TI TLK2711-SP

TLK2711-SP
www.ti.com .............................................................................................................................................................. SGLS307D – JULY 2006 – REVISED JULY 2009
1.6-Gbps to 2.5-Gbps Class V Transceiver
FEATURES
1
•
•
•
•
•
•
•
1.6- to 2.5-Gbps (Gigabits Per Second)
Serializer/Deserializer
Hot-Plug Protection
High-Performance 68-Pin Ceramic Quad Flat
Pack Package (HFG)
Low-Power Operation
Programmable Preemphasis Levels on
Serial Output
Interfaces to Backplane, Copper Cables, or
Optical Converters
On-Chip 8-Bit/10-Bit Encoding/Decoding,
Comma Detect
•
•
•
•
•
•
•
•
On-Chip PLL Provides Clock Synthesis From
Low-Speed Reference
Low Power: <500 mW
3-V Tolerance on Parallel Data Input Signals
16-Bit Parallel TTL-Compatible Data Interface
Ideal for High-Speed Backplane Interconnect
and Point-to-Point Data Link
Military Temperature Range
(–55°C to 125°C Tcase)
Loss of Signal (LOS) Detection
Integrated 50-Ω Termination Resistors on RX
DESCRIPTION
The TLK2711 is a member of the WizardLink transceiver family of multigigabit transceivers, intended for use in
ultra-high-speed bidirectional point-to-point data transmission systems. The TLK2711 supports an effective serial
interface speed of 1.6 Gbps to 2.5 Gbps, providing up to 2 Gbps of data bandwidth.
The primary application of the TLK2711 is to provide high-speed I/O data channels for point-to-point baseband
data transmission over controlled impedance media of approximately 50 Ω. The transmission media can be
printed circuit board, copper cables, or fiber-optic cable. The maximum rate and distance of data transfer is
dependent upon the attenuation characteristics of the media and the noise coupling to the environment.
This device can also be used to replace parallel data transmission architectures by providing a reduction in the
number of traces, connector terminals, and transmit/receive terminals. Parallel data loaded into the transmitter is
delivered to the receiver over a serial channel, which can be a coaxial copper cable, a controlled impedance
backplane, or an optical link. It is then reconstructed into its original parallel format. It offers significant power and
cost savings over parallel solutions, as well as scalability for higher data rates in the future.
The TLK2711 performs parallel-to-serial and serial-to-parallel data conversion. The clock extraction functions as
a physical layer (PHY) interface device. The serial transceiver interface operates at a maximum speed of 2.5
Gbps. The transmitter latches 16-bit parallel data at a rate based on the supplied reference clock (TXCLK). The
16-bit parallel data is internally encoded into 20 bits using an 8-bit/10-bit (8b/10b) encoding format. The resulting
20-bit word is then transmitted differentially at 20 times the reference clock (TXCLK) rate. The receiver section
performs the serial-to-parallel conversion on the input data, synchronizing the resulting 20-bit wide parallel data
to the recovered clock (RXCLK). It then decodes the 20-bit wide data using the 8-bit/10-bit decoding format
resulting in 16 bits of parallel data at the receive data terminals (RXD0–RXD15). The outcome is an effective
data payload of 1.28 Gbps to 2 Gbps (16 bits data × the frequency).
The TLK2711 is available in a 68-pin ceramic nonconductive tie-bar package (HFG).
NOTE:
The errata noted in the commercial TLK2711 device titled "Errata to the TLK2711,
1.6-to-2.7 GBPS Transceiver Data Sheet– PLL False Lock Problem" does not apply to
the TLK2711-SP device. The TLK2711-SP is functionally equivalent to the TLK2711A
commercial device.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006–2009, Texas Instruments Incorporated
TLK2711-SP
SGLS307D – JULY 2006 – REVISED JULY 2009 .............................................................................................................................................................. www.ti.com
The TLK2711 provides an internal loopback capability for self-test purposes. Serial data from the serializer is
passed directly to the deserializer, providing the protocol device with a functional self-check of the physical
interface.
The TLK2711 has a loss of signal (LOS) detection circuit for conditions where the incoming signal no longer has
a sufficient voltage amplitude to keep the clock recovery circuit in lock.
The TLK2711 allows users to implement redundant ports by connecting receive data bus terminals from two
TLK2711 devices together. Asserting the LCKREFN to a low state causes the receive data bus terminals
(RXD0–RXD15, RXCLK, RKLSB, and RKMSB) to go to a high-impedance state. This places the device in a
transmit-only mode, since the receiver is not tracking the data.
The TLK2711 I/Os are 3-V compatible. The TLK2711 is characterized for operation from –55°C to 125°C Tcase.
The TLK2711 is designed to be hot-plug capable. An on-chip power-on reset circuit holds the RXCLK low, and
goes to high impedance on the parallel-side output signal terminals, as well as TXP and TXN during power up.
RXD1
RXD2
RXD0
DINRXN
GND
VDDA
GND
DINRXP
VDDA
PRE
DOUTTXN
GND
DOUTTXP
TXD0
GND
TXD2
TXD1
HFG PACKAGE
(TOP VIEW)
VDD
1
68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52
51
TXD3
2
50
VDD
TXD4
3
49
RXD3
TXD5
4
48
RXD4
GND
5
47
RXD5
TXD6
6
46
RXD6
TXD7
7
45
GND
GTX_CLK
8
44
RXD7
VDD
9
43
RX_CLK
TXD8
10
42
RXD8
TXD9
11
41
RXD9
TXD10
12
40
VDD
GND
13
39
RXD10
TXD11
14
38
RXD11
TXD12
15
37
RXD12
TXD13
16
36
RXD13
GND
GND
RXD15
RXD14
RKMSB
GND
RKLSB
TESTEN
PRBSEN
LCKREFN
TKLSB
VDD
ENABLE
TXD15
TKMSB
LOOPEN
GND
35
17
18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34
TXD14
GND
GND
ORDERING INFORMATION (1)
(1)
(2)
2
TA
PACKAGE (2)
ORDERABLE PART
NUMBER
TOP-SIDE MARKING
–55°C to 125°C
TLK2711 - HFG
5962-0522101VXC
5962-0522101VXC TLK2711HFG
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
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BLOCK DIAGRAM
LOOPEN
PRBSEN
PRBSEN
PRBS
Generator
TXP
10
TXN
10
Parallel to
Serial
BIAS
10
PRE
MUX
TKLSB
9
TKMSB
8b/10b
Encoder
TXD0−TXD15
18 Bit
Register
9
8b/10b
Encoder
2:1
10
MUX
10
Clock
Synthesizer
TXCLK
TESTEN
Controls:
PLL, Bias, RX,
TX
ENABLE
PRBSEN
2:1
MUX
RKLSB
18 Bit
Register
9
RKMSB
PRBS
Verification
PRBSEN
RXCLK
RXD0−RXD15
Interpolator and
Clock Recovery
9
Comma
Detect
and 8b/10b
Decoding
Comma
Detect
and 8b/10b
Decoding
Clock
2:1
MUX
Recovered
Clock
10
1:2
MUX
10
Serial to
Parallel
2:1
MUX
Data
RXP
RXN
10
Signal Detect
(LOS)
Figure 1. TLK2711 Block Diagram
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TLK2711-SP
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TERMINAL FUNCTIONS
TERMINAL
NAME
PIN NO.
I/O
DESCRIPTION
DOUTTXN
DOUTTXP
63
64
O
Serial transmit outputs. TXP and TXN are differential serial outputs that interface to copper or an
optical I/F module. These terminals transmit NRZ data at a rate of 20 times the TXCLK value. TXP
and TXN are put in a high-impedance state when LOOPEN is high and are active when LOOPEN
is low. During power-on reset, these terminals are high impedance.
ENABLE
25
I (1)
Device enable. When this terminal is held low, the device is placed in power-down mode. Only the
signal detect circuit on the serial receive pair is active. When asserted high while the device is in
power-down mode, the transceiver goes into power-on reset before beginning normal operation.
5, 13, 17,
19, 29, 34,
35, 45, 51,
55, 58, 62,
65
GND
LCKREFN
26
Analog and digital logic ground. Provides a ground for the logic circuits, digital I/O buffers, and the
high-speed analog circuits.
Lock to reference. When LCKREFN is low, the receiver clock is frequency locked to TXCLK. This
places the device in a transmit-only mode since the receiver is not tracking the data. When
LCKREFN is asserted low, the receive data bus terminals (RXD0–RXD15, RXCLK, RKLSB, and
RKMSB) are in a high-impedance state.
When LCKREFN is deasserted high, the receiver is locked to the received data stream.
I
(1)
(2)
Loop enable. When LOOPEN is active high, the internal loopback path is activated. The
transmitted serial data is directly routed internally to the inputs of the receiver. This provides a
self-test capability in conjunction with the protocol device. The TXP and TXN outputs are held in a
high-impedance state during the loopback test. LOOPEN is held low during standard operational
state, with external serial outputs and inputs active.
LOOPEN
22
I
PRE
60
I (2)
Preemphasis control. Selects the amount of preemphasis to be added to the high-speed serial
output drivers. Left low or unconnected, 5% preemphasis is added. Pulled high, 20% preemphasis
is added.
PRBSEN
27
I (2)
PRBS test enable. When asserted high, results of pseudo-random bit stream (PRBS) tests can be
monitored on the RKLSB terminal. A high on RKLSB indicates that valid PRBS is being received.
O
K-code indicator/PRBS test results. When RKLSB is asserted high, an 8-bit/10-bit K code was
received and is indicated by data bits RXD0–RXD7. When RKLSB is asserted low, an 8-bit/10-bit
D code is received and is presented on data bits RXD0–RXD7. When PRBSEN is asserted high,
this pin is used to indicate status of the PRBS test results (high = pass).
RKLSB
30
RKMSB
31
O
K-code indicator. When RKMSB is asserted high an 8-bit/10-bit K code was received and is
indicated by data bits RXD8–RXD15. When RKMSB is asserted low an 8-bit/10-bit D code was
received and is presented on data bits RXD8–RXD15. If the differential signal on RXN and RXP
drops below 200 mV, RXD0–RXD15, RKLSB, and RKMSB are all asserted high.
RXCLK
RX_CLK
43
O
Recovered clock. Output clock that is synchronized to RXD0–RXD9, RKLSB, and RKMSB. RXCLK
is the recovered serial data rate clock divided by 20. RXCLK is held low during power-on reset.
RXD0
RXD1
RXD2
RXD3
RXD4
RXD5
RXD6
RXD7
RXD8
RXD9
RXD10
RXD11
RXD12
RXD13
RXD14
RXD15
54
53
52
49
48
47
46
44
42
41
39
38
37
36
33
32
O
Receive data bus. These outputs carry 16-bit parallel data output from the transceiver to the
protocol device, synchronized to RXCLK. The data is valid on the rising edge of RXCLK as shown
in Figure 5. These terminals are in high-impedance state during power-on reset.
DINRXN
DINRXP
56
57
I
Serial receive inputs. RXP and RXN together are the differential serial input interface from a
copper or an optical I/F module.
TESTEN
28
I (2)
(1)
(2)
4
Test mode enable. This terminal should be left unconnected or tied low.
Internal 10-kΩ pullup
Internal 10-kΩ pulldown
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TERMINAL FUNCTIONS (continued)
TERMINAL
NAME
PIN NO.
I/O
DESCRIPTION
TKLSB
23
I (3)
K-code generator (LSB). When TKLSB is high, an 8-bit/10-bit K code is transmitted as controlled
by data bits TXD0–TXD7. When TKLSB is low, an 8-bit/10-bit D code is transmitted as controlled
by data bits TXD0–TXD7.
TKMSB
21
I (3)
K-code generator (MSB). When TKMSB is high, an 8-bit/10-bit K code is transmitted as controlled
by data bits TXD8–TXD15. When TKMSB is low, an 8-bit/10-bit D code is transmitted as controlled
by data bits TXD8–TXD15.
TXCLK
GTX_CLK
8
I
Reference clock. TXCLK is a continuous external input clock that synchronizes the transmitter
interface signals TKMSB, TKLSB, and TXD0–TXD15. The frequency range of TXCLK is 80 MHz to
135 MHz. The transmitter uses the rising edge of this clock to register the 16-bit input data
TXD0–TXD15 for serialization.
TXD0
TXD1
TXD2
TXD3
TXD4
TXD5
TXD6
TXD7
TXD8
TXD9
TXD10
TXD11
TXD12
TXD13
TXD14
TXD15
66
67
68
2
3
4
6
7
10
11
12
14
15
16
18
20
I
Transmit data bus. These inputs carry the 16-bit parallel data output from a protocol device to the
transceiver for encoding, serialization, and transmission. This 16-bit parallel data is clocked into
the transceiver on the rising edge of TXCLK as shown in Figure 2.
VDD
VDDA
(3)
1, 9, 24, 40,
50
59, 61
Digital logic power. Provides power for all digital circuitry and digital I/O buffers.
Analog power. VDDA provides a supply reference for the high-speed analog circuits, receiver, and
transmitter.
Internal 10-kΩ pullup
DETAILED DESCRIPTION
Transmit Interface
The transmitter interface registers valid incoming 16-bit-wide data (TXD0–TXD15) on the rising edge of the
TXCLK. The data is then 8-bit/10-bit encoded, serialized, and transmitted sequentially over the differential
high-speed I/O channel. The clock multiplier multiplies the reference clock (TXCLK) by a factor of 10 times,
creating a bit clock. This internal bit clock is fed to the parallel-to-serial shift register, which transmits data on
both the rising and falling edges of the bit clock, providing a serial data rate that is 20 times the reference clock.
Data is transmitted least significant bit (LSB) (TXD0) first.
Transmit Data Bus
The transmit data bus interface accepts 16-bit single-ended TTL parallel data at the TXD0–TXD15 terminals.
Data and K-code control is valid on the rising edge of the TXCLK. The TXCLK is used as the word clock. The
data, K-code, and clock signals must be properly aligned as shown in Figure 2. Detailed timing information can
be found in the electrical characteristics table.
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TXCLK
TXD0−TXD15
tsu
th
TKLSB, TKMSB
Figure 2. Transmit Timing Waveform
Data Transmission Latency
The data transmission latency of the TLK2711 is defined as the delay from the initial 16-bit word load to the
serial transmission of bit 0. The transmit latency is fixed once the link is established. However, due to silicon
process variations and implementation variables such as supply voltage and temperature, the exact delay varies
slightly. The minimum transmit latency td(Tx latency) is 34 bit times; the maximum is 38 bit times. Figure 3 shows the
timing relationship between the transmit data bus, the TXCLK, and the serial transmit terminals.
Transmitted 20-Bit Word
TXP,
TXN
td(Tx latency)
TXD0−TXD15
16-Bit Word to Transmit
TXCLK
Figure 3. Transmitter Latency
8-Bit/10-Bit Encoder
All true serial interfaces require a method of encoding to ensure minimum transition density, so that the receiving
phase-locked loop (PLL) has a minimal number of transitions to stay locked on. The encoding scheme maintains
the signal dc balance by keeping the number of ones and zeros the same. This provides good transition density
for clock recovery and improves error checking. The TLK2711 uses the 8-bit/10-bit encoding algorithm that is
used by fibre channel and gigabit ethernet. This is transparent to the user, as the TLK2711 internally encodes
and decodes the data such that the user reads and writes actual 16-bit data.
The 8-bit/10-bit encoder converts 8-bit-wide data to a 10-bit-wide encoded data character to improve its
transmission characteristics. Since the TLK2711 is a 16-bit-wide interface, the data is split into two 8-bit-wide
bytes for encoding. Each byte is fed into a separate encoder. The encoding is dependent upon two additional
input signals, TKMSB and TKLSB.
6
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Table 1. Transmit Data Controls
TKLSB
TKMSB
0
0
Valid data on TXD0–TXD7,
16 BIT PARALLEL INPUT
Valid data TXD8–TXD15
0
1
Valid data on TXD0–TXD7,
K code on TXD8–TXD15
1
0
K code on TXD0–TXD7,
Valid data on TXD8–TXD15
1
1
K code on TXD0–TXD7,
K code on TXD8–TXD15
Pseudo-Random Bit Stream (PRBS) Generator
The TLK2711 has a built-in 27–1 PRBS function. When the PRBSEN terminal is forced high, the PRBS test is
enabled. A PRBS is generated and fed into the 10-bit parallel-to-serial converter input register. Data from the
normal input source is ignored during the PRBS mode. The PRBS pattern is then fed through the transmit
circuitry as if it were normal data and sent out to the transmitter. The output can be sent to a bit error rate tester
(BERT), the receiver of another TLK2711, or looped back to the receive input. Since the PRBS is not really
random but a predetermined sequence of ones and zeroes, the data can be captured and checked for errors by
a BERT.
Parallel to Serial
The parallel-to-serial shift register takes in the 20-bit-wide data word multiplexed from the two parallel 8-bit/10-bit
encoders and converts it to a serial stream. The shift register is clocked on both the rising and falling edge of the
internally generated bit clock, which is 10 times the TXCLK input frequency. The LSB (TXD0) is transmitted first.
High-Speed Data Output
The high-speed data output driver consists of a voltage mode logic (VML) differential pair optimized for a 50-Ω
impedance environment. The magnitude of the differential pair signal swing is compatible with pseudo emitter
coupled logic (PECL) levels when ac coupled. The line can be directly coupled or ac coupled. See Figure 13 and
Figure 14 for termination details. The outputs also provide preemphasis to compensate for ac loss when driving a
cable or PCB backplane trace over a long distance (see Figure 4). The level of preemphasis is controlled by PRE
(see Table 2 ).
VOD(p)
Table 2. Programmable Preemphasis
VOD(d)
0V
PRE
PREEMPHASIS LEVEL (%)
VOD(P), VOD(D) (1)
0
5%
1
20%
VOD(d)
Bit
Time
Bit
Time
VOD(p)
(1)
Figure 4. Output Voltage Under Preemphasis
(VTXP–VTXN)
VOD(p): Voltage swing when there is a transition in the data
stream.
VOD(d): Voltage swing when there is no transition in the data
stream.
Receive Interface
The receiver interface of the TLK2711 accepts 8-bit/10-bit encoded differential serial data. The interpolator and
clock recovery circuit locks to the data stream and extracts the bit-rate clock. This recovered clock is used to
retime the input data stream. The serial data is then aligned to two separate 10-bit word boundaries, 8-bit/10-bit
decoded, and output on a 16-bit-wide parallel bus synchronized to the extracted receive clock. The data is
received LSB (RXD0) first.
Receive Data Bus
The receive bus interface drives 16-bit-wide single-ended TTL parallel data at the RXD0–RXD15 terminals. Data
is valid on the rising edge of the RXCLK. The RXCLK is used as the recovered word clock. The data, RKLSB,
RKMSB, and clock signals are aligned as shown in Figure 5. Detailed timing information can be found in the
switching characteristics table.
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RXCLK
RXD0−RXD15
tsu
th
RKLSB, RKMSB
Figure 5. Receive Timing Waveform
Data Reception Latency
The serial-to-parallel data receive latency is the time from when the first bit arrives at the receiver until it is output
in the aligned parallel word. The receive latency is fixed once the link is established. However, due to silicon
process variations and implementation variables such as supply voltage and temperature, the exact delay varies
slightly. The minimum receive latency td(Rx latency) is 76 bit times; the maximum is 107 bit times. Figure 6 shows
the timing relationship between the serial receive terminals, the recovered word clock (RXCLK), and the receive
data bus.
20-Bit Encoded Word
RXN,
RXP
td(Rx latency)
RXD0−RXD15
16-Bit Decoded Word
RXCLK
Figure 6. Receiver Latency
Serial to Parallel
Serial data is received on the RXP and RXN terminals. The interpolator and clock recovery circuit locks to the
data stream if the clock to be recovered is within 200 PPM of the internally generated bit rate clock. The
recovered clock is used to retime the input data stream. The serial data is then clocked into the serial-to-parallel
shift registers. The 10-bit-wide parallel data is then multiplexed and fed into two separate 8-bit/10-bit decoders,
where the data is then synchronized to the incoming data stream word boundary by detection of the comma
8-bit/10-bit synchronization pattern.
8
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Comma Detect and 8-Bit/10-Bit Decoding
The TLK2711 has two parallel 8-bit/10-bit decode circuits. Each 8-bit/10-bit decoder converts 10-bit encoded
data (half of the 20-bit received word) back into eight bits. The comma-detect circuit is designed to provide for
byte synchronization to an 8-bit/10-bit transmission code. When parallel data is clocked into a parallel-to-serial
converter, the byte boundary that was associated with the parallel data is now lost in the serialization of the data.
When the serial data is received and converted to parallel format again, a method is needed to recognize the
byte boundary. Typically, this is accomplished through the use of a synchronization pattern. This is typically a
unique pattern of ones and zeros that either cannot occur as part of valid data or is a pattern that repeats at
defined intervals. The 8-bit/10-bit encoding contains a character called the comma (b0011111 or b1100000),
which is used by the comma-detect circuit on the TLK2711 to align the received serial data back to its original
byte boundary. The decoder detects the comma, generating a synchronization signal aligning the data to their
10-bit boundaries for decoding; the comma is mapped into the LSB. The decoder then converts the data back
into 8-bit data. The output from the two decoders is latched into the 16-bit register synchronized to the recovered
parallel data clock (RXCLK) and output valid on the rising edge of the RXCLK.
NOTE:
The TLK2711 only achieves byte alignment on the 0011111 comma.
Decoding provides two additional status signals, RKLSB and RKMSB. When RKLSB is asserted, an 8-bit/10-bit
K code is received and the specific K code is presented on the data bits RXD0–RXD7; otherwise, an 8-bit/10-bit
D code is received. When RKMSB is asserted, an 8-bit/10-bit K code is received and the specific K-code is
presented on data bits RXD8–RXD15; otherwise, an 8-bit/10-bit D code is received (see Table 3). The valid K
codes the TLK2711; decodes are provided in Table 4. An error detected on either byte, including K codes not in
Table 4, causes that byte only to indicate a K0.0 code on the RKxSB and associated data pins, where K0.0 is
known to be an invalid 8-bit/10-bit code. A loss of input signal causes a K31.7 code to be presented on both
bytes, where K31.7 is also known to be an invalid 8-bit/10-bit code.
Table 3. Receive Status Signals
RKLSB
RKMSB
DECODED 20-BIT OUTPUT
0
0
Valid data on RXD0–RXD7,
Valid data RXD8–RXD15
0
1
Valid data on RXD0–RXD7,
K code on RXD8–RXD15
1
0
K code on RXD0–RXD7,
Valid data on RXD8–RXD15
1
1
K code on RXD0–RXD7,
K code on RXD8–RXD15
Table 4. Valid K Characters
K CHARACTER
RECEIVE DATA BUS
RXD0–RXD7 OR RXD8–RXD15
K28.0
000 11100
K28.1
001 11100
K28.2
010 11100
K28.3
011 11100
K28.4
100 11100
K28.5
(1)
(1)
(1)
101 11100
K28.6
110 11100
K28.7 (1)
111 11100
K23.7
111 10111
K27.7
111 11011
K29.7
111 11101
K30.7
111 11110
Should only be present on RXD0–RXD7 when in running disparity
<0
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Power-Down Mode
The TLK2711 goes into power-down mode when the ENABLE pin is pulled low. In the power-down mode, the
serial transmit pins (TXN), the receive data bus pins (RXD0–RXD15), and RKLSB goes into a high-impedance
state. In the power-down condition, the signal detection circuit draws less than 15 mW. When the TLK2711 is in
the power-down mode, the clock signal on the TXCLK terminal must be provided if LOS functionality is needed.
Loss of Signal (LOS) Detection
The TLK2711 has a LOS detection circuit for conditions where the incoming signal no longer has a sufficient
voltage level to keep the clock recovery circuit in lock. The signal detection circuit is intended to be an indication
of gross signal error conditions, such as a detached cable or no signal being transmitted, and not an indication of
signal coding health. The TLK2711 reports this condition by asserting RKLSB, RKMSB, and RXD0–RXD15
terminals to a high state. As long as the differential signal is above 200 mV in differential magnitude, the LOS
circuit does not signal an error condition.
PRBS Verification
The TLK2711 also has a built-in BERT function in the receiver side that is enabled by the PRBSEN. It can check
for errors and report the errors by forcing the RKLSB terminal low.
Reference Clock Input
The reference clock (TXCLK) is an external input clock that synchronizes the transmitter interface. The reference
clock is then multiplied in frequency 10 times to produce the internal serialization bit clock. The internal
serialization bit clock is frequency locked to the reference clock and used to clock out the serial transmit data on
both its rising and falling edges, providing a serial data rate that is 20 times the reference clock.
Operating Frequency Range
The TLK2711 operates at a serial data rate from 1.6 Gbps to 2.5 Gbps. To achieve these serial rates, TXCLK
must be within 80 MHz to 125 MHz. The TXCLK must be within ±100 PPM of the desired parallel data rate clock.
Testability
The TLK2711 has a comprehensive suite of built-in self-tests. The loopback function provides for at-speed
testing of the transmit/receive portions of the circuitry. The enable terminal allows for all circuitry to be disabled
so that a quiescent current test can be performed. The PRBS function allows for built-in self-test (BIST).
Loopback Testing
The transceiver can provide a self-test function by enabling (LOOPEN) the internal loopback path. Enabling this
terminal causes serial-transmitted data to be routed internally to the receiver. The parallel data output can be
compared to the parallel input data for functional verification. The external differential output is held in a
high-impedance state during the loopback testing.
Built-In Self-Test (BIST)
The TLK2711 has a BIST function. By combining PRBS with loopback, an effective self-test of all the circuitry
running at full speed can be realized. The successful completion of the BIST is reported on the RKLSB terminal.
Power-On Reset
Upon application of minimum valid power, the TLK2711 generates a power-on reset. During the power-on reset
the RXD0–RXD15, RKLSB, and RKMSB signal terminals go to a high-impedance state. The RXCLK is held low.
The length of the power-on reset cycle is dependent upon the TXCLK frequency, but is less than 1 ms.
10
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ABSOLUTE MAXIMUM RATINGS
over operating temperature range (unless otherwise noted) (1)
UNIT
Supply voltage range (2)
VDD
–0.3 V to 3 V
TXD0–TXD15, ENABLE, TXCLK, TKMSB,
TKLSB, LOOPEN, PRBSEN, LCKREFN,
PRE
Voltage range
All other terminals
PD
Package power dissipation
Tstg
Storage temperature range
Tc
(1)
(2)
–0.3 V to 4 V
–0.3 V to VDD , VDDA + 0.3 V
See Dissipation Rating Table
–65°C to 150°C
Electrostatic discharge
HBM
2 kV
Characterized case operating temperature range
HFG
–55°C to 125°C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are stated with respect to network ground.
ELECTRICAL CHARACTERISTICS
over recommended operating conditions
PARAMETER
VDD
Supply voltage
ICC
Supply current
PD
Power dissipation
TEST CONDITIONS
MIN
NOM
MAX
Frequency range 1.6 Gbps to 2 Gbps
2.375
2.5
2.625
2.5
2.6
2.7
Frequency range 1.6 Gbps to 2.5 Gbps
Frequency = 1.6 Gbps, PRBS pattern
110
Frequency = 2.5 Gbps, PRBS pattern
160
Frequency = 1.6 Gbps, PRBS pattern
275
Frequency = 2.5 Gbps, PRBS pattern
400
Frequency = 2.5 Gbps, PRBS pattern
Shutdown current
Enable = 0, VDDA, VDD terminals, VDD = MAX
PLL startup lock time
VDD, VDDC = 2.375 V
mA
mW
3
0.1
mA
0.4
1024
Operating case temperature
V
550
Data acquisition time
Tc
UNIT
–55
ms
Bits
125
°C
REFERENCE CLOCK (TXCLK) TIMING REQUIREMENTS
over recommended operating conditions (unless otherwise noted)
PARAMETER
MAX
UNIT
–100
100
ppm
Frequency tolerance
–100
100
ppm
Duty cycle
40%
Frequency
Jitter
TEST CONDITIONS
Receiver data rate/20
Peak to peak
MIN
TYP
50%
60%
40
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TTL INPUT ELECTRICAL CHARACTERISTICS
over recommended operating conditions (unless otherwise noted),
TTL signals: TXD0–TXD15, TXCLK, LOOPEN, LCKREFN, ENABLE, PRBS_EN, TKLSB, TKMSB, PRE
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIH
High-level input voltage
See Figure 7
1.7
VIL
Low-level input voltage
See Figure 7
0.8
V
V
IIH
Input high current
VDD = MAX, VIN = 2 V
40
µA
IIL
Input low current
VDD = MAX, VIN = 0.4 V
CI
Receiver input capacitance
–40
µA
6
pF
1
ns
1
ns
tr
Rise time, TXCLK, TKMSB, TKLSB, TXD0–TXD15
0.7 V to 1.9 V, C = 5 pF,
See Figure 7
tf
Fall time, TXCLK, TKMSB, TKLSB, TXD0–TXD15
1.9 V to 0.7 V, C = 5 pF,
See Figure 7
tsu
TXD0–TXD15, TKMSB, TKLSB setup to ↑ TXCLK
See Figure 7 (1)
1.5
ns
(1)
0.4
ns
th
(1)
TXD, TKMSB, TKLSB hold to ↑ TXCLKS
See Figure 7
Nonproduction tested parameters
3.6 V
2V
TXCLK
0.8 V
0V
tr
tf
3.6 V
2V
TKLSB, TKMSB,
TXD0−TXD15
0.8 V
0V
tr
tsu
tf
th
Figure 7. TTL Data Input Valid Levels for AC Measurements
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TTL OUTPUT SWITCHING CHARACTERISTICS
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
2.1
2.3
MAX
UNIT
VOH
High-level output voltage
IOH = –2 mA, VDD = MIN
VOL
Low-level output voltage
IOL = 2 mA, VDD = MIN
tr(slew)
Slew rate (rising), magnitude of RXCLK, RKLSB,
RKMSB, RXD0–RXD15
0.8 V to 2 V, C = 5 pF, See Figure 8
0.5
V/ns
tf(slew)
Slew rate (falling), magnitude of RXCLK, RKLSB,
RKMSB, RXD0–RXD15
0.8 V to 2 V, C = 5 pF, See Figure 8
0.5
V/ns
tsu
th
(1)
RXD0–RXD15, RKMSB, RKLSB setup to ↑ RXCLK
RXD0–RXD15, RKMSB, RKLSB hold to ↑ RXCLK
V
0.25
50% voltage swing, TXCLK = 80 MHz,
See Figure 8 (1)
50% voltage swing, TXCLK = 125 MHz,
See Figure 8 (1)
0.5
V
3
ns
2.5
50% voltage swing, TXCLK = 80 MHz,
See Figure 8 (1)
3
50% voltage swing, TXCLK = 125 MHz,
See Figure 8 (1)
2
ns
Nonproduction tested parameters
2.7 V
2V
RXCLK
0.8 V
0V
tr(slew)
tf(slew)
2.7 V
2V
RKLSB, RKMSB,
RXD0−RXD15
0.8 V
0V
tr(slew)
tsu
tf(slew)
th
Figure 8. TTL Data Output Valid Levels for AC Measurements
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TRANSMITTER/RECEIVER CHARACTERISTICS
PARAMETER
VOD(p)
VOD(pp_p)
TEST CONDITIONS
Preemphasis VOD, direct,
VOD(p) = |VTXP – VTXN|
Differential,
peak-to-peak output voltage
with preemphasis
MIN
TYP
MAX
Rt = 50 Ω, PREM = high, dc-coupled,
See Figure 9
655
800
1100
Rt = 50 Ω, PREM = low, dc coupled,
See Figure 9
590
740
1050
Rt = 50 Ω, PREM = high, dc coupled,
See Figure 9
1310
1600
2200
Rt = 50 Ω, PREM = low, dc coupled,
See Figure 9
1180
1480
2100
UNIT
mV
mVp-p
VOD(d)
Deemphais output voltage,
|VTXP – VTXN|
Rt = 50 Ω, dc coupled, See Figure 9
540
650
950
mV
VOD(pp_d)
Differential, peak-to-peak output voltage with
deemphasis
Rt = 50 Ω, dc coupled, See Figure 9
1080
1300
1900
mVp-p
V(cmt)
Transmit common mode voltage range,
(VTXP + VTXN)/2
Rt = 50 Ω, See Figure 9
1000
1250
1450
mV
VID
Receiver input voltage differential,
|VRXP – VRXN|
(1)
220
1600
mV
V(cmr)
Receiver common mode voltage range,
(VRXP + VRXN)/2
(1)
1000
2250
mV
Ilkg
Receiver input leakage current
10
µA
CI
Receiver input capacitance
1250
–10
4
pF
Differential output jitter at 2.5 Gbps,
Random + deterministic, PRBS pattern
0.28
Differential output jitter at 1.6 Gbps,
Random + deterministic, PRBS pattern
0.32
Differential output signal rise, fall time
(20% to 80%)
RL = 50 Ω, CL = 5 pF, See Figure 9
150
Jitter tolerance eye closure
Differential input jitter, random + deterministic,
PRBS pattern at zero crossing (1)
0.4
latency)
Tx latency
See Figure 3
34
38
Bits
td(Rx latency)
Rx latency
See Figure 6
76
107
Bits
Serial data total jitter (peak to peak)
tt, tf
td(Tx
(1)
(2)
UI (2)
ps
UI
Nonproduction tested parameters
UI is the time interval of one serialized bit.
VOD(p)
VOD(d)
VOD(pp_d)
0V
VOD(pp_p)
tf
VOD(d)
tr
Bit
Time
Bit
Time
VOD(p)
Figure 9. Differential and Common-Mode Output Voltage
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VOD(p)
VOD(d)
VTXN
V(cmt)
VTXP
Bit
Time
Bit
Time
Figure 10. Common-Mode Output Voltage Definitions
THERMAL INFORMATION
Thermal Characteristics
TYP
UNIT
RθJA
Junction-to-free-air thermal resistance
PARAMETER
Board mounted, per JESD 51-5 methodology
TEST CONDITIONS
31.5
°C/W
RθJC
Junction-to-case thermal resistance
MIL-STD-883 Test Method 1012
2.96
°C/W
Thermal notes: This CQFP package has built in vias that electrically and thermally connect the bottom of the die
to a pad on the bottom of the package. In order to efficiently remove heat and provide a low-impedance ground
path, a thermal land is required on the surface of the PCB directly underneath the body of the package. During
normal surface mount flow solder operations, the heat pad on the underside of the package is soldered to this
thermal land creating an efficient thermal path. Normally, the PCB thermal land has a number of thermal vias
within it that provide a thermal path to internal copper areas (or to the opposite side of the PCB) that provide for
more efficient heat removal. TI typically recommends an 11,9-mm x 11.9-mm board-mount thermal pad with a
4,2-mm x 4,2-mm solder mask defined pad attach opening. This allows maximum area for thermal dissipation,
while allowing leads pad to solder pad clearance. A sufficient quantity of thermal/electrical vias must be included
to keep the device within recommended operating conditions. This pad must be electrically ground potential.
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12
10
Tlife - Years
8
6
4
2
0
100
105
110
115
120
125
130
135
140
145
150
155
Junction Tem perature - °C
Figure 11. Tlife vs Junction Temperature
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APPLICATION INFORMATION
1 nF−10 nF†
1 nF−10 nF†
1 nF−10 nF†
1 nF−10 nF†
Recommended use of 0.01-µF
capacitor per VDD terminal
0.01 µF
5 Ω at 100 MHz
RXD1
RXD2
RXD0
RXD3
TXD5
4
48
RXD4
GND
5
47
RXD5
TXD6
6
46
RXD6
TXD7
7
45
GND
GTX_CLK
8
44
RXD7
VDD
9
43
RX_CLK
TXD8
10
42
RXD8
TXD9
11
41
RXD9
TXD10
12
40
VDD
GND
13
39
RXD10
TXD11
14
38
RXD11
TXD12
15
37
RXD12
TXD13
16
36
RXD13
GND
49
DINRXN
3
GND
VDD
TXD4
DINRXP
50
PRE
VDDA
2
GND
TXD3
DOUTTXP
68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52
51
DOUTTXN
1
GND
VDD
GND
GND
GND
RXD15
RXD14
RKMSB
RKLSB
GND
TESTEN
PRBSEN
LCKREFN
TKLSB
VDD
ENABLE
TXD15
TKMSB
LOOPEN
GND
17
35
18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34
TXD14
GND
†
TXD0
TXD2
TXD1
0.01 µF 0.01 µF 0.01 µF
0.01 µF
VDDA
VDD
For ac coupling
Figure 12. External Component Interconnection
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TXP
50 Ω
RXP
VDDA
Transmission
Line
50 Ω
4 kΩ
50 Ω
6 kΩ
50 Ω
TXN
Transmitter
Transmission
Line
Media
+
_
GND
RXN
Receiver
Figure 13. High-Speed I/O Directly-Coupled Mode
TXP
50 Ω
RXP
VDDA
Transmission
Line
50 Ω
4 kΩ
50 Ω
6 kΩ
50 Ω
TXN
Transmitter
Transmission
Line
Media
+
_
GND
RXN
Receiver
Figure 14. High-Speed I/O AC-Coupled Mode
18
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PACKAGE OPTION ADDENDUM
www.ti.com
26-Jul-2010
PACKAGING INFORMATION
Orderable Device
5962-0522101VXC
Status
(1)
Package Type Package
Drawing
ACTIVE
CFP
HFG
Pins
Package Qty
68
1
Eco Plan
TBD
(2)
Lead/
Ball Finish
Call TI
MSL Peak Temp
(3)
Samples
(Requires Login)
N / A for Pkg Type
Purchase Samples
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF TLK2711-SP :
• Catalog: TLK2711
NOTE: Qualified Version Definitions:
• Catalog - TI's standard catalog product
Addendum-Page 1
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