PD - 9.1492A IRFP9140N PRELIMINARY HEXFET® Power MOSFET l l l l l l Advanced Process Technology Dynamic dv/dt Rating 175°C Operating Temperature P-Channel Fast Switching Fully Avalanche Rated D VDSS = -100V RDS(on) = 0.117Ω G ID = -23A S Description Fifth Generation HEXFETs from International Rectifier utilize advanced processing techniques to achieve extremely low on-resistance per silicon area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET Power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in a wide variety of applications. The TO-247 package is preferred for commercialindustrial applications where higher power levels preclude the use of TO-220 devices. The TO-247 is similar but superior to the earlier TO-218 package because of its isolated mounting hole. TO-247AC Absolute Maximum Ratings ID @ TC = 25°C ID @ TC = 100°C IDM PD @TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Parameter Max. Continuous Drain Current, VGS @ -10V Continuous Drain Current, VGS @ -10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torque, 6-32 or M3 screw -23 -16 -76 140 0.91 ± 20 430 -11 14 -5.0 -55 to + 175 Units A W W/°C V mJ A mJ V/ns °C 300 (1.6mm from case ) 10 lbf•in (1.1N•m) Thermal Resistance Parameter RθJC RθCS RθJA Junction-to-Case Case-to-Sink, Flat, Greased Surface Junction-to-Ambient Typ. Max. Units ––– 0.24 ––– 1.1 ––– 40 °C/W 3/16/98 IRFP9140N Electrical Characteristics @ TJ = 25°C (unless otherwise specified) RDS(on) VGS(th) gfs Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Qg Qgs Qgd td(on) tr td(off) tf Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Min. -100 ––– ––– -2.0 5.3 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– Typ. ––– -0.11 ––– ––– ––– ––– ––– ––– ––– ––– ––– ––– 15 67 51 51 IDSS Drain-to-Source Leakage Current LD Internal Drain Inductance ––– 5.0 LS Internal Source Inductance ––– 13 Ciss Coss Crss Input Capacitance Output Capacitance Reverse Transfer Capacitance ––– ––– ––– 1300 400 240 V(BR)DSS ∆V(BR)DSS/∆TJ IGSS Max. Units Conditions ––– V VGS = 0V, ID = -250µA ––– V/°C Reference to 25°C, I D = -1mA 0.117 Ω VGS = -10V, ID = -13A -4.0 V VDS = VGS, ID = -250µA ––– S VDS = -50V, ID = 11A -25 VDS = -100V, VGS = 0V µA -250 VDS = -80V, VGS = 0V, TJ = 150°C 100 VGS = 20V nA -100 VGS = -20V 97 ID = -11A 15 nC VDS = -80V 51 VGS = -10V, See Fig. 6 and 13 ––– VDD = -50V ––– ID = -11A ns ––– RG = 5.1Ω ––– RD = 4.2Ω, See Fig. 10 D Between lead, ––– 6mm (0.25in.) nH G from package ––– and center of die contact S ––– VGS = 0V ––– pF VDS = -25V ––– ƒ = 1.0MHz, See Fig. 5 Source-Drain Ratings and Characteristics IS ISM VSD trr Qrr ton Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Min. Typ. Max. Units Conditions D MOSFET symbol ––– ––– -23 showing the A G integral reverse ––– ––– -76 p-n junction diode. S ––– ––– -1.3 V TJ = 25°C, IS = -13A, VGS = 0V ––– 150 220 ns TJ = 25°C, IF = -11A ––– 830 1200 µC di/dt = -100A/µs Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) Starting TJ = 25°C, L = 7.1mH RG = 25Ω, IAS = -11A. (See Figure 12) ISD ≤ -11A, di/dt ≤ -470A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C Pulse width ≤ 300µs; duty cycle ≤ 2%. Uses IRF9540N data and test conditions IRFP9140N 100 100 VGS - 15V - 10V - 8.0V - 7.0V - 6.0V - 5.5V - 5.0V BOTTOM - 4.5V VGS - 15V - 10V - 8.0V - 7.0V - 6.0V - 5.5V - 5.0V BOTTOM - 4.5V TOP -ID , D rain-to-S ource C urrent (A ) -ID , D rain-to-S ource C urrent (A ) TOP 10 -4.5V 20µ s P U LS E W ID TH T c = 25°C A 1 0.1 1 10 10 -4.5V 20µ s P U LS E W ID TH T C = 175°C 1 100 0.1 2.5 R D S (on ) , D rain-to -S ource O n R esistance (N orm alized) -I D , D rain-to -S o urc e C urre nt (A ) 100 TJ = 2 5 °C TJ = 1 7 5 °C 10 1 V D S = -2 5 V 2 0 µ s P U L S E W ID T H 5 6 7 8 9 -VG S , G a te -to -S o u rc e V o lta g e (V ) Fig 3. Typical Transfer Characteristics A 100 Fig 2. Typical Output Characteristics Fig 1. Typical Output Characteristics 4 10 -VD S , D rain-to-S ource V oltage (V ) -VD S , D rain-to-S ource V oltage (V ) 0.1 1 10 A I D = -19A 2.0 1.5 1.0 0.5 VG S = -10V 0.0 -60 -40 -20 0 20 40 60 80 A 100 120 140 160 180 T J , Junction T em perature (°C ) Fig 4. Normalized On-Resistance Vs. Temperature IRFP9140N V GS C is s C rs s C oss C , C apacitanc e (pF ) 2500 2000 = = = = 20 0V , f = 1M H z C gs + C gd , Cds S H O R TE D C gd C ds + C gd -V G S , G ate-to-S ource V oltage (V ) 3000 C is s 1500 C os s 1000 C rs s 500 0 10 V D S = -80V V D S = -50V V D S = -20V 16 12 8 4 FO R TE S T C IR C U IT S E E FIG U R E 1 3 0 A 1 I D = -1 1A 100 0 -VD S , D rain-to-S ource V oltage (V ) 40 60 80 A 100 Q G , Total G ate C harge (nC ) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 1000 O P E R A TIO N IN TH IS A R E A LIM ITE D B Y R D S (on) -I D , D rain C urrent (A ) -I S D , R everse D rain C urrent (A ) 20 10 T J = 175°C T J = 25°C 1 V G S = 0V 0.1 0.2 0.4 0.6 0.8 1.0 1.2 1.4 -VS D , S ource-to-D rain V oltage (V ) Fig 7. Typical Source-Drain Diode Forward Voltage A 1.6 100 10 0µ s 10 1m s T C = 25°C T J = 175°C S ingle P uls e 1 1 10m s A 10 100 -VD S , D rain-to-S ource V oltage (V ) Fig 8. Maximum Safe Operating Area 1000 IRFP9140N 25 RD VDS VGS I D , Drain Current (A) 20 D.U.T. RG + 15 VDD -10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % 10 Fig 10a. Switching Time Test Circuit 5 td(on) tr t d(off) tf VGS 10% 0 25 50 75 100 125 150 175 TC , Case Temperature ( ° C) 90% Fig 9. Maximum Drain Current Vs. Case Temperature VDS Fig 10b. Switching Time Waveforms Thermal Response (Z thJC ) 10 1 D = 0.50 0.20 PDM 0.10 0.1 0.01 0.00001 0.05 0.02 0.01 t1 t2 SINGLE PULSE (THERMAL RESPONSE) Notes: 1. Duty factor D = t 1 / t 2 2. Peak TJ = P DM x Z thJC + TC 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 1 IRFP9140N D .U .T RG IA S -20V tp VD D A D R IV E R 0.01 Ω 15V Fig 12a. Unclamped Inductive Test Circuit E A S , S ingle P ulse A valanc he E nergy (m J) 1200 L VDS TO P 1000 B O TTO M 800 600 400 200 0 A 25 IAS ID -4.7A -8.1A -11A 50 75 100 125 150 S tarting T J , Junction T em perature (°C ) Fig 12c. Maximum Avalanche Energy Vs. Drain Current tp V (BR)DSS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50KΩ QG 12V .3µF -10V QGS .2µF QGD D.U.T. +VDS VGS VG -3mA Charge Fig 13a. Basic Gate Charge Waveform IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit 175 IRFP9140N Peak Diode Recovery dv/dt Test Circuit + D.U.T* Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer + - - + • dv/dt controlled by RG • ISD controlled by Duty Factor "D" • D.U.T. - Device Under Test RG VGS * + - VDD Reverse Polarity of D.U.T for P-Channel Driver Gate Drive P.W. D= Period P.W. Period [VGS=10V ] *** D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode [VDD] Forward Drop Inductor Curent Ripple ≤ 5% *** VGS = 5.0V for Logic Level and 3V Drive Devices Fig 14. For P-Channel HEXFETS [I ] SD IRFP9140N Package Outline TO-247AC Outline Dimensions are shown in millimeters (inches) -D - 3.65 (.1 43 ) 3.55 (.1 40 ) 1 5.90 (.6 2 6) 1 5.30 (.6 0 2) -B- 0.25 (.0 1 0) M 5 .3 0 (.20 9 ) 4 .7 0 (.18 5 ) 2 .5 0 (.08 9) 1 .5 0 (.05 9) 4 D B M -A5 .50 (.21 7) 2 0 .30 (.80 0) 1 9 .70 (.77 5) 2X 1 2 NOTES: 5.50 (.2 1 7) 4.50 (.1 7 7) 1 D IM E N S IO N IN G & TO LE R A N C IN G P E R A N S I Y 14.5M , 1982. 2 C O N TR O LLIN G D IM E N S IO N : IN C H . 3 C O N F O R M S TO JE D E C O U TLIN E T O -247-A C . 3 -C - 1 4.8 0 (.5 83 ) 1 4.2 0 (.5 59 ) 2 .40 (.09 4) 2 .00 (.07 9) 2X 5.45 (.2 1 5) 2X 4 .3 0 (.1 70 ) 3 .7 0 (.1 45 ) 0 .80 (.03 1) 3X 0 .40 (.01 6) 1 .4 0 (.0 56 ) 3 X 1 .0 0 (.0 39 ) 0 .2 5 (.0 10 ) M LE A D A S S IG N M E N TS 2.60 (.1 0 2) 2.20 (.0 8 7) C A S 3 .4 0 (.1 33 ) 3 .0 0 (.1 18 ) 1 2 3 4 - G A TE D R A IN SOURCE D R A IN Part Marking Information TO-247AC E X A M P L E : TH IS IS A N IR F P E 3 0 W ITH A S S E M B L Y LOT CODE 3A1Q A IN TE R N A TIO N A L R E C T IF IE R LOGO PART NUMBER IR F P E 3 0 3A 1 Q 9 3 0 2 ASSEMBLY LOT CODE D A TE C O D E (Y YW W ) YY = YEAR W W W EEK WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, Tel: (310) 322 3331 EUROPEAN HEADQUARTERS: Hurst Green, Oxted, Surrey RH8 9BB, UK Tel: ++ 44 1883 732020 IR CANADA: 7321 Victoria Park Ave., Suite 201, Markham, Ontario L3R 2Z8, Tel: (905) 475 1897 IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 6172 96590 IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 11 451 0111 IR FAR EAST: K&H Bldg., 2F, 3-30-4 Nishi-Ikeburo 3-Chome, Toshima-Ki, Tokyo Japan 171 Tel: 81 3 3983 0086 IR SOUTHEAST ASIA: 315 Outram Road, #10-02 Tan Boon Liat Building, Singapore 0316 Tel: 65 221 8371 http://www.irf.com/ Data and specifications subject to change without notice. 3/98