ELDRS Report_RH1016MW_Fab Lot WD003520.1.pdf

ELDRS Report
09-287 100711 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1016MW UltraFast Precision Comparator for Linear Technology
Customer: Linear Technology (PO 53101L)
RAD Job Number: 09-287
Part Type Tested: Linear Technology RH1016MW-ES UltraFast Precision Comparator
Commercial Part Number: RH1016MW
Traceability Information: Lot Date Code: 0738, Fab Lot# WD003520.1, Wafer 2, Assembly Lot# 482911.1.
Information obtained from Linear Technology PO#53101L. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation (all pins tied to
ground) and 2 control units. Serial numbers 774 to 777, and 779 were biased during irradiation. Serial numbers
780 to 783, and 785 were unbiased during irradiation (all pins tied to ground). Serial numbers 797 and 798 were
used as controls. See Appendix B for the radiation bias connection table.
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30, and 50krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Programs: RH1016W.SRC
Test Hardware: LTS2020 Tester, 2101 Family Board, 0608 Fixture, and RH1016 BGSS-100116 DUT Board.
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5.
Irradiation and Test Temperature: Ambient room temperature for irradiation and test controlled to 24°C±6°C
per MIL-STD-883.
Low Dose Rate Test Result: PASSED. Units Passed to 50krad(Si) with all
parameters remaining within their pre- and/or post-radiation specification limits.
Further the units do not exhibit ELDRS as defined in the current test method.
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ELDRS Report
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the
device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from
approximately 50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4meters.
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ELDRS Report
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Radiation Assured Devices
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3.0. Radiation Test Conditions
The RH1016MW UltraFast Precision Comparator described in this final report was tested using two bias
conditions, biased with a split 5V supply and all pins tied to ground, that is biased and unbiased. See
Appendix B for details on the biasing conditions during radiation exposure. In our opinion, these bias
circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading
Conditions which states “The bias applied to the test devices shall be selected to produce the greatest
radiation induced damage or the worst-case damage for the intended application, if known. While
maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or
maximum output load current) exhibit more degradation with 0 V bias.”
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of
each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose
exposure within two hours from the end of the previous radiation increment. The TID bias board was
positioned in the Co-60 cell to provide the required maximum dose rate of 10mrad(Si)/s and was located
inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G
TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall
be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered
radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required.
This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as
CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when
the source is changed, or (3) when the orientation or configuration of the source, container, or testfixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the
device-irradiation container at the approximate test-device position. If it can be demonstrated that low
energy scattered radiation is small enough that it will not cause dosimetry errors due to dose
enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10mrad(Si)/s with a precision of ±5%.
4.0. Tested Parameters
The following parameters were tested during the course of this work:
1.
2.
3.
4.
5.
Positive Supply Current (A)
Negative Supply Current (A)
Input Offset Voltage (V)
Input Offset Current (A)
Positive Input Bias Current (A)
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6. Negative Input Bias Current (A)
7. Average Input Bias Current (A)
8. Positive PSRR (dB)
9. Negative PSRR (dB)
10. Small-Signal Voltage Gain (V/V)
11. CMRR (dB)
12. Output High Voltage IOUT=1mA - Q (V)
13. Output High Voltage IOUT=10mA - Q (V)
14. Output Low Voltage ISINK=4mA - Q (V)
15. Output High Voltage IOUT=1mA - Q# (V)
16. Output High Voltage IOUT=10mA - Q# (V)
17. Output Low Voltage ISINK=4mA - Q# (V)
18. LATCH Pin Input Voltage Threshold (V)
19. LATCH Pin Current (A)
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per
MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival
probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using
a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a
device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated
under electrical bias shall pass the specification value. The units irradiated without electrical bias and
the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under
electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
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ELDRS Report
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Radiation Assured Devices
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measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled “Total
Ionizing Dose (TID) Testing of the RH1016MW UltraFast Precision Comparator for Linear
Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1016MW UltraFast Precision Comparator (from the lot date
code identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to
50krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits. As
noted above (Section 4) the data for the units-under-test irradiated in the unbiased condition and the
KTL statistics presented in this report are for reference only and are not used for the determination of
“PASS/FAIL” for the lot.
Figures 5.1 through 5.19 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 – 5.19 show the corresponding raw data for each of these parameters. In these data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change
during the anneal.
As seen clearly in these figures, the pre- and post-irradiation data are well within the specification even
after application of the KTL statistics and the control units, as expected, show no significant changes to
any of the parameters throughout the course of the measurements. Therefore we can conclude that the
observed degradation was due to the radiation exposure and not drift in the test equipment.
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ELDRS Report
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Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.60E-02
Positive Supply Current (A)
3.40E-02
3.20E-02
3.00E-02
2.80E-02
2.60E-02
2.40E-02
2.20E-02
2.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.1. Plot of Positive Supply Current (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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ELDRS Report
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Table 5.1. Raw data for Positive Supply Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current (A)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
2.84E-02
2.86E-02
2.87E-02
2.84E-02
2.82E-02
2.82E-02
2.74E-02
2.86E-02
2.74E-02
2.78E-02
2.80E-02
2.96E-02
10
2.84E-02
2.85E-02
2.86E-02
2.83E-02
2.81E-02
2.81E-02
2.73E-02
2.85E-02
2.73E-02
2.78E-02
2.79E-02
2.95E-02
20
2.83E-02
2.85E-02
2.85E-02
2.83E-02
2.81E-02
2.80E-02
2.72E-02
2.85E-02
2.73E-02
2.77E-02
2.79E-02
2.95E-02
30
2.84E-02
2.85E-02
2.86E-02
2.83E-02
2.81E-02
2.80E-02
2.73E-02
2.85E-02
2.73E-02
2.77E-02
2.79E-02
2.95E-02
50
2.84E-02
2.84E-02
2.85E-02
2.83E-02
2.81E-02
2.80E-02
2.72E-02
2.84E-02
2.73E-02
2.77E-02
2.79E-02
2.95E-02
24-hr
Anneal
168-hr
Anneal
60
2.83E-02
2.85E-02
2.85E-02
2.83E-02
2.81E-02
2.80E-02
2.72E-02
2.84E-02
2.73E-02
2.77E-02
2.79E-02
2.95E-02
70
2.83E-02
2.84E-02
2.85E-02
2.82E-02
2.81E-02
2.80E-02
2.72E-02
2.84E-02
2.72E-02
2.77E-02
2.79E-02
2.95E-02
Biased Statistics
Average Biased
2.85E-02
2.84E-02
2.83E-02
2.84E-02
2.84E-02
2.83E-02
2.83E-02
Std Dev Biased
1.80E-04
1.66E-04
1.71E-04
1.68E-04
1.68E-04
1.74E-04
1.74E-04
Ps90%/90% (+KTL) Biased
2.89E-02
2.88E-02
2.88E-02
2.88E-02
2.88E-02
2.88E-02
2.88E-02
Ps90%/90% (-KTL) Biased
2.80E-02
2.79E-02
2.79E-02
2.79E-02
2.79E-02
2.79E-02
2.78E-02
Un-Biased Statistics
Average Un-Biased
2.79E-02
2.78E-02
2.77E-02
2.77E-02
2.77E-02
2.77E-02
2.77E-02
Std Dev Un-Biased
5.32E-04
5.28E-04
5.28E-04
5.09E-04
5.08E-04
5.18E-04
5.22E-04
Ps90%/90% (+KTL) Un-Biased
2.93E-02
2.92E-02
2.92E-02
2.91E-02
2.91E-02
2.91E-02
2.91E-02
Ps90%/90% (-KTL) Un-Biased
2.64E-02
2.64E-02
2.63E-02
2.64E-02
2.63E-02
2.63E-02
2.63E-02
Specification MAX
3.50E-02
3.50E-02
3.50E-02
3.50E-02
3.50E-02
3.50E-02
3.50E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
-2.00E-03
Negative Supply Current (A)
-2.50E-03
-3.00E-03
-3.50E-03
-4.00E-03
-4.50E-03
-5.00E-03
-5.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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Table 5.2. Raw data for Negative Supply Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current (A)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
-3.56E-03
-3.58E-03
-3.63E-03
-3.58E-03
-3.54E-03
-3.56E-03
-3.51E-03
-3.61E-03
-3.52E-03
-3.52E-03
-3.49E-03
-3.65E-03
10
-3.49E-03
-3.50E-03
-3.56E-03
-3.48E-03
-3.46E-03
-3.47E-03
-3.42E-03
-3.54E-03
-3.46E-03
-3.45E-03
-3.45E-03
-3.60E-03
20
-3.48E-03
-3.48E-03
-3.54E-03
-3.48E-03
-3.44E-03
-3.46E-03
-3.40E-03
-3.52E-03
-3.46E-03
-3.44E-03
-3.49E-03
-3.62E-03
30
-3.46E-03
-3.43E-03
-3.51E-03
-3.43E-03
-3.40E-03
-3.40E-03
-3.37E-03
-3.48E-03
-3.42E-03
-3.42E-03
-3.47E-03
-3.61E-03
50
-3.46E-03
-3.42E-03
-3.48E-03
-3.41E-03
-3.36E-03
-3.36E-03
-3.34E-03
-3.42E-03
-3.40E-03
-3.38E-03
-3.47E-03
-3.61E-03
24-hr
Anneal
168-hr
Anneal
60
-3.42E-03
-3.41E-03
-3.48E-03
-3.41E-03
-3.37E-03
-3.37E-03
-3.34E-03
-3.44E-03
-3.40E-03
-3.39E-03
-3.48E-03
-3.62E-03
70
-3.46E-03
-3.46E-03
-3.53E-03
-3.46E-03
-3.42E-03
-3.42E-03
-3.37E-03
-3.49E-03
-3.43E-03
-3.41E-03
-3.47E-03
-3.62E-03
Biased Statistics
Average Biased
-3.58E-03 -3.50E-03 -3.48E-03 -3.45E-03 -3.43E-03 -3.42E-03 -3.47E-03
Std Dev Biased
3.35E-05
3.77E-05
3.58E-05
4.16E-05
4.67E-05
3.96E-05
3.97E-05
Ps90%/90% (+KTL) Biased
-3.49E-03 -3.39E-03 -3.39E-03 -3.33E-03 -3.30E-03 -3.31E-03 -3.36E-03
Ps90%/90% (-KTL) Biased
-3.67E-03 -3.60E-03 -3.58E-03 -3.56E-03 -3.55E-03 -3.53E-03 -3.57E-03
Un-Biased Statistics
Average Un-Biased
-3.54E-03 -3.47E-03 -3.46E-03 -3.42E-03 -3.38E-03 -3.39E-03 -3.42E-03
Std Dev Un-Biased
4.16E-05
4.44E-05
4.34E-05
4.02E-05
3.16E-05
3.70E-05
4.34E-05
Ps90%/90% (+KTL) Un-Biased
-3.43E-03 -3.35E-03 -3.34E-03 -3.31E-03 -3.29E-03 -3.29E-03 -3.31E-03
Ps90%/90% (-KTL) Un-Biased
-3.66E-03 -3.59E-03 -3.57E-03 -3.53E-03 -3.47E-03 -3.49E-03 -3.54E-03
Specification MIN
-5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-03
Input Offset Voltage (V)
4.00E-03
2.00E-03
0.00E+00
-2.00E-03
-4.00E-03
-6.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.3. Plot of Input Offset Voltage (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
11
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.3. Raw data for Input Offset Voltage (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
-4.27E-04
-1.67E-04
-4.46E-04
-4.43E-04
-3.27E-04
-4.27E-04
-3.26E-04
-2.92E-04
-3.93E-04
-3.74E-04
-4.32E-04
-1.55E-04
10
-4.37E-04
-1.77E-04
-4.57E-04
-4.54E-04
-3.38E-04
-4.29E-04
-3.25E-04
-2.95E-04
-3.94E-04
-3.74E-04
-4.51E-04
-1.72E-04
20
-4.34E-04
-1.74E-04
-4.56E-04
-4.53E-04
-3.36E-04
-4.18E-04
-3.11E-04
-2.86E-04
-3.84E-04
-3.62E-04
-4.52E-04
-1.72E-04
30
-4.32E-04
-1.69E-04
-4.52E-04
-4.49E-04
-3.32E-04
-4.04E-04
-2.97E-04
-2.73E-04
-3.71E-04
-3.48E-04
-4.50E-04
-1.69E-04
50
-4.10E-04
-1.54E-04
-4.38E-04
-4.33E-04
-3.16E-04
-3.76E-04
-2.65E-04
-2.51E-04
-3.45E-04
-3.19E-04
-4.48E-04
-1.68E-04
24-hr
Anneal
168-hr
Anneal
60
-4.18E-04
-1.55E-04
-4.39E-04
-4.35E-04
-3.17E-04
-3.77E-04
-2.69E-04
-2.52E-04
-3.48E-04
-3.22E-04
-4.49E-04
-1.68E-04
70
-4.30E-04
-1.68E-04
-4.52E-04
-4.50E-04
-3.30E-04
-3.94E-04
-2.86E-04
-2.65E-04
-3.62E-04
-3.37E-04
-4.52E-04
-1.71E-04
Biased Statistics
Average Biased
-3.62E-04 -3.73E-04 -3.71E-04 -3.67E-04 -3.50E-04 -3.53E-04 -3.66E-04
Std Dev Biased
1.19E-04
1.20E-04
1.20E-04
1.21E-04
1.20E-04
1.21E-04
1.21E-04
Ps90%/90% (+KTL) Biased
-3.44E-05 -4.43E-05 -4.06E-05 -3.49E-05 -2.06E-05 -2.02E-05 -3.28E-05
Ps90%/90% (-KTL) Biased
-6.90E-04 -7.01E-04 -7.01E-04 -6.99E-04 -6.80E-04 -6.85E-04 -6.99E-04
Un-Biased Statistics
Average Un-Biased
-3.62E-04 -3.63E-04 -3.52E-04 -3.39E-04 -3.11E-04 -3.14E-04 -3.29E-04
Std Dev Un-Biased
5.37E-05
5.36E-05
5.37E-05
5.35E-05
5.28E-05
5.26E-05
5.32E-05
Ps90%/90% (+KTL) Un-Biased
-2.15E-04 -2.16E-04 -2.05E-04 -1.92E-04 -1.66E-04 -1.69E-04 -1.83E-04
Ps90%/90% (-KTL) Un-Biased
-5.10E-04 -5.10E-04 -4.99E-04 -4.85E-04 -4.56E-04 -4.58E-04 -4.75E-04
Specification MIN
-3.00E-03 -4.00E-03 -4.50E-03 -4.50E-03 -5.00E-03 -5.00E-03 -5.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-03
4.00E-03
4.50E-03
4.50E-03
5.00E-03
5.00E-03
5.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
12
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-06
Input Offset Current (A)
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.4. Plot of Input Offset Current (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.4. Raw data for Input Offset Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current (A)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
-1.66E-07
6.50E-08
-7.20E-08
-1.16E-07
4.10E-08
-9.10E-08
-3.30E-08
-6.90E-08
-2.80E-08
3.00E-09
-3.65E-07
-2.50E-08
10
-3.24E-07
-1.20E-07
-2.55E-07
-2.89E-07
-1.19E-07
-1.02E-07
-3.10E-08
-7.20E-08
-3.50E-08
-9.00E-09
-3.57E-07
-3.40E-08
20
-5.47E-07
-3.54E-07
-5.19E-07
-5.48E-07
-3.52E-07
-1.01E-07
-2.90E-08
-7.20E-08
-3.30E-08
-1.90E-08
-3.69E-07
-3.50E-08
30
-7.87E-07
-6.18E-07
-7.79E-07
-7.92E-07
-5.90E-07
-1.10E-07
-3.90E-08
-8.00E-08
-2.60E-08
-1.60E-08
-3.52E-07
-3.10E-08
50
-1.06E-06
-9.30E-07
-1.09E-06
-1.13E-06
-9.10E-07
-1.14E-07
-3.70E-08
-9.20E-08
-3.00E-08
-3.10E-08
-3.51E-07
-3.60E-08
24-hr
Anneal
168-hr
Anneal
60
-1.06E-06
-9.07E-07
-1.06E-06
-1.09E-06
-8.70E-07
-1.12E-07
-4.60E-08
-8.90E-08
-3.50E-08
-3.20E-08
-3.52E-07
-3.30E-08
70
-8.09E-07
-6.55E-07
-7.80E-07
-8.08E-07
-5.88E-07
-1.16E-07
-4.20E-08
-7.60E-08
-3.10E-08
-1.30E-08
-3.52E-07
-3.10E-08
Biased Statistics
Average Biased
-4.96E-08 -2.21E-07 -4.64E-07 -7.13E-07 -1.02E-06 -9.99E-07 -7.28E-07
Std Dev Biased
9.98E-08
9.62E-08
1.02E-07
1.00E-07
9.82E-08
1.02E-07
1.01E-07
Ps90%/90% (+KTL) Biased
2.24E-07
4.23E-08 -1.84E-07 -4.38E-07 -7.54E-07 -7.19E-07 -4.52E-07
Ps90%/90% (-KTL) Biased
-3.23E-07 -4.85E-07 -7.44E-07 -9.88E-07 -1.29E-06 -1.28E-06 -1.00E-06
Un-Biased Statistics
Average Un-Biased
-4.36E-08 -4.98E-08 -5.08E-08 -5.42E-08 -6.08E-08 -6.28E-08 -5.56E-08
Std Dev Un-Biased
3.68E-08
3.69E-08
3.45E-08
3.96E-08
3.94E-08
3.57E-08
4.08E-08
Ps90%/90% (+KTL) Un-Biased
5.73E-08
5.15E-08
4.39E-08
5.43E-08
4.72E-08
3.52E-08
5.64E-08
Ps90%/90% (-KTL) Un-Biased
-1.45E-07 -1.51E-07 -1.46E-07 -1.63E-07 -1.69E-07 -1.61E-07 -1.68E-07
Specification MIN
-1.00E-06 -2.00E-06 -2.50E-06 -2.50E-06 -5.00E-06 -5.00E-06 -5.00E-06
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
1.00E-06
2.00E-06
2.50E-06
2.50E-06
5.00E-06
5.00E-06
5.00E-06
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-05
Positive Input Bias Current (A)
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.5. Plot of Positive Input Bias Current (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.5. Raw data for Positive Input Bias Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current (A)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.92E-06
4.95E-06
4.41E-06
4.12E-06
3.80E-06
4.33E-06
3.91E-06
3.32E-06
3.37E-06
3.82E-06
6.10E-06
5.32E-06
10
3.98E-06
5.02E-06
4.47E-06
4.19E-06
3.86E-06
4.54E-06
4.12E-06
3.50E-06
3.55E-06
4.01E-06
6.12E-06
5.31E-06
20
4.05E-06
5.09E-06
4.54E-06
4.25E-06
3.94E-06
4.80E-06
4.37E-06
3.73E-06
3.78E-06
4.26E-06
6.12E-06
5.32E-06
30
4.09E-06
5.13E-06
4.59E-06
4.30E-06
3.98E-06
5.06E-06
4.61E-06
3.93E-06
4.00E-06
4.50E-06
6.10E-06
5.32E-06
50
4.31E-06
5.39E-06
4.84E-06
4.56E-06
4.23E-06
5.62E-06
5.14E-06
4.41E-06
4.48E-06
5.02E-06
6.11E-06
5.31E-06
60
4.32E-06
5.38E-06
4.84E-06
4.56E-06
4.23E-06
5.58E-06
5.09E-06
4.38E-06
4.46E-06
4.98E-06
6.11E-06
5.31E-06
70
4.16E-06
5.21E-06
4.67E-06
4.39E-06
4.07E-06
5.23E-06
4.78E-06
4.08E-06
4.15E-06
4.65E-06
6.12E-06
5.32E-06
4.24E-06
4.59E-07
5.50E-06
2.98E-06
4.31E-06
4.62E-07
5.57E-06
3.04E-06
4.37E-06
4.63E-07
5.64E-06
3.10E-06
4.42E-06
4.62E-07
5.69E-06
3.15E-06
4.67E-06
4.70E-07
5.95E-06
3.38E-06
4.67E-06
4.64E-07
5.94E-06
3.40E-06
4.50E-06
4.59E-07
5.76E-06
3.24E-06
3.75E-06
3.95E-06
4.19E-06
4.42E-06
4.93E-06
4.90E-06
4.58E-06
4.18E-07
4.31E-07
4.46E-07
4.66E-07
5.02E-07
4.94E-07
4.75E-07
4.90E-06
5.13E-06
5.41E-06
5.70E-06
6.31E-06
6.25E-06
5.88E-06
2.60E-06
2.76E-06
2.97E-06
3.14E-06
3.56E-06
3.54E-06
3.28E-06
-1.00E-05 -1.20E-05 -1.20E-05 -1.20E-05 -1.50E-05 -1.50E-05 -1.50E-05
PASS
PASS
PASS
PASS
PASS
PASS
PASS
1.00E-05
1.20E-05
1.20E-05
1.20E-05
1.50E-05
1.50E-05
1.50E-05
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current (A)
2.00E-05
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.6. Plot of Negative Input Bias Current (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.6. Raw data for Negative Input Bias Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current (A)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
4.09E-06
4.89E-06
4.48E-06
4.24E-06
3.76E-06
4.43E-06
3.95E-06
3.39E-06
3.40E-06
3.82E-06
6.47E-06
5.35E-06
10
4.31E-06
5.14E-06
4.74E-06
4.49E-06
3.99E-06
4.65E-06
4.16E-06
3.58E-06
3.59E-06
4.03E-06
6.48E-06
5.36E-06
20
4.60E-06
5.45E-06
5.06E-06
4.80E-06
4.29E-06
4.91E-06
4.41E-06
3.80E-06
3.82E-06
4.28E-06
6.49E-06
5.36E-06
30
4.88E-06
5.76E-06
5.37E-06
5.10E-06
4.57E-06
5.17E-06
4.65E-06
4.02E-06
4.04E-06
4.52E-06
6.47E-06
5.36E-06
50
5.37E-06
6.33E-06
5.94E-06
5.69E-06
5.14E-06
5.75E-06
5.19E-06
4.50E-06
4.53E-06
5.06E-06
6.47E-06
5.35E-06
60
5.39E-06
6.30E-06
5.89E-06
5.65E-06
5.11E-06
5.70E-06
5.15E-06
4.47E-06
4.49E-06
5.02E-06
6.47E-06
5.35E-06
70
4.98E-06
5.87E-06
5.45E-06
5.21E-06
4.66E-06
5.35E-06
4.83E-06
4.16E-06
4.19E-06
4.68E-06
6.48E-06
5.36E-06
4.29E-06
4.26E-07
5.46E-06
3.12E-06
4.53E-06
4.37E-07
5.73E-06
3.33E-06
4.84E-06
4.40E-07
6.05E-06
3.63E-06
5.14E-06
4.55E-07
6.38E-06
3.89E-06
5.69E-06
4.67E-07
6.97E-06
4.41E-06
5.67E-06
4.59E-07
6.93E-06
4.41E-06
5.23E-06
4.59E-07
6.49E-06
3.97E-06
3.80E-06
4.00E-06
4.24E-06
4.48E-06
5.00E-06
4.96E-06
4.64E-06
4.32E-07
4.46E-07
4.62E-07
4.80E-07
5.18E-07
5.12E-07
4.96E-07
4.98E-06
5.22E-06
5.51E-06
5.80E-06
6.42E-06
6.37E-06
6.00E-06
2.61E-06
2.78E-06
2.98E-06
3.16E-06
3.58E-06
3.56E-06
3.28E-06
-1.00E-05 -1.20E-05 -1.20E-05 -1.20E-05 -1.50E-05 -1.50E-05 -1.50E-05
PASS
PASS
PASS
PASS
PASS
PASS
PASS
1.00E-05
1.20E-05
1.20E-05
1.20E-05
1.50E-05
1.50E-05
1.50E-05
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-05
Average Input Bias Current (A)
1.50E-05
1.00E-05
5.00E-06
0.00E+00
-5.00E-06
-1.00E-05
-1.50E-05
-2.00E-05
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.7. Plot of Average Input Bias Current (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.7. Raw data for Average Input Bias Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Average Input Bias Current (A)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
4.00E-06
4.92E-06
4.45E-06
4.18E-06
3.78E-06
4.38E-06
3.93E-06
3.36E-06
3.38E-06
3.82E-06
6.29E-06
5.33E-06
10
4.15E-06
5.08E-06
4.60E-06
4.34E-06
3.93E-06
4.60E-06
4.14E-06
3.54E-06
3.57E-06
4.02E-06
6.30E-06
5.34E-06
20
4.33E-06
5.27E-06
4.80E-06
4.53E-06
4.12E-06
4.86E-06
4.39E-06
3.77E-06
3.80E-06
4.27E-06
6.30E-06
5.34E-06
30
4.49E-06
5.45E-06
4.98E-06
4.70E-06
4.28E-06
5.12E-06
4.63E-06
3.97E-06
4.02E-06
4.51E-06
6.29E-06
5.34E-06
50
4.84E-06
5.86E-06
5.39E-06
5.12E-06
4.69E-06
5.69E-06
5.16E-06
4.45E-06
4.50E-06
5.04E-06
6.29E-06
5.33E-06
60
4.86E-06
5.84E-06
5.36E-06
5.11E-06
4.67E-06
5.64E-06
5.12E-06
4.42E-06
4.47E-06
5.00E-06
6.29E-06
5.33E-06
70
4.57E-06
5.54E-06
5.06E-06
4.80E-06
4.37E-06
5.29E-06
4.80E-06
4.12E-06
4.17E-06
4.67E-06
6.30E-06
5.34E-06
4.26E-06
4.40E-07
5.47E-06
3.06E-06
4.42E-06
4.47E-07
5.64E-06
3.19E-06
4.61E-06
4.49E-07
5.84E-06
3.38E-06
4.78E-06
4.56E-07
6.03E-06
3.53E-06
5.18E-06
4.66E-07
6.46E-06
3.90E-06
5.17E-06
4.59E-07
6.43E-06
3.91E-06
4.87E-06
4.56E-07
6.12E-06
3.62E-06
3.78E-06
3.97E-06
4.22E-06
4.45E-06
4.97E-06
4.93E-06
4.61E-06
4.25E-07
4.38E-07
4.54E-07
4.73E-07
5.10E-07
5.03E-07
4.85E-07
4.94E-06
5.17E-06
5.46E-06
5.75E-06
6.37E-06
6.31E-06
5.94E-06
2.61E-06
2.77E-06
2.97E-06
3.15E-06
3.57E-06
3.55E-06
3.28E-06
-1.00E-05 -1.20E-05 -1.20E-05 -1.20E-05 -1.50E-05 -1.50E-05 -1.50E-05
PASS
PASS
PASS
PASS
PASS
PASS
PASS
1.00E-05
1.20E-05
1.20E-05
1.20E-05
1.50E-05
1.50E-05
1.50E-05
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
Positive PSRR (dB)
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.8. Plot of Positive PSRR (dB) versus total dose. The solid diamonds are the average of the measured
data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.8. Raw data for Positive PSRR (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive PSRR (dB)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
9.39E+01
8.59E+01
8.70E+01
9.59E+01
9.78E+01
9.27E+01
9.15E+01
6.16E+01
9.11E+01
9.02E+01
7.91E+01
8.84E+01
10
7.05E+01
6.51E+01
8.42E+01
8.94E+01
1.35E+02
8.65E+01
1.08E+02
6.56E+01
1.05E+02
1.04E+02
7.77E+01
8.53E+01
20
7.01E+01
6.52E+01
8.31E+01
8.81E+01
1.02E+02
8.42E+01
1.01E+02
1.16E+02
1.03E+02
1.02E+02
7.78E+01
8.77E+01
30
6.99E+01
6.56E+01
8.31E+01
8.76E+01
1.02E+02
8.29E+01
9.41E+01
5.67E+01
9.56E+01
9.52E+01
7.80E+01
8.54E+01
50
8.67E+01
6.50E+01
8.18E+01
8.25E+01
9.44E+01
8.02E+01
8.80E+01
6.46E+01
8.85E+01
8.78E+01
7.80E+01
8.73E+01
24-hr
Anneal
168-hr
Anneal
60
6.85E+01
6.50E+01
8.16E+01
8.56E+01
9.35E+01
8.04E+01
8.78E+01
6.73E+01
8.89E+01
8.82E+01
7.78E+01
8.54E+01
70
8.69E+01
6.43E+01
8.29E+01
8.73E+01
1.02E+02
8.17E+01
9.07E+01
6.60E+01
9.24E+01
9.20E+01
7.78E+01
9.36E+01
Biased Statistics
Average Biased
9.21E+01 8.88E+01 8.18E+01 8.17E+01 8.20E+01 7.88E+01 8.46E+01
Std Dev Biased
5.33E+00 2.74E+01 1.48E+01 1.47E+01 1.08E+01 1.19E+01 1.35E+01
Ps90%/90% (+KTL) Biased
1.07E+02 1.64E+02 1.22E+02 1.22E+02 1.12E+02 1.12E+02 1.22E+02
Ps90%/90% (-KTL) Biased
7.75E+01 1.36E+01 4.12E+01 4.15E+01 5.25E+01 4.61E+01 4.77E+01
Un-Biased Statistics
Average Un-Biased
8.54E+01 9.39E+01 1.01E+02 8.49E+01 8.18E+01 8.25E+01 8.45E+01
Std Dev Un-Biased
1.33E+01 1.80E+01 1.14E+01 1.66E+01 1.02E+01 9.15E+00 1.13E+01
Ps90%/90% (+KTL) Un-Biased
1.22E+02 1.43E+02 1.33E+02 1.30E+02 1.10E+02 1.08E+02 1.15E+02
Ps90%/90% (-KTL) Un-Biased
4.89E+01 4.46E+01 7.00E+01 3.93E+01 5.38E+01 5.74E+01 5.37E+01
Specification MIN
6.00E+01 6.00E+01 5.80E+01 5.80E+01 5.60E+01 5.60E+01 5.60E+01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
Negative PSRR (dB)
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.9. Plot of Negative PSRR (dB) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.9. Raw data for Negative PSRR (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative PSRR (dB)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
1.06E+02
1.10E+02
1.05E+02
1.06E+02
1.08E+02
1.07E+02
1.08E+02
1.07E+02
1.06E+02
1.05E+02
1.06E+02
1.08E+02
10
1.05E+02
1.09E+02
1.05E+02
1.06E+02
1.07E+02
1.05E+02
1.07E+02
1.06E+02
1.05E+02
1.06E+02
1.06E+02
1.08E+02
20
1.05E+02
1.09E+02
1.05E+02
1.05E+02
1.07E+02
1.06E+02
1.07E+02
1.06E+02
1.06E+02
1.06E+02
1.07E+02
1.08E+02
30
7.92E+01
1.09E+02
1.05E+02
1.05E+02
1.07E+02
1.05E+02
1.08E+02
1.06E+02
1.06E+02
1.06E+02
1.06E+02
1.08E+02
50
1.05E+02
1.09E+02
1.05E+02
1.06E+02
1.07E+02
1.06E+02
1.08E+02
1.07E+02
1.06E+02
1.06E+02
1.06E+02
1.08E+02
24-hr
Anneal
168-hr
Anneal
60
1.06E+02
1.09E+02
1.05E+02
1.05E+02
1.07E+02
1.06E+02
1.07E+02
1.07E+02
1.05E+02
1.06E+02
1.06E+02
1.09E+02
70
1.05E+02
1.09E+02
1.05E+02
1.05E+02
1.07E+02
1.05E+02
1.08E+02
1.07E+02
1.06E+02
1.06E+02
1.06E+02
1.08E+02
Biased Statistics
Average Biased
1.07E+02 1.06E+02 1.06E+02 1.01E+02 1.06E+02 1.06E+02 1.06E+02
Std Dev Biased
2.11E+00 1.56E+00 1.60E+00 1.23E+01 1.45E+00 1.63E+00 1.74E+00
Ps90%/90% (+KTL) Biased
1.13E+02 1.11E+02 1.11E+02 1.35E+02 1.10E+02 1.11E+02 1.11E+02
Ps90%/90% (-KTL) Biased
1.01E+02 1.02E+02 1.02E+02 6.73E+01 1.02E+02 1.02E+02 1.02E+02
Un-Biased Statistics
Average Un-Biased
1.07E+02 1.06E+02 1.06E+02 1.06E+02 1.06E+02 1.06E+02 1.06E+02
Std Dev Un-Biased
1.13E+00
8.31E-01
6.56E-01
8.55E-01
8.12E-01
8.27E-01
8.15E-01
Ps90%/90% (+KTL) Un-Biased
1.10E+02 1.08E+02 1.08E+02 1.09E+02 1.09E+02 1.09E+02 1.09E+02
Ps90%/90% (-KTL) Un-Biased
1.04E+02 1.04E+02 1.04E+02 1.04E+02 1.04E+02 1.04E+02 1.04E+02
Specification MIN
8.00E+01 7.80E+01 7.60E+01 7.60E+01 7.40E+01 7.40E+01 7.40E+01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
2.80E+03
Small-Signal Voltage Gain (V/V)
2.60E+03
2.40E+03
2.20E+03
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.10. Plot of Small-Signal Voltage Gain (V/V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.10. Raw data for Small-Signal Voltage Gain (V/V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Small-Signal Voltage Gain (V/V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
2.49E+03
2.46E+03
2.42E+03
2.42E+03
2.53E+03
2.49E+03
2.56E+03
2.75E+03
2.63E+03
2.55E+03
2.11E+03
2.38E+03
10
2.55E+03
2.51E+03
2.47E+03
2.47E+03
2.58E+03
2.54E+03
2.60E+03
2.80E+03
2.69E+03
2.60E+03
2.15E+03
2.43E+03
20
2.55E+03
2.50E+03
2.46E+03
2.46E+03
2.58E+03
2.52E+03
2.59E+03
2.79E+03
2.66E+03
2.58E+03
2.14E+03
2.42E+03
30
2.54E+03
2.51E+03
2.46E+03
2.47E+03
2.57E+03
2.50E+03
2.58E+03
2.78E+03
2.65E+03
2.57E+03
2.15E+03
2.44E+03
50
2.54E+03
2.49E+03
2.45E+03
2.45E+03
2.55E+03
2.46E+03
2.54E+03
2.74E+03
2.61E+03
2.53E+03
2.16E+03
2.44E+03
60
2.53E+03
2.49E+03
2.45E+03
2.44E+03
2.55E+03
2.47E+03
2.54E+03
2.74E+03
2.61E+03
2.53E+03
2.15E+03
2.44E+03
70
2.51E+03
2.48E+03
2.44E+03
2.44E+03
2.55E+03
2.48E+03
2.55E+03
2.75E+03
2.63E+03
2.55E+03
2.14E+03
2.43E+03
2.46E+03
4.78E+01
2.59E+03
2.33E+03
2.52E+03
4.84E+01
2.65E+03
2.39E+03
2.51E+03
5.14E+01
2.65E+03
2.37E+03
2.51E+03
4.77E+01
2.64E+03
2.38E+03
2.50E+03
4.84E+01
2.63E+03
2.36E+03
2.49E+03
4.77E+01
2.62E+03
2.36E+03
2.48E+03
4.68E+01
2.61E+03
2.36E+03
2.59E+03 2.65E+03 2.63E+03 2.62E+03 2.58E+03 2.58E+03 2.59E+03
9.90E+01 1.04E+02 1.06E+02 1.06E+02 1.05E+02 1.04E+02 1.04E+02
2.86E+03 2.93E+03 2.92E+03 2.91E+03 2.86E+03 2.86E+03 2.88E+03
2.32E+03 2.36E+03 2.34E+03 2.32E+03 2.29E+03 2.29E+03 2.31E+03
1.40E+03 1.30E+03 1.20E+03 1.20E+03 1.10E+03 1.10E+03 1.10E+03
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.50E+01
CMRR (dB)
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.11. Plot of CMRR (dB) versus total dose. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
27
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.11. Raw data for CMRR (dB) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
CMRR (dB)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
9.34E+01
9.31E+01
9.31E+01
9.29E+01
9.35E+01
9.33E+01
9.36E+01
9.48E+01
9.42E+01
9.37E+01
9.11E+01
9.30E+01
10
8.90E+01
8.88E+01
8.87E+01
8.87E+01
8.91E+01
8.90E+01
8.92E+01
9.02E+01
8.97E+01
8.92E+01
8.72E+01
8.86E+01
20
8.87E+01
8.85E+01
8.84E+01
8.84E+01
8.89E+01
8.86E+01
8.89E+01
8.99E+01
8.94E+01
8.90E+01
8.68E+01
8.83E+01
30
8.89E+01
8.87E+01
8.86E+01
8.86E+01
8.90E+01
8.88E+01
8.91E+01
9.00E+01
8.95E+01
8.91E+01
8.70E+01
8.85E+01
50
8.88E+01
8.85E+01
8.85E+01
8.84E+01
8.89E+01
8.86E+01
8.89E+01
8.99E+01
8.94E+01
8.89E+01
8.70E+01
8.85E+01
24-hr
Anneal
168-hr
Anneal
60
8.89E+01
8.87E+01
8.86E+01
8.86E+01
8.90E+01
8.87E+01
8.90E+01
9.00E+01
8.95E+01
8.91E+01
8.71E+01
8.86E+01
70
8.88E+01
8.86E+01
8.84E+01
8.84E+01
8.89E+01
8.87E+01
8.89E+01
8.99E+01
8.94E+01
8.90E+01
8.70E+01
8.85E+01
Biased Statistics
Average Biased
9.32E+01 8.89E+01 8.86E+01 8.87E+01 8.86E+01 8.87E+01 8.86E+01
Std Dev Biased
2.56E-01
2.01E-01
2.16E-01
1.99E-01
2.09E-01
2.03E-01
2.00E-01
Ps90%/90% (+KTL) Biased
9.39E+01 8.94E+01 8.92E+01 8.93E+01 8.92E+01 8.93E+01 8.92E+01
Ps90%/90% (-KTL) Biased
9.25E+01 8.83E+01 8.80E+01 8.82E+01 8.81E+01 8.82E+01 8.81E+01
Un-Biased Statistics
Average Un-Biased
9.39E+01 8.95E+01 8.92E+01 8.93E+01 8.91E+01 8.93E+01 8.92E+01
Std Dev Un-Biased
5.98E-01
4.78E-01
4.89E-01
4.87E-01
4.92E-01
5.08E-01
4.96E-01
Ps90%/90% (+KTL) Un-Biased
9.55E+01 9.08E+01 9.05E+01 9.06E+01 9.05E+01 9.07E+01 9.06E+01
Ps90%/90% (-KTL) Un-Biased
9.23E+01 8.82E+01 8.78E+01 8.80E+01 8.78E+01 8.79E+01 8.78E+01
Specification MIN
8.00E+01 8.00E+01 7.70E+01 7.70E+01 7.40E+01 7.40E+01 7.40E+01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output High Voltage IOUT=1mA - Q (V)
3.40E+00
3.20E+00
3.00E+00
2.80E+00
2.60E+00
2.40E+00
2.20E+00
2.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.12. Plot of Output High Voltage IOUT=1mA - Q (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
29
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.12. Raw data for Output High Voltage IOUT=1mA - Q (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output High Voltage IOUT=1mA - Q (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
3.22E+00
3.20E+00
3.21E+00
3.21E+00
3.23E+00
3.21E+00
3.22E+00
3.24E+00
3.23E+00
3.23E+00
3.18E+00
3.19E+00
10
3.21E+00
3.19E+00
3.20E+00
3.19E+00
3.22E+00
3.20E+00
3.21E+00
3.23E+00
3.22E+00
3.21E+00
3.17E+00
3.18E+00
20
3.21E+00
3.19E+00
3.20E+00
3.19E+00
3.21E+00
3.20E+00
3.20E+00
3.22E+00
3.22E+00
3.21E+00
3.17E+00
3.18E+00
30
3.21E+00
3.19E+00
3.20E+00
3.19E+00
3.21E+00
3.20E+00
3.21E+00
3.23E+00
3.22E+00
3.21E+00
3.17E+00
3.18E+00
50
3.23E+00
3.20E+00
3.20E+00
3.20E+00
3.22E+00
3.20E+00
3.21E+00
3.23E+00
3.22E+00
3.21E+00
3.17E+00
3.18E+00
60
3.22E+00
3.20E+00
3.20E+00
3.20E+00
3.22E+00
3.20E+00
3.21E+00
3.23E+00
3.22E+00
3.21E+00
3.17E+00
3.18E+00
70
3.21E+00
3.19E+00
3.20E+00
3.19E+00
3.21E+00
3.20E+00
3.20E+00
3.22E+00
3.22E+00
3.21E+00
3.17E+00
3.18E+00
3.21E+00
1.08E-02
3.24E+00
3.18E+00
3.20E+00
1.07E-02
3.23E+00
3.17E+00
3.20E+00
1.04E-02
3.23E+00
3.17E+00
3.20E+00
1.02E-02
3.23E+00
3.18E+00
3.21E+00
1.46E-02
3.25E+00
3.17E+00
3.20E+00
1.01E-02
3.23E+00
3.18E+00
3.20E+00
1.07E-02
3.23E+00
3.17E+00
3.23E+00 3.21E+00 3.21E+00 3.21E+00 3.21E+00 3.21E+00 3.21E+00
1.16E-02
1.08E-02
1.10E-02
1.14E-02
1.08E-02
1.07E-02
1.11E-02
3.26E+00 3.24E+00 3.24E+00 3.24E+00 3.24E+00 3.24E+00 3.24E+00
3.20E+00 3.18E+00 3.18E+00 3.18E+00 3.18E+00 3.18E+00 3.18E+00
2.65E+00 2.65E+00 2.65E+00 2.65E+00 2.64E+00 2.64E+00 2.64E+00
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output High Voltage IOUT=10mA - Q (V)
3.20E+00
3.00E+00
2.80E+00
2.60E+00
2.40E+00
2.20E+00
2.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.13. Plot of Output High Voltage IOUT=10mA - Q (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
31
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.13. Raw data for Output High Voltage IOUT=10mA - Q (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output High Voltage IOUT=10mA - Q (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
3.04E+00
3.02E+00
3.03E+00
3.02E+00
3.04E+00
3.03E+00
3.04E+00
3.05E+00
3.05E+00
3.04E+00
3.00E+00
3.01E+00
10
3.03E+00
3.01E+00
3.02E+00
3.01E+00
3.03E+00
3.02E+00
3.02E+00
3.04E+00
3.04E+00
3.03E+00
2.99E+00
3.00E+00
20
3.03E+00
3.01E+00
3.01E+00
3.01E+00
3.03E+00
3.01E+00
3.02E+00
3.04E+00
3.03E+00
3.02E+00
2.99E+00
2.99E+00
30
3.03E+00
3.01E+00
3.02E+00
3.01E+00
3.03E+00
3.02E+00
3.02E+00
3.04E+00
3.04E+00
3.03E+00
2.99E+00
3.00E+00
50
3.04E+00
3.01E+00
3.02E+00
3.01E+00
3.03E+00
3.02E+00
3.03E+00
3.04E+00
3.04E+00
3.03E+00
2.99E+00
3.00E+00
60
3.03E+00
3.01E+00
3.02E+00
3.01E+00
3.03E+00
3.02E+00
3.02E+00
3.04E+00
3.04E+00
3.03E+00
2.99E+00
3.00E+00
70
3.03E+00
3.01E+00
3.02E+00
3.01E+00
3.03E+00
3.02E+00
3.02E+00
3.04E+00
3.03E+00
3.03E+00
2.99E+00
3.00E+00
3.03E+00
9.89E-03
3.06E+00
3.00E+00
3.02E+00
9.86E-03
3.05E+00
2.99E+00
3.02E+00
9.31E-03
3.04E+00
2.99E+00
3.02E+00
9.18E-03
3.04E+00
2.99E+00
3.02E+00
1.26E-02
3.06E+00
2.99E+00
3.02E+00
9.37E-03
3.05E+00
2.99E+00
3.02E+00
9.83E-03
3.04E+00
2.99E+00
3.04E+00 3.03E+00 3.03E+00 3.03E+00 3.03E+00 3.03E+00 3.03E+00
9.66E-03
9.58E-03
9.53E-03
9.98E-03
9.39E-03
9.24E-03
9.71E-03
3.07E+00 3.06E+00 3.05E+00 3.06E+00 3.06E+00 3.05E+00 3.05E+00
3.02E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00
2.40E+00 2.40E+00 2.40E+00 2.40E+00 2.39E+00 2.39E+00 2.39E+00
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Low Voltage ISINK=4mA - Q (V)
6.00E-01
5.50E-01
5.00E-01
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.14. Plot of Output Low Voltage ISINK=4mA - Q (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
33
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.14. Raw data for Output Low Voltage ISINK=4mA - Q (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Low Voltage ISINK=4mA - Q (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.18E-01
3.06E-01
3.30E-01
3.25E-01
3.17E-01
3.26E-01
3.19E-01
2.99E-01
3.17E-01
3.22E-01
3.52E-01
2.93E-01
10
3.18E-01
3.07E-01
3.30E-01
3.26E-01
3.18E-01
3.26E-01
3.19E-01
3.00E-01
3.18E-01
3.23E-01
3.53E-01
2.95E-01
20
3.18E-01
3.07E-01
3.30E-01
3.26E-01
3.19E-01
3.26E-01
3.19E-01
3.00E-01
3.18E-01
3.23E-01
3.52E-01
2.94E-01
30
3.19E-01
3.07E-01
3.30E-01
3.27E-01
3.19E-01
3.27E-01
3.20E-01
3.00E-01
3.19E-01
3.23E-01
3.53E-01
2.94E-01
50
3.15E-01
3.07E-01
3.30E-01
3.26E-01
3.18E-01
3.26E-01
3.19E-01
3.00E-01
3.18E-01
3.23E-01
3.52E-01
2.93E-01
60
3.18E-01
3.07E-01
3.30E-01
3.26E-01
3.18E-01
3.26E-01
3.19E-01
2.99E-01
3.18E-01
3.23E-01
3.52E-01
2.93E-01
70
3.21E-01
3.11E-01
3.34E-01
3.30E-01
3.23E-01
3.30E-01
3.23E-01
3.03E-01
3.22E-01
3.26E-01
3.53E-01
2.95E-01
3.19E-01
9.09E-03
3.44E-01
2.94E-01
3.20E-01
8.84E-03
3.44E-01
2.96E-01
3.20E-01
8.80E-03
3.44E-01
2.96E-01
3.20E-01
8.93E-03
3.45E-01
2.96E-01
3.19E-01
9.09E-03
3.44E-01
2.94E-01
3.20E-01
8.84E-03
3.44E-01
2.96E-01
3.24E-01
8.87E-03
3.48E-01
2.99E-01
3.17E-01
3.17E-01
3.17E-01
3.18E-01
3.17E-01
3.17E-01
3.21E-01
1.04E-02
1.01E-02
1.01E-02
1.04E-02
1.01E-02
1.06E-02
1.04E-02
3.45E-01
3.45E-01
3.45E-01
3.46E-01
3.45E-01
3.46E-01
3.49E-01
2.88E-01
2.89E-01
2.89E-01
2.89E-01
2.89E-01
2.88E-01
2.92E-01
5.50E-01
5.50E-01
5.50E-01
5.50E-01
5.60E-01
5.60E-01
5.60E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output High Voltage IOUT=1mA - Q# (V)
3.40E+00
3.20E+00
3.00E+00
2.80E+00
2.60E+00
2.40E+00
2.20E+00
2.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.15. Plot of Output High Voltage IOUT=1mA - Q# (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
35
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.15. Raw data for Output High Voltage IOUT=1mA - Q# (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output High Voltage IOUT=1mA - Q# (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
3.23E+00
3.21E+00
3.21E+00
3.21E+00
3.23E+00
3.22E+00
3.23E+00
3.25E+00
3.24E+00
3.23E+00
3.18E+00
3.22E+00
10
3.22E+00
3.20E+00
3.20E+00
3.21E+00
3.22E+00
3.21E+00
3.21E+00
3.23E+00
3.22E+00
3.22E+00
3.17E+00
3.21E+00
20
3.21E+00
3.20E+00
3.19E+00
3.20E+00
3.21E+00
3.21E+00
3.21E+00
3.23E+00
3.22E+00
3.21E+00
3.17E+00
3.21E+00
30
3.22E+00
3.20E+00
3.20E+00
3.20E+00
3.22E+00
3.21E+00
3.21E+00
3.23E+00
3.22E+00
3.22E+00
3.17E+00
3.21E+00
50
3.23E+00
3.21E+00
3.20E+00
3.21E+00
3.22E+00
3.21E+00
3.22E+00
3.23E+00
3.22E+00
3.22E+00
3.18E+00
3.22E+00
60
3.22E+00
3.21E+00
3.20E+00
3.21E+00
3.22E+00
3.21E+00
3.21E+00
3.23E+00
3.22E+00
3.21E+00
3.17E+00
3.21E+00
70
3.22E+00
3.20E+00
3.19E+00
3.20E+00
3.22E+00
3.21E+00
3.21E+00
3.23E+00
3.22E+00
3.21E+00
3.17E+00
3.21E+00
3.22E+00
9.73E-03
3.25E+00
3.19E+00
3.21E+00
9.40E-03
3.23E+00
3.18E+00
3.20E+00
9.39E-03
3.23E+00
3.18E+00
3.21E+00
9.37E-03
3.23E+00
3.18E+00
3.21E+00
1.35E-02
3.25E+00
3.18E+00
3.21E+00
9.37E-03
3.24E+00
3.18E+00
3.21E+00
9.94E-03
3.23E+00
3.18E+00
3.23E+00 3.22E+00 3.22E+00 3.22E+00 3.22E+00 3.22E+00 3.22E+00
1.01E-02
9.18E-03
9.53E-03
1.01E-02
9.27E-03
9.24E-03
9.68E-03
3.26E+00 3.24E+00 3.24E+00 3.25E+00 3.25E+00 3.24E+00 3.24E+00
3.21E+00 3.19E+00 3.19E+00 3.19E+00 3.19E+00 3.19E+00 3.19E+00
2.65E+00 2.65E+00 2.65E+00 2.65E+00 2.64E+00 2.64E+00 2.64E+00
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output High Voltage IOUT=10mA - Q# (V)
3.20E+00
3.00E+00
2.80E+00
2.60E+00
2.40E+00
2.20E+00
2.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.16. Plot of Output High Voltage IOUT=10mA - Q# (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
37
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.16. Raw data for Output High Voltage IOUT=10mA - Q# (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output High Voltage IOUT=10mA - Q# (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
3.06E+00
3.05E+00
3.04E+00
3.05E+00
3.06E+00
3.06E+00
3.06E+00
3.08E+00
3.07E+00
3.06E+00
3.02E+00
3.05E+00
10
3.05E+00
3.04E+00
3.03E+00
3.04E+00
3.05E+00
3.04E+00
3.05E+00
3.06E+00
3.06E+00
3.05E+00
3.01E+00
3.04E+00
20
3.05E+00
3.03E+00
3.03E+00
3.04E+00
3.05E+00
3.04E+00
3.04E+00
3.06E+00
3.05E+00
3.05E+00
3.01E+00
3.04E+00
30
3.05E+00
3.04E+00
3.03E+00
3.04E+00
3.05E+00
3.04E+00
3.05E+00
3.07E+00
3.06E+00
3.05E+00
3.01E+00
3.05E+00
50
3.07E+00
3.04E+00
3.03E+00
3.04E+00
3.05E+00
3.04E+00
3.05E+00
3.07E+00
3.06E+00
3.05E+00
3.01E+00
3.05E+00
60
3.05E+00
3.04E+00
3.03E+00
3.04E+00
3.05E+00
3.05E+00
3.05E+00
3.07E+00
3.06E+00
3.05E+00
3.01E+00
3.05E+00
70
3.05E+00
3.04E+00
3.03E+00
3.04E+00
3.05E+00
3.04E+00
3.04E+00
3.06E+00
3.05E+00
3.05E+00
3.01E+00
3.04E+00
3.05E+00
9.09E-03
3.08E+00
3.03E+00
3.04E+00
8.90E-03
3.07E+00
3.02E+00
3.04E+00
8.73E-03
3.06E+00
3.01E+00
3.04E+00
8.47E-03
3.07E+00
3.02E+00
3.05E+00
1.24E-02
3.08E+00
3.01E+00
3.04E+00
8.73E-03
3.07E+00
3.02E+00
3.04E+00
9.02E-03
3.06E+00
3.01E+00
3.06E+00 3.05E+00 3.05E+00 3.05E+00 3.05E+00 3.05E+00 3.05E+00
8.26E-03
8.11E-03
8.03E-03
8.65E-03
8.04E-03
8.04E-03
8.23E-03
3.09E+00 3.07E+00 3.07E+00 3.08E+00 3.07E+00 3.07E+00 3.07E+00
3.04E+00 3.03E+00 3.03E+00 3.03E+00 3.03E+00 3.03E+00 3.03E+00
2.40E+00 2.40E+00 2.40E+00 2.40E+00 2.39E+00 2.39E+00 2.39E+00
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Low Voltage ISINK=4mA - Q# (V)
6.00E-01
5.50E-01
5.00E-01
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.17. Plot of Output Low Voltage ISINK=4mA - Q# (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
39
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.17. Raw data for Output Low Voltage ISINK=4mA - Q# (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Low Voltage ISINK=4mA - Q# (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.21E-01
3.21E-01
3.20E-01
3.33E-01
3.23E-01
3.33E-01
3.22E-01
3.14E-01
3.16E-01
3.22E-01
3.45E-01
3.30E-01
10
3.21E-01
3.21E-01
3.20E-01
3.33E-01
3.24E-01
3.34E-01
3.23E-01
3.15E-01
3.17E-01
3.23E-01
3.46E-01
3.32E-01
20
3.21E-01
3.21E-01
3.20E-01
3.33E-01
3.24E-01
3.34E-01
3.22E-01
3.14E-01
3.17E-01
3.23E-01
3.46E-01
3.31E-01
30
3.21E-01
3.22E-01
3.20E-01
3.34E-01
3.24E-01
3.34E-01
3.23E-01
3.15E-01
3.17E-01
3.23E-01
3.46E-01
3.31E-01
50
3.17E-01
3.21E-01
3.19E-01
3.32E-01
3.23E-01
3.34E-01
3.22E-01
3.14E-01
3.16E-01
3.23E-01
3.45E-01
3.30E-01
60
3.21E-01
3.21E-01
3.19E-01
3.33E-01
3.23E-01
3.33E-01
3.23E-01
3.14E-01
3.17E-01
3.23E-01
3.46E-01
3.30E-01
70
3.24E-01
3.25E-01
3.23E-01
3.37E-01
3.27E-01
3.38E-01
3.26E-01
3.17E-01
3.20E-01
3.26E-01
3.46E-01
3.31E-01
3.24E-01
5.37E-03
3.38E-01
3.09E-01
3.24E-01
5.36E-03
3.38E-01
3.09E-01
3.24E-01
5.36E-03
3.38E-01
3.09E-01
3.24E-01
5.67E-03
3.40E-01
3.09E-01
3.22E-01
5.81E-03
3.38E-01
3.06E-01
3.23E-01
5.55E-03
3.39E-01
3.08E-01
3.27E-01
5.67E-03
3.43E-01
3.12E-01
3.21E-01
3.22E-01
3.22E-01
3.22E-01
3.22E-01
3.22E-01
3.25E-01
7.40E-03
7.40E-03
7.65E-03
7.40E-03
7.82E-03
7.28E-03
8.05E-03
3.42E-01
3.43E-01
3.43E-01
3.43E-01
3.43E-01
3.42E-01
3.47E-01
3.01E-01
3.02E-01
3.01E-01
3.02E-01
3.00E-01
3.02E-01
3.03E-01
5.50E-01
5.50E-01
5.50E-01
5.50E-01
5.60E-01
5.60E-01
5.60E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
LATCH Pin Input Voltage Threshold (V)
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.18. Plot of LATCH Pin Input Voltage Threshold (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
41
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.18. Raw data for LATCH Pin Input Voltage Threshold (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
LATCH Pin Input Voltage Threshold (V)
Device
774
775
776
777
779
780
781
782
783
785
797
798
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.71E+00
1.71E+00
1.72E+00
1.71E+00
1.72E+00
1.72E+00
1.72E+00
1.71E+00
1.71E+00
1.72E+00
1.73E+00
1.73E+00
10
1.69E+00
1.69E+00
1.70E+00
1.69E+00
1.69E+00
1.70E+00
1.70E+00
1.69E+00
1.69E+00
1.69E+00
1.71E+00
1.70E+00
20
1.70E+00
1.70E+00
1.71E+00
1.70E+00
1.71E+00
1.71E+00
1.71E+00
1.70E+00
1.70E+00
1.70E+00
1.72E+00
1.71E+00
30
1.69E+00
1.69E+00
1.71E+00
1.70E+00
1.70E+00
1.70E+00
1.70E+00
1.69E+00
1.69E+00
1.70E+00
1.71E+00
1.70E+00
50
1.68E+00
1.69E+00
1.70E+00
1.70E+00
1.69E+00
1.70E+00
1.69E+00
1.69E+00
1.69E+00
1.69E+00
1.71E+00
1.70E+00
60
1.69E+00
1.69E+00
1.70E+00
1.70E+00
1.69E+00
1.70E+00
1.70E+00
1.69E+00
1.69E+00
1.69E+00
1.71E+00
1.70E+00
70
1.69E+00
1.69E+00
1.70E+00
1.70E+00
1.69E+00
1.70E+00
1.70E+00
1.69E+00
1.69E+00
1.69E+00
1.71E+00
1.70E+00
1.72E+00
5.13E-03
1.73E+00
1.70E+00
1.69E+00
4.42E-03
1.71E+00
1.68E+00
1.70E+00
5.59E-03
1.72E+00
1.69E+00
1.70E+00
5.43E-03
1.71E+00
1.68E+00
1.69E+00
7.66E-03
1.71E+00
1.67E+00
1.69E+00
5.73E-03
1.71E+00
1.68E+00
1.69E+00
5.20E-03
1.71E+00
1.68E+00
1.71E+00 1.69E+00 1.70E+00 1.70E+00 1.69E+00 1.69E+00 1.69E+00
6.11E-03
4.02E-03
4.39E-03
5.41E-03
5.43E-03
4.60E-03
5.00E-03
1.73E+00 1.70E+00 1.71E+00 1.71E+00 1.71E+00 1.70E+00 1.71E+00
1.70E+00 1.68E+00 1.69E+00 1.68E+00 1.68E+00 1.68E+00 1.68E+00
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-04
LATCH Pin Current (A)
6.00E-04
5.00E-04
4.00E-04
3.00E-04
2.00E-04
1.00E-04
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.19. Plot of LATCH Pin Current (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
43
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-287 100711 R1.0
Table 5.19. Raw data for LATCH Pin Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
LATCH Pin Current (A)
Device
774
775
776
777
779
780
781
782
783
785
797
798
0
1.53E-04
1.57E-04
1.46E-04
1.57E-04
1.62E-04
1.56E-04
1.38E-04
1.55E-04
1.46E-04
1.68E-04
1.53E-04
1.56E-04
10
1.87E-04
1.71E-04
1.83E-04
1.76E-04
1.75E-04
1.74E-04
1.64E-04
1.67E-04
1.63E-04
1.72E-04
1.67E-04
1.41E-04
20
1.94E-04
2.12E-04
1.86E-04
1.95E-04
2.09E-04
2.05E-04
1.61E-04
1.95E-04
1.64E-04
1.68E-04
1.45E-04
1.45E-04
30
2.06E-04
2.01E-04
2.19E-04
2.15E-04
2.18E-04
2.08E-04
1.81E-04
2.06E-04
1.66E-04
1.71E-04
1.61E-04
1.50E-04
50
2.29E-04
2.46E-04
2.39E-04
2.37E-04
2.55E-04
2.43E-04
2.04E-04
2.38E-04
1.64E-04
1.91E-04
1.63E-04
1.44E-04
24-hr
Anneal
168-hr
Anneal
60
2.33E-04
2.33E-04
2.34E-04
2.42E-04
2.53E-04
2.29E-04
2.18E-04
2.33E-04
1.81E-04
1.87E-04
1.45E-04
1.57E-04
70
2.02E-04
2.06E-04
1.88E-04
2.08E-04
2.16E-04
2.14E-04
1.83E-04
2.05E-04
1.75E-04
1.81E-04
1.48E-04
1.40E-04
Biased Statistics
Average Biased
1.55E-04
1.78E-04
1.99E-04
2.12E-04
2.41E-04
2.39E-04
2.04E-04
Std Dev Biased
6.12E-06
6.56E-06
1.06E-05
7.79E-06
9.77E-06
8.86E-06
1.02E-05
Ps90%/90% (+KTL) Biased
1.72E-04
1.96E-04
2.28E-04
2.33E-04
2.68E-04
2.63E-04
2.32E-04
Ps90%/90% (-KTL) Biased
1.38E-04
1.60E-04
1.70E-04
1.90E-04
2.14E-04
2.15E-04
1.76E-04
Un-Biased Statistics
Average Un-Biased
1.53E-04
1.68E-04
1.79E-04
1.86E-04
2.08E-04
2.10E-04
1.92E-04
Std Dev Un-Biased
1.14E-05
4.62E-06
1.99E-05
1.95E-05
3.28E-05
2.43E-05
1.72E-05
Ps90%/90% (+KTL) Un-Biased
1.84E-04
1.81E-04
2.33E-04
2.40E-04
2.98E-04
2.76E-04
2.39E-04
Ps90%/90% (-KTL) Un-Biased
1.21E-04
1.55E-04
1.24E-04
1.33E-04
1.18E-04
1.43E-04
1.45E-04
Specification MAX
5.00E-04
5.25E-04
5.75E-04
5.75E-04
6.50E-04
6.50E-04
6.50E-04
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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6.0. Summary / Conclusions
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source.
Samples of the RH1016MW UltraFast Precision Comparator described in this report were irradiated
biased with a split ±5V supply and unbiased (all leads tied to ground). The devices were irradiated to a
maximum total ionizing dose level of 50krad(Si) with a pre-rad baseline reading as well as incremental
readings at 10, 20, and 30krad(Si). Electrical testing occurred within one hour following the end of each
irradiation segment. For intermediate irradiations, the units were tested and returned to total dose
exposure within two hours from the end of the previous radiation increment. In addition, all unitsunder-test received a 24hr room temperature and 168hr 100°C anneal, using the same bias conditions as
the radiation exposure.
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in a separate Excel file. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814
using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were
selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the
qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be
met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces
irradiated under electrical bias shall pass the specification value. The units irradiated without electrical
bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated
under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
Using the conditions stated above, the RH1016MW UltraFast Precision Comparator (from the lot date
code identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to
50krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits.
Note that the data for the units-under-test irradiated in the unbiased condition and the KTL statistics
presented in this report are for reference only and are not used for the determination of “PASS/FAIL”
for the lot. Further, the data in this report can be analyzed along with the low dose rate report titled
“Total Ionizing Dose (TID) Testing of the RH1016MW UltraFast Precision Comparator for Linear
Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
(Extracted from LINEAR TECHNOLOGY CORPORATION RH1016M Datasheet)
Biased Samples:
14FP Socket Pin DUT Pin Function Connection / Bias
2
1
V+
To +5V using 0.01μF decoupling to GND
3
2
+IN
To +5V via 5.11kΩ Resistor
To DUT pin 3 via 1kΩ Resistor
4
3
-IN
To -5V via 5.11kΩ Resistor
To DUT pin 2 via 1kΩ Resistor
5
4
V-
To -5V using 0.01μF decoupling to GND
6
5
NC
NC
9
6
NC
NC
10
7
LATCH
To +5V
11
8
GND
GND
12
9
Q OUT
NC
13
10
Q# OUT
NC
Unbiased Samples:
14FP Socket Pin DUT Pin Function Connection / Bias
2
1
V+
GND
3
2
+IN
GND
4
3
-IN
GND
5
4
V-
GND
6
5
NC
GND
9
6
NC
GND
10
7
LATCH
GND
11
8
GND
GND
12
9
Q OUT
GND
13
10
Q# OUT
GND
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was
extracted from LINEAR TECHNOLOGY CORPORATION RH1016M Datasheet.
Figure B.2. W package drawing (for reference only).
TECHNOLOGY CORPORATION RH1016M Datasheet.
This figure was extracted from LINEAR
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0608 Socket Assembly and the RH1016 BGSS-100116 DUT board. The measured parameters and test
conditions are shown in Tables C.1.
A listing of the measurement precision/resolution for each parameter is shown in Tables C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. One such parameter is pre-irradiation Small Signal Voltage
Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard
deviation. If necessary, larger samples sizes could be used to qualify these parameters using an
“attributes” approach.
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Table C.1. Measured parameters and test conditions.
Measured Parameter
Test Conditions
Positive Supply Current (A)
V+ = 5V, V- = -5V
Negative Supply Current (A)
V+ = 5V, V- = -5V
Input Offset Voltage (V)
V+ = 5V, V- = -5V
Input Offset Current (A)
V+ = 5V, V- = -5V
Positive Input Bias Current (A)
V+ = 5V, V- = -5V
Negative Input Bias Current (A)
V+ = 5V, V- = -5V
Average Input Bias Current (A)
V+ = 5V, V- = -5V
Positive PSRR (dB)
V+ = 4.6V – 5.4V, V- = -5V
Negative PSRR (dB)
V+ = 5V, V- = -2 to -7V
Small-Signal Voltage Gain (V/V)
Q or Q# = 1V to 2V
CMRR (dB)
VCM = -3.75V to 3.5V
Output High Voltage IOUT=1mA - Q (V)
V+ = 4.6V, V- = -5V, IOUT = 1mA
Output High Voltage IOUT=10mA - Q (V)
V+ = 4.6V, V- = -5V, IOUT = 10mA
Output Low Voltage ISINK=4mA - Q (V)
V+ = 5V, V- = -5V, ISINK = 4mA
Output High Voltage IOUT=1mA - Q# (V)
V+ = 4.6V, V- = -5V, IOUT = 1mA
Output High Voltage IOUT=10mA - Q# (V)
V+ = 4.6V, V- = -5V, IOUT = 10mA
Output Low Voltage ISINK=4mA - Q# (V)
V+ = 5V, V- = -5V, ISINK = 4mA
LATCH Pin Input Voltage Threshold (V)
LATCH Pin Current (A)
V+ = 5V, V- = -5V
V+ = 5V, V- = -5V, VLATCH = 0V
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Table C.2. Measured parameters, pre-irradiation specifications, and measurement resolutions.
Pre-Irradiation Specification
Measured Parameter
Min
Positive Supply Current (A)
Max
3.50E+01
Measurement
Resolution/Precision
±1.42E-04
Negative Supply Current (A)
-5.00E-03
Input Offset Voltage (V)
-3.00E-03
3.00E-03
±2.10E-05
Input Offset Current (A)
-1.00E-06
1.00E-06
±4.07E-09
Positive Input Bias Current (A)
-1.00E-05
1.00E-05
±3.97E-08
Negative Input Bias Current (A)
-1.00E-05
1.00E-05
±3.91E-08
Average Input Bias Current (A)
-1.00E-05
1.00E-05
±3.95E-08
Positive PSRR (dB)
6.00E+01
±1.72E+01
Negative PSRR (dB)
8.00E+01
±1.85E+00
Small-Signal Voltage Gain (V/V)
1.40E+03
±3.85E+01
CMRR (dB)
8.00E+01
±1.00E-01
Output High Voltage IOUT=1mA - Q (V)
2.65E+00
±3.06E-02
Output High Voltage IOUT=10mA - Q (V)
2.40E+00
±2.62E-02
Output Low Voltage ISINK=4mA - Q (V)
±7.63E-05
5.50E-01
±7.17E-03
Output High Voltage IOUT=1mA - Q# (V)
2.65E+00
±2.95E-02
Output High Voltage IOUT=10mA - Q# (V)
2.40E+00
±2.57E-02
Output Low Voltage ISINK=4mA - Q# (V)
LATCH Pin Input Voltage Threshold (V)
8.00E-01
LATCH Pin Current (A)
5.50E-01
±6.56E-03
2.00E+00
±1.82E-02
5.00E-04
±1.51E-05
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Appendix D: List of Figures used in Section 5 (Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
Positive Supply Current (A)
Negative Supply Current (A)
Input Offset Voltage (V)
Input Offset Current (A)
Positive Input Bias Current (A)
Negative Input Bias Current (A)
Average Input Bias Current (A)
Positive PSRR (dB)
Negative PSRR (dB)
Small-Signal Voltage Gain (V/V)
CMRR (dB)
Output High Voltage IOUT=1mA - Q (V)
Output High Voltage IOUT=10mA - Q (V)
Output Low Voltage ISINK=4mA - Q (V)
Output High Voltage IOUT=1mA - Q# (V)
Output High Voltage IOUT=10mA - Q# (V)
Output Low Voltage ISINK=4mA - Q# (V)
LATCH Pin Input Voltage Threshold (V)
LATCH Pin Current (A)
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