SHENZHENFREESCALE AOL1401

AOL1401
P-Channel Enhancement Mode Field
Effect Transistor
General Description
The AOL1401 uses advanced trench technology to provide excellent RDS(ON), and ultra-low low gate
charge with a 25V gate rating. This device is suitable for use as a load switch or in PWM applications. It is
ESD protected.
Features
VDS (V) = -38V
ID = -85A
RDS(ON) < 8.5mΩ (VGS = -20V)
RDS(ON) < 10mΩ (VGS = -10V)
Ultra SO-8TM Top View
D
D
Bottom tab
connected to
drain
G
S
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted
Parameter
Symbol
VDS
Drain-Source Voltage
VGS
Gate-Source Voltage
TC=25°C
Continuous Drain
Current G
Pulsed Drain Current
Continuous Drain
Current G
ID
IDM
C
2.08
W
1.3
TJ, TSTG
°C
-55 to 175
Symbol
t ≤ 10s
Steady-State
Steady-State
W
50
PDSM
Junction and Storage Temperature Range
1/6
-10
100
PD
TA=25°C
Thermal Characteristics
Parameter
Maximum Junction-to-Ambient A
Maximum Junction-to-Ambient A
Maximum Junction-to-Case B
A
-120
IDSM
TC=25°C
TA=70°C
V
-12
TA=70°C
Power Dissipation A
±25
-62
TA=25°C
TC=100°C
Units
V
-85
TC=100°C
Power Dissipation B
Maximum
-38
RθJA
RθJC
Typ
21
48
1
Max
25
60
1.5
Units
°C/W
°C/W
°C/W
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AOL1401
P-Channel Enhancement Mode Field
Effect Transistor
Electrical Characteristics (T J=25°C unless otherwise noted)
Parameter
Symbol
STATIC PARAMETERS
BVDSS
Drain-Source Breakdown Voltage
Conditions
Min
ID=-250µA, VGS=0V
-38
-100
Zero Gate Voltage Drain Current
IGSS
Gate-Body leakage current
VGS(th)
Gate Threshold Voltage
VDS=VGS ID=-250µA
-1.5
ID(ON)
On state drain current
VGS=-10V, VDS=-5V
-120
RDS(ON)
Static Drain-Source On-Resistance
TJ=55°C
VDS=0V, VGS=±25V
VGS=-20V, ID=-20A
TJ=125°C
VGS=-10V, ID=-20A
Forward Transconductance
VSD
IS=-1A,VGS=0V
Diode Forward Voltage
Maximum Body-Diode Continuous Current
VDS=-5V, ID=-20A
DYNAMIC PARAMETERS
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Rg
Gate resistance
SWITCHING PARAMETERS
Qg(10V) Total Gate Charge (10V)
Qgs
Gate Source Charge
-500
VDS=0V, VGS=±20V
gFS
Max
-2.2
±1
µA
±10
µA
-3.5
VGS=-10V, VDS=-20V, ID=-20A
V
6.8
8.5
9.1
11
7.9
10
mΩ
-1
V
14.5
A
4560
pF
50
0.71
mΩ
S
560
pF
350
VGS=0V, VDS=0V, f=1MHz
nA
A
3800
VGS=0V, VDS=-20V, f=1MHz
Units
V
VDS=-30V, VGS=0V
IDSS
IS
Typ
pF
7.5
9
61.2
74
Ω
nC
11.88
nC
Qgd
Gate Drain Charge
15.4
nC
tD(on)
Turn-On DelayTime
13.5
ns
tr
Turn-On Rise Time
17
ns
tD(off)
Turn-Off DelayTime
97
ns
tf
Turn-Off Fall Time
43
ns
VGS=-10V, VDS=-20V, RL=1Ω,
RGEN=3Ω
trr
Body Diode Reverse Recovery Time
IF=-20A, dI/dt=100A/µs
30
Qrr
Body Diode Reverse Recovery Charge IF=-20A, dI/dt=100A/µs
29
36
ns
nC
A: The value of R θJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with T A =25°C. The
Power dissipation PDSM is based on R θJA and the maximum allowed junction temperature of 150°C. The value in any given application depends on
the user's specific board design, and the maximum temperature of 175°C may be used if the PCB allows it.
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper
dissipation limit for cases where additional heatsinking is used.
C: Repetitive rating, pulse width limited by junction temperature TJ(MAX)=175°C.
D. The R θJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming
a maximum junction temperature of TJ(MAX)=175°C.
G. The maximum current rating is limited by bond-wires.
H. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A =25°C.
* This device is guaranteed green after date code 8P11 (June 1 ST 2008)
Rev 2: Dec 2008
2/6
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AOL1401
P-Channel Enhancement Mode Field
Effect Transistor
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
120
30
-14V
-10V
VDS=-5V
25
90
20
-ID(A)
-ID (A)
-6V
60
125°C
15
10
-4V
25°C
30
5
Vgs=-3.5V
0
0
0
1
2
3
4
5
2
2.5
-VDS (Volts)
Fig 1: On-Region Characteristics
3.5
4
4.5
5
-VGS(Volts)
Figure 2: Transfer Characteristics
9
1.8
Normalized On-Resistance
RDS(ON) (mΩ)
3
VGS=-10V
8
7
VGS=-20V
1.6
VGS=-20V
ID=-20A
1.4
1.2
VGS=-10V
ID=-20A
1
6
0
5
0.8
10
15
20
25
-ID (A)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage
0
30
60
90
120
150
180
210
Temperature (°C)
Figure 4: On-Resistance vs. Junction Temperature
1.0E+01
30
ID=-20A
1.0E+00
25
1.0E-01
125°C
-IS (A)
RDS(ON) (mΩ)
20
15
125°C
1.0E-02
1.0E-03
25°C
1.0E-04
10
25°C
1.0E-05
5
1.0E-06
0
0.0
4
6
8
10
-VGS (Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
3/6
0.2
0.4
0.6
0.8
1.0
-VSD (Volts)
Figure 6: Body-Diode Characteristics
4.9
6
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AOL1401
P-Channel Enhancement Mode Field
Effect Transistor
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
5000
10
4000
Capacitance (pF)
-VGS (Volts)
Ciss
VDS=-20V
ID=-20A
8
6
4
3000
2000
Coss
Crss
1000
2
0
0
0
10
20
30
40
50
60
-Qg (nC)
Figure 7: Gate-Charge Characteristics
0
70
1000.0
5
10
15
20
25
-VDS (Volts)
Figure 8: Capacitance Characteristics
30
1000
TJ(Max)=175°C, TA=25°C
RDS(ON)
limited
100µs
1ms
10.0
10ms
1.0
DC
100m
0.1
0.1
1
10
100
-VDS (Volts)
ZθJC Normalized Transient
Thermal Resistance
TJ(Max)=175°C
TA=25°C
600
400
200
0
0.0001
0.001
0.01
0.1
1
10
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-toCase (Note B)
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
10
Power (W)
-ID (Amps)
800
10µs
100.0
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
D=Ton/T
TJ,PK=TC+PDM.ZθJC.RθJC
RθJC=1.5°C/W
1
PD
0.1
Ton
Single Pulse
0.01
0.00001
0.0001
0.001
0.01
0.1
T
1
10
100
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
4.9
4/6
6
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AOL1401
P-Channel Enhancement Mode Field
Effect Transistor
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
60
120
40
Power (W)
Power Dissipation (W)
50
90
60
30
TA=25°C
20
30
10
0
0
25
50
75
100
125
150
0
0.01
175
TCASE (°C)
Figure 12: Power De-rating (Note B)
0.1
1
10
100
1000
Pulse Width (s)
Figure 13: Single Pulse Power Rating Junction-toAmbient (Note H)
Current rating -ID(A)
100
80
60
40
20
0
0
25
50
75
100
125
150
175
TCASE (°C)
Figure 14: Current De-rating (Note B)
ZθJA Normalized Transient
Thermal Resistance
100
10
D=Ton/T
TJ,PK=TA+PDM.ZθJA.RθJA
RθJA=60°C/W
In descending order
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
1
0.1
PD
0.01
0.001
0.00001
Ton
Single Pulse
0.0001
0.001
0.01
0.1
1
T
10
100
1000
Pulse Width (s)
Figure 15: Normalized Maximum Transient Thermal Impedance (Note H)
4.9
5/6
6
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AOL1401
P-Channel Enhancement Mode Field
Effect Transistor
Gate Charge Test Circuit & W aveform
Vgs
Qg
-10V
+
VD C
-
Qgs
Vds
Qgd
+
VDC
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & W aveforms
RL
Vds
t off
t on
td(on)
Vgs
VDC
Rg
-
DUT
Vgs
t d(off)
tr
tf
90%
Vdd
+
Vgs
10%
Vds
Unclam ped Inductive Switching (UIS) Test Circuit & W aveform s
2
L
E AR = 1/2 LIAR
Vds
Vds
Id
VDC
-
Vgs
Vgs
+
Rg
BVDSS
Vdd
Id
I AR
DUT
Vgs
Vgs
Diode Recovery Test Circuit & W aveform s
Q rr = - Idt
Vds +
DUT
Vds -
Isd
Vgs
Ig
6/6
Vgs
L
-Isd
+ Vdd
VDC
-
-I F
t rr
dI/dt
-I RM
Vdd
-Vds
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