HAT1047R, HAT1047RJ Silicon P Channel Power MOS FET High Speed Power Switching REJ03G0074-0500Z (Previous ADE-208-1545D(Z)) Rev.5.00 Aug.27.2003 Features • • • • For Automotive Application (at Type Code "J") Low on-resistance Capable of –4.5 V gate drive High density mounting Outline SOP-8 8 5 6 7 8 D D D D 5 7 6 3 1 2 4 4 G S S S 1 2 3 Rev.5.00, Aug.27.2003, page 1 of 9 1, 2, 3 4 5, 6, 7, 8 Source Gate Drain HAT1047R, HAT1047RJ Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS –30 V Gate to source voltage VGSS ±20 V Drain current ID –14 A Drain peak current ID(pulse)Note1 –112 A Body-drain diode reverse drain current IDR –14 A — — –14 A — — 19.6 mJ 2.5 W Avalanche current HAT1047R Avalanche energy HAT1047R IAP Note3 HAT1047RJ EAR Note3 Channel dissipation Pch Note2 Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C HAT1047RJ Notes: 1. PW ≤ 10 µs, duty cycle ≤ 1 % 2. When using the glass epoxy board (FR4 40 x 40 x 1.6 mm), PW ≤ 10s 3. Value at Tch = 25°C, Rg ≥ 50 Ω Rev.5.00, Aug.27.2003, page 2 of 9 HAT1047R, HAT1047RJ Electrical Characteristics (Ta = 25°C) Item Symbol Min Typ Max Unit Test Conditions Drain to source breakdown voltage V(BR)DSS –30 — — V ID = –10 mA, VGS = 0 Gate to source breakdown voltage V(BR)GSS ±20 — — mV IG = ±100 µA, VDS = 0 Gate to source leak current IGSS — — ±10 µA VGS = ± 16V, VDS = 0 Zero gate voltage drain current IDSS — — ±1 µA VDS = –30 V, VGS = 0 Zero gate voltage HAT1047R IDSS — — — µA VDS = –24 V, VGS = 0 drain current HAT1047RJ IDSS — — –20 µA Ta = 125°C Gate to source cutoff voltage VGS(off) –1.0 — –2.5 V VDS = –10 V, ID = –1 mA Static drain to source on state RDS(on) — 10 12 mΩ ID = –7 A, VGS = –10 V Note4 resistance RDS(on) — 19 25 mΩ ID = –7 A, VGS = –4.5 V Note4 Forward transfer admittance |yfs| 9.6 16 — S ID = –7 A, VDS = –10 V Note4 Input capacitance Ciss — 3500 — pF VDS = –10 V Output capacitance Coss — 750 — pF VGS = 0 Reverse transfer capacitance Crss — 520 — pF f = 1 MHz Total gate charge Qg — 64 — nc VDD = –10 V Gate to source charge Qgs — 10 — nc VGS = –10 V Gate to drain charge Qgd — 12 — nc ID = –14 A Turn-on delay time td(on) — 23 — ns VGS = –10 V, ID = –7A Rise time tr — 45 — ns VDD ≅ –10 V Turn-off delay time td(off) — 80 — ns RL = 1.43 Ω Fall time tf — 25 — ns RL = 4.7 Ω Body–drain diode forward voltage VDF — –0.82 –1.07 V IF = –14 A, VGS = 0 Note4 Body–drain diode reverse recovery time trr — 45 — ns IF = –14 A, VGS = 0 diF/ dt = 100 A/µs Notes: 4. Pulse test Rev.5.00, Aug.27.2003, page 3 of 9 HAT1047R, HAT1047RJ Main Characteristics Power vs. Temperature Derating Maximum Safe Operation Area 2.0 1.0 10 µs -100 I D (A) 3.0 Test condition. When using the glass epoxy board. (FR4 40 x 40 x 1.6 mm), (PW ≤ 10s) -500 10 -10 DC PW Op era Drain Current Channel Dissipation Pch (W) 4.0 0µ s 1m s =1 0m tio s n( -1 Operation in this area is limited by R DS(on) -0.1 PW N ≤ 1 ote 1 0s ) Ta = 25°C 1 shot Pulse 0 50 100 150 200 Ambient Temperature Ta (°C) -0.01 -0.1 -0.3 -1 -3 -10 -30 -100 Drain to Source Voltage V DS (V) Note 1: When using the glass epoxy board. ( FR4 40 x 40 x 1.6 mm) Typical Output Characteristics Typical Transfer Characteristics -50 -50 -10 V Pulse Test (A) -40 -4 V ID I D (A) -8 V Drain Current Drain Current -30 -20 -3 V -10 -40 V DS = -10 V Pulse Test -30 -20 75°C -10 25°C Tc = -25°C VGS = -2 V 0 -2 -4 -6 Drain to Source Voltage Rev.5.00, Aug.27.2003, page 4 of 9 -8 -10 V DS (V) 0 -1 -2 -3 Gate to Source Voltage -4 VGS (V) -5 HAT1047R, HAT1047RJ I D = -10 A Pulse Test -160 -120 -5 A -80 -2 A -40 -12 -4 -8 Gate to Source Voltage Static Drain to Source on State Resistance R DS(on) (mΩ ) 0 Static Drain to Source on State Resistance vs. Temperature 40 Pulse Test -10 A 32 24 V GS = -4.5 V I D = -2,-5 A 16 8 0 -40 -2, -5, -10 A -10 V 0 40 80 120 160 Case Temperature Tc (°C) Rev.5.00, Aug.27.2003, page 5 of 9 Static Drain to Source on State Resistance vs. Drain Current 100 Pulse Test 50 20 -4.5 V 10 VGS = -10 V 5 2 1.0 -1 -16 -20 V GS (V) -2 -5 -10 -20 -50 -100 -200 Drain Current I D (A) Forward Transfer Admittance vs. Drain Current Forward Transfer Admittance |yfs| (S) Drain to Source Saturation Voltage V DS(on) (mV) -200 Drain to Source On State Resistance R DS(on) (m Ω) Drain to Source Saturation Voltage vs. Gate to Source Voltage 500 200 V DS = -10 V Pulse Test 100 Tc = –25°C 50 20 10 25°C 5 75°C 2 1.0 0.5 0.1 1.0 10 Drain Current I D (A) 100 HAT1047R, HAT1047RJ Body-Drain Diode Reverse Recovery Time Typical Capacitance vs. Drain to Source Voltage 30000 VGS = 0 f = 1 MHz Capacitance C (pF) Reverse Recovery Time trr (ns) 500 200 100 50 20 10 -1 10000 Ciss 1000 Coss Crss di / dt = 100 A / µs V GS = 0, Ta = 25°C 100 0 -2 -5 -10 -20 -50 -100 Reverse Drain Current I DR (A) -40 -50 0 V DS VDD = - 5 V -10 V -25 V I D = -14 A 16 32 48 64 Gate Charge Qg (nc) Rev.5.00, Aug.27.2003, page 6 of 9 -8 V GS -12 -16 -20 80 -30 -40 -50 V GS (V) Switching Characteristics 500 Switching Time t (ns) -30 -4 1000 Gate to Source Voltage V DS (V) Drain to Source Voltage V DD = - 5 V -10 V -25 V -10 -20 0 -20 Drain to Source Voltage V DS (V) Dynamic Input Characteristics 0 -10 V GS = -10 V, VDD = -10 V PW = 5 µs, duty < 1 % 200 t d(off) 100 50 tr tf 20 t d(on) 10 -0.1 -0.2 -0.5 -1 -2 Drain Current -5 I D (A) -10 -20 HAT1047R, HAT1047RJ Maximum Avalanche Energy vs. Channel Temperature Derating Repetitive Avalanche Energy EAR (mJ) Reverse Drain Current vs. Source to Drain Voltage (A) -50 Reverse Drain Current I F -40 -10 V -5V -30 V GS = 0, 5 V -20 -10 Pulse Test 0 -0.4 -0.8 -1.2 Source to Drain Voltage -1.6 -2.0 20 I AP = -14 A V DD = -15 V duty < 0.1 % Rg > 50 Ω 16 12 8 4 0 25 V SDF (V) 50 75 100 125 150 Channel Temperature Tch (°C) Avalanche Test Circuit Avalanche Waveform EAR = L V DS Monitor 1 2 2 L • I AP • IAP Monitor VDSS VDSS - VDD V (BR)DSS I AP Rg D. U. T V DS VDD ID Vin -15 V 50Ω 0 Rev.5.00, Aug.27.2003, page 7 of 9 VDD HAT1047R, HAT1047RJ Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermal Impedance γ s (t) 10 1 D=1 0.5 0.1 0.2 0.1 0.05 0.01 θ ch - f(t) = γ s (t) x θ ch - f θ ch - f = 83.3°C/W, Ta = 25°C When using the glass epoxy board (FR4 40 x 40 x 1.6 mm) 0.02 0.01 lse 0.001 PDM u tp D= ho 1s PW T PW T 0.0001 10 µ 100 µ 1m 10 m 100 m 1 10 Pulse Width PW (S) Switching Time Test Circuit Rg 1000 1000 Switching Time Waveform Vout Monitor Vin Monitor 100 Vin 10% D.U.T. RL 90% Vin -10 V V DD = -10 V Vout td(on) Rev.5.00, Aug.27.2003, page 8 of 9 90% 90% 10% 10% tr td(off) tf HAT1047R, HAT1047RJ Package Dimensions As of January, 2003 Unit: mm 3.95 4.90 5.3 Max 5 8 *0.22 ± 0.03 0.20 ± 0.03 4 1.75 Max 1 0.75 Max + 0.10 6.10 – 0.30 1.08 0.14 – 0.04 *0.42 ± 0.08 0.40 ± 0.06 + 0.11 0˚ – 8˚ 1.27 + 0.67 0.60 – 0.20 0.15 0.25 M *Dimension including the plating thickness Base material dimension Rev.5.00, Aug.27.2003, page 9 of 9 Package Code JEDEC JEITA Mass (reference value) FP-8DA Conforms — 0.085 g Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. 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