MITSUBISHI MGF4851A

June/2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF4851A
SUPER LOW NOISE InGaAs HEMT (Leadless Ceramic Package)
DESCRIPTION
Outline Drawing
The MGF4851A HEMT (High Electron Mobility Transistor) is
designed for use in S to K band amplifiers and oscillators.
The lead-less ceramic package assures minimum parasitic losses.
FEATURES
High gain and High P1dB
Glp=11dB , P1dB=14.5dBm (Typ.) @ f=12GHz
Fig.1
APPLICATION
S to K band power Amplifiers
QUALITY GRADE
GG
ORDERING INFORMATION
Tape & reel
3000pcs./reel
Keep Safety first in your circuit designs!
ABSOLUTE MAXIMUM RATINGS
Symbol
VGDO
VGSO
Parameter
Gate to drain voltage
Gate to source voltage
V
Total power dissipation
100
mW
Channel temperature
125
°C
Storage temperature
-65~125
°C
Tstg
ELECTRICAL CHARACTERISTICS
P1dB
Glp
V
mA
PT
Tch
VGS(off)
Unit
-5
-5
Drain current
V(BR)GDO
IDSS
Ratings
IDSS
ID
Synbol
(Ta=25°C )
Parameter
Mitsubishi Electric Corporation puts the maximum
effort into making semiconductor products better
and more reliable , but there is always the
possibility that trouble may occur with them.
Trouble with semiconductors may lead to personal
injury , fire or property damage. Remember to give
due consideration to safety when making your
circuit designs , with appropriate measure such
as (I) placement of substitutive , auxiliary circuits ,
(ii) use of non-flammable material or (iii) prevention
against any malfunction or mishap.
(Ta=25°C )
Test conditions
Limits
Unit
MIN.
TYP.
-5
-8
MAX
--
V
35
60
120
mA
Saturated drain current
Ig=-10µA
VGS=0V,VDS=2.5V
Gate to source cut-off voltage
VDS=2.5V,ID=500µA
-0.1
-0.8
-2.0
V
Output Power at 1dB gain
VDS=2.5V,ID=25mA
12
14.5
--
dBm
Compression
f=12GHz
VDS=2.5V,ID=25mA
9
11
--
dB
Gate to drain breakdown voltage
Linear Power Gain
f=12GHz,Pin=-5dBm
MITSUBISHI
(1/5)
June/2004
June/2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF4851A
SUPER LOW NOISE InGaAs HEMT (Leadless Ceramic Package)
Fig.1
Unit : mm
Top
Side
‚‡…‰‡
Bottom
‰
˜
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2.
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1.
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3.
➂
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Square shape electrode is Drain
‰…Š‡€
from "A" side view
1. Gate
2. Source
3. Drain
MITSUBISHI
(2/5)
June/2004
June/2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF4851A
SUPER LOW NOISE InGaAs HEMT (Leadless Ceramic Package)
TYPICAL CHARACTERISTICS
(Ta=25°C)
ID vs. VDS
ID vs. VGS
80
70
VGS=-0.1V/STEP
V GS=0V
VDS=2V
70
DRAIN CURRENTID(mA)
DRAIN CURRENT ID(mA)
60
50
40
30
20
10
60
50
40
30
20
10
0
0
0
1
2
3
4
5
-1.0
DRAIN TO SOURCE VOLTAGE V DS(V)
-0.8
-0.6
0.0
20
VDS=2.5V
ID=25mA
f=12GHz
Output Power Pout (dBm)
Output Power Po (dBm)
20.00
10.00
5.00
0.00
-10
-0.2
Po vs. Pin
Po vs. Pin
15.00
-0.4
GATE TO SOURCE VOLTAGEVGS(V)
15
VDS=2V
ID=10mA
f=12GHz
10
5
0
-5
0
5
-10
10
-5
0
5
10
Input Power Pin (dBm)
Input Power Pin (dBm)
MITSUBISHI
(3/5)
June/2004
June/2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF4851A
SUPER LOW NOISE InGaAs HEMT (Leadless Ceramic Package)
S PARAMETERS
(Conditions : VDS=2.5V,ID=25mA,Ta=25deg.C)
f
S11
Angle
0.986 -16.1
0.959 -35.1
0.933 -47.6
0.898 -64.4
0.867 -76.5
0.840 -86.5
0.813 -96.0
0.792 -106.6
0.766 -114.9
0.744 -123.4
0.709 -133.5
0.658 -146.0
0.607 -160.7
0.561 176.4
0.523 151.0
0.542 123.0
0.598 95.1
0.679 70.3
0.760 51.1
0.827 35.4
0.890 21.0
0.921 10.8
0.932
2.6
0.933
-3.9
0.947
-9.0
0.947 -14.4
(GHz) Magn.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
S21
Magn. Angle
6.558 165.2
6.385 148.7
6.118 136.8
5.865 123.4
5.505 112.8
5.187 103.8
4.891 94.8
4.710 83.6
4.538 74.9
4.500 66.5
4.514 57.5
4.549 47.0
4.589 36.3
4.607 20.9
4.547
7.2
4.470
-6.8
4.267 -21.7
3.880 -37.6
3.447 -51.9
3.005 -65.2
2.560 -80.4
2.187 -90.3
1.879 -100.1
1.555 -108.1
1.330 -114.7
1.146 -121.8
S12
Magn. Angle
0.015 79.0
0.028 65.3
0.040 56.6
0.050 46.8
0.058 38.6
0.064 32.3
0.069 26.7
0.073 18.8
0.077 14.2
0.083 10.6
0.092
3.1
0.099
-4.6
0.106 -12.3
0.113 -25.3
0.116 -36.3
0.120 -48.5
0.119 -59.8
0.113 -71.3
0.105 -83.2
0.094 -94.0
0.084 -106.2
0.074 -111.9
0.064 -117.3
0.056 -124.3
0.049 -127.9
0.042 -128.9
S22
Magn. Angle
0.539 -13.6
0.531 -30.0
0.525 -38.9
0.502 -49.8
0.498 -58.1
0.492 -63.8
0.487 -67.9
0.487 -74.3
0.486 -77.8
0.483 -81.1
0.468 -86.3
0.437 -91.4
0.392 -97.5
0.324 -109.3
0.241 -118.6
0.140 -131.0
0.030 -165.6
0.097 43.6
0.214 30.0
0.323 19.9
0.407
8.0
0.481
2.4
0.570
-2.3
0.625
-6.3
0.681
-7.6
0.730
-8.8
Gate
Source
w
Reference Point
Reference Point
Drain
Source
MITSUBISHI
(4/5)
June/2004
June/2004
MITSUBISHI SEMICONDUCTOR <GaAs FET>
MGF4851A
SUPER LOW NOISE InGaAs HEMT (Leadless Ceramic Package)
Requests Regarding Safety Designs
Mitsubishi Electric constantly strives to raise the level of its quality and reliability. Despite these concerted efforts,
however, there will be occasions when our semiconductor products suffer breakdowns, malfunctions or other problems.
In view of this reality, it is requested that every feasible precaution be taken in the pursuit of redundancy design,
malfunction prevention design and other safety-related designs, to prevent breakdowns or malfunctions in our products
from resulting in accidents involving people, fires, social losses or other problems, thereby upholding the highest levels of
safety in the products when in use by customers.
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MITSUBISHI
(5/5)
June/2004