MICROSEMI APTCV60TLM45T3G

APTCV60TLM45T3G
Three level inverter
CoolMOS & Trench + Field Stop IGBT
Power Module
Trench & Field Stop IGBT Q2, Q3:
VCES = 600V ; IC = 75A @ Tc = 80°C
CoolMOS™ Q1, Q4:
VDSS = 600V ; ID = 38A @ Tc = 80°C
Application
• Solar converter
• Uninterruptible Power Supplies
Features
• Q2, Q3 Trench + Field Stop IGBT Technology
- Low voltage drop
- Low tail current
- Switching frequency up to 20 kHz
- Soft recovery parallel diodes
- Low diode VF
- Low leakage current
- RBSOA and SCSOA rated
•
-
28 27 26 25
•
•
•
•
20 19 18
23 22
29
16
30
15
14
31
32
13
2
3
4
7
8
10 11 12
Kelvin emitter for easy drive
Very low stray inductance
High level of integration
Internal thermistor for temperature monitoring
Benefits
• Stable temperature behavior
• Very rugged
• Direct mounting to heatsink (isolated package)
• Low junction to case thermal resistance
• Easy paralleling due to positive TC of VCEsat
• Low profile
• RoHS Compliant
All ratings @ Tj = 25°C unless otherwise specified
These Devices are sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.
See application note APT0502 on www.microsemi.com
www.microsemi.com
1 - 11
APTCV60TLM45T3G – Rev 0
March, 2009
All multiple inputs and outputs must be shorted together
Example: 10/11/12 ; 7/8 …
Q1, Q4 CoolMOS™
Ultra low RDSon
Low Miller capacitance
Ultra low gate charge
Avalanche energy rated
Very rugged
APTCV60TLM45T3G
Q1 & Q4 Absolute maximum ratings
Symbol
VDSS
ID
IDM
VGS
RDSon
PD
IAR
EAR
EAS
Parameter
Drain - Source Breakdown Voltage
Tc = 25°C
Tc = 80°C
Continuous Drain Current
Pulsed Drain current
Gate - Source Voltage
Drain - Source ON Resistance
Maximum Power Dissipation
Avalanche current (repetitive and non repetitive)
Repetitive Avalanche Energy
Single Pulse Avalanche Energy
Tc = 25°C
Max ratings
600
49
38
130
±20
45
250
15
3
1900
Unit
V
A
V
mΩ
W
A
mJ
Q1 & Q4 Electrical Characteristics
Symbol Characteristic
IDSS
RDS(on)
VGS(th)
IGSS
Zero Gate Voltage Drain Current
Drain – Source on Resistance
Gate Threshold Voltage
Gate – Source Leakage Current
Test Conditions
VGS = 0V,VDS = 600V
VGS = 0V,VDS = 600V
Min
Typ
Tj = 25°C
Tj = 125°C
VGS = 10V, ID = 24.5A
VGS = VDS, ID = 3mA
VGS = ±20 V, VDS = 0V
2.1
40
3
Max
250
500
45
3.9
100
Unit
Max
Unit
µA
mΩ
V
nA
Q1 & Q4 Dynamic Characteristics
Total gate Charge
Qgs
Gate – Source Charge
Qgd
Gate – Drain Charge
Td(on)
Turn-on Delay Time
Tr
Td(off)
Rise Time
Turn-off Delay Time
Tf
Fall Time
Eon
Turn-on Switching Energy
Eoff
Turn-off Switching Energy
Eon
Turn-on Switching Energy
Eoff
Turn-off Switching Energy
RthJC
Junction to Case Thermal Resistance
VGS = 10V
VBus = 300V
ID = 49A
Inductive Switching (125°C)
VGS = 10V
VBus = 400V
ID = 49A
RG = 5Ω
Inductive switching @ 25°C
VGS = 10V ; VBus = 400V
ID = 49A ; RG = 5Ω
Inductive switching @ 125°C
VGS = 10V ; VBus = 400V
ID = 49A ; RG = 5Ω
Min
Typ
7.2
8.5
nF
150
nC
34
51
21
30
ns
100
45
675
µJ
520
1100
µJ
635
0.5
www.microsemi.com
March, 2009
Qg
Test Conditions
VGS = 0V ; VDS = 25V
f = 1MHz
°C/W
2 - 11
APTCV60TLM45T3G – Rev 0
Symbol Characteristic
Ciss
Input Capacitance
Coss
Output Capacitance
APTCV60TLM45T3G
Q2 & Q3 Absolute maximum ratings
Symbol
VCES
IC
ICM
VGE
PD
RBSOA
Parameter
Collector - Emitter Breakdown Voltage
TC = 25°C
TC = 80°C
TC = 25°C
Continuous Collector Current
Pulsed Collector Current
Gate – Emitter Voltage
Maximum Power Dissipation
Reverse Bias Safe Operating Area
TC = 25°C
TJ = 150°C
Max ratings
600
100
75
140
±20
250
150A @ 550V
Unit
V
A
V
W
Q2 & Q3 Electrical Characteristics
Symbol Characteristic
ICES
Zero Gate Voltage Collector Current
VCE(sat)
Collector Emitter Saturation Voltage
VGE(th)
IGES
Gate Threshold Voltage
Gate – Emitter Leakage Current
Test Conditions
VGE = 0V, VCE = 600V
Tj = 25°C
VGE =15V
IC = 75A
Tj = 150°C
VGE = VCE, IC = 600µA
VGE = 20V, VCE = 0V
Min
Typ
5.0
1.5
1.7
5.8
Min
Typ
Max
Unit
250
1.9
µA
6.5
600
V
nA
Max
Unit
V
Q2 & Q3 Dynamic Characteristics
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
QG
Gate charge
Td(on)
Tr
Td(off)
Tf
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Td(on)
Turn-on Delay Time
Tr
Rise Time
Turn-off Delay Time
Fall Time
Td(off)
Tf
Eon
Turn-on Switching Energy
Eoff
Turn-off Switching Energy
Isc
Short Circuit data
RthJC
VGE = 0V
VCE = 25V
f = 1MHz
VGE=±15V, IC=75A
VCE=300V
Inductive Switching (25°C)
VGE = ±15V
VBus = 300V
IC = 75A
RG = 4.7Ω
Inductive Switching (150°C)
VGE = ±15V
VBus = 300V
IC = 75A
RG = 4.7Ω
VGE = ±15V
Tj = 25°C
VBus = 300V
Tj = 150°C
IC = 75A
Tj = 25°C
RG = 4.7Ω
Tj = 150°C
VGE ≤15V ; VBus = 360V
tp ≤ 6µs ; Tj = 150°C
Junction to Case Thermal Resistance
4620
300
140
pF
0.8
µC
110
45
200
40
ns
120
50
250
60
0.35
0.6
2.2
2.6
ns
mJ
mJ
380
A
0.60
www.microsemi.com
°C/W
3 - 11
March, 2009
Cies
Coes
Cres
Test Conditions
APTCV60TLM45T3G – Rev 0
Symbol Characteristic
APTCV60TLM45T3G
CR5 & CR6 diode ratings and characteristics
Symbol Characteristic
VRRM Maximum Peak Repetitive Reverse Voltage
IRM
Maximum Reverse Leakage Current
IF
DC Forward Current
VF
Diode Forward Voltage
Test Conditions
VR=600V
IF = 30A
IF = 60A
IF = 30A
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
di/dt =200A/µs
Err
Reverse Recovery Energy
IF = 30A
VR = 400V
IF = 30A
VR = 400V
Min
600
Tj = 25°C
Tj = 125°C
Tc = 80°C
Typ
Max
25
500
Tj = 125°C
Tj = 25°C
Tj = 125°C
Tj = 25°C
30
1.8
2.2
1.5
25
160
35
Tj = 125°C
480
Tj = 125°C
0.6
Unit
V
µA
A
2.2
V
ns
nC
mJ
di/dt =1000A/µs
RthJC
Junction to Case Thermal Resistance
1.2
°C/W
Max
Unit
V
CR2, CR3, CR7 & CR8 diode ratings and characteristics
Symbol Characteristic
VRRM Maximum Peak Repetitive Reverse Voltage
IRM
IF
VF
Maximum Reverse Leakage Current
Test Conditions
VR=1200V
DC Forward Current
IF = 30A
IF = 60A
IF = 30A
Diode Forward Voltage
trr
Reverse Recovery Time
Qrr
Reverse Recovery Charge
di/dt =200A/µs
Err
Reverse Recovery Energy
IF = 30A
VR = 800V
IF = 30A
VR = 800V
Min
1200
Tj = 25°C
Tj = 125°C
Tc = 80°C
Typ
100
500
Tj = 125°C
Tj = 25°C
Tj = 125°C
Tj = 25°C
30
2.6
3.2
1.8
300
380
360
Tj = 125°C
1700
Tj = 125°C
1.6
µA
A
3.1
V
ns
nC
mJ
di/dt =1000A/µs
RthJC
Junction to Case Thermal Resistance
1.2
°C/W
Temperature sensor NTC (see application note APT0406 on www.microsemi.com for more information).
Min
T25 = 298.15 K
TC=100°C
RT =
R25
Typ
50
5
3952
4
Max
Unit
kΩ
%
K
%
March, 2009
Characteristic
Resistance @ 25°C
T: Thermistor temperature
⎡
⎛ 1
1 ⎞⎤ RT: Thermistor value at T
exp ⎢ B25 / 85 ⎜⎜
− ⎟⎟⎥
⎝ T25 T ⎠⎦
⎣
www.microsemi.com
4 - 11
APTCV60TLM45T3G – Rev 0
Symbol
R25
∆R25/R25
B25/85
∆B/B
APTCV60TLM45T3G
Thermal and package characteristics
Symbol
VISOL
TJ
TSTG
TC
Torque
Wt
Characteristic
RMS Isolation Voltage, any terminal to case t =1 min, I isol<1mA, 50/60Hz
Operating junction temperature range
Storage Temperature Range
Operating Case Temperature
Mounting torque
Package Weight
To heatsink
M4
Min
2500
-40
-40
-40
2.5
Typ
Max
175*
125
100
4.7
110
Unit
V
°C
N.m
g
* Tjmax = 150°C for Q1 & Q4
SP3 Package outline (dimensions in mm)
28
17
1
12
See application note 1901 - Mounting Instructions for SP3 Power Modules on www.microsemi.com
60
VCE=300V
D=50%
R G=4.7Ω
T J=150°C
45
T c =85°C
30
March, 2009
Operating Frequency vs Collector Current
75
Hard
switching
15
0
0
20
40
60
80
100
IC (A)
www.microsemi.com
5 - 11
APTCV60TLM45T3G – Rev 0
Fmax, Operating Frequency (kHz)
Q2 & Q3 Typical performance curve
APTCV60TLM45T3G
Output Characteristics (VGE=15V)
Output Characteristics
150
150
TJ=25°C
TJ = 150°C
VGE=13V
100
TJ=150°C
IC (A)
IC (A)
100
75
VGE=15V
75
50
50
25
25
VGE=9V
TJ=25°C
0
0
0.5
1
1.5
VCE (V)
0
2
2.5
0
3
5
TJ=25°C
125
1
1.5
2
VCE (V)
VCE = 300V
VGE = 15V
RG = 4.7Ω
TJ = 150°C
4
E (mJ)
100
75
TJ=150°C
50
0.5
2.5
3
3.5
Energy losses vs Collector Current
Transfert Characteristics
150
IC (A)
VGE=19V
125
125
3
Eoff
2
Eon
1
25
TJ=25°C
0
0
5
6
7
8
9
10
11
0
12
25
50
75
100
125
150
IC (A)
VGE (V)
Switching Energy Losses vs Gate Resistance
Reverse Bias Safe Operating Area
5
175
Eoff
150
125
Eon
3
IC (A)
E (mJ)
4
2
VCE = 300V
VGE =15V
IC = 75A
TJ = 150°C
1
100
75
50
VGE=15V
TJ=150°C
RG=4.7Ω
25
0
0
0
5
10 15 20 25 30
Gate Resistance (ohms)
35
40
0
100
200
300 400
VCE (V)
500
600
700
maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration
0.5
0.4
0.3
0.2
0.1
0.9
0.7
0.5
March, 2009
0.6
0.3
0.1
0.05
0
0.00001
Single Pulse
0.0001
0.001
0.01
0.1
1
10
Rectangular Pulse Duration in Seconds
www.microsemi.com
6 - 11
APTCV60TLM45T3G – Rev 0
Thermal Impedance (°C/W)
0.7
APTCV60TLM45T3G
Q1 & Q4 Typical performance curve
Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration
Thermal Impedance (°C/W)
0.6
0.5
0.9
0.4
0.7
0.3
0.5
0.2
0.3
0.1
0.1
Single Pulse
0.05
0
0.00001
0.0001
0.001
0.01
0.1
1
10
rectangular Pulse Duration (Seconds)
Transfert Characteristics
Low Voltage Output Characteristics
140
360
VGS=15&10V
6.5V
280
ID, Drain Current (A)
6V
240
200
5.5V
160
120
5V
80
4.5V
40
4V
0
VDS > ID(on)xRDS(on)MAX
250µs pulse test @ < 0.5 duty cycle
120
100
80
60
40
TJ=125°C
20
TJ=25°C
0
0
5
10
15
20
25
0
Normalized to
VGS=10V @ 50A
1.25
1.2
VGS=10V
1.15
1.1
1
2
3
4
5
6
VGS, Gate to Source Voltage (V)
7
DC Drain Current vs Case Temperature
50
RDS(on) vs Drain Current
1.3
VGS=20V
1.05
1
0.95
ID, DC Drain Current (A)
0.9
40
30
20
10
0
0
20
40
60
80
100 120 140
ID, Drain Current (A)
www.microsemi.com
25
50
75
100
125
TC, Case Temperature (°C)
March, 2009
RDS(on) Drain to Source ON Resistance
VDS, Drain to Source Voltage (V)
150
7 - 11
APTCV60TLM45T3G – Rev 0
ID, Drain Current (A)
320
1.1
1.0
0.9
0.8
25
50
75
100
125
150
ON resistance vs Temperature
3.0
2.0
1.5
1.0
0.5
0.0
25
TJ, Junction Temperature (°C)
1000
1.0
ID, Drain Current (A)
VGS(TH), Threshold Voltage
(Normalized)
50
75
100
125
150
TJ, Junction Temperature (°C)
Maximum Safe Operating Area
Threshold Voltage vs Temperature
1.1
0.9
0.8
0.7
limited by RDSon
100
100 µs
1 ms
Single pulse
TJ=150°C
TC=25°C
10
0.6
10 ms
1
25
50
75
100
125
150
1
Coss
Ciss
1000
Crss
100
10
1000
10
20
30
40
50
VDS, Drain to Source Voltage (V)
12
ID=50A
TJ=25°C
10
VDS=120V
VDS=300V
8
VDS=480V
6
4
2
0
0
20
40
60 80 100 120 140 160
Gate Charge (nC)
March, 2009
0
100
Gate Charge vs Gate to Source Voltage
VGS, Gate to Source Voltage (V)
Capacitance vs Drain to Source Voltage
100000
10000
10
VDS, Drain to Source Voltage (V)
TC, Case Temperature (°C)
C, Capacitance (pF)
VGS=10V
ID= 50A
2.5
www.microsemi.com
8 - 11
APTCV60TLM45T3G – Rev 0
BVDSS, Drain to Source Breakdown
Voltage (Normalized)
Breakdown Voltage vs Temperature
1.2
RDS(on), Drain to Source ON resistance
(Normalized)
APTCV60TLM45T3G
APTCV60TLM45T3G
Delay Times vs Current
140
Rise and Fall times vs Current
70
td(off)
100
VDS=400V
RG=5Ω
TJ=125°C
L=100µH
80
60
40
VDS=400V
RG=5Ω
TJ=125°C
L=100µH
60
tr and tf (ns)
td(on)
20
50
tf
40
30
tr
20
10
0
0
0
10
20 30 40 50
60 70 80
0
10
20
ID, Drain Current (A)
1.6
Switching Energy (mJ)
Switching Energy (mJ)
VDS=400V
RG=5Ω
TJ=125°C
L=100µH
Eon
1.2
Eoff
0.8
0.4
VDS=400V
ID=50A
TJ=125°C
L=100µH
2
1.5
50
60
70
80
Eoff
Eon
1
0.5
0
0
0
10
20 30 40 50 60
ID, Drain Current (A)
70
80
0
IDR, Reverse Drain Current (A)
300
VDS=400V
D=50%
RG=5Ω
TJ=125°C
TC=75°C
250
200
150
hard
switching
100
50
15 20 25 30 35
ID, Drain Current (A)
30
40
50
40
45
TJ=150°C
100
TJ=25°C
10
1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
VSD, Source to Drain Voltage (V)
March, 2009
10
20
Source to Drain Diode Forward Voltage
1000
0
5
10
Gate Resistance (Ohms)
Operating Frequency vs Drain Current
Frequency (kHz)
40
Switching Energy vs Gate Resistance
2.5
Switching Energy vs Current
2
30
ID, Drain Current (A)
www.microsemi.com
9 - 11
APTCV60TLM45T3G – Rev 0
td(on) and td(off) (ns)
120
APTCV60TLM45T3G
CR5 & CR6 Typical performance curve
Forward Characteristic of diode
80
IF (A)
60
TJ=125°C
40
TJ=25°C
20
0
0.0
0.4
0.8
1.2
VF (V)
1.6
2.0
2.4
Switching Energy Losses vs Gate Resistance
1
0.75
0.75
0.5
E (mJ)
E (mJ)
Energy losses vs Collector Current
1
VCE = 400V
VGE = 15V
RG = 2.5Ω
TJ = 125°C
0.25
20
40
60
VCE = 400V
VGE =15V
IC = 30A
TJ = 125°C
0.25
0
0
0.5
0
80
0
2
4
6
8
Gate Resistance (ohms)
IC (A)
10
1
0.8
0.6
0.4
0.2
0.9
0.7
0.5
0.3
0.1
Single Pulse
0.05
0
0.00001
0.0001
0.001
0.01
0.1
1
10
Rectangular Pulse Duration (Seconds)
www.microsemi.com
March, 2009
1.2
10 - 11
APTCV60TLM45T3G – Rev 0
Thermal Impedance (°C/W)
Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration
1.4
APTCV60TLM45T3G
CR2, CR3, CR7 & CR8 Typical performance curve
Forward Current vs Forward Voltage
IF, Forward Current (A)
80
TJ=125°C
60
40
20
TJ=25°C
0
0.0
1.0
2.0
3.0
4.0
VF, Anode to Cathode Voltage (V)
Switching Energy Losses vs Gate Resistance
2.5
1.8
2
1.6
1.4
1.5
E (mJ)
E (mJ)
Energy losses vs Collector Current
VCE = 800V
VGE = 15V
RG = 5Ω
TJ = 125°C
1
0.5
20
40
60
VCE = 800V
VGE =15V
IC = 30A
TJ = 125°C
1
0.8
0
0
1.2
0.6
80
0
10
IC (A)
20
30
Gate resistance (ohms)
Maximum Effective Transient Thermal Impedance, Junction to Case vs Pulse Duration
1.2
1
0.8
0.9
0.7
0.5
0.6
0.2
0.3
0.1
0.05
0
0.00001
Single Pulse
0.0001
0.001
0.01
0.1
1
10
March, 2009
0.4
Rectangular Pulse Duration (Seconds)
Microsemi reserves the right to change, without notice, the specifications and information contained herein
Microsemi's products are covered by one or more of U.S patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583 4,748,103
5,283,202 5,231,474 5,434,095 5,528,058 6,939,743 7,352,045 5,283,201 5,801,417 5,648,283 7,196,634 6,664,594 7,157,886 6,939,743 7,342,262
and foreign patents. U.S and Foreign patents pending. All Rights Reserved.
www.microsemi.com
11 - 11
APTCV60TLM45T3G – Rev 0
Thermal Impedance (°C/W)
1.4