2SK3210(L), 2SK3210(S) Silicon N Channel MOS FET High Speed Power Switching REJ03G0414-0300 (Previous ADE-208-760A (Z)) Rev.3.00 Sep. 30, 2004 Features • Low on-resistance RDS = 40 mΩ typ. • High speed switching • 4 V gate drive device can be driven from 5 V source Outline LDPAK D 4 4 1. Gate 2. Drain 3. Source 4. Drain G 1 1 2 2 3 3 S Absolute Maximum Ratings (Ta = 25°C) Item Symbol Ratings Unit Drain to source voltage VDSS 150 V Gate to source voltage VGSS ±20 V Drain current Drain peak current Body-drain diode reverse drain current ID 30 A ID (pulse)Note1 120 A IDR 30 A 30 A Note3 Avalanche current IAP Avalanche energy EARNote3 Note2 Channel dissipation Pch 67 mJ 100 W Channel temperature Tch 150 °C Storage temperature Tstg –55 to +150 °C Notes: 1. PW ≤ 10ms, duty cycle ≤ 1 % 2. Value at Tc = 25°C 3. Value at Tch = 25°C, Rg ≥ 50 Ω Rev.3.00 Sep. 30, 2004 page 1 of 8 2SK3210(L), 2SK3210(S) Electrical Characteristics (Ta = 25°C) Symbol Min Typ Max Unit Drain to source breakdown voltage Item V(BR)DSS 150 — — V ID = 10 mA, VGS = 0 Test Conditions Gate to source breakdown voltage V(BR)GSS ±20 — — V IG = ±100 µA, VDS = 0 Gate to source leak current IGSS — — ±10 µA VGS = ±16 V, VDS = 0 Zero gate voltage drain current IDSS — — 10 µA VDS = 150 V, VGS = 0 Gate to source cutoff voltage VGS(off) 1.0 — 2.5 V VDS = 10 V, ID = 1 mA Static drain to source on state resistance RDS(on) — 40 45 mΩ ID = 15 A, VGS = 10 V Note4 RDS(on) — 45 63 mΩ ID = 15 A, VGS = 4 VNote4 |yfs| 18 30 — S ID = 15 A, VDS = 10 VNote4 Input capacitance Ciss — 2600 — pF Output capacitance Coss — 820 — pF VDS = 10 V, VGS = 0 f = 1MHz Reverse transfer capacitance Crss — 350 — pF Turn-on delay time td(on) — 25 — ns Forward transfer admittance Rise time Turn-off delay time Fall time Body–drain diode forward voltage Body–drain diode reverse recovery time Notes: 4. Pulse test Rev.3.00 Sep. 30, 2004 page 2 of 8 tr — 180 — ns td(off) — 600 — ns VGS = 10 V, ID= 15 A RL = 2 Ω tf — 280 — ns VDF — 0.91 — V IF = 30 A, VGS = 0 trr — 110 — ns IF = 30 A, VGS = 0 diF/dt = 50 A/µs 2SK3210(L), 2SK3210(S) Main Characteristics Maximum Safe Operation Area Power vs. Temperature Derating 500 300 ID (A) C 10 0 50 100 150 Case Temperature 1 0.1 Ta = 25°C 0.05 0.1 0.3 1 3 200 25 n °C ) ho t) 10 100 300 1000 30 VDS (V) VDS = 10 V Pulse Test ID (A) 40 4V Drain Current 3V 20 10 Tc = –25°C 1.6 1.2 ID = 20 A 10 A 0.4 5A 4 8 12 Gate to Source Voltage Rev.3.00 Sep. 30, 2004 page 3 of 8 0 8 10 VDS (V) Pulse Test 0.8 25°C 10 Drain to Source Saturation Voltage vs. Gate to Source Voltage 2.0 75°C 20 VGS = 2.5 V 2 4 6 Drain to Source Voltage 40 30 16 VGS (V) 20 1 2 3 Gate to Source Voltage 4 5 VGS (V) Static Drain to Source on State Resistance vs. Drain Current 1000 Pulse Test 500 Drain to Source On State Resistance RDS(on) (mΩ) ID (A) = 1s tio Typical Transfer Characteristics Pulse Test 5V 30 Drain Current s( ra 50 10 V Drain to Source Voltage VDS(on) (V) m pe Drain to Source Voltage Tc (°C) Typical Output Characteristics 0 10 Operation in this area is 0.3 limited by RDS(on) 50 0 O Tc 3 = s 40 D m 80 PW 30 Drain Current 120 10 µs 100 µs 100 1 Channel Dissipation Pch (W) 160 200 100 VGS = 4 V 50 10 V 20 10 1 2 5 10 Drain Current 20 ID (A) 50 100 200 150 ID = 20 A 5, 10 A 100 VGS = 4 V 50 5, 10 A 20 A 10 V 0 –40 0 40 80 Case Temperature 120 Tc 25°C 3 1 0.3 VDS = 10 V Pulse Test 0.1 Drain Current ID (A) Capacitance C (pF) 50 100 Typical Capacitance vs. Drain to Source Voltage Ciss 1000 Coss 300 100 30 20 Crss VGS = 0 f = 1 MHz 10 0.3 1 3 10 30 0 100 VDD = 100 V 50 V 25 V 12 200 8 VDS 100 4 VDD = 100 V 50 V 25 V 40 80 Gate Charge Rev.3.00 Sep. 30, 2004 page 4 of 8 120 160 Qg (nc) 20 30 40 50 0 200 Switching Characteristics VGS = 10 V, VDD = 30 V PW = 5 µs, duty < 1 % 2000 Switching Time t (ns) 16 VGS (V) 400 Gate to Source Voltage VGS 300 5000 20 ID = 30A 10 Drain to Source Voltage VDS (V) IDR (A) Dynamic Input Characteristics 0 10 20 3000 50 500 5 2 0.5 1 10000 100 Reverse Drain Current VDS (V) 75°C 10 (°C) 200 10 0.1 Drain to Source Voltage Tc = –25°C 30 0.1 0.2 di / dt = 50 A / µs VGS = 0, Ta = 25°C 500 100 160 Body-Drain Diode Reverse Recovery Time 1000 Reverse Recovery Time trr (ns) Forward Transfer Admittance vs. Drain Current Static Drain to Source on State Resistance vs. Temperature 250 Pulse Test Forward Transfer Admittance |yfs| (S) Drain to Source On State Resistance RDS(on) (mΩ) 2SK3210(L), 2SK3210(S) td(off) 1000 500 tf 200 tr 100 50 td(on) 20 10 0.1 0.2 0.5 1 2 Drain Current 5 10 20 ID (A) 50 2SK3210(L), 2SK3210(S) Reverse Drain Current vs. Source to Drain Voltage Repetitive Avalanche Energy EAR (mJ) Reverse Drain Current IDR (A) 50 Maximum Avalanche Energy vs. Channel Temperature Derating Pulse Test 40 30 VGS = 10 V 20 10 0, –5 V 5V 0 0.4 0.8 1.2 1.6 Source to Drain Voltage 100 2.0 IAP = 30 A VDD = 50 V duty < 0.1 % Rg > 50 Ω 80 60 40 20 0 25 50 75 100 125 150 Channel Temperature Tch (°C) VSD (V) Normalized Transient Thermal Impedance vs. Pulse Width Normalized Transient Thermal Impedance γs (t) 3 Tc = 25°C 1 D=1 0.5 0.3 0.2 0.1 θch – c(t) = γs (t) × θch – c θch – c = 1.25°C/W, Tc = 25°C 0.1 0.05 PDM 0.02 1 lse 0.0 t pu o h 1s 0.03 0.01 10 µ PW T PW T 100 µ 1m 10 m 100 m Pulse Width PW (s) Avalanche Test Circuit V DS Monitor D= 1 10 Avalanche Waveform EAR = L VDSS 1 × L × IAP2 × VDSS – V DD 2 I AP Monitor V (BR)DSS I AP Rg D. U. T V DS VDD ID Vin 15 V 50Ω 0 Rev.3.00 Sep. 30, 2004 page 5 of 8 VDD 2SK3210(L), 2SK3210(S) Switching Time Test Circuit Switching Time Waveform Vout Monitor Vin Monitor 90% D.U.T. RL Vin Vin 10 V 50Ω V DD = 30 V Vout 10% 10% 90% td(on) Rev.3.00 Sep. 30, 2004 page 6 of 8 tr 10% 90% td(off) tf 2SK3210(L), 2SK3210(S) Package Dimensions • 2SK3210(L) As of January, 2003 Unit: mm 8.6 ± 0.3 11.3 ± 0.5 0.3 10.0 +– 0.5 (1.4) 4.44 ± 0.2 10.2 ± 0.3 1.3 ± 0.15 1.3 ± 0.2 1.37 ± 0.2 0.76 ± 0.1 2.54 ± 0.5 2.54 ± 0.5 2.49 ± 0.2 11.0 ± 0.5 0.2 0.86 +– 0.1 0.4 ± 0.1 Package Code JEDEC JEITA Mass (reference value) LDPAK (L) — — 1.40 g • 2SK3210(S) As of January, 2003 Unit: mm (1.5) 2.49 ± 0.2 0.2 0.1 +– 0.1 7.8 7.0 0.3 10.0 +– 0.5 8.6 ± 0.3 (1.5) 7.8 6.6 1.3 ± 0.15 1.7 (1.4) 4.44 ± 0.2 10.2 ± 0.3 2.2 1.37 ± 0.2 2.54 ± 0.5 0.2 0.86 +– 0.1 2.54 ± 0.5 0.4 ± 0.1 0.3 3.0 +– 0.5 1.3 ± 0.2 Package Code JEDEC JEITA Mass (reference value) Rev.3.00 Sep. 30, 2004 page 7 of 8 LDPAK (S)-(1) — — 1.30 g 2SK3210(L), 2SK3210(S) Ordering Information Part Name Quantity Shipping Container 2SK3210L 50 pcs. Loose packing 2SK3210STL 1000 pcs. Taping Note: For some grades, production may be terminated. Please contact the Renesas sales office to check the state of production before ordering the product. Rev.3.00 Sep. 30, 2004 page 8 of 8 Sales Strategic Planning Div. Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan Keep safety first in your circuit designs! 1. Renesas Technology Corp. puts the maximum effort into making semiconductor products better and more reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may lead to personal injury, fire or property damage. Remember to give due consideration to safety when making your circuit designs, with appropriate measures such as (i) placement of substitutive, auxiliary circuits, (ii) use of nonflammable material or (iii) prevention against any malfunction or mishap. Notes regarding these materials 1. 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