data at the memory location determined by the address pins. When ECS and OE are low and EWE is high, this data is present on the outputs. When ECS and OE are high, the outputs are in a high impedance state. This two line control prevents bus contention. EEPROM AC READ CHARACTERISTICS (VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C) Read Cycle Parameter Symbol -120 Min 120 -150 Max Min 150 -300 Max Min 300 Unit Max Read Cycle Time t RC Address Access Time t ACC 120 150 300 ns Chip Select Access Time t ACS 120 150 300 ns Output Hold from Add. Change, OE or ECS t OH 0 Output Enable to Output Valid t OE 0 Chip Select or OE to High Z Output t DF FIG. 9 0 50 0 0 55 70 0 70 EEPROM READ WAVEFORMS t RC ADDRESS ADDRESS VALID ECS1-2 t ACS t OE OE t DF NOTES: OE may be delayed up to tACS - tOE after the falling edge of ECS without impact on t OE or by t ACC - tOE after an address change without impact on t ACC. t ACC EEPROM DATA OUTPUT White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520 HIGH Z 8 ns t OH OUTPUT VALID ns 85 ns 70 ns WSE128K16-XXX EEPROM DATA POLLING The WSE128K16-XXX offers a data polling feature for the EEPROM which allows a faster method of writing to the device. Figure 11 shows the timing diagram for this function. During a byte or page write cycle, an attempted read of the last byte written will result in the complement of the written data on D7 (for each chip.) Once the write cycle has been completed, true data is valid on all outputs and the next cycle may begin. Data polling may begin at any time during the write cycle. EEPROM DATA POLLING CHARACTERISTICS (VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C) Parameter Symbol Min Data Hold Time tDH 10 OE Hold Time tOEH 10 OE To Output Valid tOE Write Recovery Time tWR FIG. 10 Max Unit ns ns 55 0 ns ns EEPROM DATA POLLING WAVEFORMS EWE1-2 ECS1-2 t OEH OE ED7 t DH t OE HIGH Z t WR ADDRESS 9 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WSE128K16-XXX EEPROM PAGE WRITE OPERATION EEPROM PAGE WRITE CHARACTERISTICS (VCC = 5.0V, VSS = 0V, TA = -55°C to +125°C) The WSE128K16-XXX has a page write operation that allows one to 128 bytes of data to be written into the device and consecutively loads during the internal programming period. Successive bytes may be loaded in the same manner after the first data byte has been loaded. An internal timer begins a time out operation at each write cycle. If another write cycle is completed within 150µs or less, a new time out period begins. Each write cycle restarts the delay period. The write cycles can be continued as long as the interval is less than the time out period. Page Mode Write Characteristics The usual procedure is to increment the least significant address lines from A0 through A6 at each write cycle. In this manner a page of up to 128 bytes can be loaded in to the EEPROM in a burst mode before beginning the relatively long interval programming cycle. tWC Address Set-up Time tAS 0 ns Address Hold Time (1) tAH 100 ns Data Set-up Time tDS 100 ns Data Hold Time t DH 10 ns Write Pulse Width tWP 150 ns Byte Load Cycle Time tBLC Write Pulse Width High tWPH EEPROM PAGE MODE WRITE WAVEFORMS OE ECS1-2 t BLC EWE1-2 ADDRESS t AH VALID ADDRESS t DS EEPROM DATA White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520 VALID DATA t WC t DH BYTE 0 10 150 50 1. Page address must remain valid for duration of write cycle. t WPH BYTE 1 10 Max Write Cycle Time, TYP = 6ms FIG. 11 t AS Unit Min After the 150µs time out is completed, the EEPROM begins an internal write cycle. During this cycle the entire page of bytes will be written at the same time. The internal programming cycle is the same regardless of the number of bytes accessed. t WP Symbol Parameter BYTE 2 BYTE 3 BYTE 127 ms µs ns WSE128K16-XXX FIG. 12 EEPROM SOFTWARE DATA PROTECTION ENABLE ALGORITHM(1) LOAD DATA AA TO ADDRESS 5555 ➞ LOAD DATA 55 TO ADDRESS 2AAA ➞ WRITES ENABLED(2) ➞ LOAD DATA A0 TO ADDRESS 5555 ➞ LOAD DATA XX TO ANY ADDRESS(4) LOAD LAST BYTE TO LAST ADDRESS ENTER DATA PROTECT STATE NOTES: 1. Data Format: ED 7 - ED 0 (Hex); Address Format: A 16 - A0 (Hex). 2. Write Protect state will be activated at end of write even if no other data is loaded. 3. Write Protect state will be deactivated at end of write period even if no other data is loaded. 4. 1 to 128 bytes of data may be loaded. 11 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WSE128K16-XXX EEPROM SOFTWARE DATA PROTECTION FIG. 13 A software write protection feature may be enabled or disabled by the user. When shipped by WEDC, the WSE128K16-XXX has the feature disabled. Write access to the device is unrestricted. EEPROM SOFTWARE DATA PROTECTION DISABLE ALGORITHM(1) To enable software write protection, the user writes three access code bytes to three special internal locations. Once write protection has been enabled, each write to the EEPROM must use the same three byte write sequence to permit writing. After setting software data protection, any attempt to write to the device without the three-byte command sequence will start the internal write timers. No data will be written to the device, however, for the duration of tWC. The write protection feature can be disabled by a six byte write sequence of specific data to specific locations. Power transitions will not reset the software write protection. LOAD DATA AA TO ADDRESS 5555 ➞ LOAD DATA 55 TO ADDRESS 2AAA ➞ LOAD DATA 80 TO ADDRESS 5555 ➞ Each 128K byte block of the EEPROM has independent write protection. One or more blocks may be enabled and the rest disabled in any combination. The software write protection guards against inadvertent writes during power transitions, or unauthorized modification using a PROM programmer. LOAD DATA AA TO ADDRESS 5555 ➞ LOAD DATA 55 TO ADDRESS 2AAA ➞ EEPROM HARDWARE DATA PROTECTION (3) ➞ EXIT DATA PROTECT STATE These features protect against inadvertent writes to the WSE128K16-XXX. These are included to improve reliability during normal operation: LOAD DATA 20 TO ADDRESS 5555 a) V CC power on delay As VCC climbs past 3.8V typical the device will wait 5msec typical before allowing write cycles. LOAD DATA XX TO ANY ADDRESS(4) ➞ LOAD LAST BYTE TO LAST ADDRESS b) V CC sense While below 3.8V typical write cycles are inhibited. c) Write inhibiting Holding OE low and either ECS or EWE high inhibits write cycles. d) Noise filter Pulses of <8ns (typ) on EWE or ECS will not initiate a write cycle. NOTES: 1. Data Format: ED 7 - ED 0 (Hex); Address Format: A 16 - A0 (Hex). 2. Write Protect state will be activated at end of write even if no other data is loaded. 3. Write Protect state will be deactivated at end of write period even if no other data is loaded. 4. 1 to 128 bytes of data may be loaded. White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520 12 WSE128K16-XXX PACKAGE 400: 66 PIN, PGA TYPE, CERAMIC HEX-IN-LINE PACKAGE, HIP (H1) 27.3 (1.075) ± 0.25 (0.010) SQ PIN 1 IDENTIFIER SQUARE PAD ON BOTTOM 25.4 (1.0) TYP 4.34 (0.171) MAX 3.81 (0.150) ± 0.13 (0.005) 1.42 (0.056) ± 0.13 (0.005) 0.76 (0.030) ± 0.13 (0.005) 2.54 (0.100) TYP 15.24 (0.600) TYP 1.27 (0.050) TYP DIA 0.46 (0.018) ± 0.05 (0.002) DIA 25.4 (1.0) TYP ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES 13 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WSE128K16-XXX PACKAGE 509: 68 LEAD, CERAMIC QUAD FLAT PACK, CQFP (G2T) 25.15 (0.990) ± 0.26 (0.010) SQ 4.57 (0.180) MAX 22.36 (0.880) ± 0.26 (0.010) SQ 0.27 (0.011) ± 0.04 (0.002) 0.25 (0.010) REF Pin 1 R 0.25 (0.010) 24.03 (0.946) ± 0.26 (0.010) 0.19 (0.007) ± 0.06 (0.002) 1° / 7° 1.0 (0.040) ± 0.127 (0.005) 23.87 (0.940) REF DETAIL A 1.27 (0.050) TYP SEE DETAIL "A" 0.38 (0.015) ± 0.05 (0.002) 20.3 (0.800) REF The WEDC 68 lead G2T CQFP fills the same fit and function as the JEDEC 68 lead CQFJ or 68 PLCC. But the G2T has the TCE and lead inspection advantage of the CQFP form. 0.940" TYP ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES White Electronic Designs Corporation • Phoenix, AZ • (602) 437-1520 14 WSE128K16-XXX ORDERING INFORMATION W S E 128K16 - XXX X X X LEAD FINISH: Blank = Gold plated leads A = Solder dip leads DEVICE GRADE: M = Military Screened I = Industrial C = Commercial -55°C to +125°C -40°C to +85°C 0°C to +70°C PACKAGE TYPE: H1 = 1.075" sq. Ceramic Hex-In-line Package, HIP (Package 400) G2T = 22.4mm Ceramic Quad Flat Pack, CQFP (Package 509) ACCESS TIME (ns) 35 = 35ns SRAM and 150ns EEPROM 42 = 45ns SRAM and 120ns EEPROM 73 = 70ns SRAM and 300ns EEPROM ORGANIZATION, 128K x 16 EEPROM SRAM WHITE ELECTRONIC DESIGNS CORP. 15 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com