TI DRV8850

DRV8850
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SLVSCC0A – NOVEMBER 2013 – REVISED JANUARY 2014
Low-Voltage H-Bridge IC With LDO Voltage Regulator
FEATURES
DESCRIPTION
•
The DRV8850 device provides a motor driver plus
LDO voltage regulator solution for consumer
products, toys, and other low-voltage or batterypowered motion-control applications. The device has
one H-bridge driver to drive a DC motor, a voice-coil
actuator, one winding of a stepper motor, a solenoid,
or other devices. The output driver block consists of
N-channel power MOSFETs configured as an Hbridge to drive the load. An internal charge pump
generates the needed gate-drive voltages.
1
2
•
•
•
•
•
•
•
•
H-Bridge Motor Driver
– Drives a DC Motor, One Winding of a
Stepper Motor, or Other Loads
– Low MOSFET On-Resistance: 45 mΩ per
FET
5-A Continuous 8-A Peak-Drive Current
Internal Current Sensing With Current Sense
Output
2 to 5.5-V Operating Supply Voltage Range
Overvoltage and Undervoltage Lockout
Low-Power Sleep Mode
100-mA Isolated Low-Dropout (LDO) Voltage
Regulator
24-Pin QFN Package
24-Pin HTSSOP Package
APPLICATIONS
•
Battery-Operated Applications With High
Startup Torque, such as:
– Personal Hygiene (Electric Toothbrushes,
Shavers)
– Toys
– RC Helicopters and Cars
– Robotics
The DRV8850 device supplies up to 5 A of
continuous output current (with proper PCB heat
sinking) and up to 8-A peak current. It operates on a
supply voltage from 2.0 to 5.5 V.
A low-dropout linear voltage regulator is integrated
with the motor driver to supply power to
microcontrollers or other circuits. The LDO voltage
regulator can be active in device sleep mode, so that
the driver may be shut down without removing power
to any devices powered by the LDO voltage
regulator.
Internal shutdown functions provide overcurrent,
short-circuit,
undervoltage,
overvoltage,
and
overtemperature protection. In addition, the device
also has a built-in current sensing for accurate
current measurement.
The DRV8850 device is packaged in a 24-pin
HTSSOP (7.7 mm × 4.4 mm) or QFN (3.5-mm × 5.5mm) package with PowerPAD™ (Eco-friendly: RoHS
and no Sb/Br).
1
2
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2013–2014, Texas Instruments Incorporated
DRV8850
SLVSCC0A – NOVEMBER 2013 – REVISED JANUARY 2014
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FUNCTIONAL BLOCK DIAGRAM
LDOOUT
2.0 to
5.5 V LDOEN
LDOOUT
VCP
VCC
LDO
Regulator
LDOFB
VCC
Overvolt
Undervolt
Charge
Pump
VCC
VCC
SR
VCC
VCC
OUT1
OverTemp
OCP
ISEN
Gate
Drive
OUT1
OUT1
Osc
IN1H
IN1L
DCM
VCC
Logic
OUT2
IN2H
IN2L
Gate
Drive
OCP
ISEN
OUT2
OUT2
VPROPI
nSLEEP
GND GND GND GND
2
PPAD
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DEVICE INFORMATION
OUT1
OUT1
OUT1
IN1H
IN1L
IN2H
IN2L
nSLEEP
LDOEN
SR
GND
GND
1
24
DRV8850RGY (QFN) PACKAGE
(TOP VIEW)
2
23
3
22
4
21
20
5
GND
1
(PPAD)
6
7
19
18
8
17
9
16
10
15
11
14
OUT2
OUT2
OUT2
VCC
VCC
VCC
VCP
VPROPI
LDOOUT
LDOFB
12
13
GND
GND
DRV8850PWP (HTSSOP) PACKAGE
(TOP VIEW)
GND
1
24
GND
OUT1
2
23
OUT2
OUT1
3
22
OUT2
OUT1
4
21
OUT2
IN1H
5
20
VCC
IN1L
6
19
VCC
IN2H
7
18
VCC
IN2L
8
17
VCP
nSLEEP
9
16
VPROPI
LDOEN
10
15
LDOOUT
SR
11
14
LDOFB
GND
12
13
GND
GND
(PPAD)
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Table 1. Terminal Functions
PIN
I/O (1)
DESCRIPTION
NAME
NO.
GND
1, 12, 13, 24,
PPAD
–
Device ground
LDOOUT
15
–
LDO regulator output
Bypass to GND with a 2.2-μF 6.3-V ceramic capacitor
VCC
21, 22, 23
–
Device supply
Bypass to GND with 0.1-μF and 10-μF 6.3-V ceramic capacitors
VCP
17
–
Charge pump
POWER AND GROUND
Connect a 0.1-μF 6.3-V ceramic capacitor to VCC
CONTROL
LDOEN
10
I
LDO regulator enable
Logic low disables LDO regulator
Logic high enables LDO regulator
Internal pulldown resistor
LDOFB
14
I
LDO regulator feedback
Resistor divider from LDOOUT sets LDO output voltage
May be connected to LDOIN to enable LDO
IN1H
5
I
Input 1 HS FET enable
Active high enables HS FET for output 1
Internal pulldown resistor
IN1L
6
I
Input 1 LS FET enable
Active high enables LS FET for output 1
Internal pulldown resistor
IN2H
7
I
Input 2 HS FET enable
Active high enables HS FET for output 2
Internal pulldown resistor
IN2L
8
I
Input 2 LS FET enable
Active high enables LS FET for output 2
Internal pulldown resistor
nSLEEP
9
I
Sleep mode input
Logic low puts device in low-power sleep mode
Logic high for typical operation
Internal pulldown resistor
SR
11
IO
Slew rate control
Resistor to ground sets output slew rate
OUTPUT
(1)
OUT1
2, 3, 4
O
Output 1
OUT2
18, 19, 20
O
Output 2
VPROPI
16
O
Current sense output
Connect to motor winding
Output current is proportional to H-bridge current. 1 kΩ, 1% resistor to
GND for 2-A max current with VCC at 2 V. See text for equation if more
current is required
Directions: I = input, O = output, OZ = 3-state output, OD = open-drain output, IO = input or output
Table 2. External Components
PIN
4
DESCRIPTION
NAME
NO.
LDOFB
14
LDO regulator
feedback
Resistor divider from LDOUT sets LDO output voltage.
LDOOUT
15
LDO regulator output
Bypass to GND with a 2.2-μF 6.3-V ceramic capacitor.
SR
11
Slew rate control
Resistor to ground sets output slew rate GND to 2.4 MΩ.
VCC
21, 22, 23
Device supply
Bypass to GND with 0.1-μF and 10-μF 6.3-V ceramic capacitors.
VCP
17
Charge pump
Connect a 0.1-μF 6.3-V ceramic capacitor to VCC
VPROPI
16
Current sense output
Output current is proportional to H-bridge current. 1 kΩ, 1% resistor to GND for 2-A
max current with VCC at 2 V. See Equation 1 for if more current is required.
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Absolute Maximum Ratings (1) (2)
over operating free-air temperature range (unless otherwise noted)
MIN
TYP
MAX
VCC
Power supply voltage range
–0.3
7
VCP
Charge pump
–0.3
VCC + 7
LDOEN, IN1H, IN1L, IN2H,
IN2L, nSLEEP
Digital pin voltage range
–0.5
7
OUT1, OUT2, SR, LDOUT,
LDOFB, VPROPI
Other pins
–0.3
7
OUT1, OUT2
Peak motor drive output current
Internally Limited
LDOOUT
LDO output current
Internally Limited
TJ
Operating junction temperature range
–40
150
TSTG
Storage temperature range
–60
150
(1)
(2)
UNIT
V
A
°C
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.
All voltage values are with respect to network ground terminal.
Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
VCC
Device power supply voltage range
IOUT
H-bridge continuous output current (1)
(1)
NOM
MAX
UNIT
2.0
5.5
V
0
5
A
IOUT
H-bridge peak output current
0
8
A
fPWM
Externally applied PWM frequency
0
50
kHz
VIN
Logic level input voltage
0
VCC
V
TA
Ambient temperature
–40
85
°C
(1)
Power dissipation and thermal limits must be observed
Thermal Information
DRV8850
THERMAL METRIC (1)
PWP
RGY
24 PINS
24 PINS
θJA
Junction-to-ambient thermal resistance (2)
43.8
39.1
θJCtop
Junction-to-case (top) thermal resistance (3)
24.6
41.1
θJB
Junction-to-board thermal resistance (4)
22.7
15.0
0.7
0.6
(5)
ψJT
Junction-to-top characterization parameter
ψJB
Junction-to-board characterization parameter (6)
22.5
14.9
θJCbot
Junction-to-case (bottom) thermal resistance (7)
4.1
3.2
(1)
(2)
(3)
(4)
(5)
(6)
(7)
UNIT
°C/W
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDECstandard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
The junction-to-top characterization parameter, ψJT, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θJA, using a procedure described in JESD51-2a (sections 6 and 7).
The junction-to-board characterization parameter, ψJB, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θJA , using a procedure described in JESD51-2a (sections 6 and 7).
The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
Spacer
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Electrical Characteristics
TA = 25°C, over recommended operating conditions unless otherwise noted
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
POWER SUPPLIES (VCC)
IVCC
VCC operating supply current,
LDO regulator and driver enabled
VCC = 4.2 V, nSLEEP = LDOEN = VCC
IVCQ1
VCC sleep mode supply current
VCC = 4.2 V, nSLEEP = LDOEN = 0 V,
INXH = INXL = 0 V
IVCQ2
VCC operating supply current,
LDO regulator enabled, driver
disabled (1)
VCC = 4.2 V, nSLEEP = 0 V, LDOEN =
VCC, INXH = INXL = 0 V
IVCQ3
VCC operating supply current LDO VCC = 4.2 V, nSLEEP = VCC, LDOEN = 0 V
voltage regulator disabled, driver
enabled
VUVLO
VCC undervoltage lockout voltage
VOVLO
VCC overvoltage lockout voltage
VIL
Input low voltage
VIH
Input high voltage
VHYS
Input hysteresis
IIL
Input low current
VIN = 0
IIH
Input high current
VIN = 3.3 V
RPD
Pulldown resistance
2.9
mA
1
40
μA
2.9
mA
VCC rising
2
VCC falling
1.95
VCC rising
5.6
VCC falling
5.5
μA
V
V
LOGIC-LEVEL INPUTS (LDOEN, IN1H, IN1L, IN2H, IN2L, nSLEEP)
0
0.5 × VCC
0.2 ×
VCC
V
VCC
V
1
μA
50
μA
0.08 × VCC
–1
V
LDOEN
3.5
MΩ
nSLEEP
400
kΩ
INXH, INXL
200
kΩ
IOUT / 2000
A
VPROPI OUTPUT (VPROPI)
IVPROPI
VPROPI output current
VCC = 4.2 V, resistor chosen to keep
VPROPI ≤ (VCC – 1 V) / IOUT
500 mA ≤ IOUT ≤ 5 A
RDS(ON)
HS FET on resistance
VCC = 4.2 V, IO = 2 A, TA = 25°C
35
mΩ
LS FET on resistance
VCC = 4.2 V, IO = 2 A, TA = 25°C
30
mΩ
Off-state leakage current
VOUT = 0 V
H-BRIDGE FETS (OUT1, OUT2)
IOFF
–1
1
μA
0.84
V
LDO REGULATOR (LDOOUT)
VFB
LDO feedback (reference) voltage
0.76
0.8
VDO
LDO regulator dropout voltage
ΔVLINE
LDO line regulation
VCC from 4.2 to 5.5 V, VOUT = 3.3 V
–2.5
2.5
%
ΔVLOAD
LDO load regulation
VOUT = 3.3 V, IOUT from 1 to 100 mA
–2.5
2.5
%
ICL
LDO output current limit
VCC = 4.2 V, VOUT = 3.3 V, TA ≥ 25°C
275
mA
9.5
A
VCC = 4.2 V, IOUT = 100 mA, TA = 25°C
150
VCC = 4.2 V, IOUT = 100 mA, TA = 85°C
175
mV
mV
PROTECTION CIRCUITS
IOCP
Overcurrent protection trip level
tOCP
Overcurrent protection deglitch
time
1
µs
tRETRY
Overcurrent retry time
4
ms
tTSD
Thermal shutdown temperature
Die temperature (rising)
tHYS
Thermal shutdown hysteresis
Temperature hysteresis
(1)
6
VCC = 2.5 to 5.5 V
150
160
50
180
°C
°C
Does not include the current consumption from the feedback resistors.
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Timing Requirements (1)
TA = 25°C, VCC = 4.2 V, RL = 2 Ω
PARAMETER
tR, tF
tDELAY
Rise and fall time
(measured at OUTx)
TEST CONDITIONS
UNIT
70
ns
0.7
µs
RSR = 2.4 MΩ
70
µs
500
ns
750
ns
50
µs
400
ns
RSR = 24 kΩ
2.6
µs
RSR = 2.4 MΩ
110
µs
RSR short to GND
400
ns
RSR = 24 kΩ
2.6
µs
RSR = 2.4 MΩ
110
µs
RSR short to GND
400
ns
RSR = 24 kΩ
2.6
µs
RSR = 2.4 MΩ
110
µs
RSR short to GND
600
ns
RSR = 24 kΩ
3.9
µs
RSR = 2.4 MΩ
165
µs
Low-side slow decay
LS OFF to HS ON
Low-side slow decay
HS OFF to LS ON
High-side slow decay
or fast decay
HS OFF to LS ON
High-side slow decay
or fast decay
LS OFF to HS ON
(1)
MAX
RSR = 24 kΩ
RSR short to GND
tDEAD
TYP
RSR connected to GND
Propagation delay
RSR connected to GND
(measured as time between
RSR = 24 kΩ
input edge to output
RSR = 2.4 MΩ
change)
Dead time (measured as
time OUTx FET is Hi-Z)
MIN
Rise and fall time measured from 10 to 90% VCC
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TYPICAL PERFORMANCE GRAPHS
Iq
vs
VCC
2.8
2.8
TA = +85°C
TA = +25°C
2.6
TA = +85°C
TA = +25°C
2.6
2.4
2.4
2.2
2.2
Iq (mA)
Iq (mA)
Iq
vs
VCC
2.0
2.0
1.8
1.8
1.6
1.6
1.4
1.4
2.0
2.5
3.0
3.5
4.0
4.5
5.0
VCC (V)
5.5
2.0
2.5
3.0
Figure 1. Quiescent Current With Motor Driver on
and LDO On
2.5
5.0
5.5
C002
TA = +85°C
TA = +25°C
2.0
34
Iq (µA)
32
Iq (µA)
4.5
Iq
vs
VCC
TA = +85°C
TA = +25°C
36
4.0
Figure 2. Quiescent Current With Motor Driver on
and LDO Off
Iq
vs
VCC
38
3.5
VCC (V)
C001
30
28
26
1.5
1.0
0.5
24
22
0.0
2.0
2.5
3.0
3.5
4.0
VCC (V)
4.5
5.0
5.5
Figure 3. Quiescent Current With Motor Driver off
and LDO On
8
2.0
2.5
3.0
3.5
4.0
VCC (V)
C003
4.5
5.0
5.5
C003
C004
Figure 4. Quiescent Current With Motor Driver off
and LDO off, Sleep Current
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RDS(ON)
vs
VCC
70
70
60
60
50
50
RDS(ON) (m)
RDS(ON) (m)
RDS(ON)
vs
VCC
40
30
20
40
30
20
TA = +85°C
TA = +25°C
TA = ±40ƒC
10
0
2.0
2.5
3.0
TA = +85°C
TA = +25°C
TA = ±40ƒC
10
0
3.5
4.0
4.5
5.0
VCC
5.5
2.0
2.5
3.0
4.5
5.0
5.5
C005
C006
Figure 6. RDS(ON), HS – OUT2
RDS(ON)
vs
VCC
RDS(ON)
vs
VCC
70
70
60
60
50
50
RDS(ON) (m)
RDS(ON) (m)
4.0
VCC
Figure 5. RDS(ON), HS – OUT1
40
30
20
40
30
20
TA = +85°C
TA = +25°C
TA = ±40ƒC
10
0
2.0
2.5
3.0
TA = +85°C
TA = +25°C
TA = ±40ƒC
10
0
3.5
4.0
4.5
5.0
VCC
5.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
VCC
C005
C007
Figure 7. RDS(ON), LS – OUT1
5.5
C005
C007
C008
Figure 8. RDS(ON), LS – OUT2
Error
vs
IOUT
Error
vs
IOUT
0.2
Error (% from 25ƒC, 10-mA load)
1.0
Error (% from 25ƒC, 10-mA load)
3.5
C005
C011
0.5
0.0
±0.5
±1.0
±1.5
±2.0
±2.5
±3.0
0.00
TA = +85°C
TA = +25°C
TA = ±40ƒC
0.02
0.04
0.06
0.08
IOUT (A)
0.10
0.0
±0.2
±0.4
±0.6
±0.8
±1.0
±1.2
0.00
0.02
0.04
0.06
0.08
IOUT (A)
C005
C009
Figure 9. LDO Output, VCC = 3.5 V,
LDOOUT = 3.3 V
TA = +85°C
TA = +25°C
TA = ±40ƒC
0.10
C005
C010
Figure 10. LDO Output, VCC = 4.2 V,
LDOOUT = 3.3 V
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Error
vs
IOUT
VPROPI
vs
IOUT
2.5
0.0
2.0
±0.2
VPROPI (V)
Error (% from 25ƒC, 10-mA load)
0.2
±0.4
±0.6
±0.8
±1.0
0.00
1.0
OUT1, TA = +85°C
OUT1, TA = +25°C
0.5
TA = +85°C
TA = +25°C
TA = ±40ƒC
0.02
1.5
OUT1, TA = ±40ƒC
0.0
0.04
0.06
0.08
0.10
IOUT (A)
0
1
2
3
IOUT (A)
C005
C011
Figure 11. LDO Output, VCC = 5.5 V,
LDOOUT = 3.3 V
4
5
C005
C012
Figure 12. VPROPI Output, VCC = 4.2 V, OUT1
overtemperature, 1 kΩ
VPROPI
vs
IOUT
2.5
VPROPI (V)
2.0
1.5
1.0
0.5
OUT1, TA = +85°C
OUT1, TA = +25°C
OUT1, TA = ±40ƒC
0.0
0
1
2
3
IOUT (A)
4
5
C005
C013
Figure 13. VPROPI Output, VCC = 4.2 V, OUT2 overtemperature, 1 kΩ
10
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Functional Description
Power Supervisor
The LDO regulator can be active independent of the nSLEEP pin. This independence allows a microcontroller, or
other device, to be powered by the LDO voltage regulator, while retaining the ability to put the DRV8850 device
into sleep mode.
Because of this functionality, nSLEEP and LDOEN must both be brought logic low to minimize power
consumption in sleep mode. If the LDO regulator remains active in sleep mode, a quiescent current of IVCQ2
(typically 50 µA plus current through the external feedback resistors) is drawn from the supply.
Table 3 shows the operation mode logic for the DRV8850 device:
Table 3. DRV8850 Device Operation Mode Logic (1)
(1)
nSLEEP
LDOEN
LDO Regulator
Driver
0
0
Off
Sleep
0
1
Active
Sleep
1
0
Off
Active
1
1
Active
Active
A state must be active for a minimum of 1 ms before a new state is
commanded.
Bridge Control
A corresponding input pin controls the individual FETs in the DRV8850 device. Shoot-through (the condition
when both HS and LS FETs are turned on at the same time) is not allowed; with this input condition, both the HS
and LS FETs turn off.
Table 4 shows the logic for the DRV8850 device:
Table 4. DRV8850 Device Logic
INxL
INxH
0
0
OUTx
Z
0
1
H
1
0
L
1
1
Z
Current Sensing – VPROPI
The VPROPI pin outputs an analog current that is proportional to the current flowing in the H-bridge. The output
current is typically 1 / 2000 of the current in both high side FETs. VPROPI is derived from the current through
either of the high side FETs. Because of this, VPROPI does not represent the H-bridge current when operating in
a fast-decay mode or low-side slow-decay mode. VPROPI represents the H-bridge current under forward drive,
reverse drive, and high-side slow decay. VPROPI output is delayed by roughly 2 µs after the high side FET is
switched on and it has reached approximately VCC (including the deglitch on the HSon). Select the external
resistor so that the voltage on VPROPI is less than (VCC – 1 V), so the resistor must be sized less than:
2000 x VCC 1 V / IOUT
where IOUT is the maximum drive current to be monitored
(1)
The range of current that can be monitored is 500 mA to 5 A, assuming the external resistor meets the prior
equation.
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VCC
VCC
4
4
1
OUT2
OUT1
2
1
Forward drive
2
Fast decay
3
Low-side slow decay
4
High-side slow decay
1
OUT2
OUT1
1
Reverse drive
2
Fast decay
3
Low-side slow decay
4
High-side slow decay
2
3
3
FORWARD
REVERSE
Figure 14. Forward and Reverse Operation
When using an independent half-bridge as a high-side driver, VPROPI does not output a current measurement
during slow decay. During typical operation, VPROPI represents the total current flowing to loads connected to
OUT1 and OUT2.
VPROPI is nonfunctional when implemented as a low-side driver.
VCC
VCC
1
1
OUT1
2
VCC
Normal operation
2
Slow decay
1
Normal operation
2
Slow decay
OUT1
2
1
High-side driver
Low-side driver
Figure 15. High-Side and Low-Side Drivers
12
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Slew-Rate Control
The rise and fall times (tR and tF) of the outputs can be adjusted by the value of an external resistor connected
from the SR pin to ground. The output slew rate is adjusted internally by the DRV8850 device by controlling the
ramp rate of the driven FET gate.
The typical voltage on the SR pin is 0.6 V driven internally. Changing the resistor value monotonically increases
the slew rates from approximately 100 ns to 100 µs. Recommended values for the external resistor are from
GND to 2.4 MΩ. If the SR pin is grounded then the slew rate is 100 ns.
Dead Time
The dead time (tDEAD) is measured as the time when OUTx is Hi-Z between turning off one of the H-bridge FETs
and turning on the other. For example, the output is Hi-Z between turning off the high-side FET and turning on
the low-side FET. When driving current out of the pin, the output is observed to fall to one diode drop below
ground during dead time. When driving current into the pin, the output is observed to rise to one diode drop
above VCC.
The DRV8850 has an analog dead time of approximately 100 ns. In addition to this analog dead time, the output
is Hi-Z when the FET gate voltage is less than the threshold voltage. The total dead time depends on the SR
resistor setting because a portion of the FET gate ramp includes the observable dead time.
Propagation Delay
The propagation delay time (tDELAY) is measured as the time between an input edge to an output change. This
time is composed of two parts: an input deglitcher and output slewing delay. The input deglitcher prevents noise
on the input pins from affecting the output state.
The output slew rate also contributes to the delay time. For the output to change state during typical operation,
first one FET must be turned off. The FET gate is ramped down according to the SR resistor selection, and the
observed propagation delay ends when the FET gate falls to less than the threshold voltage.
INxH
INxL
High-side
Gate
Low-side
Gate
HS Slew Rate
HS Slew Rate
LS Slew Rate
LS Slew Rate
OUTx
tDELAY
tDEAD
tR
tDELAY
tF
tDEAD
Figure 16. Low-Side Slow Decay Operation – Current Sourced from OUTx
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INxH
INxL
High-side
Gate
HS Slew Rate
HS Slew Rate
Low-side
Gate
LS Slew Rate
LS Slew Rate
OUTx
tDELAY
tDEAD
tF
tDELAY
tR
tDEAD
Figure 17. High-Side Slow Decay or Fast Decay Operation – Current Sunk into OUTx
Power Supplies and Input Pins
An internal charge pump generates a voltage greater than VCC that is used to drive the internal N-channel
power MOSFETs. The charge pump requires a capacitor between the VCP and VCC pins. TI recommends to
bypass VCC to ground with 0.1 and 10-μF ceramic capacitors, placed as close as possible to the IC. Each input
pin has a weak pulldown resistor to ground (see Electrical Characteristics for more details).
The input pins should not be driven to more than 0.6 V without the VCC power supply removed.
LDO Voltage Regulator
An LDO regulator is integrated into the DRV8850 device. The LDO regulator is typically used to provide the
supply voltage for a low-power microcontroller. For proper operation, bypass the LDOOUT pin to GND using a
ceramic capacitor. The recommended value for this component is 2.2 μF.
Two external resistors are used to set the LDO voltage (VLDO) by creating a voltage divider between LDOOUT
and LDOFB. The LDO output voltage can be given by:
VFB x 1 R1 / R 2 V
VLDO
where
•
•
14
R1 is located between LDOOUT and LDOFB
R2 is between LDOFB and GND
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LDOOUT
LDOOUT
LDO regulator
R1
2.2 µF
LDOFB
R2
Figure 18. LDO Regulator Schematic
The output voltage is adjustable from 1.6 V to VCC – VLDO using external resistors. The LDOEN pin is used to
enable or disable the LDO regulator; when disabled, the output is turned off and the LDO regulator enters a verylow-power state.
When the LDO current load exceeds ICL, the LDO regulator behaves like a constant current source. The LDO
output voltage drops significantly with currents greater than ICL.
Protection Circuits
The DRV8850 device is protected against undervoltage, overvoltage, overcurrent, and overtemperature events.
Overcurrent Protection (OCP)
An analog current limit circuit on each FET limits the current through the FET by removing the gate drive. If this
analog current limit persists for longer than tOCP, all FETs in the H-bridge are disabled. After approximately
tRETRY, the bridge re-enables automatically.
Overcurrent conditions on both high and low-side devices, that is, a short to ground, supply, or across the motor
winding result in an overcurrent shutdown.
Thermal Shutdown (TSD)
If the die temperature exceeds tTSD, all FETs in the H-bridge are disabled. Once the die temperature has fallen
below tTSD – tHYS, the H-bridge automatically re-enables.
Undervoltage Lockout (UVLO)
If at any time the voltage on the VCC pins falls to less than the undervoltage lockout threshold voltage, all
circuitry in the device is disabled and internal logic resets. Operation resumes when VCC rises to greater than
the UVLO threshold.
Overvoltage Lockout (OVLO)
If at any time the voltage on the VCC pins rises to more than VOVLO, the output FETs are disabled (outputs are
high-Z). Operation resumes when VCC falls below the VOVLO.
CAUTION
VCC must remain less than the absolute maximum rating for the device, or damage to
the device may occur.
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Thermal Information
Thermal Protection
The DRV8850 device has thermal shutdown (TSD) as described above. If the die temperature exceeds
approximately tTSD, the device will be disabled until the temperature drops to a safe level.
Any tendency of the device to enter thermal shutdown is an indication of either excessive power dissipation,
insufficient heatsinking, or too high an ambient temperature.
Power Dissipation
Power dissipation in the DRV8850 device is the sum of the motor driver power dissipation and the LDO voltage
regulator dissipation.
The LDO dissipation is calculated simply by (VIN – VOUT) × IOUT.
The power dissipation in the motor driver is dominated by the power dissipated in the output FET resistance, or
RDS(ON). Power dissipation can be estimated by:
LS _ R
PTOT
DS (ON )
HS _ RDS (ON ) x IOUT ( RMS ) 2
where
•
•
•
PTOT is the total power dissipation
RDS(ON) is the resistance of each FET
IOUT(RMS) is the RMS output current being driven
(3)
The maximum amount of power that can be dissipated in the device is dependent on ambient temperature and
heat sinking.
Note that RDS(ON) increases with temperature, so as the device heats, the power dissipation increases.
REVISION HISTORY
Changes from Original (November 2013) to Revision A
•
16
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PACKAGE OPTION ADDENDUM
www.ti.com
2-Jan-2014
PACKAGING INFORMATION
Orderable Device
Status
(1)
Package Type Package Pins Package
Drawing
Qty
Eco Plan
Lead/Ball Finish
MSL Peak Temp
(2)
(6)
(3)
Op Temp (°C)
Device Marking
(4/5)
DRV8850RGYR
ACTIVE
VQFN
RGY
24
3000
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
DRV8850
DRV8850RGYT
ACTIVE
VQFN
RGY
24
250
Green (RoHS
& no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
-40 to 85
DRV8850
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.
(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.
(6)
Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish
value exceeds the maximum column width.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
Addendum-Page 1
Samples
PACKAGE OPTION ADDENDUM
www.ti.com
2-Jan-2014
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
Addendum-Page 2
PACKAGE MATERIALS INFORMATION
www.ti.com
2-Jan-2014
TAPE AND REEL INFORMATION
*All dimensions are nominal
Device
DRV8850RGYR
Package Package Pins
Type Drawing
VQFN
RGY
24
SPQ
Reel
Reel
A0
Diameter Width (mm)
(mm) W1 (mm)
3000
330.0
12.4
Pack Materials-Page 1
3.8
B0
(mm)
K0
(mm)
P1
(mm)
5.8
1.2
8.0
W
Pin1
(mm) Quadrant
12.0
Q1
PACKAGE MATERIALS INFORMATION
www.ti.com
2-Jan-2014
*All dimensions are nominal
Device
Package Type
Package Drawing
Pins
SPQ
Length (mm)
Width (mm)
Height (mm)
DRV8850RGYR
VQFN
RGY
24
3000
367.0
367.0
35.0
Pack Materials-Page 2
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