ETC M38510/014XXX

INCH-POUND
MIL-M-38510/14E
21 March 2005__
SUPERSEDING
MIL-M-38510/14D
2 August 1982
MILITARY SPECIFICATION
MICROCIRCUITS, DIGITAL, TTL, DATA SELECTORS/MULTIPLEXERS,
MONOLITHIC SILICON
Inactive for new design after 7 September 1995.
This specification is approved for use by all Departments and Agencies of the Department of Defense.
The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535
1. SCOPE
1.1 Scope. This specification covers the detail requirements for monolithic, silicon, TTL, data
selectors/multiplexers, logic microcircuits. Two product assurance classes and a choice of case outlines and lead
finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M38510 have been superseded by MIL-PRF-38535, (see 6.4).
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as follows:
Device type
01
02, 06
03
04
05
Circuit
Sixteen-input data selector/multiplexer, with enable
Eight-input data selector/multiplexer, with enable
Dual, four-input data selector/multiplexer, with enable
Dual, four-input data selector/multiplexer, without enable
Quad, two-input data selector/multiplexer, with enable
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows:
Outline letter
E
F
J
K
Z
Descriptive designator
Terminals
Package style
GDIP1-T16 or CDIP2-T16
GDFP2-F16 or CDFP3-F16
GDIP1-T24 or CDIP2-T24
GDFP2-F24 or CDFP3-F24
GDFP7-F24 or CDFP8-F24
16
16
24
24
24
Dual-in-line
Flat-pack
Dual-in-line
Flat-pack
Flat-pack
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to
[email protected]. Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at http://assist.daps.dla.mil.
AMSC N/A
FSC 5962
MIL-M-38510/14E
1.3 Absolute maximum ratings.
Supply voltage range ......................................................
Input voltage range .........................................................
Storage temperature range ............................................
Maximum power dissipation per gate, (PD) 1/
Device type 01 ........................................................
Device types 02 and 06 ...........................................
Device type 03 ........................................................
Device type 04 ........................................................
Device type 05 ........................................................
Lead temperature (soldering 10 seconds) ......................
Thermal resistance, junction-to-case (θJC)......................
Junction temperature (TJ ) 2/ ..........................................
-0.5 V to +7.0 V
-1.5 V at -12 mA to +5.5 V
-65°C to +150°C
375 mW
268 mW
286 mW
248 mW
275 mW
300°C
(See MIL-STD-1835)
175°C
1.4 Recommended operating conditions.
Supply voltage (VCC) .......................................................
Minimum high level input voltage (VIH) ...........................
Maximum low level input voltage (VIL) ............................
Maximum low level output current (IIL) ............................
Normalized fanout (each output) 3/
Low logic level .........................................................
High logic level ........................................................
Case operating temperature range (TC ) .........................
4.5 V minimum to 5.5 V maximum
2.0 V dc
0.8 V dc
16 mA
10 maximum
20 maximum
-55°C to 125°C
2.0 APPLICABLE DOCUMENT
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification.
This section does not include documents cited in other sections of this specification or recommended for
additional information or as examples. While every effort has been made to ensure the completeness of this
list, document users are cautioned that they must meet all specified requirements of documents cited in
sections 3, 4, or 5 of this specification, whether or not they are listed.
2.2 Government documents.
2.2.1 Specifications and standards. The following specifications and standards form a part of this specification to
the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535 -
Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
-
Test Method Standard for Microelectronics.
Interface Standard Electronic Component Case Outlines
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or
http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D,
Philadelphia, PA 19111-5094.)
_______
1/ Must withstand the added PD due to short circuit condition (e.g. IOS test).
2/ Maximum junction temperature should not be exceeded except in accordance with allowable short
duration burn-in screening condition in accordance with MIL-PRF-38535.
3/ Device will fanout in both high and low levels to the specified number of inputs of the same device type
as that being tested.
2
MIL-M-38510/14E
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited
herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws
and regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before
contract award (see 4.3 and 6.3).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as
specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the
QM plan shall not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be
as specified in MIL-PRF-38535 and herein.
3.3.1 Logic diagrams and terminal connections. The logic diagrams and terminal connections shall be as
specified on figure 1 and 2.
3.3.2 Truth tables. The truth tables shall be as specified on figure 3.
3.3.4 Schematic circuit. The schematic circuit shall be maintained by the manufacturer and made available to the
qualifying activity and the preparing activity upon request.
3.3.5 Case outlines. Case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table 1
and apply over the full recommended case operating temperature range, unless otherwise specified.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups
specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group
number 4 (see MIL-PRF-38535, appendix A).
3
MIL-M-38510/14E
TABLE I. Electrical performance characteristics.
Test
High level output voltage
Symbol
Conditions
-55°C ≤ TC ≤ +125°C
unless otherwise specified
VOH
VCC = 4.5 V
Device
type
All
Limits
Min
Max
2.4
Unit
V
IOH = -.8 mA
Low level output voltage
VOL
VCC = 4.5 V
All
0.4
V
All
-1.5
V
-0.7
-1.6
mA
-0.6
-1.6
IOL = 16 mA
Input clamp voltage
VIC
VCC = 4.5 V
IIN = -12 mA
Low level input current
IIL
VCC = 5.5 V
VIN = 0.4 V
High-level input current
IIH1
VCC = 5.5 V
02, 03,
04
05, 06
01
All
40
µA
All
100
µA
VIN = 2.5 V
High-level input current
IIH2
VCC = VIN = 5.5 V
Short circuit output current
IOS
VCC = 5.5 V
01, 03,
06
02, 04,
05
01
02,06
04
03
05
01
-20
-55
mA
-20
-120
mA
8
68
48
45
52
50
40
mA
mA
mA
mA
mA
ns
01
8
43
ns
tPHL2
01
6
37
ns
tPLH2
01
6
32
ns
tPHL3
01
3
23
ns
tPLH3
01
3
30
ns
VOUT = 0 V 1/
Supply current
Propagation delay time high-to-low
level output from A, B, C or D to W
Propagation delay time low-to-high
level output from A, B, C or D to W
Propagation delay time high-to-low
level output from strobe to W
Propagation delay time low-to-high
level output from strobe to W
Propagation delay time high-to-low
level output from E0–E15 to W
Propagation delay time low-to-high
level output from E0–E15 to W
ICC
VCC = 5.5 V
tPHL1
RL = 390Ω ±5%,
tPLH1
CL = 50 pF minimum
(figure 4)
1/ Not more than one should be shorted at one time.
4
MIL-M-38510/14E
TABLE I. Electrical performance characteristics - Continued.
Conditions
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Test
Symbol
Propagation delay time, high-to-low
level output from A, B, or C to W
Propagation delay time, low-to-high
level output from A, B, or C to W
Propagation delay time, high-to-low
level output from A, B, or C to Y
Propagation delay time, low-to-high
level output from A, B, or C to Y
Propagation delay time, high-to-low
level output from strobe to W
Propagation delay time, low-to-high
level output from strobe to W
Propagation delay time, high-to-low
level output from strobe to Y
Propagation delay time, low-to-high
level output from strobe to Y
Propagation delay time, high-to-low
level output from D0-D7 to W
Propagation delay time, low-to-high
level output from D0-D7 to W
Propagation delay time, high-to-low
level output from D0-D7 to Y
tPHL1
RL = 390Ω ±5%,
tPLH1
CL = 50 pF minimum
(figure 4)
Propagation delay time, low-to-high
level output from D0-D7 to Y
Propagation delay time, high-to-low
level output from data to Y
Propagation delay time, low-to-high
level output from data to Y
Propagation delay time, high-to-low
level output from A or B to Y
Propagation delay time, low-to-high
level output from A or B to Y
Propagation delay time, high-to-low
level output from strobe to Y
Propagation delay time, low-to-high
level output from strobe to Y
Device
type
Limits
Min
Max
Unit
02
06
02
06
02
06
02
06
02
06
02, 06
6
6
6
6
8
8
8
8
6
6
6
40
48
38
43
49
60
45
58
37
38
35
ns
8
8
8
8
3
46
52
42
52
32
ns
tPHL5
02
06
02
06
02, 06
tPLH5
02, 06
3
26
ns
tPHL6
02
6
41
ns
06
6
44
tPLH6
02
6
33
06
6
36
tPHL1
RL = 390Ω ±5%,
03
3
29
ns
tPLH1
CL = 50 pF minimum
(figure 5)
03
3
28
ns
tPHL2
03
6
44
ns
tPLH2
03
6
42
ns
tPHL3
03
6
32
ns
tPLH3
03
6
42
ns
tPHL2
tPLH2
tPHL3
tPLH3
tPHL4
tPLH4
5
ns
ns
ns
ns
ns
ns
ns
ns
MIL-M-38510/14E
TABLE I. Electrical performance characteristics - Continued.
Conditions
-55°C ≤ TC ≤ +125°C
unless otherwise specified
Test
Symbol
Propagation delay time high-to-low
level output from data to Y
Propagation delay time low-to-high
level output from data to Y
Propagation delay time high-to-low
level output from data to W
Propagation delay time low-to-high
level output from data to W
Propagation delay time high-to-low
level output from A or B to Y
Propagation delay time low-to-high
level output from A or B to Y
Propagation delay time high-to-low
level output from A or B to W
Propagation delay time low-to-high
level output from A or B to W
Propagation delay time high-to-low
level output from A to Y
Propagation delay time low-to-high
level output from A to Y
Propagation delay time high-to-low
level output from strobe to Y
Propagation delay time low-to-high
level output from strobe to Y
Propagation delay time high-to-low
level output from data to Y
Propagation delay time low-to-high
level output from data to Y
tPHL1
RL = 390Ω ±5%,
tPLH1
CL = 50 pF minimum
(figure 5)
Device
type
Limits
Min
Max
Unit
04
3
41
ns
04
3
39
ns
tPHL2
04
3
25
ns
tPLH2
04
3
24
ns
tPHL3
04
6
51
ns
tPLH3
04
6
51
ns
tPHL4
04
6
39
ns
tPLH4
04
6
34
ns
tPHL1
RL = 390Ω ±5%,
05
6
49
ns
tPLH1
CL = 50 pF minimum
(figure 6)
05
6
41
ns
tPHL2
05
3
39
ns
tPLH2
05
3
33
ns
tPHL3
05
3
25
ns
tPLH3
05
3
35
ns
6
MIL-M-38510/14E
TABLE II. Electrical test requirements.
Subgroups (see table III)
Class S
Devices
MIL-PRF-38535
Test requirement
Interim electrical parameters
1
Final electrical test parameters
1*, 2, 3, 7,
9, 10, 11
Group A test requirements
1, 2, 3, 7, 8,
9, 10, 11
Group B electrical test parameters
when using the method 5005 QCI option
1, 2, 3
Groups C end point electrical parameters
1, 2, 3
Group D end point electrical parameters
1, 2, 3
Class B
Devices
1
1*, 2, 3,
7, 9
1, 2, 3, 7, 8
9, 10, 11
N/A
1, 2, 3
1, 2, 3
*PDA applies to subgroup 1.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535
or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall
not effect the form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior
to qualification and conformance inspection. The following additional criteria shall apply:
a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test
circuit shall be maintained under document control by the device manufacturer's Technology Review
Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or
preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power
dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical
parameters test prior to burn-in is optional at the discretion of the manufacturer.
c. Additional screening for space level product shall be as specified in MIL-PRF-38535.
7
MIL-M-38510/14E
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with
MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as
follows:
a. Tests shall be as specified in table II herein.
b. Subgroups 4, 5, and 6, shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as
follows:
a. End point electrical parameters shall be as specified in table II herein.
b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit
shall be maintained under document control by the device manufacturer's Technology Review Board (TRB)
in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon
request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in
accordance with the intent specified in test method 1005 of MIL-STD-883.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point
electrical parameters shall be as specified in table II herein.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows:
4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given
are conventional current and positive when flowing into the referenced terminal.
8
MIL-M-38510/14E
Figure 1. Terminal connections (top view).
9
MIL-M-38510/14E
Figure 1. Terminal connections (top view) - Continued.
10
MIL-M-38510/14E
Figure 1. Terminal connections (top view) - Continued.
11
MIL-M-38510/14E
Figure 2. Logic diagrams.
12
MIL-M-38510/14E
Figure 2. Logic diagrams – Continued.
13
MIL-M-38510/14E
Figure 2. Logic diagrams – Continued.
14
MIL-M-38510/14E
Figure 2. Logic diagrams – Continued.
15
MIL-M-38510/14E
Device type 01
INPUTS
OUTPUT
D
C
B
A STROBE E0
E1
E2
E3
E4
E5
E6
E7
E8
E9 E10 E11 E12 E13 E14 E15
W
X
L
L
L
L
L
L
L
L
L
L
L
L
L
L
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H
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X
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X
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X
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L
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H
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x
When used to indicate an input condition, X = High logic level or low logic level.
Figure 3. Truth tables.
16
x
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MIL-M-38510/14E
Device types 02 and 06
INPUTS
OUTPUTS
C
B
A
STROBE
D0
D1
D2
D3
D4
D5
D6
D7
Y
W
X
L
L
L
L
L
L
L
L
H
H
H
H
H
H
H
H
X
L
L
L
L
H
H
H
H
L
L
L
L
H
H
H
H
X
L
L
H
H
L
L
H
H
L
L
H
H
L
L
H
H
H
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
L
x
L
H
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
x
L
H
L
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
H
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
When used to indicate an input, X = Irrelevant.
H = High level, L = Low level.
ADDRESS
INPUTS
B
A
X
L
L
L
L
H
H
H
H
X
L
L
H
H
L
L
H
H
DATA INPUTS
STROBE
OUTPUT
C0
C1
C2
C3
G
Y
x
L
H
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
L
H
x
x
x
x
x
x
x
x
x
L
H
H
L
L
L
L
L
L
L
L
L
L
H
L
H
L
H
L
H
Address inputs A and B are common to both sections.
H = high level, L = low level, X = irrelevant.
Figure 3. Truth tables – Continued.
17
MIL-M-38510/14E
Device type 04
Address
inputs
B
A
C0
C1
C2
C3
Y
W
L
L
L
L
H
H
H
H
L
H
X
X
X
X
X
X
X
X
L
H
X
X
X
X
X
X
X
X
L
H
X
X
X
X
X
X
X
X
L
H
L
H
L
H
L
H
L
H
H
L
H
L
H
L
H
L
L
L
H
H
L
L
H
H
Data
inputs
Outputs
Address inputs A and B are common to both sections.
H = High level, L = Low level, X = Irrelevant.
Device type 05
Strobe
(enable)
Select
input
Data
inputs
G
A
B0
B1
Y
H
L
L
L
L
X
H
H
L
L
X
X
X
L
H
X
L
H
X
X
L
L
H
L
H
Output
Address A and strobe G are common to all sections.
H = High level, L = Low level, X = Irrelevant.
FIGURE 3. Truth tables – Continued.
18
MIL-M-38510/14E
FIGURE 4. Switching test for device types 01, 02, and 06.
19
MIL-M-38510/14E
NOTES:
1. The input pulse has the following characteristics: VOH = 3 V,
VOL = 0 V, t1 = t0 = 10 ns, tp = 500 ns, PRR ≤ 1 MHz, duty
cycle = 50% ±15%, and generator Zout ≈ 50Ω.
2.
3.
4.
CL includes probe and jig capacitance.
All diodes are 1N3064 or equivalent.
Load circuits on a given output are only required where the specific test
given in table III indicates “OUT” on that output. Load circuits may
otherwise be omitted.
FIGURE 4. Switching test for device types 01, 02, and 06 - Continued.
20
MIL-M-38510/14E
VOLTAGE WAVEFORMS
Switching time
Output waveform
CN to Y (types 03 and 04)
CN to W (type 04 only)
A or B to Y (types 03 and 04)
A or B to W (type 04 only)
G to Y (type 03 only)
A
B
A
B
B
NOTES:
1. The pulse generator has the following characteristics: PRR ≤ 1 MHz,
duty cycle = 50% ±15% and Zout ≈ 50Ω.
2.
3.
4.
CL = 50 pF ±10% and includes probe and jig capacitance.
All diodes are 1N3064, or equivalent.
Load circuits on a given output are only required where the specific test given in
table III indicates “OUT” on that output. Load circuits may otherwise be omitted.
FIGURE 5. Switching test for device types 03 and 04.
21
MIL-M-38510/14E
VOLTAGE WAVEFORMS
Input
Output waveform
A to Y
A
B to Y
S to Y
A
B
NOTES:
1. The pulse generator has the following characteristics: PRR ≤ 1 MHz,
duty cycle = 50% ±15% and Zout ≈ 50Ω.
2.
3.
4.
CL = 50 pF ±10% and includes probe and jig capacitance.
All diodes are 1N3064 or equivalent.
Load circuits on a given output are only required where the specific test given in
table III indicates “OUT” on that output. Load circuits may otherwise be omitted.
FIGURE 6. Switching test for device type 05.
22
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
Symbol
Cases J, K,
Z
1
2
3
4
5
6
7
8
9
10
11
12
Test No.
E7
E6
E5
E4
E3
E2
E1
E0
G
W
D
GND
Meas.
terminal
Min
2.0 V
-.8mA
GND
W
2.4
0.8 V
16mA
“
W
0.4
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
A
B
C
D
G
-1.5
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1
VOH
3006
1
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
VOL
3007
2
“
IIL
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
VIC
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3009
24
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
2.0 V
GND
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
Test limits
E0
E1
E2
E3
E4
E5
E6
E7
E8
E9
E10
E11
E12
E13
E14
E15
Max
Unit
V
GND
GND
“
E0
-0.7
-1.6
mA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
0.4 V
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E1
1/
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
0.4 V
E2
E3
E4
E5
E6
E7
E8
E9
E10
E11
E12
E13
E14
E15
G
A
B
C
D
MIL-M-38510/14E
23
MILSTD-883
method
TABLE III. Group A inspection for device type 01.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
Symbol
Cases J, K,
Z
13
14
15
16
17
18
19
20
21
22
23
24
Test No.
C
B
A
E15
E14
E13
E12
E11
E10
E9
E8
VCC
Meas.
terminal
Min
4.5 V
W
2.4
GND
“
-12mA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1
VOH
3006
1
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
VOL
3007
2
“
IIL
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
VIC
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
GND
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
-12mA
Test limits
Max
Unit
W
0.4
V
A
B
C
D
G
-1.5
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E0
E1
E2
E3
E4
E5
E6
E7
E8
E9
E10
E11
E12
E13
E14
E15
V
3009
24
GND
GND
GND
5.5 V
E0
-0.7
-1.6
mA
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
“
“
“
5.5 V
“
“
“
GND
“
“
“
5.5 V
“
“
“
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E1
1/
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
See note at end of device type 01.
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
E2
E3
E4
E5
E6
E7
E8
E9
E10
E11
E12
E13
E14
E15
G
A
B
C
D
MIL-M-38510/14E
24
MILSTD-883
method
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILSTD-883
method
Cases J, K,
Z
1
2
3
4
5
6
7
8
9
10
11
12
Test No.
E7
E6
E5
E4
E3
E2
E1
E0
G
W
D
GND
Meas.
terminal
Max
Unit
3010
45
GND
G
40
µA
TC = 25°C
“
“
“
“
“
“
“
“
“
IIH1
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
46
47
48
49
50
51
52
53
54
55
5.5 V
"
“
“
“
“
“
GND
GND
GND
2.4 V
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
A
B
C
D
E5
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
56
“
“
“
E6
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
57
58
59
60
61
62
63
64
65
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E7
“
“
“
“
“
“
“
“
“
"
"
"
66
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
67
68
69
70
71
72
73
74
75
75
77
78
79
80
81
82
83
84
85
86
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
IIH2
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
IOS
3011
87
“
ICC
3005
88
Subgroup
1
Symbol
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
25
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
2
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC are omitted.
GND
GND
5.5 V
GND
E0
E1
E2
E3
E4
E15
“
“
“
“
“
“
“
“
“
"
G
100
GND
GND
GND
5.5 V
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
A
B
C
D
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
W
5.5 V
“
VCC
E8
E9
E10
E11
E12
E13
E14
E0
E1
E2
E3
E4
E5
E6
E7
E8
E9
E10
E11
E12
E13
E14
E15
-20
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-55
mA
68
mA
MIL-M-38510/14E
5.5 V
5.5 V
Test limits
Min
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Cases J, K,
Z
13
14
15
Test No.
C
B
A
3010
45
TC = 25°C
“
“
“
“
“
“
“
“
“
IIH1
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
46
47
48
49
50
51
52
53
54
55
GND
GND
2.4 V
GND
5.5 V
“
“
“
GND
“
GND
2.4 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
“
“
“
56
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
57
58
59
60
61
62
63
64
65
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
IIH2
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1
26
"
Symbol
16
17
18
19
20
21
22
23
24
Test limits
VCC
Meas.
terminal
Max
Unit
5.5 V
G
40
µA
2.4 V
GND
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
“
“
“
“
“
“
“
“
“
“
A
B
C
D
E5
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
5.5 V
“
E6
“
“
“
5.5 V
“
“
“
GND
“
“
“
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
“
“
“
“
“
“
“
“
“
E7
“
“
“
“
“
“
“
“
“
66
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
67
68
69
70
71
72
73
74
75
75
77
78
79
80
81
82
83
84
85
86
GND
GND
5.5 V
GND
5.5 V
“
“
“
GND
“
“
“
5.5 V
“
“
“
GND
“
“
“
GND
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
GND
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
IOS
3011
87
GND
GND
GND
“
W
ICC
3005
88
5.5 V
5.5 V
5.5 V
“
VCC
E15
E14
E13
E11
E10
E9
E8
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
2
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC are omitted.
See note at end of device type 01.
E12
Min
E0
E1
E2
E3
E4
E15
“
“
“
“
“
“
“
“
“
"
G
100
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
A
B
C
D
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-55
mA
68
mA
E8
E9
E10
E11
E12
E13
E14
E0
E1
E2
E3
E4
E5
E6
E7
E8
E9
E10
E11
E12
E13
E14
E15
-20
MIL-M-38510/14E
MILSTD-883
method
Subgroup
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
7
8
9
Truth
table
test
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MILSTD-883
method
Cases J, K,
Z
1
2
3
4
5
6
7
8
9
10
11
12
Test No.
E7
E6
E5
E4
E3
E2
E1
E0
G
W
D
GND
3014
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
A 2/
B
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
H 3/
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
B
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
GND
OUT
GND
GND
A to W
“
“
“
“
“
B to W
“
“
“
“
“
“
“
IN
“
“
GND
GND
OUT
GND
“
“
“
5.0 V
5.0 V
“
“
“
IN
IN
“
“
“
OUT
OUT
“
“
IN
GND
GND
“
(Fig 4)
123
“
“
“
“
124
125
"
tPLH1
“
“
“
"
126
"
“
“
“
“
127
128
129
130
131
“
“
“
“
B
A
B
A
B
A
B
A
B
A
B
A
B
A
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
3003
122
tPHL1
TC = 25°C
“
“
"
B
A
tPHL2
tPLH2
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
Meas.
terminal
Test limits
Min
Max
Unit
8
37
ns
“
“
“
C to W
D to W
“
“
“
“
“
“
GND
A to W
8
39
ns
“
“
“
“
“
B to W
C to W
D to W
G to W
G to W
“
“
“
6
6
“
“
“
34
28
“
“
“
ns
ns
3/
MIL-M-38510/14E
27
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Symbol
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
7
8
9
Truth
table
test
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MILSTD-883
method
Cases J, K,
Z
13
14
15
16
17
18
19
20
21
22
23
24
Test No.
C
B
A
E15
E14
E13
E12
E11
E10
E9
E8
VCC
3014
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
B
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
B
“
“
“
“
“
“
“
A
“
“
“
“
“
“
“
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
3003
122
GND
tPHL1
B
“
“
“
A
“
“
“
B
“
“
“
A
“
“
“
B
“
“
“
A
“
“
“
B
“
“
“
A
“
“
“
B
B
A
A
B
B
A
A
B
B
A
A
B
B
A
A
B
B
A
A
B
B
A
A
B
B
A
A
B
B
A
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
B
A
Meas.
terminal
4.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Test limits
Min
Max
Unit
ns
MIL-M-38510/14E
28
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Symbol
3/
GND
IN
5.0 V
A to W
8
37
TC = 25°C
“
“
“
(Fig 4)
123
GND
IN
GND
“
B to W
“
“
“
“
“
“
“
124
125
IN
GND
GND
GND
“
“
“
“
C to W
D to W
“
“
“
“
“
“
"
"
tPLH1
“
“
“
"
126
GND
GND
IN
5.0 V
A to W
8
39
ns
"
“
“
“
“
127
128
129
130
131
GND
IN
GND
GND
GND
IN
GND
GND
GND
GND
GND
“
“
GND
GND
“
“
“
“
“
B to W
C to W
D to W
G to W
G to W
“
“
“
6
6
“
“
“
34
28
“
“
“
ns
ns
“
“
“
“
tPHL2
tPLH2
See note at end of device type 01
5.0 V
5.0 V
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILSTD-883
method
Cases J, K,
Z
1
2
3
4
5
6
7
8
9
10
11
12
Test No.
E7
E6
E5
E4
E3
E2
E1
E0
G
W
D
GND
Meas.
terminal
Min
Max
Unit
tPHL3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3003
(Fig 4)
“
“
“
“
“
“
“
“
“
“
“
“
“
“
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
IN
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
OUT
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E0
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
5.0 V
“
“
“
“
“
“
“
to W
E1 to W
E2 to W
E3 to W
E4 to W
E5 to W
E6 to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
18
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
IN
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
OUT
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
24
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
164
GND
GND
OUT
GND
“
8
40
ns
TC = 125°C
“
“
tPHL1
“
“
“
to W
E1 to W
E2 to W
E3 to W
E4 to W
E5 to W
E6 to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
A to W
“
“
“
165
166
167
“
“
“
“
“
“
“
“
“
“
“
IN
“
“
“
B to W
C to W
D to W
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH1
“
“
“
“
“
“
“
168
169
170
171
“
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
IN
“
“
“
“
A to W
B to W
C to W
D to W
“
“
“
“
43
“
“
“
“
“
“
“
“
tPHL2
“
172
5.0 V
IN
OUT
GND
“
G to W
6
37
ns
“
tPLH2
“
173
5.0 V
IN
OUT
GND
“
G to W
6
32
ns
Subgroup
9
“
“
29
“
“
“
“
“
“
“
“
“
“
“
“
“
“
10
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
E0
Test limits
“
MIL-M-38510/14E
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Symbol
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILSTD-883
method
Cases J, K,
Z
13
14
15
16
17
18
19
20
21
22
23
24
Test No.
C
B
A
E15
E14
E13
E12
E11
E10
E9
E8
VCC
Meas.
terminal
Min
Max
Unit
tPHL3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3003
(Fig 4)
“
“
“
“
“
“
“
“
“
“
“
“
“
“
132
133
134
135
136
137
138
139
140
141
142
143
144
145
146
147
GND
“
“
“
5.0 V
“
“
“
GND
“
“
“
5.0 V
“
“
“
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
E0
IN
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
to W
E1 to W
E2 to W
E3 to W
E4 to W
E5 to W
E6 to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
18
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
148
149
150
151
152
153
154
155
156
157
158
159
160
161
162
163
GND
“
“
“
5.0 V
“
“
“
GND
“
“
“
5.0 V
“
“
“
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
IN
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
24
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
164
GND
GND
IN
“
8
40
ns
TC = 125°C
“
“
tPHL1
“
“
“
to W
to W
E2 to W
E3 to W
E4 to W
E5 to W
E6 to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
A to W
“
“
“
165
166
167
GND
IN
GND
IN
GND
GND
GND
GND
GND
5.0 V
“
“
“
B to W
C to W
D to W
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH1
“
“
“
“
“
“
“
168
169
170
171
GND
GND
IN
GND
GND
IN
GND
GND
IN
GND
GND
GND
5.0 V
“
“
“
“
A to W
B to W
C to W
D to W
“
“
“
“
43
“
“
“
“
“
“
“
“
tPHL2
“
172
GND
GND
GND
“
G to W
6
37
ns
“
tPLH2
“
173
GND
GND
GND
“
G to W
6
32
ns
Subgroup
9
“
“
30
“
“
“
“
“
“
“
“
“
“
“
“
“
“
10
See note at end of device type 01
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
E0
E1
Test limits
MIL-M-38510/14E
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Symbol
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
10
"
"
31
“
“
“
“
“
“
“
“
“
“
“
“
“
“
11
tPHL3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MILSTD-883
method
Cases J, K,
Z
1
2
3
4
5
6
7
8
9
10
11
12
Test No.
E7
E6
E5
E4
E3
E2
E1
E0
G
W
D
GND
Meas.
terminal
3003
174
IN
GND
OUT
GND
GND
E0
(Fig 4)
“
“
“
“
“
“
“
“
“
“
“
“
“
“
175
176
177
178
179
180
181
182
183
184
185
186
187
188
189
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.0 V
“
“
“
“
“
“
“
"
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
190
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
191
192
193
194
195
196
197
198
199
200
201
202
203
204
205
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
Same tests, terminal conditions and limits as subgroup 10 except TC = -55°C.
“
“
“
“
“
Test limits
Min
Max
Unit
to W
3
23
ns
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
to W
E2 to W
E3 to W
E4 to W
E5 to W
E6 to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
"
E0
to W
3
30
ns
“
“
“
“
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E1
to W
E2 to W
E3 to W
E4 to W
“
“
“
“
“
“
“
“
“
“
“
“
to W
to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E1
E5
E6
MIL-M-38510/14E
TC = 125°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Symbol
TABLE III. Group A inspection for device type 01 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
10
"
"
“
“
“
“
“
“
“
“
“
32
“
“
“
“
“
11
tPHL3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MILSTD-883
method
Cases J, K,
Z
13
14
15
16
17
18
19
20
21
22
23
24
Test No.
C
B
A
E15
E14
E13
E12
E11
E10
E9
E8
VCC
Meas.
terminal
3003
174
GND
GND
GND
5.0 V
E0
(Fig 4)
“
“
“
“
“
“
“
“
“
“
“
“
“
“
175
176
177
178
179
180
181
182
183
184
185
186
187
188
189
“
“
“
5.0 V
“
“
“
GND
“
“
“
5.0 V
“
“
“
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
"
190
GND
GND
GND
"
E0
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
191
192
193
194
195
196
197
198
199
200
201
202
203
204
205
“
“
“
5.0 V
“
“
“
GND
“
“
“
5.0 V
“
“
“
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E1
to W
to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
Same tests, terminal conditions and limits as subgroup 10 except TC = -55°C.
1/ IIL minimum limit for CKT E is -0.6 mA.
2/ A = 3.0 V minimum, B = 0.0 V or GND.
3/ H > 1.5 V; L < 1.5 V.
Only attributes data is required for subgroups 7 and 8.
Test limits
Min
Max
Unit
to W
3
23
ns
to W
E2 to W
E3 to W
E4 to W
E5 to W
E6 to W
E7 to W
E8 to W
E9 to W
E10 to W
E11 to W
E12 to W
E13 to W
E14 to W
E15 to W
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
to W
3
30
ns
to W
E2 to W
E3 to W
E4 to W
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
E1
E5
E6
MIL-M-38510/14E
MIL-M-38510/14E
TC = 125°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Symbol
TABLE III. Group A inspection for device type 02.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
1
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
VOH
VOH
VOL
VOL
VIC
“
“
“
“
“
“
“
“
“
“
“
IIL
“
“
“
“
“
“
“
“
“
“
“
IIH1
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
“
“
“
“
3010
“
“
“
“
“
“
“
“
“
“
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
2
3
4
5
6
7
8
9
10
11
12
D1
D2
D3
D4
D5
D6
GND
D7
G
A
B
0.8 V
2.0 V
2.0 V
0.8 V
0.8 V
2.0 V
2.0 V
0.8 V
0.8 V
2.0 V
2.0 V
0.8 V
2.0 V
2.0 V
-12 mA
0.4 V
2.4 V
See note at end of device type 02.
GND
“
“
“
“
-12 mA
“
-12 mA
“
-12 mA
“
-12 mA
“
-12 mA
“
-12 mA
“
“
-12 mA
“
“
“
“
“
“
“
“
“
0.4 V
“
0.4 V
“
0.4 V
“
0.4 V
“
0.4 V
“
0.4 V
“
“
0.4 V
“
“
“
“
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
2.4 V
“
“
2.4 V
-12 mA
-12 mA
-12 mA
0.4 V
GND
“
“
“
“
“
“
“
“
“
“
2.4 V
5.5 V
“
“
“
“
“
“
“
“
“
“
5.5 V
0.4 V
5.5 V
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
2.4 V
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
5.5 V
0.4 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
2.4 V
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
13
14
15
16
Test limits
C
W
Y
VCC
Max
Meas.
terminal Min
0.8 V
-0.8 mA 4.5 V
Y
2.4
2.0 V -0.8 mA
“
W
2.4
2.0 V
16 mA
“
Y
0.8 V 16 mA
“
W
“
D0
“
D1
“
D2
“
D3
“
D4
“
D5
“
D6
“
D7
“
G
“
A
“
B
-12 mA
“
C
5.5 V
5.5 V
G
-0.7
“
“
A
“
“
“
B
“
0.4 V
“
C
“
GND
“
“
D0
“
“
“
D1
“
“
“
D2
“
“
“
D3
5.5 V
“
“
D4
“
“
“
D5
“
“
“
D6
“
“
“
D7
GND
“
G
GND
“
A
GND
“
B
2.4 V
“
C
5.5 V
“
D0
“
“
D1
“
“
D2
“
“
D3
GND
“
D4
“
“
D5
“
“
D6
“
“
D7
0.4
0.4
-1.5
“
“
“
“
“
“
“
“
“
“
“
-1.6
“
“
“
“
“
“
“
“
“
“
“
40
“
“
“
“
“
“
“
“
“
“
“
Unit
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/14E
33
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3006
3006
3007
3007
1
D0
TABLE III. Group A inspection for device type 02– Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
1
MILCases E, F
Symbol STD-883
Test No.
method
2
3
4
5
6
7
8
9
10
11
12
13
14
15
D1
D2
D3
D4
D5
D6
GND
D7
G
A
B
C
W
Y
GND
“
“
“
“
“
“
“
“
“
“
“
GND
GND
5.5 V
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
"
"
GND
“
“
5.5 V
“
“
“
“
GND
“
“
“
IIH2
“
“
“
“
“
“
“
“
“
“
“
"
IOS
3011
53
GND
"
IOS
3011
54
ICC
3005
55
16
Test limits
VCC
Max
Unit
100
“
“
“
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
Meas.
terminal Min
5.5 V
G
“
A
“
B
“
C
“
D0
“
D1
“
D2
“
D3
“
D4
“
D5
“
D6
“
D7
34
5.5 V
5.5 V
GND
“
“
“
“
“
“
“
“
“
“
GND
"
GND
"
GND
"
GND
"
GND
"
"
GND
5.5 V
5.5 V
GND
"
GND
5.5 V
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
"
“
"
GND
"
"
"
"
5.5 V
"
"
"
"
"
"
“
"
GND
"
"
"
H 2/
L
H
L
“
L
H
“
“
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
GND
GND
"
Y
-20
-120
“
W
-20
-120
mA
mA
“
VCC
48
mA
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
7
Truth
56
GND
A 1/
TC = 25°C
“
table
57
B
“
B
B
B
test
58
A
“
“
B
“
B
“
“
“
59
B
“
“
A
“
“
H
L
“
“
60
A
“
“
A
“
“
L
H
“
“
“
61
B
“
“
B
A
“
H
L
“
“
“
62
A
“
“
63
B
“
“
64
A
“
“
65
B
“
“
66
A
“
“
67
B
“
“
68
A
“
“
69
“
“
70
“
“
71
“
“
“
72
“
8
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
See note at end of device type 02.
4.5 V
“
“
B
“
“
L
H
“
“
“
A
“
“
H
L
“
“
“
A
“
“
L
H
“
“
“
B
B
H
L
“
“
“
B
“
A
“
L
H
“
“
“
A
“
“
H
L
“
“
“
A
“
“
L
H
“
B
“
“
B
A
“
H
L
“
A
“
“
B
“
“
L
H
“
B
“
A
“
“
H
L
“
A
“
A
“
“
L
H
“
2/
MIL-M-38510/14E
TC = 25°C
“
“
“
“
“
“
“
“
“
“
3010
“
“
“
“
“
“
“
“
“
“
“
"
2
41
42
43
44
45
46
47
48
49
50
51
52
1
D0
TABLE III. Group A inspection for device type 02– Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
D0
D1
D2
D3
D4
D5
D6
GND
D7
G
A
B
C
W
Y
VCC
5.0 V
3003
73
GND
(Fig 4)
74
“
“
“
75
“
“
76
“
“
tPLH1
“
“
77
“
“
“
“
78
“
“
“
79
“
“
tPHL2
“
“
80
“
“
“
“
81
“
“
“
82
“
“
tPLH2
“
“
83
“
“
“
“
84
“
“
tPHL3
“
85
“
tPLH3
“
“
“
tPHL4
“
Test limits
Max
Unit
GND
GND
IN
GND
GND
OUT
5.0 V
A to W
6
32
ns
“
“
GND
IN
GND
“
“
B to W
“
“
“
“
“
GND
GND
IN
“
“
C to W
“
“
“
“
“
IN
GND
GND
“
“
A to W
“
29
“
“
“
GND
IN
GND
“
“
B to W
“
“
“
“
“
GND
GND
IN
“
“
C to W
“
“
“
“
“
IN
GND
GND
OUT
“
A to Y
“
40
“
“
“
GND
IN
GND
“
“
B to Y
“
“
“
“
“
GND
GND
IN
“
“
C to Y
“
“
“
“
IN
GND
GND
“
“
A to Y
“
39
“
“
“
“
GND
IN
GND
“
“
B to Y
“
“
“
“
“
GND
GND
IN
“
“
C to Y
“
“
“
5.0 V
“
IN
GND
GND
GND
OUT
“
G to W
6
28
“
86
“
“
“
“
“
“
OUT
“
G to W
6
24
“
“
87
“
“
“
“
“
“
OUT
“
G to Y
8
37
“
tPLH4
“
88
“
“
“
“
“
“
OUT
“
G to Y
8
35
“
“
89
IN
“
GND
GND
GND
GND
OUT
“
Do to W
3
20
“
“
tPHL5
“
“
90
“
“
5.0 V
GND
“
“
“
D1 to W
“
“
“
“
“
“
91
“
“
GND
5.0 V
“
“
“
D2 to W
“
“
“
“
“
“
92
“
“
5.0 V
5.0 V
“
“
“
D3 to W
“
“
“
“
“
“
93
“
“
GND
GND
5.0 V
“
“
D4 to W
“
“
“
“
“
“
94
“
“
5.0 V
GND
“
“
“
D5 to W
“
“
“
“
“
“
95
“
“
GND
5.0 V
“
“
“
D6 to W
“
“
“
“
“
“
96
IN
“
5.0 V
5.0 V
“
“
“
D7 to W
“
“
“
"
"
“
“
“
“
“
“
tPLH5
“
“
“
“
“
“
“
"
"
“
“
“
“
“
“
97
98
99
100
101
102
103
104
IN
"
“
“
“
“
“
“
“
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
“
“
“
5.0 V
“
“
“
"
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
Do to W
D1 to W
D2 to W
D3 to W
D4 to W
D5 to W
D6 to W
D7 to W
"
“
“
“
“
“
“
“
17
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
9
TC = 25°C
“
“
35
See note at end of device type 02.
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
IN
IN
IN
IN
IN
IN
“
IN
IN
IN
IN
IN
IN
IN
"
“
“
“
“
“
“
”
MIL-M-38510/14E
tPHL1
“
Meas.
terminal Min
TABLE III. Group A inspection for device type 02– Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
9
MILCases E, F
Symbol STD-883
Test No.
method
105
106
107
108
109
tPHL6
“
“
“
“
“
“
“
110
“
“
“
“
“
“
“
“
“
“
10
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
111
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
142
143
144
TC = 125°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH6
“
“
“
“
“
“
“
tPHL1
“
“
tPLH1
“
“
tPHL2
“
“
tPLH2
“
“
tPHL3
tPLH3
tPHL4
tPLH4
tPHL5
“
“
“
“
“
“
“
See note at end of device type 02.
2
3
4
5
6
7
8
9
10
11
12
13
14
15
D1
D2
D3
D4
D5
D6
GND
D7
G
A
B
C
W
Y
GND
“
“
“
“
GND
5.0 V
GND
5.0 V
GND
GND
GND
5.0 V
5.0 V
GND
GND
“
“
“
5.0 V
OUT
“
“
“
“
“
“
5.0 V
GND
“
“
“
D5 to Y
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
IN
“
“
“
GND
“
“
“
“
“
“
“
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
IN
GND
GND
IN
GND
GND
IN
GND
GND
IN
GND
GND
GND
“
“
“
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
IN
GND
GND
IN
GND
GND
IN
GND
GND
IN
GND
GND
“
“
“
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
“
“
GND
“
“
“
5.0 V
“
“
“
GND
GND
IN
GND
GND
IN
GND
GND
IN
GND
GND
IN
GND
“
“
“
GND
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
D6 to Y
D7 to Y
IN
GND
“
“
“
“
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
GND
“
“
“
“
“
“
“
“
“
“
“
5.0 V
“
“
“
IN
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
IN
IN
IN
IN
IN
IN
IN
IN
IN
OUT
“
“
“
“
“
OUT
“
“
“
“
“
OUT
OUT
OUT
OUT
OUT
“
“
“
“
“
“
“
16
Test limits
VCC
Max
Unit
29
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
6
“
“
“
“
“
“
“
6
“
“
“
“
“
8
“
“
“
“
“
6
6
8
8
3
“
“
“
“
“
“
“
“
“
29
“
“
“
“
“
“
“
40
“
“
38
“
“
49
“
“
45
“
“
37
35
46
42
32
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Meas.
terminal Min
5.0 V Do to Y
6
“
“
D1 to Y
“
“
D2 to Y
“
“
D3 to Y
“
“
D4 to Y
Do to Y
D1 to Y
D2 to Y
D3 to Y
D4 to Y
D5 to Y
D6 to Y
D7 to Y
A to W
B to W
C to W
A to W
B to W
C to W
A to Y
B to Y
C to Y
A to Y
B to Y
C to Y
G to W
G to W
G to Y
G to Y
Do to W
D1 to W
D2 to W
D3 to W
D4 to W
D5 to W
D6 to W
D7 to W
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/14E
36
TC = 25°C
“
“
“
3003
(Fig 4)
“
“
“
1
D0
TABLE III. Group A inspection for device type 02– Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
D0
D1
D2
D3
D4
D5
D6
GND
D7
G
A
B
C
W
Y
VCC
145
(Fig 4)
“
“
“
“
“
“
146
147
148
149
150
151
152
“
“
“
“
“
“
“
“
tPHL6
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
153
154
155
156
157
158
159
160
IN
“
“
tPLH6
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
161
162
163
164
165
166
167
168
IN
10
37
“
“
“
“
“
“
11
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
Same tests, terminal conditions and limits as subgroup 10, except TA = -55°C.
1/ A = 3.0 V minimum, B = 0.0 V or GND.
2/ H > 1.5 V; L < 1.5 V.
Only attributes data is required for subgroups 7 and 8.
IN
GND
GND
GND
GND
GND
OUT
“
“
“
“
“
“
”
IN
“
“
“
“
“
“
“
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
IN
“
“
“
“
“
“
“
“
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
“
“
“
5.0 V
“
“
“
IN
“
“
“
“
“
“
“
“
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
5.0 V Do to W
Test limits
Max
Unit
3
26
ns
“
“
“
“
“
“
“
D1 to W
D2 to W
D3 to W
D4 to W
D5 to W
D6 to W
D7 to W
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
OUT
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Do to Y
D1 to Y
D2 to Y
D3 to Y
D4 to Y
D5 to Y
D6 to Y
D7 to Y
6
“
“
“
“
“
“
“
41
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Do to Y
“
“
“
“
“
“
“
“
33
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
D1 to Y
D2 to Y
D3 to Y
D4 to Y
D5 to Y
D6 to Y
D7 to Y
“
“
“
“
“
“
MIL-M-38510/14E
tPLH5
“
“
“
“
“
“
“
3003
TC = 125°C
“
“
“
“
“
“
Meas.
terminal Min
TABLE III. Group A inspection for device type 03.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
1
38
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
VOH
VOH
VOL
VOL
VIC
“
“
“
“
“
“
“
“
“
“
“
IIL
“
“
“
“
“
“
“
“
“
“
“
IIH1
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
“
“
“
“
3010
“
“
“
“
“
“
“
“
“
“
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
2
3
4
5
6
7
8
9
10
11
12
13
14
15
B
1C3
1C2
1C1
1C0
1Y
GND
2Y
2C0
2C1
2C2
2C3
A
2G
0.8 V
0.8 V
0.8 V
0.8 V
0.8 V
0.8 V
2.0 V -.8 mA
2.0 V
16 mA
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
-12mA
0.4 V
0.4 V
GND
“
“
“
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
0.4 V
0.4 V
0.4 V
0.4 V
2.4 V
2.4 V
5.5 V
“
“
“
See notes at end of device type 03.
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
2.4 V
2.4 V
2.4 V
2.4 V
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
-.8 mA 2.0 V
16 mA
2.0 V
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
0.4 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
2.4 V
GND
“
“
“
2.4 V
2.4 V
2.4 V
2.4 V
2.4 V
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
“
“
“
16
Test limits
VCC
Max
Meas.
terminal Min
4.5 V
1Y
2.4
“
2Y
2.4
“
1Y
“
2Y
“
A
“
B
“
1C0
“
1C1
“
1C2
“
1C3
“
1G
“
2C0
“
2C1
“
2C2
“
2C3
“
2G
5.5 V
A
-0.7
“
B
“
“
1G
“
“
2G
“
“
“
1C0
“
“
1C1
“
“
1C2
“
“
1C3
“
“
2C0
“
“
2C1
“
“
2C2
“
“
2C3
“
A
“
B
“
1G
“
2G
“
1C0
“
1C1
“
1C2
“
1C3
“
2C0
“
2C1
“
2C2
“
2C3
0.4
0.4
-1.5
“
“
“
“
“
“
“
“
“
“
“
-1.6
“
“
“
“
“
“
“
“
“
“
“
40
“
“
“
“
“
“
“
“
“
“
“
Unit
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/14E
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3006
3006
3007
3007
1
1G
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
B
1C3
1C2
1C1
1C0
1Y
GND
2Y
2C0
2C1
2C2
2C3
A
2G
VCC
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
39
IIH2
“
5.5 V
TC = 25°C
“
“
5.5 V
“
“
“
“
5.5 V 5.5 V
5.5 V
“
“
“
5.5 V
5.5 V
“
“
“
GND
5.5 V
“
“
“
GND 5.5 V
“
“
5.5 V
“
“
5.5 V
“
“
GND
“
“
"
“
GND
"
GND GND GND 5.5 V GND
IOS
"
"
GND
“
IOS
“
"
"
GND GND GND GND
ICC
2
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
7
Truth
56
A 1/
L 2/
GND
L
57
B
B
B
L
“
L
TC = 25°C table
“
test
58
“
B
A
H
“
H
“
“
59
“
B
B
L
“
L
“
“
60
“
B
A
H
“
H
“
“
61
“
A
B
L
“
L
“
“
62
“
A
A
H
“
H
“
“
63
“
A
B
L
“
L
“
“
64
“
A
A
H
“
H
8
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
3003
65
GND GND
IN
OUT GND
9
tPHL1
“
(Fig 5)
66
“
GND
IN
“
“
TC = 25°C
“
“
“
67
“
5.0 V
IN
“
“
“
“
“
68
“
5.0 V
IN
“
“
“
“
“
69
GND
“
OUT
“
“
“
70
GND
“
“
“
“
“
71
5.0 V
“
“
“
“
“
72
5.0 V
“
“
See notes at end of device type 03.
5.5 V
GND
GND
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
A
B
“
“
“
“
“
“
“
4.5 V
“
“
“
“
“
“
“
“
GND
“
“
“
5.0 V
“
“
“
“
“
“
“
5.5 V
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
"
"
"
B
A
B
B
A
A
B
B
A
A
IN
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
GND
GND
GND
GND
GND
B
A
B
A
B
A
IN
IN
IN
5.5 V
“
“
“
Meas.
terminal
A
B
1G
2G
1C0
1C1
1C2
1C3
2C0
2C1
2C2
2C3
1Y
2Y
Test limits
Min
-20
-20
VCC
Max
Unit
100
“
“
“
“
“
“
“
“
“
“
“
-55
-55
52
µA
“
“
“
“
“
“
“
“
“
“
“
mA
mA
mA
25
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
2/
1C0 to 1Y
1C1 to 1Y
1C2 to 1Y
1C3 to 1Y
2C0 to 2Y
2C1 to 2Y
2C2 to 2Y
2C3 to 2Y
3
“
“
“
“
“
“
“
MIL-M-38510/14E
3010
“
“
“
“
“
“
“
“
“
“
“
3011
3011
3005
1
1G
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
9
tPLH1
“
“
“
“
“
“
“
tPHL2
“
“
“
tPLH2
“
“
“
tPHL3
tPHL3
tPLH3
tPLH3
40
tPHL1
“
TC = 125°C
“
“
“
“
“
“
“
“
“
“
“
“
“
tPLH1
“
“
“
“
“
“
“
“
“
“
“
“
“
“
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
B
1C3
1C2
1C1
1C0
1Y
GND
2Y
2C0
2C1
2C2
2C3
A
2G
VCC
GND
“
“
“
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
IN
GND
IN
GND
IN
GND
IN
GND
GND
GND
GND
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
GND
GND
5.0 V
5.0 V
IN
OUT
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
GND
GND
GND
GND
IN
IN
GND
“
“
“
GND
“
“
“
See notes at end of device type 03.
IN
IN
IN
5.0 V
5.0 V
5.0 V
5.0 V
GND
GND
GND
GND
OUT
5.0 V
OUT
IN
IN
IN
IN
IN
IN
OUT
OUT
5.0 V
IN
IN
OUT
OUT
OUT
“
“
“
OUT
“
“
“
OUT
“
“
“
IN
OUT
OUT
GND
GND
5.0 V
OUT
OUT
GND
GND
5.0 V
OUT
5.0 V
OUT
5.0 V
OUT
“
“
“
OUT
“
“
“
IN
IN
IN
5.0 V
5.0 V
IN
IN
IN
IN
IN
IN
IN
IN
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
IN
GND
IN
GND
IN
GND
IN
GND
GND
GND
GND
GND
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
5.0 V
GND
“
“
“
GND
GND
GND
GND
IN
IN
GND
“
“
“
GND
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
“
5.0 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
Meas.
terminal
1C0 to 1Y
1C1 to 1Y
1C2 to 1Y
1C3 to 1Y
2C0 to 2Y
2C1 to 2Y
2C2 to 2Y
2C3 to 2Y
A to 1Y
B to 1Y
A to 2Y
B to 2Y
A to 1Y
B to 1Y
A to 2Y
B to 2Y
1G to 1Y
2G to 2Y
1G to 1Y
2G to 2Y
1C0 to 1Y
1C1 to 1Y
1C2 to 1Y
1C3 to 1Y
2C0 to 2Y
2C1 to 2Y
2C2 to 2Y
2C3 to 2Y
1C0 to 1Y
1C1 to 1Y
1C2 to 1Y
1C3 to 1Y
2C0 to 2Y
2C1 to 2Y
2C2 to 2Y
2C3 to 2Y
Test limits
Min
Max
Unit
3
“
“
“
“
“
“
“
6
“
“
“
6
“
“
“
“
“
“
“
3
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
24
“
“
“
“
“
“
“
36
“
“
“
34
“
“
“
28
28
38
38
29
“
“
“
“
“
“
“
28
“
“
“
“
“
“
“
ns
“
“
“
“
“
“
“
“
“
“
“
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/14E
TC = 25°C
“
“
“
“
“
“
“
“
“
“
"
"
“
“
“
“
“
“
10
3003
(Fig 5)
“
“
“
“
“
“
“
“
“
“
"
"
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
1
1G
TABLE III. Group A inspection for device type 03 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
10
TC = 125°C
“
“
“
“
“
“
“
“
“
“
11
tPHL2
“
“
“
tPLH2
“
“
“
tPHL3
tPHL3
tPLH3
tPLH3
3003
(Fig 5)
“
“
“
“
“
“
“
“
“
“
109
110
111
112
113
114
115
116
117
118
119
120
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
1G
B
1C3
1C2
1C1
1C0
1Y
GND
2Y
2C0
2C1
2C2
2C3
A
2G
GND
GND
GND
IN
GND
IN
GND
IN
GND
IN
GND
GND
GND
GND
5.0 V
GND
GND
OUT
OUT
GND
“
“
“
“
“
“
“
“
“
“
“
GND
GND
IN
IN
5.0 V
5.0 V
5.0 V
GND
GND
OUT
OUT
5.0 V
OUT
5.0 V
OUT
OUT
OUT
GND
GND
5.0 V
OUT
OUT
GND
GND
5.0 V
OUT
5.0 V
OUT
5.0 V
5.0 V
5.0 V
IN
GND
IN
GND
IN
GND
IN
GND
GND
GND
GND
GND
GND
GND
GND
GND
IN
IN
16
Meas.
terminal
5.0 V A to 1Y
“
B to 1Y
“
A to 2Y
“
B to 2Y
“
A to 1Y
“
B to 1Y
“
A to 2Y
“
B to 2Y
“
1G to 1Y
“
2G to 2Y
“
1G to 1Y
“
2G to 2Y
VCC
Test limits
Min
Max
Unit
6
“
“
“
“
“
“
“
“
“
“
“
44
“
“
“
42
“
“
“
32
32
42
42
ns
“
“
“
“
“
“
“
“
“
“
“
Same tests, terminal conditions and limits as subgroup 10, except TC = -55°C.
1/ A = 3.0 V minimum, B = 0.0 V or GND.
2/ H > 1.5 V; L < 1.5 V.
Only attributes data is required for subgroups 7 and 8.
MIL-M-38510/14E
41
TABLE III. Group A inspection for device type 04.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
1
VOH
“
“
“
VOL
“
“
“
VIC
“
“
“
“
“
“
“
“
“
IIL
“
“
“
“
“
“
“
“
“
IIH1
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
“
“
3010
“
“
“
“
“
“
“
“
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
2W
B
2C0
2C1
2C2
2C3
GND
1C3
1C2
1C1
1C0
A
1W
1Y
VCC
0.8 V
“
-0.8 mA
“
-0.8 mA
“
“
“
16 mA
“
16 mA
“
See note at end of device type 04.
GND
“
2.0 V
“
0.8 V
“
“
“
2.0 V
“
0.8 V
“
“
-12 mA
“
“
“
-12 mA
“
-12 mA
“
-12 mA
-12 mA
“
-12 mA
“
-12 mA
“
-12 mA
“
“
0.4 V
“
GND
“
GND
“
0.4 V
5.5 V
“
0.4 V
5.5 V
“
0.4 V
GND 0.4 V
“
GND
0.4 V
“
5.5 V
0.4 V
“
5.5 V
0.4 V
“
“
2.4 V
“
5.5 V
“
5.5 V
“
2.4 V
GND
“
2.4 V
GND
“
2.4 V
5.5 V 2.4 V
“
5.5 V
2.4 V
“
GND
2.4 V
“
GND
2.4 V
“
2.0 V
0.8 V
0.8 V
-0.8 mA 4.5 V
“
-0.8 mA
“
“
“
“
“
2.0 V
“
16 mA
“
0.8 V
“
16 mA
“
“
“
“
“
-12 mA
“
“
-12 mA
“
“
“
“
“
“
“
“
0.4 V
5.5 V
“
0.4 V GND
“
5.5 V
“
GND
“
5.5 V
“
GND
“
5.5 V
“
GND
“
5.5 V
“
2.4 V
“
“
2.4 V 5.5 V
“
GND
“
5.5 V
“
GND
“
5.5 V
“
GND
“
5.5 V
“
GND
“
Meas.
terminal
1Y
1W
2Y
2W
1W
1Y
2W
2Y
A
B
1C0
1C1
1C2
1C3
2C0
2C1
2C2
2C3
A
B
1C0
1C1
1C2
1C3
2C0
2C1
2C2
2C3
A
B
1C0
1C1
1C2
1C3
2C0
2C1
2C2
2C3
Test limits
Min
Max
Unit
0.4
“
“
“
-1.5
“
“
“
“
“
“
“
“
“
-1.6
“
“
“
“
“
“
“
“
“
40
“
“
“
“
“
“
“
“
“
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
2.4
“
“
“
-0.7
“
“
“
“
“
“
“
“
“
MIL-M-38510/14E
42
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3006
“
“
“
3007
“
“
“
1
2Y
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILSubgroup Symbol STD-883
method
1
3
7
IIH2
“
“
“
“
“
“
“
“
“
IOS
“
“
“
3010
“
“
“
“
“
“
“
“
“
3011
“
“
“
3005
Test No.
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
1
2Y
2
2W
GND
GND
3
B
4
2C0
5.5 V
“
“
GND
GND
5.5 V
5.5 V
GND
“
“
“
“
“
“
GND
5.5 V
5.5 V
A
5
2C1
6
2C2
7
2C3
5.5 V
5.5 V
5.5 V
5.5 V
GND
“
“
GND
“
“
GND
“
“
8
GND
GND
“
“
“
“
“
“
“
“
“
“
“
“
“
“
9
1C3
10
1C2
55
H
L
“
56
L
H
“
B
A
1C1
5.5 V
5.5 V
GND
GND
GND
GND
“
43
“
57
H
L
“
“
“
58
L
H
A
B
A
1C0
13
A
14
1W
15
1Y
5.5 V 5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
GND GND
“
GND 5.5 V
“
“
“
GND 5.5 V
“
5.5 V
“
“
12
5.5 V
GND GND
ICC
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
Truth
54
L 2/
H
B 1/
B
GND
TC = 25°C table
“
test
11
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
B
B
H
L
B
L
H
“
A
H
L
“
A
L
H
“
B
H
L
“
A
B
A
Test limits
Meas.
terminal
Min
A
B
1C0
1C1
1C2
1C3
2C0
2C1
2C2
2C3
1W
1Y
2W
2Y
-20
“
“
“
VCC
Max
Unit
100
“
“
“
“
“
“
“
“
“
-120
“
“
“
45
ns
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
4.5 V
“
“
59
H
L
“
B
L
H
“
“
“
60
L
H
“
B
“
B
A
H
L
“
“
“
61
H
L
“
A
“
A
A
L
H
“
8
“
GND
VCC
A
B
“
GND
16
MIL-M-38510/14E
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
2
Cases E, F
2/
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
9
tPHL1
“
TC = 25°C
“
“
3003
62
GND
GND
(Fig 5)
63
GND
“
“
64
5.0 V
“
5.0 V
“
“
“
“
65
“
“
“
66
OUT
GND
“
“
“
67
“
GND
“
“
“
68
“
5.0 V
“
“
“
69
“
5.0 V
See note at end of device type 04.
IN
IN
IN
IN
IN
IN
IN
IN
GND
OUT
5.0 V
1C0 to 1Y
3
29
ns
5.0 V
“
“
1C1 to 1Y
“
“
“
GND
“
“
1C2 to 1Y
“
“
“
5.0 V
“
“
1C3 to 1Y
“
“
“
“
GND
“
2C0 to 2Y
“
“
“
“
5.0 V
“
2C1 to 2Y
“
“
“
“
GND
“
2C2 to 2Y
“
“
“
“
5.0 V
“
2C3 to 2Y
“
“
“
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
2Y
2W
B
2C0
2C1
2C2
2C3
GND
1C3
1C2
1C1
1C0
A
1W
1Y
VCC
IN
GND
70
GND
GND
(Fig 5)
71
GND
“
“
“
72
5.0 V
“
“
“
“
73
5.0 V
“
“
“
“
74
OUT
GND
“
“
“
75
“
GND
“
“
“
76
“
5.0 V
“
“
“
77
“
5.0 V
“
“
78
GND
“
“
tPHL2
“
“
79
GND
“
“
“
“
80
5.0 V
“
“
“
“
81
5.0 V
“
“
“
“
82
OUT
GND
“
“
“
83
“
GND
“
“
“
84
“
5.0 V
“
“
“
85
“
5.0 V
“
tPLH2
“
“
86
“
87
GND
“
“
“
88
5.0 V
“
“
“
“
89
5.0 V
“
“
“
“
90
OUT
GND
“
“
“
91
“
GND
“
“
“
92
“
5.0 V
“
“
“
93
“
"
"
94
"
tPHL3
“
"
95
“
“
“
96
“
“
“
97
“
“
98
“
tPLH3
“
“
99
“
“
“
100
“
“
“
101
“
“
102
“
tPHL4
“
“
103
“
“
“
104
“
“
“
105
TC = 25°C
“
“
“
IN
IN
IN
IN
IN
IN
IN
IN
GND
44
OUT
“
GND
“
“
1C2 to 1Y
“
“
“
5.0 V
“
“
1C3 to 1Y
“
“
“
“
GND
“
2C0 to 2Y
“
“
“
“
5.0 V
“
2C1 to 2Y
“
“
“
“
GND
“
2C2 to 2Y
“
“
“
“
5.0 V
“
2C3 to 2Y
“
“
“
IN
IN
IN
IN
GND
OUT
“
1C0 to 1W
“
18
“
5.0 V
“
“
1C1 to 1W
“
“
“
GND
“
“
1C2 to 1W
“
“
“
5.0 V
“
“
1C3 to 1W
“
“
“
“
GND
“
2C0 to 2W
“
“
“
“
5.0 V
“
2C1 to 2W
“
“
“
“
GND
“
2C2 to 2W
“
“
“
“
5.0 V
“
2C3 to 2W
“
“
“
1C0 to 1W
“
17
“
“
IN
IN
IN
IN
GND
OUT
5.0 V
“
“
1C1 to 1W
“
“
“
GND
“
“
1C2 to 1W
“
“
“
5.0 V
“
“
1C3 to 1W
“
“
“
“
“
“
“
5.0 V
“
2C1 to 2W
“
“
“
“
GND
“
2C2 to 2W
“
“
“
5.0 V
“
5.0 V
“
“
“
“
GND
"
"
2C3 to 2W
A to 1Y
6
37
ns
IN
IN
GND
5.0 V
IN
GND
5.0 V
GND
5.0 V
GND
GND
IN
GND
GND
“
5.0 V
5.0 V
GND
5.0 V
GND
IN
GND
GND
“
5.0 V
“
“
A to 2Y
“
“
“
OUT
“
B to 1Y
“
“
“
“
B to 2Y
“
“
“
OUT
“
A to 1Y
“
37
“
“
A to 2Y
“
“
“
OUT
“
B to 1Y
“
“
“
IN
5.0 V
“
“
GND
GND
OUT
GND
5.0 V
“
GND
IN
“
“
GND
GND
IN
5.0 V
“
IN
IN
5.0 V
“
GND
GND
IN
“
IN
See note at end of device type 04.
“
2C0 to 2W
GND
OUT
ns
“
“
IN
OUT
IN
Unit
29
GND
IN
GND
OUT
IN
“
IN
OUT
5.0 V
Max
3
“
GND
OUT
IN
OUT 5.0 V 1C0 to 1Y
“
“
1C1 to 1Y
Test limits
Min
OUT
IN
5.0 V
GND
OUT
“
B to 2Y
“
“
“
“
A to 1W
“
28
“
“
A to 2W
“
“
“
“
B to 1W
“
“
“
“
B to 2W
“
“
“
MIL-M-38510/14E
tPLH1
“
3003
Meas.
terminal
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
method Test No.
9
TC = 25°C
“
“
tPLH4
“
3003
106
(Fig 5)
107
“
“
108
“
“
109
“
110
10
tPHL1
“
TC = 125°C
“
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
2Y
2W
B
2C0
2C1
2C2
2C3
GND
1C3
1C2
1C1
1C0
A
1W
1Y
VCC
Meas.
terminal
Min
Max
Unit
5.0 V
GND
IN
OUT
5.0 V
A to 1W
6
26
ns
“
A to 2W
“
“
“
“
B to 1W
“
“
“
GND
OUT
GND
GND
GND
5.0 V
“
IN
OUT
IN
“
GND
5.0 V
5.0 V
GND
GND
“
B to 2W
“
“
“
IN
GND
OUT
“
1C0 to 1Y
3
41
“
5.0 V
“
“
1C1 to 1Y
“
“
“
GND
“
“
1C2 to 1Y
“
“
“
5.0 V
“
“
1C3 to 1Y
“
“
“
“
GND
“
111
GND
“
112
5.0 V
“
5.0 V
“
45
“
“
113
“
“
“
114
OUT
GND
“
“
“
115
“
GND
“
“
“
116
“
5.0 V
“
“
“
117
“
5.0 V
“
“
118
GND
“
“
tPLH1
“
“
119
GND
“
“
“
“
120
5.0 V
“
“
“
“
“
121
5.0 V
“
“
“
122
OUT
GND
“
“
“
123
“
GND
“
“
“
124
“
5.0 V
“
5.0 V
IN
IN
IN
IN
IN
IN
IN
IN
GND
“
2C0 to 2Y
“
“
“
“
5.0 V
“
2C1 to 2Y
“
“
“
“
GND
“
2C2 to 2Y
“
“
“
“
5.0 V
“
2C3 to 2Y
“
“
“
39
“
5.0 V
“
“
1C1 to 1Y
“
“
“
GND
“
“
1C2 to 1Y
“
“
“
5.0 V
“
“
1C3 to 1Y
“
“
“
“
“
5.0 V
“
2C1 to 2Y
“
“
“
GND
“
2C2 to 2Y
“
“
“
“
“
125
GND
“
“
“
127
GND
“
“
“
“
128
5.0 V
“
“
“
“
129
5.0 V
“
“
“
“
130
OUT
GND
“
“
“
131
“
GND
“
“
“
132
“
5.0 V
“
“
“
133
“
5.0 V
“
“
134
GND
“
“
tPLH2
“
“
135
GND
“
“
“
“
136
5.0 V
“
“
“
“
137
5.0 V
“
“
“
“
138
OUT
GND
“
“
“
139
“
GND
“
“
“
140
“
5.0 V
“
“
“
141
“
5.0 V
IN
“
“
126
IN
1C0 to 1Y
“
“
IN
“
2C0 to 2Y
“
IN
IN
IN
OUT
“
“
IN
IN
GND
GND
tPHL2
“
IN
IN
“
“
IN
IN
“
“
IN
IN
IN
“
“
2C3 to 2Y
“
“
GND
OUT
“
1C0 to 1W
“
25
“
5.0 V
“
“
1C1 to 1W
“
“
“
5.0 V
IN
IN
IN
IN
GND
“
“
1C2 to 1W
“
“
“
5.0 V
“
“
1C3 to 1W
“
“
“
“
GND
“
2C0 to 2W
“
“
“
“
5.0 V
“
2C1 to 2W
“
“
“
“
GND
“
2C2 to 2W
“
“
“
“
5.0 V
“
2C3 to 2W
“
“
“
IN
IN
IN
IN
GND
OUT
“
1C0 to 1W
“
24
“
5.0 V
“
“
1C1 to 1W
“
“
“
GND
“
“
1C2 to 1W
“
“
“
5.0 V
“
“
1C3 to 1W
“
“
“
“
GND
“
2C0 to 2W
“
“
“
“
5.0 V
“
2C1 to 2W
“
“
“
“
GND
“
2C2 to 2W
“
“
“
“
5.0 V
“
2C3 to 2W
“
“
“
MIL-M-38510/14E
“
OUT
GND
“
“
See note at end of device type 04.
IN
Test limits
TABLE III. Group A inspection for device type 04 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
method Test No.
10
tPHL3
“
3003
142
(Fig 5)
143
“
“
144
“
“
“
145
“
“
146
“
tPLH3
“
“
147
“
“
“
148
“
“
“
149
“
tPHL4
“
“
150
“
151
TC = 125°C
“
“
“
“
“
152
“
“
“
153
“
tPLH4
“
“
154
“
155
“
“
“
156
“
“
“
157
11
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
2W
B
2C0
2C1
2C2
2C3
GND
1C3
1C2
1C1
1C0
A
1W
1Y
VCC
Meas.
terminal
Min
Max
Unit
5.0 V
GND
IN
OUT
5.0 V
A to 1Y
6
51
ns
“
A to 2Y
“
“
“
“
B to 1Y
“
“
“
“
B to 2Y
“
“
“
“
A to 1Y
“
“
“
“
A to 2Y
“
“
“
“
B to 1Y
“
“
“
“
B to 2Y
“
“
“
GND
OUT
GND
GND
GND
5.0 V
“
IN
OUT
IN
“
GND
5.0 V
GND
OUT
GND
IN
GND
5.0 V
GND
GND
5.0 V
IN
5.0 V
GND
OUT
GND
5.0 V
IN
5.0 V
5.0 V
Same tests, terminal conditions and limits as subgroup 10, except TC = -55°C.
1/ A = 3.0 V minimum, B = 0.0 V or GND.
2/ H > 1.5 V; L < 1.5 V.
Only attributes data is required for subgroups 7 and 8.
GND
“
OUT
IN
OUT
IN
5.0 V
GND
“
“
GND
GND
GND
OUT
GND
5.0 V
GND
“
IN
OUT
GND
OUT
GND
“
GND
OUT
IN
5.0 V
“
“
GND
IN
“
IN
OUT
GND
“
5.0 V
GND
GND
5.0 V
“
GND
GND
“
“
GND
OUT
5.0 V
“
IN
OUT
IN
IN
OUT
IN
5.0 V
GND
GND
GND
OUT
Test limits
“
A to 1W
“
39
“
“
A to 2W
“
“
“
“
B to 1W
“
“
“
“
B to 2W
“
“
“
“
A to 1W
“
34
“
“
A to 2W
“
“
“
B to 1W
“
“
“
“
“
B to 2W
“
“
“
MIL-M-38510/14E
“
1
2Y
46
TABLE III. Group A inspection for device type 05.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
1
TC = 25°C
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A
1B0
1B1
1Y
2B0
2B1
2Y
GND
4Y
4B1
4B0
3Y
3B1
3B0
G
VCC
Meas.
terminal
Min
GND
0.8 V
4.5 V
1Y
2.4
“
“
“
2Y
“
“
“
“
3Y
“
“
“
“
4Y
“
2.0 V
“
1Y
VOH
“
3006
1
2.0 V
“
2
“
“
“
3
“
“
“
“
4
“
3007
5
“
VOL
“
“
6
“
“
“
7
“
“
“
8
“
“
VIC
“
10
“
“
11
“
“
12
“
“
13
“
“
14
9
2.0 V -.8 mA
“
“
16 mA
-.8 mA 2.0 V
-.8 mA 2.0 V
“
16 mA
“
“
“
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
16 mA
“
2Y
“
“
3Y
“
“
“
“
4Y
“
“
“
A
-1.5
“
“
“
1B0
“
“
“
“
1B1
“
“
“
2B0
“
“
“
“
“
2B1
“
“
“
4B1
“
“
-12 mA
47
“
15
“
16
“
“
“
“
17
“
“
18
“
-12 mA
“
3009
19
“
“
IIL
“
“
20
0.4 V
“
“
“
21
GND
“
4B0
“
“
“
3B1
“
“
“
“
“
“
3B0
G
0.4 V
5.5 V
G
“
GND
“
A
“
“
“
“
“
“
1B0
“
“
“
“
“
“
1B1
“
“
“
“
“
“
2B0
“
“
“
“
“
“
2B1
“
“
“
“
“
4B1
“
“
“
“
“
“
22
5.5 V
“
“
“
23
GND
“
“
“
24
5.5 V
“
“
“
25
5.5 V
“
“
“
26
GND
“
“
“
“
27
5.5 V
“
“
“
“
28
GND
“
“
3010
29
“
IIH1
“
“
30
2.4 V
“
“
“
31
5.5 V
“
“
“
32
GND
“
“
“
33
5.5 V
“
“
“
34
GND
“
“
“
35
GND
“
0.4 V
“
2.4 V
2.4 V
2.4 V
2.4 V
-12 mA
-12 mA
-12 mA
0.4 V
0.4 V
-0.7
“
“
-1.6
mA
“
“
4B0
“
“
“
“
“
3B1
“
“
“
“
“
“
“
“
“
2.4 V
“
3B0
G
40
µA
“
5.5 V
“
A
“
“
“
“
“
1B0
“
“
0.4 V
0.4 V
“
“
“
1B1
“
“
“
“
“
2B0
“
“
“
“
“
2B1
“
“
“
“
4B1
“
“
“
“
4B0
“
“
“
“
3B1
“
“
“
“
3B0
“
“
“
“
“
36
5.5 V
“
“
“
“
37
GND
“
“
“
“
38
5.5 V
“
See notes at end of device type 05.
“
“
“
0.4 V
“
0.4
“
“
0.4 V
V
“
“
0.4 V
Unit
“
“
16 mA
Max
2.4 V
2.4 V
2.4 V
2.4 V
MIL-M-38510/14E
“
2.0 V -.8 mA
Test limits
TABLE III. Group A inspection for device type 05 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A
1B0
1B1
1Y
2B0
2B1
2Y
GND
4Y
4B1
4B0
3Y
3B1
3B0
G
VCC
Meas.
terminal
Max
Unit
GND
5.5 V
5.5 V
G
100
µA
“
“
“
A
“
“
“
“
“
1B0
“
“
IIH2
“
3010
39
“
40
5.5 V
“
“
41
5.5 V
“
“
“
42
GND
“
“
“
43
5.5 V
“
“
“
44
GND
“
“
“
45
GND
“
1
TC = 25°C
“
5.5 V
5.5 V
5.5 V
5.5 V
“
1B1
“
“
“
2B0
“
“
“
“
“
2B1
“
“
“
“
4B1
“
“
“
“
4B0
“
“
“
“
3B1
“
“
“
“
“
“
GND
“
3B0
1Y
-20
-120
“
“
2Y
“
“
mA
“
“
“
4Y
“
“
“
“
“
“
50
“
ns
“
“
46
5.5 V
“
“
“
47
GND
“
“
“
“
48
5.5 V
“
“
3011
49
5.5 V
“
IOS
“
“
50
“
“
“
“
51
“
“
“
“
“
52
“
“
“
ICC
3005
53
GND
5.5 V
GND
GND
5.5 V
5.5 V
5.5 V
“
5.5 V
GND
5.5 V
GND
5.5 V
GND
GND
“
GND
5.5 V
5.5 V
GND
“
GND
GND
5.5 V
5.5 V
“
“
3Y
GND
GND
GND
“
VCC
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
7
Truth
54
L
GND
L
A
4.5 V
TC = 25°C
“
table
55
A 1/
B
L
B
L
“
L
B
L
B
B
“
test
56
A
A
H
A
H
“
H
A
H
A
“
“
“
“
57
B
B
L
B
L
“
L
B
L
B
“
“
“
58
B
A
H
A
H
“
H
A
H
A
“
“
GND
GND
5.0 V
A to 1Y
6
30
“
“
“
A to 2Y
“
“
“
“
“
A to 3Y
“
“
“
“
L 2/
8
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
9
tPHL1
“
3003
59
IN
(Fig 6)
60
“
“
“
61
“
“
“
“
62
“
“
“
63
“
“
tPLH1
“
“
64
“
“
“
“
65
“
“
“
“
“
66
“
“
TC = 25°C
“
GND
5.0 V
OUT
GND
5.0 V
OUT
L
“
“
GND
See notes at end of device type 05.
5.0 V
OUT
OUT
OUT
5.0 V
5.0 V
GND
GND
“
GND
5.0 V
OUT
“
OUT
OUT
5.0 V
GND
5.0 V
GND
2/
“
“
A to 4Y
“
“
“
“
“
A to 1Y
“
27
“
“
“
A to 2Y
“
“
“
“
“
A to 3Y
“
“
“
“
“
A to 4Y
“
“
“
MIL-M-38510/14E
“
“
“
2
48
“
“
“
5.5 V
Test limits
Min
TABLE III. Group A inspection for device type 05 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A
1B0
1B1
1Y
2B0
2B1
2Y
GND
4Y
4B1
4B0
3Y
3B1
3B0
G
VCC
Meas.
terminal
Min
Max
Unit
5.0 V
OUT
GND
IN
5.0 V
G to 1Y
3
28
ns
“
“
“
G to 2Y
“
“
“
“
“
G to 3Y
“
“
“
“
“
G to 4Y
“
“
“
“
“
“
G to 1Y
“
23
“
“
“
“
G to 2Y
“
“
“
“
“
G to 3Y
“
“
“
67
5.0 V
(Fig 6)
68
“
“
“
69
“
“
“
“
“
70
“
“
“
tPLH2
“
“
71
“
“
“
72
“
“
“
“
73
“
“
“
“
74
“
“
“
75
GND
“
tPHL3
“
“
76
5.0 V
“
“
“
77
GND
“
“
“
78
5.0 V
“
“
“
79
GND
“
OUT
“
“
“
80
5.0 V
“
OUT
“
“
“
81
GND
“
OUT
“
“
“
82
5.0 V
“
OUT
“
tPLH3
“
“
83
GND
“
84
5.0 V
“
“
“
“
85
GND
“
“
86
5.0 V
“
“
“
87
GND
“
OUT
“
“
“
88
5.0 V
“
OUT
“
“
“
89
GND
“
OUT
“
“
“
90
5.0 V
“
OUT
3003
91
IN
(Fig 6)
92
“
“
93
“
TC = 25°C
“
“
49
10
tPHL1
“
TC = 125°C
“
“
5.0 V
5.0 V
OUT
OUT
5.0 V
OUT
OUT
OUT
5.0 V
“
“
IN
OUT
IN
IN
IN
IN
5.0 V
“
G to 4Y
“
“
“
GND
“
1B0 to 1Y
“
20
“
“
“
“
1B1 to 1Y
“
“
“
“
“
“
2B0 to 2Y
“
“
“
OUT
“
“
“
2B1 to 2Y
“
“
“
“
“
3B0 to 3Y
“
“
“
“
“
3B1 to 3Y
“
“
“
“
“
4B0 to 4Y
“
“
“
“
“
4B1 to 4Y
“
“
“
IN
IN
“
1B0 to 1Y
“
20
OUT
“
“
“
1B1 to 1Y
“
“
“
“
OUT
“
“
“
2B0 to 2Y
“
“
“
OUT
“
“
“
2B1 to 2Y
“
“
“
“
“
3B0 to 3Y
“
“
“
“
“
3B1 to 3Y
“
“
“
“
“
4B0 to 4Y
“
“
“
“
“
“
“
“
“
“
“
4B1 to 4Y
A to1Y
6
49
“
“
“
“
A to 2Y
“
“
“
“
“
A to 3Y
“
“
“
“
“
A to 4Y
“
“
“
“
“
A to1Y
“
41
“
OUT
5.0 V
OUT
“
“
“
94
“
“
“
95
“
“
tPLH1
“
“
“
96
“
“
“
“
97
“
“
“
“
98
“
“
“
99
5.0 V
“
tPHL2
“
“
100
“
“
“
“
101
“
“
“
“
“
102
“
“
See notes at end of device type 05.
OUT
5.0 V
5.0 V
GND
GND
“
GND
5.0 V
OUT
“
“
“
5.0 V
IN
IN
OUT
OUT
IN
IN
“
5.0 V
IN
“
GND
GND
IN
“
IN
5.0 V
“
“
OUT
IN
GND
5.0 V
OUT
OUT
IN
OUT
OUT
5.0 V
OUT
OUT
OUT
5.0 V
5.0 V
GND
“
5.0 V
OUT
“
OUT
OUT
5.0 V
5.0 V
GND
“
“
A to 2Y
“
“
“
“
“
A to 3Y
“
“
“
“
“
A to 4Y
“
“
“
IN
“
G to 1Y
3
39
“
“
“
G to 2Y
“
“
“
“
“
G to 3Y
“
“
“
“
“
G to 4Y
“
“
“
MIL-M-38510/14E
tPHL2
"
3003
Test limits
TABLE III. Group A inspection for device type 05 – Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MIL- Cases E, F
Subgroup Symbol STD-883
method Test No.
10
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A
1B0
1B1
1Y
2B0
2B1
2Y
GND
4Y
4B1
4B0
3Y
3B1
3B0
G
VCC
Meas.
terminal
Min
Max
Unit
5.0 V
OUT
GND
IN
5.0 V
G to 1Y
3
33
ns
“
“
“
G to 2Y
“
“
“
“
“
G to 3Y
“
“
“
103
5.0 V
(Fig 6)
104
“
“
“
105
“
“
“
“
106
“
“
“
107
GND
“
tPHL3
“
“
108
5.0 V
“
“
“
109
GND
“
“
“
110
5.0 V
“
“
“
111
GND
“
OUT
“
“
“
112
5.0 V
“
OUT
“
“
“
113
GND
“
OUT
“
“
“
114
5.0 V
“
OUT
"
"
115
GND
"
tPLH3
“
"
116
5.0 V
“
“
“
117
GND
TC = 125°C
“
5.0 V
OUT
“
“
IN
OUT
IN
IN
IN
“
G to 4Y
“
“
“
GND
“
1B0 to 1Y
“
25
“
“
“
1B1 to 1Y
“
“
“
“
“
2B0 to 2Y
“
“
“
OUT
“
“
“
2B1 to 2Y
“
“
“
“
“
3B0 to 3Y
“
“
“
“
“
3B1 to 3Y
“
“
“
“
“
4B0 to 4Y
“
“
“
“
“
4B1 to 4Y
“
“
“
"
"
"
1B0 to 1Y
"
35
"
“
“
“
1B1 to 1Y
“
“
“
“
“
2B0 to 2Y
“
“
“
“
“
“
2B1 to 2Y
“
“
“
“
“
3B0 to 3Y
“
“
“
“
“
3B1 to 3Y
“
“
“
“
“
4B0 to 4Y
“
“
“
“
“
4B1 to 4Y
“
“
“
OUT
IN
5.0 V
“
OUT
IN
“
“
“
OUT
IN
OUT
IN
IN
50
“
“
118
5.0 V
“
“
“
119
GND
“
OUT
“
“
“
120
5.0 V
“
OUT
“
“
“
121
GND
“
OUT
“
11
“
“
122
5.0 V
“
OUT
1/ A = 3.0 V minimum, B = 0.0 V or GND.
2/ H > 1.5 V; L < 1.5 V.
Only attributes data is required for subgroups 7 and 8.
OUT
IN
IN
“
Same tests, terminal conditions and limits as subgroup 10, except TC = -55°C.
5.0 V
OUT
OUT
IN
OUT
“
IN
IN
IN
IN
MIL-M-38510/14E
tPLH2
“
3003
Test limits
TABLE III. Group A inspection for device type 06.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
1
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
VOH
VOH
VOL
VOL
VIC
“
“
“
“
“
“
“
“
“
“
“
IIL
“
“
“
“
“
“
“
“
“
“
“
IIH1
“
“
“
“
“
“
“
“
“
“
“
3009
“
“
“
“
“
“
“
“
“
“
“
3010
“
“
“
“
“
“
“
“
“
“
“
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
2
3
4
5
6
7
8
9
10
11
12
13
14
15
D2
D1
D0
Y
W
G
GND
C
B
A
D7
D6
D5
D4
0.8 V
2.0 V
2.0 V
0.8 V
0.8 V
2.0 V
2.0 V
0.8 V
2.0 V -0.8 mA
2.0 V
-12 mA
-12 mA
-12 mA
-12 mA
0.4 V
0.4 V
0.4 V
0.4 V
2.4 V
2.4 V
2.4 V
2.4 V
See note at end of device type 06.
0.8 V
-0.8 mA 2.0 V
16 mA
2.0 V
16 mA 0.8 V
GND 0.8 V
“
2.0 V
2.0 V
“
“
0.8 V
“
“
“
“
“
“
“
“
-12 mA
“
“
“
“
-12 mA
0.4 V
“
5.5 V
GND
“
5.5 V
“
“
5.5 V
“
“
0.4 V
“
“
GND
“
“
“
“
“
“
“
“
“
“
“
5.5 V
“
“
“
“
“
“
“
“
“
GND
2.4 V
“
5.5 V
“
GND
“
“
GND
“
“
2.4 V
“
“
5.5 V
“
“
“
“
“
“
“
“
“
“
“
GND
“
“
“
“
“
“
“
“
“
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
-12 mA
5.5 V
5.5 V
0.4 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
2.4 V
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
“
5.5 V
0.4 V
5.5 V
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
2.4 V
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
0.4 V
0.4 V
0.4 V
0.4 V
2.4 V
2.4 V
2.4 V
2.4 V
16
Test limits
VCC
Max
Meas.
terminal Min
4.5 V
Y
2.4
“
W
2.4
“
Y
“
W
“
D0
“
D1
“
D2
“
D3
“
D4
“
D5
“
D6
“
D7
“
G
“
A
“
B
“
C
5.5 V
G
-0.7
“
A
“
“
B
“
“
C
“
“
“
D0
“
“
D1
“
“
D2
“
“
D3
“
“
D4
“
“
D5
“
“
D6
“
“
D7
“
G
“
A
“
B
“
C
“
D0
“
D1
“
D2
“
D3
“
D4
“
D5
“
D6
“
D7
0.4
0.4
-1.5
“
“
“
“
“
“
“
“
“
“
“
-1.6
“
“
“
“
“
“
“
“
“
“
“
40
“
“
“
“
“
“
“
“
“
“
“
Unit
V
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
mA
“
“
“
“
“
“
“
“
“
“
“
µA
“
“
“
“
“
“
“
“
“
“
“
MIL-M-38510/14E
51
TC = 25°C
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
“
3006
3006
3007
3007
1
D3
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
Subgroup
1
MILCases E, F
Symbol STD-883
Test No.
method
41
42
43
44
45
46
47
48
49
50
51
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
D3
D2
D1
D0
Y
W
G
GND
C
B
A
D7
D6
D5
D4
5.5 V
“
“
“
“
“
“
“
“
“
"
GND
“
“
“
“
“
“
“
“
“
"
GND
“
“
5.5 V
“
“
“
“
GND
"
"
GND
GND
5.5 V
GND
5.5 V
5.5 V
GND
GND
5.5 V
5.5 V
GND
GND
5.5 V
GND
GND
5.5 V
GND
5.5 V
GND
5.5 V
GND
5.5 V
"
“
“
“
GND
5.5 V
“
D7
"
"
"
“
“
“
“
GND
GND
GND
GND
“
W
-20
-55
mA
GND
“
“
“
“
"
"
"
"
“
Y
-20
-55
mA
GND
“
“
“
“
"
"
"
"
“
VCC
48
mA
TC = 25°C
“
“
“
“
“
“
“
“
"
IIH2
“
“
“
“
“
“
“
“
“
"
3010
“
“
“
“
“
“
“
“
“
"
"
"
"
52
“
3011
53
GND
GND
GND
GND
“
IOS
IOS
3011
54
"
"
"
5.5 V
“
ICC
3005
55
"
"
"
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
GND
GND
Same tests, terminal conditions and limits as subgroup 1, except TC = 125°C and VIC tests are omitted.
3
Same tests, terminal conditions and limits as subgroup 1, except TC = -55°C and VIC tests are omitted.
Truth
56
1/
L 2/
H
A
GND
7
5.5 V
Test limits
Max
Unit
100
“
“
“
“
“
“
“
“
“
"
µA
“
“
“
“
“
“
“
“
“
"
Meas.
terminal Min
5.5 V
G
“
A
“
B
“
C
“
D0
“
D1
“
D2
“
D3
“
D4
“
D5
"
D6
4.5 V
52
TC = 25°C
“
table
57
B
L
H
B
“
B
B
B
“
test
58
A
H
L
“
“
“
“
B
“
“
“
59
B
L
H
“
“
“
“
A
“
“
“
60
A
H
L
“
“
“
“
A
“
“
“
61
B
L
H
“
“
“
A
B
“
“
“
62
A
H
L
“
“
“
“
B
“
“
“
63
B
L
H
“
“
“
“
A
“
“
“
64
A
H
L
“
“
“
“
A
“
“
65
L
H
“
“
A
B
B
“
“
66
H
L
“
“
“
“
B
“
“
67
L
H
“
“
“
“
A
B
“
“
“
68
H
L
“
“
“
“
A
A
“
“
“
69
L
H
“
“
“
A
B
B
“
“
“
70
H
L
“
“
“
“
B
A
“
“
“
71
L
H
“
“
“
“
A
B
“
“
“
72
H
L
“
“
“
“
A
A
“
8
Repeat subgroup 7 at TC = 125°C and TC = -55°C.
See notes at end of device type 06.
MIL-M-38510/14E
2
5.5 V
5.5 V
16
VCC
“
B
“
A
“
2/
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
D3
D2
D1
D0
Y
W
G
GND
C
B
A
D7
D6
D5
D4
VCC
Meas.
terminal Min
Max
Unit
5.0 V
GND
OUT
GND
GND
GND
GND
IN
5.0 V
A to W
6
32
ns
“
“
“
“
GND
IN
GND
“
B to W
“
“
“
“
“
“
“
IN
GND
GND
“
C to W
“
“
“
“
“
“
“
GND
GND
IN
“
A to W
“
29
“
“
“
“
“
GND
IN
GND
“
B to W
“
“
“
“
“
“
“
IN
GND
GND
“
C to W
“
“
“
73
(Fig 4)
74
“
“
75
“
76
“
tPLH1
“
“
77
“
“
“
78
“
tPHL2
“
“
79
“
80
“
“
“
81
“
“
82
“
tPLH2
“
“
83
“
“
“
84
“
tPHL3
tPLH3
“
85
5.0 V
“
86
“
tPHL4
tPLH4
“
87
“
OUT
“
88
“
OUT
“
89
IN
“
tPHL5
“
“
90
“
“
“
91
“
“
“
92
"
"
93
"
tPHL5
“
"
94
“
“
“
“
“
“
95
“
“
“
“
“
“
96
“
“
“
“
“
97
“
“
“
tPLH5
“
“
98
“
“
“
“
99
“
“
“
100
“
“
“
“
“
“
“
TC = 25°C
“
“
“
“
“
“
“
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
5.0 V
“
OUT
“
“
GND
GND
IN
“
A to Y
8
40
“
“
“
“
“
GND
IN
GND
“
B to Y
“
“
“
“
C to Y
“
“
“
“
A to Y
“
39
“
53
“
“
“
“
IN
GND
GND
“
“
“
“
GND
GND
IN
“
“
“
“
GND
IN
GND
“
“
“
“
IN
GND
“
OUT
IN
“
GND
“
OUT
“
“
“
“
“
“
“
“
OUT
GND
“
“
5.0 V
“
B to Y
“
“
“
“
C to Y
“
“
“
“
G to W
6
28
“
“
“
“
“
G to W
6
26
“
“
“
“
G to Y
8
37
“
“
“
“
“
G to Y
8
35
“
“
“
“
“
“
D0 to W
3
20
“
“
“
“
“
5.0 V
“
D1 to W
“
“
“
“
“
“
5.0 V
GND
“
D2 to W
“
“
“
“
“
“
“
5.0 V
5.0 V
“
D3 to W
“
“
“
OUT
GND
"
5.0 V
GND
GND
"
"
"
"
“
GND
5.0 V
“
D4 to W
D5 to W
“
“
“
“
5.0 V
GND
“
D6 to W
“
“
“
“
5.0 V
5.0 V
“
D7 to W
“
“
“
“
GND
GND
GND
“
“
17
“
“
“
“
GND
5.0 V
“
D0 to W
D1 to W
“
“
“
“
“
“
“
5.0 V
GND
“
D2 to W
“
“
“
“
“
“
“
5.0 V
5.0 V
“
D3 to W
“
“
“
101
“
“
“
5.0 V
GND
GND
“
D4 to W
“
“
“
“
102
“
“
“
“
GND
5.0 V
“
D5 to W
“
“
“
“
“
103
“
“
“
“
5.0 V
GND
“
D6 to W
“
“
“
“
“
104
“
“
“
“
5.0 V
5.0 V
“
D7 to W
“
“
“
See notes at end of device type 06.
5.0 V
5.0 V
IN
IN
IN
IN
IN
IN
IN
5.0 V
IN
IN
IN
IN
IN
IN
IN
IN
MIL-M-38510/14E
tPHL1
“
3003
Test limits
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
D3
D2
D1
D0
Y
W
G
GND
C
B
A
D7
D6
D5
D4
VCC
IN
OUT
GND
GND
GND
GND
GND
5.0 V
“
“
“
“
GND
5.0 V
“
“
“
“
“
5.0 V
GND
“
“
“
“
5.0 V
5.0 V
Max
Unit
D0 to Y
D1 to Y
29
ns
“
“
“
“
D2 to Y
“
“
“
“
D3 to Y
“
“
“
“
D4 to Y
“
“
“
“
D5 to Y
“
“
“
“
D6 to Y
“
“
“
“
D7 to Y
“
“
“
GND
“
“
33
“
5.0 V
“
D0 to Y
D1 to Y
“
“
“
tPHL6
“
105
(Fig 4)
106
“
“
107
“
“
“
108
“
“
“
109
“
“
“
5.0 V
GND
GND
“
“
“
110
“
“
“
“
GND
5.0 V
“
“
“
111
“
“
“
“
5.0 V
GND
“
“
“
112
“
“
“
“
5.0 V
5.0 V
“
“
113
“
“
“
GND
GND
“
tPLH6
“
“
114
“
“
“
“
GND
“
“
“
115
“
“
“
“
5.0 V
GND
“
“
“
116
“
“
“
“
5.0 V
5.0 V
“
“
“
117
“
“
“
5.0 V
GND
GND
IN
IN
IN
IN
IN
IN
IN
“
“
118
“
“
“
“
GND
5.0 V
“
“
“
119
“
“
“
“
5.0 V
GND
“
“
“
120
“
“
“
“
5.0 V
5.0 V
“
121
“
122
“
123
54
tPHL1
“
TC = 125°C
“
“
“
5.0 V
5.0 V
IN
“
“
“
D3 to Y
“
“
“
D4 to Y
“
“
“
“
“
D5 to Y
“
“
“
“
D6 to Y
“
“
“
“
D7 to Y
“
“
“
“
IN
“
A to W
“
48
“
“
“
“
GND
IN
GND
“
B to W
“
“
“
“
“
“
“
IN
GND
GND
“
C to W
“
“
“
“
“
“
126
“
“
127
“
tPHL2
“
“
128
“
“
“
129
“
tPLH2
“
“
130
“
131
“
“
“
“
tPHL3
tPLH3
“
“
134
“
tPHL4
tPLH4
“
135
“
OUT
“
136
“
OUT
“
137
IN
“
tPHL5
“
“
138
“
“
“
139
“
“
“
140
“
IN
D2 to Y
GND
124
“
IN
“
“
GND
125
“
IN
“
“
“
IN
“
“
5.0 V
IN
OUT
tPLH1
“
“
5.0 V
IN
GND
“
5.0 V
IN
5.0 V
“
“
“
“
GND
GND
IN
“
A to W
“
43
“
“
“
“
“
GND
IN
GND
“
B to W
“
“
“
“
“
“
“
IN
GND
GND
“
C to W
“
“
“
5.0 V
“
OUT
“
“
GND
GND
IN
“
A to Y
8
60
“
“
“
“
“
GND
IN
GND
“
B to Y
“
“
“
“
“
“
“
IN
GND
GND
“
C to Y
“
“
“
“
“
“
“
GND
GND
IN
“
A to Y
“
58
“
“
“
“
“
GND
IN
GND
“
B to Y
“
“
“
132
“
“
133
5.0 V
5.0 V
5.0 V
5.0 V
IN
IN
IN
See notes at end of device type 06.
5.0 V
“
“
IN
GND
“
“
C to Y
“
“
“
OUT
IN
“
GND
“
“
“
G to W
6
38
“
OUT
“
“
“
“
“
“
G to W
6
35
“
“
“
“
“
“
“
G to Y
8
52
“
“
“
“
“
“
“
G to Y
8
52
“
GND
“
“
“
“
“
3
32
“
OUT
5.0 V
“
“
“
“
“
5.0 V
“
D0 to W
D1 to W
“
“
“
“
“
“
“
5.0 V
GND
“
D2 to W
“
“
“
“
“
“
“
5.0 V
5.0 V
“
D3 to W
“
“
“
MIL-M-38510/14E
“
10
Test limits
6
3003
TC = 25°C
“
Meas.
terminal Min
TABLE III. Group A inspection for device type 06 - Continued.
Terminal conditions (pins not designated may be H ≥ 2.0 V, or L ≤ 0.8 V, or open).
MILCases E, F
Subgroup Symbol STD-883
Test No.
method
10
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
D3
D2
D1
D0
Y
W
G
GND
C
B
A
D7
D6
D5
D4
VCC
IN
5.0 V D4 to W
“
D5 to W
“
D6 to W
141
OUT
GND
GND
5.0 V
GND
GND
(Fig 4)
142
“
“
“
“
GND
5.0 V
“
“
143
“
“
“
“
5.0 V
GND
“
“
“
144
“
“
“
“
5.0 V
5.0 V
“
“
145
“
“
“
GND
GND
“
tPLH5
“
“
146
“
“
“
“
GND
“
“
“
147
“
“
“
“
5.0 V
“
“
“
148
“
“
“
“
5.0 V
“
“
“
149
“
“
“
5.0 V
GND
GND
“
“
“
150
“
“
“
“
GND
5.0 V
“
“
“
151
“
“
“
“
5.0 V
GND
“
“
“
152
“
“
“
“
5.0 V
5.0 V
“
tPHL6
“
“
153
OUT
“
“
GND
GND
“
154
“
“
“
“
GND
“
“
“
“
155
“
“
“
“
5.0 V
GND
“
“
156
“
“
“
“
5.0 V
5.0 V
“
“
“
157
“
“
“
5.0 V
GND
GND
“
“
“
158
“
“
“
“
GND
5.0 V
“
“
“
159
“
“
“
“
5.0 V
GND
“
“
“
160
“
“
“
“
5.0 V
5.0 V
“
“
161
“
“
“
GND
GND
“
tPLH6
“
“
162
“
“
“
“
GND
“
“
“
163
“
“
“
“
5.0 V
“
“
“
164
“
“
“
“
5.0 V
“
“
“
165
“
“
“
5.0 V
GND
GND
“
“
“
166
“
“
“
“
GND
5.0 V
“
“
“
167
“
“
“
“
5.0 V
GND
“
“
“
168
“
“
“
“
5.0 V
5.0 V
TC = 125°C
“
“
55
11
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
IN
Same tests, terminal conditions and limits as subgroup 10, except TC = -55°C.
1/ A = 3.0 V minimum, B = 0.0 V or GND.
2/ H > 1.5 V; L < 1.5 V.
Only attributes data is required for subgroups 7 and 8.
IN
IN
Test limits
Max
Unit
3
32
ns
“
“
“
“
“
“
“
“
D7 to W
“
“
GND
“
“
26
“
5.0 V
“
D0 to W
D1 to W
“
“
“
GND
“
D2 to W
“
“
“
5.0 V
“
D3 to W
“
“
“
“
D4 to W
“
“
“
“
D5 to W
“
“
“
“
D6 to W
“
“
“
“
D7 to W
“
“
“
GND
“
6
44
“
5.0 V
“
D0 to Y
D1 to Y
“
“
“
IN
IN
IN
IN
IN
“
D2 to Y
“
“
“
“
D3 to Y
“
“
“
D4 to Y
“
“
“
“
“
D5 to Y
“
“
“
“
D6 to Y
“
“
“
“
D7 to Y
“
“
“
GND
“
“
36
“
5.0 V
“
D0 to Y
D1 to Y
“
“
“
GND
“
D2 to Y
“
“
“
5.0 V
“
D3 to Y
“
“
“
“
D4 to Y
“
“
“
“
D5 to Y
“
“
“
“
D6 to Y
“
“
“
“
D7 to Y
“
“
“
IN
IN
IN
IN
IN
IN
IN
IN
MIL-M-38510/14E
tPHL5
“
3003
Meas.
terminal Min
MIL-M-38510/14E
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the
contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel,
these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging
requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense
Agency, or within the military service's system command. Packaging data retrieval is available from the managing
Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the
responsible packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but it not mandatory)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a. Title, number, and date of the specification.
b. PIN and compliance identifier, if applicable (see 1.2).
c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device
inspection lot to be supplied with each shipment by the device manufacturer, if applicable.
d. Requirement for certificate of compliance, if applicable.
e. Requirements for notification of change of product or process to acquiring activity in addition to
notification to the qualifying activity, if applicable.
f. Requirements for failure analysis (including required test condition of method 5003), corrective action
and reporting of results, if applicable.
g. Requirements for product assurance options.
h. Requirements for carriers, special lead lengths or lead forming, if applicable. These requirements shall
not affect the part number. Unless otherwise specified, these requirements will not apply to direct
purchase by or direct shipment to the Government.
i. Requirements for "JAN" marking.
j. Packaging requirements (see 5.1).
6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which
are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not
such products have actually been so listed by that date. The attention of the contractors is called to these
requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal
Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for
the products covered by this specification. Information pertaining to qualification of products may be obtained from
DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199.
6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements
now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have
been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists.
56
MIL-M-38510/14E
6.5 Abbreviations, symbols and definitions. The abbreviations, symbols, and definitions used herein are defined
in MIL-PRF-38535 and MIL-HDBK-1331, and as follows:
GND .................................................. Ground zero voltage potential
VIN ..................................................... Voltage level at an input terminal
VIC ..................................................... Input clamp voltage
IIN ...................................................... Current-flowing into an input terminal
6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified,
microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material
and finish A (see 3.4). Longer lead lengths and lead forming shall not affect the part number.
6.7 Substitutability. The cross-reference information below is presented for the convenience of users.
Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry
microcircuit types may not have equivalent operational performance characteristics across military temperature
ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation
to case size. The presence of this information should not be deemed as permitting substitution of generic-industry
types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535.
Military
device type
Generic-industry
type
01
02
03
04
05
06
54150
9312
54153
9309
9322, 54157
54151
6.8 Manufacturers designation. Manufacturer circuits included in this specification are designated as shown in
table IV herein.
TABLE IV. Substitutability and manufacturers designator.
Device
Types
01
02
03
04
05
06
Motorola
Signetics
Fairchild
Texas
Instruments
National
A
B
C
D
E
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
57
Advanced
Micro
Device
F
X
X
X
MIL-M-38510/14E
6.9 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect
to the previous issue due to the extensiveness of the changes.
Custodians:
Army - CR
Navy - EC
Air Force - 11
DLA - CC
Preparing activity:
DLA - CC
(Project 5962-2103)
Review activities:
Army - MI, SM
Navy - AS, CG, MC, SH, TD
Air Force - 03, 19, 99
NOTE: The activities listed above were interested in this document as of the date of this document. Since
organizations and responsibilities can change, you should verify the currency of the information above using the
ASSIST Online database at http://assist.daps.dla.mil.
58