FAIRCHILD FDA24N40F

UniFETTM
FDA24N40F
tm
N-Channel MOSFET, FRFET
400V, 23A, 0.19Ω
Features
Descripition
• RDS(on) = 0.15Ω ( Typ.)@ VGS = 10V, ID = 11.5A
These N-Channel enhancement mode power field effect transistors are produced using Fairchild’s proprietary, planar stripe,
DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the avalanche
and commutation mode. These devices are well suited for high
efficient switched mode power supplies and active power factor
correction.
• Low gate charge (Typ. 46nC)
• Low Crss (Typ.25pF)
• Fast switching
• 100% avalanche tested
• Improved dv/dt apability
• RoHS compliant
D
G
TO-3PN
G DS
S
MOSFET Maximum Ratings TC = 25 C unless otherwise noted*
o
Symbol
VDSS
Drain to Source Voltage
Parameter
VGSS
Gate to Source Voltage
ID
Drain Current
-Continuous (TC = 25oC)
Units
V
±30
V
23
-Continuous (TC = 100oC)
- Pulsed
Ratings
400
A
13.8
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
IAR
Avalanche Current
(Note 1)
23
A
EAR
Repetitive Avalanche Energy
(Note 1)
23.5
mJ
dv/dt
Peak Diode Recovery dv/dt
4.5
V/ns
92
A
(Note 2)
1190
mJ
(Note 3)
(TC = 25oC)
PD
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
TL
(Note 1)
- Derate above 25oC
235
W
1.8
W/oC
-55 to +150
o
C
300
o
C
Thermal Characteristics
Min.
Max.
RθJC
Symbol
Thermal Resistance, Junction to Case
Parameter
-
0.53
RθCS
Thermal Resistance, Case to Sink Typ.
0.24
-
RθJA
Thermal Resistance, Junction to Ambient
-
40
©2007 Fairchild Semiconductor Corporation
FDA24N40F Rev. A
1
Units
o
C/W
www.fairchildsemi.com
FDA24N40F N-Channel MOSFET
December 2007
Device Marking
FDA24N40F
Device
FDA24N40F
Package
TO-3PN
Reel Size
-
Tape Width
-
Quantity
30
Electrical Characteristics
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Units
ID = 250µA, VGS = 0V, TJ = 25oC
400
-
-
V
ID = 250µA, Referenced to 25oC
-
0.5
-
V/oC
VDS = 400V, VGS = 0V
Off Characteristics
BVDSS
∆BVDSS
∆TJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate to Body Leakage Current
-
-
10
VDS = 320V, TC = 125oC
-
-
100
VGS = ±30V, VDS = 0V
-
-
±100
µA
nA
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250µA
3.0
-
5.0
V
Static Drain to Source On Resistance
VGS = 10V, ID = 11.5A
-
0.15
0.19
Ω
gFS
Forward Transconductance
VDS = 20V, ID = 11.5A
-
29
-
S
(Note 4)
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Qg(tot)
Total Gate Charge at 10V
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
VDS = 25V, VGS = 0V
f = 1MHz
VDS = 320V
ID = 23A
(Note 4, 5)
-
2280
3030
pF
-
370
490
pF
-
25
38
pF
-
46
60
nC
-
13
-
nC
-
18
-
nC
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
VDS = 200V, ID = 23A
RG = 25Ω
(Note 4, 5)
-
40
90
ns
-
92
195
ns
-
120
250
ns
-
75
160
ns
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
23
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
92
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0V, ISD = 23A
-
-
1.5
V
trr
Reverse Recovery Time
-
110
-
ns
Qrr
Reverse Recovery Charge
VGS = 0V, ISD = 23A
dIF/dt = 100A/µs
-
0.3
-
µC
(Note 4)
Notes:
1: Repetitive Rating: Pulse width limited by maximum junction temperature
2: L = 4.5mH, IAS = 23A, VDD = 50V, RG = 25Ω, Starting TJ = 25oC
3: ISD ≤ 23A, di/dt ≤ 200A/µs, VDD ≤ BVDSS, Starting TJ = 25°C
4: Pulse Test: Pulse width ≤ 300µs, Duty Cycle ≤ 2%
5: Essentially Independent of Operating Temperature Typical Characteristics
FDA24N40F Rev. A
2
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FDA24N40F N-Channel MOSFET
Package Marking and Ordering Information TC = 25oC unless otherwise noted
FDA24N40F N-Channel MOSFET
Typical Performance Characteristics
Figure 1. On-Region Characteristics
VGS = 15.0V
10.0V
8.0 V
7.0 V
6.5 V
6.0 V
5.5 V
10
ID,Drain Current[A]
ID,Drain Current[A]
70
Figure 2. Transfer Characteristics
100
1
o
10
150 C
o
25 C
*Notes:
1. 250µs Pulse Test
*Notes:
1. VDS = 20V
2. 250µs Pulse Test
o
2. TC = 25 C
0.1
0.02
0.1
1
VDS,Drain-Source Voltage[V]
1
10 15
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
100
IS, Reverse Drain Current [A]
0.28
0.24
VGS = 10V
VGS = 20V
0.20
0.16
o
150 C
*Note: TJ = 25 C
0
20
40
60
ID, Drain Current [A]
10
*Notes:
1. VGS = 0V
1
0.0
80
Figure 5. Capacitance Characteristics
2. 250µs Pulse Test
0.4
0.8
1.2
VSD, Body Diode Forward Voltage [V]
1.6
Figure 6. Gate Charge Characteristics
10
5000
4000
Ciss
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
VGS, Gate-Source Voltage [V]
Coss
3000
o
25 C
o
Capacitances [pF]
8
200
0.32
0.12
5
6
7
VGS,Gate-Source Voltage[V]
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
0.36
RDS(ON) [Ω],
Drain-Source On-Resistance
4
*Note:
1. VGS = 0V
2. f = 1MHz
2000
1000
VDS = 100V
VDS = 200V
VDS = 320V
8
6
4
2
Crss
0
0.1
FDA24N40F Rev. A
1
10
VDS, Drain-Source Voltage [V]
0
30
3
*Note: ID = 23A
0
10
20
30
40
Qg, Total Gate Charge [nC]
50
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Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. Maximum Safe Operating Area
200
100
30µs
100µs
1.1
1ms
ID, Drain Current [A]
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.2
1.0
10
DC
*Notes:
0.1
*Notes:
1. VGS = 0V
2. ID = 250µA
-50
0
50
100
150
o
TJ, Junction Temperature [ C]
Operation in This Area
is Limited by R DS(on)
1
0.9
0.8
-100
10ms
o
1. TC = 25 C
o
0.01
200
2. TJ = 150 C
3. Single Pulse
1
10
100
800
VDS, Drain-Source Voltage [V]
Figure 9. Maximum Drain Current
vs. Case Temperature
25
ID, Drain Current [A]
20
15
10
5
0
25
50
75
100
125
o
TC, Case Temperature [ C]
150
Figure 10. Transient Thermal Response Curve
Thermal Response [ZθJC]
1
0.5
0.1
0.2
0.1
0.01
t1
0.02
*Notes:
0.01
t2
o
1. ZθJC(t) = 0.53 C/W Max.
2. Duty Factor, D= t1/t2
3. TJM - TC = PDM * ZθJC(t)
Single pulse
1E-3
-5
10
FDA24N40F Rev. A
PDM
0.05
-4
10
-3
-2
-1
0
10
10
10
10
Rectangular Pulse Duration [sec]
4
1
10
2
10
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FDA24N40F N-Channel MOSFET
Typical Performance Characteristics (Continued)
FDA24N40F N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FDA24N40F Rev. A
5
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FDA24N40F N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+
V
DS
_
I
SD
L
D r iv e r
R
V
V GS
( D r iv e r )
G S
G
S am e T ype
as DUT
V
DD
• d v / d t c o n t r o lle d b y R G
• I S D c o n t r o lle d b y p u ls e p e r io d
G a t e P u ls e W id th
D = -------------------------G a te P u ls e P e r io d
10V
I F M , B o d y D io d e F o r w a r d C u r r e n t
I SD
( DUT )
d i/ d t
IR M
B o d y D io d e R e v e r s e C u r r e n t
V DS
( DUT )
B o d y D io d e R e c o v e r y d v / d t
V
V
SD
DD
B o d y D io d e
F o r w a r d V o lt a g e D r o p
FDA24N40F Rev. A
6
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FDA24N40F N-Channel MOSFET
Mechanical Dimensions
TO-3PN
Dimensions in Millimeters
FDA24N40F Rev. A
7
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Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In Design
This datasheet contains the design specifications for product development.
Specifications may change in any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make
changes at any time without notice to improve design.
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Full Production
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the right to make changes at any time without notice to improve design.
Obsolete
Not In Production
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Rev. I32
FDA24N40F Rev. A
8
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FDA24N40F N-Channel MOSFET
TRADEMARKS