ETC SSTV16859MTDX

Revised September 2001
SSTV16859
Dual Output 13-Bit Register with
SSTL-2 Compatible I/O and Reset
General Description
Features
The SSTV16859 is a dual output 13-bit register designed
for use with 184 and 232 pin DDR-1 memory modules. The
device has a differential input clock, SSTL-2 compatible
data inputs and a LVCMOS compatible RESET input. The
device has been designed to meet the JEDEC DDR module register specifications.
■ Compliant with DDR-I registered module specifications
The device has been fabricated on an advanced submicron CMOS process and is designed to operate at power
supplies of less than 3.6V’s.
■ Low power mode when device is reset
■ Operates at 2.5V ± 0.2V VDD
■ SSTL-2 compatible input structure
■ SSTL-2 compliant output structure
■ Differential SSTL-2 compatible clock inputs
■ Industry standard 64 pin TSSOP package
■ Also packaged in plastic Fine-Pitch Ball Grid Array
(FBGA)
Ordering Code:
Order Number
SSTV16859GX
(Note 1)
SSTV16859MTD
(Note 2)
Package Number
BGA96A
MTD64
Package Description
96-Ball Fine-Pitch Ball Grid Array (FBGA), JEDEC MO-205, 5.5mm Wide
[TAPE and REEL]
64-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide
Note 1: BGA package available in Tape and Reel only.
Note 2: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
© 2001 Fairchild Semiconductor Corporation
DS500414
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SSTV16859 Dual Output 13-Bit Register with SSTL-2 Compatible I/O and Reset
March 2001
SSTV16859
Connection Diagrams
Pin Descriptions
Pin Name
Pin Assignment for TSSOP
Description
Q1A-Q13A
SSTL-2 Compatible Register Outputs
Q1B-Q13B
D1-D13
SSTL-2 Compatible Register Inputs
RESET
Asynchronous LVCMOS Reset Input
CK
Positive Master Clock Input
CK
Negative Master Clock Input
VREF
Voltage Reference Pin for SSTL level inputs
VDDQ
Power Supply Voltage for Output Signals
VDD
Power Supply Voltage for Inputs
NC
Electrically Isolated No Connect
FBGA Pin Assignments
Pin Assignment for FBGA
1
2
3
4
5
6
A
NC
NC
NC
NC
NC
NC
B
Q12A
Q13A
GND
GND
NC
NC
C
Q10A
Q11A
GND
GND
NC
NC
D
Q8A
Q9A
VDDQ
VDDQ
D13
D12
E
Q6A
Q7A
VDDQ
VDD
D11
D10
F
Q4A
Q5A
VDDQ
VDD
D9
D8
G
Q2A
Q3A
GND
GND
D7
RESET
H
Q1A
Q13B
GND
GND
NC
CK
J
Q12B
Q11B
GND
VREF
NC
CK
K
Q10B
Q9B
VDDQ
VDD
NC
NC
L
Q8B
Q7B
VDDQ
VDD
D5
D6
M
Q6B
Q5B
VDDQ
VDDQ
D3
D4
N
Q4B
Q3B
GND
GND
D1
D2
P
Q2B
Q1B
GND
GND
NC
NC
R
NC
NC
NC
NC
NC
NC
T
NC
NC
NC
NC
NC
NC
Truth Table
RESET
Dn
CK
CK
Qn
L
X or
Floating
X or
Floating
X or
Floating
L
H
L
↑
↓
L
H
H
↑
↓
H
H
X
L
H
Qn-1
H
X
H
L
Qn-1
L = Logic LOW
H = Logic HIGH
X = Don’t Care but not floating unless noted
↑ = LOW-to-HIGH Clock Transition
↓ = HIGH-to-LOW Clock Transition
Qn-1 = Output Remains in Previously Clocked State
(Top Thru View)
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The SSTV16859 is a 13-bit dual register with SSTL-2 compatible inputs and outputs. Input data is transferred to output data on the rising edge of the differential clock pair.
When the RESET signal is asserted LOW all outputs are
placed into the LOW logic state and all input comparators
are disabled for power savings. Output glitches are prevented by disabling the internal registers more quickly than
the input comparators. When RESET is removed, the system designer must insure the clock and data inputs to the
device are stable during the rising transition of the RESET
signal.
The SSTL-2 data inputs transition based on the value of
VREF. VREF is a stable system reference used for setting
the trip point of the input buffers of the SSTV16859 and
other SSTL-2 compatible devices.
The RESET signal is a standard CMOS compatible input
and is not referenced to the VREF signal.
Logic Diagram
For n = 1 to 13
3
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SSTV16859
Functional Description
SSTV16859
Absolute Maximum Ratings(Note 3)
Recommended Operating
Conditions (Note 5)
Supply Voltage (VDDQ)
−0.5V to +3.6V
Supply Voltage (VDD)
−0.5V to +3.6V
Power Supply (VDDQ)
Reference Voltage (VREF )
−0.5V to +3.6V
Power Supply (VDD)
−0.5V to VDD +0.5V
Input Voltage (VI)
Operating Range
Output Voltage (VO)
Outputs Active (Note 4)
VDDQ to 2.7V
Reference Supply
−0.5V to VDDQ + 0.5V
(VREF = VDDQ/2)
DC Input Diode Current (IIK)
1.15 to 1.35
VREF ± 40 mV
Termination Voltage (VTT)
VI < 0V
−50 mA
Input Voltage
VI > VDD
+50 mA
Output Voltage (VO)
VO < 0V
−50 mA
Output Current IOH/IOL
VO > VDDQ
+50 mA
DC Output Diode Current (IOK)
0 to VDD
Output in Active States
0V to VDDQ
VDD = 2.3V to 2.7V
DC Output Source/Sink Current
±20 mA
0°C to +70°C
Free Air Operating Temperature (TA)
±50 mA
(IOH/IOL)
Note 3: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the “Electrical
Characteristics” table are not guaranteed at the absolute maximum ratings.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
DC VDD or Ground Current
±100 mA
per Supply Pin (IDD or Ground)
Storage Temperature Range (Tstg)
2.3V to 2.7V
−65°C to +150°C
≥ 7000V
ESD (Human Body Model)
Note 4: IO Absolute Maximum Rating must be observed.
Note 5: The RESET input of the device must be held at VDD or GND to
ensure proper device operation. The differential inputs must not be floating,
unless RESET is asserted LOW.
DC Electrical Characteristics (2.3V ≤ VDD ≤ 2.7V)
Symbol
Parameter
VDD
Conditions
(V)
Min
Typ
Max
Units
VIKL
Input LOW Clamp Voltage
II = −18 mA
2.3
−1.2
V
VIKH
Input HIGH Clamp Voltage
II = +18 mA
2.3
3.5
V
VREF+310mV
VIH-AC
AC HIGH Level Input Voltage
Data Inputs
VIL-AC
AC LOW Level Input Voltage
Data Inputs
VIH-DC
DC HIGH Level Input Voltage
Data Inputs
VIL-DC
DC LOW Level Input Voltage
Data Inputs
VIH
HIGH Level Input Voltage
RESET
VIL
LOW Level Input Voltage
RESET
VICR
Common Mode Input Voltage Range CK, CK
0.97
VI(PP)
Peak to Peak Input Voltage
360
VOH
HIGH Level Output Voltage
VOL
LOW Level Output Voltage
VREF+150mV
1.7
V
V
mV
IOH = −100 µA
2.3 to 2.7
VDD − 0.2
2.3
1.95
IOL = 100 µA
2.3 to 2.7
0.2
IOL = 16 mA
2.3
0.35
2.7
±5.0
µA
10
µA
25
mA
120
µA/MHz
15
µA/MHz
Input Leakage Current
VI = VDD or GND
Static Standby
RESET = GND, IO = 0
Static Operating
RESET = VDD, IO = 0
V
V
2.7
VI = VIH(AC) or VIL(AC)
Dynamic Operating Current
1.53
IOH = −16 mA
II
Clock Only
V
V
0.7
CK, CK
V
V
VREF−150mV
IDD
IDDD
V
VREF−310mV
RESET = VDD, IO = 0
VI = VIH(AC) or VIL(AC)
CK, CK Duty Cycle 50%
Dynamic Operating Current
RESET = VDD, IO = 0
per Data Input
VI = VIH(AC) or VIL(AC)
CK, CK Duty Cycle 50%
Data Input = ½ Clock
Rate 50% Duty Cycle
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4
2.7
Symbol
Parameter
(Continued)
VDD
Conditions
Min
Typ
Max
Units
Ω
(V)
ROH
Output HIGH On Resistance
IOH = −20 mA
2.3 to 2.7
7
20
ROL
Output LOW On Resistance
IOL = 20 mA
2.3 to 2.7
7
20
Ω
RO∆
| ROH - ROL |
IO = 20 mA, TA = 25°C
4
Ω
2.5
AC Electrical Characteristics (Note 6)
TA = 0°C to +70°C, CL = 30 pF, RL = 50Ω
Symbol
VDD = 2.5V ± 0.2V; VDDQ = 2.5V ± 0.2V
Parameter
Min
Typ
Units
Max
fMAX
Maximum Clock Frequency
200
MHz
tW
Pulse Duration, CK, CK HIGH or LOW (Figure 2)
2.5
ns
tACT
Differential Inputs Activation Time,
(Note 7)
data inputs must be LOW after RESET HIGH (Figure 3)
22
ns
22
ns
tINACT
Differential Inputs De-activation Time,
(Note 7)
data and clock inputs must be held at valid levels
(not floating) after RESET LOW
tS
tH
Setup Time, Fast Slew Rate (Note 8)(Note 9) (Figure 5)
0.75
Setup Time, Slow Slew Rate (Note 9)(Note 10) (Figure 5)
0.9
Hold Time, Fast Slew Rate (Note 8)(Note 10) (Figure 5)
0.75
Hold Time, Slow Slew Rate (Note 9)(Note 10) (Figure 5)
0.9
tREM
Reset Removal Time (Figure 7)
10
tPHL, tPLH
Propagation Delay CK, CK to Qn (Figure 4)
1.1
tPHL
Propagation Delay RESET to Qn (Figure 6)
ns
ns
ns
2.8
ns
5.0
ns
Note 6: Refer to Figure 1 through Figure 7.
Note 7: This parameter is not production tested.
Note 8: For data signal input slew rate ≥ 1 V/ns.
Note 9: For data signal input slew rate ≥ 0.5 V/ns and < 1 V/ns.
Note 10: For CK, CK signals input slew rates are ≥ 1 V/ns.
Capacitance (Note 11)
Symbol
CIN
Max
Units
Data Pin Input Capacitance
Parameter
Min
2.2
Typ
3.2
pF
VDD = 2.5V, VI = VREF ± 310 mV
Conditions
CK, CK - Input Capacitance
2.2
3.2
pF
VDD = 2.5V, VICR = 1.25, VI(PP) = 360 mV
RESET
2.3
3.3
pF
VDD = 2.5V, VI = VDD or GND
Note 11: TA = +25°C, f = 1 MHz, Capacitance is characterized but not tested.
5
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SSTV16859
DC Electrical Characteristics
SSTV16859
AC Loading and Waveforms (See Notes A through F below)
Note: CL includes probe and jog capacitance
FIGURE 2. Voltage Waveforms - Pulse Duration
FIGURE 1. AC Test Circuit
Note: IDD tested with clock and data inputs held at VDD or GND,
and IO = 0 mA.
FIGURE 3. Voltage and Current Waveforms Inputs
Active and Inactive Times
FIGURE 4. Voltage Waveforms Propagation Delay Times
FIGURE 5. Voltage Waveforms - Setup and Hold Times
FIGURE 6. Voltage Waveforms RESET Propagation Delay Times
Note A: All input pulses are supplied by generators having
the following characteristics:
PRR ≤ 10 MHz, Z0 = 50Ω, input slew rate = 1V/ns ± 20%
(unless otherwise specified).
Note B: The outputs are measured one at a time with one
transition per measurement.
Note C: VTT = VREF = VDD/2.
Note D: VIH = VREF +310 mV (AC voltage levels) for differential inputs. VIH = VDD for LVCMOS input.
Note E: VIL = VREF −310 mV (AC voltage levels) for differential inputs. VIL = GND for LVCMOS input.
Note F: Removal time (tREM) is tested with one data input
held active HIGH. The propagation time from CK to the corresponding output must meet valid timing specifications for
the measurement to be accurate.
FIGURE 7. Voltage Waveforms RESET Removal Delay Times
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SSTV16859
Physical Dimensions inches (millimeters) unless otherwise noted
96-Ball Fine-Pitch Ball Grid Array (FBGA), JEDEC MO-205, 5.5mm Wide
Package Number BGA96A
7
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SSTV16859 Dual Output 13-Bit Register with SSTL-2 Compatible I/O and Reset
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
64-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 6.1mm Wide
Package Number MTD64
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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