KEXIN KQB4P40

Transistors
IC
SMD Type
400V P-Channel MOSFET
KQB4P40
1 .2 7 -0+ 0.1.1
TO-263
Features
3.5A, -400V, RDS(on) = 3.1
Unit: mm
+0.1
1.27-0.1
+0.2
4.57-0.2
@VGS = -10 V
5 .2 8 -0+ 0.2.2
100% avalanche tested
Improved dv/dt capability
0.1max
+0.1
1.27-0.1
Fast switching
+0.1
0.81-0.1
2.54
2.54
+0.2
-0.2
+0.1
5.08-0.1
1 5 .2 5 -0+ 0.2.2
Low Crss ( typical 11 pF)
2 .5 4 -0+ 0.2.2
8 .7 -0+ 0.2.2
5 .6 0
Low gate charge ( typical 18 nC)
+0.2
0.4-0.2
gate
11Gate
drain
22Drain
source
33Source
Absolute Maximum Ratings Ta = 25
Parameter
Drain to Source Voltage
Symbol
Rating
VDSS
-400
V
-3.5
A
-2.2
A
-14
A
Drain Current Continuous TC=25
ID
Drain Current Continuous TC=100
Drain Current - Pulsed
(Note 1)
IDM
Gate-Source Voltage
VGSS
30
Single Pulsed Avalanche Energy (Note 2)
EAS
260
Unit
V
mJ
Avalanche Current
(Note 1)
IAR
-3.5
A
Repetitive Avalanche Energy
(Note 1)
EAR
8.5
mJ
Peak Diode Recovery dv/dt
(Note 3)
dv/dt
-4.5
V/ns
3.13
W
85
W
Power dissipation @ Ta=25
Power dissipation @ Tc=25
PD
0.68
Derate above 25
Operating and Storage Temperature Range
Maximum lead temperature for soldering
purposes,1/8" from case for 5 seconds
TJ, TSTG
-55 to 150
TL
300
Thermal Resistance Junction to Case
R
JC
Thermal Resistance Junction to Ambient *
R
Thermal Resistance Junction to Ambient
R
W/
1.47
/W
JA
40
/W
JA
62.5
/W
* When mounted on the minimum pad size recommended (PCB Mount)
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1
Transistors
IC
SMD Type
KQB4P40
Electrical Characteristics Ta = 25
Parameter
Symbol
Drain-Source Breakdown Voltage
BVDSS
Breakdown Voltage Temperature Coefficient
Testconditons
VGS = 0 V, ID = -250
ID = -250
Zero Gate Voltage Drain Current
Max
-400
Unit
V
0.36
A, Referenced to 25
V/
-1
A
VDS = -320V, TC=125
-10
A
IGSSF
VGS = -30 V, VDS = 0 V
-100
nA
100
nA
-5.0
V
Gate-Body Leakage, Reverse
IGSSR
VGS = 30V, VDS = 0 V
Gate Threshold Voltage
VGS(th)
VDS = VGS, ID = -250
Static Drain-Source On-Resistance
RDS(on)
VGS = -10 V, ID = -1.75A
VDS = -50 V, ID = -1.75 A
Forward Transconductance
gFS
Input Capacitance
Ciss
Output Capacitance
Coss
A
VDS = -25 V, VGS = 0 V,f = 1.0 MHz
-3.0
2.44
3.1
2.7
S
520
680
pF
80
105
pF
Reverse Transfer Capacitance
Crss
11
15
pF
Turn-On Delay Time
td(on)
13
35
ns
Turn-On Rise Time
tr
55
120
ns
Turn-Off Delay Time
td(off)
35
80
ns
37
85
ns
18
23
nC
Turn-Off Fall Time
VDD = -200 V, ID = -3.5 A,RG = 25
(Note4,5)
tf
Total Gate Charge
Qg
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
VDS = -320 V, ID = -3.5 A,VGS = -10
V(Note4,5)
5.8
nC
9.4
nC
Maximum Continuous Drain-Source Diode
Forward Current
IS
-3.5
A
Maximum Pulsed Drain-Source Diode Forward
Current
ISM
-14
A
Drain-Source Diode Forward Voltage
VSD
VGS = 0 V, IS = -3.5 A
-5
V
Reverse Recovery Time
trr
VGS = 0 V, IS = -3.5 A,
260
ns
Reverse Recovery Charge
Qrr
dIF / dt = 100 A/
1.4
c
Note:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 37mH, IAS = -3.5A, VDD = -50V, RG = 25
3. ISD
-3.5A, di/dt
200A/
4. Pulse Test : Pulse width
s, VDD
, Starting TJ = 25
BVDSS, Starting TJ = 25
300 s, Duty cycle
5. Essentially independent of operating temperature
2
Typ
VDS = -400 V, VGS = 0 V
IDSS
Gate-Body Leakage, Forward
A
Min
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2%
s (Note 4)