ETC STK14C88

STK14C88-M
32K x 8 AutoStore™ nvSRAM
QuantumTrap™ CMOS
Nonvolatile Static RAM
MIL-STD-883
FEATURES
DESCRIPTION
• Nonvolatile Storage without Battery Problems
The Simtek STK14C88-M is a fast static RAM with a
nonvolatile, electrically erasable PROM element
incorporated in each static memory cell. The SRAM
can be read and written an unlimited number of
times, while independent nonvolatile data resides in
EEPROM. Data transfers from the SRAM to the
EEPROM (the STORE operation) can take place automatically on power down. A 68µF or larger capacitor
tied from VCAP to ground guarantees the STORE
operation, regardless of power-down slew rate or
loss of power from “hot swapping”. Transfers from
the EEPROM to the SRAM (the RECALL operation)
take place automatically on restoration of power. Initiation of STORE and RECALL cycles can also be
software controlled by entering specific read
sequences. A hardware STORE may be initiated with
the HSB pin.
• 35ns and 45ns Access Times
• “Hands-off” Automatic STORE with External
68µF Capacitor on Power Down
• STORE to EEPROM Initiated by Hardware,
Software or AutoStore™ on Power Down
• RECALL to SRAM Initiated by Software or
Power Restore
• 10mA Typical ICC at 200ns Cycle Time
• Unlimited READ, WRITE and RECALL Cycles
• 100,000 STORE Cycles to EEPROM
• 10-Year Data Retention in EEPROM
• Single 5V + 10% Operation
• Not Sensitive to Power On/Off Ramp Rates
• No Data Loss from Undershoot
• 32-Pad LCC and 32-Pin 300 mil CDIP Packages
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
INPUT BUFFERS
COLUMN I/O
SOFTWARE
DETECT
A0 - A13
COLUMN DEC
A0 A1 A2 A3 A4 A10
G
E
W
April 1999
5-43
26
25
24
23
A 11
G
NC
A 10
A1
A0
11
12
22
21
E
DQ 7
DQ 0
DQ 1
13
14
20
19
DQ 6
DQ 5
DQ 2
V SS
15
16
18
17
DQ 4
DQ 3
2
32 31 30
29
3
1
W
7
8
9
10
V CCX
HSB
A4
A3
NC
A2
4
A
5
A
5
A
6
28
7
27
A
3
NC
A
2
A
8
26
11
23
A
0
DQ
12
22
6
4
32
LCC
9
10
1
0
25
24
13
21
14 15 16 17 18 19 20
6
A8
A9
5
28
27
A 14
V CAP
5
6
DQ
HSB
W
A 13
A6
A5
3
RECALL
V CCX
HSB
30
29
DQ
4
DQ
STATIC RAM
ARRAY
512 x 512
STORE/
RECALL
CONTROL
32
31
3
4
2
STORE
1
2
A 12
A7
VSS
DQ
POWER
CONTROL
VCAP
A 14
DQ
1
DQ
A5
A6
A7
A8
A9
A11
A12
A13
A14
ROW DECODER
EEPROM ARRAY
512 x 512
VCAP
A7
A 12
PIN CONFIGURATIONS
VCCX
32 300 mil DIP
BLOCK DIAGRAM
PIN NAMES
A0 - A14
Address Inputs
DQ0 -DQ7
Data In/Out
E
Chip Enable
W
Write Enable
G
Output Enable
HSB
Hardware Store Busy (I/O)
VCCX
Power (+ 5V)
VCAP
Capacitor
VSS
Ground
A
13
A
8
A
9
A
11
G
NC
A
10
E
DQ
7
STK14C88-M
ABSOLUTE MAXIMUM RATINGSa
Voltage on Input Relative to VSS . . . . . . . . . .–0.6V to (VCC + 0.5V)
Voltage on DQ0-7 or HSB . . . . . . . . . . . . . . . .–0.5V to (VCC + 0.5V)
Temperature under Bias. . . . . . . . . . . . . . . . . . . . . –55°C to 125°C
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1W
DC Output Current (1 output at a time, 1s duration) . . . . . . . 15mA
Note a: Stresses greater than those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device. This is a
stress rating only, and functional operation of the device at conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
(VCC = 5.0V ± 10%)e
DC CHARACTERISTICS
MILITARY
SYMBOL
PARAMETER
UNITS
MIN
NOTES
MAX
ICC1b
Average VCC Current
90
85
mA
mA
tAVAV = 35ns
tAVAV = 45ns
ICC2c
Average VCC Current during STORE
6
mA
All Inputs Don’t Care, VCC = max
ICC3b
Average VCC Current at tAVAV = 200ns
15
mA
W ≥ (VCC – 0.2V)
All Others Cycling, CMOS Levels
ICC4c
Average VCAP Current during AutoStore™
Cycle
4
mA
ISB1d
Average VCC Current
(Standby, Cycling TTL Input Levels)
30
28
mA
mA
tAVAV = 35ns, E ≥ VIH
tAVAV = 45ns, E ≥ VIH
ISB2d
VCC Standby Current
(Standby, Stable CMOS Input Levels)
3
mA
E ≥ (VCC – 0.2V)
All Others VIN ≤ 0.2V or ≥ (VCC – 0.2V)
IILK
Input Leakage Current
±1
µA
VCC = max
VIN = VSS to VCC
IOLK
Off-State Output Leakage Current
±5
µA
VCC = max
VIN = VSS to VCC, E or G ≥ VIH
All Inputs Don’t Care
VIH
Input Logic “1” Voltage
2.2
VCC + .5
V
All Inputs
VIL
Input Logic “0” Voltage
VSS – .5
0.8
V
All Inputs
VOH
Output Logic “1” Voltage
V
IOUT = – 4mA except HSB
VOL
Output Logic “0” Voltage
0.4
V
IOUT = 8mA except HSB
VBL
Logic “0” Voltage on HSB Output
0.4
V
IOUT = 3mA
TA
Operating Temperature
125
°C
Note b:
Note c:
Note d:
Note e:
2.4
– 55
ICC1 and ICC3 are dependent on output loading and cycle rate. The specified values are obtained with outputs unloaded.
ICC and ICC are the average currents required for the duration of the respective STORE cycles (tSTORE ) .
2
4
E ≥ VIH will not produce standby current levels until any nonvolatile cycle in progress has timed out.
VCC reference levels throughout this datasheet refer to VCCX if that is where the power supply connection is made, or VCAP if VCCX is connected to ground.
AC TEST CONDITIONS
Input Pulse Levels. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0V to 3V
Input Rise and Fall Times. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .≤ 5ns
Input and Output Timing Reference Levels. . . . . . . . . . . . . . . . 1.5V
Output Load . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Figure 1
CAPACITANCEf
SYMBOL
(TA = 25°C, f = 1.0MHz)
PARAMETER
MAX
UNITS
CONDITIONS
CIN
Input Capacitance
5
pF
∆V = 0 to 3V
COUT
Output Capacitance
7
pF
∆V = 0 to 3V
Note f:
5.0V
480 Ohms
OUTPUT
255 Ohms
30 pF
INCLUDING
SCOPE
AND FIXTURE
These parameters are guaranteed but not tested.
Figure 1: AC Output Loading
April 1999
5-44
STK14C88-M
(VCC = 5.0V ± 10%)e
SRAM READ CYCLES #1 & #2
SYMBOLS
NO.
STK14C88-35M
STK14C88-45M
MIN
MIN
PARAMETER
#1, #2
Alt.
UNITS
MAX
MAX
1
tELQV
tACS
Chip Enable Access Time
2
tAVAVg
tRC
Read Cycle Time
35
45
3
tAVQVh
tAA
Address Access Time
35
45
ns
4
tGLQV
tOE
Output Enable to Data Valid
15
20
ns
5
tAXQXh
tOH
Output Hold after Address Change
3
3
ns
6
tELQX
tLZ
Chip Enable to Output Active
5
5
ns
7
tEHQZ
tHZ
Chip Disable to Output Inactive
8
tGLQX
tOLZ
Output Enable to Output Active
9
tGHQZi
tOHZ
Output Disable to Output Inactive
10
tELICCH
tPA
Chip Enable to Power Active
11
tEHICCL
tPS
Chip Disable to Power Standby
35
45
ns
13
15
0
0
15
0
45
SRAM READ CYCLE #1: Address Controlledg, h
2
tAVAV
ADDRESS
3
tAVQV
tAXQX
DQ (DATA OUT)
DATA VALID
SRAM READ CYCLE #2: E Controlledg
2
tAVAV
ADDRESS
1
11
tELQV
E
tEHICCL
6
tELQX
7
tEHQZ
G
9
tGHQZ
4
8
tGLQX
tGLQV
DQ (DATA OUT)
DATA VALID
10
tELICCH
ACTIVE
ICC
April 1999
STANDBY
5-45
ns
ns
35
Note g: W and HSB must be high during SRAM READ cycles.
Note h: Device is continuously selected with E and G both low.
Note i: Measured ± 200mV from steady state output voltage.
5
ns
ns
13
0
ns
ns
STK14C88-M
(VCC = 5.0V ± 10%)e
SRAM WRITE CYCLES #1 & #2
SYMBOLS
NO.
STK14C88-35M
STK14C88-45M
MIN
MIN
PARAMETER
#1
#2
Alt.
UNITS
MAX
MAX
12
tAVAV
tAVAV
tWC
Write Cycle Time
35
45
13
tWLWH
tWLEH
tWP
Write Pulse Width
25
30
ns
14
tELWH
tELEH
tCW
Chip Enable to End of Write
25
30
ns
ns
15
tDVWH
tDVEH
tDW
Data Set-up to End of Write
12
15
ns
16
tWHDX
tEHDX
tDH
Data Hold after End of Write
0
0
ns
17
tAVWH
tAVEH
tAW
Address Set-up to End of Write
25
30
ns
18
tAVWL
tAVEL
tAS
Address Set-up to Start of Write
0
0
ns
19
tWHAX
tEHAX
tWR
Address Hold after End of Write
0
0
20
tWLQZi, j
tWZ
Write Enable to Output Disable
21
tWHQX
tOW
Output Active after End of Write
13
5
5
Note j: If W is low when E goes low, the outputs remain in the high-impedance state.
Note k: E or W must be ≥ VIH during address transitions.
Note l: HSB must be high during SRAM WRITE cycles.
SRAM WRITE CYCLE #1: W Controlledk, l
12
tAVAV
ADDRESS
19
tWHAX
14
tELWH
E
17
tAVWH
18
tAVWL
13
tWLWH
W
15
16
tDVWH
DATA IN
tWHDX
DATA VALID
20
tWLQZ
21
DATA OUT
tWHQX
HIGH IMPEDANCE
PREVIOUS DATA
SRAM WRITE CYCLE #2: E Controlledk, l
12
tAVAV
ADDRESS
18
14
tAVEL
19
tELEH
tEHAX
E
17
tAVEH
13
W
tWLEH
15
16
tDVEH
DATA IN
DATA OUT
April 1999
tEHDX
DATA VALID
HIGH IMPEDANCE
5-46
ns
15
ns
ns
STK14C88-M
HARDWARE MODE SELECTION
E
W
HSB
A13 - A0 (hex)
MODE
I/O
POWER
H
X
H
X
Not Selected
Output High Z
Standby
L
H
H
X
Read SRAM
Output Data
Active
L
L
H
X
Write SRAM
Input Data
Active
X
X
L
X
Nonvolatile STORE
Output High Z
lCC2
H
0E38
31C7
03E0
3C1F
303F
0FC0
Read SRAM
Read SRAM
Read SRAM
Read SRAM
Read SRAM
Nonvolatile STORE
Output Data
Output Data
Output Data
Output Data
Output Data
Output High Z
H
0E38
31C7
03E0
3C1F
303F
0C63
Read SRAM
Read SRAM
Read SRAM
Read SRAM
Read SRAM
Nonvolatile RECALL
Output Data
Output Data
Output Data
Output Data
Output Data
Output High Z
L
H
L
H
NOTES
p
m
Active
n, o, p
lCC2
n, o, p
Active
Note m: HSB store operation occurs only if an SRAM WRITE has been done since the last nonvolatile cycle. After the store (if any) completes, the part
will go into standby mode, inhibiting all operations until HSB rises.
Note n: The six consecutive addresses must be in order listed. W must be high during all six consecutive cycles to enable a nonvolatile cycle.
Note o: While there are 15 addresses on the STK14C88-M, only the lower 14 are used to control software modes.
Note p: I/O state assumes G < VIL. Activation of nonvolatile cycles does not depend on state of G.
(VCC = 5.0V ± 10%)e
HARDWARE STORE CYCLE
SYMBOLS
STK14C88-M
NO.
PARAMETER
Standard
Alternate
MIN
22
tSTORE
tHLHZ
STORE Cycle Duration
23
tDELAY
tHLQZ
Time Allowed to Complete SRAM Cycle
24
tRECOVER
tHHQX
Hardware STORE High to Inhibit Off
25
tHLHX
Hardware STORE Pulse Width
26
tHLBL
Hardware STORE Low to STORE Busy
UNITS
NOTES
ms
i, q
MAX
10
µs
i, q
700
ns
q, r
300
ns
1
20
ns
Note q: E and G low and W high for output behavior.
Note r: tRECOVER is only applicable after tSTORE is complete.
HARDWARE STORE CYCLE
25
tHLHX
HSB (IN)
24
tRECOVER
22
tSTORE
26
tHLBL
HSB (OUT)
HIGH IMPEDANCE
HIGH IMPEDANCE
23
tDELAY
DQ (DATA OUT)
April 1999
DATA VALID
DATA VALID
5-47
STK14C88-M
(VCC = 5.0V ± 10%)e
AutoStore™/POWER-UP RECALL
SYMBOLS
STK14C88-M
NO.
PARAMETER
Standard
27
tRESTORE
28
tSTORE
UNITS
Alternate
tHLHZ
MIN
Power-up RECALL Duration
550
µs
s
STORE Cycle Duration
10
ms
q, t
29
tVSBL
30
tDELAY
Low Voltage Trigger (VSWITCH) to HSB Low
31
VSWITCH
Low Voltage Trigger Level
32
VRESET
Low Voltage Reset Level
tBLQZ
NOTES
MAX
300
Time Allowed to Complete SRAM Cycle
1
4.0
ns
l
µs
q
4.5
V
3.9
V
Note s: tRESTORE starts from the time VCC rises above VSWITCH.
Note t: HSB is asserted low for 1µs when VCAP drops through VSWITCH. If an SRAM WRITE has not taken place since the last nonvolatile cycle, HSB
will be released and no STORE will take place.
AutoStore™/POWER-UP RECALL
VCC
31
VSWITCH
32
VRESET
AutoStore™
POWER-UP RECALL
29
28
tVSBL
27
tRESTORE
tSTORE
HSB
30
tDELAY
W
DQ (DATA OUT)
POWER-UP
RECALL
April 1999
BROWN OUT
NO STORE DUE TO
NO SRAM WRITES
BROWN OUT
AutoStore™
BROWN OUT
AutoStore™
NO RECALL
(VCC DID NOT GO
BELOW VRESET)
NO RECALL
(VCC DID NOT GO
BELOW VRESET)
RECALL WHEN
VCC RETURNS
ABOVE VSWITCH
5-48
STK14C88-M
(VCC = 5.0V ± 10%)e
SOFTWARE-CONTROLLED STORE/RECALL CYCLEv
SYMBOLS
NO.
STK14C88-35M
STK14C88-45M
MIN
MIN
PARAMETER
UNITS
MAX
NOTES
Standard
Alternate
33
tAVAV
tRC
STORE/RECALL Initiation Cycle Time
35
45
ns
q
34
tAVEL
tAS
Address Set-up Time
0
0
ns
u
35
tELEH
tCW
Clock Pulse Width
25
30
ns
u
36
tELAX
Address Hold Time
20
25
ns
u
37
tRECALL
RECALL Duration
20
MAX
20
µs
Note u: The software sequence is clocked with E controlled READs.
Note v: The six consecutive addresses must be in the order listed in the Hardware Mode Selection Table: (0E38, 31C7, 03E0, 3C1F, 303F, 0FC0) for
a STORE cycle or (0E38, 31C7, 03E0, 3C1F, 303F, 0C63) for a RECALL cycle. W must be high during all six consecutive cycles.
SOFTWARE STORE/RECALL CYCLE: E Controlledv
33
tAVAV
ADDRESS
33
tAVAV
ADDRESS #1
34
tAVEL
ADDRESS #6
35
tELEH
E
36
tELAX
28
tSTORE
DQ (DATA OUT)
April 1999
DATA VALID
DATA VALID
5-49
37
/ tRECALL
HIGH IMPEDANCE
STK14C88-M
DEVICE OPERATION
The STK14C88-M has two separate modes of operation: SRAM mode and nonvolatile mode. In SRAM
mode, the memory operates as a standard fast
static RAM. In nonvolatile mode, data is transferred
from SRAM to EEPROM (the STORE operation) or
from EEPROM to SRAM (the RECALL operation). In
this mode SRAM functions are disabled.
NOISE CONSIDERATIONS
The STK14C88-M is a high-speed memory and so
must have a high frequency bypass capacitor of
approximately 0.1µF connected between VCAP and
VSS, using leads and traces that are as short as possible. As with all high-speed CMOS ICs, normal careful routing of power, ground and signals will help
prevent noise problems.
SRAM READ
The STK14C88-M performs a READ cycle whenever
E and G are low and W and HSB are high. The
address specified on pins A0-14 determines which of
the 32,768 data bytes will be accessed. When the
READ is initiated by an address transition, the outputs will be valid after a delay of tAVQV (READ cycle
#1). If the READ is initiated by E or G, the outputs will
be valid at tELQV or at tGLQV, whichever is later (READ
cycle #2). The data outputs will repeatedly respond
to address changes within the tAVQV access time without the need for transitions on any control input pins,
and will remain valid until another address change or
until E or G is brought high, or W or HSB is brought
low.
POWER-UP RECALL
During power up, or after any low-power condition
(VCAP < VRESET), an internal RECALL request will be
latched. When VCAP once again exceeds the sense
voltage of VSWITCH, a RECALL cycle will automatically
be initiated and will take tRESTORE to complete.
If the STK14C88-M is in a WRITE state at the end of
power-up RECALL, the SRAM data will be corrupted.
To help avoid this situation, a 10K Ohm resistor
should be connected either between W and system
VCC or between E and system VCC.
SOFTWARE NONVOLATILE STORE
The STK14C88-M software STORE cycle is initiated
by executing sequential E controlled READ cycles
from six specific address locations. During the
STORE cycle an erase of the previous nonvolatile
data is first performed, followed by a program of the
nonvolatile elements. The program operation copies
the SRAM data into nonvolatile memory. Once a
STORE cycle is initiated, further input and output are
disabled until the cycle is completed.
Because a sequence of READs from specific
addresses is used for STORE initiation, it is important that no other READ or WRITE accesses intervene in the sequence, or the sequence will be
aborted and no STORE or RECALL will take place.
To initiate the software STORE cycle, the following
READ sequence must be performed:
1.
2.
3.
4.
5.
6.
SRAM WRITE
A WRITE cycle is performed whenever E and W are
low and HSB is high. The address inputs must be
stable prior to entering the WRITE cycle and must
remain stable until either E or W goes high at the
end of the cycle. The data on the common I/O pins
DQ0-7 will be written into the memory if it is valid tDVWH
before the end of a W controlled WRITE or tDVEH
before the end of an E controlled WRITE.
It is recommended that G be kept high during the
entire WRITE cycle to avoid data bus contention on
common I/O lines. If G is left low, internal circuitry will
turn off the output buffers tWLQZ after W goes low.
April 1999
Read address
Read address
Read address
Read address
Read address
Read address
0E38 (hex)
31C7 (hex)
03E0 (hex)
3C1F (hex)
303F (hex)
0FC0 (hex)
Valid READ
Valid READ
Valid READ
Valid READ
Valid READ
Initiate STORE cycle
The software sequence must be clocked with E controlled READs.
Once the sixth address in the sequence has been
entered, the STORE cycle will commence and the
chip will be disabled. It is important that READ cycles
and not WRITE cycles be used in the sequence,
although it is not necessary that G be low for the
sequence to be valid. After the tSTORE cycle time has
been fulfilled, the SRAM will again be activated for
READ and WRITE operation.
5-50
STK14C88-M
0E38 (hex)
31C7 (hex)
03E0 (hex)
3C1F (hex)
303F (hex)
0C63 (hex)
Valid READ
Valid READ
Valid READ
Valid READ
Valid READ
Initiate RECALL cycle
Internally, RECALL is a two-step procedure. First, the
SRAM data is cleared, and second, the nonvolatile
information is transferred into the SRAM cells. After
the tRECALL cycle time the SRAM will once again be
ready for READ and WRITE operations. The RECALL
operation in no way alters the data in the EEPROM
cells. The nonvolatile data can be recalled an unlimited number of times.
AutoStore™ OPERATION
The STK14C88-M can be powered in one of three
modes.
During normal AutoStore™ operation, the
STK14C88-M will draw current from VCCX to charge a
capacitor connected to the VCAP pin. This stored
charge will be used by the chip to perform a single
STORE operation. After power up, when the voltage
on the VCAP pin drops below VSWITCH, the part will
automatically disconnect the VCAP pin from VCCX and
initiate a STORE operation.
If an automatic STORE on power loss is not required,
then VCCX can be tied to ground and + 5V applied to
VCAP (Figure 4). This is the AutoStore™ Inhibit
mode, in which the AutoStore™ function is disabled.
If the STK14C88-M is operated in this configuration,
references to VCCX should be changed to VCAP
throughout this data sheet. In this mode, STORE
operations may be triggered through software control or the HSB pin. It is not permissable to change
between these three options “on the fly”.
In order to prevent unneeded STORE operations,
automatic STOREs as well as those initiated by
externally driving HSB low will be ignored unless at
least one WRITE operation has taken place since the
most recent STORE or RECALL cycle. Softwareinitiated STORE cycles are performed regardless of
whether a WRITE operation has taken place. An
optional pull-up resistor is shown connected to HSB.
This can be used to signal the system that the
AutoStore™ cycle is in progress.
10kΩ
1
32
16
32
31
31
30
30
16
17
Figure 2: AutoStore™ Mode
17
Figure 3: System Power Mode
*If HSB is not used, it should be left unconnected.
April 1999
1
31
0.1µF
Bypass
+
32
30
0.1µF
Bypass
68µF
6v, 20%
1
10kΩ∗
10kΩ∗
10kΩ∗
Read address
Read address
Read address
Read address
Read address
Read address
5-51
16
17
Figure 4: AutoStore™
Inhibit Mode
10kΩ
1.
2.
3.
4.
5.
6.
In system power mode (Figure 3), both VCCX and
VCAP are connected to the + 5V power supply without
the 100µF capacitor. In this mode the AutoStore™
function of the STK14C88-M will operate on the
stored system charge as power goes down. The
user must, however, guarantee that VCCX does not
drop below 3.6V during the 10ms STORE cycle.
0.1µF
Bypass
A software RECALL cycle is initiated with a sequence
of READ operations in a manner similar to the software STORE initiation. To initiate the RECALL cycle,
the following sequence of E controlled READ operations must be performed:
Figure 2 shows the proper connection of capacitors
for automatic store operation. A charge storage
capacitor having a capacity of between 68µF and
220µF (± 20%) rated at 6V should be provided.
10kΩ
SOFTWARE NONVOLATILE RECALL
STK14C88-M
HSB OPERATION
PREVENTING STORES
The STK14C88-M provides the HSB pin for controlling and acknowledging the STORE operations. The
HSB pin can be used to request a hardware STORE
cycle. When the HSB pin is driven low, the
STK14C88-M will conditionally initiate a STORE
operation after tDELAY; an actual STORE cycle will only
begin if a WRITE to the SRAM took place since the
last STORE or RECALL cycle. The HSB pin acts as
an open drain driver that is internally driven low to
indicate a busy condition while the STORE (initiated
by any means) is in progress.
The STORE function can be disabled on the fly by
holding HSB high with a driver capable of sourcing
30mA at a VOH of at least 2.2V, as it will have to overpower the internal pull-down device that drives HSB
low for 20µs at the onset of a STORE. When the
STK14C88-M is connected for AutoStore™ operation (system VCC connected to VCCX and a 68µF
capacitor on VCAP) and VCC crosses VSWITCH on the
way down, the STK14C88-M will attempt to pull HSB
low; if HSB doesn’t actually get below VIL, the part
will stop trying to pull HSB low and abort the STORE
attempt.
SRAM READ and WRITE operations that are in
progress when HSB is driven low by any means are
given time to complete before the STORE operation
is initiated. After HSB goes low, the STK14C88-M
will continue SRAM operations for tDELAY. During tDELAY,
multiple SRAM READ operations may take place. If a
WRITE is in progress when HSB is pulled low it will
be allowed a time, tDELAY, to complete. However, any
SRAM WRITE cycles requested after HSB goes low
will be inhibited until HSB returns high.
The HSB pin can be used to synchronize multiple
STK14C88-Ms while using a single larger capacitor.
To operate in this mode, the HSB pin should be connected together to the HSB pins from the other
STK14C88-Ms. An external pull-up resistor to + 5V
is required since HSB acts as an open drain pull
down. The VCAP pins from the other STK14C88-M
parts can be tied together and share a single capacitor. The capacitor size must be scaled by the number of devices connected to it. When any one of the
STK14C88-Ms detects a power loss and asserts
HSB, the common HSB pin will cause all parts to
request a STORE cycle (a STORE will take place in
those STK14C88-Ms that have been written since
the last nonvolatile cycle).
During any STORE operation, regardless of how it
was initiated, the STK14C88-M will continue to drive
the HSB pin low, releasing it only when the STORE is
complete. Upon completion of the STORE operation
the STK14C88-M will remain disabled until the HSB
pin returns high.
HARDWARE PROTECT
The STK14C88-M offers hardware protection
against inadvertent STORE operation and SRAM
WRITEs during low-voltage conditions. When VCAP <
VSWITCH, all externally initiated STORE operations and
SRAM WRITEs are inhibited.
AutoStore™ can be completely disabled by tying
VCCX to ground and applying + 5V to VCAP. This is the
AutoStore™ Inhibit mode; STOREs are only initiated
by explicit request using either the software
sequence or the HSB pin in this mode.
LOW AVERAGE ACTIVE POWER
The STK14C88-M will draw significantly less current
when it is cycled at times longer than 50ns. Figure 5
shows the relationship between ICC and READ cycle
time. Worst-case current consumption is shown for
both CMOS and TTL input levels (commercial temperature range, VCC = 5.5V, 100% duty cycle on chip
enable). Figure 6 shows the same relationship for
WRITE cycles. If the chip enable duty cycle is less
than 100%, only standby current is drawn when the
chip is disabled.
The overall average current drawn by the
STK14C88-M depends on the following items:
1) CMOS vs. TTL input levels; 2) the duty cycle of
chip enable; 3) the overall cycle rate for accesses;
4) the ratio of READs to WRITEs; 5) the operating
temperature; 6) the VCC level; and 7) I/O loading.
If HSB is not used, it should be left unconnected.
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100
100
80
80
Average Active Current (mA)
Average Active Current (mA)
STK14C88-M
60
40
TTL
20
60
TTL
40
CMOS
20
CMOS
0
0
50
100
150
Cycle Time (ns)
200
50
Figure 5: ICC (max) Reads
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100
150
Cycle Time (ns)
200
Figure 6: ICC (max) Writes
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STK14C88-M
ORDERING INFORMATION
STK14C88 - 5 L 45 M
Temperature Range
M =Military (– 55 to 125˚C)
Access Time
35 = 35ns
45 = 45ns
Package
L = 32-Pad LCC
C = Ceramic 32-Pin 300 mil CDIP
K = Ceramic 32-Pin 300 mil CDIP
with solder DIP finish
April 1999
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