TOSHIBA 2SC5976

2SC5976
TOSHIBA Transistor Silicon NPN Epitaxial Type
2SC5976
High-Speed Switching Applications
DC-DC Converter Applications
Unit: mm
•
Low collector-emitter saturation voltage: VCE (sat) = 0.14 V (max)
•
High-speed switching: tf = 25 ns (typ.)
1
3
2
Rating
Unit
VCBO
50
V
Collector-emitter voltage
VCEX
50
V
Collector-emitter voltage
VCEO
30
V
Emitter-base voltage
VEBO
6
V
DC
IC
3.0
Pulse
ICP
5.0
IB
0.3
Collector current
Base current
Collector power dissipation (t=10s)
Total collector power dissipation (DC)
Junction temperature
Storage temperature range
PC (Note.1)
1.00
0.625
1.Base
2.Emitter
3.Collector
0.15
0~0.1
Collector-base voltage
Symbol
0.7±0.05
Maximum Ratings (Ta = 25°C)
Characteristics
A
JEDEC
―
A
JEITA
―
TOSHIBA
0.4±0.1
High DC current gain: hFE = 250 to 400 (IC = 0.3 A)
0.95 0.95
•
2.9±0.2
1.9±0.2
+0.2
2.8-0.3
+0.2
1.6-0.1
0.16±0.05
Strobe Flash Applications
2-3S1A
W
Tj
150
°C
Tstg
−55 to 150
°C
2
Note 1: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm )
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2SC5976
Electrical Characteristics (Ta = 25°C)
Characteristics
Symbol
Test Condition
VCB = 50 V, IE = 0
Min
Typ.
Max
Unit
⎯
⎯
0.1
μA
Collector cut-off current
ICBO
Emitter cut-off current
IEBO
VEB = 6 V, IC = 0
⎯
⎯
0.1
μA
V (BR) CEO
IC = 10 mA, IB = 0
30
⎯
⎯
V
hFE (1)
VCE = 2 V, IC = 0.3 A
250
⎯
400
hFE (2)
VCE = 2 V, IC = 1.0 A
120
⎯
⎯
Collector-emitter saturation voltage
VCE (sat)
IC = 1.0 A, IB =33mA
⎯
⎯
0.14
V
Base-emitter saturation voltage
VBE (sat)
IC = 1.0 A, IB =33mA
⎯
⎯
1.10
V
Collector-emitter breakdown voltage
DC current gain
Collector output capacitance
Switching time
VCB = 10 V, IE = 0, f=1MHz
Cob
Rise time
tr
Storage time
tstg
Fall time
tf
18
pF
See Figure 1.
⎯
40
⎯
VCC ≈ 12V, RL = 12 Ω
⎯
320
⎯
IB1 = −IB2 = 33 mA
⎯
25
⎯
ns
VCC
IB1
Input
IB1
RL
20 µs
Output
IB2
IB2
Duty cycle < 1%
Figure 1 Switching Time Test Circuit & Timing Chart
MARKING
Part No. (or abbreviation code)
W
Lot code (year)
Dot: even year
No dot: odd year
W
Lot code (month)
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2SC5976
IC – VCE
3.0
hFE – IC
1000
20
15
Ta = 100°C
8
DC current gain hFE
Collector current IC
(A)
10
2.5
2.0
6
1.5
4
1.0
IB = 2 mA
0.5
0.4
1.2
0.8
1.6
2.0
Collector−emitter voltage VCE
−55°C
100
Common emitter
Common emitter
Ta = 25°C
Single nonrepetitive pulse
0
0
25°C
VCE = 2 V
Single nonrepetitive pulse
10
0.01
0.001
2.4
Base-emitter saturation voltage
VBE (sat) (V)
Collector−emitter saturation voltage
VCE (sat) (V)
0.1
−55°C
Ta = 100°C
25°C
0.01
0.1
1
Collector current IC
Ta = −55°C
1
100°C
25°C
0.1
0.001
10
0.01
(A)
0.1
(W)
PC
Collector power dissipation
(A)
Collector current IC
2.0
1.5
Ta = 100°C
−55°C
1.0
0.5
25°C
0.4
0.6
(A)
Pc – Ta
0.8
VCE = 2 V
2.5 Single nonrepetitive pulse
0.2
10
1
Collector current IC
Common emitter
0
0
(A)
Common emitter
β = 30
Single nonrepetitive pulse
IC – VBE
3.0
10
VBE (sat) – IC
10
Common emitter
β = 30
Single nonrepetitive pulse
0.01
0.001
1
Collector current IC
(V)
VCE (sat) – IC
1
0.1
0.8
1.0
Base−emitter saturation voltage VBE
DC Operation Ta = 25°C
Mounted on an FR4 board glass epoxy,
2
1.6 mm thick, Cu area: 645 mm )
0.6
0.4
0.2
0
0
1.2
(V)
20
40
60
80
100
Ambient temperature
3
Ta
120
140
160
(°C)
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2SC5976
rth – tw
Transient thermal resistance
rth(j-a) (°C/W)
1000
100
10
Curves should be applied in thermal limited area.
Single nonrepetitive pulse Ta = 25°C
2
Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm )
1
0.001
0.01
0.1
1
Pulse width
10
100
1000
tw (s)
Safe operating area
10
10 ms* 1 ms* 100 µs*
1
10 µs*
10 s*
DC operation
Ta = 25°C
*: Single nonrepetitive pulse
Ta = 25°C
Note that the curves for 100 ms,
0.1 10 s and DC operation will be
different when the devices aren’t
mounted on an FR4 board (glass
epoxy, 1.6 mm thick, Cu area:
2
645 mm ).
These characteristic curves must
be derated linearly with increase
in temperature.
0.01
0.1
1
VCEO max
Collector current IC (A)
IC max (Pulsed)*
IC max (Continuous)*
100 ms*
10
Collector−emitter voltage VCE
100
(V)
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RESTRICTIONS ON PRODUCT USE
030619EAA
• The information contained herein is subject to change without notice.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of
TOSHIBA or others.
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
• TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced
and sold, under any law and regulations.
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2004-07-01